A terahertz three-temperature test system

Abstract

The embodiment of the application provides a terahertz three-temperature test system, and relates to the field of automatic test technology.The system comprises a microwave dark box, a power division waveguide assembly, a waveguide switching assembly, an up-down frequency conversion assembly and a radio frequency switching switch;the inside side wall of the microwave dark box is provided with a test probe in the center;the top of the microwave dark box is provided with a waveguide and a waveguide switching structure;the power division waveguide assembly is arranged on the outer wall of the microwave dark box, is located opposite the test probe and is connected with the waveguide in alignment;one end of the waveguide switching assembly is connected with the waveguide switching structure, and the other end is connected with the up-down frequency conversion assembly;the up-down frequency conversion assembly is connected to the radio frequency switching switch, and the radio frequency switching switch is connected with test instruments outside.The terahertz three-temperature test system of the application realizes the application requirements of high efficiency, small size and high stability.

Description

Technical Field

[0001] This application relates to the field of automated testing technology, and more specifically, to a terahertz three-temperature testing system. Background Technology

[0002] The core of a phased array radar system is the transceiver module, which performs functions such as radio frequency signal amplification, amplitude and phase modulation, and transmit / receive switching. As systems evolve towards large-scale and highly integrated designs, systematic testing of the three-temperature performance indicators of multi-channel TR modules, which combine polarization switching and transmit / receive switching, has become crucial for module testing. Automated three-temperature terahertz testing can perform simultaneous performance testing on multiple terahertz modules, encompassing functions such as radio frequency signal amplification, amplitude and phase modulation, and transmit / receive switching. This approach is an effective way to achieve high stability and high efficiency in terahertz testing.

[0003] Traditional terahertz three-temperature testing faces two major challenges: low testing efficiency for individual test modules and inconsistent wear patterns in test fixtures under repeated temperatures. High efficiency is key to improving module testing speed and ensuring mass production. High stability is fundamental to ensuring the authenticity of module test data and guaranteeing module performance indicators. Current technology typically places one module into a fixture and tests it through separate test channels. While this method ensures accurate and valid test data, it is time-consuming, and the numerous high and low temperature cycles of the fixture can affect wear patterns. Furthermore, when multiple modules operate in the same environment, the fixture size is large, leading to high rework costs and limiting its widespread application. Summary of the Invention

[0004] The embodiments of this application provide a terahertz three-temperature testing system to solve the problem that existing terahertz components cannot efficiently and stably meet the three-temperature testing requirements of multiple components and multiple channels.

[0005] Other features and advantages of this application will become apparent from the following detailed description, or may be learned in part from practice of this application.

[0006] According to a first aspect of the embodiments of this application, a terahertz three-temperature testing system is provided, including: a microwave anechoic chamber, a power divider waveguide assembly, a waveguide adapter assembly, an up-conversion assembly, and a radio frequency switching switch; A test probe is provided at the center of the inner side wall of the microwave dark box, and a waveguide and waveguide transition structure are provided on the top of the microwave dark box. The power divider waveguide assembly is disposed on the outer wall of the microwave anechoic chamber, opposite the test probe, and aligned and connected to the waveguide. One end of the waveguide adapter is connected to the waveguide adapter structure, and the other end is connected to the up and down frequency conversion components; The up and down frequency conversion components are connected to the radio frequency switching switch, which is connected to external testing instruments.

[0007] In some embodiments of this application, based on the aforementioned scheme, the power divider waveguide component includes: a power divider upper structure and a power divider lower structure spliced ​​together.

[0008] In some embodiments of this application, based on the aforementioned scheme, the lower structure of the power divider waveguide is embedded with a fixed terahertz component to be measured.

[0009] In some embodiments of this application, based on the foregoing scheme, the waveguide adapter assembly includes: a waveguide adapter plate, a fixed connection nut, a waveguide support bracket, a waveguide extension tube, and a cross-sectional waveguide extension tube; The waveguide adapter plate is aligned and combined with the waveguide adapter structure, and connected by the fixing nut; One end of the waveguide extension tube is connected to the waveguide adapter plate, and the other end is spliced ​​to the cross-section waveguide extension tube; The cross-sectional waveguide extension tube is mounted on the waveguide support bracket and connected to the upper and lower frequency conversion components.

[0010] In some embodiments of this application, based on the aforementioned scheme, a pin is provided at the waveguide adapter structure, and the waveguide adapter structure is connected to the waveguide adapter plate through the pin.

[0011] In some embodiments of this application, based on the foregoing scheme, the up-and-down frequency conversion assembly includes: an up-and-down frequency conversion power supply structure plate, an up-and-down frequency conversion radio frequency structure, an up-and-down frequency conversion radio frequency amplifier, and a docking and fixing connection nut; The up-and-down frequency conversion radio frequency structure is connected to the up-and-down frequency conversion power supply structure board to generate control signals; The up-conversion RF amplifier is connected to the up-conversion power supply structure board and is used to generate RF signals. The up-and-down frequency conversion RF amplifier is connected to the waveguide adapter assembly and to the up-and-down frequency conversion RF structure via the docking fixing nut, for transmitting RF signals; The up-conversion and down-conversion RF structure is connected to the RF switching switch and is used to switch between different RF function tests.

[0012] In some embodiments of this application, based on the foregoing scheme, the radio frequency switching switch includes: a power divider, a control power supply circuit board, a radio frequency amplification module, a mechanical switch structure, and a connector; The power divider is connected to the up-conversion and down-conversion RF structure and is used to receive the local oscillator signal; The control power supply circuit board is connected to the mechanical switch structure and the radio frequency amplifier module respectively, and outputs control power supply signals; The mechanical switch structure, the connector, and the radio frequency amplification module are connected in sequence to transmit radio frequency signals.

[0013] In some embodiments of this application, based on the aforementioned scheme, the radio frequency switching switch is further provided with an alarm indicator light, which is connected to the control power supply circuit board.

[0014] In some embodiments of this application, based on the foregoing scheme, the microwave anechoic chamber is provided with microwave absorbing material.

[0015] In some embodiments of this application, based on the foregoing scheme, the microwave dark box has a cubic structure.

[0016] The technical solution of this application has the following beneficial effects: 1. This invention employs a microwave anechoic chamber structure, which can simultaneously install multiple terahertz components, enabling time-sharing testing of multiple terahertz components without the need to replace components or maintain a constant temperature. 2. Compared with traditional three-temperature testing systems, this invention is based on a microwave anechoic chamber transceiver integrated structure, which has lower cost, smaller size, faster testing speed, more comprehensive coverage channels, and less environmental resource occupation. It is more suitable for rapid testing application scenarios, improves system testing volume and reliability, and saves costs and resources.

[0017] 3. Compared with traditional three-temperature testing systems, this invention uses a switch to switch the temperature and combines it with software to achieve 24-hour fully automated testing, which greatly saves manpower and reduces the index error caused by human testing.

[0018] It should be understood that the above general description and the following detailed description are exemplary and explanatory only, and do not limit this application. Attached Figure Description

[0019] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this application and, together with the description, serve to explain the principles of this application. It is obvious that the drawings described below are merely some embodiments of this application, and those skilled in the art can obtain other drawings based on these drawings without any inventive effort. In the drawings: Figure 1 A schematic diagram of a terahertz three-temperature testing system according to an embodiment of this application is shown; Figure 2 A schematic diagram of the structure of a microwave anechoic chamber according to an embodiment of this application is shown; Figure 3 A schematic diagram of the structure of a power divider waveguide assembly according to an embodiment of this application is shown; Figure 4 A schematic diagram of the structure of a waveguide adapter assembly according to an embodiment of this application is shown; Figure 5 A schematic diagram of the structure of an up-converter assembly according to an embodiment of this application is shown; Figure 6 A schematic diagram of the structure of a radio frequency switching switch according to an embodiment of this application is shown.

[0020] Explanation of reference numerals in the attached figures 1-Power divider waveguide assembly, 2-Microwave anechoic chamber, 3-Waveguide adapter assembly, 4-Up / down frequency conversion assembly, 5-RF switching switch, 6-Waveguide, 11-Upper structure of power divider waveguide, 12-Lower structure of power divider waveguide, 21-Test probe, 22-Waveguide adapter structure, 23-Microwave anechoic chamber structure, 31-Waveguide adapter board, 32-Fixing nut, 33-Waveguide support bracket, 34-Waveguide extension tube, 35-Cross-section waveguide extension tube, 41-Up / down frequency conversion power supply structure board, 42-Up / down frequency conversion RF structure, 43-Up / down frequency conversion RF amplifier, 44-Fixing nut, 51-Power divider device, 52-Control power supply circuit board, 53-RF amplification module, 54-Mechanical switch structure, 55-Connector, 56-Alarm indicator light. Detailed Implementation

[0021] Exemplary embodiments will now be described more fully with reference to the accompanying drawings. However, these exemplary embodiments can be implemented in many forms and should not be construed as limited to the examples set forth herein; rather, these embodiments are provided to make this application more comprehensive and complete, and to fully convey the concept of the exemplary embodiments to those skilled in the art.

[0022] Furthermore, the described features, structures, or characteristics can be combined in any suitable manner in one or more embodiments. Numerous specific details are provided in the following description to give a thorough understanding of embodiments of this application. However, those skilled in the art will recognize that the technical solutions of this application can be practiced without one or more of the specific details, or other methods, components, apparatuses, steps, etc., can be employed. In other instances, well-known methods, apparatuses, implementations, or operations are not shown or described in detail to avoid obscuring various aspects of this application.

[0023] It should be noted that "multiple" in this article refers to two or more. "And / or" describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A alone, A and B simultaneously, or B alone. The character " / " generally indicates that the preceding and following related objects have an "or" relationship.

[0024] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such uses of these terms can be interchanged where appropriate so that the embodiments of this application described herein can be implemented in orders other than those illustrated or described.

[0025] To make the objectives, technical solutions, and advantages of this invention clearer, the technical solutions of the embodiments of this invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this invention, and not all of them. Based on the embodiments of this invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this invention.

[0026] The following detailed description of some embodiments of this application will be provided in conjunction with the accompanying drawings. Unless otherwise specified, the following embodiments and features can be combined with each other.

[0027] To address the technical problems existing in the prior art, this application provides a terahertz three-temperature testing system, including: a microwave anechoic chamber, a power divider waveguide assembly, a waveguide adapter assembly, an up-conversion assembly, and an RF switching switch; A test probe is provided at the center of the inner side wall of the microwave dark box, and a waveguide and waveguide transition structure are provided on the top of the microwave dark box. The power divider waveguide assembly is disposed on the outer wall of the microwave anechoic chamber, opposite the test probe, and aligned and connected to the waveguide. One end of the waveguide adapter is connected to the waveguide adapter structure, and the other end is connected to the up and down frequency conversion components; The up and down frequency conversion components are connected to the radio frequency switching switch, which is connected to external testing instruments.

[0028] For example, see Figure 1 The diagram shows a schematic structural diagram of a terahertz three-temperature testing system according to an embodiment of this application.

[0029] See Figure 2 The diagram shows a schematic structural diagram of a microwave anechoic chamber according to an embodiment of this application.

[0030] like Figure 1As shown, the power-sharing waveguide assembly 1 is located on the outer wall of the microwave anechoic chamber 2. It can be used to install terahertz components and interconnect with external waveguide structures to achieve radio frequency signal transmission and fixation of terahertz components. The waveguide adapter assembly 3 is connected to the waveguide adapter structure on the top of the microwave anechoic chamber 2 to achieve radio frequency signal transmission. The other end of the waveguide adapter assembly 3 is adapted to the up / down converter assembly 4, which is connected to the radio frequency switching switch 5 to ensure stable and efficient radio frequency transmission performance.

[0031] like Figure 2 As shown, a test probe 21 is set at the center point of the inner wall of the microwave anechoic chamber 2. The test probe 21 is directly facing the power divider waveguide assembly 1. A waveguide adapter structure 22 and a waveguide 6 are set on the top outside of the microwave anechoic chamber 2. One end of the waveguide 6 is connected to the waveguide adapter structure 22, and the other end is aligned and connected to the power divider waveguide assembly 1. The waveguide adapter structure 22 is used to connect to the waveguide adapter assembly 3.

[0032] In some feasible embodiments, based on the aforementioned scheme, the power divider waveguide component includes: a power divider waveguide upper structure and a power divider waveguide lower structure spliced ​​together.

[0033] For example, see Figure 3 The diagram shows a schematic representation of a power divider waveguide assembly according to an embodiment of this application.

[0034] like Figure 3 As shown, the power divider waveguide assembly is divided into a power divider waveguide upper structure 11 and a power divider waveguide lower structure 12. The power divider waveguide upper structure 11 and the power divider waveguide lower structure 12 are spliced ​​together to form a whole power divider waveguide assembly 1.

[0035] In some feasible embodiments, based on the aforementioned scheme, the lower structure of the power divider waveguide is embedded with a fixed terahertz component to be measured.

[0036] In some feasible embodiments, based on the foregoing scheme, the waveguide adapter assembly includes: a waveguide adapter plate, a fixed connection nut, a waveguide support bracket, a waveguide extension tube, and a cross-sectional waveguide extension tube; The waveguide adapter plate is aligned and combined with the waveguide adapter structure, and connected by the fixing nut; One end of the waveguide extension tube is connected to the waveguide adapter plate, and the other end is spliced ​​to the cross-section waveguide extension tube; The cross-sectional waveguide extension tube is mounted on the waveguide support bracket and connected to the upper and lower frequency conversion components.

[0037] For example, see Figure 4 The diagram shows a schematic structural diagram of a waveguide adapter assembly according to an embodiment of the present application.

[0038] like Figure 4As shown, the waveguide adapter assembly 3 includes a waveguide adapter plate 31, a fixed connection nut 32, a waveguide support bracket 33, a waveguide extension tube 34, and a cross-section waveguide extension tube 35.

[0039] The waveguide adapter plate 31 is connected to the waveguide adapter structure 22. The waveguide adapter plate 31, the fixed connection nut 32, the waveguide extension tube 34, and the cross-section waveguide extension tube 35 are spliced ​​together to form a waveguide adapter extension section, which is supported by the waveguide support bracket 33, which plays a stabilizing role.

[0040] In some feasible embodiments, based on the aforementioned scheme, a pin is provided at the waveguide adapter structure, and the waveguide adapter structure is connected to the waveguide adapter plate through the pin.

[0041] In some feasible embodiments, based on the foregoing scheme, the up and down frequency conversion component includes: an up and down frequency conversion power supply structure plate, an up and down frequency conversion radio frequency structure, an up and down frequency conversion radio frequency amplifier, and a docking and fixing connection nut; The up-and-down frequency conversion radio frequency structure is connected to the up-and-down frequency conversion power supply structure board to generate control signals; The up-conversion RF amplifier is connected to the up-conversion power supply structure board and is used to generate RF signals. The up-and-down frequency conversion RF amplifier is connected to the waveguide adapter assembly and to the up-and-down frequency conversion RF structure via the docking fixing nut, for transmitting RF signals; The up-conversion and down-conversion RF structure is connected to the RF switching switch and is used to switch between different RF function tests.

[0042] The up-conversion and down-conversion RF amplifiers receive RF signals from the RF switching component, perform mixing, amplification, and filtering, and then transmit the processed signals to the RF amplifier component. Finally, the processed signals are output to the waveguide adapter component through the docking and fixing nut for the transmission of specified RF input signals.

[0043] For example, see Figure 5 The diagram shows a structural schematic of an up-converter component according to an embodiment of the present application.

[0044] like Figure 5 As shown, the up-and-down frequency conversion power supply structure board 41 is connected to the up-and-down frequency conversion radio frequency structure 42 and the up-and-down frequency conversion radio frequency amplifier 43 respectively to provide control signals.

[0045] The up-conversion RF amplifier 43 is connected to the waveguide adapter 3 and the up-conversion RF structure 42 respectively. It receives the signal transmitted from the waveguide adapter 3 and generates RF signal, which is then transmitted to the up-conversion RF structure 42. The up-conversion RF structure 42 is then connected to the RF switching switch 5 and transmits the signal to the RF switching switch 5 to realize the switching of RF function test.

[0046] In some feasible embodiments, based on the foregoing scheme, the radio frequency switching switch includes: a power divider, a control power supply circuit board, a radio frequency amplification module, a mechanical switch structure, and a connector; The power divider is connected to the up-conversion and down-conversion RF structure and is used to receive the local oscillator signal; The control power supply circuit board is connected to the mechanical switch structure and the radio frequency amplifier module respectively, and outputs control power supply signals; The mechanical switch structure, the connector, and the radio frequency amplification module are connected in sequence to transmit radio frequency signals.

[0047] In some feasible embodiments, based on the aforementioned scheme, the radio frequency switching switch is also provided with an alarm indicator light, which is connected to the control power supply circuit board.

[0048] For example, see Figure 6 The diagram shows a schematic structural diagram of a radio frequency switching switch according to an embodiment of the present application.

[0049] like Figure 6 As shown, the main body structure of the RF switching switch resembles a frame, with a power divider 51, a connector 55, and an alarm indicator 56 installed on its side walls; and a control power supply circuit board 52, an RF amplification module 53, and a mechanical switch structure 54 installed at its bottom.

[0050] The RF switching switch has two RF input signals. The power divider receives one RF input signal and then transmits it to the up and down frequency converters to provide the mixing intrinsic signal. The other RF input signal enters the mechanical switch structure, which switches different RF output signal channels through the control circuit. Then, it is amplified by the RF amplification module to finally realize the RF switching.

[0051] In some feasible embodiments, based on the aforementioned scheme, the microwave anechoic chamber is provided with microwave absorbing material.

[0052] In some feasible embodiments, based on the aforementioned scheme, the microwave dark box has a cubic structure.

[0053] In summary, existing three-temperature testing systems mostly employ the method of extending the power supply and terahertz radio frequency of a single component for testing. This results in a large structural design for testing multiple components, and requires operators to switch between different channels of the tested component, placing high demands on operators' real-time operation under stable temperatures. This invention proposes a terahertz-based, highly stable, and efficient three-temperature testing system that can test multiple components while distributing the module usage to a smaller structural size. Furthermore, it achieves full-channel coverage during testing without requiring real-time operator intervention. Additionally, this invention can be used with software for data acquisition and processing, significantly reducing the time required for component data processing and distribution, and saving on personnel and time costs.

[0054] Other embodiments of this application will readily conceive of by those skilled in the art upon consideration of the specification and practice of the embodiments disclosed herein. This application is intended to cover any variations, uses, or adaptations of this application that follow the general principles of this application and include common knowledge or customary techniques in the art not disclosed herein. It should be understood that this application is not limited to the precise structures described above and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope. The scope of this application is limited only by the appended claims.

Claims

1. A terahertz three-temperature testing system, characterized in that, include: Microwave anechoic chamber, power divider waveguide assembly, waveguide adapter assembly, up / down converter assembly and RF switching switch; A test probe is provided at the center of the inner side wall of the microwave dark box, and a waveguide and waveguide transition structure are provided on the top of the microwave dark box. The power divider waveguide assembly is disposed on the outer wall of the microwave anechoic chamber, opposite the test probe, and aligned and connected to the waveguide. One end of the waveguide adapter is connected to the waveguide adapter structure, and the other end is connected to the up and down frequency conversion components; The up and down frequency conversion components are connected to the radio frequency switching switch, and the radio frequency switching switch is connected to external testing instruments. The power divider waveguide assembly includes: a power divider waveguide upper structure and a power divider waveguide lower structure spliced ​​together; The lower layer structure of the power divider waveguide is embedded with a fixed terahertz component to be measured. The up and down frequency conversion assembly includes: an up and down frequency conversion power supply structure board, an up and down frequency conversion radio frequency structure, an up and down frequency conversion radio frequency amplifier, and a docking and fixing connection nut; The up-and-down frequency conversion radio frequency structure is connected to the up-and-down frequency conversion power supply structure board to generate control signals; The up-conversion RF amplifier is connected to the up-conversion power supply structure board and is used to generate RF signals. The up-and-down frequency conversion RF amplifier is connected to the waveguide adapter assembly and to the up-and-down frequency conversion RF structure via the docking fixing nut, for transmitting RF signals; The up-and-down frequency conversion RF structure is connected to the RF switching switch and is used to switch between different RF function tests. The radio frequency switching switch includes: a power divider, a control power supply circuit board, a radio frequency amplification module, a mechanical switch structure, and a connector; The power divider is connected to the up-conversion and down-conversion RF structure and is used to receive the local oscillator signal; The control power supply circuit board is connected to the mechanical switch structure and the radio frequency amplifier module respectively, and outputs control power supply signals; The mechanical switch structure, the connector, and the radio frequency amplification module are connected in sequence to transmit radio frequency signals; The RF switching switch has two RF input signals. The power divider receives the RF input signal from one end and then transmits it to the up and down frequency converters to provide the mixing intrinsic signal. The RF input signal from the other end enters the mechanical switch structure, and the control circuit switches between different RF output signal channels. Then, it is amplified by the RF amplification module to finally realize the RF switching.

2. The system according to claim 1, characterized in that, The waveguide adapter assembly includes: a waveguide adapter plate, a fixing nut, a waveguide support bracket, a waveguide extension tube, and a cross-sectional waveguide extension tube; The waveguide adapter plate is aligned and combined with the waveguide adapter structure, and connected by the fixing nut; One end of the waveguide extension tube is connected to the waveguide adapter plate, and the other end is spliced ​​to the cross-section waveguide extension tube; The cross-sectional waveguide extension tube is mounted on the waveguide support bracket and connected to the upper and lower frequency conversion components.

3. The system according to claim 2, characterized in that, A pin is provided at the waveguide adapter structure, and the waveguide adapter structure is connected to the waveguide adapter plate through the pin.

4. The system according to claim 1, characterized in that, The radio frequency switch is also equipped with an alarm indicator light, which is connected to the control power supply circuit board.

5. The system according to claim 1, characterized in that, The microwave anechoic chamber is equipped with microwave absorbing material.

6. The system according to claim 1, characterized in that, The microwave darkroom has a cubic structure.

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