A system and method for 41° awg die test responsivity

Abstract

This invention discloses a system and method for testing the responsivity of a 41° AWG chip, comprising the following steps: system initialization, startup of the test process control module, establishment of connections with all test instruments, and adjustment of the optical power to 500uW; starting the test: the operator scans or enters the device under test number and clicks "real-time acquisition to start the test"; automatic data acquisition and calculation: after the optical power stabilizes, the software automatically reads the current value and calls the internal calculation unit to calculate the responsivity in real time; automatic result judgment: the software compares the calculated responsivity with the preset specifications and outputs the judgment result; automatic data storage and uploading: the software saves the complete test record locally and then automatically uploads it to the server.

Description

Technical Field

[0001] This invention relates to the field of AWG chip testing technology, specifically to a system and method for testing the responsiveness of a 41° AWG chip. Background Technology

[0002] In the production and testing of passive devices, responsivity is a key performance parameter. Responsivity is defined as the ratio of the photocurrent generated by the device to the incident light power, and is usually measured in A / W.

[0003] Existing technical solutions: 1. The operator uses a light source and an optical power meter to manually adjust the optical power incident on the device under test to a standard value (e.g., 500 μW).

[0004] 2. Personnel read the current value (in μA) output by the device under test at this time.

[0005] 3. Personnel manually calculate the response based on the formula: Responsivity = Photocurrent / Optical Power.

[0006] 4. Personnel will record the calculated response values ​​in a paper form or an electronic spreadsheet.

[0007] This results in the following defects: 1. High risk of human error: Manual calculation is prone to errors, such as decimal point errors, unit conversion errors, etc., which lead to unreliable test results.

[0008] 2. Low testing efficiency: The entire process relies heavily on manual operation, recording, and calculation, which is time-consuming and cannot meet the needs of large-scale production.

[0009] 3. Difficulty in data management: Manually recorded data is easily lost, difficult to trace, and difficult to statistically analyze, which is not conducive to quality control and process improvement.

[0010] 4. Poor consistency: Different operators may have different operating habits and calculation and verification standards, which may affect the consistency of test results.

[0011] Therefore, there is an urgent need in this field for a solution that can automate testing, computation, and data management to improve the accuracy, efficiency, and information literacy of testing. Summary of the Invention

[0012] To address the shortcomings of existing technologies, this invention provides a system and method for testing the responsiveness of a 41° AWG chip.

[0013] To achieve the above objectives, the present invention provides the following technical solution: a system for testing the responsivity of a 41° AWG chip, comprising; Test process control module: Used to control the automatic execution of the entire test sequence; Data acquisition and calculation module: After the optical power stabilizes, it automatically reads the photocurrent value from the ammeter and immediately completes the calculation based on the built-in algorithm; Result judgment module: compares the calculated response value with the preset acceptable range and automatically determines whether the device is "acceptable" or "unacceptable". Data Management Module: Automatically generates a structured record from the complete data of this test and stores it in the local database; Data upload module: Periodically or in real time, automatically uploads test records from the local database to the central server to achieve centralized data management.

[0014] This application also provides a method for testing the responsivity of a 41°AWG chip, which, based on the system for testing the responsivity of a 41°AWG chip as described above, further includes the following steps: System initialization, test process control module starts, establishes connection with all test instruments, and adjusts optical power to 500uW; Start Test: The operator scans or enters the serial number of the device under test and clicks "Real-time Acquisition to Start Test".

[0015] Automatic data acquisition and calculation: After the optical power stabilizes, the software automatically reads the current value and calls the internal calculation unit to calculate the responsivity in real time; Automatic result determination: The software compares the calculated responsiveness with the preset specifications and outputs the determination result; Automatic data storage and upload: The software saves complete test records locally and then automatically uploads them to the server.

[0016] In some embodiments, the formula for the built-in algorithm is: Responsivity = Photocurrent / Optical Power.

[0017] Beneficial effects

[0018] This invention provides a system and method for testing the responsivity of a 41° AWG chip. Compared with the prior art, it has the following advantages: This application transforms the discrete, human-dependent, and manual testing process into a highly integrated and automated "data pipeline," thereby fundamentally solving the three major technical pain points of traditional methods: low efficiency, error-proneness, and data silos, and realizing the intelligent upgrade of the testing process. Attached Figure Description

[0019] Figure 1 This is a system diagram of the present invention. Detailed Implementation

[0020] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0021] This invention provides a technical solution: a system for testing the responsivity of a 41° AWG chip, comprising; Test process control module: Used to control the automatic execution of the entire test sequence; Data acquisition and calculation module: After the optical power stabilizes, it automatically reads the photocurrent value from the ammeter and immediately completes the calculation based on the built-in algorithm; Result judgment module: compares the calculated response value with the preset acceptable range and automatically determines whether the device is "acceptable" or "unacceptable". Data Management Module: Automatically generates a structured record from the complete data of this test and stores it in the local database; Data upload module: Periodically or in real time, automatically uploads test records from the local database to the central server to achieve centralized data management.

[0022] The system consists of a hardware layer and a control software layer.

[0023] The hardware layer includes: Adjustable light source: used to generate the light signal required for testing.

[0024] Optical power meter: Used to measure and calibrate the optical power incident on the device under test.

[0025] Ammeter / data acquisition card: Used to measure the photocurrent generated by the device under test under illumination.

[0026] Industrial PC / computer: Serves as a platform for running software and connects to the aforementioned hardware devices via interfaces (such as GPIB, USB, LAN).

[0027] Server: Used to receive and store test data.

[0028] The control software layer (the core of this invention) includes the following functional modules: 1. Test process control module: Used to control the automatic execution of the entire test sequence.

[0029] 2. Data Acquisition and Calculation Module: After the optical power stabilizes, the module automatically reads the photocurrent value from the ammeter and immediately completes the calculation based on the built-in algorithm (responsivity = photocurrent / optical power). This replaces manual recording and calculation.

[0030] 3. Result Judgment Module: Compares the calculated response value with the preset acceptable range and automatically determines whether the device is "acceptable" or "unacceptable".

[0031] 4. Data Management Module: Automatically generates a structured record from the complete data of this test (including but not limited to: device number, test time, set optical power, measured photocurrent, calculated responsivity, and judgment result) and stores it in the local database.

[0032] 5. Data Upload Module: Automatically uploads test records from the local database to the central server periodically or in real time to achieve centralized data management.

[0033] Based on the above system, the present invention also provides a testing method, comprising the following steps: 1. System initialization: The software starts, establishes connections with all test instruments, and adjusts the optical power to 500uW.

[0034] 2. Start the test: The operator scans or enters the serial number of the device under test and clicks "Real-time Acquisition" to start the test.

[0035] 3. Automatic data acquisition and calculation: After the optical power stabilizes, the software automatically reads the current value and calls the internal calculation unit to calculate the responsivity in real time.

[0036] 5. Automatic result judgment: The software compares the calculated responsiveness with the preset specifications and outputs the judgment result.

[0037] 6. Automatic Data Storage and Upload: The software saves complete test records (including device ID, raw data, results, and timestamps) locally and then automatically uploads them to the server, eliminating manual calculation errors, improving testing efficiency, and realizing automated and digital management of test data. It controls the light source output and stabilizes the optical power to the target value based on feedback from the power meter; reads the current value measured by the ammeter; automatically calculates the responsivity based on the target optical power and the current value; and stores and uploads the test data.

[0038] Furthermore, any content not described in detail in this specification is existing technology known to those skilled in the art.

Claims

1. A system for testing the responsivity of a 41° AWG chip, characterized in that: include; Test process control module: Used to control the automatic execution of the entire test sequence; Data acquisition and calculation module: After the optical power stabilizes, it automatically reads the photocurrent value from the ammeter and immediately completes the calculation based on the built-in algorithm; Result judgment module: compares the calculated response value with the preset acceptable range and automatically determines whether the device is "acceptable" or "unacceptable". Data Management Module: Automatically generates a structured record from the complete data of this test and stores it in the local database; Data upload module: Periodically or in real time, automatically uploads test records from the local database to the central server to achieve centralized data management.

2. A method for testing the responsivity of a 41° AWG chip, characterized in that: The system for testing the responsivity of a 41°AWG chip as described in claim 1 further includes the following steps: System initialization, test process control module starts, establishes connection with all test instruments, and adjusts optical power to 500uW; Start Test: The operator scans or enters the serial number of the device under test and clicks "Real-time Acquisition to Start Test"; Automatic data acquisition and calculation: After the optical power stabilizes, the software automatically reads the current value and calls the internal calculation unit to calculate the responsivity in real time; Automatic result determination: The software compares the calculated responsiveness with the preset specifications and outputs the determination result; Automatic data storage and upload: The software saves complete test records locally and then automatically uploads them to the server.

3. The method for testing the responsivity of a 41° AWG chip according to claim 2, characterized in that: The formula for the built-in algorithm is: Responsivity = Photocurrent / Optical Power.

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