Component electrostatic detection method and device, computer device, storage medium and computer program product

Abstract

The application relates to a component electrostatic detection method and device, computer equipment, a storage medium and a computer program product. The method comprises the following steps: in response to an electrostatic detection instruction for a to-be-detected component, a first leakage current value of the to-be-detected component before electrostatic discharge impact is acquired; according to an electrostatic detection standard corresponding to the to-be-detected component, electrostatic discharge impact is performed on the to-be-detected component, and a second leakage current value of the to-be-detected component after electrostatic discharge impact is acquired; based on the first leakage current value and the second leakage current value, an electrostatic detection result of the to-be-detected component under the electrostatic detection standard is determined; and according to the electrostatic detection result of the to-be-detected component under the electrostatic detection standard, a target electrostatic detection result corresponding to the to-be-detected component is determined. By adopting the method, the electrostatic detection accuracy of the component can be improved.

Description

Technical Field

[0001] This application relates to the field of power grid technology, and in particular to a method, apparatus, computer equipment, computer-readable storage medium, and computer program product for electrostatic detection of electronic components. Background Technology

[0002] In the fields of electronic component manufacturing, screening, and reliability verification, electrostatic discharge (ESD) is one of the key factors leading to component failure. It not only causes immediate damage but can also trigger latent damage, leading to sudden failure during subsequent use and severely impacting the stability and lifespan of electronic equipment. Therefore, accurate electrostatic testing of components is crucial.

[0003] In traditional technology, electrostatic discharge (ESD) testing of components is generally performed manually; however, this method is cumbersome and prone to human error, resulting in low accuracy of ESD testing. Summary of the Invention

[0004] Therefore, it is necessary to provide a method, apparatus, computer equipment, computer-readable storage medium, and computer program product for electrostatic discharge (ESD) testing of components that can improve the accuracy of ESD testing of components, in order to address the above-mentioned technical problems.

[0005] In a first aspect, this application provides a method for electrostatic discharge (ESD) detection of electronic components, including:

[0006] In response to an electrostatic discharge (ESD) test command for the component under test, the first leakage current value of the component under test before undergoing an ESD shock is obtained.

[0007] According to the electrostatic detection standard corresponding to the component under test, the component under test is subjected to electrostatic discharge impact, and the second leakage current value of the component under test after the electrostatic discharge impact is obtained.

[0008] Based on the first leakage current value and the second leakage current value, the electrostatic test result of the component under test under the electrostatic test standard is determined;

[0009] Based on the electrostatic discharge test results of the component under test under the electrostatic discharge test standard, the target electrostatic discharge test result corresponding to the component under test is determined.

[0010] In one embodiment, the step of subjecting the component under test to electrostatic discharge shock according to the electrostatic detection standard corresponding to the component under test includes:

[0011] Based on the electrostatic detection standard corresponding to the component under test, the electrostatic discharge impulse pulse corresponding to the component under test is determined;

[0012] The component under test is subjected to electrostatic discharge impact by the electrostatic discharge impact pulse.

[0013] In one embodiment, determining the electrostatic discharge impulse pulse corresponding to the component under test (SUT) based on the electrostatic detection standard corresponding to the SUT includes:

[0014] Based on the electrostatic discharge (ESD) detection standard corresponding to the component under test, the correspondence between the ESD detection standard and the pulse information is queried to obtain the pulse information corresponding to the ESD detection standard, which is used as the target pulse information corresponding to the component under test.

[0015] Based on the target pulse information, the electrostatic discharge impulse pulse corresponding to the component under test is determined.

[0016] In one embodiment, determining the electrostatic discharge (ESD) test result of the component under test under the ESD test standard based on the first leakage current value and the second leakage current value includes:

[0017] The current difference between the second leakage current value and the first leakage current value is determined, and the first electrostatic detection result of the component under test is determined based on the difference between the current difference and the preset current difference.

[0018] Based on the difference between the second leakage current value and the preset leakage current value, the second electrostatic detection result of the component under test under the electrostatic detection standard is determined;

[0019] The rate of change of current between the second leakage current value and the first leakage current value is determined, and the third electrostatic detection result of the component under test is determined based on the difference between the rate of change of current and the preset rate of change of current.

[0020] Based on the first electrostatic discharge (ESD) test result, the second ESD test result, and the third ESD test result, the ESD test result of the component under test is obtained under the ESD test standard.

[0021] In one embodiment, before subjecting the component under test to electrostatic discharge (ESD) according to the ESD detection standard corresponding to the component under test, the method further includes:

[0022] Extract the component model information corresponding to the component under test from the electrostatic detection command;

[0023] Based on the component model information, the electrostatic discharge (ESD) testing standard corresponding to the component under test is determined.

[0024] In one embodiment, determining the target electrostatic discharge (ESD) result corresponding to the component under test (BUT) based on the ESD test result under the ESD test standard includes:

[0025] If the electrostatic discharge test results of the component under test under the electrostatic discharge test standard are all passed, the target electrostatic discharge test result corresponding to the component under test is determined to be passed.

[0026] If at least one of the electrostatic discharge (ESD) test results for the component under test under the ESD test standard is a failure, then the target ESD test result for the component under test is determined to be a failure.

[0027] Secondly, this application also provides a component electrostatic detection device, comprising:

[0028] The first acquisition module is used to acquire the first leakage current value of the component under test before electrostatic discharge impact in response to the electrostatic detection command for the component under test.

[0029] The second acquisition module is used to perform electrostatic discharge impact on the component under test according to the electrostatic detection standard corresponding to the component under test, and acquire the second leakage current value of the component under test after the electrostatic discharge impact.

[0030] The first determining module is used to determine the electrostatic detection result of the component under test under the electrostatic detection standard based on the first leakage current value and the second leakage current value.

[0031] The second determining module is used to determine the target electrostatic detection result corresponding to the component under test based on the electrostatic detection result of the component under test under the electrostatic detection standard.

[0032] Thirdly, this application also provides a computer device, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to perform the following steps:

[0033] In response to an electrostatic discharge (ESD) test command for the component under test, the first leakage current value of the component under test before undergoing an ESD shock is obtained.

[0034] According to the electrostatic detection standard corresponding to the component under test, the component under test is subjected to electrostatic discharge impact, and the second leakage current value of the component under test after the electrostatic discharge impact is obtained.

[0035] Based on the first leakage current value and the second leakage current value, the electrostatic test result of the component under test under the electrostatic test standard is determined;

[0036] Based on the electrostatic discharge test results of the component under test under the electrostatic discharge test standard, the target electrostatic discharge test result corresponding to the component under test is determined.

[0037] Fourthly, this application also provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, performs the following steps:

[0038] In response to an electrostatic discharge (ESD) test command for the component under test, the first leakage current value of the component under test before undergoing an ESD shock is obtained.

[0039] According to the electrostatic detection standard corresponding to the component under test, the component under test is subjected to electrostatic discharge impact, and the second leakage current value of the component under test after the electrostatic discharge impact is obtained.

[0040] Based on the first leakage current value and the second leakage current value, the electrostatic test result of the component under test under the electrostatic test standard is determined;

[0041] Based on the electrostatic discharge test results of the component under test under the electrostatic discharge test standard, the target electrostatic discharge test result corresponding to the component under test is determined.

[0042] Fifthly, this application also provides a computer program product, including a computer program that, when executed by a processor, performs the following steps:

[0043] In response to an electrostatic discharge (ESD) test command for the component under test, the first leakage current value of the component under test before undergoing an ESD shock is obtained.

[0044] According to the electrostatic detection standard corresponding to the component under test, the component under test is subjected to electrostatic discharge impact, and the second leakage current value of the component under test after the electrostatic discharge impact is obtained.

[0045] Based on the first leakage current value and the second leakage current value, the electrostatic test result of the component under test under the electrostatic test standard is determined;

[0046] Based on the electrostatic discharge test results of the component under test under the electrostatic discharge test standard, the target electrostatic discharge test result corresponding to the component under test is determined.

[0047] The aforementioned electrostatic discharge (ESD) testing method, apparatus, computer equipment, storage medium, and computer program product for electronic components first respond to an ESD testing command for the component under test (BUT), acquiring the first leakage current value of the BUT before undergoing an ESD impact. Then, according to the ESD testing standard corresponding to the BUT, an ESD impact is performed on the BUT, and the second leakage current value is acquired after the ESD impact. Next, based on the first and second leakage current values, the ESD testing result of the BUT under the ESD testing standard is determined. Finally, based on the ESD testing result of the BUT under the ESD testing standard, the target ESD testing result corresponding to the BUT is determined. In this way, when performing ESD testing on components, by separately acquiring the leakage current values ​​before and after the ESD impact, and then combining the two sets of leakage current data, the testing result is automatically determined. The entire testing process relies on quantitative data and standardized rules, avoiding the drawbacks of traditional manual testing methods, which are cumbersome and prone to human error, leading to low accuracy in ESD testing. This improves the accuracy of ESD testing for electronic components. Attached Figure Description

[0048] To more clearly illustrate the technical solutions in the embodiments of this application or related technologies, the drawings used in the description of the embodiments of this application or related technologies will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0049] Figure 1 This is a flowchart illustrating an electrostatic discharge (ESD) detection method for components in one embodiment.

[0050] Figure 2 This is a flowchart illustrating the electrostatic discharge (ESD) detection method for components in another embodiment;

[0051] Figure 3 This is a schematic diagram of an automatic electrostatic testing system for electricity meter components in one embodiment.

[0052] Figure 4 This is a flowchart illustrating the automated electrostatic discharge (ESD) test process for multi-channel modular components in one embodiment.

[0053] Figure 5 This is a structural block diagram of a component electrostatic detection device in one embodiment;

[0054] Figure 6 This is an internal structural diagram of a computer device in one embodiment. Detailed Implementation

[0055] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0056] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, data stored, data displayed, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of the relevant data must comply with relevant regulations.

[0057] In one exemplary embodiment, such as Figure 1 As shown, a method for electrostatic discharge (ESD) detection of electronic components is provided. This embodiment illustrates the application of this method to a server. It is understood that this method can also be applied to terminals, and to systems including terminals and servers, and is implemented through interaction between the terminal and the server. The terminal can be, but is not limited to, various personal computers, laptops, smartphones, and tablets; the server can be a standalone physical server, a server cluster or distributed system composed of multiple physical servers, or a cloud server providing cloud computing services. In this embodiment, the method includes the following steps:

[0058] Step S101: In response to the electrostatic discharge (ESD) detection command for the component under test, the first leakage current value of the component under test before undergoing an ESD shock is obtained.

[0059] Among them, the components under test refer to electronic components that need to be electrostatic tested, including but not limited to chips, power devices, discrete semiconductor devices, resistors, capacitors, inductors and other electronic components.

[0060] Among them, the electrostatic discharge (ESD) detection command refers to the control command triggered by the host computer, control system or user to trigger ESD detection of the component under test. The ESD detection command includes at least one of the following: component under test information, test channel, test parameters, etc.

[0061] Among them, electrostatic discharge (ESD) refers to applying an ESD pulse to the component under test to simulate the electrostatic stress that may be encountered in actual use.

[0062] The first leakage current value refers to the leakage current value of the component under test before it undergoes electrostatic discharge.

[0063] For example, in response to an electrostatic discharge (ESD) test command for the component under test (BUT), the server performs a status test on the leakage current acquisition unit corresponding to the BUT and obtains the status test result of the leakage current acquisition unit. If the status test result indicates that the leakage current acquisition unit has passed the test, the server acquires the first leakage current value of the BUT before the ESD impact through the leakage current acquisition unit.

[0064] Step S102: According to the electrostatic detection standard corresponding to the component under test, perform electrostatic discharge impact on the component under test, and obtain the second leakage current value of the component under test after the electrostatic discharge impact.

[0065] Electrostatic discharge (ESD) testing standards refer to industry-standardized criteria used to regulate ESD testing of electronic components, including HBM (Human-Body Model), CDM (Charged-Device Model), and IEC (International Electrotechnical Commission) standards. It should be noted that each component under test may correspond to one or more ESD testing standards.

[0066] The second leakage current value refers to the leakage current value of the component under test after electrostatic discharge.

[0067] For example, the server determines the electrostatic discharge (ESD) standard corresponding to the component under test (SUT); then, in response to the ESD shock command of the SUT, the server performs an ESD shock on the SUT according to the ESD standard corresponding to the SUT, and collects the second leakage current value of the SUT after the ESD shock through the leakage current acquisition unit.

[0068] Step S103: Based on the first leakage current value and the second leakage current value, determine the electrostatic test result of the component under test under the electrostatic test standard.

[0069] Among them, the electrostatic discharge test result refers to the single test conclusion of the component under test under the electrostatic discharge test standard, including whether the test is passed or failed.

[0070] For example, the server calculates and compares the first leakage current value and the second leakage current value to obtain the electrostatic test result of the component under test under the electrostatic test standard.

[0071] Step S104: Based on the electrostatic test results of the component under test under the electrostatic test standard, determine the target electrostatic test result corresponding to the component under test.

[0072] The target electrostatic discharge (ESD) test result refers to the final test conclusion obtained after comprehensive judgment of the component under test under all corresponding ESD test standards.

[0073] For example, the server integrates and processes the electrostatic discharge (ESD) test results of the component under test under the ESD test standard to obtain the target ESD test result corresponding to the component under test.

[0074] In the above-mentioned electrostatic discharge (ESD) testing method for components, the leakage current values ​​before and after the ESD impact are collected separately, and the test results are automatically determined by combining the two sets of leakage current data. The entire test is completed by relying on quantitative data and standardized rules, which avoids the shortcomings of the traditional manual testing method, which is cumbersome and prone to human error, resulting in low accuracy of ESD testing of components. This improves the accuracy of ESD testing of components.

[0075] In an exemplary embodiment, step S102, which involves performing electrostatic discharge (ESD) on the device under test (DUT) according to the ESD detection standard and obtaining the second leakage current value of the DUT after the ESD impact, specifically includes the following: determining the ESD impact pulse corresponding to the DUT according to the ESD detection standard; and performing ESD impact on the DUT using the ESD impact pulse.

[0076] Among them, electrostatic discharge impulse pulse refers to an electrostatic excitation pulse signal that matches the electrostatic detection standard corresponding to the component under test.

[0077] For example, the server determines an electrostatic discharge impulse pulse that matches the electrostatic discharge detection standard corresponding to the component under test (SUT), and uses it as the corresponding SUT pulse; then, the SUT pulse is applied to a designated pin of the SUT using a test fixture to subject the SUT to electrostatic discharge.

[0078] In this embodiment, by adaptively matching and generating corresponding electrostatic discharge impulse pulses according to the electrostatic detection standards corresponding to the components under test, it is ensured that the applied electrostatic excitation strictly meets the specification requirements of different standards, effectively improving the accuracy of electrostatic discharge impulses, ensuring stable and reliable detection conditions, and providing a real and effective test basis for subsequent damage assessment.

[0079] In an exemplary embodiment, the electrostatic discharge impulse pulse corresponding to the component under test (SUT) is determined according to the electrostatic detection standard corresponding to the SUT. Specifically, this includes: querying the correspondence between the electrostatic detection standard and the pulse information based on the electrostatic detection standard corresponding to the SUT to obtain the pulse information corresponding to the electrostatic detection standard, which is used as the target pulse information corresponding to the SUT; and determining the electrostatic discharge impulse pulse corresponding to the SUT based on the target pulse information.

[0080] The pulse information includes the pulse voltage, pulse rise time, and pulse width as specified in the electrostatic detection standard.

[0081] Among them, target pulse information refers to pulse information that matches the component under test.

[0082] For example, the server queries the correspondence between the electrostatic discharge (ESD) detection standard and pulse information based on the ESD detection standard corresponding to the component under test (Component Test). This yields the first pulse voltage, first pulse rise time, and first pulse width corresponding to the ESD detection standard. The server then inputs the ESD detection standard corresponding to the Component Test into the trained pulse information prediction model to obtain the second pulse voltage, second pulse rise time, and second pulse width corresponding to the ESD detection standard. Next, the first and second pulse voltages are weighted and fused to obtain the target pulse voltage corresponding to the Component Test. The first and second pulse rise times are also weighted and fused to obtain the target pulse rise time corresponding to the Component Test. Finally, the first and second pulse widths are weighted and fused to obtain the target pulse width corresponding to the Component Test. The target pulse voltage, target pulse rise time, and target pulse width are all used as the target pulse information corresponding to the Component Test. Finally, based on the target pulse voltage, target pulse rise time, and target pulse width, the ESD impact pulse corresponding to the Component Test is determined.

[0083] In this embodiment, by querying the preset correspondence based on the electrostatic detection standard, the target pulse information corresponding to the component under test can be quickly and accurately determined, avoiding errors and inconsistencies caused by manual parameter configuration, ensuring the standardization and stability of electrostatic excitation output, and improving the accuracy and reliability of electrostatic detection.

[0084] In an exemplary embodiment, step S103 above, which determines the electrostatic discharge (ESD) test result of the component under test (BUT) under the ESD test standard based on the first leakage current value and the second leakage current value, specifically includes the following: determining the current difference between the second leakage current value and the first leakage current value; determining the first ESD test result of the BUT under the ESD test standard based on the difference between the current difference and a preset current difference; determining the second ESD test result of the BUT under the ESD test standard based on the difference between the second leakage current value and the preset leakage current value; determining the current change rate between the second leakage current value and the first leakage current value; determining the third ESD test result of the BUT under the ESD test standard based on the difference between the current change rate and the preset current change rate; and obtaining the ESD test result of the BUT under the ESD test standard based on the first ESD test result, the second ESD test result, and the third ESD test result.

[0085] The current difference refers to the absolute or algebraic value obtained by subtracting the first leakage current value from the second leakage current value.

[0086] The first electrostatic discharge test result refers to the sub-test result obtained based on the leakage current difference.

[0087] Among them, the preset current difference value refers to the pre-set current difference threshold value.

[0088] The preset leakage current value refers to the pre-set leakage current threshold.

[0089] The second electrostatic discharge test result refers to the sub-test result obtained based on the second leakage current value.

[0090] The rate of change of current refers to the ratio of the current difference to the first leakage current value.

[0091] The preset current change rate refers to the pre-set threshold for the current change rate.

[0092] Among them, the third electrostatic detection result refers to the sub-detection result obtained based on the leakage current change rate.

[0093] For example, the server subtracts the second leakage current value from the first leakage current value to obtain the current difference between the two values. If the current difference is less than a preset current difference, the first electrostatic discharge (ESD) test result for the component under test (BUT) under the ESD test standard is determined to be a pass; if the current difference is greater than or equal to the preset current difference, the first ESD test result for the BUT is determined to be a fail. The server then compares the second leakage current value with the preset leakage current value. If the second leakage current value is less than the preset leakage current value, the second ESD test result for the BUT under the ESD test standard is determined to be a pass; if the second leakage current value is greater than or equal to the preset leakage current value, the second ESD test result for the BUT is determined to be a fail. The server then obtains the current difference. The ratio of the second leakage current value to the first leakage current value is used as the rate of change of current between the second leakage current value and the first leakage current value. If the rate of change of current is less than the preset rate of change of current, the third electrostatic discharge (ESD) test result of the component under test is determined to be a pass under the ESD test standard. If the rate of change of current is greater than or equal to the preset rate of change of current, the third ESD test result of the component under test is determined to be a fail under the ESD test standard. If the first, second, and third ESD test results are all pass, the ESD test result of the component under test is determined to be a pass under the ESD test standard. If at least one of the first, second, and third ESD test results is a fail, the ESD test result of the component under test is determined to be a fail under the ESD test standard.

[0094] In this embodiment, by using the same electrostatic discharge (ESD) testing standard, three dimensions—leakage current difference, absolute leakage current, and leakage current change rate—are used for separate evaluation. Multiple indicators corroborate each other and comprehensively evaluate the performance status of components after ESD shock, overcoming the limitations of a single evaluation method and effectively improving the completeness and accuracy of the test results.

[0095] In an exemplary embodiment, step S102, before subjecting the component under test to electrostatic discharge shock according to the electrostatic detection standard corresponding to the component under test, specifically includes the following: extracting the component model information corresponding to the component under test from the electrostatic detection instruction; and determining the electrostatic detection standard corresponding to the component under test based on the component model information.

[0096] Among them, component model information refers to the model code used to uniquely identify the component under test.

[0097] For example, the server inputs the electrostatic discharge (ESD) detection command into the trained information extraction model, and extracts the component model information corresponding to the component under test from the ESD detection command. Then, the component model information is input into the trained ESD detection standard prediction model to obtain the predicted probability of the component under test under each preset ESD detection standard. The preset ESD detection standard with the highest predicted probability is selected from the preset ESD detection standards as the ESD detection standard corresponding to the component under test.

[0098] In this embodiment, by automatically extracting component model information from the electrostatic discharge (ESD) test command and matching the corresponding ESD test standard according to the model, the operation process is simplified and the test efficiency is improved without the need for manual standard selection. At the same time, it can effectively avoid human error in standard selection, ensure that the test standard and the component under test are accurately matched, and ensure that the subsequent ESD test process always meets the corresponding specification requirements.

[0099] In an exemplary embodiment, step S104 above, which determines the target electrostatic discharge (ESD) result corresponding to the component under test based on the ESD test results under the ESD test standard, specifically includes the following: if all ESD test results of the component under test under the ESD test standard are passed, the target ESD test result corresponding to the component under test is determined to be passed; if at least one ESD test result of the component under test under the ESD test standard is failed, the target ESD test result corresponding to the component under test is determined to be failed.

[0100] For example, the server checks and compares the electrostatic discharge (ESD) test results of the component under test under each ESD test standard one by one; if all the ESD test results of the component under test under the ESD test standard are passed, the target ESD test result corresponding to the component under test is determined to be passed; if at least one of the ESD test results of the component under test under the ESD test standard is failed, the target ESD test result corresponding to the component under test is determined to be failed.

[0101] In this embodiment, a comprehensive judgment logic with a veto power is adopted to summarize and judge the individual electrostatic test results of the components. If any one of the test results is unqualified, the whole component is judged to fail. This can strictly control the electrostatic performance quality of the components, ensure that the final target electrostatic test results are objective and rigorous, and effectively guarantee the overall reliability of the components leaving the factory.

[0102] In one exemplary embodiment, such as Figure 2 As shown, another method for electrostatic discharge (ESD) testing of electronic components is provided. Taking the application of this method to a server as an example, the specific steps include:

[0103] Step S201: In response to the electrostatic discharge (ESD) detection command for the component under test, the first leakage current value of the component under test before undergoing an ESD shock is obtained.

[0104] Step S202: Extract the component model information corresponding to the component under test from the electrostatic detection command.

[0105] Step S203: Determine the electrostatic discharge (ESD) test standard corresponding to the component under test based on the component model information.

[0106] Step S204: Based on the electrostatic discharge (ESD) detection standard corresponding to the component under test, query the correspondence between the ESD detection standard and the pulse information to obtain the pulse information corresponding to the ESD detection standard, which is then used as the target pulse information for the component under test.

[0107] Step S205: Determine the electrostatic discharge impulse pulse corresponding to the component under test based on the target pulse information.

[0108] Step S206: Perform electrostatic discharge impact on the component under test using an electrostatic discharge impact pulse, and obtain the second leakage current value of the component under test after the electrostatic discharge impact.

[0109] Step S207: Based on the first leakage current value and the second leakage current value, determine the electrostatic test result of the component under test under the electrostatic test standard.

[0110] Step S208: Based on the electrostatic test results of the component under test under the electrostatic test standard, determine the target electrostatic test result corresponding to the component under test.

[0111] In the above-mentioned electrostatic discharge (ESD) testing method for components, when performing ESD testing on components, the leakage current values ​​before and after the ESD impact are collected separately, and the test results are automatically determined by combining the two sets of leakage current data. The entire test is completed by relying on quantitative data and standardized rules, which avoids the shortcomings of traditional technology that uses manual testing methods, which are cumbersome and prone to human error, resulting in low accuracy of ESD testing of components. This improves the accuracy of ESD testing of components.

[0112] In one exemplary embodiment, to more clearly illustrate the component electrostatic discharge (ESD) detection method provided in this application, a specific embodiment is described below. In one embodiment, this application also provides another component ESD detection method, which specifically includes the following:

[0113] In the field of electronic component manufacturing, screening and reliability verification, electrostatic discharge (ESD) is one of the key factors leading to component failure. It can not only cause immediate damage to components, but also cause latent damage, leading to sudden failure of components during subsequent use, which seriously affects the stability and service life of electronic equipment.

[0114] Currently, the field of ESD testing for electronic components faces four main problems: First, low automation, with most testing processes relying on manual operation, which is not only time-consuming and labor-intensive but also prone to data distortion due to human error, failing to meet the high-efficiency testing requirements of large-scale production scenarios. Second, limited testing standards, with existing equipment mostly supporting only a single ESD test model (such as only supporting the human body model (HBM) or the charged device model (CDM), failing to cover the multi-standard testing requirements of different application scenarios and making it difficult to comprehensively evaluate the ESD tolerance of components. Third, inability to achieve batch parallel testing, with existing devices mostly being single-channel designs, capable of testing only one component at a time, resulting in low testing efficiency and difficulty in meeting the testing needs of large-scale component production. Fourth, difficulty in identifying latent damage after ESD, with traditional testing only able to determine whether a component fails immediately, failing to capture minute changes in parameters such as leakage current after an ESD impact. These minute changes are often the core characteristics of latent damage, easily leading to components with latent damage entering the market and creating safety hazards.

[0115] As electronic components rapidly evolve towards miniaturization, high integration, and low power consumption, their ESD tolerance is further reduced, placing higher demands on the automation, multi-standardization, batch testing, and latent damage identification capabilities of ESD testing. Against this backdrop, developing a multi-channel modular automated electrostatic discharge (ESD) testing device capable of addressing these challenges and achieving efficient, comprehensive, and accurate verification of component ESD reliability has become an urgent need for the industry, while also providing crucial technical support for improving the reliability of electronic equipment.

[0116] like Figure 3 As shown in the diagram, this solution provides a system block diagram for an automatic electrostatic discharge (ESD) testing device for components in an energy meter. The entire system consists of four main parts: a host computer, a main control system, a multi-channel control and acquisition system, and an isolated test fixture. The host computer and the main control system communicate with each other via the RS485 (Recommended Standard 485, a serial bus standard) protocol. The main control system controls the multi-channel control and acquisition system to apply ESD stress and collect leakage current for each channel. The isolated test fixture is used to place the component under test.

[0117] like Figure 4 As shown, a test procedure for a multi-channel modular automatic electrostatic discharge (ESD) testing device for electronic components is provided, including the following steps:

[0118] S1. Set the measurement conditions of the test device, including: setting the ESD standard used, ESD impulse voltage, number of test channels, leakage current threshold, number of test cycles and other key parameters.

[0119] S2. After the hardware connection is completed, the system performs a self-test, automatically identifying the ID (identity) and status of all connected modules. If any module experiences a communication error or fails the self-test, an alarm is triggered and the system waits for processing, interrupting the process; if all modules are normal, the system proceeds to the next step.

[0120] S3. The main control system controls the multi-channel relay matrix to switch to the leakage current measurement path, and collects the initial leakage current data I_leak0 of multiple devices under test before ESD impact through the nA (nanoampere) level leakage current monitoring unit.

[0121] S4. Select the corresponding ESD excitation module according to the test standard configured in S1.

[0122] S5. The main control system controls the multi-channel relay matrix to select the ESD stress path and controls the ESD excitation module to generate standard-compliant ESD impulse pulses. At the same time, the ESD impulse pulses are applied in parallel to multiple devices under test through an isolated test fixture (including a high-insulation spring pin array, coaxial shielding box, and ferrite bead isolation structure) to complete batch ESD stress application, avoid test interference, and ensure signal integrity.

[0123] S6. The main control system controls the multi-channel relay matrix to quickly switch back to the leakage current measurement path and cut off the ESD excitation path; the leakage current data I_leak1 of each measured component after ESD impact is collected through the nA-level leakage current monitoring unit.

[0124] S7. The main control system will compare the collected post-impact leakage current I_leak1 with the initial leakage current I_leak0 and the preset qualified threshold to complete the automatic determination of ESD latent damage of the tested component.

[0125] S8. The main control system determines whether the current test task is completed, including whether all test channels and multi-standard ESD tests have been completed. If the test is not completed, it jumps to S4. If the corresponding channel component is determined to be damaged, the subsequent loop test of that channel is stopped, and the loop is only executed on the valid channels that have not completed the test to improve test efficiency.

[0126] S9. After the test is completed, the host computer analyzes the test data and outputs the component ESD test report.

[0127] In the above embodiments, when performing electrostatic discharge (ESD) testing on components, the leakage current values ​​before and after the ESD impact are collected separately, and the test results are automatically determined by combining the two sets of leakage current data. The entire testing process relies on quantitative data and standardized rules, avoiding the shortcomings of traditional manual testing methods, which are cumbersome and prone to human error, resulting in low accuracy of ESD testing. This improves the accuracy of ESD testing. Simultaneously, the fully automated control process enables batch parallel testing of components, achieving efficient testing in large-scale production scenarios. The use of replaceable HBM / CDM / IEC multi-standard ESD excitation modules allows switching between multiple testing standards, improving the comprehensiveness of component ESD tolerance assessment. The multi-channel design allows simultaneous testing of multiple components, reducing manual operation costs, shortening the testing time for a single component, and improving testing efficiency. The integrated nA-level leakage current monitoring unit can capture minute changes in leakage current after ESD impact, assessing the impact of latent damage on component reliability. The use of replaceable isolated test fixtures adapts to different types and sizes of components, reducing test interference and improving the accuracy of test data.

[0128] It should be understood that although the steps in the flowcharts of the above embodiments are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the above embodiments may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages of other steps.

[0129] Based on the same inventive concept, this application also provides a component electrostatic detection device for implementing the component electrostatic detection method described above. The solution provided by this device is similar to the solution described in the above method; therefore, the specific limitations in one or more component electrostatic detection device embodiments provided below can be found in the limitations of the component electrostatic detection method described above, and will not be repeated here.

[0130] In one exemplary embodiment, such as Figure 5 As shown, a component electrostatic discharge (ESD) detection device is provided, comprising: a first acquisition module 501, a second acquisition module 502, a first determination module 503, and a second determination module 504, wherein:

[0131] The first acquisition module 501 is used to acquire the first leakage current value of the component under test before it undergoes electrostatic discharge impact in response to an electrostatic detection command for the component under test.

[0132] The second acquisition module 502 is used to perform electrostatic discharge impact on the component under test according to the electrostatic detection standard corresponding to the component under test, and to acquire the second leakage current value of the component under test after the electrostatic discharge impact.

[0133] The first determining module 503 is used to determine the electrostatic test result of the component under test under the electrostatic test standard based on the first leakage current value and the second leakage current value.

[0134] The second determining module 504 is used to determine the target electrostatic test result corresponding to the component under test based on the electrostatic test result of the component under test under the electrostatic test standard.

[0135] In an exemplary embodiment, the second acquisition module 502 is further configured to determine the electrostatic discharge impulse pulse corresponding to the component under test according to the electrostatic detection standard corresponding to the component under test; and to perform electrostatic discharge impulse on the component under test through the electrostatic discharge impulse pulse.

[0136] In an exemplary embodiment, the second acquisition module 502 is further configured to query the correspondence between the electrostatic detection standard and the pulse information based on the electrostatic detection standard corresponding to the component under test, and obtain the pulse information corresponding to the electrostatic detection standard as the target pulse information corresponding to the component under test; and determine the electrostatic discharge impulse pulse corresponding to the component under test based on the target pulse information.

[0137] In an exemplary embodiment, the first determining module 503 is further configured to: determine the current difference between the second leakage current value and the first leakage current value; determine the first electrostatic discharge (ESD) result of the component under test (BUT) under the ESD testing standard based on the difference between the current difference and a preset current difference; determine the second ESD result of the BUT under the ESD testing standard based on the difference between the second leakage current value and the preset leakage current value; determine the current change rate between the second leakage current value and the first leakage current value; determine the third ESD result of the BUT under the ESD testing standard based on the difference between the current change rate and the preset current change rate; and obtain the ESD test result of the BUT under the ESD testing standard based on the first ESD test result, the second ESD test result, and the third ESD test result.

[0138] In one exemplary embodiment, the component electrostatic detection device further includes a standard determination module, used to extract the component model information corresponding to the component under test from the electrostatic detection command; and to determine the electrostatic detection standard corresponding to the component under test based on the component model information.

[0139] In an exemplary embodiment, the second determining module 504 is further configured to determine that the target electrostatic detection result of the component under test is a pass when all electrostatic detection results of the component under test under the electrostatic detection standard are pass; and to determine that the target electrostatic detection result of the component under test is a fail when at least one electrostatic detection result of the component under test under the electrostatic detection standard is fail.

[0140] Each module in the aforementioned electrostatic discharge (ESD) detection device can be implemented entirely or partially through software, hardware, or a combination thereof. These modules can be embedded in the processor of a computer device in hardware form or independent of it, or stored in the memory of a computer device in software form, so that the processor can call and execute the corresponding operations of each module.

[0141] In one exemplary embodiment, a computer device is provided, which may be a server, and its internal structure diagram may be as follows: Figure 6 As shown, this computer device includes a processor, memory, input / output (I / O) interfaces, and a communication interface. The processor, memory, and I / O interfaces are connected via a system bus, and the communication interface is also connected to the system bus via the I / O interfaces. The processor provides computational and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores the operating system, computer programs, and a database. The internal memory provides the environment for the operating system and computer programs stored in the non-volatile storage media. The database stores data such as first leakage current values ​​and second leakage current values. The I / O interfaces are used for information exchange between the processor and external devices. The communication interface is used for communication with external terminals via a network connection. When executed by the processor, the computer program implements a method for electrostatic discharge (ESD) detection of electronic components.

[0142] Those skilled in the art will understand that Figure 6 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0143] In one exemplary embodiment, a computer device is also provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps in the above-described method embodiments.

[0144] In one exemplary embodiment, a computer-readable storage medium is provided having a computer program stored thereon that, when executed by a processor, implements the steps in the above-described method embodiments.

[0145] In one exemplary embodiment, a computer program product is provided, including a computer program that, when executed by a processor, implements the steps in the above-described method embodiments.

[0146] Those skilled in the art will understand that all or part of the processes in the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium. When executed, the computer program can include the processes of the embodiments described above. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, etc., and are not limited to these.

[0147] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0148] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. A method for electrostatic detection of electronic components, characterized in that, The method includes: In response to an electrostatic discharge (ESD) test command for the component under test, the first leakage current value of the component under test before undergoing an ESD shock is obtained. According to the electrostatic detection standard corresponding to the component under test, the component under test is subjected to electrostatic discharge impact, and the second leakage current value of the component under test after the electrostatic discharge impact is obtained. The process involves determining the current difference between the second leakage current value and the first leakage current value, and based on the difference between the current difference and a preset current difference, determining the first electrostatic discharge (ESD) test result of the component under test (BUT) under the ESD test standard. It also involves determining the second ESD test result of the BUT under the ESD test standard based on the difference between the second leakage current value and the preset leakage current value. Finally, it involves determining the current change rate between the second leakage current value and the first leakage current value, and based on the difference between the current change rate and the preset current change rate, determining the third ESD test result of the BUT under the ESD test standard. Based on the electrostatic discharge test results of the component under test under the electrostatic discharge test standard, the target electrostatic discharge test result corresponding to the component under test is determined.

2. The method according to claim 1, characterized in that, The step of subjecting the component under test to electrostatic discharge shock according to the electrostatic detection standard corresponding to the component under test includes: Based on the electrostatic detection standard corresponding to the component under test, the electrostatic discharge impulse pulse corresponding to the component under test is determined; The component under test is subjected to electrostatic discharge impact by the electrostatic discharge impact pulse.

3. The method according to claim 2, characterized in that, The step of determining the electrostatic discharge impulse pulse corresponding to the component under test based on the electrostatic detection standard corresponding to the component under test includes: Based on the electrostatic discharge (ESD) detection standard corresponding to the component under test, the correspondence between the ESD detection standard and the pulse information is queried to obtain the pulse information corresponding to the ESD detection standard, which is used as the target pulse information corresponding to the component under test. Based on the target pulse information, the electrostatic discharge impulse pulse corresponding to the component under test is determined.

4. The method according to claim 1, characterized in that, Before subjecting the component under test to electrostatic discharge (ESD) according to the ESD testing standard corresponding to the component under test, the process further includes: Extract the component model information corresponding to the component under test from the electrostatic detection command; Based on the component model information, the electrostatic discharge (ESD) testing standard corresponding to the component under test is determined.

5. The method according to any one of claims 1 to 4, characterized in that, The step of determining the target electrostatic discharge (ESD) result corresponding to the component under test based on the ESD test result under the ESD test standard includes: If the electrostatic discharge test results of the component under test under the electrostatic discharge test standard are all passed, the target electrostatic discharge test result corresponding to the component under test is determined to be passed. If at least one of the electrostatic discharge (ESD) test results for the component under test under the ESD test standard is a failure, then the target ESD test result for the component under test is determined to be a failure.

6. A component electrostatic detection device, characterized in that, The device includes: The first acquisition module is used to acquire the first leakage current value of the component under test before electrostatic discharge impact in response to the electrostatic detection command for the component under test. The second acquisition module is used to perform electrostatic discharge impact on the component under test according to the electrostatic detection standard corresponding to the component under test, and acquire the second leakage current value of the component under test after the electrostatic discharge impact. A first determining module is configured to: determine the current difference between the second leakage current value and the first leakage current value; determine a first electrostatic discharge (ESD) result for the component under test (BUT) under the ESD detection standard based on the difference between the second leakage current value and the preset leakage current value; determine a second ESD result for the BUT under the ESD detection standard based on the difference between the second leakage current value and the preset leakage current value; determine the current change rate between the second leakage current value and the first leakage current value; determine a third ESD result for the BUT under the ESD detection standard based on the difference between the current change rate and the preset current change rate; and obtain the ESD detection result for the BUT under the ESD detection standard based on the first ESD result, the second ESD result, and the third ESD result. The second determining module is used to determine the target electrostatic detection result corresponding to the component under test based on the electrostatic detection result of the component under test under the electrostatic detection standard.

7. The apparatus according to claim 6, characterized in that, The second acquisition module is further configured to determine the electrostatic discharge impulse pulse corresponding to the component under test according to the electrostatic detection standard corresponding to the component under test; and to perform electrostatic discharge impulse on the component under test through the electrostatic discharge impulse pulse.

8. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that, When the processor executes the computer program, it implements the steps of the method according to any one of claims 1 to 5.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 5.

10. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 5.

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