A three-dimensional profile non-contact scanning measuring device and method

CN122384705APending Publication Date: 2026-07-14

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Filing Date
2026-04-17
Publication Date
2026-07-14

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    Figure CN122384705A_ABST
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Abstract

The application relates to the field of precision measurement technology and provides a three-dimensional profile non-contact scanning measurement device and method, which comprises a placing base and a measuring mechanism; the placing base comprises a base and a first rotary table used for placing a measured object, and the first rotary table is rotatably arranged on the base in the vertical direction; the measuring mechanism comprises a mounting reference frame, a first air floating guide rail, a second air floating guide rail, a second rotary table and a non-contact probe; the first air floating guide rail is arranged on the mounting reference frame and is used for driving the second air floating guide rail to move in a first direction; the second air floating guide rail is used for driving the second rotary table to move in a second direction; and the second rotary table is used for driving the non-contact probe to rotate in a third direction. The application can complete accurate scanning of various curved surfaces, the non-contact measurement mode can avoid damage to the measured surface, the precision and adaptability of three-dimensional profile measurement are greatly improved, the overall structure design is simple, and the assembly and operation convenience are effectively improved.
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