Optical power measurement methods, control devices, and optical power measurement equipment

Abstract

This invention discloses an optical power measurement method, control device, and optical power measurement equipment, relating to the field of optical power measurement technology. The optical power measurement equipment includes multiple signal conditioning circuits, each including a photoelectric conversion circuit, an optical power detection circuit, and an analog-to-digital conversion circuit. The method generates and sends hard-timing pulses in response to a trigger signal, controlling each channel to sequentially complete photoelectric conversion, voltage conversion, and analog-to-digital conversion, and filtering the digital signal. Subsequently, the operating temperature, temperature compensation coefficient, and calibration coefficient containing multiple sub-coefficients are acquired, and temperature compensation is performed on the signal. Then, based on the power range of the signal, the corresponding sub-calibration coefficients are matched, and the optical power measurement signal is calculated through linear fitting and transmitted to the host computer. Thus, the technical solution of this invention can solve the problems of low accuracy, narrow dynamic range, and large temperature drift error in existing multi-channel power meter measurement equipment for synchronous optical power measurement.

Description

Technical Field

[0001] This invention relates to the field of optical power measurement technology, and in particular to an optical power measurement method, control device, and optical power measurement equipment. Background Technology

[0002] In modern electronic systems, multi-channel optical power synchronous measurement is a crucial step in ensuring the stability of electronic system performance. It must simultaneously meet the core requirements of 32-channel expansion, nanosecond-level synchronization, high-speed sampling, high precision, large dynamic range, and real-time transmission. Existing multi-channel power meter measurement equipment has unavoidable shortcomings, primarily manifested in the contradiction between multi-channel synchronization and sampling rate. Current multi-channel power meter measurement equipment is mostly designed for 8 to 16 channels. When expanded to 32 channels, it typically employs time-division multiplexing or distributed control architecture, resulting in a synchronization delay between channels exceeding 20 microseconds. This fails to meet the synchronous measurement requirements of multi-channel power meter measurement equipment, and its sampling rate is less than or equal to 10 kSps (10,000 samples per second), making it difficult to adapt to the dynamic monitoring needs of high-speed signals. Furthermore, the dynamic range and measurement accuracy of traditional multi-channel power meter measurement devices are significantly limited. They generally employ a combination of ordinary power detection chips and 12-bit low-resolution analog-to-digital converters, achieving a dynamic range of only 50 to 60 dB, corresponding to a power range of approximately -50 dB / mW to +10 dB / mW. This fails to cover application scenarios where weak signals such as -70 dB / mW coexist with strong signals. Simultaneously, power detection chips exhibit significant temperature drift, with a temperature drift coefficient greater than 0.1 dB / degree Celsius, resulting in an overall measurement error greater than or equal to ±0.5 dB. Although the combination of a wide dynamic range logarithmic power detection chip and a high-resolution analog-to-digital converter holds the potential for high speed and high accuracy, current technology has not effectively resolved key issues such as synchronization control, signal matching, and error compensation encountered during 32-channel integration, failing to fully leverage the performance advantages of the core components. Summary of the Invention

[0003] The main objective of this invention is to propose an optical power measurement method, control device, and optical power measurement equipment, aiming to solve the problems of low accuracy, narrow dynamic range, and large temperature drift error in the synchronous measurement of optical power in existing multi-channel power meter measurement equipment.

[0004] To achieve the above objectives, the present invention proposes an optical power measurement method for use in an optical power measurement device. The optical power measurement device includes multiple signal conditioning circuits, each of which includes a photoelectric conversion circuit, an optical power detection circuit, and an analog-to-digital conversion circuit. The optical power measurement method includes: In response to a trigger signal input from an external device, concurrent hard timing control pulses are generated to control each of the photoelectric conversion circuits to convert the input optical signal into an electrical signal, control the corresponding optical power detection circuit to convert the electrical signal into an analog voltage signal, and control the corresponding analog-to-digital conversion circuit to convert the analog voltage signal into a digital signal for output. Perform filtering processing on each digital signal; The operating temperature of each optical power detection circuit is obtained, as well as multiple preset temperature compensation coefficients and multiple preset calibration coefficients. Each preset calibration coefficient includes multiple preset sub-calibration coefficients that correspond one-to-one with multiple different power ranges. Based on the operating temperature of the optical power detection circuit and the corresponding preset temperature compensation coefficient, temperature compensation is performed on the filtered digital signal. Determine the power range corresponding to the temperature-compensated digital signal, and match the preset sub-calibration coefficient corresponding to the power range; The optical power measurement signal is obtained by linearly fitting the temperature-compensated digital signal using the matched preset sub-calibration coefficients. The optical power measurement signals are transmitted to the host computer.

[0005] In one embodiment, determining the power range corresponding to the temperature-compensated digital signal and matching the preset sub-calibration coefficient corresponding to the power range includes: When the temperature-compensated digital signal fluctuates at the boundary between two adjacent power ranges, a preset delay switching threshold is used to perform a hysteresis comparison on the digital signal. If the fluctuation amplitude of the digital signal does not exceed the delay switching threshold, the current power range and the corresponding preset sub-calibration coefficient remain unchanged. If the fluctuation amplitude of the digital signal exceeds the delay switching threshold, the digital signal is switched to another adjacent power range and matched with the corresponding preset sub-calibration coefficient.

[0006] In one embodiment, before filtering each digital signal, the optical power measurement method further includes: Obtain the channel transmission delay skew value corresponding to each of the analog-to-digital conversion circuits; Based on the channel transmission delay skew value, the timing of each digital signal is compensated for channel-by-channel delay so that the sampling time base of each digital signal is aligned. The filtering process for each digital signal includes: Parallel filtering is performed on each of the time-base aligned digital signals to suppress electromagnetic crosstalk signals between channels.

[0007] In one embodiment, prior to responding to a trigger signal input from an external device, the optical power measurement method further includes: In response to the calibration command issued by the host computer, the standard power source is controlled to input multiple preset power point signals covering each of the power ranges into each of the signal conditioning circuits; Obtain the sampling voltage of each optical power detection circuit at each preset power point, and obtain the sampling temperature of each optical power detection circuit; For each of the signal conditioning circuits, using the sampling voltage and the sampling temperature, and combining the mapping relationship between the corresponding preset power point and the power range, the multi-segment preset sub-calibration coefficients of each signal conditioning circuit under multiple different power ranges are generated by least squares fitting.

[0008] In one embodiment, the optical power measurement method further includes: At preset intervals, the operating temperature of each optical power detection circuit is acquired, and the corresponding preset temperature compensation coefficient is updated based on the operating temperature.

[0009] In one embodiment, transmitting each of the optical power measurement signals to the host computer includes: The converted optical power measurement signals are encapsulated with the corresponding signal conditioning circuit identification information, timestamp, and operating temperature to generate Ethernet data packets. The Ethernet data packets are output to the host computer via the Ethernet interface in either real-time streaming mode or triggered transmission mode. In real-time streaming mode, the Ethernet data packets are uploaded at a preset sampling frequency. In triggered transmission mode, the upload of the Ethernet data packets is initiated when an external trigger command is received or when any of the optical power measurement signals reaches a preset threshold.

[0010] In one embodiment, transmitting the optical power measurement signal to the host computer further includes: When any of the optical power measurement signals exceeds a preset safety threshold, an alarm signal is output and an abnormal flag is added to the corresponding Ethernet data packet.

[0011] The present invention also proposes a control device, including a processor and a memory, wherein the memory stores an optical power measurement control program, and when the optical power measurement control program is executed by the processor, the optical power measurement method described above is implemented.

[0012] The present invention also proposes an optical power measurement device, comprising: Multiple signal conditioning circuits are provided, each of which includes a photoelectric conversion circuit, an optical power detection circuit, and an analog-to-digital conversion circuit. The output terminal of the photoelectric conversion circuit is connected to the input terminal of the optical power detection circuit, and the output terminal of the optical power detection circuit is connected to the input terminal of the analog-to-digital conversion circuit. The photoelectric conversion circuit is used to convert the input optical signal into an electrical signal, the optical power detection circuit is used to convert the electrical signal into an analog voltage signal, and the analog-to-digital conversion circuit is used by the analog conversion unit to convert the analog voltage signal into a digital signal and then output it. As described above, the input terminal of the control device is connected to the output terminal of each of the analog-to-digital conversion circuits.

[0013] In one embodiment, each of the signal conditioning circuits further includes a temperature detection circuit, which is used to detect the operating temperature of the optical power detection circuit and output a corresponding temperature detection signal to the control device; the control device is used to perform temperature compensation on the corresponding digital signal according to the operating temperature of the temperature detection circuit.

[0014] The technical solution of this invention generates concurrent hard-timing control pulses in response to trigger signals input from external devices. This unified control of the photoelectric conversion circuit, optical power detection circuit, and analog-to-digital conversion circuit in each signal conditioning circuit ensures coordinated operation. This allows the multi-channel optical power measurement device to maintain nanosecond-level synchronization and improve the sampling rate even when expanded to thirty-two channels, alleviating the contradiction between multi-channel synchronization and sampling rate. Simultaneously, each digital signal is filtered, and temperature compensation is performed on the filtered digital signals based on the operating temperature of each optical power detection circuit and the corresponding preset temperature compensation coefficient, reducing measurement errors caused by temperature drift. Furthermore, the corresponding power range is determined based on the temperature-compensated digital signal, and a preset sub-calibration coefficient corresponding to this power range is matched. The optical power measurement signal is obtained by linear fitting of the temperature-compensated digital signal using the matched preset sub-calibration coefficient, which widens the dynamic range and improves the measurement accuracy. This improves the problems of low synchronous measurement accuracy, narrow dynamic range, and large temperature drift error in existing multi-channel power meter measurement devices. Attached Figure Description

[0015] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on the structures shown in these drawings without creative effort.

[0016] Figure 1 The flowchart of the optical power measurement method provided by the present invention Figure 1; Figure 2 The flowchart of the optical power measurement method provided by the present invention Figure 2 ; Figure 3 The flowchart of the optical power measurement method provided by the present invention Figure 3 ; Figure 4 The flowchart of the optical power measurement method provided by the present invention Figure 4 ; Figure 5 The flowchart of the optical power measurement method provided by the present invention Figure 5 ; Figure 6 The flowchart of the optical power measurement method provided by the present invention Figure 6 ; Figure 7 The flowchart of the optical power measurement method provided by the present invention Figure 7 ; Figure 8 The flowchart of the optical power measurement method provided by the present invention Figure 8 ; Figure 9 A schematic diagram of the circuit functional modules of an embodiment of the control device provided by the present invention; Figure 10 A schematic diagram of the circuit functional modules of an embodiment of the optical power measurement device provided by the present invention; Figure 11 A circuit diagram of an embodiment of the optical power measurement device provided by the present invention.

[0017] Explanation of icon numbers: 100. Optical power measurement device; 10. Signal conditioning circuit; 11. Photoelectric conversion circuit; 12. Optical power detection circuit; 13. Analog-to-digital conversion circuit; 14. Temperature detection circuit; 15. First filter circuit; 16. Second filter circuit; 20. Control device; 21. Processor; 22. Memory.

[0018] The realization of the objective, functional features and advantages of the present invention will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0019] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present invention.

[0020] In modern electronic systems, multi-channel optical power synchronous measurement is a crucial step in ensuring the stability of electronic system performance. It must simultaneously meet the core requirements of 32-channel expansion, nanosecond-level synchronization, high-speed sampling, high precision, large dynamic range, and real-time transmission. Existing multi-channel power meter measurement equipment has unavoidable shortcomings, primarily manifested in the contradiction between multi-channel synchronization and sampling rate. Current multi-channel power meter measurement equipment is mostly designed for 8 to 16 channels. When expanded to 32 channels, it typically employs time-division multiplexing or distributed control architecture, resulting in a synchronization delay between channels exceeding 20 microseconds. This fails to meet the synchronous measurement requirements of multi-channel power meter measurement equipment, and its sampling rate is less than or equal to 10 kSps (10,000 samples per second), making it difficult to adapt to the dynamic monitoring needs of high-speed signals. Furthermore, the dynamic range and measurement accuracy of traditional multi-channel power meter measurement devices are significantly limited. They generally employ a combination of ordinary power detection chips and 12-bit low-resolution analog-to-digital converters, achieving a dynamic range of only 50 to 60 dB, corresponding to a power range of approximately -50 dB / mW to +10 dB / mW. This fails to cover application scenarios where weak signals such as -70 dB / mW coexist with strong signals. Simultaneously, power detection chips exhibit significant temperature drift, with a temperature drift coefficient greater than 0.1 dB / degree Celsius, resulting in an overall measurement error greater than or equal to ±0.5 dB. Although the combination of a wide dynamic range logarithmic power detection chip and a high-resolution analog-to-digital converter holds the potential for high speed and high accuracy, current technology has not effectively resolved key issues such as synchronization control, signal matching, and error compensation encountered during 32-channel integration, failing to fully leverage the performance advantages of the core components.

[0021] This invention proposes a method for measuring optical power.

[0022] This optical power measurement method is applicable to the testing of multi-channel optical switches, microelectromechanical system optical switches, and other multi-channel optical devices, as well as multi-channel communication systems and radar arrays. The optical power measurement method of this invention is applied to an optical power measurement device 100. The optical power measurement device 100 includes multiple signal conditioning circuits 10, each forming a channel for signal transmission. Each channel is independently configured, which helps improve signal integrity and channel consistency.

[0023] Because the analog voltage signals and digital signals generated by multi-channel high-speed acquisition are prone to high-frequency electromagnetic radiation between adjacent channels during parallel transmission, electromagnetic coupling noise that interferes with each other between channels is introduced, leading to a deterioration in measurement accuracy. In one embodiment, a metal shielding layer is provided between different channels, and the metal shielding layer is disposed between adjacent signal conditioning circuits 10. The metal shielding layer can be implemented using metal shielding sheets, and the number and shape of the metal shielding sheets can be rectangular planar sheet structures adapted to the shape of the signal conditioning circuit 10, without specific limitations. The metal shielding sheets are used to suppress electromagnetic coupling between different channels, so that the crosstalk between channels does not exceed -80 dB.

[0024] The number of signal conditioning circuits 10 can be any integer to meet the expansion requirements of the electronic system, such as 8, 16, 32, or 64. Considering the expansion requirements of radar arrays and multi-channel communication systems for parallel high-speed sampling of 32 channels, this invention mainly sets 32 signal conditioning circuits 10 to meet the high-speed synchronous measurement of 32 channels. Each signal conditioning circuit 10 includes a photoelectric conversion circuit 11, an optical power detection circuit 12, and an analog-to-digital conversion circuit 13. The photoelectric conversion circuit 11 can be implemented using a photodetector, such as a silicon-based PIN photodiode or an avalanche photodiode. The input terminal of the photoelectric conversion circuit 11 is used to connect to the output terminal of an optical device, which can be a multiplex optical switch, a microelectromechanical system (MEMS) optical switch, or other multiplex optical devices capable of outputting the optical signal to be measured. The photoelectric conversion circuit 11 receives the optical signal output by the optical device and converts the optical signal into an electrical signal, which is then output to the corresponding optical power detection circuit 12. The optical power detection circuit 12 can be implemented using an optical power detection chip, such as a logarithmic response power detection chip with a native dynamic range covering -70 dBmW to +10 dBmW. Logarithmic response power detection chips have the characteristic that the output analog voltage is linearly proportional to the logarithm of the input power, which can compress a wide dynamic range of input power into a measurable analog voltage range. The input terminal of the optical power detection circuit 12 is connected to the output terminal of the corresponding photoelectric conversion circuit 11. The optical power detection circuit 12 receives the electrical signal output by the corresponding photoelectric conversion circuit 11 and converts the electrical signal into an analog voltage signal of 0.1V to 3.2V, which is proportional to the logarithm of the optical signal power. This conversion process utilizes the wide dynamic range, fast response characteristics, and detection accuracy better than ±0.05 dB of the logarithmic response power detection chip to convert the wide dynamic range electrical signal into an analog voltage signal suitable for acquisition by the analog-to-digital conversion circuit 13. -70 dBmW is a weak signal, and +10 dBmW is a strong signal. This helps improve the measurement capability of the optical power measurement device 100 under conditions where weak and strong signals coexist, and reduces measurement deviations caused by changes in ambient temperature. The analog-to-digital conversion circuit 13 can be implemented using an analog-to-digital converter, such as a 16-bit or higher resolution high-speed analog-to-digital converter. The input terminal of the analog-to-digital conversion circuit 13 is connected to the output terminal of the corresponding optical power detection circuit 12. The analog-to-digital conversion circuit 13 receives the analog voltage signal output by the corresponding optical power detection circuit 12 and converts the analog voltage signal into a digital signal before outputting it.

[0025] Based on the above hardware structure, please refer to Figure 1 and Figure 10 In one embodiment of the present invention, the optical power measurement method includes: S100: In response to the trigger signal input from an external device, it generates concurrent hard timing control pulses to control each photoelectric conversion circuit to convert the input optical signal into an electrical signal, controls the corresponding optical power detection circuit to convert the electrical signal into an analog voltage signal, and controls the corresponding analog-to-digital conversion circuit to convert the analog voltage signal into a digital signal for output. S200: Filter each digital signal; S300: Obtain the operating temperature of each optical power detection circuit, as well as multiple preset temperature compensation coefficients and multiple preset calibration coefficients. Each preset calibration coefficient includes multiple preset sub-calibration coefficients that correspond one-to-one with multiple different power ranges. S400. Based on the operating temperature of the optical power detection circuit and the corresponding preset temperature compensation coefficient, perform temperature compensation on the filtered digital signal. S500: Determine the power range corresponding to the temperature-compensated digital signal and match the preset sub-calibration coefficients corresponding to the power range. S600: The temperature-compensated digital signal is linearly fitted and calculated using the matched preset sub-calibration coefficients to obtain the optical power measurement signal. S700 transmits each optical power measurement signal to the host computer.

[0026] In this embodiment, the trigger signal is a synchronization source signal. The operating temperature of each optical power detection circuit 12 is obtained by acquiring real-time temperature data of each channel through a temperature detection circuit. The preset temperature compensation coefficient is the correction data for temperature compensation of the filtered digital signal, pre-stored in the memory of the optical power measurement device 100 for the corresponding channel. The preset calibration coefficient is the correction data for linear fitting calculation of the temperature-compensated digital signal, pre-stored in the memory of the optical power measurement device 100 for the corresponding channel. Each preset calibration coefficient contains multiple preset sub-calibration coefficients that correspond one-to-one with multiple different power ranges.

[0027] In practical applications, the optical power measurement device 100 responds to the synchronization source signal input from an external device and uses this synchronization source signal to generate concurrent hard timing control pulses. Addressing the inter-channel synchronization delay defects caused by time-division multiplexing or distributed control in multi-channel synchronous measurements, the concurrent control process based on the same trigger source helps align the 32 channels in the time dimension, controlling the inter-channel synchronization delay to the nanosecond level, thereby reducing synchronization errors and improving the timing synchronization of each signal conditioning circuit 10 in acquiring analog voltage signals and outputting digital signals. Each photoelectric conversion circuit 11 simultaneously starts photoelectric conversion and outputs an electrical signal upon receiving the hard timing control pulse. Each optical power detection circuit 12 simultaneously starts logarithmic amplification and detection and outputs an analog voltage signal upon receiving the hard timing control pulse. The amplitude of this analog voltage signal is logarithmically related to the power of the optical signal input to the photoelectric conversion circuit 11; that is, the analog voltage signal output by the optical power detection circuit 12 reflects the logarithmic trend of the electrical signal output by the photoelectric conversion circuit 11, enabling the wide dynamic range electrical signal to be converted into an analog voltage signal suitable for acquisition by the analog-to-digital conversion circuit 13. Each analog-to-digital converter 13 quantizes the analog voltage signal and converts it into a digital signal using the same sampling clock when it receives a hard timing control pulse. The filtering of each digital signal is performed by the digital filter of the optical power measurement device 100, which performs low-pass smoothing filtering on the digital signals of the 32 channels in parallel.

[0028] Because logarithmic response power detection chips exhibit temperature drift characteristics, their temperature drift coefficient is typically greater than 0.1 dB per degree Celsius. Without compensation, this can easily lead to an overall measurement error of ±0.5 dB. To overcome this defect, the optical power measurement device 100 acquires the operating temperature of each optical power detection circuit 12, as well as multiple preset temperature compensation coefficients and multiple preset calibration coefficients. Based on the acquired operating temperature of the optical power detection circuit 12 and the corresponding preset temperature compensation coefficients, it performs temperature compensation on the corresponding filtered digital signal. This involves algebraic correction of the digital signal's zero point and gain to eliminate numerical deviations caused by temperature variations in the analog voltage signal after conversion to a digital signal. After temperature compensation, the optical power measurement device 100 determines the power range corresponding to the temperature-compensated digital signal and matches the preset sub-calibration coefficients corresponding to that power range. It then uses these matching preset sub-calibration coefficients to perform linear fitting calculations on the temperature-compensated digital signal, establishing an optical power relationship within a specific power range corresponding to the temperature-compensated digital signal, thereby obtaining the optical power measurement signal. By controlling each photoelectric conversion circuit 11 to convert the input optical signal into an electrical signal, controlling the corresponding optical power detection circuit 12 to convert the electrical signal into an analog voltage signal, and controlling the corresponding analog-to-digital conversion circuit 13 to convert the analog voltage signal into a digital signal for output, and after filtering each digital signal, temperature compensation is performed on the filtered digital signal by combining the obtained operating temperature of each optical power detection circuit 12 and the preset temperature compensation coefficient. Then, by determining the power range corresponding to the temperature-compensated digital signal and matching the preset sub-calibration coefficient, the optical power measurement signal is obtained by linear fitting calculation of the temperature-compensated digital signal. This can alleviate the synchronization delay problem during multi-channel expansion, improve the sampling rate, reduce the measurement error caused by temperature drift, and enable different power ranges to obtain suitable calibration parameters, thereby improving the measurement accuracy over a wide dynamic range. Finally, the optical power measurement device 100 packages the optical power measurement signals of the 32 channels into protocol frames and sends them to the host computer through a physical communication link so that the host computer can obtain the accurate optical power measurement results of each channel.

[0029] The technical solution of this invention generates concurrent hard-timing control pulses in response to trigger signals input from external devices, uniformly controlling the photoelectric conversion circuit 11, optical power detection circuit 12, and analog-to-digital conversion circuit 13 in each signal conditioning circuit 10 to work together. This enables the multi-channel optical power measurement device 100 to maintain nanosecond-level synchronization and improve the sampling rate even when expanded to thirty-two channels, alleviating the contradiction between multi-channel synchronization and sampling rate. Simultaneously, each digital signal is filtered, and temperature compensation is performed on the filtered digital signals based on the operating temperature of each optical power detection circuit 12 and the corresponding preset temperature compensation coefficient, reducing measurement errors caused by temperature drift. Furthermore, the corresponding power range is determined based on the temperature-compensated digital signal, and a preset sub-calibration coefficient corresponding to the power range is matched. The optical power measurement signal is obtained by linear fitting of the temperature-compensated digital signal using the matched preset sub-calibration coefficient, which broadens the dynamic range and improves the measurement accuracy. This improves the problems of low synchronous measurement accuracy, narrow dynamic range, and large temperature drift error in existing multi-channel power meter measurement devices.

[0030] like Figure 2 and Figure 10 As shown, in one embodiment, step S500 includes: S510. When the temperature-compensated digital signal fluctuates at the boundary between two adjacent power ranges, a preset delay switching threshold is used to perform hysteresis comparison on the digital signal. S520. If the fluctuation amplitude of the digital signal does not exceed the delay switching threshold, the current power range and the corresponding preset sub-calibration coefficient remain unchanged. S530. If the fluctuation amplitude of the digital signal exceeds the delay switching threshold, the digital signal is switched to another adjacent power range and matched with the corresponding preset sub-calibration coefficient.

[0031] In this embodiment, since the analog voltage signal generated by the optical power detection circuit 12 corresponds to multiple power ranges, when the temperature-compensated digital signal is exactly at the boundary between two adjacent power ranges, the small random noise generated by the analog-to-digital conversion circuit 13 during the quantization process can easily cause numerical fluctuations, resulting in frequent jumps between the preset sub-calibration coefficients of the optical power measurement device 100 in different power ranges. Since there are inevitably small fitting residuals at the boundary between the multiple preset sub-calibration coefficients corresponding to two adjacent power ranges, this frequent switching will cause false spikes and oscillations in the final converted output optical power measurement signal. This embodiment uses a preset delay switching threshold to perform hysteresis comparison on the digital signal when it fluctuates at the boundary between two adjacent power ranges after temperature compensation. This allows for the establishment of a transition region that acts as a buffer at the boundary. When the fluctuation amplitude of the digital signal does not exceed the delay switching threshold, the current power range and the corresponding preset sub-calibration coefficient remain fixed. Only when the fluctuation amplitude exceeds the delay switching threshold is the digital signal allowed to switch to another adjacent power range and match the corresponding preset sub-calibration coefficient. This suppresses erroneous switching of interval coefficients caused by noise, eliminates jumps in optical power measurement signals at interval switching boundaries, and improves boundary stability during full dynamic range piecewise fitting calculations.

[0032] like Figure 3 , Figure 4 and Figure 10 As shown, in one embodiment, before step S200, the optical power measurement method further includes: S800: Obtain the channel transmission delay skew value corresponding to each analog-to-digital conversion circuit; S900: Perform channel-by-channel delay compensation on the timing of each digital signal according to the channel transmission delay skew value, so as to align the sampling time base of each digital signal.

[0033] Step S200 includes: S210. Perform parallel filtering on each digital signal after time base alignment and suppress electromagnetic crosstalk signals between channels.

[0034] In this embodiment, since the optical power measurement device 100 contains up to 32 channels and has a single-channel sampling rate greater than or equal to 2MSps, during the parallel input of 32 high-frequency digital signals into the control device 20 of the optical power measurement device 100, the varying lengths of the printed circuit board traces and slight differences in device characteristics of the control device 20 often lead to slight deviations in the timing of the arrival of the digital signals from each channel at the processor of the control device 20. By acquiring the channel transmission delay skew value corresponding to each analog-to-digital conversion circuit 13, and performing channel-by-channel delay compensation based on the channel transmission delay skew value, the digital signals before entering the filtering stage achieve sampling time base alignment on the time axis, which helps to eliminate the relative delay skew between channels and improve the accuracy of multi-channel synchronous measurement. After the sampling time base of each digital signal is aligned, parallel filtering is performed on each time base aligned digital signal. This not only smoothly filters out baseband noise, but also effectively combats the synchronous radiation interference coupled to the analog end and transmission link due to the parallel switching of the 32 high-speed data lines. This suppresses electromagnetic crosstalk signals between channels, controls crosstalk between channels, and improves signal integrity during high-speed multi-channel concurrent acquisition.

[0035] like Figure 5 and Figure 10 As shown, in one embodiment, the optical power measurement method further includes, prior to responding to a trigger signal input from an external device: S1100, in response to the calibration command issued by the host computer, controls the standard power source to input multiple preset power point signals covering each power range into each signal conditioning circuit 10; S1200: Obtain the sampling voltage of each optical power detection circuit at each preset power point, and obtain the sampling temperature of each optical power detection circuit. S1300: For each signal conditioning circuit, using the sampling voltage and sampling temperature, combined with the mapping relationship between the corresponding preset power point and power range, the least squares method is used to fit and generate multiple preset sub-calibration coefficients for each signal conditioning circuit under multiple different power ranges.

[0036] In this embodiment, the optical power measurement device 100 can enter a calibration mode before formal measurement, which is initiated by the host computer. During the calibration process, the optical power measurement device 100 controls a standard power source to sequentially output multiple preset power point signals covering a range from -70 dB / mW to +10 dB / mW, and feeds these preset power point signals into all 32 signal conditioning circuits 10. The multiple preset power point signals can include eight power levels: -70 dB / mW, -60 dB / mW, -50 dB / mW, -40 dB / mW, -30 dB / mW, -20 dB / mW, -10 dB / mW, and +10 dB / mW. These power points are evenly distributed across the entire dynamic range to fully characterize the response characteristics of the logarithmic response power detection chip under different input intensities. For each preset power point, the optical power measurement device 100 synchronously acquires the sampling voltage and corresponding sampling temperature output by each optical power detection circuit 12. Based on the correspondence between the collected sampling voltage, sampling temperature, and known preset power points, the optical power measurement device 100 segments the dataset of each signal conditioning circuit 10 according to a predefined power range division strategy. It then uses the least squares method to perform linear fitting on each segment of data, thereby generating multiple preset sub-calibration coefficients for each channel, corresponding to different power ranges, including slope and offset parameters. These multiple preset sub-calibration coefficients for each channel are then stored in the storage unit of the optical power measurement device 100 for high-precision nonlinear correction of the temperature-compensated digital signal in subsequent measurement stages, supporting the consistency and accuracy of optical power measurement signals across channels within a wide dynamic range.

[0037] like Figure 6 and Figure 10 As shown, in one embodiment, the optical power measurement method further includes: S1400: At preset intervals, obtain the operating temperature of each optical power detection circuit, and update the corresponding preset temperature compensation coefficient according to the operating temperature.

[0038] In this embodiment, during continuous operation, the optical power measurement device 100 periodically collects the operating temperature of each optical power detection circuit 12 at set time intervals, such as one minute. Based on each collected operating temperature, the optical power measurement device 100 retrieves or interpolates a preset temperature compensation coefficient adapted to the current operating temperature from a pre-established temperature-compensation parameter mapping relationship, and updates the original preset temperature compensation coefficient of the corresponding channel in the storage unit. This mechanism enables the optical power measurement device 100 to adjust the temperature compensation strategy when the ambient temperature changes slowly or when the temperature rises due to long-term operation, thereby maintaining the measurement accuracy and long-term stability of each channel within a wide dynamic range and avoiding systematic errors caused by the accumulation of temperature drift.

[0039] like Figure 7 and Figure 10 As shown, in one embodiment, step S700 includes: S710: Encapsulate the converted optical power measurement signals with the corresponding signal conditioning circuit identification information, timestamp, and operating temperature to generate Ethernet data packets; S720 outputs Ethernet data packets to the host computer via the Ethernet interface in either real-time streaming mode or triggered transmission mode. In real-time streaming mode, Ethernet data packets are uploaded according to a preset sampling frequency. In triggered transmission mode, the upload of Ethernet data packets is initiated when an external trigger command is received or when any optical power measurement signal reaches a preset threshold.

[0040] In this embodiment, after generating optical power measurement signals for each channel, the optical power measurement device 100 combines the optical power measurement signal of each channel with the identification information of its corresponding signal conditioning circuit 10, the timestamp of the sampling time, and the operating temperature of the corresponding optical power detection circuit 12, and encapsulates it into a structured Ethernet data packet according to a custom communication protocol. The encapsulated Ethernet data packet is output to the host computer through the Ethernet interface. The transmission process supports two operating modes: in real-time streaming mode, the optical power measurement device 100 continuously uploads Ethernet data packets according to a preset sampling frequency, which is suitable for scenarios where dynamic signals are continuously monitored; in triggered transmission mode, when an external trigger command is received or the optical power measurement signal of any channel reaches a threshold condition pre-configured by the host computer, the optical power measurement device 100 initiates the data upload action, which is suitable for event-driven testing or anomaly detection applications. Both transmission modes are designed for low latency and high reliability, supporting a high data update rate and maintaining a low probability of packet loss. At the same time, the Ethernet interface is also used to receive parameter configuration commands issued by the host computer, including sampling rate setting, calibration start command and threshold adjustment, as well as responding to device status query requests, to achieve bidirectional and efficient communication.

[0041] like Figure 8 and Figure 10 As shown, in one embodiment, step S700 further includes: S730: When any optical power measurement signal exceeds a preset safety threshold, an alarm signal is output and an abnormal flag is added to the corresponding Ethernet data packet.

[0042] In this embodiment, during the generation of Ethernet data packets, the optical power measurement device 100 continuously monitors whether the optical power measurement signals of each channel exceed the safety thresholds pre-configured by the host computer. When the optical power measurement signal of a certain channel is detected to exceed the threshold, the optical power measurement device 100, in addition to triggering an alarm signal output, also embeds an anomaly flag bit in the corresponding Ethernet data packet to indicate that the current data is in an out-of-limit state. This anomaly flag bit is encapsulated together with the identification information of the signal conditioning circuit 10, the timestamp, the operating temperature, and the optical power measurement signal, which facilitates the host computer to quickly identify abnormal events and take corresponding processing measures after receiving data, thereby enhancing the security and responsiveness of the optical power measurement device 100 in high-reliability application scenarios.

[0043] The present invention also proposes a control device 20, such as Figure 9 As shown, the control device 20 includes a processor 21 and a memory 22. The memory 22 stores an optical power measurement control program. When the optical power measurement control program is executed by the processor 21, it implements the optical power measurement method as described above. The specific structure of the optical power measurement method is as described in the above embodiments. Since the control device 20 adopts all the technical solutions of all the above embodiments, it has at least all the beneficial effects brought about by the technical solutions of the above embodiments, which will not be described in detail here.

[0044] The present invention also proposes an optical power measurement device 100, such as... Figure 9 and Figure 10 As shown, the optical power measurement device 100 includes multiple signal conditioning circuits 10 and a control device 20. The specific structure of the control device 20 is as described in the above embodiments. Since the optical power measurement device 100 adopts all the technical solutions of all the above embodiments, it has at least all the beneficial effects brought about by the technical solutions of the above embodiments, which will not be described in detail here.

[0045] Each signal conditioning circuit 10 includes a photoelectric conversion circuit 11, an optical power detection circuit 12, and an analog-to-digital conversion circuit 13. The output terminal of the photoelectric conversion circuit 11 is connected to the input terminal of the optical power detection circuit 12, and the output terminal of the optical power detection circuit 12 is connected to the input terminal of the analog-to-digital conversion circuit 13. The photoelectric conversion circuit 11 is used to convert the input optical signal into an electrical signal, the optical power detection circuit 12 is used to convert the electrical signal into an analog voltage signal, and the analog-to-digital conversion circuit 13 is used by the analog conversion unit to convert the analog voltage signal into a digital signal and then output it. The input terminal of the control device 20 is connected to the output terminal of each analog-to-digital conversion circuit 13.

[0046] In this embodiment, the optical power measurement device 100 coordinates the working timing of each signal conditioning circuit 10 through the control device 20, responds to the trigger signal input from the external device, and synchronously starts the signal acquisition process of the photoelectric conversion circuit 11, the optical power detection circuit 12, and the analog-to-digital conversion circuit 13. The control device 20 is also used to obtain the working temperature of each optical power detection circuit 12, perform temperature compensation on the digital signal of each channel according to the preset temperature compensation coefficient, and convert the compensated digital signal into an optical power measurement signal in combination with multiple preset sub-calibration coefficients. In addition, the control device 20 is responsible for encapsulating each optical power measurement signal together with the corresponding signal conditioning circuit 10 identification information, timestamp, and working temperature into an Ethernet data packet, and outputting it to the host computer through the Ethernet interface in the above-mentioned real-time streaming mode or trigger transmission mode. When the optical power measurement signal is detected to exceed the preset safety threshold, an alarm signal is generated and an abnormal flag is placed in the data packet, thereby realizing a multi-channel optical power measurement function with high synchronization, high precision, wide dynamic range, and high reliability.

[0047] like Figure 10 As shown, in one embodiment, each signal conditioning circuit 10 further includes a temperature detection circuit 14, which is used to detect the operating temperature of the optical power detection circuit 12 and output a corresponding temperature detection signal to the control device 20; the control device 20 is used to perform temperature compensation on the corresponding digital signal according to the operating temperature of the temperature detection circuit 14.

[0048] In this embodiment, the optical power measurement device 100 is equipped with an independent temperature detection circuit 14 in each signal conditioning circuit 10 to acquire the operating temperature of the corresponding optical power detection circuit 12 in real time. Based on the received temperature detection signal, the control device 20 calls a preset temperature compensation coefficient that matches the operating temperature to perform channel-level temperature compensation processing on the digital signals from the same signal conditioning circuit 10. This design allows each channel to be differentially calibrated according to its actual thermal environment, avoiding measurement errors caused by inter-channel temperature differences or overall temperature drift, thereby maintaining the accuracy consistency and long-term stability of each optical power measurement signal under multi-channel high-density integration conditions.

[0049] like Figure 10 As shown, in one embodiment, each signal conditioning circuit 10 further includes a first filtering circuit 15. The input terminal of the first filtering circuit 15 is connected to the output terminal of the photoelectric conversion circuit 11, and the output terminal of the first filtering circuit 15 is connected to the input terminal of the optical power detection circuit 12. The first filtering circuit 15 is used to filter the electrical signal output by the photoelectric conversion circuit 11 and then output it to the optical power detection circuit 12.

[0050] In this embodiment, the optical power measurement device 100 introduces a first filter circuit 15 between the photoelectric conversion circuit 11 and the optical power detection circuit 12 to suppress high-frequency noise, out-of-band interference, or transient spikes mixed in during the photoelectric conversion process. The electrical signal processed by the first filter circuit 15 has a better signal-to-noise ratio and waveform stability, which helps to improve the response accuracy of the optical power detection circuit 12 to weak optical signals and reduce nonlinear errors caused by signal distortion. This further enhances the measurement reliability and repeatability of each signal conditioning circuit 10 in a wide dynamic range, especially in the low power range (such as near -70 dBmW).

[0051] like Figure 10 As shown, in one embodiment, each signal conditioning circuit 10 further includes a second filtering circuit 16. The input terminal of the second filtering circuit 16 is connected to the output terminal of the optical power detection circuit 12, and the output terminal of the second filtering circuit 16 is connected to the input terminal of the analog-to-digital conversion circuit 13. The second filtering circuit 16 is used to filter the analog voltage signal output by the optical power detection circuit 12 and then output it to the analog-to-digital conversion circuit 13.

[0052] In this embodiment, the optical power measurement device 100 includes a second filter circuit 16 between the optical power detection circuit 12 and the analog-to-digital conversion circuit 13. This second filter circuit performs low-pass or anti-aliasing filtering on the analog voltage signal output by the optical power detection circuit 12 to suppress high-frequency noise, switching transients, and potential electromagnetic interference. The analog voltage signal processed by the second filter circuit 16 has a smoother waveform and lower out-of-band components, which helps the analog-to-digital conversion circuit 13 accurately capture the effective signal during high-resolution sampling and avoids quantization errors caused by signal aliasing or noise boosting. This design further improves the measurement accuracy and system stability of the optical power measurement device 100 under high-speed sampling conditions.

[0053] like Figure 11 As shown, in one embodiment, the first filter circuit 15 includes a first resistor R1, a second resistor R2, a first capacitor C1, a second capacitor C2, and a third capacitor C3; The optical power detection circuit 12 includes a logarithmic response power detection chip U1; The second filter circuit 16 includes a third resistor R3, a fourth resistor R4, a fifth resistor R5, and a fourth capacitor C4; The analog-to-digital conversion circuit 13 includes an analog-to-digital conversion chip U2, a sixth resistor R6, a seventh resistor R7, an eighth resistor R8, a ninth resistor R9, and a tenth resistor R10; The common terminal of the first end of the first resistor R1 and the first end of the first capacitor C1 is connected to the ground terminal AGND, and the second end of the first resistor R1 is connected to the first end of the second capacitor C2. The second terminal of the second capacitor C2 is connected to the INPT of the logarithmic response power detection chip U1, and the common terminal of the second terminal of the second capacitor C2 and the INPT of the logarithmic response power detection chip U1 is connected to the ground terminal AGND. The second terminal of the first capacitor C1 is connected to the VPDB of the logarithmic response power detection chip U1, and the common terminal of the second terminal of the first capacitor C1 and the VPDB of the logarithmic response power detection chip U1 is connected to the ground terminal AGND. The first terminal of the third capacitor C3 is connected to VSUM of the logarithmic response power detection chip U1, and the second terminal of the third capacitor C3 is connected to the ground terminal AGND. The first terminal of the second resistor R2 is connected to VREF of the logarithmic response power detection chip U1, the second terminal of the second resistor R2 is connected to VLOG of the logarithmic response power detection chip U1, and the common terminal of the second terminal of the second resistor R2 and VLOG of the logarithmic response power detection chip U1 is connected to BFIN of the logarithmic response power detection chip U1. The first terminal of the fourth resistor R4 and the common terminal of the logarithmic response power detection chip U1 connected to PWDN, GND, and GND are connected to the ground terminal AGND. The second terminal of the fourth resistor R4 is connected to the first terminal of the third resistor R3 and the BFNG of the logarithmic response power detection chip U1. The second terminal of the third resistor R3 is connected to the first terminal of the fifth resistor R5 and the common terminal VOUT of the logarithmic response power detection chip U1; The second terminal of the fifth resistor R5 is connected to the AINP terminal of the analog-to-digital converter chip U2. The common terminal of the second terminal of the fifth resistor R5 and the AINP terminal of the analog-to-digital converter chip U2 is connected to the first terminal of the fifth capacitor C5. The second terminal of the fifth capacitor C5 is connected to the first terminal of the fourth capacitor C4. The common terminal of the second terminal of the fifth capacitor C5 and the first terminal of the fourth capacitor C4 is connected to the ground terminal AGND. The second terminal of the fourth capacitor C4 is connected to the common point of VPS1 and VPS2 of the analog-to-digital converter chip U2. The second terminal of the fourth capacitor C4 is connected to the common terminal of the common point of VPS1 and VPS2 of the analog-to-digital converter chip U2. The GND of the analog-to-digital converter chip U2 is connected to the ground terminal AGND; The AVDD pin of the analog-to-digital converter chip U2 is connected to the power supply terminal VCC. The AIMN pin of the analog-to-digital converter chip U2 is connected to the ground terminal AGND. The DVDD pin of analog-to-digital converter chip U2 is connected to the first end of the sixth resistor R6, and the second end of the sixth resistor R6 is connected to the power supply terminal VCC. The common terminal of the DVDD of the analog-to-digital converter chip U2 and the first terminal of the sixth resistor R6 is connected to the first terminal of the seventh resistor R7, and the second terminal of the seventh resistor R7 is connected to the power supply terminal VCC. The SCLK of the analog-to-digital converter chip U2 is connected to the first end of the eighth resistor R8, and the second end of the eighth resistor R8 is connected to the ADC. The SDO of the analog-to-digital converter chip U2 is connected to the first end of the ninth resistor R9, and the second end of the ninth resistor R9 is connected to the ADC. The CS# pin of the analog-to-digital converter chip U2 is connected to the first end of the tenth resistor R10, and the second end of the tenth resistor R10 is connected to the ADC.

[0054] Through the above circuit structure design, the optical power measurement device 100 achieves effective suppression and impedance matching optimization of key noise sources in the signal link at the hardware level. The first filter circuit 15 adopts a multi-stage RC network composed of R1, R2, C1, C2 and C3, which not only provides low-pass filtering for the weak current signal output by the photoelectric conversion circuit 11, but also significantly reduces the high-frequency interference between the internal reference voltage and the summing node of the logarithmic response power detection chip U1 by bypassing the VPDB, INPT and VSUM pins, thereby improving its signal-to-noise ratio and stability under ultra-low optical power conditions of -70 dBm. The second filter circuit 16 is composed of R3, R4, R5 and C4 to form an anti-aliasing filter, which accurately limits the analog bandwidth entering the analog-to-digital conversion chip U2 and avoids high-frequency components from folding into the effective frequency band and causing quantization distortion; at the same time, the connection method of R4 with the BFNG and PWDN pins ensures the rapid stabilization of U1 in standby or dynamic switching states. In the analog-to-digital converter circuit 13, the single-ended input configuration of U2's AINP, combined with the differential decoupling network formed by C5 and C4, further reduces the impact of common-mode noise. The DVDD power supply, after being filtered by a π-type filter composed of R6 and R7, supplies power to the digital core, effectively isolating crosstalk from digital switching noise to the high-precision analog front-end. Furthermore, R8, R9, and R10, connected in series on the SCLK, SDO, and CS# signal lines, not only achieve impedance matching to ensure signal integrity for high-speed SPI communication but also provide current limiting protection. The overall circuit layout balances high speed, high impedance, and low noise requirements, maintaining nanosecond-level synchronous trigger response, measurement accuracy better than ±0.1 dB, and a wide dynamic range covering -70 dBm to +10 dBm even under 32-channel high-density integration. This fully supports the reliable operation of this invention in demanding application scenarios such as radar array calibration and multi-channel optical switch testing.

[0055] The above description is merely an exemplary embodiment of the present invention and does not limit the patent scope of the present invention. Any equivalent structural transformations made using the contents of the present invention specification and drawings under the technical concept of the present invention, or direct / indirect applications in other related technical fields, are included within the patent protection scope of the present invention.

Claims

1. A method of optical power measurement, characterized by, An optical power measurement device is used, the optical power measurement device including multiple signal conditioning circuits, each of the signal conditioning circuits including a photoelectric conversion circuit, an optical power detection circuit, and an analog-to-digital conversion circuit, the optical power measurement method including: In response to a trigger signal input from an external device, concurrent hard timing control pulses are generated to control each of the photoelectric conversion circuits to convert the input optical signal into an electrical signal, control the corresponding optical power detection circuit to convert the electrical signal into an analog voltage signal, and control the corresponding analog-to-digital conversion circuit to convert the analog voltage signal into a digital signal for output. Perform filtering processing on each digital signal; The operating temperature of each optical power detection circuit is obtained, as well as multiple preset temperature compensation coefficients and multiple preset calibration coefficients. Each preset calibration coefficient includes multiple preset sub-calibration coefficients that correspond one-to-one with multiple different power ranges. Based on the operating temperature of the optical power detection circuit and the corresponding preset temperature compensation coefficient, temperature compensation is performed on the filtered digital signal. Determine the power range corresponding to the temperature-compensated digital signal, and match the preset sub-calibration coefficient corresponding to the power range; The optical power measurement signal is obtained by linearly fitting the temperature-compensated digital signal using the matched preset sub-calibration coefficients. The optical power measurement signals are transmitted to the host computer.

2. The optical power measurement method according to claim 1, wherein, The process of determining the power range corresponding to the temperature-compensated digital signal and matching the preset sub-calibration coefficients corresponding to the power range includes: When the temperature-compensated digital signal fluctuates at the boundary between two adjacent power ranges, a preset delay switching threshold is used to perform a hysteresis comparison on the digital signal. If the fluctuation amplitude of the digital signal does not exceed the delay switching threshold, the current power range and the corresponding preset sub-calibration coefficient remain unchanged. If the fluctuation amplitude of the digital signal exceeds the delay switching threshold, the digital signal is switched to another adjacent power range and matched with the corresponding preset sub-calibration coefficient.

3. The optical power measurement method of claim 1, wherein, Before filtering each digital signal, the optical power measurement method further includes: Obtain the channel transmission delay skew value corresponding to each of the analog-to-digital conversion circuits; Based on the channel transmission delay skew value, the timing of each digital signal is compensated for channel-by-channel delay so that the sampling time base of each digital signal is aligned. The filtering process for each digital signal includes: Parallel filtering is performed on each of the time-base aligned digital signals to suppress electromagnetic crosstalk signals between channels.

4. The optical power measurement method as described in claim 1, characterized in that, Prior to responding to a trigger signal input from an external device, the optical power measurement method further includes: In response to the calibration command issued by the host computer, the standard power source is controlled to input multiple preset power point signals covering each of the power ranges into each of the signal conditioning circuits; Obtain the sampling voltage of each optical power detection circuit at each preset power point, and obtain the sampling temperature of each optical power detection circuit; For each of the signal conditioning circuits, using the sampling voltage and the sampling temperature, and combining the mapping relationship between the corresponding preset power point and the power range, the multi-segment preset sub-calibration coefficients of each signal conditioning circuit under multiple different power ranges are generated by least squares fitting.

5. The optical power measurement method as described in claim 1, characterized in that, The optical power measurement method further includes: At preset intervals, the operating temperature of each optical power detection circuit is acquired, and the corresponding preset temperature compensation coefficient is updated based on the operating temperature.

6. The optical power measurement method as described in claim 1, characterized in that, The step of transmitting each of the optical power measurement signals to the host computer includes: The converted optical power measurement signals are encapsulated with the corresponding signal conditioning circuit identification information, timestamp, and operating temperature to generate Ethernet data packets. The Ethernet data packets are output to the host computer via the Ethernet interface in either real-time streaming mode or triggered transmission mode. In real-time streaming mode, the Ethernet data packets are uploaded at a preset sampling frequency. In triggered transmission mode, the upload of the Ethernet data packets is initiated when an external trigger command is received or when any of the optical power measurement signals reaches a preset threshold.

7. The optical power measurement method as described in claim 6, characterized in that, The step of transmitting each of the optical power measurement signals to the host computer also includes: When any of the optical power measurement signals exceeds a preset safety threshold, an alarm signal is output and an abnormal flag is added to the corresponding Ethernet data packet.

8. A control device, characterized in that, It includes a processor and a memory, wherein the memory stores an optical power measurement control program, and when the optical power measurement control program is executed by the processor, it implements the optical power measurement method as described in any one of claims 1 to 7.

9. An optical power measurement device, characterized in that, include: Multiple signal conditioning circuits are provided, each of which includes a photoelectric conversion circuit, an optical power detection circuit, and an analog-to-digital conversion circuit. The output terminal of the photoelectric conversion circuit is connected to the input terminal of the optical power detection circuit, and the output terminal of the optical power detection circuit is connected to the input terminal of the analog-to-digital conversion circuit. The photoelectric conversion circuit is used to convert the input optical signal into an electrical signal, the optical power detection circuit is used to convert the electrical signal into an analog voltage signal, and the analog-to-digital conversion circuit is used by the analog conversion unit to convert the analog voltage signal into a digital signal and then output it. The control device as described in claim 8, wherein the input terminal of the control device is connected to the output terminal of each of the analog-to-digital conversion circuits.

10. The optical power measuring device as described in claim 9, characterized in that, Each of the signal conditioning circuits further includes a temperature detection circuit, which is used to detect the operating temperature of the optical power detection circuit and output a corresponding temperature detection signal to the control device; the control device is used to perform temperature compensation on the corresponding digital signal according to the operating temperature of the temperature detection circuit.

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