Wide-field structured light super-resolution microscopic imaging device and method

By introducing a wide-field structured light super-resolution microscopy device with scanning galvanometers and deformable mirrors, the illumination and imaging fields of view are expanded, solving the problem of high spatiotemporal resolution imaging of large field-of-view samples and realizing high-quality full-field image reconstruction.

CN122284126APending Publication Date: 2026-06-26TSINGHUA UNIVERSITY
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
TSINGHUA UNIVERSITY
Filing Date
2026-05-19
Publication Date
2026-06-26

AI Technical Summary

Technical Problem

Existing technologies struggle to achieve high spatiotemporal resolution structured light super-resolution imaging of large field-of-view samples, especially at the multicellular scale and in fields of view larger than hundreds of micrometers, making it impossible to effectively observe the dynamic processes of organelles.

Method used

A wide-field structured light super-resolution microscopy imaging device is used, combined with a scanning galvanometer and a deformable mirror, to expand the illumination and imaging fields of view. Through the coordinated work of the scanning module and the imaging module, high spatiotemporal resolution imaging with a large field of view is achieved, and a full-field image is generated through super-resolution reconstruction technology.

Benefits of technology

It breaks through the limitation of field of view size, realizes structured light super-resolution imaging with large field of view and high spatiotemporal resolution, can maintain high imaging quality in a large field of view, and reduces the requirements for sample leveling and focusing, adapting to the imaging needs of non-flat samples.

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Abstract

This application discloses a wide-field-of-view structured light super-resolution microscopy imaging device and method. The wide-field-of-view structured light super-resolution microscopy imaging device includes a structured light illumination module, a scanning module, and a first imaging module. The structured light illumination module is used to emit laser light, modulate the laser light, and filter the diffracted beam of the modulated laser light to obtain illumination structured light. The scanning module is used to guide the illumination structured light to the sample, move the imaging field of view by deflection through a scanning galvanometer, and receive the first imaging light generated by the sample excited by the illumination structured light. The first imaging module is used to receive the first imaging light transmitted by the scanning module to generate a corresponding field-of-view image. This application expands the illumination field of view and imaging field of view of structured light super-resolution microscopy, overcomes the limitation of field of view size by structured light modulation devices or imaging cameras, and enables the scanning imaging system to fully utilize the spatial bandwidth product provided by the objective lens to achieve large-field-of-view, high spatiotemporal resolution structured light super-resolution imaging.
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