An insulated gate bipolar transistor test apparatus

Abstract

This application relates to the field of insulated-gate bipolar transistor (IGBT) testing technology, and in particular to an IGBT testing apparatus, comprising a test circuit board and two mounting bases. A first elastic connection component is installed in at least one receiving hole of the mounting base on one side, and a second elastic connection component is installed in at least one receiving hole. A third elastic connection component is installed in at least one receiving hole of the mounting base on the other side, and a fourth elastic connection component is installed in at least one receiving hole. After the IGBT under test is placed on the first, second, third, and fourth elastic connection components, the first, second, third, and fourth elastic connection components adaptively deform, avoiding localized poor contact or excessive localized interaction forces.

Description

Technical Field

[0001] This application relates to the field of insulated gate bipolar transistor (IGBT) testing technology, and in particular to an IGBT testing apparatus. Background Technology

[0002] The Insulated Gate Bipolar Transistor (IGBT) test apparatus is used to test and evaluate the performance and reliability of IGBTs and related power modules under high current conditions. It can achieve full-process electrical parameter characterization and stress assessment from R&D verification to mass production quality inspection.

[0003] Currently, during testing, the insulated gate bipolar transistor is connected to the test circuit board using a rigid contact method.

[0004] The existing technical solutions mentioned above have the following drawbacks: the insulated gate bipolar transistor (IGBT) is connected to the test circuit board in a rigid contact manner, which is prone to local poor contact or excessive local interaction force, resulting in test failure or damage to the IGBT. Summary of the Invention

[0005] To avoid poor local contact or excessive local interaction forces, this application provides a test device for insulated gate bipolar transistors.

[0006] This application provides a test device for insulated-gate bipolar transistors, which adopts the following technical solution: An insulated gate bipolar transistor (IGBT) testing apparatus, comprising: Test circuit board; Two mounting bases, both elongated structures, are installed on opposite sides of the top surface of the test circuit board. Each mounting base has multiple receiving holes along its length. A first elastic connection component is installed in at least one receiving hole of the mounting base on one side, and a second elastic connection component is installed in at least one receiving hole. A third elastic connection component is installed in at least one receiving hole of the mounting base on the other side, and a fourth elastic connection component is installed in at least one receiving hole. The top end of the first elastic connection component abuts against the collector of the insulated-gate bipolar transistor (IGBT) under test, and the bottom end abuts against the test circuit board. The top end of the second elastic connection component abuts against the collector of the IGBT under test, and the bottom end abuts against the test circuit board. The top end of the third elastic connection component abuts against the gate of the IGBT under test, and the bottom end abuts against the test circuit board. The top end of the fourth elastic connection component abuts against the emitter of the IGBT under test, and the bottom end abuts against the test circuit board.

[0007] By adopting the above technical solution, the first and second elastic connection components serve to electrically connect the test circuit board to the collector of the insulated-gate bipolar transistor (IGBT) under test. The third elastic connection component serves to electrically connect the test circuit board to the gate of the IGBT. The fourth elastic connection component serves to electrically connect the test circuit board to the emitter of the IGBT. After the IGBT is placed on the first, second, third, and fourth elastic connection components, each of these components adaptively deforms, autonomously compensating for installation position errors. This avoids poor local contact or excessive local interaction forces, improving the test success rate and preventing damage to the IGBT. Furthermore, the multiple first elastic connection components work together to distribute the current density and load, preventing local overheating and excessive local stress, thus improving current carrying capacity and load capacity. Multiple third elastic connection components work together to disperse current density and load, preventing local overheating and excessive local stress, thus improving current carrying capacity and load capacity.

[0008] This application is further configured such that: each first elastic connection assembly includes a plurality of first elastic connectors arranged in parallel; the top ends of the plurality of first elastic connectors respectively abut against the collector of the insulated gate bipolar transistor under test, and the bottom ends respectively abut against the test circuit board; each third elastic connection assembly has the same structure as each first elastic connection assembly; each second elastic connection assembly includes two second elastic connectors arranged in parallel; the top ends of the two second elastic connectors respectively abut against the collector of the insulated gate bipolar transistor under test, and the bottom ends respectively abut against the test circuit board; each fourth elastic connection assembly has the same structure as each second elastic connection assembly.

[0009] This application further specifies that: each first resilient connector: The first curved section has an arc-shaped structure; The first connecting part is horizontally arranged, and one end is fixedly connected to one end of the first curved part; The first lifting part is vertically set, and its bottom end is fixedly connected to the other end of the first connecting part; The second connecting part is horizontally positioned, and its top end is fixedly connected to the other end of the first curved part. There are two first pressing parts, both horizontally arranged, with their top ends fixedly connected to the bottom ends of the opposite ends of the second connecting parts; each first pressing part has multiple first contact protrusions at its bottom end.

[0010] By adopting the above technical solution, when the bottom surface of the insulated-gate bipolar transistor (IGBT) under test contacts the first raised portion, the first bent portion can deform, so that the first elastic connector can make good contact with the IGBT and the test circuit board respectively, and avoid the first elastic connector applying excessive force to the IGBT / test circuit board. The first contact protrusion increases the friction between the bottom surface of the first pressing portion and the top surface of the test circuit board, preventing the first pressing portion from undergoing large displacement in the horizontal direction, and ensuring good contact between the first pressing portion and the test circuit board.

[0011] This application further specifies that: each second resilient connector: The second curved section has an arc-shaped structure; The third connecting part is horizontally set, and one end is fixedly connected to one end of the second curved part; The second lifting part is vertically set, and its bottom end is fixedly connected to the other end of the third connecting part; The fourth connecting part is horizontally positioned, and its top end is fixedly connected to the other end of the second curved part; There are two second pressing parts, both horizontally arranged, with their top ends fixedly connected to the bottom ends of the opposite ends of the fourth connecting part; each second pressing part has multiple second contact protrusions formed at its bottom end.

[0012] By adopting the above technical solution, when the bottom surface of the insulated-gate bipolar transistor (IGBT) under test contacts the second raised portion, the second bent portion can deform, so that the second elastic connector can make good contact with the IGBT and the test circuit board respectively, and avoid the second elastic connector applying excessive force to the IGBT / test circuit board. The second contact protrusion increases the friction between the bottom surface of the second pressing portion and the top surface of the test circuit board, preventing the second pressing portion from undergoing large displacement in the horizontal direction, and ensuring good contact between the second pressing portion and the test circuit board.

[0013] This application further specifies that each fixed base includes: The pressure plate has multiple receiving holes along its length; elastic pressure strips are provided on the inner walls of the opposite sides of each receiving hole. The base plate is detachably installed at the bottom of the pressure plate, and clearance holes are formed on both opposite sides.

[0014] This application further includes: The top cover is detachably mounted on the top of the test circuit board and covers the outside of the mounting base, the first elastic connection component, the second elastic connection component, the third elastic connection component and the fourth elastic connection component; the top cover has clearance holes for the top ends of the first elastic connection component, the second elastic connection component, the third elastic connection component and the fourth elastic connection component to protrude.

[0015] This application is further configured such that: at least one receiving hole is equipped with a spring actuation mechanism; the spring actuation mechanism can be connected to or disconnected from the recessed side of the first curved portion of a plurality of first elastic connectors; when the spring actuation mechanism is connected to the recessed side of the first curved portion, it can drive the first curved portion to deform.

[0016] By adopting the above technical solution, it is possible to verify the electrical performance of the insulated gate bipolar transistor under different contact stresses, actively compensate for height differences, and adjust the elastic coefficient of the first elastic connector according to test requirements.

[0017] This application further specifies that each reed actuating mechanism includes: The first isolation cylinder is installed in the receiving hole, and a through hole is formed on the side near the recessed side of the first bend. The guide rod is installed inside the first isolation cylinder, and its axial direction is the same as that of the first isolation cylinder. The sliding sleeve is slidably fitted onto the guide rod along the guide rod axis, and multiple teeth are formed on the outer wall in the middle. A magnet is fixed to one end of the sliding sleeve near the concave side of the first bend. As the sliding sleeve moves, it can connect or disconnect with the concave side of the first bend. A spring is sleeved on a guide rod, with one end fixedly connected to the inner wall of the first isolation cylinder and the other end fixedly connected to the recessed side of the sliding sleeve away from the first bend. A rotating ring is rotatably disposed inside the first isolation cylinder, and multiple actuating teeth are formed on its outer wall; The first drive motor is installed inside the first isolation cylinder, and its output shaft is fixedly connected to the rotating ring to drive the rotating ring to rotate.

[0018] By adopting the above technical solution, when the magnet connects to the concave side of the first bend, the first drive motor drives the rotating ring to rotate. Multiple actuating teeth and multiple locating teeth cause the sliding sleeve to slide away from the first bend along the axial direction of the guide rod, thereby causing the first bend to actively deform through the magnet. During this process, the spring is gradually compressed. As the sliding sleeve continues to slide away from the first bend, the outer wall of the first isolation cylinder forces the concave side of the first bend to disconnect from the magnet, allowing the first bend to spontaneously reset. When the first drive motor continues to drive the rotating ring to rotate, all the actuating teeth disengage from the locating teeth, and the spring's restoring deformation force drives the sliding sleeve to slide closer to the first bend along the axial direction of the guide rod, causing the magnet to move towards the concave side of the first bend, allowing the magnet to reconnect with the concave side of the first bend.

[0019] This application is further configured such that: at least one receiving hole is equipped with a reed damping mechanism; the reed damping mechanism is capable of abutting against the bottom end of the first connecting part of the plurality of first elastic connectors and the top end of the second connecting part of the plurality of first elastic connectors respectively, so as to prevent the first bending part from deforming.

[0020] By adopting the above technical solution, multiple first elastic connecting parts can lose their elasticity and become rigid parts, so as to realize the reference position for static testing or calibration testing.

[0021] This application further specifies that each reed damping mechanism includes: The second isolation cylinder is installed inside the receiving hole; The second drive motor is installed inside the second isolation cylinder; A right-angle commutator, with its input shaft fixedly connected to the output shaft of the second drive motor; There are two screw jacks, which are respectively installed on opposite sides inside the isolation cylinder; the input shaft of one screw jack is fixedly connected to one of the output shafts of the right-angle commutator; the input shaft of the other screw jack is fixedly connected to the other output shaft of the right-angle commutator. The top rod is fixedly connected at its bottom end to the flange of the screw head of one of the screw jacks, and at its top end can abut against the bottom end of the first connecting part of a plurality of first elastic connecting members; The pressure rod is fixedly connected at its top end to the flange of the screw head of another screw jack, and at its bottom end can abut against the top end of the second connection part of multiple first elastic connectors.

[0022] By adopting the above technical solution, when multiple first elastic connectors lose their deformation capacity, the second drive motor drives two screw jacks through a right-angle commutator to operate, causing the top rod to move upward and the pressure rod to move downward, so that the top end of the top rod abuts against the bottom end of the first connecting part of the multiple first elastic connectors, and the bottom end of the pressure rod abuts against the top end of the second connecting part of the multiple first elastic connectors. When multiple first elastic connectors need to regain their deformation capacity, the second drive motor drives two screw jacks through a right-angle commutator to operate, causing the top rod to move downward and the pressure rod to move upward, so that the top end of the top rod disengages from the bottom end of the first connecting part of the multiple first elastic connectors, and the bottom end of the pressure rod disengages from the top end of the second connecting part of the multiple first elastic connectors.

[0023] In summary, the beneficial technical effects of this application are as follows: 1. By setting up a first, second, third, and fourth elastic connection component, the first and second elastic connection components serve to electrically connect the test circuit board to the collector of the insulated-gate bipolar transistor (IGBT) under test. The third elastic connection component serves to electrically connect the test circuit board to the gate of the IGBT. The fourth elastic connection component serves to electrically connect the test circuit board to the emitter of the IGBT. After the IGBT is placed on the first, second, third, and fourth elastic connection components, each of these components adaptively deforms, autonomously compensating for installation position errors. This avoids poor local contact or excessive local interaction forces, improving the test success rate and preventing damage to the IGBT. Furthermore, the multiple first elastic connection components work together to distribute the current density and load, preventing local overheating and excessive local stress, thus improving current carrying capacity and load capacity. Multiple third elastic connection components work together to disperse current density and load, preventing local overheating and excessive local stress, thus improving current carrying capacity and load capacity.

[0024] 2. When the bottom surface of the insulated-gate bipolar transistor (IGBT) under test contacts the first raised portion, the first bent portion deforms to ensure good contact between the first elastic connector and the IGBT and the test circuit board, respectively, and to prevent the first elastic connector from applying excessive force to the IGBT / test circuit board. The first contact protrusion increases the friction between the bottom surface of the first pressing portion and the top surface of the test circuit board, preventing large displacement of the first pressing portion in the horizontal direction, thus ensuring good contact between the first pressing portion and the test circuit board. When the bottom surface of the IGBT under test contacts the second raised portion, the second bent portion deforms to ensure good contact between the second elastic connector and the IGBT and the test circuit board, respectively, and to prevent the second elastic connector from applying excessive force to the IGBT / test circuit board. The second contact protrusion increases the friction between the bottom surface of the second pressing portion and the top surface of the test circuit board, preventing large displacement of the second pressing portion in the horizontal direction, thus ensuring good contact between the second pressing portion and the test circuit board.

[0025] 3. By adding a spring actuation mechanism, when the spring actuation mechanism is connected to the concave side of the first bend, it can drive the first bend to deform. This allows for the verification of the electrical performance of the insulated gate bipolar transistor under different contact stresses, active compensation for height differences, and adjustment of the elastic coefficient of the first elastic connector according to test requirements. When the magnet is connected to the concave side of the first bend, the first drive motor drives the rotating ring to rotate, causing the sliding sleeve to slide away from the first bend along the axial direction of the guide rod via multiple actuating teeth and multiple actuated teeth, thereby causing the first bend to actively deform via the magnet. During this process, the spring is gradually compressed. As the sliding sleeve continues to slide away from the first bend, the outer wall of the first insulating cylinder forces the concave side of the first bend to disconnect from the magnet, allowing the first bend to spontaneously reset. When the first drive motor continues to drive the rotating ring to rotate, all the actuating teeth disengage from the actuated teeth. The force of the spring restoring the deformation drives the sliding sleeve to slide along the axial direction of the guide rod towards the first bend, so as to drive the magnet to move towards the concave side of the first bend, so that the magnet can reconnect with the concave side of the first bend.

[0026] 4. By adding a reed damping mechanism, multiple first elastic connecting parts can lose their elasticity and become rigid, thus achieving a static test or calibration test reference position. When multiple first elastic connecting parts need to lose their deformation capacity, the second drive motor drives two screw jacks through a right-angle commutator to work, causing the top rod to move upward and the pressure rod to move downward, so that the top end of the top rod abuts against the bottom end of the first connecting part of multiple first elastic connecting parts, and the bottom end of the pressure rod abuts against the top end of the second connecting part of multiple first elastic connecting parts. When multiple first elastic connecting parts need to regain their deformation capacity, the second drive motor drives two screw jacks through a right-angle commutator to work, causing the top rod to move downward and the pressure rod to move upward, so that the top end of the top rod disengages from the bottom end of the first connecting part of multiple first elastic connecting parts, and the bottom end of the pressure rod disengages from the top end of the second connecting part of multiple first elastic connecting parts. Attached Figure Description

[0027] Figure 1 This is a schematic diagram of an embodiment of an insulated gate bipolar transistor (IGBT) test apparatus; Figure 2 yes Figure 1 A schematic diagram of the first elastic connection component in the insulated gate bipolar transistor test device shown; Figure 3 yes Figure 1 A schematic diagram of the structure of the second flexible connection component in the insulated gate bipolar transistor test device shown; Figure 4 yes Figure 1The diagram shows the combined structure of the fixture, the first elastic connection component, and the second elastic connection component in the insulated gate bipolar transistor test device. Figure 5 yes Figure 4 The diagram shows a structural schematic of the mounting base from another perspective; Figure 6 yes Figure 4 A sectional view of the mounting bracket shown; Figure 7 This is a schematic diagram of another embodiment of the insulated gate bipolar transistor test apparatus; Figure 8 yes Figure 7 The diagram shows the structure of the insulated gate bipolar transistor test device in use. Figure 9 This is a schematic diagram of the combined structure of the reed actuation mechanism and the first elastic connector; Figure 10 yes Figure 9 A magnified view of a portion of region A in the middle; Figure 11 This is a schematic diagram of the combined structure of the reed actuation mechanism and the first elastic connector; Figure 12 yes Figure 11 A magnified view of a portion of region B in the middle.

[0028] Reference numerals: 110, Test circuit board; 120, Fixing base; 121, Pressure plate; 1211, Receiving hole; 12111, Lower limit groove; 12112, Upper limit groove; 1212, First positioning hole; 122, Base plate; 1221, Clearance hole; 1222, Positioning pin; 123, Elastic pressure strip; 130, First elastic connecting assembly; 131, First elastic connector; 1311, First bending portion; 1312, First connecting portion; 1313, First lifting portion; 1314, Second connecting portion; 1315, First pressing portion; 13151, First contact protrusion; 140, Second elastic connecting assembly; 141, Second elastic connector; 1411, Second bending portion; 1412, Third connecting portion; 1413, First... 1414. Second lifting part; 1415. Fourth connecting part; 1416. Second pressing part; 14151. Second contact protrusion; 150. Third elastic connecting assembly; 160. Fourth elastic connecting assembly; 170. Top cover; 171. Second positioning hole; 180. Spring actuation mechanism; 181. First isolation cylinder; 182. Guide rod; 183. Sliding sleeve; 1831. Actuated tooth; 184. Magnet; 185. Spring; 186. Rotating ring; 1861. Actuating tooth; 187. First drive motor; 190. Spring damping mechanism; 191. Second isolation cylinder; 192. Second drive motor; 193. Right angle commutator; 194. Screw jack; 195. Top rod; 196. Pressure rod; 200. Insulated gate bipolar transistor under test. Detailed Implementation

[0029] It should be noted in advance that existing insulated gate bipolar transistors have a collector on one side and a gate and emitter on the other side.

[0030] The following is in conjunction with the appendix Figure 1-12 This application will be described in further detail.

[0031] Reference Figure 1This application discloses an insulated-gate bipolar transistor (IGBT) testing device, including a test circuit board 110 and two mounting bases 120. The test circuit board 110 serves both as a support and as an electrical connection between the IGBT 200 under test and external testing equipment. Both mounting bases 120 are elongated structures, respectively mounted on opposite sides of the top surface of the test circuit board 110. Each mounting base 120 has multiple receiving holes 1211 along its length. At least one receiving hole 1211 of one of the mounting bases 120 houses a first elastic connection component 130, and at least one receiving hole 1211 houses a second elastic connection component 140. The top end of the first elastic connection component 130 abuts against the collector of the IGBT 200 under test, and the bottom end abuts against the test circuit board 110. The top end of the second elastic connection component 140 abuts against the collector of the IGBT 200 under test, and the bottom end abuts against the test circuit board 110. A third elastic connection component 150 is installed in at least one receiving hole 1211 of the mounting base 120 on the other side, and a fourth elastic connection component 160 is installed in at least one receiving hole 1211. The top end of the third elastic connection component 150 abuts against the gate of the insulated-gate bipolar transistor 200 under test, and the bottom end abuts against the test circuit board 110. The top end of the fourth elastic connection component 160 abuts against the emitter of the insulated-gate bipolar transistor 200 under test, and the bottom end abuts against the test circuit board 110. The first elastic connection component 130 and the second elastic connection component 140 serve to electrically connect the test circuit board 110 and the collector of the insulated-gate bipolar transistor 200 under test. The third elastic connection component 150 serves to electrically connect the test circuit board 110 and the gate of the insulated-gate bipolar transistor 200 under test. The fourth elastic connection component 160 serves to electrically connect the test circuit board 110 and the emitter of the insulated-gate bipolar transistor 200 under test. After the insulated-gate bipolar transistor (IGBT) 200 under test is placed on the first elastic connection component 130, the second elastic connection component 140, the third elastic connection component 150, and the fourth elastic connection component 160, each of these components adaptively deforms to compensate for installation position errors, avoiding poor local contact or excessive local interaction forces, thus improving the test success rate and preventing damage to the IGBT. Furthermore, the multiple first elastic connection components 130 work together to distribute the current density and load, preventing local overheating and excessive local stress, thereby improving current carrying capacity and load capacity. Similarly, the multiple third elastic connection components 150 work together to distribute the current density and load, preventing local overheating and excessive local stress, thus improving current carrying capacity and load capacity.

[0032] Reference Figure 1 and Figure 2 In one embodiment, each first elastic connection assembly 130 includes a plurality of first elastic connectors 131 arranged in parallel. The top ends of the plurality of first elastic connectors 131 respectively abut against the collector of the insulated gate bipolar transistor 200 under test, and the bottom ends respectively abut against the test circuit board 110. Each first elastic connector 131 adaptively deforms, autonomously compensating for installation position errors, avoiding local poor contact or excessive local interaction forces, improving the test success rate, and preventing damage to the insulated gate bipolar transistor. Moreover, the plurality of first elastic connectors 131 cooperate with each other to distribute current density and load, avoiding local overheating and excessive local stress, and improving current carrying capacity and load capacity. Each third elastic connection assembly 150 has the same structure as each first elastic connection assembly 130.

[0033] Reference Figure 1 and Figure 3 In one embodiment, each second elastic connection assembly 140 includes two second elastic connectors 141 arranged side by side. The top ends of the two second elastic connectors 141 abut against the collector of the insulated gate bipolar transistor 200 under test, and the bottom ends abut against the test circuit board 110, respectively. Each fourth elastic connection assembly 160 has the same structure as each second elastic connection assembly 140.

[0034] Reference Figure 2In one embodiment, each first elastic connector 131 is made of carbon spring steel, alloy spring steel, or stainless steel. Each first elastic connector 131 includes a first bending portion 1311, a first connecting portion 1312, a first lifting portion 1313, a second connecting portion 1314, and two first pressing portions 1315. The first bending portion 1311 has an arc-shaped structure. The first connecting portion 1312 is horizontally arranged, with one end fixedly connected to one end of the first bending portion 1311. The first lifting portion 1313 is vertically arranged, with its bottom end fixedly connected to the other end of the first connecting portion 1312, and its top end used to support the insulated gate bipolar transistor 200 under test. The second connecting portion 1314 is horizontally arranged, with its top end fixedly connected to the other end of the first bending portion 1311. Both first pressing portions 1315 are horizontally arranged, with their top ends fixedly connected to the bottom ends of the opposite ends of the second connecting portions 1314, and their bottom ends pressing against the top surface of the test circuit board 110. When the bottom surface of the insulated-gate bipolar transistor 200 under test contacts the first lifting portion 1313, the first bending portion 1311 can deform to ensure good contact between the first elastic connector 131 and the insulated-gate bipolar transistor 200 and the test circuit board 110, respectively, and to prevent the first elastic connector 131 from applying excessive force to the insulated-gate bipolar transistor 200 / test circuit board 110. Multiple first contact protrusions 13151 are formed at the bottom end of each first pressing portion 1315. These multiple first contact protrusions 13151 increase the friction between the bottom surface of the first pressing portion 1315 and the top surface of the test circuit board 110, preventing large horizontal displacement of the first pressing portion 1315 and ensuring good contact between the first pressing portion 1315 and the test circuit board 110.

[0035] Reference Figure 3In one embodiment, each second elastic connector 141 is made of carbon spring steel, alloy spring steel, or stainless steel. Each second elastic connector 141 includes a second bent portion 1411, a third connecting portion 1412, a second lifting portion 1413, a fourth connecting portion 1414, and two second pressing portions 1415. The second bent portion 1411 has an arc-shaped structure. The third connecting portion 1412 is horizontally arranged, with one end fixedly connected to one end of the second bent portion 1411. The second lifting portion 1413 is vertically arranged, with its bottom end fixedly connected to the other end of the third connecting portion 1412, and its top end used to support the insulated gate bipolar transistor 200 under test. The fourth connecting portion 1414 is horizontally arranged, with its top end fixedly connected to the other end of the second bent portion 1411. Both second pressing portions 1415 are horizontally arranged, with their top ends fixedly connected to the bottom ends of the opposite ends of the fourth connecting portion 1414, respectively. When the bottom surface of the insulated-gate bipolar transistor 200 under test contacts the second lifting portion 1413, the second bending portion 1411 can deform to ensure good contact between the second elastic connector 141 and the insulated-gate bipolar transistor 200 and the test circuit board 110, respectively, and to prevent the second elastic connector 141 from applying excessive force to the insulated-gate bipolar transistor 200 / test circuit board 110. Multiple second contact protrusions 14151 are formed at the bottom end of each second pressing portion 1415. These multiple second contact protrusions 14151 increase the friction between the bottom surface of the second pressing portion 1415 and the top surface of the test circuit board 110, preventing large displacement of the second pressing portion 1415 in the horizontal direction and ensuring good contact between the second pressing portion 1415 and the test circuit board 110.

[0036] Reference Figure 4 , Figure 5 and Figure 6 In one embodiment, each mounting base 120 includes a pressure plate 121 and a base plate 122. The pressure plate 121 has a plurality of receiving holes 1211 formed along its length. The base plate 122 is detachably mounted to the bottom end of the pressure plate 121 to facilitate the assembly, use, disassembly, and replacement of the base plate 122, pressure plate 121, first elastic connecting assembly 130, second elastic connecting assembly 140, third elastic connecting assembly 150, and fourth elastic connecting assembly 160. Avoidance holes 1221 are formed on opposite sides of the base plate 122 to avoid the first pressing portion 1315 / second pressing portion 1415. Elastic pressure strips 123 are respectively provided on the inner walls of opposite sides of each receiving hole 1211. The elastic pressure strips 123 on both sides apply a downward force to the pressing portions on both sides to ensure that the pressing portions on both sides can make good contact with the test circuit board 110. Compared to using rigid pressure strips, this extends the service life of the elastic connectors.

[0037] Preferably, the elastic strip 123 is made of rubber or silicone.

[0038] Preferably, each receiving hole 1211 has a lower limiting groove 12111 formed at its lower part to limit the upward movement of each first pressing part 1315 / each second pressing part 1415, and an upper limiting groove 12112 formed in the middle part to limit the upward movement of the second connecting part 1314 / fourth connecting part 1414. The elastic pressure strip 123 is installed in the lower limiting groove 12111.

[0039] Preferably, a first positioning hole 1212 is formed on the pressure plate 121, and a positioning pin 1222 is formed at the top of the base plate 122. When assembling the base plate 122 and the pressure plate 121, the positioning pin 1222 and the first positioning hole 1212 cooperate to play a positioning and assembly role, thereby improving the assembly accuracy and assembly efficiency.

[0040] Reference Figure 7 and Figure 8 In one embodiment, the insulated gate bipolar transistor (IGBT) test apparatus further includes a top cover 170. The top cover 170 is detachably mounted on the top of the test circuit board 110 to facilitate its installation and removal. The top cover 170 covers the outside of the mounting base 120, the first elastic connection assembly 130, the second elastic connection assembly 140, the third elastic connection assembly 150, and the fourth elastic connection assembly 160, providing protection. The top cover 170 has clearance holes for the top ends of the first elastic connection assembly 130, the second elastic connection assembly 140, the third elastic connection assembly 150, and the fourth elastic connection assembly 160 to protrude.

[0041] Preferably, the top cover 170 and the test circuit board 110 are detachably connected by means of bolts, snap-fit, or plug-in.

[0042] Preferably, a second positioning hole 171 is formed on the top cover 170. When assembling the top cover 170 and the test circuit board 110, the positioning pin 1222 and the second positioning hole 171 cooperate to perform positioning assembly, thereby improving assembly accuracy and assembly efficiency.

[0043] Reference Figure 9 and Figure 10In another embodiment, at least one reed actuation mechanism 180 is installed within a receiving hole 1211. The reed actuation mechanism 180 can be connected to or disconnected from the recessed side of the first curved portion 1311 of a plurality of first elastic connectors 131. When the reed actuation mechanism 180 is connected to the recessed side of the first curved portion 1311, it can drive the first curved portion 1311 to actively deform. In this way, the electrical performance of the insulated gate bipolar transistor under different contact stresses can be verified, height differences can be actively compensated, and the elastic coefficient of the first elastic connector 131 can be adjusted according to test requirements. Each reed actuation mechanism 180 includes a first isolation cylinder 181, a guide rod 182, a sliding sleeve 183, a magnet 184, a spring 185, a rotating ring 186, and a first drive motor 187. The first isolation cylinder 181 is installed within the receiving hole 1211, and a through hole is formed on the side near the recessed side of the first curved portion 1311 to serve as an isolation function. A guide rod 182 is installed inside the first isolation cylinder 181, and its axial direction is the same as the radial direction of the first isolation cylinder 181. A sliding sleeve 183 is slidably fitted onto the guide rod 182 along its axial direction, and a plurality of teeth 1831 are formed on its outer wall in the middle. A magnet 184 is fixed to one end of the sliding sleeve 183 near the recessed side of the first bend 1311, and can connect or disconnect with the recessed side of the first bend 1311 as the sliding sleeve 183 moves. A spring 185 is fitted onto the guide rod 182, one end of which is fixedly connected to the inner wall of the first isolation cylinder 181, and the other end of which is fixedly connected to the end of the sliding sleeve 183 away from the recessed side of the first bend 1311. A rotating ring 186 is rotatably disposed inside the first isolation cylinder 181, and a plurality of teeth 1861 are formed on its outer wall. The first drive motor 187 is installed inside the first isolation cylinder 181, and its output shaft is fixedly connected to the rotating ring 186 to drive the rotating ring 186 to rotate. When the magnet 184 is connected to the concave side of the first curved portion 1311, the first drive motor 187 drives the rotating ring 186 to rotate. Through multiple actuating teeth 1861 and multiple actuated teeth 1831, the sliding sleeve 183 slides away from the first curved portion 1311 along the axial direction of the guide rod 182, thereby causing the first curved portion 1311 to actively deform through the magnet 184. During this process, the spring 185 is gradually compressed. When the sliding sleeve 183 continues to slide away from the first curved portion 1311, the outer wall of the first isolation cylinder 181 forces the concave side of the first curved portion 1311 to disconnect from the magnet 184, so that the first curved portion 1311 spontaneously resets.When the first drive motor 187 continues to drive the rotating ring 186 to rotate, all the actuating teeth 1861 disengage from the actuated teeth 1831. The force of the spring 185 restoring the deformation drives the sliding sleeve 183 to slide along the axial direction of the guide rod 182 toward the direction close to the first curved part 1311, so as to drive the magnet 184 toward the concave side of the first curved part 1311, so that the magnet 184 can reconnect with the concave side of the first curved part 1311.

[0044] Reference Figure 11 and Figure 12In another embodiment, at least one reed damping mechanism 190 is installed within a receiving hole 1211. The reed damping mechanism 190 abuts against the bottom end of the first connecting portion 1312 and the top end of the second connecting portion 1314 of the plurality of first elastic connectors 131, respectively, to prevent deformation of the first bending portion 1311, causing the plurality of first elastic connectors 131 to lose elasticity and become rigid members, thereby achieving a static test or calibration test reference position. Each reed damping mechanism 190 includes a second isolation cylinder 191, a second drive motor 192, a right-angle commutator 193, two screw jacks 194, a top rod 195, and a pressure rod 196. The second isolation cylinder 191 is installed within the receiving hole 1211, serving an isolation function. The second drive motor 192 is installed within the second isolation cylinder 191. The input shaft of the right-angle commutator 193 is fixedly connected to the output shaft of the second drive motor 192. Two screw jacks 194 are respectively disposed on opposite sides inside the isolation cylinder. The input shaft of one screw jack 194 is fixedly connected to one of the output shafts of the right-angle commutator 193. The input shaft of the other screw jack 194 is fixedly connected to the other output shaft of the right-angle commutator 193. The bottom end of the push rod 195 is fixedly connected to the screw head flange of one of the screw jacks 194, and the top end can abut against the bottom end of the first connecting portion 1312 of the plurality of first elastic connectors 131. The top end of the pressure rod 196 is fixedly connected to the screw head flange of the other screw jack 194, and the bottom end can abut against the top end of the second connecting portion 1314 of the plurality of first elastic connectors 131. When multiple first elastic connectors 131 need to lose their deformation capacity, the second drive motor 192 drives two screw jacks 194 to work through the right-angle commutator 193, so as to drive the top rod 195 to move upward and drive the pressure rod 196 to move downward, so that the top end of the top rod 195 abuts against the bottom end of the first connecting part 1312 of multiple first elastic connectors 131, and the bottom end of the pressure rod 196 abuts against the top end of the second connecting part 1314 of multiple first elastic connectors 131. When multiple first elastic connectors 131 need to restore their deformation capacity, the second drive motor 192 drives two screw jacks 194 to work through the right-angle commutator 193, so as to drive the top rod 195 to move downward and drive the pressure rod 196 to move upward, so that the top end of the top rod 195 disengages from the bottom end of the first connecting part 1312 of the multiple first elastic connectors 131, and the bottom end of the pressure rod 196 disengages from the top end of the second connecting part 1314 of the multiple first elastic connectors 131.

[0045] The implementation principle of this embodiment is as follows: the first elastic connection component 130 and the second elastic connection component 140 serve as the collectors of the test circuit board 110 and the insulated-gate bipolar transistor 200 under test. The third elastic connection component 150 serves as the gate of the test circuit board 110 and the insulated-gate bipolar transistor 200 under test. The fourth elastic connection component 160 serves as the emitter of the test circuit board 110 and the insulated-gate bipolar transistor 200 under test. After the insulated-gate bipolar transistor 200 under test is placed on the first elastic connection component 130, the second elastic connection component 140, the third elastic connection component 150, and the fourth elastic connection component 160, each of these components adaptively deforms to compensate for installation position errors, avoiding poor local contact or excessive local interaction forces, thus improving the test success rate and preventing damage to the insulated-gate bipolar transistor. Furthermore, the multiple first elastic connection components 130 cooperate with each other to disperse the current density and load, preventing local overheating and excessive local stress, thereby improving the current carrying capacity and load capacity. Similarly, the multiple third elastic connection components 150 cooperate with each other to disperse the current density and load, preventing local overheating and excessive local stress, thereby improving the current carrying capacity and load capacity.

[0046] The embodiments described herein are preferred embodiments of the present invention and are not intended to limit the scope of protection of the present invention. Therefore, all equivalent changes made in accordance with the structure, shape, and principle of the present invention should be covered within the scope of protection of the present invention.

Claims

1. A testing device for an insulated gate bipolar transistor, characterized in that, include: Test circuit board (110); There are two mounting bases (120), both of which are elongated structures, and are respectively installed on opposite sides of the top surface of the test circuit board (110). Each mounting base (120) has multiple receiving holes (1211) along its length. At least one receiving hole (1211) of the mounting base (120) on one side is equipped with a first elastic connecting component (130), and at least one receiving hole (1211) is equipped with a second elastic connecting component (140). At least one receiving hole (1211) of the mounting base (120) on the other side is equipped with a third elastic connecting component (150), and at least one receiving hole (1211) is equipped with a fourth elastic connecting component (160). The top end of the first elastic connection component (130) abuts against the collector of the insulated gate bipolar transistor (200) under test, and the bottom end abuts against the test circuit board (110); the top end of the second elastic connection component (140) abuts against the collector of the insulated gate bipolar transistor (200) under test, and the bottom end abuts against the test circuit board (110); the top end of the third elastic connection component (150) abuts against the gate of the insulated gate bipolar transistor (200) under test, and the bottom end abuts against the test circuit board (110); the top end of the fourth elastic connection component (160) abuts against the emitter of the insulated gate bipolar transistor (200) under test, and the bottom end abuts against the test circuit board (110).

2. The insulated gate bipolar transistor test apparatus according to claim 1, characterized in that, Each of the first elastic connection components (130) includes a plurality of first elastic connectors (131) arranged in parallel; the top ends of the plurality of first elastic connectors (131) respectively abut against the collector of the insulated gate bipolar transistor (200) under test, and the bottom ends respectively abut against the test circuit board (110); each of the third elastic connection components (150) has the same structure as each of the first elastic connection components (130); each of the second elastic connection components (140) includes two second elastic connectors (141) arranged in parallel; the top ends of the two second elastic connectors (141) respectively abut against the collector of the insulated gate bipolar transistor (200) under test, and the bottom ends respectively abut against the test circuit board (110); each of the fourth elastic connection components (160) has the same structure as each of the second elastic connection components (140).

3. The insulated gate bipolar transistor testing apparatus according to claim 2, characterized in that, Each of the first resilient connectors (131): The first curved section (1311) has an arc-shaped structure; The first connecting part (1312) is horizontally arranged, and one end is fixedly connected to one end of the first curved part (1311); The first lifting part (1313) is vertically arranged, and its bottom end is fixedly connected to the other end of the first connecting part (1312); The second connecting part (1314) is horizontally arranged, and its top end is fixedly connected to the other end of the first curved part (1311); There are two first pressing parts (1315), both of which are horizontally arranged, and their top ends are fixedly connected to the bottom ends of the opposite ends of the second connecting part (1314); each of the first pressing parts (1315) has a plurality of first contact protrusions (13151) formed at its bottom end.

4. The insulated gate bipolar transistor testing apparatus according to claim 2, characterized in that, Each of the second resilient connectors (141): The second curved section (1411) has an arc-shaped structure; The third connecting part (1412) is horizontally arranged, and one end is fixedly connected to one end of the second curved part (1411); The second lifting part (1413) is vertically arranged, and its bottom end is fixedly connected to the other end of the third connecting part (1412); The fourth connecting part (1414) is horizontally arranged, and its top end is fixedly connected to the other end of the second curved part (1411); There are two second pressing parts (1415), both of which are horizontally arranged, and their top ends are fixedly connected to the bottom ends of the opposite ends of the fourth connecting part (1414); each second pressing part (1415) has a plurality of second contact protrusions (14151) formed at its bottom end.

5. The insulated gate bipolar transistor test apparatus according to any one of claims 1 to 4, characterized in that, Each of the said mounting bases (120) includes: The pressure plate (121) has a plurality of receiving holes (1211) formed along its length; each of the receiving holes (1211) has an elastic pressure strip (123) provided on the inner walls of opposite sides; The base plate (122) is detachably installed at the bottom end of the pressure plate (121), and clearance holes (1221) are formed on opposite sides.

6. The insulated gate bipolar transistor test apparatus according to any one of claims 1 to 4, characterized in that, Also includes: A top cover (170) is detachably mounted on the top of the test circuit board (110) and covers the outside of the mounting base (120), the first elastic connection component (130), the second elastic connection component (140), the third elastic connection component (150), and the fourth elastic connection component (160); the top cover (170) has clearance holes for the top ends of the first elastic connection component (130), the second elastic connection component (140), the third elastic connection component (150), and the fourth elastic connection component (160) to protrude.

7. The insulated gate bipolar transistor test apparatus according to claim 3, characterized in that, At least one of the receiving holes (1211) is equipped with a reed actuating mechanism (180); the reed actuating mechanism (180) is capable of being connected to or disconnected from the recessed side of the first curved portion (1311) of the plurality of first elastic connectors (131); when the reed actuating mechanism (180) is connected to the recessed side of the first curved portion (1311), it is capable of driving the first curved portion (1311) to deform.

8. The insulated gate bipolar transistor test apparatus according to claim 7, characterized in that, Each of the reed actuation mechanisms (180) includes: The first isolation cylinder (181) is installed in the receiving hole (1211), and a through hole is formed on the side near the recessed side of the first curved part (1311); The guide rod (182) is installed inside the first isolation cylinder (181), and its axial direction is the same as that of the first isolation cylinder (181) radial direction; The sliding sleeve (183) is slidably sleeved on the guide rod (182) along the axial direction, and a plurality of teeth (1831) are formed on the outer wall of the middle part; A magnet (184) is fixed to one end of the sliding sleeve (183) near the recessed side of the first bend (1311). As the sliding sleeve (183) moves, it can connect or disconnect with the recessed side of the first bend (1311). A spring (185) is sleeved on the guide rod (182), with one end fixedly connected to the inner wall of the first isolation cylinder (181) and the other end fixedly connected to the end of the sliding sleeve (183) away from the recessed side of the first curved part (1311). A rotating ring (186) is rotatably disposed inside the first isolation cylinder (181), and a plurality of actuating teeth (1861) are formed on its outer wall; The first drive motor (187) is installed inside the first isolation cylinder (181), and its output shaft is fixedly connected to the rotating ring (186) to drive the rotating ring (186) to rotate.

9. The insulated gate bipolar transistor test apparatus according to claim 3, characterized in that, At least one of the receiving holes (1211) is equipped with a spring damping mechanism (190); the spring damping mechanism (190) can abut against the bottom end of the first connecting portion (1312) of the plurality of first elastic connectors (131) and the top end of the second connecting portion (1314) of the plurality of first elastic connectors (131) respectively, so as to prevent the first bending portion (1311) from deforming.

10. The insulated gate bipolar transistor test apparatus according to claim 9, characterized in that, Each of the reed damping mechanisms (190) includes: The second isolation cylinder (191) is installed inside the receiving hole (1211); The second drive motor (192) is installed inside the second isolation cylinder (191); The input shaft of the right-angle commutator (193) is fixedly connected to the output shaft of the second drive motor (192); There are two screw jacks (194), which are respectively installed on opposite sides inside the isolation cylinder; the input shaft of one screw jack (194) is fixedly connected to one of the output shafts of the right angle commutator (193); the input shaft of the other screw jack (194) is fixedly connected to the other output shaft of the right angle commutator (193); The top rod (195) is fixedly connected at its bottom end to the screw head flange of one of the screw jacks (194), and at its top end can abut against the bottom end of the first connecting part (1312) of the plurality of first elastic connecting members (131). The pressure rod (196) is fixedly connected at its top end to the screw head flange of another screw jack (194), and its bottom end is able to abut against the top end of the second connection portion (1314) of a plurality of first elastic connectors (131).

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