Display screen slide durability test device and test method

Abstract

The application relates to the technical field of display screens, and provides a display screen sliding endurance test device and a test method.The display screen sliding endurance test device comprises the following: in response to monitoring occurrence of a test event, a current test process level of a display screen to be tested is acquired; according to the current test process level, a first test behavior tree is called; in response to determining that the test event meets a trigger condition of a first test action, the test device is controlled to execute the first test action; wherein the first test action is an action matched with the test event in a plurality of test actions included in the first test behavior tree. The display screen sliding endurance test device provided by the application can improve the technical problem that display screen testing is performed by using fixed control logic, fixed test parameters and fixed execution timing, abnormal working condition response lag, performance attenuation detection omission, and even invalid testing and irreversible damage of a sample.

Description

Technical Field

[0001] This application relates to the field of display screen technology, and in particular to a display screen sliding durability testing device and testing method. Background Technology

[0002] The touch screen sliding durability testing device is a testing equipment used in the reliability verification stage of touch screens before mass production. It is widely used in the quantitative testing of the wear resistance, touch function stability, and structural durability of touch screens in consumer electronics, automotive central control, and industrial touch fields. Its working principle is to drive the friction head to move through the feed cylinder, and in conjunction with the contact with the screen, simulate the user's daily finger sliding operation on the screen, and complete the durability test for a set number of cycles. It is a key device for verifying the actual service life of the screen.

[0003] Display screen sliding durability testing devices in related technologies generally adopt fixed control logic and execution strategies. They execute push and pull actions in a fixed cycle with fixed parameters and timings preset before the test. They cannot adjust the execution parameters, triggering timing, interruption rules, and cycle coordination logic of the push and pull actions as the test progresses, the real-time performance degradation status of the screen under test is monitored, or various test events are detected. Therefore, using the same push and pull speed, stroke, and lifting and lowering coordination sequence at the beginning of the test and at the end of the wear stage may not accurately capture the critical point of performance degradation of the screen under test. It is also easy to cause irreversible scratch damage to the screen under test due to improper timing of the return pull action when wear has already appeared on the screen surface. Furthermore, when abnormal events occur, the current push and pull action cycle must be completed before a fault alarm or performance degradation signal can be responded to. It is impossible to realize the immediate interruption and priority switching of actions according to the urgency of the test event. In case of emergency such as abnormal air source pressure, sudden change in friction force, or cylinder jamming, it may cause invalid test cycles, equipment failure, or even scrapping of the tested sample. Summary of the Invention

[0004] This application provides a display screen sliding durability testing device and method, which can improve the technical problems existing in related technologies. The display screen is tested using fixed control logic, fixed test parameters and fixed execution timing. It is impossible to adjust the test actions, response strategies and priority scheduling according to the dynamic changes in the cycle stage and the performance degradation state of the screen under test. This may lead to delayed response to abnormal working conditions, missed detection of performance degradation, or even invalid tests and irreversible damage to the sample.

[0005] In a first aspect, embodiments of this application provide a display screen sliding durability testing device, comprising: frame; A mounting section, movably mounted on the frame, has at least one mounting space for fixing a display screen, and the mounting section is used to move the display screen fixed in the mounting space along a first direction or a second direction, the first direction being perpendicular to the second direction; and The testing unit is mounted on the rack and has at least one testing area, which corresponds one-to-one with the placement space. Each testing area has at least one contact surface for contacting the display screen fixed to the placement space. When the placement part moves the display screen fixed on the placement space along the first direction, the contact surface and the contacting display screen move relative to each other in the first direction. When the placement part moves the display screen fixed on the placement space along the second direction, the contact surface and the contacting display screen move relative to each other in the second direction.

[0006] The technical solutions described in this application embodiment have at least the following technical effects: The display screen sliding durability testing device provided in this application embodiment can make the entire display screen under test move linearly back and forth along a first direction or a second direction without adding additional mechanical parts by changing the posture of the mounting part. This achieves relative sliding friction between the display screen under test and the fixed contact surface on the testing part when moving along the first direction or the second direction. When the display screen under test moves in the opposite direction of the first direction or the opposite direction of the second direction (reset process), the contact surface is driven by the testing part to not contact the display screen under test, thereby achieving unidirectional sliding friction of the display screen (the display screen only slides against the contact surface when moving along the first direction or the second direction), further simulating the unidirectional sliding of a human hand, which is close to the actual use of the display screen.

[0007] Secondly, embodiments of this application provide a method for testing the sliding durability of a display screen, applied to the display screen sliding durability testing device described in the first aspect above. The display screen sliding durability testing device pre-stores multiple sets of test behavior trees corresponding to different test process levels. Each set of test behavior trees includes multiple test actions and triggering conditions corresponding to the test actions. The test process level dynamically changes as the test progresses. The method includes: In response to the detection of a test event, the current test progress level of the display screen under test is obtained; wherein the display screen under test is the target of the unidirectional sliding durability test. Based on the current test process level, the first test behavior tree is invoked; wherein, the first test behavior tree is the behavior tree corresponding to the current test process level from among multiple pre-stored test behavior trees; In response to determining that the test event satisfies the triggering condition of the first test action, the test device is controlled to execute the first test action; wherein, the first test action is an action that matches the test event among a plurality of test actions included in the first test behavior tree.

[0008] The technical solutions described in this application embodiment have at least the following technical effects: By pre-storing multiple test behavior trees corresponding one-to-one with different test process levels, the control logic of the test process is hierarchically encapsulated according to the test progress stage and the real-time status of the screen under test. This improves the traditional control mode where a fixed set of logic runs the entire process, and enables dynamic switching of test control strategies as the test progresses. By using real-time monitored test events as trigger sources, a closed-loop control is completed sequentially, including event monitoring, acquisition of the current test process level, invocation of the corresponding test behavior tree, matching of trigger conditions, and execution of the target test action. This can match and execute corresponding test actions based on dynamically changing loop nodes, the performance status of the screen under test, and the operating conditions of the equipment during the test, improving the problems of delayed response to abnormal test conditions and missed detection of performance degradation thresholds in traditional tests. By using the test process level as the anchor point for behavior tree invocation, the execution strategy, priority, and execution frequency of test actions are matched with the needs of the current test stage. This ensures test efficiency in the initial stage of testing, balances test progress and status monitoring in the middle stage of testing, and accurately captures failure thresholds at the end of testing. This effectively avoids irreversible damage to the screen under test and improves the accuracy and reference value of test data. Attached Figure Description

[0009] To more clearly illustrate the technical solutions in the embodiments of this application, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0010] Figure 1 This is a schematic diagram of the structure of the display screen sliding durability testing device provided in the embodiments of this application; Figure 2 This is a schematic diagram of the structure of the display screen sliding durability testing device provided in the embodiment of this application when testing the display screen along the first direction; Figure 3 A schematic diagram of the structure of the display screen sliding durability testing device provided in this application when testing the display screen along the second direction. Figure 1 ; Figure 4 A schematic diagram of the structure of the display screen sliding durability testing device provided in this application when testing the display screen along the second direction. Figure 2 ; Figure 5 A schematic diagram showing the first and second directions acting on the display screen, provided for an embodiment of this application; Figure 6 This is a flowchart illustrating the display screen sliding durability test method provided in an embodiment of this application.

[0011] The following are the labeling elements in the figure: 100. Display screen sliding durability testing device; 10. Frame; 20. Mounting part; 21. Guide device; 211. Guide frame; 212. Guide component; 213. Guide rod; 22. Mounting device; 221. Mounting plate; 222. Sliding component; 23. Clamping device; 24. Mounting drive device; 30. Testing part; 31. Testing frame; 32. Testing device; 321. Fixing buckle; 322. Optical axis; 323. Gasket; 33. Testing drive device. Detailed Implementation

[0012] To make the technical problems, technical solutions, and beneficial effects to be solved by this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and are not intended to limit the scope of this application.

[0013] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs; the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the application. The terms “comprising” and “having”, and any variations thereof, in the specification, claims, and foregoing description of the drawings are intended to cover non-exclusive inclusion.

[0014] To improve the technical problems existing in related technologies, such as using fixed control logic, fixed test parameters and fixed execution timing for display screen testing, which cannot dynamically change the test actions, response strategies and priority scheduling according to the performance degradation state of the screen under test, which may lead to delayed response to abnormal conditions, missed detection of performance degradation, or even invalid tests and irreversible damage to the sample, the embodiments of this application provide the following solutions.

[0015] Please see Figure 1 This application provides a display screen sliding durability testing device 100, which includes a frame 10, a mounting part 20, and a testing part 30, wherein: The mounting section 20 is movably mounted on the frame 10 and has at least one mounting space for fixing the display screen. The mounting section 20 is used to move the display screen fixed on the mounting space along a first direction or a second direction, wherein the first direction is perpendicular to the second direction.

[0016] The test unit 30 is mounted on the frame 10 and has at least one test area. Each test area corresponds to a placement space. Each test area has at least one contact surface for contacting the display screen fixed on the placement space.

[0017] Specifically, when the installation unit 20 moves the display screen fixed in the installation space along the first direction, the contact surface and the display screen in contact with it move relative to each other in the first direction; when the installation unit 20 moves the display screen fixed in the installation space along the second direction, the contact surface and the display screen in contact with each other move relative to each other in the second direction.

[0018] It is understood that the frame 10 is the overall load-bearing foundation frame of the display screen sliding durability testing device 100, used to fix and support the mounting section 20 and the testing section 30, providing a stable reference plane and rigid support. For example, the frame 10 can be a high-strength aluminum alloy frame structure or a carbon steel profile frame structure, but is not limited to these.

[0019] The mounting unit 20 is a device movably mounted on the frame 10 for supporting and fixing the display screen under test. It can drive the fixed display screen under test to move linearly back and forth along a preset first or second direction (for example, when the mounting unit 20 is in its initial posture, the mounting unit 20 can drive the fixed display screen under test to move along the first direction; when the mounting unit 20 rotates 90 degrees on the same horizontal plane compared to the initial posture, the mounting unit 20 can drive the fixed display screen under test to move along the second direction). It is an actuator that generates relative sliding friction between the screen under test and the test contact surface. For example, the mounting unit 20 may include a drive component (servo motor, double-acting cylinder, etc.) and a clamp (side clamping clamp, carrier plate clamp, etc.). The clamp has a mounting space for holding and fixing the display screen located in the mounting space. The drive component is movably (detachably) mounted on the frame 10 and its output end is connected to the clamp for driving the clamp to move repeatedly, etc., but is not limited to this.

[0020] The mounting space can be customized into a recessed mounting position that perfectly matches the outer contour of the screen, and the screen can be fixed by silicone pressure blocks around the perimeter, but it is not limited to this.

[0021] The first direction can be the direction of movement of the display screen when a sliding durability test needs to be performed on the center of the display screen. The second direction can be the direction of movement of the display screen when a sliding durability test needs to be performed on either side of the display screen.

[0022] The testing unit 30 is a device fixedly mounted on the frame 10 and capable of providing friction test conditions for the display screen under test. For example, the testing unit 30 may include a driving component (straight rod cylinder, double-acting cylinder, etc.) and a contact (rubber contact, ceramic probe contact, etc.). The driving component may be disposed on the frame 10 and its output end is connected to the contact. It is used to drive the contact to approach and abut the display screen after the display screen is reset (the display screen is located at the starting point of movement along the first direction or the second direction), and to drive the contact away from the display screen when the display screen moves in the opposite direction of the first direction or the opposite direction of the second direction.

[0023] The testing area is a testing station area on the testing unit 30, which corresponds one-to-one with the placement space of the placement unit 20. Each testing area has at least one contact surface (at least one contact surface when testing the center of the display screen, and at least two contact surfaces when testing the sides of the display screen). For example, assuming that the placement unit 20 has 3 independent placement spaces, the testing unit 30 will have 3 independent testing areas, allowing simultaneous durability testing of 3 displays of the same specifications.

[0024] The contact surface is a friction surface set in the test area of ​​the test section 30 for direct contact with the surface of the display screen under test. It can be made of rubber, silicone or standard wool felt material that simulates the characteristics of human fingers. The relative sliding with the screen under test simulates the wear and tear on the screen by the user's finger sliding.

[0025] As can be seen from the above, the display screen sliding durability testing device 100 provided in this application embodiment can make the entire display screen under test move linearly back and forth along the first direction or the second direction without adding additional mechanical parts by changing the posture of the mounting part 20. This achieves relative sliding friction between the display screen under test and the contact surface fixed on the testing part 30 when the display screen under test moves along the first direction or the second direction. When the display screen under test moves in the opposite direction of the first direction or the opposite direction of the second direction (reset process), the contact surface is driven by the testing part 30 to not contact the display screen under test, thereby achieving unidirectional sliding friction of the display screen (the display screen only slides against the contact surface when moving along the first direction or the second direction), further simulating the unidirectional sliding of a human hand, which is consistent with the actual use of the display screen.

[0026] In some embodiments, please refer to the following: Figures 1 to 4 The placement unit 20 includes a guide device 21, a placement device 22, at least one clamping device 23, and a placement drive device 24.

[0027] The guide device 21 is movably mounted on the frame 10.

[0028] The placement device 22 is movably disposed on the guide device 21 and has at least one movable hole, through which the placement device 22 slides in cooperation with the guide device 21.

[0029] At least one clamping device 23 is movably disposed on the placement device 22 and has a placement space, the clamping device 23 being used to fix the display screen placed in the placement space.

[0030] The mounting drive device 24 is detachably mounted on the guide device 21. The axis of the moving hole is parallel to the driving direction of the mounting drive device 24. The output end of the mounting drive device 24 is connected to the mounting device 22 and is used to drive the mounting device 22 to move along a first direction or a second direction.

[0031] It is understood that the guide device 21 is movably (rotatably, detachably) mounted on the frame 10, providing guidance for the linear reciprocating movement of the mounting device 22 and restricting unnecessary degrees of freedom of movement, ensuring that the mounting device 22 only moves linearly along a preset first or second direction. The guide device 21 may include at least two linear bearings (ball bushing guide bearings, horizontal bearings, etc.) and at least one guide rod (aluminum alloy rod, copper rod, etc.), wherein the guide rod is detachably mounted on the frame 10 through at least two linear bearings, and the mounting device 22 slides with the guide rod through a moving hole adapted to the diameter of the guide rod.

[0032] The clamping device 23 is a functional component that is movably (detachably) mounted on the mounting device 22 for positioning and fixing the display screen under test. It has its own mounting space for accommodating and limiting the screen body, and can be adjusted to adapt to display screens of different sizes and shapes under test, preventing the screen body from shifting or shaking during the test. For example, the clamping device 23 can be a side clamping fixture, a carrier plate fixture, etc., but is not limited to these.

[0033] The mounting drive device 24 is a device capable of driving the mounting device 22 to move along a first direction or a second direction. For example, the mounting drive device 24 can be a double-acting cylinder, a straight rod cylinder, etc., but is not limited to these.

[0034] With this configuration, when it is necessary to change the movement direction (first direction or second direction) of the placement device 22, the movement direction of the placement device 22 can be changed by synchronously changing the positions of the guide device 21, the placement device 22, and the placement drive device 24 (the relative positions of the guide device 21, the placement device 22, and the placement drive device 24 remain unchanged). For example, when the guide device 21, the placement device 22, and the placement drive device 24 are in their initial positions, the placement drive device 24 can drive the placement device 22 to move along the first direction. When the guide device 21, the placement device 22, and the placement drive device 24 are synchronously rotated 90 degrees relative to their initial positions (the clamping device 23 can be disassembled and repositioned to maintain its position and orientation), the placement drive device 24 can drive the placement device 22 to move along the second direction. In this way, the switching of the display screen sliding test direction can be achieved simply by synchronously rotating the guide device 21, the placement device 22, and the placement drive device 24, without the need to add any additional mechanical structures.

[0035] In some embodiments, please refer to the following: Figures 1 to 4 When the placement drive device 24 is in the first position, the placement drive device 24 is used to drive the placement device 22 to move in the first direction. When the placement drive device 24 is in the second position, the placement drive device 24 is used to drive the placement device 22 to move in the second direction. The first position is the opposite side of the test drive device 33, and the second position is the side of the test drive device 33.

[0036] It can be understood that "the mounting drive device 24 is located on the opposite side of the test drive device 33" means that the mounting drive device 24 and the side of the test drive device 33 on the rack 10 are directly opposite each other. At this time, the drive output direction of the mounting drive device 24 is parallel to the direction of the line connecting the two devices (i.e., the first direction). "The mounting drive device 24 is located beside the test drive device 33" means that after the mounting drive device 24 is moved, it is located at a vertical end adjacent to the side of the test drive device 33 on the rack 10, that is, the left and right adjacent sides of the mounting side of the test drive device 33. At this time, the drive output direction of the mounting drive device 24 is simultaneously switched to a second direction perpendicular to the first direction.

[0037] With this setup, by changing the position of the drive unit 24, only one power unit is needed to achieve test drive in two orthogonal directions. There is no need to set up two independent drive mechanisms, which simplifies the device structure for bidirectional sliding durability testing and reduces equipment cost and control complexity.

[0038] In some embodiments, please refer to the following: Figures 1 to 4When the placement drive device 24 drives the placement device 22 to move along the first direction, the contact point between the test device 32 and the display screen is located at the center of the display screen. When the placement drive device 24 drives the placement device 22 to move along the second direction, the contact points between the test device 32 and the display screen are located on both sides of the display screen.

[0039] This setup, by fixing the contact point between the test device 32 (optical axis 322) and the display screen at the center of the display screen during the first direction test and adjusting the contact point to the sides of the display screen during the second direction test, matches the user's actual usage habits when using a touch screen, where horizontal swiping operations are concentrated at the center of the screen and vertical swiping operations are concentrated on the sides of the screen, thus making the test conditions consistent with the user's actual usage scenarios.

[0040] In some embodiments, please refer to the following: Figures 1 to 4 The guiding device 21 includes a guide frame 211, at least two guide members 212 and at least one guide rod 213.

[0041] The guide frame 211 is movably mounted on the frame 10.

[0042] Two guide members 212 are mounted on the guide frame 211.

[0043] The guide rod 213 is mounted on the guide member 212.

[0044] The mounting device 22 is slidably engaged with the guide rod 213 through a movable hole.

[0045] It can be understood that the guide frame 211 is the main supporting frame of the guide device 21, which is movably (detachably) mounted on the frame 10. It is used to support the guide rod 213 and house the drive device 24, and can also drive the entire guide device 21 to rotate and move as a whole on the frame 10, realizing rapid switching between the first direction and the second direction. For example, the guide frame 211 can be an aluminum alloy frame structure or a carbon steel frame structure, but is not limited to these.

[0046] The guide component 212 is a positioning component fixedly installed on the guide frame 211, used to support and position the guide rod 213, fixing the installation position, parallelism, and coaxiality of the guide rod 213, and providing stable rigid support for the guide rod 213. For example, the guide component 212 can be a mounted bearing, a vertical shaft support, a flange shaft support, etc., but is not limited to these.

[0047] The guide rod 213 is a linear guide shaft that passes through the guide member 212 and forms a sliding fit with the moving hole of the mounting device 22. The extension direction of the guide rod 213 is parallel to the driving direction of the mounting drive device 24, and it is a guide component that directly constrains the movement trajectory of the mounting device 22. For example, the guide rod 213 can be a chrome-plated optical shaft, a stainless steel linear optical shaft, etc., but is not limited to these.

[0048] This configuration provides rigid support for the guide rod 213 via the guide member 212 fixed on the guide frame 211, ensuring the parallelism, coaxiality, and structural stability of the guide rod 213 and providing a reference guide for the linear reciprocating motion of the mounting device 22. The sliding fit between the moving hole on the mounting device 22 and the guide rod 213 provides direct rigid constraint on the movement trajectory of the mounting device 22, limiting unnecessary degrees of freedom such as deflection, off-center loading, and warping of the mounting device 22 beyond the preset movement direction, ensuring the straightness of the reciprocating sliding of the tested display screen and consistency with the test conditions. The guide frame 211, movably mounted on the frame 10, can drive the entire guiding mechanism and mounting device 22 to move (rotate), facilitating rapid switching between two test directions without the need for recalibrating the guide reference.

[0049] In some embodiments, please refer to the following: Figures 1 to 4 The mounting device 22 includes a mounting plate 221 and at least one sliding member 222.

[0050] The slider 222 is disposed on the mounting plate 221 and has a moving hole.

[0051] The clamping device 23 is movably mounted on the mounting plate 221.

[0052] It can be understood that the mounting plate 221 is the main supporting plate structure of the mounting device 22, providing an installation reference and bearing plane for the sliding member 222 and the clamping device 23. The mounting plate 221 has multiple sets of mounting positions reserved to accommodate the flexible installation of sliding members 222 and clamping devices 23 of different specifications. For example, the mounting plate 221 can be made of high-strength, low-deformation hard aluminum alloy or stainless steel sheet, but is not limited to these.

[0053] The sliding component 222 is a sliding fit component with a movable hole that is fixedly installed on the mounting plate 221. It forms a sliding fit with the guide rod 213 through the movable hole and serves as the connection hub between the mounting device 22 and the guiding mechanism. It can strictly constrain the movement trajectory of the mounting plate 221 in the extension direction of the guide rod 213. For example, the sliding component 222 can be a bearing seat with an embedded self-lubricating bearing, a linear slider, etc., but is not limited to these.

[0054] This configuration, by integrating a movable hole on the slider 222 that matches the guide rod 213, provides a reference for the sliding cooperation between the mounting device 22 and the guide mechanism, strictly constraining the movement trajectory of the mounting plate 221 to the preset test direction, limiting unnecessary degrees of freedom such as deflection, off-center loading, and warping during reciprocating motion, and effectively ensuring the straightness and working condition consistency of the sliding test of the screen under test; by movably setting the clamping device 23 on the mounting plate 221, the flexible adjustment of the screen clamping position is realized, which can adapt to the fixing requirements of screens under test of different sizes and shapes, and avoids the distortion of test data caused by screen displacement and shaking during the test; by using the mounting plate 221 as a unified rigid bearing reference, the sliding guide function and screen clamping and fixing function are integrated on the same plate, which greatly simplifies the overall structure of the mounting device 22, reduces the processing and assembly difficulty, and can adapt to the testing requirements of different test conditions and screens under test of different specifications by replacing the slider 222 of different specifications and adjusting the installation position of the clamping device 23.

[0055] In some embodiments, please refer to the following: Figures 1 to 4 The testing unit 30 includes a test rack 31, at least one test device 32, and a test drive device 33.

[0056] The test fixture 31 is rotatably mounted on the frame 10, and the test fixture 31 has at least one test area.

[0057] The test device 32 is detachably mounted on the test frame 31 and located within the test area, and the test device 32 has a contact surface.

[0058] The test drive device 33 is mounted on the frame 10, and the output end of the test drive device 33 is rotatably connected to the test frame 31.

[0059] The test drive device 33 is used to drive the test frame 31 away from the frame 10 when the display screen fixed on the placement space is moved in the opposite direction of the first direction or the opposite direction of the second direction by the placement part 20, so that the contact surface does not contact the display screen.

[0060] It can be understood that the test frame 31 is the main supporting frame of the test unit 30, rotatably mounted on the frame 10, used to support the detachable test device 32, and has test areas corresponding one-to-one with the placement space. It can rotate, lift or lower under the drive of the test drive device 33 to switch the contact surface with or away from the display screen. For example, the test frame 31 can be a high-strength aluminum alloy or carbon steel frame structure, but is not limited to these.

[0061] The testing area is a testing station area on the testing frame 31 that corresponds one-to-one with the placement space of the placement section 20. At least one testing device 32 can be installed in each testing area, which is the positioning area for aligning the screen under test with the testing device 32 and completing the sliding friction test. For example, when it is necessary to test the center of the display screen, one testing device 32 is set in the testing area; when it is necessary to test both sides of the display screen, two testing devices 32 are set in the testing area.

[0062] The testing device 32 is a friction testing unit 30 that is detachably installed within the testing area of ​​the testing frame 31 and has a contact surface that directly contacts the display screen under test. It is used to simulate the sliding touch operation of a human finger and to test the wear resistance and durability of the screen by sliding relative to the display screen. The contact surface of different materials and sizes can be quickly replaced according to the testing requirements. For example, the testing device 32 can be made of materials such as rubber, silicone, or wool felt, but is not limited to these.

[0063] The test drive device 33 is a drive component that is fixedly mounted on the frame 10 and provides controllable power for the rotation, lifting, and lowering of the test frame 31. Its drive rod (output end) is rotatably connected to the test frame 31 and can control the lifting timing, lifting height, and lowering sequence of the test frame 31. For example, the test drive device 33 can be a linear actuator such as a pneumatic cylinder or a servo electric cylinder, but it is not limited to these.

[0064] This configuration, through the rotational connection structure between the drive rod of the test drive device 33 and the rotatable test frame 31, converts the linear power of the drive device into the rotational lifting and lowering action of the test frame 31. This achieves complete synchronization between the action of the test frame 31 and the movement sequence of the placement unit 20. When the placement unit 20 drives the display screen fixed in the placement space to return and reset along the opposite direction of the first direction or the opposite direction of the second direction, the test frame 31 is synchronously driven to lift away from the frame 10, so that the contact surface of the test device 32 is completely separated from the surface of the display screen. This solves the problems of screen rubbing during return, interference with test data, and damage to the wear-resistant coating on the screen surface. Through the test areas on the test frame 31 that correspond one-to-one with the placement space, and the detachable installation structure of the test device 32 within the test area, test devices 32 of different materials, sizes, and specifications can be quickly replaced according to test requirements. This adapts to different sizes and types of display screens under test and the test requirements of different industry standards. At the same time, the parallel design of multiple test areas can realize the synchronous testing of multiple display screens, improving test efficiency.

[0065] In some embodiments, please refer to the following: Figures 1 to 4 The test frame 31 is rotatably connected to the frame 10 via a hinge.

[0066] This design simplifies the mechanical structure of the rotational connection between the test frame 31 and the frame 10 through the hinge structure, reducing the difficulty of processing, assembly and subsequent maintenance of the device. At the same time, by replacing hinges of different specifications and functions, it can flexibly adapt to the usage requirements of different loads, different rotation angles and different test conditions.

[0067] In some embodiments, please refer to the following: Figures 1 to 4 The drive rod of the test drive device 33 is connected to one end of the I-type connector, the other end of the I-type connector is rotatably connected to one end of the Y-type connector, and the other end of the Y-type connector is connected to the test frame 31.

[0068] It is understandable that the I-type connector, also known as a straight rod connector, is an intermediate transmission connector connecting the drive rod and the Y-type connector. It has a cylindrical straight rod structure with internally threaded holes at both ends. One end is fastened to the external thread of the drive rod, while the other end forms a rotational connection with the Y-type connector via a pin. It is the component that facilitates the transition between linear power transmission and rotational connection. For example, the I-type connector can be made of high-strength carbon steel or stainless steel, but it is not limited to these materials. The Y-type connector, also known as a fork connector, is a hinged connector that converts linear power into rotational power. One end is a straight rod section with internal threads, and the other end is a forked double-ear structure with coaxial pin holes on the double ears. It forms a rotational connection with the I-type connector via the pin and can also connect to the test frame 31 via the straight rod section, effectively compensating for trajectory deviations between the linear motion of the drive rod and the rotational motion of the test frame 31.

[0069] This configuration, through the rotating connection structure between the I-type joint and the Y-type joint, forms a universal hinge transmission pair that adapts to changes in angle, compensating for the angular deviation between the linear motion trajectory of the drive rod and the rotational motion trajectory of the test frame 31 around the hinge, and eliminating the defects of motion interference, action jamming, and radial off-center wear that exist in traditional rigid connection structures.

[0070] In some embodiments, please refer to the following: Figures 1 to 4 The testing device 32 includes a fixing buckle 321, an optical axis 322, a pressure sensor, and at least one gasket 323.

[0071] The fixing buckle 321 is set on the test frame 31 and located within the test area.

[0072] The optical axis 322 is set on the fixing buckle 321 and has a contact surface. The optical axis 322 and the fixing buckle 321 correspond one-to-one.

[0073] A pressure sensor is mounted on the fixing buckle 321 and connected to the optical axis 322 to detect the force when the contact surface contacts the display screen.

[0074] The gasket 323 is detachably mounted on the optical axis 322.

[0075] It can be understood that the fixing buckle 321 is a fixed connector installed on the test frame 31 and located in the test area, used to support the positioning optical axis 322 and the pressure sensor. It is set one-to-one with the optical axis 322, providing a stable coaxial mounting reference for the optical axis 322. At the same time, it can fix the pressure sensor to ensure the stable transmission of the force measurement signal. For example, the fixing buckle 321 can be made of high-strength aluminum alloy or stainless steel, but is not limited to these.

[0076] The optical axis 322 is a friction component that is mounted on the fixing buckle 321 and corresponds one-to-one with the fixing buckle 321. Its outer surface has a contact surface that directly contacts the display screen being tested. For example, the optical axis 322 can be a high-precision chrome-plated optical axis 322, a stainless steel optical axis 322, etc., but is not limited to these.

[0077] The contact surface is the surface on the outer cylindrical surface of the optical axis 322 that directly contacts the surface of the display screen under test, generating relative sliding friction. It is the carrier for testing the wear resistance of the screen. The surface roughness, material, and hardness of the contact surface directly determine the consistency of the friction test conditions and the accuracy of the test results.

[0078] The pressure sensor is a force-measuring element mounted on the retaining buckle 321 and rigidly connected at both ends to the retaining buckle 321 and the optical axis 322, respectively. It is used to detect the contact pressure when the contact surface of the optical axis 322 comes into contact with the display screen under test in real time. For example, the pressure sensor can be a miniature strain gauge pressure sensor, a piezoresistive pressure sensor, a piezoelectric pressure sensor, etc., but is not limited to these.

[0079] The shim 323 is a thin, detachable adjusting component that is mounted on the optical axis 322. It can be made of materials such as stainless steel, brass, or polytetrafluoroethylene, but is not limited to these. The shim 323 can be quickly replaced with products of different thicknesses and specifications according to testing needs, and is used to adjust the effective contact length of the optical axis 322, compensate for installation gaps, and optimize contact pressure distribution.

[0080] This setup, through the mounting structure of the fixing buckle 321 within the test area of ​​the test frame 31, provides a stable mounting reference for the corresponding optical axis 322 and pressure sensor, ensuring the alignment of the test device 32 with the target test point of the display screen under test. It adapts to the testing needs of different areas such as the center and side edges of the screen. Simultaneously, multiple sets of fixing buckles 321 can be installed in parallel to achieve simultaneous testing of multiple screens, improving testing efficiency. The contact friction formed between the optical axis 322 and the display screen under test simulates the contact state of a user's finger sliding, avoiding localized high pressure. The device addresses the issue of distorted test conditions caused by scratches and uneven wear on the screen. A pressure sensor connected to the optical axis 322 and fixed to the fixing buckle 321 detects the positive pressure when the contact surface contacts the screen under test in real time, enabling continuous online monitoring and over-limit alarms of the contact pressure during the test. A detachable gasket 323 on the optical axis 322 allows for flexible adjustment of the effective contact length, compensation of installation gaps, and optimization of contact pressure distribution, quickly adapting to the testing needs of screens of different sizes and specifications, thus enhancing the device's versatility.

[0081] In some embodiments, please refer to Figure 5 In the diagram, the rounded square on the outside represents the display screen, the circle inside the frame represents the contact area between the contact surface and the display screen, and the arrows indicate the first or second direction.

[0082] Please see Figure 6 This application also provides a display screen sliding durability test method, applied to the display screen sliding durability test device 100 of any of the above claims. The display screen sliding durability test device 100 pre-stores multiple sets of test behavior trees corresponding to different test process levels. Each set of test behavior trees includes multiple test actions and corresponding triggering conditions. The test process level changes dynamically as the test progresses. The display screen sliding durability test method includes: In response to the detection of a test event, the current test progress level of the display screen under test is obtained; wherein, the display screen under test is the object of the unidirectional sliding durability test. Based on the current test process level, the first test behavior tree is invoked; wherein, the first test behavior tree is the behavior tree corresponding to the current test process level among multiple pre-stored test behavior trees; In response to determining that a test event meets the triggering condition for a first test action, the test device is controlled to execute the first test action; wherein, the first test action is the action that matches the test event among the multiple test actions included in the first test behavior tree.

[0083] It is understandable that the test process level is dynamically divided according to the number of test cycles, the degree of performance degradation of the screen under test, and the test condition stage, accompanying the progress of the one-way sliding durability test of the display screen. For example, it can be divided into three test process levels according to the number of test cycles: the initial stage (first 1000 cycles), the middle stage (1000-10000 cycles), and the final stage (more than 10000 cycles), matching different test control logic, etc., but it is not limited to this.

[0084] The test behavior tree can be pre-existing in the control unit of the display sliding durability testing device (which is communicatively connected to the pressure sensor, the display under test, the test drive device, and the placement drive device), corresponding one-to-one with different test process levels, and encapsulating multiple test actions and corresponding trigger conditions. For example, the test behavior tree corresponding to the initial stage of the test process level can encapsulate low-priority test actions such as conventional unidirectional friction cycles, basic data acquisition, and routine thousand-cycle testing, to meet the stable operation requirements in the early stages of testing, but is not limited to this.

[0085] Test actions are encapsulated within the test behavior tree, and are operational units that the display slide durability testing device can execute to complete the test process, status detection, and anomaly handling. For example, basic test actions may include unidirectional friction cycle execution actions, test frame lifting / lowering timing control actions, test point positioning actions, etc., but are not limited to these. Control and handling test actions may include performance degradation characteristic detection actions, contact pressure calibration actions, emergency stop and reset actions, etc., but are not limited to these.

[0086] Triggering conditions are pre-existing in the test behavior tree and are bound to each test action. They serve as the judgment rules and threshold standards for determining whether to execute the corresponding test action. For example, triggering conditions for regular loop-type test actions may include the completion of a single loop action, the cumulative number of loops reaching 1000, etc., but are not limited to these. Triggering conditions for abnormal handling may include friction fluctuation coefficient exceeding a preset threshold of 12%, contact pressure deviation exceeding ±10%, abnormal air source pressure, etc., but are not limited to these.

[0087] Test events are a collective term for various state changes monitored in real time by various sensors and counters during the testing process of a display screen sliding durability testing device. These changes can be matched and compared with trigger conditions within the test behavior tree. For example, regular node-type test events may include, but are not limited to, the cumulative number of cycles reaching 1000, the completion of a single unidirectional friction action, and the switching of test process levels. Abnormal state-type test events may include, but are not limited to, the deviation of the touch reporting accuracy of the tested screen exceeding the standard, the sudden change in friction force exceeding the threshold, and the test frame not being raised to the correct position.

[0088] The first test action is the target test action that the device needs to execute, which is the one whose triggering condition matches the currently monitored test event among the multiple test actions encapsulated within the first test behavior tree.

[0089] As can be seen from the above, the display screen sliding durability test method provided in this application improves the traditional control mode of running a fixed set of logic throughout the entire process by pre-storing multiple sets of test behavior trees that correspond one-to-one with different test process levels, and encapsulates the control logic of the test process according to the test progress stage and the real-time status of the screen under test. This achieves dynamic switching of the test control strategy with the test process. By using the test events monitored in real time as the trigger source, the closed-loop control of event monitoring, current test process level acquisition, corresponding test behavior tree invocation, trigger condition matching, and target test action execution is completed in sequence. It can match and execute corresponding test actions according to the dynamically changing loop nodes, the performance status of the screen under test, and the operating conditions of the equipment during the test, thus improving the problems of delayed response to abnormal test conditions and missed detection of performance degradation critical points in traditional tests. By using the test process level as the anchor point for behavior tree invocation, the execution strategy, priority, and execution frequency of test actions are matched with the needs of the current test stage. This ensures test efficiency in the initial stage of test, balances test progress and status monitoring in the middle stage of test, and accurately captures failure critical points at the end of test. This effectively avoids irreversible damage to the screen under test and improves the accuracy and reference value of test data.

[0090] To better understand the display screen sliding durability test method provided in the embodiments of this application, the specific implementation process of the display screen sliding durability test method provided in the embodiments of this application will be described by way of example below.

[0091] Figure 6 This paper illustrates a schematic flowchart of a display screen sliding durability test method provided in an embodiment of this application. The display screen sliding durability test method includes: S100, in response to the detection of a test event, obtains the current test progress level of the display screen under test; wherein, the display screen under test is the object of the unidirectional sliding durability test.

[0092] It can be understood that monitoring is the process of real-time and uninterrupted data acquisition, status identification, and signal capture of the test cycle progress, equipment operating status, performance parameters of the screen under test, and action status of the actuator through data acquisition units such as cycle counters, pressure sensors, and displacement sensors in the display screen sliding durability test.

[0093] By using responsive triggering logic to ensure that process level acquisition actions are executed only at critical nodes where test events occur, unnecessary system resource consumption is avoided, and the synchronization of state acquisition timing with triggering events is guaranteed, laying the timing foundation for immediate response of subsequent control actions. By synchronously acquiring the current test process level of the display under test at real-time nodes where test events occur, an anchor point is provided for matching the corresponding test behavior tree and calling the appropriate test control strategy, ensuring that every test action executed subsequently fits the needs of the current test cycle stage and the real-time performance status of the display under test.

[0094] S200, based on the current test process level, invoke the first test behavior tree; wherein, the first test behavior tree is the behavior tree corresponding to the current test process level among multiple pre-stored test behavior trees.

[0095] It is understandable that the first test behavior tree is a test behavior tree that the device retrieves from multiple pre-stored test behavior trees during the testing process, based on the real-time acquired current test progress level of the screen under test, and that matches the current test progress level. For example, when the current test progress level is the initial stage of testing, the retrieved first test behavior tree is pre-stored control information adapted to the initial stage. The control information contains built-in action rules for high-frequency push / pull unidirectional friction cycles and low-frequency routine performance tests to ensure operational efficiency in the early stages of testing.

[0096] Depending on the current test progress level, the first test behavior tree can be invoked in several ways. First, the entire unidirectional sliding durability test process can be divided into multiple continuous and non-overlapping fixed intervals based on the number of effective unidirectional friction cycles. Each interval corresponds to a test progress level, and an independent test behavior tree is pre-bound for each level. During the test, the current test progress level is determined based on the cumulative number of effective push / pull cycles, and then the first test behavior tree pre-bound to that level is directly invoked. Alternatively, multiple hierarchical judgment thresholds can be set in advance based on real-time collectable performance parameters of the screen under test, such as contact pressure, friction fluctuation coefficient, and touch reporting accuracy. Each threshold corresponds to an independent test progress level, and an adapted test behavior tree is pre-stored for each level. During the test, the current test progress level is determined based on the comparison between the real-time collected performance parameters and the preset thresholds, and then the first test behavior tree matching that level is adaptively invoked. However, these methods are not limited to these approaches.

[0097] By establishing a one-to-one mapping between the current test process level and multiple pre-stored test behavior trees, the test control strategy is adapted to the current test stage, the real-time performance status of the screen under test, and the test conditions. The control logic can be dynamically switched to fit the current requirements as the test progresses. By using the current test process level as the anchor point and calling the first test behavior tree that matches it as the control basis for the current test cycle, it ensures that the judgment of each test event, the execution of each push / pull unidirectional friction action, and the control of each return lift sequence are adapted to the requirements of the current test stage. This ensures test efficiency in the early stage of testing, balances the running progress and status monitoring in the middle stage of testing, and prioritizes test accuracy and sample safety in the final stage of testing, thereby improving the problem of the disconnect between traditional test control strategies and actual working conditions.

[0098] S300, in response to determining that the test event meets the triggering condition of the first test action, control the test device to execute the first test action; wherein, the first test action is the action that matches the test event among the multiple test actions included in the first test behavior tree.

[0099] It can be understood that a test event satisfying the trigger condition of the first test action means that the state characteristics, quantification parameters, and occurrence sequence of the test event monitored in real time completely match the preset threshold range, judgment rules, and effective scenarios of the trigger condition bound to the corresponding first test action in the first test behavior tree. For example, when the monitored test event is the cumulative completion of 1000 valid unidirectional friction cycles, its quantification parameters completely match the preset threshold of 1000 cycles for performance testing, then the test event is determined to satisfy the trigger condition.

[0100] Controlling the testing equipment to execute the first test action refers to controlling the hardware actuators in the display screen sliding durability testing device that are driven by the control system commands and directly execute the corresponding test actions. These include, but are not limited to, placement drive devices, test drive devices, and pressure sensors. For example, for the first test action executed in a unidirectional friction cycle, the corresponding testing equipment is a placement drive device, which can drive the display screen under test to complete a preset stroke of push and pull reciprocating motion under the command of the control system.

[0101] By comparing and verifying the real-time monitored test events with the trigger conditions of each test action in the first test behavior tree, the execution command is only issued when the test event is determined to meet the corresponding trigger conditions. This ensures that the execution of each test action has a legitimate trigger basis, improving the shortcomings of traditional testing that indiscriminately executes invalid actions and wastes system resources. By locating the first test action that matches the current test event from multiple test actions in the first test behavior tree as the execution target, the adaptation of test actions and test events is achieved. Standardized loop and detection actions can be executed for regular node events, and emergency protection and shutdown actions can be executed first for abnormal alarm events. This improves the problems of traditional test action execution being out of sync with real-time operating conditions and delayed abnormal response.

[0102] In one possible implementation, before step S300, the method further includes: S300a, obtaining a first multiplier parameter corresponding to the current test process level based on the current test process level; wherein, the first multiplier parameter is used to characterize the multiplier of the influence of the test process level on the response parameters when the test equipment performs test actions.

[0103] It can be understood that the first magnification parameter is an adjustment coefficient pre-stored in the control system (control unit) of the display screen sliding durability test device, which is bound one-to-one with different test process levels. It is used to characterize the proportion of influence of the test process level on the response parameters when the test equipment performs test actions. For example, for the critical failure stage at the end of the test, the pre-stored first magnification parameter can be 0.5, which is used to reduce the basic feed speed of the push / pull unidirectional friction action by 50% to capture the critical failure point of the screen with low-speed sliding; for example, for the performance degradation warning stage, the pre-stored first magnification parameter can be 10, which is used to increase the basic sampling frequency of screen performance detection by 10 times to achieve high-frequency monitoring of the screen wear degradation trend, etc., but is not limited to these.

[0104] Response parameters are operational parameters that the display screen sliding durability testing device can adjust through the control system when performing various test actions. These parameters directly determine the action execution effect, response speed, and execution frequency, and are the direct adjustment targets of the first magnification parameter. For example, motion-related response parameters may include the feed speed of the drive device driving the screen under test to perform push / pull unidirectional friction actions, the start delay of the return pull action, and the response speed of the test frame lifting action. Detection and control-related response parameters may include the sampling frequency for detecting the performance degradation characteristics of the screen under test, the calibration interval of the contact pressure, and the monitoring sensitivity of friction fluctuations, but are not limited to these.

[0105] The influence ratio refers to the linear adjustment ratio of the first magnification parameter to the preset basic response parameter of the test equipment. Specifically, it manifests as a quantitative adjustment effect on amplifying, reducing, or maintaining the basic response parameter. This can be achieved by adjusting the response parameter to equal the basic response parameter. The first multiplier parameter is calculated to adapt the response parameters to the current test progress level. For example, when the first multiplier parameter is 0.8, its influence multiplier is 80%, which can adjust the base feed speed of the push / pull action to 80% of the original speed, adapting to the low-speed precision test requirements at the end of the test.

[0106] By establishing a one-to-one correspondence between the current test process level and the first magnification parameter, a quantitative adjustment benchmark is provided for the dynamic adjustment of test action response parameters, improving the control mode of the traditional test with fixed parameters running the entire process. By using the first magnification parameter to characterize the influence of the test process level on the response parameters, the response parameters such as the feed speed of the push / pull unidirectional friction action, the return lifting response delay, and the performance detection sampling frequency can be adjusted based on the needs of the current test stage. In the early stage of the test, high magnification parameters can be used to improve test operation efficiency; in the middle stage of the test, the test progress and status monitoring accuracy can be balanced by adapting the magnification; and in the late stage of the test, low magnification parameters can be used to reduce the sliding speed and increase the detection frequency, adapting to the needs of different test stages.

[0107] S300b acquires the preset basic response parameters and basic test process level for the test equipment.

[0108] It can be understood that the basic response parameters are preset before the test starts and are bound to the basic test process level. They are the baseline operating parameters for the test equipment to perform various test actions. They are the benchmark values ​​for adaptive adjustment of response parameters during the test process. All changed response parameters adjusted with the test process level are calculated based on this basic value using the first magnification parameter. For example, for the outward push and return pull actions performed by the drive unit, the preset basic response parameters are a basic feed speed of 50mm / s for the outward push action and a basic start delay of 50ms for the return pull action (a 50ms delay after the test frame is raised to start the pull action). During the test, these basic parameters can be amplified or reduced using different first magnification parameters to adapt to the anti-scratching and test accuracy requirements of different test process levels.

[0109] The basic test process level is preset before the test starts. It serves as the initial reference level for the parameter benchmark of the entire unidirectional sliding durability test process, corresponding to the initial stage of the test cycle and the normal state of the screen under test with good performance. It is the core benchmark for dividing other test process levels and matching the corresponding first magnification parameter with the test behavior tree. For example, for conventional mass production unidirectional sliding durability testing, the preset basic test process level can be the initial stage of the test, corresponding to the range of 0-1000 effective unidirectional friction cycles. Under this level, the test equipment executes preset basic response parameters, which serve as the benchmark for dividing the subsequent intermediate and final process levels.

[0110] By pre-setting basic response parameters bound to the basic test process level before test initiation, a quantitative benchmark is provided for the adaptive adjustment of response parameters such as push / pull action feed speed, return pull action start delay, and performance detection frequency throughout the entire test process. This ensures that all changed response parameters adjusted with the test process level are linearly calculated based on the same benchmark value using the first multiplier parameter, thus improving the drawback of large fluctuations in traditional test parameter adjustment conditions. By obtaining the pre-set basic test process level, a unified reference is provided for the test process level division, first multiplier parameter matching, and test behavior tree invocation throughout the entire test process. This ensures that the test process division rules are consistent for different test batches, different devices, and different specifications of the tested screens, improving the consistency of test conditions and the repeatability of test data.

[0111] S300c determines the change response parameters of the test equipment at the current test process level based on the first rate parameter, the basic response parameters of the test equipment, and the basic test process level.

[0112] It can be understood that, under the current test process level, the change response parameters corresponding to the test equipment refer to the calculation process by which the control unit of the display screen sliding durability test device, using a preset basic response parameter as a quantification benchmark, combines the first multiplier parameter matching the current test process level and the basic test process level, to complete the quantification calculation of the change response parameters, equipment safety threshold verification, test behavior tree rule matching, and finally output the effective operating parameters that can be sent to the test equipment for execution. For example, the control system uses a preset 50mm / s forward push operation basic feed speed as a benchmark, combines the 0.5 times first multiplier parameter corresponding to the current test end process level, completes linear calculation, determines the change response parameter as a feed speed of 25mm / s, and simultaneously verifies that this parameter is within the equipment safety operating threshold range and matches the rules of the current test behavior tree, and finally assigns the value to the placement drive device for execution.

[0113] Modified response parameters refer to the actual operating parameters that the control system calculates and determines based on the basic response parameters and the first-rate parameters, combined with the current test progress level. These parameters are tailored to the needs of the current test stage and can be sent to the test equipment for execution. They serve as the control basis for the test equipment to perform various test actions such as push / pull unidirectional friction, return lift, and performance testing, and can be updated in real time with the dynamic changes in the test progress level. For example, for the critical failure progress level at the end of the test, the calculated modified response parameters are a push / pull action feed speed of 25mm / s, a return pull action start delay of 100ms, and a contact pressure deviation alarm threshold of ±3%. Compared with the basic parameters, this reduces the sliding speed, extends the return start delay, and narrows the alarm threshold, accurately capturing the screen failure critical point while avoiding scratches on the already worn screen during the return stroke.

[0114] By using preset basic response parameters as a unified quantitative benchmark and a first-magnification parameter matching the current test process level as a dynamic adjustment coefficient, and combining the basic test process level to calculate the changed response parameters, the adaptation of the core response parameters of the test action to the current test stage and the real-time performance status of the screen under test is achieved. By verifying the calculated changed response parameters against the device safety threshold and the rules of the current test behavior tree, it is ensured that the operating parameters sent to the test device not only meet the needs of the current test process but also comply with the device's safe operation specifications. In the early stage of the test, the changed parameters adjusted at a high magnification rate improve the efficiency of push / pull actions. In the middle stage of the test, the changed parameters adjusted at an appropriate magnification rate balance the test progress and the accuracy of status monitoring. In the late stage of the test, the changed parameters adjusted at a low magnification rate reduce the sliding speed, extend the return start-up delay, and increase the detection frequency. This improves the problems of the disconnect between traditional test control parameters and actual working conditions and the uncontrollable risk of return screen interference, and enhances the adaptability, control accuracy, and reliability of the test process.

[0115] S300d controls the test equipment to execute the first test action according to the changed response parameters.

[0116] It is understandable that by establishing a binding control relationship between change response parameters and the execution of the first test action, it is ensured that every test action executed by the test equipment follows change response parameters that are adapted to the current test process level and the real-time performance status of the screen under test, thus achieving dynamic adaptation between test actions and process test conditions. By controlling the parameters of the process in which the test equipment executes the first test action, it is ensured that action parameters such as the feed speed of the push / pull unidirectional friction action, the start-up delay of the return pull action, the execution frequency of performance testing, and the control threshold of contact pressure strictly conform to the quantitative requirements of the change response parameters, thereby improving the execution accuracy of test actions, the consistency of test conditions, and the reliability of test data.

[0117] In one possible implementation, the first test behavior tree includes at least a first test subtree and a second test subtree. The first test subtree includes test actions with high execution priority, and the second test subtree includes regular test actions without execution priority.

[0118] It can be understood that the first test subtree is an independent branch logic module belonging to the first test behavior tree. It specifically encapsulates all test actions with high execution priority and is the branch unit with the highest execution authority in the entire test control logic. When the triggering condition of the built-in action is met, it can directly interrupt the currently executing non-priority regular test action, seize system resources, and execute it first. It is the logical carrier that ensures the safety of test equipment, rapid response to abnormal operating conditions, and protection of the screen under test from irreversible damage. For example, the first test subtree, which adapts to the entire test process, has built-in high-priority test actions such as forced lifting of the test rack during the return phase, emergency shutdown due to abnormal air source pressure, and locking due to sudden change in friction force exceeding the threshold. When the corresponding test event is triggered, it can immediately interrupt the currently executing regular unidirectional friction cycle and execute the protection action first.

[0119] The second test subtree is a basic branch logic module belonging to and running parallel to the first test behavior tree. It specifically encapsulates all routine test actions without execution priority. It is the fundamental execution unit supporting the continuous and stable advancement of the test process. It executes smoothly according to preset timing, cycle, and loop rules only when no high-priority test actions are triggered, without interrupting or preempting the execution rights of high-priority actions. For example, the second test subtree adapted for the initial test phase includes routine test actions without priority, such as outbound unidirectional friction loop execution, thousand-cycle routine performance testing, and routine test data archiving. When no high-priority abnormal events are triggered, these actions are executed continuously and cyclically according to preset parameters, maximizing the operational efficiency in the initial test phase.

[0120] Execution priority is a hierarchical control rule pre-existing in the first test behavior tree, used to define the execution permissions, response timing, and resource preemption capabilities of different test actions. Its function is to clarify the execution order when the triggering conditions of multiple test actions are met simultaneously. High-priority actions have the right to preempt system resources and can be interrupted, while low-priority actions are executed first.

[0121] Regular test actions without execution priority are basic test actions encapsulated in the second test subtree and do not have the right to preempt system resources. They are executed only in the idle state when no high-priority test actions are triggered, according to the preset timing, cycle and loop rules. They cannot interrupt or interfere with the execution of high-priority actions. They mainly cover three categories: standardized test loops, regular status monitoring and regular data storage. They are the basic execution units that support the complete progress of the entire durability test process.

[0122] By decomposing the first test behavior tree into two independent and parallel branch modules, the logic of high-priority safety emergency actions and regular test cycle actions is decoupled and hierarchically controlled. By centrally encapsulating all high-priority test actions in the first test subtree and all regular test actions without execution priority in the second test subtree, a hierarchical execution rule of safety priority, anomaly preemption, and routine fallback is established. When the triggering condition of a high-priority action is met, the ongoing regular test action can be immediately interrupted, and high-priority actions such as safety protection, emergency response, and key data acquisition can be executed first. This avoids irreversible damage to the screen under test, ensures the continuous and stable progress of the regular test cycle under normal operating conditions, and improves the safety control capability of the testing process.

[0123] In one possible implementation, prior to step S300, the method further includes: S300e compares the test event with the triggering conditions of each test action in the first test subtree.

[0124] If the test event meets the triggering condition of the second test action, then the second test action is determined as the first test action; wherein, the second test action is the action that matches the test event among the multiple test actions included in the first test subtree.

[0125] If the test event does not meet the triggering conditions of each test action in the first test subtree, then the third test action is determined as the first test action; wherein, the third test action is any test action in the second test subtree.

[0126] It can be understood that comparing the test event with the triggering conditions of each test action in the first test subtree means that the control system performs a logical comparison operation by traversing the characteristic parameters, state type, and occurrence sequence of the test event monitored in real time with the triggering conditions bound to all high-priority test actions in the first test subtree, performing item-by-item full traversal, feature matching, and threshold verification.

[0127] The second test action refers to the highest priority target execution action among multiple high-priority test actions encapsulated within the first test subtree. After comparison and verification by the control system, the action whose triggering conditions are fully met by the current test event and whose characteristics perfectly match the test event has the highest execution authority and will be prioritized as the first test action and issued to the test equipment for execution. For example, when a test event entering the return reset phase is detected, and the triggering conditions for the forced lifting of the test frame during the return phase within the first test subtree are fully met, this forced lifting action is the second test action and will be prioritized as the first test action for execution.

[0128] The third test action refers to the fallback action selected from the regular test actions without execution priority in the second test subtree when the current test event does not meet the triggering conditions of all high-priority test actions in the first test subtree after a full comparison and verification by the control system. This fallback action serves as the foundation for issuing the first test action and ensures the continuous and smooth progress of the test process. For example, if the detected test event is the completion of a single valid unidirectional friction cycle without any abnormal state triggering, and a full comparison confirms that it does not meet the triggering conditions of all high-priority actions in the first test subtree, the next outgoing unidirectional friction cycle execution action in the second test subtree is determined as the third test action and issued as the first test action, ensuring the continuous and smooth progress of the test cycle.

[0129] By establishing a two-level verification rule that prioritizes full verification of high-priority subtrees and follows with fallback execution of regular subtrees, the system requires a full comparison of the test event with the trigger conditions of all high-priority test actions within the first test subtree. Only when no matching high-priority action is found does the system proceed to the regular action matching stage. This logically ensures the priority verification authority and fastest response speed for high-priority actions such as backhaul anti-screen-scratching and emergency shutdown. By unifying the matched high-priority second test action and the regular third test action when no match is found into a unified first test action for execution, a standardized and comprehensive action output closed loop is established. This ensures the priority execution of high-priority protection actions under abnormal conditions, effectively avoiding irreversible scratches on the screen under test, missed detection of critical test data, and equipment failure risks. It also ensures the smooth fallback execution of regular test actions under normal conditions, improving the security control capabilities, anomaly response speed, continuity of the test process, and integrity of test data.

[0130] In one possible implementation, the first test behavior tree further includes a third test subtree, which includes test actions with intermediate execution priority. The method also includes: S300f, responding to the occurrence time of the test event as a preset detection time, compares the test event with the triggering conditions of each test action in the third test subtree.

[0131] It can be understood that the occurrence time refers to the time node or cycle count node at which the display screen sliding durability testing device captures the triggering of the test event, completes the identification of state characteristics, and acquires effective signals. For example, when the testing device completes the 1000th effective outward unidirectional friction cycle, it captures the test event with a cumulative effective cycle count of 1000. The node at which this cycle is completed is the occurrence time of the test event.

[0132] The preset detection time refers to a fixed time node or cycle number node that is pre-set by the user in the control system of the testing device before the formal start of the unidirectional sliding durability test, based on industry testing standards, the specifications of the screen under test, and wear status tracking requirements. This node is then linked to each detection action. For example, for standardized mass production testing of consumer electronics mobile phone screens, the preset detection time could be a node marking 1000, 5000, or 10000 effective unidirectional friction cycles, respectively, linked to corresponding frequencies of anti-fingerprint coating wear detection and touch point accuracy verification actions.

[0133] The third test subtree is an independent branch logic module belonging to the first test behavior tree and running parallel to the first test subtree (high-priority emergency actions) and the second test subtree (non-priority routine actions). It specifically encapsulates all periodic / node-based performance testing and status calibration test actions bound to preset detection times. Trigger condition comparison and verification are only initiated when the test event occurs at the preset detection time. For example, the third test subtree adapted for routine sampling inspections on mass production lines includes built-in detection actions bound to preset cycle nodes, such as thousand-cycle routine performance testing, contact pressure cycle calibration, and test data archiving, which can be triggered for verification and execution at the corresponding detection time.

[0134] The third test subtree includes test actions with an intermediate priority. The intermediate priority level is lower than the highest priority corresponding to the first test subtree but higher than the no priority corresponding to the second test subtree. It can only interrupt the regular test actions of the second test subtree and cannot preempt the highest priority emergency actions of the first test subtree.

[0135] By using whether the occurrence time of the test event is the preset detection time as the pre-triggered threshold, the trigger condition comparison logic of the third test subtree is only activated when the condition is met. This achieves complete logical decoupling between periodic detection actions and high-priority emergency actions and regular loop actions, avoiding the system resource occupation caused by indiscriminate verification of detection actions at all times, and ensuring the response speed of high-priority backhaul anti-screen-crashing, emergency shutdown and other actions and the running stability of the main test loop.

[0136] S300g, in response to the test event meeting the trigger condition of the fourth test action, controls the test equipment to execute the fourth test action, and after the fourth test action is completed, executes the first test action; wherein, the fourth test action is the action that matches the test event among the multiple test actions included in the third test subtree.

[0137] It is understandable that the fourth test action belongs to the third test subtree and is bound to a preset detection time. After the control system verifies and confirms that the current test event fully meets its triggering conditions, it takes precedence over the regular first test action. This action is a standardized periodic / node-specific performance test or equipment condition calibration test. For example, for the standardized mass production test of electronic mobile phone screens, the two regular test actions of anti-fingerprint coating wear detection and touch point accuracy verification, which are bound to the preset detection time of every 1000 effective unidirectional friction cycles, become the fourth test action when the test event meets its triggering conditions. This action can complete the test of the screen performance at a fixed node.

[0138] By establishing a timing rule that prioritizes the complete execution of the fourth test action and follows the closed-loop sequence of the first test action, the execution of the first test action must be initiated only after the fourth test action process is completed. This improves the data distortion caused by the parallel execution and mutual interference between the detection actions and the main loop. It ensures both the performance detection at the preset detection time and the consistency of the main test loop's operating conditions and the continuity of the process. By limiting the fourth test action within the third test subtree to an intermediate priority action that is triggered only at the preset detection time, has a higher execution order than the regular first test action, but does not preempt the execution authority of the high-priority emergency action in the first test subtree, it achieves the decoupling of the three levels of priority and timing for emergency protection, periodic detection, and regular loop test actions. This ensures the orderly and complete execution of standardized periodic detection actions and improves the timing controllability of the testing process and the accuracy of the detection data.

[0139] S300h: If the test event does not meet the triggering conditions for each test action in the third test subtree, then control the test equipment to execute the first test action.

[0140] It is understandable that by requiring a full, item-by-item comparison of the trigger conditions for each test action within the third test subtree before outputting the final judgment result on whether the conditions are met, missed detections and misjudgments of the detection actions are avoided. This ensures the complete verification and execution of the detection actions at the preset detection time period, as well as the rapid and seamless continuation of the main test loop when there is no match. At the same time, it does not interfere with the priority response authority of high-priority emergency protection actions within the first test subtree, thus improving the operational efficiency of the testing process.

[0141] In one possible implementation, the method also includes: The S300i responds to the fact that the occurrence of a test event is not the detection time, and controls the test equipment to execute the first test action.

[0142] It is understandable that the occurrence time of the test event is not the detection time. This means that the control system of the display screen sliding durability test device will compare the real-time captured time node or cycle number node of the test event with all the standardized detection times preset before the test starts. The output will be a negative judgment result that the two do not match at all and the occurrence time does not fall within the range of any preset detection nodes.

[0143] By establishing a fast execution logic that skips the third test subtree verification step and directly executes the first test action during non-detection periods, the system resource consumption caused by invalid full verification during non-detection periods is eliminated, thereby improving the execution response speed of the main test loop and the running efficiency of long-cycle tests.

[0144] S300j, in response to the testing process reaching the detection time, compares the test event with the trigger conditions of each test action in the third test subtree.

[0145] It can be understood that the testing process refers to the complete process of a display screen's unidirectional sliding durability test, starting from the start and progressing step by step according to the number of cycles, runtime, or performance degradation stages. For example, the testing process can be a test process that progresses based on the cumulative number of unidirectional sliding friction cycles, or a test process that progresses based on the continuous runtime, etc., but is not limited to these.

[0146] The test process proceeds to the node state that reaches and matches the preset detection time after a certain number of real-time loops or runtime. For example, when the cumulative loop count increases from 999 to 1000, it means the preset detection time of 1000 has been reached.

[0147] By only initiating the comparison process when the testing process reaches the detection point, the timing of enabling the third test subtree is strictly limited, thus avoiding resource waste and action timing delays caused by meaningless verification outside of the detection point.

[0148] S300k, in response to a test event meeting the trigger condition for the fourth test action, controls the test equipment to stop executing the first test action, execute the fourth test action, and continue executing the first test action after the fourth test action is completed.

[0149] It is understandable that by immediately stopping the first test action when the trigger condition of the fourth test action is met, an independent and interference-free execution environment is provided for detection and calibration actions, ensuring that the test results are true and accurate and the parameter calibration is effective. By continuing to execute the interrupted first test action after the fourth test action is completed, the regular test process can be continued. This not only completes the performance monitoring and equipment calibration of key nodes, but also maintains the continuity and integrity of the durability test cycle, while not preempting the execution rights of high-priority safety actions, thus improving the standardization, data reliability and process stability of the entire test process.

[0150] In one possible implementation, the test events include at least one of the following: a test cycle count reaching a target event, a performance degradation characteristic triggering event of the tested display screen, an abnormal operating status event of the test equipment, and a test point switching event.

[0151] It can be understood that the test loop count achievement event refers to a node-type test event generated when the cumulative number of unidirectional sliding durability tests reaches a preset node threshold. For example, the test loop count achievement event could be an achievement event triggered when 1000 or 10000 standard sliding cycles are completed cumulatively.

[0152] Performance degradation characteristic triggering events for the tested display screen refer to performance test events that occur when performance parameters such as friction, touch accuracy, and surface coating condition exceed preset degradation thresholds. For example, a performance degradation characteristic triggering event for the tested display screen could be a degradation event triggered when the fluctuation amplitude of sliding friction exceeds a warning threshold of ±12%.

[0153] Abnormal events in the operating status of test equipment refer to equipment-related test events caused by deviations of the operating parameters of hardware such as drives, sensors, and actuators from safe ranges. For example, abnormal events in the operating status of test equipment may be abnormal events triggered by the test drive device or the air source pressure of the drive device being lower than the safety limit of 0.4 MPa.

[0154] The test point switching event refers to a test point-type event that occurs when switching to another target test position on the display screen after completing the test at the current point. For example, the test point switching event could be a switching event triggered when switching from a test point at the center of the screen to a test point at the left or right edge.

[0155] By clearly defining test events as including at least one of the following: test cycle count reached, performance degradation triggered, equipment malfunction, and test site switching, a multi-dimensional event system covering all nodes, performance, equipment, operating conditions, and test sites in the entire test process is constructed, providing a complete and comprehensive triggering basis for subsequent behavior tree matching, priority determination, and test action execution.

[0156] In one possible implementation, the test actions include at least one of the following: unidirectional friction cycle execution action, friction direction switching action, performance degradation detection action, data acquisition action, emergency stop action, and equipment reset action.

[0157] The timing sequence for the unidirectional friction cycle execution action is as follows: a. The control and placement drive device extends forward along the first direction to complete unidirectional friction.

[0158] b. Control the test drive device to lift the friction load away from the surface of the display screen under test.

[0159] c. Control the retraction of the drive unit to the initial position.

[0160] d, control the test drive device to fall and reset.

[0161] It is understandable that the unidirectional friction cycle execution action is to complete one effective unidirectional friction and frictionless return stroke in strict accordance with a fixed timing sequence.

[0162] Performance degradation detection is a detection action that uses parameters such as friction and touch accuracy to determine the wear and failure trend of the screen under test.

[0163] The data acquisition action is the real-time collection and storage of data such as cycle count, friction force, performance parameters, and equipment status.

[0164] An emergency shutdown is a safety protection action that immediately stops the operation of all mechanisms when equipment malfunctions, screens fail, or safety risks occur.

[0165] The equipment reset action is the action of restoring all actuators to their initial standby position after the test is completed and the abnormality is resolved.

[0166] In one possible implementation, the test process levels include: an initial stage, a middle stage, and a final stage based on the number of test cycles, or a normal stage, a degradation warning stage, and a failure critical stage based on the degree of performance degradation of the tested display screen. The change in response parameters includes at least one of the following: data sampling frequency, performance testing interval, unidirectional friction cycle execution delay, abnormal response speed, and friction feed speed.

[0167] It can be understood that the data sampling frequency is the number of times the control system collects test information such as friction force and touch data per unit cycle or unit time. For example, the data sampling frequency could be once every 100 cycles in the initial stage, and once every 10 cycles in the final stage, etc.

[0168] The performance testing interval is the number of cycles or the length of time between two consecutive performance degradation tests on the screen, such as wear and touch performance tests. For example, the performance testing interval could be once every 1000 cycles in the initial stage, and once every 200 cycles in the final stage, etc.

[0169] The execution delay of a unidirectional friction cycle is a time delay parameter between each action in the unidirectional friction cycle. For example, the execution delay of a unidirectional friction cycle can be an extension of the return action delay by 50ms or 100ms in the final stage.

[0170] Abnormal response speed is the delay between when the test equipment detects an abnormality and when it executes protective actions such as shutdown or lifting.

[0171] Friction feed speed is the motion feed speed at which the screen body is driven by a drive device to complete effective unidirectional friction. For example, the friction feed speed can be a high-speed feed of 50 mm / s in the initial stage and a low-speed operation of 20 mm / s in the final stage.

[0172] The display screen sliding durability testing device 100 provided in this application embodiment may further include a control unit. The control unit is communicatively connected to the placement drive device, the test drive device, the display screen under test, and various sensors (e.g., pressure sensors, displacement sensors disposed on the output end of the placement drive device or the test drive device). The control unit includes at least one processor, at least one memory, and a computer program stored in at least one memory and executable on at least one processor. When the processor executes the computer program, it causes the display screen sliding durability testing device 100 to implement the steps in any of the above-described display screen sliding durability testing method embodiments.

[0173] For example, a computer program can be divided into one or more modules / units, one or more of which are stored in memory and executed by a processor to complete this application. One or more modules / units can be a series of computer program instruction segments capable of performing a specific function, which describe the execution process of the computer program in the control unit.

[0174] The control unit can be a programmable logic controller, microcontroller, embedded main control module, control box, or other computing device. This control unit may include, but is not limited to, processors and memory. Those skilled in the art will understand that the above embodiments are merely examples of control units and do not constitute a limitation on the control unit. It may include more or fewer components, or combine certain components, or different components, such as input / output devices, network access devices, buses, etc.

[0175] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0176] In the embodiments provided in this application, it should be understood that the disclosed display screen sliding durability testing apparatus and method can be implemented in other ways. For example, the embodiments of the display screen sliding durability testing apparatus and method described above are merely illustrative. Furthermore, the displayed or discussed mutual couplings, direct couplings, or communication connections can be indirect couplings or communication connections through some interfaces, devices, or units, and can be electrical, mechanical, or other forms.

[0177] The above description is merely a preferred embodiment of this application and is not intended to limit this application. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this application should be included within the protection scope of this application.

Claims

1. A device for testing the sliding durability of a display screen, characterized in that, include: frame; The mounting part is movably disposed on the frame and has at least one mounting space for fixing the display screen. The mounting part is used to move the display screen fixed on the mounting space along a first direction or a second direction, wherein the first direction is perpendicular to the second direction. as well as The testing unit is mounted on the rack and has at least one testing area, which corresponds one-to-one with the placement space. Each testing area has at least one contact surface for contacting the display screen fixed to the placement space. When the placement part moves the display screen fixed on the placement space along the first direction, the contact surface and the contacting display screen move relative to each other in the first direction. When the placement part moves the display screen fixed on the placement space along the second direction, the contact surface and the contacting display screen move relative to each other in the second direction.

2. The display screen sliding durability testing device as described in claim 1, characterized in that, The placement department includes: A guide device is movably mounted on the frame; A placement device is movably disposed on the guide device and has at least one movable hole, through which the placement device slides in cooperation with the guide device; At least one clamping device, movably disposed on the mounting device and having the mounting space, the clamping device being used to fix a display screen mounted within the mounting space; and A placement drive device is detachably mounted on the guide device. The axis of the moving hole is parallel to the driving direction of the placement drive device. The output end of the placement drive device is connected to the placement device and is used to drive the placement device to move along the first direction or the second direction.

3. The display screen sliding durability testing device as described in claim 2, characterized in that, The testing unit includes: A test fixture, rotatably mounted on the frame, the test fixture having at least one test area; At least one testing device, detachably mounted on the testing frame and located within the testing area, the testing device having the contact surface; and A test drive device is mounted on the frame, and the output end of the test drive device is rotatably connected to the test frame. The test drive device is used to drive the test frame away from the frame when the display screen fixed on the placement space moves in the opposite direction of the first direction or the opposite direction of the second direction in the placement part, so that the contact surface does not contact the display screen.

4. A method for testing the sliding durability of a display screen, characterized in that, The method is applied to the display screen sliding durability testing apparatus as described in any one of claims 1 to 3, wherein the display screen sliding durability testing apparatus pre-stores multiple sets of test behavior trees corresponding to different test process levels, each set of test behavior trees includes multiple test actions and triggering conditions corresponding to the test actions, the test process level changes dynamically with the progress of the test, and the method includes: In response to the detection of a test event, the current test progress level of the display screen under test is obtained; wherein the display screen under test is the target of the unidirectional sliding durability test. Based on the current test process level, the first test behavior tree is invoked; wherein, the first test behavior tree is the behavior tree corresponding to the current test process level from among multiple pre-stored test behavior trees; In response to determining that the test event meets the triggering condition of the first test action, the test device is controlled to execute the first test action; wherein, the first test action is an action that matches the test event among a plurality of test actions included in the first test behavior tree.

5. The display screen sliding durability test method as described in claim 4, characterized in that, Before controlling the test device to execute the first test action in response to determining that the test event meets the triggering condition of the first test action, the method further includes: Based on the current test process level, obtain the first multiplier parameter corresponding to the current test process level; wherein, the first multiplier parameter is used to characterize the multiplier of the influence of the test process level on the response parameters when the test device performs test actions; Obtain the preset basic response parameters and basic test process level for the test equipment; Based on the first multiplier parameter, the basic response parameters corresponding to the test equipment, and the basic test process level, determine the change response parameters corresponding to the test equipment under the current test process level; Control the test equipment to execute the first test action according to the changed response parameters.

6. The display screen sliding durability test method as described in claim 4, characterized in that, The first test behavior tree includes at least a first test subtree and a second test subtree. The first test subtree includes test actions with high execution priority, and the second test subtree includes regular test actions with no execution priority.

7. The display screen sliding durability test method as described in claim 6, characterized in that, Before controlling the test device to execute the first test action in response to determining that the test event meets the triggering condition of the first test action, the method further includes: The test event is compared with the triggering conditions of each test action in the first test subtree; If the test event meets the triggering condition of the second test action, then the second test action is determined as the first test action; wherein, the second test action is the action that matches the test event among the multiple test actions included in the first test subtree; If the test event does not meet the triggering condition of each test action in the first test subtree, then the third test action is determined as the first test action; wherein, the third test action is any test action in the second test subtree.

8. The display screen sliding durability test method as described in claim 7, characterized in that, The first test behavior tree further includes a third test subtree, the third test subtree including test actions with an execution priority of intermediate priority, and the method further includes: In response to the occurrence time of the test event being a preset detection time, the test event is compared with the triggering conditions of each test action in the third test subtree; The step of controlling the test device to execute the first test action includes: in response to the test event satisfying the triggering condition of the fourth test action, controlling the test device to execute the fourth test action, and executing the first test action after the fourth test action is completed; wherein, the fourth test action is the action that matches the test event among the multiple test actions included in the third test subtree; If the test event does not meet the triggering conditions for each test action in the third test subtree, then the test device is controlled to execute the first test action.

9. The display screen sliding durability test method as described in claim 8, characterized in that, The method further includes: In response to the fact that the occurrence time of the test event is not the detection time, the test device is controlled to execute the first test action; In response to the detection time during the testing process, the test event is compared with the triggering conditions of each test action in the third test subtree; In response to the test event satisfying the triggering condition of the fourth test action, the test device is controlled to stop executing the first test action, execute the fourth test action, and continue executing the first test action after the fourth test action is completed.

10. The display screen sliding durability test method as described in claim 4, characterized in that, The test events include at least one of the following: test cycle count reaching the target, performance degradation characteristic of the tested display screen triggered, abnormal operation status of the test equipment, and test point switching event.

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