Apparatus and method for simulating single event effect test under spatial magnetic field

Abstract

The application discloses a device and method for simulating single particle effect under the action of a space magnetic field, which comprises a radiation source, a zero magnetic shielding mechanism, a magnetic field generator and a test controller, wherein the radiation source is located outside the zero magnetic shielding mechanism, the magnetic field generator is located inside the zero magnetic shielding mechanism, the measured electronic device is placed in the action range of the radiation source and in the magnetic field range generated by the magnetic field generator, and the test controller is connected with the magnetic field generator and the measured electronic device respectively. According to the application, the test data of the single particle effect under different magnetic field actions can be obtained, and the reliability of the simulation data of the device under the action of the space magnetic field, especially under the action of a strong magnetic field, is improved.

Description

Technical Field

[0001] This invention relates to the technical field of space environment effect testing for spacecraft, and in particular to a testing device and method for simulating single-event effects under the influence of a space magnetic field. Background Technology

[0002] Traditional single-event effect (SEE) tests on electronic components do not consider the influence of space magnetic fields. However, actual electronic components and circuits are used in spacecraft. During spacecraft operation in orbit, they are affected not only by various high-energy particles but also by the combined influence of space magnetic fields. If the influence of space magnetic fields is not considered when conducting SEE tests on electronic components, the experimental data will be inaccurate. Therefore, it is urgent to conduct SEE tests under the influence of space magnetic fields. Summary of the Invention

[0003] The purpose of this invention is to provide a testing device and method for simulating single-particle effects under the influence of a space magnetic field.

[0004] A first aspect of the present invention provides a single-event effect testing device for simulating the effect of a space magnetic field, comprising: a radiation source, a zero-magnetic shielding mechanism, a magnetic field generator, and a test controller, wherein the radiation source is located outside the zero-magnetic shielding mechanism, the magnetic field generator is located inside the zero-magnetic shielding mechanism, the electronic device under test is placed within the effective range of the radiation source and within the magnetic field range generated by the magnetic field generator, and the test controller is connected to both the magnetic field generator and the electronic device under test; wherein... The zero magnetic shielding mechanism has an internal accommodating space. The zero magnetic shielding mechanism is configured to generate a magnetic field that can cancel the Earth's magnetic field, so as to shield the stray magnetic field or the Earth's magnetic field in the external environment of the zero magnetic shielding mechanism and form a zero magnetic field region within the accommodating space. The radiation source is used to generate energy particles, wherein the electronic device under test includes a sensitive region facing the incident direction of the energy particles; The magnetic field generator is used to superimpose a controllable magnetic field in the zero magnetic field region. The magnetic field generator is configured to generate the controllable magnetic field with variable direction, intensity, and helix angle to simulate the changes in magnetic field formed by solar wind, magnetic storms, and / or encounters with planets in space, so as to simulate the single-event effect caused by the real space magnetic field acting on the electronic device under test. The test controller includes: A single-event effect test circuit electrically connected to the electronic device under test is used to collect the single-event effect response signal of the electronic device under test under simulated different spatial magnetic fields after being irradiated by energy particles. A system noise processing module electrically connected to the single-event effect test circuit is used to acquire the test system noise and remove the signal component corresponding to the system noise from the single-event effect response signal; and The single-event effect test data processing module, which is electrically connected to the system noise processing module, is used to perform statistical analysis on the noise-processed single-event effect response signal to obtain the test results when the electronic device under test exhibits a single-event effect.

[0005] Furthermore, the zero magnetic shielding mechanism includes an active magnetic field cancellation device, which includes a coil unit arranged around the zero magnetic field region and a current controller connected to the coil unit. The current controller provides a current opposite to the direction of the geomagnetic field to the coil unit based on the geomagnetic field measurement results in the accommodating space, so that the magnetic field strength in the zero magnetic field region is less than a set threshold.

[0006] Furthermore, the zero-magnetic shielding mechanism also includes a frame, which is a prism or cylinder structure. The interior of the frame forms a receiving space, and the coil units are arranged in a grid-like structure around the outer periphery of the frame.

[0007] Furthermore, the magnetic field generator includes a first magnetic field generating component, which comprises a solenoid wound with a wire; wherein, The electronic device under test is located inside the solenoid. When an adjusted current is passed through the solenoid, a magnetic field with a set direction and intensity is formed. The plane of the sensitive area is perpendicular to the direction of the magnetic field lines generated by the solenoid; and / or, The magnetic field generator includes a second type of magnetic field generating component, which comprises two electromagnets spaced apart; wherein... The electronic device under test is located between the N and S poles of two electromagnets. When the two electromagnets are energized with an adjusted current, they form a magnetic field with a set direction and intensity. The plane of the sensitive area of ​​the electronic device under test is parallel to the direction of the magnetic field lines generated by the two electromagnets.

[0008] Furthermore, the magnetic field generator also includes a first magnetic field simulation module for simulating the magnetic field strength of the solar wind magnetic field, wherein, The first magnetic field simulation module calculates the helix angle of the interplanetary magnetic field based on the input solar wind parameters, and controls the magnetic field generator to generate a set magnetic field strength value, so as to generate a magnetic field strength that fluctuates randomly over time in the zero magnetic field region, so as to simulate a solar wind magnetic field with solar wind turbulence characteristics; wherein, the solar wind parameters include solar wind speed, density and duration.

[0009] Furthermore, the magnetic field generator also includes a second magnetic field simulation module for simulating magnetic field changes during geomagnetic storm events, wherein, The second magnetic field simulation module is based on the Tsyganenko magnetosphere model. It takes into account the time, spatial location, solar wind speed, density, dynamic pressure, interplanetary magnetic field IMF components and geomagnetic Dst index, and controls the magnetic field generator to generate a time-evolved magnetic field intensity that goes through the initial compression phase, the main phase phase and the recovery phase. It also superimposes a magnetic field disturbance with a set magnetic field value, which is set as a local magnetic field disturbance generated by the auroral current system.

[0010] Furthermore, the magnetic field generator also includes a third magnetic field simulation module for simulating magnetic field changes caused by encountering a planet. The influence of the space magnetic field environment during planetary encounters includes the strong magnetic field environment of the spacecraft using the tested electronic device in polar Earth orbit, Jupiter orbit, or Jupiter's moon orbit. The third magnetic field simulation module is based on the Tsyganenko magnetosphere model and the PPMLR-MHD physical model. It takes into account the spacecraft's orbital parameters, time, spatial position, solar wind speed, density, dynamic pressure, interplanetary magnetic field IMF component and geomagnetic Dst index, and controls the magnetic field generator to produce a corresponding target magnetic field strength to simulate the magnetic field changes caused by the space magnetic field environment when encountering a planet. The target magnetic field strength is calculated based on the distance between the spacecraft and the encountered planet, the magnetic field gradient and the main magnetic field strength of the encountered planet.

[0011] Furthermore, the system noise processing module includes: The system noise collection channel is used to receive the single-event effect response signal sent by the single-event effect test circuit; A noise feature recognition unit is used to identify system noise signals in the single-event effect response signal; and The noise cancellation unit is used to eliminate and filter the single-event effect response signal based on the system noise signal during single-event effect testing, so as to eliminate the influence of environmental noise on the test results.

[0012] Furthermore, the electronic device under test includes any of the following: CMOS devices, power MOSFET devices, memory devices, analog circuit devices, digital circuit devices, and AD / DA converters; and / or, Furthermore, the radiation source includes any one of the following: a particle irradiation source, a laser source, a heavy ion accelerator, a proton accelerator, and a pulsed laser; and / or, Furthermore, the magnetic field strength generated by the magnetic field generator can be adjusted within a range of 1×10⁻⁶. 3 -1×10 6 nT.

[0013] A second aspect of the present invention provides a method for testing single-event effects under the influence of a space magnetic field, based on the above-described apparatus, the method comprising: The coil unit of the zero magnetic shielding mechanism is energized, and the current flowing into the coil unit is adjusted according to the real-time changes in the magnetic field within the containment space of the zero magnetic shielding mechanism, so as to form a zero magnetic field region within the containment space of the zero magnetic shielding mechanism. The magnetic field generator is adjusted to produce a controllable magnetic field in order to simulate the effect of the target space magnetic field. Turn on the radiation source to apply particles with a preset energy to the electronic device under test; Monitor whether the electronic device under test undergoes a single-event effect under the action of a simulated target space magnetic field and irradiation by incident particles of preset energy; If the electronic device under test does not exhibit a single-event effect under the influence of the simulated target space magnetic field and the irradiation of incident particles with a preset energy, then increase the energy of the incident particles until the electronic device under test exhibits a single-event effect, and record the test results.

[0014] The above-described technical solution of the present invention has the following beneficial technical effects: In this embodiment of the invention, by setting up a zero magnetic shielding mechanism, stray magnetic fields or geomagnetic fields around the external environment of the zero magnetic shielding mechanism can be shielded, forming a zero magnetic field in the central region of the containment space. A magnetic field generator is installed in the zero magnetic field region of the containment space, and a controllable magnetic field is superimposed in the zero magnetic field region. The magnetic field strength generated by the magnetic field generator acts on the electronic device under test. The current of the magnetic field generator can be adjusted according to the magnetic field strength value in the real space magnetic field environment to obtain the corresponding magnetic field strength, thereby simulating the effect of the space magnetic field on the electronic device under test. After being irradiated by incident particles of preset energy, the single-event effect of the electronic device under test is monitored. Test data on the occurrence of single-event effects of the electronic device under test under different magnetic fields can be obtained. This can improve the reliability and accuracy of the ground simulation test data of the electronic device under test in the space magnetic field environment, especially in the strong magnetic field service environment. This provides a basis for the optimization of the redundancy design and fault tolerance mechanism of the electronic device under test, provides a basis for the selection of electronic components for spacecraft in the space magnetic field service environment, and thus provides a guarantee for the on-orbit service safety of electronic components and the on-orbit reliability of spacecraft. Attached Figure Description

[0015] Figure 1 This is a schematic diagram of the structure of a single-event effect testing device for simulating the action of a space magnetic field according to the first embodiment of the present invention. Figure 2 This is a schematic diagram of the structure of a single-event effect testing device for simulating the action of a space magnetic field according to the second embodiment of the present invention. Figure 3This is a schematic diagram of the structure of a single-event effect testing device for simulating the action of a space magnetic field according to a third embodiment of the present invention. Figure 4 This is a flowchart of a method for testing single-event effects under the influence of a space magnetic field according to a fourth embodiment of the present invention. Figure label: 11. Zero magnetic shielding mechanism; 111. Coil unit; 12. Radiation source; 13. Test controller; 15. Electronic device under test; 20. Magnetic field generator; 21. Solenoid; 22. First electromagnet; 23. Second electromagnet. Detailed Implementation

[0016] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to specific embodiments and the accompanying drawings. It should be understood that these descriptions are merely exemplary and not intended to limit the scope of the invention. Furthermore, descriptions of well-known structures and techniques are omitted in the following description to avoid unnecessarily obscuring the concept of the invention. In this document, terms such as first, second, and third are used only to distinguish one feature from another and are not intended to require or imply any order or association between these features.

[0017] During spacecraft operation, the space particle radiation environment and space magnetic field environment can influence the spacecraft, inducing single-event effects (SEEs) in its electronic components. SEEs are also known as single-event effects. High-energy charged particles in the space particle radiation environment act on electronic components, generating a large number of charged particles within the sensitive areas of the components; this phenomenon is an ionization effect. When sufficiently high-energy particles enter integrated circuits, due to ionization (including secondary particles), a large number of ionized electron-hole pairs are generated, causing soft and hard errors in semiconductor devices. For example, this can cause single-event flips in logic devices and memory, single-event latch-up in CMOS devices, and even permanent single-event damage. The types of SEEs are described in Table 1 below. Table 1. Description of the types of single-event effects

[0018] The space particle radiation environment mainly includes stellar capture radiation belts, solar cosmic rays, galactic cosmic rays, and neutrons. Among these, stellar capture radiation belts refer to the regions of high-energy charged particles captured by magnetic fields in planetary magnetospheres; these are primarily composed of protons and electrons, with a small amount of heavy ions. Solar cosmic rays are the large streams of high-energy protons, electrons, and heavy nuclei emitted during solar bursts of activity, with the vast majority composed of protons; these are sometimes referred to as solar proton events or solar particle events (SPEs). Galactic cosmic rays are charged particles originating from outside the solar system, composed of high-energy, low-flux charged particles, with protons comprising 85%, alpha particles 14%, and heavy ions 1%, and particle energies ranging from 100 to 1 × 10⁻⁶. 14 MeV, flux of 2–4 / (cm²) 2 ·s).

[0019] Traditional single-event effect tests on electronic components do not consider the effect of space magnetic fields. However, when electronic components and their circuits are used in spacecraft, they are not only affected by various high-energy particles during their orbital operation, but also by the combined effect of space magnetic fields. If the effect of space magnetic fields is not considered when conducting single-event effect tests on electronic components, the test data will be inaccurate.

[0020] The geomagnetic field is the magnetic field that extends from the Earth's core to the boundary of the magnetosphere. It can be divided into two parts: the fundamental magnetic field and the varying magnetic field. The fundamental magnetic field consists of several components, including the dipole field, the non-dipole field, and geomagnetic anomalies. The dipole field is the basic component of the geomagnetic field, accounting for approximately 90% of its total area, deviating from the Earth's axis by about 11.5 degrees, and from the Earth's core by about 500 km. Therefore, when simulating the space magnetic field environment on the ground, it is necessary to shield against interference from the geomagnetic field; otherwise, the experimental data may be inaccurate.

[0021] Therefore, embodiments of the present invention provide a single-event effect testing device for simulating the effects of a space magnetic field, such as... Figure 1-2As shown, it includes: a zero magnetic shielding mechanism 11, a magnetic field generator 20, a radiation source 12, and a test controller 13. The zero magnetic shielding mechanism 11 includes a coil unit 111 and a frame for supporting the coil unit 111. The frame is a prism structure or a cylinder structure, and the interior of the frame forms an accommodating space. The coil unit 111 can be assembled into a grid structure around the outer periphery of the frame. When power is supplied to the coil unit 111, the magnetic field generated by the coil unit 111 can cancel the Earth's magnetic field, thereby shielding the stray magnetic field or Earth's magnetic field in the external environment of the zero magnetic shielding mechanism 11 and forming a zero magnetic field region in the central area of ​​the accommodating space. The radiation source is located outside the zero-magnetic shielding mechanism, and the magnetic field generator is located inside the zero-magnetic shielding mechanism. The electronic device under test is placed within the effective range of the radiation source and within the magnetic field range generated by the magnetic field generator. The radiation source generates energy particles, and the electronic device under test includes a sensitive area facing the incident direction of the energy particles. The magnetic field generator is used to superimpose a controllable magnetic field within the zero-magnetic field region. The magnetic field generator is configured to generate the controllable magnetic field with variable direction, intensity, and helix angle to simulate the changes in magnetic fields caused by solar wind, geomagnetic storms, and / or encounters with planets in space, thereby simulating the single-event effect caused by the real space magnetic field acting on the electronic device under test. The device also includes a testing... The controller and the test controller are respectively connected to the magnetic field generator and the electronic device under test. The test controller includes: a single-event effect test circuit electrically connected to the electronic device under test, used to acquire the single-event effect response signal of the electronic device under test under the action of simulated spatial magnetic fields and irradiation by energy particles; a system noise processing module connected to the single-event effect test circuit, used to acquire the test system noise and remove the signal component corresponding to the system noise from the single-event effect response signal; and a single-event effect test data processing module connected to the system noise processing module, used to perform statistical analysis on the noise-processed single-event effect response signal to obtain the test result when the electronic device under test exhibits a single-event effect.

[0022] The electronic device under test 15 is installed in a preset position on the magnetic field generator, which is located in the center of the zero magnetic shielding mechanism's containment space. The magnetic field generator is adjusted to produce a controllable magnetic field with variable direction, intensity, and helix angle. The controllable magnetic field changes are superimposed within the zero magnetic field region, and the magnetic field intensity generated by the magnetic field generator 20 can reach a set value to simulate a spatial magnetic field acting on the electronic device under test 15. The radiation source 12 is then turned on, causing particles with a preset energy to act on the electronic device under test 15. The sensitive area of ​​the electronic device under test 15 is oriented towards the particle incident direction, and the plane of the sensitive area is aligned with the radiation source 12. 2. The generated particles are incident perpendicularly, monitoring whether the electronic device under test (DUT) 15 experiences a single-event effect under simulated space magnetic field and irradiation by incident particles of preset energy. This allows for the acquisition of test data on single-event effects under different magnetic fields, improving the reliability and accuracy of ground-based simulation test data for DUTs in space magnetic field environments, especially strong magnetic field service environments. This provides a basis for optimizing redundant design and fault-tolerant mechanisms for DUTs, and for selecting electronic components for spacecraft in space magnetic field service environments, ultimately ensuring the on-orbit safety of electronic components and the on-orbit reliability of spacecraft. Furthermore, during single-event effect testing, the system noise in the single-event effect response signal is complex and diverse. By comprehensively analyzing the physical characteristics, circuit architecture, and test conditions of the DUT, and through the synergistic optimization of noise modeling, suppression techniques, and signal processing algorithms, system noise signals in the single-event effect response signal can be eliminated and filtered, improving the accuracy and reliability of single-event effect testing.

[0023] In some embodiments, the magnetic field generator 20 includes a first magnetic field generating component, which includes a solenoid 21 wound with wire, and the internal space of the solenoid 21 is a hollow structure; wherein, the electronic device under test 15 is disposed in the internal space of the solenoid 21, and when an adjusted current is passed through the solenoid, a set magnetic field direction and magnetic field strength are formed, and the plane where the sensitive area is located is perpendicular to the direction of the magnetic field lines generated by the solenoid.

[0024] The magnetic field generator 20 includes a solenoid 21 wound with wire. The solenoid 21 has multiple turns of coil spaced apart along its axis. When current is passed through the solenoid 21, a magnetic field is generated inside the solenoid 21. According to the right-hand screw rule (Ampere's law), with the direction of the four fingers of the right hand around the coil as the direction of the current, the direction of the right thumb is the N pole of the magnetic field, and the opposite direction is the S pole. Changing the direction of the current can change the direction of the magnetic field generated by the solenoid 21. The magnetic field strength can be adjusted by adjusting the current passed through the solenoid 21. When the magnetic field strength is adjusted to a set value, such as the magnetic field strength value in a spatial magnetic field environment, it is possible to simulate different spatial magnetic fields acting on the electronic device under test 15. In addition, a power switch can be connected between the solenoid 21 and the power supply to control the connection and disconnection of the power supply, so as to switch whether the solenoid 21 generates a magnetic field. The power supply of the solenoid 21 and the power switch can both be connected to the test controller 13. Preset energy particles generated by radiation source 12 are incident on the electronic device under test 15 through one end of solenoid 21. The incident direction of the preset energy particles is, for example, from the S pole of the magnetic field. The electronic device under test 15 is, for example, a microelectronic device used in spacecraft. Therefore, by setting the zero magnetic shielding mechanism 11, the stray magnetic field or geomagnetic field around the external environment of the zero magnetic shielding mechanism 11 can be shielded, forming a zero magnetic field in the central region of the containment space. When the magnetic field generator 20 is installed in the central region of the containment space, and the magnetic field strength generated by the magnetic field generator 20 acts on the electronic device under test 15, the current of the magnetic field generator 20 can be adjusted according to the magnetic field strength value in the actual space magnetic field environment. The corresponding magnetic field strength is obtained to simulate the effect of a space magnetic field on the electronic device under test 15. After being irradiated by incident particles with a preset energy, the test controller 13 monitors whether the electronic device under test 15 experiences a single-event effect. Test data on the occurrence of single-event effects of the electronic device under test under different magnetic fields can be obtained. This can improve the reliability and accuracy of the ground simulation test data of the electronic device under test in the space magnetic field environment, especially in the strong magnetic field service environment. This provides a basis for the optimization of the redundancy design and fault tolerance mechanism of the electronic device under test, and provides a basis for the selection of electronic components for spacecraft in the space magnetic field service environment. In turn, it provides a guarantee for the on-orbit service safety of electronic components and the on-orbit reliability of spacecraft.

[0025] in, Figure 2 The thin arrow indicates the direction of particle incidence, the thick arrow indicates the direction of current in the solenoid, and the dashed arrow indicates the direction of the magnetic field generated by the solenoid. Figure 1 The arrow points in the direction of particle incidence, and Figure 1 The power connections between the test controller 13 and the electronic device under test 15 and the magnetic field generator 20 are omitted. Figure 2 The schematic diagram of the zero magnetic shielding mechanism 11 is omitted. Figure 2 The power connection between the test controller 13 and the solenoid 21 is omitted.

[0026] In some embodiments, a magnetic field generator is installed in the central region of the accommodating space. The magnetic field generator 20 includes a solenoid 21 made of wire, and the internal space of the solenoid 21 is a hollow structure. The electronic device under test 15 is disposed in the internal space of the solenoid 21. When a current regulated by a regulator is passed through the solenoid 21, a set magnetic field direction and magnetic field strength are formed to simulate the action of a spatial magnetic field on the electronic device under test 15. A radiation source 12 is used to generate particles with a preset energy. The radiation source 12 is located outside the zero magnetic shielding mechanism 11, and the preset energy particles generated by the radiation source 12 are incident through one end of the solenoid 21 and act on the electronic device under test 15. A test controller 13 is connected to the coil unit, the magnetic field generator, and the electronic device under test 15 respectively. It is used to adjust the current passed through the magnetic field generator to control the magnetic field strength generated by the magnetic field generator and to monitor whether the electronic device under test 15 experiences a single-event effect when irradiated by particles of preset energy under the action of a simulated spatial magnetic field. The test results of the electronic device under test 15 under no magnetic field and under different magnetic field strengths when a single-event effect occurs can be obtained.

[0027] Specifically, the cross-sectional shape of the frame is, for example, a square, hexagon, or circle. The function of the frame is to support and position the coil unit 111. The frame being a prism or cylinder is beneficial for the coil unit 111 to be symmetrically distributed, thus canceling the magnetic field in each direction. For example, when the frame is a cube, the coil unit 111 can be wound with wires along the X, Y, and Z axes of the cube to obtain a multi-turn first coil disk distributed along the X axis, a multi-turn second coil disk distributed along the Y axis, and a multi-turn third coil disk distributed along the Z axis. This forms a grid-like wire distribution on each surface of the cube. When the coil unit 111 is energized, the first, second, and third coil disks can all generate a magnetic field in the space around them. The test controller 13 can be electrically connected to the coil unit 111. The test controller 13 can precisely adjust and control the magnitude and direction of the current of each coil, so that the magnetic field vector sum generated by all coils can completely cancel out the geomagnetic field and the stray magnetic field of the environment in the central region of the containment space. That is, the magnetic field strength in the central region of the containment space approaches zero. For example, when the magnetic field strength measured in the central region of the containment space is less than 5nT, it can be determined that a zero magnetic field is formed in the central region.

[0028] A support frame may be provided in the central area of ​​the accommodating space of the zero-magnetic shielding mechanism 11, and the magnetic field generator 20 may be mounted on the support frame. In some embodiments, the electronic device under test 15 includes a sensitive area facing the particle incident direction. The plane of the sensitive area is perpendicular to the particle incident direction generated by the radiation source 12, and the plane of the sensitive area is perpendicular to the magnetic field direction generated by the magnetic field generator 20. The sensitive area is the core functional area of ​​the electronic device under test 15, responsible for receiving, responding to, or detecting target particles. When the particle incident direction is the same as or parallel to the magnetic field direction generated by the magnetic field generator 20, the energy loss is minimized when the particle is perpendicularly incident on the surface of the sensitive area. When the plane of the sensitive area is perpendicular to the magnetic field direction generated by the magnetic field generator 20, the sensitive area can respond to the magnetic field in the target direction, reducing interference and improving the accuracy of the test data.

[0029] In some embodiments, the test controller 13 may include a current controller connected to the coil unit 111 to adjust the current flowing into the coil unit 111 according to changes in the magnetic field within the containment space; the coil unit 111 includes multiple coil discs, each coil disc being wrapped sequentially and at intervals along different axial or circumferential directions of the frame using copper wire, so that each outer surface of the frame has two overlapping inner and outer coil discs in a grid-like structure; the frame is made of a non-magnetic material, including stainless steel or aluminum alloy.

[0030] In some embodiments, the zero magnetic shielding mechanism includes an active magnetic field cancellation device, which includes a coil unit arranged around the zero magnetic field region and a current controller connected to the coil unit. The current controller provides a current opposite to the direction of the geomagnetic field to the coil unit based on the geomagnetic field measurement results within the containment space, so that the magnetic field strength in the zero magnetic field region is less than a set threshold.

[0031] In an exemplary embodiment, the zero-magnetic shielding mechanism further includes a frame, which is a prism or cylinder structure. The interior of the frame forms an accommodating space, and the coil units are arranged in a grid-like structure around the outer periphery of the frame. The frame is made of a non-magnetic material, including stainless steel or aluminum alloy.

[0032] Specifically, the test controller is the control core of the zero-magnetic shielding mechanism 11. The test controller can sense changes in the magnetic field within the containment space of the zero-magnetic shielding mechanism 11 in real time and achieve magnetic field cancellation by adjusting the current of the coil unit 111. For example, when the frame is a 2m×2m×2m cube, a first coil disk can be obtained by winding around the outer surface of the frame along the x-axis. The wires of the first coil disk are wound in a circular or rectangular path along the plane containing the y-axis and z-axis to generate a magnetic field component in the x-axis direction. For example, if the x-axis direction is left-right, the wires of the first coil disk can be wound sequentially around the front, top, back, and bottom surfaces of the frame to obtain each coil turn, with each coil turn evenly distributed along the left-right direction. A second coil disk can be obtained by winding around the outer surface of the frame along the y-axis. The wires of the second coil disk are wound in a circular or rectangular path along the plane containing the x-axis and z-axis to generate a magnetic field component in the y-axis direction. A third coil disk can be obtained by winding around the outer surface of the frame along the z-axis. The wires are wound in a circular or rectangular path along the planes containing the x and y axes to generate a magnetic field component in the z-axis direction. In this way, the wires form a two-dimensional grid structure on each plane of the frame, forming a compensation coil along the three axes of x, y, and z. The constructed coil unit can achieve "Faraday cage" shielding. The number, spacing, or number of turns of the coils can be adjusted as needed. By setting sensors inside or outside the frame, the geomagnetic field and stray magnetic field data outside (or inside) the zero magnetic shielding mechanism 11 can be collected in real time to obtain magnetic field strength and direction information. The data collected by the sensors is compared with the target zero magnetic threshold, such as ≤5nT, to calculate the magnetic field difference that needs to be compensated. Based on the difference signal, a control signal is output through PWM (pulse width modulation) or D / A converter to drive the current magnitude and direction of each coil in the coil unit 111, so that the central area of ​​the accommodating space is zero magnetic field. The frame is made of non-magnetic material to avoid the frame itself introducing additional magnetic field interference.

[0033] In some embodiments, reference is made to Figure 3 The magnetic field generator includes a second magnetic field generating component, which includes two electromagnets spaced apart. The electronic device under test is located between the N and S poles of the two electromagnets. When an adjusted current is passed through the two electromagnets, a set magnetic field direction and magnetic field strength are formed. The plane of the sensitive area is parallel to the direction of the magnetic field lines generated by the two electromagnets.

[0034] Specifically, a support can be provided in the central area of ​​the accommodating space of the zero magnetic shielding mechanism 11, and the magnetic field generator 20 can be mounted on the support. The magnetic field generator 20 may include a first electromagnet 22 and a second electromagnet 23, and the electronic device under test 15 is located between the N pole of the first electromagnet 22 and the S pole of the second electromagnet 23. The first electromagnet 22 and the second electromagnet 23 can be connected in series, and a power switch can be connected between the first electromagnet 22 and the power supply to control the connection and disconnection of the power supply, so as to switch whether the magnetic field generator 20 generates a magnetic field; or the first electromagnet 22 and the second electromagnet 23 can be connected in parallel, and a power switch can be connected between the power supply and the first electromagnet 22 and the second electromagnet 23 respectively. The magnetic field formed when the first electromagnet 22 and the second electromagnet 23 are energized is directed from the second electromagnet 23 to the first electromagnet 22. The plane of the sensitive area is parallel to the magnetic field lines generated by the two electromagnets. The magnetic field strength can be adjusted by changing the current or voltage. When the magnetic field strength is adjusted to a set value, such as the magnetic field strength value in a space magnetic field environment, the effect of a space magnetic field on the electronic device under test 15 can be simulated. Preset energy particles generated by the radiation source 12 are incident on and irradiate the sensitive area of ​​the electronic device under test 15. The test controller 13 monitors whether the electronic device under test 15 experiences a single-event effect. Test data on the single-event effect of the electronic device under test 15 under different magnetic fields can be obtained. This can improve the reliability and accuracy of the ground simulation test data of the electronic device under test in a space magnetic field environment, especially in a strong magnetic field service environment. This provides a basis for the optimization of the redundancy design and fault tolerance mechanism of the electronic device under test, and a basis for the selection of electronic components for spacecraft in a space magnetic field service environment. In turn, it provides a guarantee for the on-orbit service safety of electronic components and the on-orbit reliability of spacecraft. Figure 3 The arrow in the diagram indicates the direction of particle incidence. The test controller 13 can be electrically connected to the magnetic field generator 20. The magnetic field strength can be adjusted by regulating the current or voltage applied.

[0035] In some embodiments, the magnetic field generating device further includes a first magnetic field simulation module, which is used to simulate the magnetic field strength of the solar wind magnetic field, wherein... The spiral angle of the interplanetary magnetic field IMF is calculated based on the input solar wind parameters, and the first type of magnetic field generating component and / or the second type of magnetic field generating component are controlled to generate a set magnetic field strength value, so as to generate a magnetic field strength that fluctuates randomly over time in the zero magnetic field region, thereby simulating a solar wind magnetic field with solar wind turbulence characteristics; wherein, the solar wind parameters include solar wind speed, density and duration.

[0036] Specifically, based on the Parker spiral model, the spiral angle of the interplanetary magnetic field IMF can be calculated according to the input solar wind parameters, and the spiral angle of the interplanetary magnetic field IMF can be calculated using the following formula. :

[0037] In the formula, B0 is the reference magnetic field strength, which can be, for example, a reference value for the radial magnetic field at the equator; r is the heliocentric distance. Latitude This refers to the speed of the solar wind.

[0038] Alternatively, a three-dimensional magnetohydrodynamic (MHD) numerical model can be used, such as the WSA-ENLIL model. This model includes the WSA (Wang-Sheeley-Arge) module and the ENLIL module. The WSA module is used to simulate the background solar wind, and the ENLIL module is used to simulate CME propagation. Therefore, the WSA-ENLIL model can predict the impact of solar wind magnetic fields and particle flows on the Earth's space environment and obtain the global solar wind magnetic field that evolves over time. By inputting the solar wind velocity, density, and duration into the WSA-ENLIL model, the basic parameters of the simulated solar wind magnetic field can be obtained, such as magnetic field strength, magnetic field direction, and magnetic field helix angle. A set magnetic field strength value can then be generated by adjusting the current or voltage of the first or second magnetic field generating component. The scintillation 1 / f noise magnetic field strength can be randomly increased or decreased on the set magnetic field strength value. For example, a scintillation 1 / f noise magnetic field strength of ±20 nT can be superimposed on a 50 nT magnetic field strength reference value to generate a magnetic field strength that fluctuates randomly over time in the zero magnetic field region, thereby simulating a solar wind magnetic field with solar wind turbulence characteristics.

[0039] In some embodiments, the magnetic field generating device further includes a second magnetic field simulation module, which is used to simulate magnetic field changes during geomagnetic storm events. Based on the Tsyganenko magnetosphere model, the system inputs time, spatial location, solar wind speed, density, dynamic pressure, interplanetary magnetic field IMF components, and geomagnetic Dst index. It then controls the first type of magnetic field generating component and / or the second type of magnetic field generating component to generate a time-evolved magnetic field intensity that goes through an initial compression phase, a main phase phase, and a recovery phase. The system also superimposes a magnetic field disturbance with a set magnetic field value, where the magnetic field disturbance is set as a local magnetic field disturbance generated by the auroral current system.

[0040] Specifically, the Tsyganenko model is a semi-empirical model built upon satellite magnetic field observations and certain physical considerations. Using the Tsyganenko model, complex problems in various regions of the magnetosphere can be studied: calculating the vector magnetic field and IG-RF magnetic field at every point in the magnetosphere, tracing magnetic field lines under different geomagnetic activity states, plotting the shape of the magnetosphere, calculating the dynamic changes of the magnetotail plasma sheet and the substorm current wedge, and calculating the loop current and its contribution to the magnetic field. Input parameters can include, for example, simulation time, spatial location, and solar wind velocity, density, dynamic pressure, interplanetary magnetic field components, and the Dst / Kp exponent, used to characterize the intensity of the geomagnetic storm and the driving conditions of the magnetosphere. Based on the above input parameters, the Tsyganenko model can output the three-dimensional magnetic field vector components at the target location during the geomagnetic storm and their time-varying curves. For example, the temporal evolution process is: an initial compression phase of 5-10 minutes, a main phase of 1-3 hours, and a recovery phase of 6-24 hours, superimposed with local magnetic field disturbances generated by the auroral current system. The set magnetic field value for these local magnetic field disturbances is ±500 nT.

[0041] In some embodiments, the magnetic field generating device further includes a third magnetic field simulation module, which is used to simulate the magnetic field changes caused by encountering a planet. The influence of the space magnetic field environment during planetary encounters includes the strong magnetic field environment of the spacecraft using the tested electronic device in polar Earth orbit, Jupiter orbit, or Jupiter's moon orbit. Based on the Tsyganenko magnetosphere model and the PPMLR-MHD physical model, the orbital parameters, time, spatial position, solar wind speed, density, dynamic pressure, interplanetary magnetic field IMF component, and geomagnetic Dst index of the spacecraft are input. The first type of magnetic field generating component and / or the second type of magnetic field generating component are controlled to generate the corresponding target magnetic field strength, so as to simulate the magnetic field changes caused by the space magnetic field environment when encountering a planet. The target magnetic field strength is calculated based on the distance between the spacecraft and the encountered planet, the magnetic field gradient, and the main magnetic field strength of the encountered planet.

[0042] Combining the Tsyganenko magnetosphere model with the PPMLR-MHD physical model yields a multi-scale coupled model. By inputting orbital parameters and solar wind conditions into the multi-scale coupled model, key parameters such as magnetic field strength and magnetic field gradient can be output. See Table 2 for the output parameters of the multi-scale coupled model.

[0043] Table 2 Output parameters of the multi-scale coupled model

[0044] The orbital parameters may include orbital type, orbital inclination, and orbital elements; the solar wind conditions may include solar wind speed, density, dynamic pressure, interplanetary magnetic field IMF component, and geomagnetic Dst index; and the simulation time and spatial location. Referring to the magnetic field gradient and the main magnetic field strength of the encountering planet in Table 1, and based on the distance between the spacecraft and the encountering planet, the target magnetic field strength can be calculated. The first type of magnetic field generating component or the second type of magnetic field generating component is controlled to generate the corresponding target magnetic field strength to simulate the strong magnetic field environment of the spacecraft in polar Earth orbit, Jupiter orbit, or Jupiter's moon orbit.

[0045] In some embodiments, the system noise processing module includes: a system noise collection channel for receiving a single-event effect response signal sent by the single-event effect test circuit; a noise feature identification unit for identifying system noise signals in the single-event effect response signal; and a noise cancellation unit for excluding and filtering the single-event effect response signal based on the system noise signal during single-event effect testing, so as to eliminate the influence of environmental noise on the test results.

[0046] System noise signals in single-event effect (SEE) response signals can include, for example, flicker 1 / f noise, transient current noise, thermal noise, phase noise, Gaussian noise, power supply noise, and ambient noise. The types of noise in SEE testing are complex and diverse. A comprehensive analysis combining the physical characteristics of the electronic device under test, circuit architecture, and test conditions is necessary. Through the synergistic optimization of noise modeling, suppression techniques, and signal processing algorithms, system noise signals in the SEE response signal can be eliminated and filtered, improving the accuracy and reliability of SEE testing. A combination of digital signal electronics and digital signal processing can be used to eliminate and filter system noise signals in the SEE response signal.

[0047] Noise cancellation at the digital signal processing level includes time-domain filtering algorithms, frequency-domain processing techniques, and intelligent algorithm optimization. Time-domain filtering algorithms, for example, can employ median filtering, specifically: sorting N consecutive sampling points and calculating the median of these N points; removing system noise signals exceeding 1.5 times the median, effectively eliminating impulse noise and 90% of transient interference. Frequency-domain processing techniques, for example, use Fast Fourier Transform (FFT): converting the time-domain signal to the frequency domain, identifying noise frequency bands, and then suppressing noise through notch filtering or band-stop filtering, for example, eliminating 50Hz power frequency noise in audio. Intelligent algorithm optimization, for example, can use machine learning classification, training CNN or LSTM models to distinguish between system noise signal characteristics and effective single-event response signal characteristics; the trained noise cancellation model can then output an effective single-event response signal that excludes environmental noise. Noise cancellation in digital signal electronic circuits can be achieved through hardware filter circuit design and signal conditioning circuits to eliminate and filter system noise signals in single-event response signals.

[0048] In an exemplary embodiment, the radiation source 12 includes a heavy-ion accelerator, a proton accelerator, a 252Cf source, or a pulsed laser. Energy particles or high-energy lasers generated by a heavy-ion accelerator, proton accelerator, 252Cf source, or pulsed laser can act on the sensitive area of ​​the electronic device under test 15. The circuit monitoring device of the test controller monitors the performance of the electronic device under test under the action of different energy particles or lasers, thereby determining whether a single-event effect occurs.

[0049] In an exemplary embodiment, the electronic device under test 15 includes any one of the following: a CMOS device, a power MOSFET device, a memory device, an analog circuit device, a digital circuit device, and an AD / DA converter device.

[0050] In some embodiments, in order to effectively simulate the magnetic field strength in a real space magnetic field environment, the magnetic field strength generated by the magnetic field generator 20 is adjustable within a range of 1×10⁻⁶. 3 -1×10 6 nT.

[0051] In some embodiments, the test results of the electronic device under test 15 when it undergoes a single-event effect without the action of a magnetic field and under different magnetic field strengths include: the critical energy threshold of the incident particle and / or the linear energy transfer threshold of the incident particle, as well as the single-event effect cross section and / or the single-event saturation cross section.

[0052] In this field, the LET value is the linear energy transfer value, describing the energy deposition characteristics of incident particles in a device. It represents the energy deposited per unit distance when high-energy ions are transported within a material. The LET value is related to ion energy and material type, and its formula can be expressed as LET = dE / dx, with dimensions in MeV·cm². 2 / g or MeV·cm 2 / mg.

[0053] The single-event effect cross section σ can include, for example, the flip-over cross section, the lock-in cross section, and the burn-out cross section. It can describe the single-event effect characteristics of electronic devices using the LET value and the single-event effect cross section σ. That is, the single-event effect cross section σ describes the single-event effect characteristics of a device under bombardment by high-energy particles at a certain LET value. (The single-event flip-over cross section is used as an example.) For example, It is the number of device flips. With the total number of incident particles The ratio, with dimensions in cm -2 ,Right now:

[0054] Once the LET value of the incident particle reaches a certain preset value, the single-event effect cross section of the electronic device under test will no longer increase when the LET value of the incident particle is further increased. This cross section is called the single-event saturation cross section.

[0055] This invention also provides a method for testing single-event effects under the influence of a space magnetic field, based on the apparatus provided in the above embodiments, such as... Figure 4 As shown, the method includes the following specific steps: S101: Energize the coil unit of the zero magnetic shielding mechanism and adjust the current flowing into the coil unit according to the real-time magnetic field change in the accommodating space of the zero magnetic shielding mechanism so as to form a zero magnetic field region in the accommodating space of the zero magnetic shielding mechanism. S102: Adjust the magnetic field generator to produce a controllable magnetic field in order to simulate the effect of the target space magnetic field; S103: Turn on the radiation source to apply particles with preset energy to the electronic device under test; S104: Monitor whether the electronic device under test experiences a single-event effect under the action of a simulated target space magnetic field and irradiation by incident particles of preset energy; S105: If the electronic device under test does not experience a single-event effect under the action of the simulated target space magnetic field and the irradiation of incident particles with a preset energy, then increase the energy of the incident particles until the electronic device under test experiences a single-event effect, and record the test results.

[0056] Specifically, the single-event effect test under simulated space magnetic field conditions is conducted as follows: After the coil unit 111 of the zero magnetic shielding mechanism 11 is energized, the current flowing into the coil unit is adjusted according to the real-time magnetic field changes within the containment space of the zero magnetic shielding mechanism, thus forming a zero magnetic field region in the central area of ​​the containment space of the zero magnetic shielding mechanism. The electronic device under test 15 is installed in a preset position of the magnetic field generator, which is installed in the central area of ​​the containment space of the zero magnetic shielding mechanism. The magnetic field generator is adjusted to generate a controllable magnetic field with variable direction, intensity, and helix angle. The magnetic field changes of the controllable magnetic field are superimposed within the zero magnetic field region, and the magnetic field strength generated by the magnetic field generator 20 can reach a set value, thereby simulating the effect of a space magnetic field on the electronic device under test 15. Up; turn on the radiation source 12 and apply particles with a preset energy to the electronic device under test 15; wherein, the sensitive area of ​​the electronic device under test 15 is oriented towards the particle incident direction, and the plane of the sensitive area is perpendicular to the particle incident direction generated by the radiation source 12, and monitor whether the electronic device under test 15 undergoes a single-event effect under the action of the simulated space magnetic field and the irradiation of the incident particles with the preset energy; if the electronic device under test 15 does not undergo a single-event effect under the action of the simulated space magnetic field and the irradiation of the incident particles with the preset energy, then increase the energy of the incident particles until the electronic device under test 15 undergoes a single-event effect, and at this time the first set of test results can be recorded as follows: the critical energy threshold of the incident particles and / or the linear energy transfer threshold of the incident particles, the single-event effect cross section and / or the single-event saturation cross section.

[0057] In some embodiments, the method further includes the following specific steps: S106: Adjust the current or voltage supplied to the magnetic field generator to zero; S107: Monitor whether the electronic device under test experiences a single-event effect under the influence of no magnetic field and the irradiation of incident particles with a preset energy. S108: If the electronic device under test does not experience a single-event effect under the influence of no magnetic field and the irradiation of incident particles with a preset energy, then increase the energy of the incident particles until the electronic device under test experiences a single-event effect, and record the second set of test results. S109: Compare the results of the first set of tests and the second set of tests to determine the effect of the space magnetic field on the single-event effect of the electronic device under test.

[0058] Specifically, the single-event effect test under a background magnetic field is conducted as follows: When current is passed through the coil unit 111 of the zero magnetic shielding mechanism 11, a zero magnetic field region can be formed within the accommodating space of the zero magnetic shielding mechanism; the current passed through the magnetic field generator is adjusted to zero, at which point the magnetic field generator does not generate a magnetic field, that is, no magnetic field acts on the electronic device under test 15; it is monitored whether the electronic device under test 15 exhibits a single-event effect under the influence of no magnetic field and the irradiation of incident particles with a preset energy; if the electronic device under test 15 does not exhibit a single-event effect under the influence of no magnetic field and the irradiation of incident particles with a preset energy, the incident particle level is increased. The energy is measured until the tested electronic device 15 experiences a single-event effect. The second set of test results is recorded as follows: the critical energy threshold and / or linear energy transfer threshold of the incident particle, as well as the single-event effect cross section and / or single-event saturation cross section. By comparing the specific numerical changes of the critical energy threshold and / or linear energy transfer threshold of the incident particle, the single-event effect cross section and / or single-event saturation cross section, the similarities and differences of the single-event effect of the tested electronic device under different magnetic field environments can be obtained, and thus the influence of the space magnetic field on the single-event effect of the tested electronic device can be determined.

[0059] In some embodiments, the method further includes: Based on the factors affecting the space magnetic field of the spacecraft in which the electronic device under test is used during its on-orbit operation, the set value of the magnetic field strength in the simulated space magnetic field is determined. Among them, the factors affecting the space magnetic field include: the spacecraft in which the electronic device under test is used is in a polar Earth orbit or in a strong magnetic field environment of Jupiter and its satellites; and / or, the magnetic field generated by high-voltage power devices or high-voltage circuits. Because spacecraft are affected not only by the space magnetic field during their on-orbit operation, but also by the magnetic fields generated by high-voltage power devices or high-voltage circuits, for example, when a spacecraft is in a polar Earth orbit or in the strong magnetic field environment of Jupiter and its moons, its ability to withstand single-event effects may be completely different, which has a significant impact on the spacecraft's on-orbit performance. Therefore, the magnetic field strength generated by the magnetic field generator can be set according to the actual space magnetic field environment experienced by the spacecraft during its on-orbit operation. This allows for the acquisition of test data on the single-event effects of the electronic devices under test under different magnetic fields. This can improve the reliability of the ground simulation test data of the electronic devices under test in the space magnetic field environment, especially in the strong magnetic field service environment. This provides a basis for the optimization of the redundancy design and fault tolerance mechanism of the electronic devices under test, and provides a basis for the selection of electronic components for spacecraft in the space magnetic field service environment. In the end, it provides a guarantee for the on-orbit service safety of electronic components and the on-orbit reliability of spacecraft.

[0060] This invention also provides a method for testing single-event effects under the influence of a space magnetic field. Based on the apparatus provided in the above embodiments, the method includes the following specific steps: S201: Construct a small zero-magnetic shielding mechanism to control the surrounding stray magnetic field.

[0061] A small-scale zero-magnetic shielding mechanism can be constructed, for example, with a frame size of 2m×2m×2m. Faraday cage shielding can be achieved by constructing coil units around the frame. Figure 1 As shown, this achieves shielding against surrounding stray magnetic fields or the Earth's magnetic field.

[0062] S202: Build a magnetic field generator.

[0063] A magnetic field generator is built inside a small-scale zero-magnetic-shield structure. For example, an electromagnet is placed at each end of the electronic device under test, with the device positioned between the N and S poles of the two electromagnets. Figure 3 As shown, the magnitude of the magnetic field acting on the electronic device under test can be controlled by adjusting the voltage or current of the two electromagnets. Alternatively, as... Figure 2 As shown, the magnetic field generator includes a solenoid made of wire. The internal space of the solenoid is a hollow structure. The electronic device under test is placed in the internal space of the solenoid. The solenoid is then installed in the central area of ​​the zero magnetic shielding mechanism. By controlling the current flowing through the solenoid, a set magnetic field direction and magnetic field strength are formed to simulate the effect of a spatial magnetic field on the electronic device under test.

[0064] S203: Conduct single-event effect tests under background magnetic field.

[0065] Close the power switch of the zero-magnetic shield and adjust the current supplied to the coil unit according to the real-time magnetic field changes within the containment space of the zero-magnetic shield to create a zero magnetic field within the containment space. Disconnect the power switch of the magnetic field generator; at this point, there is no magnetic field. Turn on the radiation source and apply protons or high-energy heavy ions of a certain energy to the electronic device under test. Monitor the performance of the electronic device under test through the test controller, primarily monitoring for abnormal changes in the current. For example, a sharp increase in current may indicate single-event burnout of the electronic device. Alternatively, monitor for signal flips, such as a change from 0 to 1, indicating a single-event flip. If the monitored stored signal remains unchanged, continue increasing the energy of the incident particles until a single-event effect occurs. The energy of the incident particles at this point is the critical energy threshold E1 for the single-event effect, which can also be expressed as the linear energy transfer threshold of the incident particles, such as LET1. The single-event effect cross section and single-event saturation cross section can also be calculated, thus obtaining the test data for the single-event effect.

[0066] S204: Conduct single-event effect tests under simulated space magnetic field conditions.

[0067] Close the power switch of the zero-magnetic shield and adjust the current flowing through the coil unit to create a zero magnetic field within the containment space of the zero-magnetic shield. Simultaneously, close the power switch of the magnetic field generator and adjust the magnetic field strength generated by the generator to the set value B0, ensuring that the magnetic field strength acting on the electronic device under test (DUT) matches the spatial magnetic field strength. Turn on the radiation source to allow preset energy particles to act on the DUT. Monitor the performance of the DUT through the test controller, primarily by monitoring for abnormal changes in the current. For example, a sharp increase in current may indicate single-event burnout. Alternatively, monitor for signal flips, such as a change from 0 to 1, indicating a single-event flip. If the monitored stored signal remains unchanged, continue increasing the energy of the incident particles until a single-event effect occurs. The energy of the incident particles at this point is the critical energy threshold E2 for the single-event effect, which can also be expressed as the linear energy transfer threshold of the incident particles, such as LET2. The single-event effect cross section and single-event saturation cross section can also be calculated, thus obtaining the test data for the single-event effect.

[0068] S205: By comparing the test data of single-event effects obtained under no magnetic field and under different magnetic field strengths, such as comparing the critical energy threshold, LET threshold, single-event effect cross section and single-event saturation cross section of the electronic device under test when the single-event effect occurs in multiple sets of test data, the influence of the space magnetic field on the single-event effect of the electronic device under test can be obtained, thereby further determining the performance of the electronic device under test that may be resistant to single-event effects.

[0069] When a spacecraft is in orbit, it may pass through different regions of space and be affected by different space magnetic fields. For example, the magnetic field strength in the Earth's equatorial region is about 0.3 Gs (Gauss), the magnetic field strength in the Earth's north pole region is about 0.6 Gs, and the magnetic field strength in the Jupiter equatorial region is about 4.5 Gs.

[0070] To address the effects of the aforementioned space magnetic field, the single-event effect testing device provided in this application embodiment can be used to conduct single-event effect testing under simulated space magnetic field conditions. The specific steps of the testing method are as follows: S1: The SRAM memory is used as the electronic device under test and is installed in the middle of the internal space of the magnetic field generator, which is a solenoid made of wire. S2: Install the magnetic field generator containing the electronic device under test on the bracket in the central area of ​​the zero magnetic shielding mechanism; S3: Close the power switch of the zero magnetic shielding mechanism and adjust the current flowing through the coil unit to form a zero magnetic field within the containment space of the zero magnetic shielding mechanism; S4: Adjust the current flowing into the magnetic field generator so that the magnetic field strength generated by the generator is the set value B1, where B1 = 0.3Gs = 3 × 10⁻⁶. 4 nT, to simulate the spatial magnetic field effect of the Earth's equatorial region; S5: Turn on the radiation source so that particles of preset energy act on the electronic device under test, and record the preset energy value of the incident particles. S6: Monitor whether the storage signal of the SRAM memory changes, such as from "0" to "1", which means a single-event upset has occurred; S7: If the stored signal in the SRAM memory remains unchanged, increase the energy of the incident particle according to a certain numerical gradient, for example, by changing it sequentially at 1 MeV, 3 MeV, 5 MeV, 10 MeV, 15 MeV, 20 MeV, and 30 MeV, until a single-event upset occurs. At this point, the energy of the incident particle is the critical energy threshold E for the single-event effect to occur. a1 And record the critical energy threshold E a1 And data such as the number of single-particle flips; S8: Replace the SRAM memory with a new one and change the current flowing through the magnetic field generator so that the magnetic field strength generated by the generator is the set value B2, where B2 = 0.6Gs = 6 × 10⁻⁶. 4 nT, to simulate the space magnetic field effect of the Earth's Arctic region, repeat the above steps S5-S7; S9: Replace the SRAM memory with a new one and change the current flowing through the magnetic field generator so that the magnetic field strength generated by the generator is the set value B3, where B3 = 4.5Gs = 4.5 × 10⁻⁶. 5 To simulate the spatial magnetic field effect of Jupiter's equatorial region, repeat steps S5-S7 above.

[0071] By recording the critical energy threshold E a1 E a2 E a3 In comparison, as the magnetic field strength increases, static random access memory (SRAM) is more prone to bit flips, meaning the critical energy threshold for single-event flips decreases. This is because a strong magnetic field causes electron-hole pairs generated when high-energy particles are incident on the sensitive area to drift towards the poles at a faster speed. At the same time, it makes recombination of electron-hole pairs less likely, resulting in a significantly increased probability of bit flips.

[0072] The single-event effect testing device for simulating the effects of a space magnetic field provided in this invention provides a testing device and establishes a reasonable experimental platform for studying the single-event effects on microelectronic devices in spacecraft under the influence of a space magnetic field. The conclusions obtained using the testing device proposed in this invention are reliable, and the component connection relationships are clear and easy to understand, which is beneficial for researchers to conduct experiments. Based on the single-event effect testing device for simulating the effects of a space magnetic field, the single-event effect testing method provided in this invention can obtain test data on single-event effects obtained by irradiation with energy particles under the influence of no magnetic field and different magnetic field intensities. By comparing multiple sets of test data, the influence of the space magnetic field on the single-event effect of the tested electronic device can be obtained, thereby further determining the performance of the tested electronic device in withstanding single-event effects. Furthermore, it can improve the reliability and accuracy of ground simulation test data of the tested electronic device in a space magnetic field environment, especially in a strong magnetic field service environment, thus providing a basis for the redundancy design and fault tolerance mechanism optimization of the tested electronic device, and a basis for the selection of electronic components for spacecraft in a space magnetic field service environment, thereby ensuring the on-orbit service safety of electronic components and the on-orbit reliability of spacecraft.

[0073] It should be understood that the specific embodiments described above are merely illustrative or explanatory of the principles of the invention and do not constitute a limitation thereof. Therefore, any modifications, equivalent substitutions, improvements, etc., made without departing from the spirit and scope of the invention should be included within the protection scope of the invention. Furthermore, the appended claims are intended to cover all variations and modifications falling within the scope and boundaries of the appended claims, or equivalent forms of such scope and boundaries.

Claims

1. A device for simulating single-event effects under the influence of a space magnetic field, characterized in that, include: The system comprises a radiation source, a zero-magnetic shielding mechanism, a magnetic field generator, and a test controller. The radiation source is located outside the zero-magnetic shielding mechanism, while the magnetic field generator is located inside. The electronic device under test (DUT) is placed within the effective range of the radiation source and within the magnetic field generated by the magnetic field generator. The test controller is connected to both the magnetic field generator and the DUT. The zero magnetic shielding mechanism has an internal accommodating space. The zero magnetic shielding mechanism is configured to generate a magnetic field that can cancel the Earth's magnetic field, so as to shield the stray magnetic field or the Earth's magnetic field in the external environment of the zero magnetic shielding mechanism and form a zero magnetic field region within the accommodating space. The radiation source is used to generate energy particles, wherein the electronic device under test includes a sensitive region facing the incident direction of the energy particles; The magnetic field generator is used to superimpose a controllable magnetic field in the zero magnetic field region. The magnetic field generator is configured to generate the controllable magnetic field with variable direction, intensity, and helix angle to simulate the changes in magnetic field formed by solar wind, magnetic storms, and / or encounters with planets in space, so as to simulate the single-event effect caused by the real space magnetic field acting on the electronic device under test. The test controller includes: A single-event effect test circuit electrically connected to the electronic device under test is used to collect the single-event effect response signal of the electronic device under test under simulated different spatial magnetic fields after being irradiated by energy particles. A system noise processing module electrically connected to the single-event effect test circuit is used to acquire the test system noise and remove the signal component corresponding to the system noise from the single-event effect response signal; and The single-event effect test data processing module, which is electrically connected to the system noise processing module, is used to perform statistical analysis on the noise-processed single-event effect response signal to obtain the test results when the electronic device under test exhibits a single-event effect.

2. The apparatus according to claim 1, characterized in that, The zero magnetic shielding mechanism includes an active magnetic field cancellation device, which includes a coil unit arranged around the zero magnetic field region and a current controller connected to the coil unit. The current controller provides a current opposite to the direction of the geomagnetic field to the coil unit based on the geomagnetic field measurement results in the accommodating space, so that the magnetic field strength in the zero magnetic field region is less than a set threshold.

3. The apparatus according to claim 2, characterized in that, The zero-magnetic shielding mechanism also includes a frame, which is a prism or cylinder structure. The interior of the frame forms a receiving space, and the coil units are arranged in a grid structure around the outer periphery of the frame.

4. The apparatus according to claim 1, characterized in that, The magnetic field generator includes a first magnetic field generating component, which comprises a solenoid wound with a wire; wherein, The electronic device under test is located inside the solenoid. When an adjusted current is passed through the solenoid, a magnetic field with a set direction and intensity is formed. The plane of the sensitive area is perpendicular to the direction of the magnetic field lines generated by the solenoid; and / or, The magnetic field generator includes a second type of magnetic field generating component, which comprises two electromagnets spaced apart; wherein... The electronic device under test is located between the N and S poles of two electromagnets. When the two electromagnets are energized with an adjusted current, they form a magnetic field with a set direction and intensity. The plane of the sensitive area of ​​the electronic device under test is parallel to the direction of the magnetic field lines generated by the two electromagnets.

5. The apparatus according to claim 1, characterized in that, The magnetic field generator also includes a first magnetic field simulation module for simulating the magnetic field strength of the solar wind magnetic field, wherein... The first magnetic field simulation module calculates the helix angle of the interplanetary magnetic field based on the input solar wind parameters, and controls the magnetic field generator to generate a set magnetic field strength value, so as to generate a magnetic field strength that fluctuates randomly over time in the zero magnetic field region, so as to simulate a solar wind magnetic field with solar wind turbulence characteristics; wherein, the solar wind parameters include solar wind speed, density and duration.

6. The apparatus according to claim 1, characterized in that, The magnetic field generator also includes a second magnetic field simulation module for simulating magnetic field changes during geomagnetic storm events, wherein... The second magnetic field simulation module is based on the Tsyganenko magnetosphere model. It takes into account the time, spatial location, solar wind speed, density, dynamic pressure, interplanetary magnetic field IMF components and geomagnetic Dst index, and controls the magnetic field generator to generate a time-evolved magnetic field intensity that goes through the initial compression phase, the main phase phase and the recovery phase. It also superimposes a magnetic field disturbance with a set magnetic field value, which is set as a local magnetic field disturbance generated by the auroral current system.

7. The apparatus according to claim 1, characterized in that, The magnetic field generator also includes a third magnetic field simulation module for simulating magnetic field changes caused by encountering a planet. The influence of the space magnetic field environment during planetary encounters includes the strong magnetic field environment of the spacecraft using the tested electronic device in polar Earth orbit, Jupiter orbit, or Jupiter's moon orbit. The third magnetic field simulation module is based on the Tsyganenko magnetosphere model and the PPMLR-MHD physical model. It takes into account the spacecraft's orbital parameters, time, spatial position, solar wind speed, density, dynamic pressure, interplanetary magnetic field IMF component and geomagnetic Dst index, and controls the magnetic field generator to produce a corresponding target magnetic field strength to simulate the magnetic field changes caused by the space magnetic field environment when encountering a planet. The target magnetic field strength is calculated based on the distance between the spacecraft and the encountered planet, the magnetic field gradient and the main magnetic field strength of the encountered planet.

8. The apparatus according to claim 1, characterized in that, The system noise processing module includes: The system noise collection channel is used to receive the single-event effect response signal sent by the single-event effect test circuit; A noise feature recognition unit is used to identify system noise signals in the single-event effect response signal; and The noise cancellation unit is used to eliminate and filter the single-event effect response signal based on the system noise signal during single-event effect testing, so as to eliminate the influence of environmental noise on the test results.

9. The apparatus according to any one of claims 1-8, characterized in that, The electronic device under test includes any of the following: CMOS devices, power MOSFET devices, memory devices, analog circuit devices, digital circuit devices, and AD / DA converters; and / or, Radiation sources include any of the following: particle irradiation sources, laser sources, heavy ion accelerators, proton accelerators, and pulsed lasers; and / or, The magnetic field strength generated by the magnetic field generator can be adjusted within a range of 1×10⁻⁶. 3 -1×10 6 nT.

10. A method for testing single-event effects under simulated space magnetic field conditions, characterized in that, Based on the apparatus of any one of claims 1-9, the method comprises: The coil unit of the zero magnetic shielding mechanism is energized, and the current flowing into the coil unit is adjusted according to the real-time changes in the magnetic field within the containment space of the zero magnetic shielding mechanism, so as to form a zero magnetic field region within the containment space of the zero magnetic shielding mechanism. The magnetic field generator is adjusted to produce a controllable magnetic field in order to simulate the effect of the target space magnetic field. Turn on the radiation source to apply particles with a preset energy to the electronic device under test; Monitor whether the electronic device under test undergoes a single-event effect under the action of a simulated target space magnetic field and irradiation by incident particles of preset energy; If the electronic device under test does not exhibit a single-event effect under the influence of the simulated target space magnetic field and the irradiation of incident particles with a preset energy, then increase the energy of the incident particles until the electronic device under test exhibits a single-event effect, and record the test results.

Images