Impedance tuning test control method, control device and impedance tuning test system

Abstract

The application provides an impedance tuning test control method, a control device and an impedance tuning test system. The method performs a calibration operation on a mechanical impedance tuner, constructs an impedance-probe position mapping model, acquires and analyzes impedance tuning test requirements, determines multiple probe key movement nodes of the mechanical impedance tuner based on the impedance-probe position mapping model, performs a probe movement strategy planning operation and an impedance offset compensation operation on each probe key movement node, generates a probe target movement strategy of the mechanical impedance tuner to control the probe movement of the mechanical impedance tuner, and performs a current impedance tuning test. The method reorders each probe key movement node sequence, reduces the total probe movement distance, improves the probe positioning accuracy and positioning repeatability, shortens the impedance tuning test time, and improves the test throughput.

Description

Technical Field

[0001] This application relates to the field of impedance tuning test technology, and in particular to an impedance tuning test control method, control device and impedance tuning test system. Background Technology

[0002] Existing mechanical impedance tuners primarily use a motor to drive the movement of probes within the tuner cavity, altering their insertion depth and position within the transmission line to generate a specific impedance state. Impedance tuning tests with mechanical impedance tuners typically involve frequent switching between hundreds of impedance points. Therefore, implementing probe movement path planning, probe movement accuracy compensation, and tuning timing optimization for mechanical impedance tuners has become crucial for improving test throughput, test repeatability, and test automation.

[0003] Existing mechanical impedance tuners typically employ a probe movement strategy that involves sequentially traversing from the starting position to multiple target positions. However, this approach has the following technical drawbacks:

[0004] ① After the tuner is calibrated, the impedance-position mapping relationship between each target impedance point on the Smith chart and one or more sets of motor coordinates that drive the internal probe of the tuner typically exhibits highly nonlinear characteristics. Current technologies do not consider the non-uniform distribution of this impedance-position mapping relationship, leading to unnecessary long-distance probe movement and redundant total probe travel. Furthermore, this redundant probe movement significantly prolongs the tuning test cycle, reducing tuning efficiency and test throughput.

[0005] ② When the tuner moves the probe under the drive of the motor through the transmission components, due to the mechanical gap, elastic deformation and friction between the transmission components (gears, screws, etc.), the probe is triggered from the same position. When the forward and reverse movements reach the same command position, there is a backlash difference. However, the existing technology ignores this mechanical hysteresis effect and does not model and compensate for the backlash difference caused by the forward and reverse movements, which will lead to poor probe movement accuracy.

[0006] ③ The existing technology lacks a direction sensing mechanism. The probe movement strategy does not incorporate the historical movement direction information of the probe. Measuring the same target impedance point will yield different results due to different approximation paths, causing repeated positioning errors and making the test data unreliable. Furthermore, each probe movement causes repeated positioning errors to accumulate, further affecting the accuracy of probe movement. Summary of the Invention

[0007] In view of the shortcomings of the prior art described above, the purpose of this application is to provide an impedance tuning test control method, control device and impedance tuning test system to solve the technical problems of the probe movement strategy of the existing mechanical impedance tuner, such as stroke redundancy, poor movement accuracy, long test cycle, low tuning efficiency and low test throughput.

[0008] To achieve the above and other related objectives, a first aspect of this application provides an impedance tuning test control method for controlling a mechanical impedance tuner to perform impedance tuning tests. The method includes: performing a calibration operation on the mechanical impedance tuner and constructing an impedance-probe position mapping model; acquiring and parsing impedance tuning test requirements to determine multiple key probe movement nodes of the mechanical impedance tuner based on the impedance-probe position mapping model; performing a probe movement strategy planning operation based on the principle of minimizing global movement cost, according to each key probe movement node, to generate a target probe movement strategy for the mechanical impedance tuner; performing an impedance offset compensation operation based on a pre-constructed mechanical hysteresis compensation model, according to the target probe movement strategy, to update the target probe movement strategy of the mechanical impedance tuner; and controlling the probe movement of the mechanical impedance tuner according to the updated target probe movement strategy to perform the current impedance tuning test.

[0009] In some embodiments of the first aspect of this application, the method of performing a calibration operation on the mechanical impedance tuner includes: controlling the probe of the mechanical impedance tuner to move to multiple calibration points, and using a vector network analyzer to measure the calibration impedance value output by the mechanical impedance tuner at each calibration point where the probe is located; using a function fitting algorithm to establish a mapping relationship between the position of each calibration point and each calibration impedance value, and constructing an impedance-probe position mapping model.

[0010] In some embodiments of the first aspect of this application, the method for determining each probe key movement node includes: acquiring and parsing the impedance tuning test requirements of the current impedance tuning test to determine the impedance space to be tested and multiple impedance values ​​to be tested in the current impedance tuning test; based on the impedance-probe position mapping model, determining the probe movement start point, probe movement end point, and multiple probe movement path nodes of the mechanical impedance tuner according to each impedance value to be tested, so as to serve as multiple probe key movement nodes respectively; and determining the probe movable space of the mechanical impedance tuner according to the impedance space to be tested.

[0011] In some embodiments of the first aspect of this application, the method of performing probe movement strategy planning operation includes: constructing a planar movement grid of the probe's movable space, mapping each key probe movement node to the planar movement grid, and obtaining the target position coordinates of each key probe movement node; enumerating all possible access sequences of each key probe movement node to generate a probe movement sequence set; traversing multiple access sequences of key probe movement nodes in the probe movement sequence set, and solving for the shortest probe movement path for each key probe movement node access sequence; calculating the actual movement cost of each shortest probe movement path, and selecting the shortest probe movement path with the smallest actual movement cost as the target probe movement path of the mechanical impedance tuner, so as to determine the movement sequence, movement path, and movement direction of each key probe movement node, and generating the probe target movement strategy of the mechanical impedance tuner.

[0012] In some embodiments of the first aspect of this application, the method for solving the shortest probe movement path based on the access order of the probe key moving nodes includes: obtaining multiple consecutive probe movement sub-paths according to the access order of the probe key moving nodes, and using a weighted greedy backtracking algorithm to solve the shortest access path for each consecutive probe movement sub-path to obtain the shortest probe movement path under the access order of the probe key moving nodes.

[0013] In some embodiments of the first aspect of this application, the method of finding the shortest access path for the continuous probe movement sub-path using a weighted greedy backtracking algorithm includes: based on the planar movement grid, starting from the stage start point of the continuous probe movement sub-path, traversing multiple unvisited grid neighbor points of the currently visited grid node, and using a greedy algorithm to select the unvisited grid neighbor point with the minimum comprehensive movement cost as the next visited grid node; if access is restricted, backtracking a preset number of access steps, and traversing the remaining unvisited grid neighbor points of the currently visited grid node, selecting the unvisited grid neighbor point with the minimum comprehensive movement cost as the next visited grid node; repeating the above steps until the stage end point of the continuous probe movement sub-path is reached, thereby obtaining the shortest access path of the continuous probe movement sub-path.

[0014] In some embodiments of the first aspect of this application, the method of performing probe movement strategy planning operations further includes: determining the multi-level proximity distance of each key probe movement node, setting the multi-level probe movement speed of each key probe movement node, and updating the probe target movement strategy.

[0015] In some embodiments of the first aspect of this application, the method of performing impedance offset compensation operation includes: obtaining the target position coordinates and movement direction of each key probe moving node, and calculating the impedance offset compensation amount of each key probe moving node based on a pre-built mechanical hysteresis compensation model; calculating the compensation position coordinates of each key probe moving node according to each target position coordinate and each impedance offset compensation amount, and updating the probe target movement strategy.

[0016] To achieve the above and other related objectives, a second aspect of this application provides an impedance tuning test control device, comprising: a tuner calibration module for performing calibration operations on the mechanical impedance tuner and constructing an impedance-probe position mapping model; a probe movement point positioning module connected to the tuner calibration module for acquiring and parsing impedance tuning test requirements, and determining multiple key probe movement nodes of the mechanical impedance tuner based on the impedance-probe position mapping model; and a probe movement strategy planning module connected to the probe movement point positioning module for determining multiple key probe movement nodes of the mechanical impedance tuner based on the global movement cost. Following the principle of minimum control, a probe movement strategy planning operation is performed based on the key movement nodes of each probe to generate the probe target movement strategy for the mechanical impedance tuner. An impedance offset compensation module, connected to the probe movement strategy planning module, is used to perform an impedance offset compensation operation based on a pre-built mechanical hysteresis compensation model and the probe target movement strategy to update the probe target movement strategy of the mechanical impedance tuner. An impedance tuning test execution module, connected to the impedance offset compensation module, is used to control the probe movement of the mechanical impedance tuner according to the updated probe target movement strategy to perform the current impedance tuning test.

[0017] To achieve the above and other related objectives, a third aspect of this application provides an impedance tuning test system, the impedance tuning test system comprising: a mechanical impedance tuner; a drive motor connected to the mechanical impedance tuner; and an impedance tuning test control device connected to the drive motor; wherein the impedance tuning test control device is configured to: employ the impedance tuning test control method described in any of the above embodiments, by controlling the drive motor to drive the probe of the mechanical impedance tuner to move, thereby performing an impedance tuning test.

[0018] As described above, this application provides an impedance tuning test control method, control device, and impedance tuning test system. It performs calibration operations on a mechanical impedance tuner and constructs an impedance-probe position mapping model. The impedance tuning test requirements are obtained and analyzed to determine multiple key probe movement nodes of the mechanical impedance tuner based on the impedance-probe position mapping model. For each key probe movement node, probe movement strategy planning and impedance offset compensation operations are performed to generate a target probe movement strategy for the mechanical impedance tuner, thereby controlling the probe movement of the mechanical impedance tuner and executing the current impedance tuning test. This application has the following beneficial effects: it reorders the sequence of key probe movement nodes, reduces the total probe movement distance, improves probe positioning accuracy and repeatability, shortens the impedance tuning test time, and increases test throughput, thus solving the technical problems of existing mechanical impedance tuner probe movement strategies, such as travel redundancy, poor movement accuracy, long test cycle, low tuning efficiency, and low test throughput. Attached Figure Description

[0019] Figure 1 The diagram shown is a flowchart of an impedance tuning test control method according to an embodiment of this application.

[0020] Figure 2 The diagram shown is a cross-sectional view of a mechanical impedance tuner along the air line direction in one embodiment of this application.

[0021] Figure 3 The diagram shown illustrates the execution method of probe movement strategy planning in one embodiment of this application.

[0022] Figure 4 The diagram shown is a schematic representation of a planar moving grid in one embodiment of this application.

[0023] Figure 5 The diagram shown is a flowchart illustrating the process of finding the shortest access path in one embodiment of this application.

[0024] Figure 6 The diagram shown is a structural schematic of an impedance tuning test control device according to an embodiment of this application.

[0025] Figure 7 The diagram shown is a structural schematic of an impedance tuning test system according to an embodiment of this application. Detailed Implementation

[0026] The following specific examples illustrate the implementation of this application. Those skilled in the art can easily understand other advantages and effects of this application from the content disclosed in this specification. This application can also be implemented or applied through other different specific embodiments, and various details in this specification can also be modified or changed based on different viewpoints and applications without departing from the spirit of this application. It should be noted that, unless otherwise specified, the following embodiments and features in the embodiments can be combined with each other.

[0027] In the embodiments of this application, the terms "first" and "second" are used to distinguish identical or similar items with essentially the same function and effect, without limiting their order. Those skilled in the art will understand that the terms "first" and "second" do not limit the quantity or execution order, and that the terms "first" and "second" do not necessarily imply that they are different.

[0028] A mechanical impedance tuner is an electromechanical device that uses a drive motor to move a probe inside the tuner cavity, changing its insertion depth and position in the air line, thereby altering the structural parameters of the radio frequency transmission line and dynamically adjusting the impedance presented at the termination. (Example:) Figure 2 As shown. Its core working principle is: based on the impedance transformation relationship in transmission line theory, that is, by precisely controlling the physical position of the metal probe on the corresponding coaxial air line through formula (1), the distributed capacitance and inductance of the tuner cavity are changed, and a controllable reflection coefficient is introduced on the reference plane. Thus, the target complex impedance is "presented". To achieve the reflection coefficient or impedance Continuous regulation. It should be understood that the reflection coefficient... and impedance These are two equivalent ways to describe terminal load.

[0029] ;Formula (1)

[0030] in, The impedance at the input of the transmission line; The characteristic impedance of the transmission line; The load impedance connected to the transmission line termination; It is a phase constant, which is related to the signal frequency and the transmission line structure. , The transmission line wavelength; This refers to the transmission line length, i.e., the physical location of the tuner probe; The imaginary unit, .

[0031] Compared to electronic impedance tuners, mechanical impedance tuners remain irreplaceable in high-power, high-reliability applications due to their advantages such as high power capacity (up to kilowatt levels), wide tuning range, excellent thermal stability, long lifespan, and low cost. They are widely used in impedance tuning tests such as load traction testing, noise traction testing, and robustness and stability testing.

[0032] ① Load pulling is a large-signal characterization technique based on an impedance-controllable environment. By systematically adjusting the terminal load impedance of the device under test (DUT), it accurately evaluates key performance indicators such as output power (Pout), power added efficiency (PAE), gain compression, harmonic characteristics, and linearity under nonlinear operating conditions. Its mathematical principle is to obtain the optimal terminal load impedance by solving the numerical optimal solution of nonlinear function formulas (2) and (3) without explicit expressions through numerical algorithms. Load pulling technology provides high-confidence data support for power amplifier device modeling, circuit topology optimization, and mass production verification, significantly improving design efficiency, product performance, and development economy.

[0033] ;Formula (2)

[0034] ;Formula (3)

[0035] in, This is the terminal load reflection coefficient.

[0036] ② Noise pulling is a system-level testing method for receiver link devices such as low noise amplifiers (LNAs). It measures and locates the optimal source impedance condition that minimizes the noise figure (NF) by scanning the input source impedance. Noise pulling measures and locates the optimal source impedance condition that minimizes the noise figure by scanning the input source impedance, as shown in formula (4). Noise pulling technology is of decisive significance for improving receiver sensitivity, optimizing signal-to-noise ratio (SNR), and realizing multi-band broadband low-noise design.

[0037] ;Formula (4)

[0038] in, Noise factor; Minimum noise factor; Noise resistor; The characteristic impedance of the transmission line; The reflection coefficient at the input of the transmission line; The optimal reflection coefficient is the one that produces the minimum noise factor.

[0039] ③ Robustness and stability test: By exciting the device under test (DUT) under extreme or boundary impedance conditions, the performance stability and failure threshold of the device under test under mismatch conditions are evaluated. This ensures that the RF front end can operate reliably in complex electromagnetic environments, ensures that the long-term performance does not drift, and prevents system failures. It is the core guarantee for the reliability of the device under test (DUT) of electronic equipment.

[0040] It should be noted that the aforementioned impedance tuning test process typically involves frequent switching between hundreds of impedance points, requiring probe movement path planning, probe movement accuracy compensation, and tuning timing scheduling optimization for mechanical impedance tuners to improve test throughput, measurement repeatability, and test automation. However, existing mechanical impedance tuners typically employ a sequential traversal approach from the starting position to multiple target positions, resulting in technical problems such as travel redundancy, poor movement accuracy, long test cycles, low tuning efficiency, and low test throughput. To address these technical issues, this application provides an impedance tuning test control method, control device, and impedance tuning test system.

[0041] To make the objectives, technical solutions, and advantages of this application clearer, the technical solutions in the embodiments of this application are further described in detail below with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are only for explaining this application and are not intended to limit this application.

[0042] like Figure 1 The diagram illustrates a flowchart of an impedance tuning test control method according to an embodiment of this application. The impedance tuning test control method in this embodiment is used to control a mechanical impedance tuner to perform impedance tuning tests, and mainly includes the following steps.

[0043] Step S1: Perform a calibration operation on the mechanical impedance tuner and construct an impedance-probe position mapping model.

[0044] In one embodiment, step S1 includes the following steps.

[0045] ① Control the probe of the mechanical impedance tuner to move to multiple calibration points, and use a vector network analyzer to measure the calibration impedance value output by the mechanical impedance tuner at each calibration point.

[0046] A vector network analyzer is used to accurately measure the response of the mechanical impedance tuner to an incident wave signal, i.e., to measure the S-parameters of the mechanical impedance tuner. The S-parameters describe the reflection coefficients of the mechanical impedance tuner between different ports, thereby obtaining the reflection coefficients and impedance values ​​of the transmission line termination load of the mechanical impedance tuner.

[0047] It should be understood that the reflection coefficient and impedance These are two equivalent ways to describe terminal load, following the transformation relationship of formula (5).

[0048] ;Formula (5)

[0049] in, The reflection coefficient, This is the impedance value. The characteristic impedance of the transmission line. Reflection coefficient. and impedance It is a complex number. This can be visualized using a Smith chart. That is, each impedance point on the Smith chart corresponds to a specific complex reflection coefficient. Therefore, the complex impedance can be calculated. .

[0050] In this embodiment, a vector network analyzer is used to measure the S-parameters of the mechanical impedance tuner at each calibration point to obtain multiple calibration reflection coefficients of the mechanical impedance tuner at each calibration point, corresponding to multiple impedance points on the Smith chart. Then, according to the transformation relationship between reflection coefficient and impedance value in formula (5), multiple calibration impedance values ​​of the mechanical impedance tuner at each calibration point are calculated.

[0051] It should be noted that the physical location and number of each calibration point can be set by the user according to their needs, and this application does not specifically limit them.

[0052] ② A function fitting algorithm is used to establish the mapping relationship between the location of each calibration point and the calibration impedance value, and an impedance-probe position mapping model is constructed.

[0053] Specifically, based on the location coordinates of each calibration point and each calibrated reflectance coefficient Build dataset Formulas (7) and (8) are solved by using component polynomial regression, radial basis function interpolation, neural network and other function fitting algorithms, so as to realize the positive mapping and inverse mapping between the position of each calibration point and each calibration reflection coefficient, and construct the impedance and probe position mapping model.

[0054] ;Formula (6)

[0055] ;Formula (7)

[0056] ;Formula (8)

[0057] in, For the first The coordinates of the location of each calibration point; Number of calibration points; for Calibration reflection coefficient at each calibration point; This represents the positive mapping relationship between the calibration point location and the calibration reflection coefficient; This is the inverse mapping relationship from the reflection coefficient to the calibration point location.

[0058] Step S2: Obtain and parse the impedance tuning test requirements to determine multiple key probe movement nodes of the mechanical impedance tuner based on the impedance-probe position mapping model.

[0059] In one embodiment, such as Figure 3 As shown, step S2 includes the following steps.

[0060] ① Obtain and analyze the impedance tuning test requirements of the current impedance tuning test to determine the impedance space to be tested and multiple impedance values ​​to be tested in the current impedance tuning test.

[0061] ② Based on the impedance and probe position mapping model, the probe movement start point, probe movement end point, and multiple probe movement path nodes of the mechanical impedance tuner are determined according to each impedance value to be measured, so as to serve as multiple key probe movement nodes respectively.

[0062] That is, based on each impedance value to be measured, multiple corresponding reflection coefficients are calculated, and the inverse mapping relationship from the reflection coefficient to the calibration point position is calibrated based on the impedance-probe position mapping model. The physical locations of each probe's key moving nodes are calculated. Each key moving node includes: the probe's starting point, the probe's ending point, and multiple probe movement path nodes.

[0063] ③ Determine the movable space of the probe of the mechanical impedance tuner based on the space of the impedance to be measured.

[0064] It should be understood that the probe movable space is used to define the range of motion of the probe of the mechanical impedance tuner.

[0065] Step S3: Based on the principle of minimizing global movement cost, perform probe movement strategy planning operation according to the key movement nodes of each probe to generate the probe target movement strategy of the mechanical impedance tuner.

[0066] In one embodiment, such as Figure 3 As shown, step S3 includes the following steps.

[0067] Step S31: Construct a planar moving mesh of the probe's movable space, and map each key moving node of the probe to the planar moving mesh to obtain the target position coordinates of each key moving node of the probe.

[0068] Specifically, the movable space of the probe is described as follows: The mesh, as a planar moving mesh, includes some inaccessible obstacles. The planar moving mesh comprises: multiple accessible mesh nodes and multiple accessible mesh paths, such as... Figure 4 As shown.

[0069] Step S32: Enumerate all possible access sequences for each probe's key moving node and generate a set of probe moving sequences.

[0070] It should be noted that each key probe movement node includes: the probe movement starting point, the probe movement ending point, and multiple probe movement path nodes. In the access order of each key probe movement node, the access starting point is always the probe movement starting point, and the access ending point is always the probe movement ending point. The access order of each key probe movement node can be determined by enumerating all possible access orders of each probe movement path node.

[0071] For example, the starting point of the probe movement is defined as... The probe's movement endpoint is Multiple probe movement path nodes are Assume there are 3 probe movement path nodes: , as well as For the three probe movement path nodes , as well as Performing a full permutation generates 6 possible combinations, thus yielding 6 possible access sequences for each probe's movement path node: , , , , as well as This yields six possible access sequences for each probe's critical moving node: , , , , as well as Based on the access order, construct a set of probe movement orders. .

[0072] Step S33: Traverse the access order of multiple key probe movement nodes in the probe movement order set, and solve for the access order of each key probe movement node.

[0073] In one embodiment, the method for finding the shortest probe movement path under the access order of the key probe movement nodes includes: obtaining multiple consecutive probe movement sub-paths according to the access order of the key probe movement nodes, and using a weighted greedy backtracking algorithm to find the shortest access path for each consecutive probe movement sub-path to obtain the shortest probe movement path under the access order of the key probe movement nodes.

[0074] In the example above, the critical moving node access order of a probe For example, the method to find the shortest probe movement path under the access order of the key probe movement nodes includes: obtaining multiple consecutive probe movement sub-paths based on the access order of the key probe movement nodes. , , as well as A weighted greedy backtracking algorithm is used to solve for the shortest access path for each continuous probe movement sub-path. Based on each shortest access path, the shortest probe movement path under the access order of the key moving nodes of the probe is calculated.

[0075] Specifically, such as Figure 5 As shown, the method for solving the shortest access path for the continuous probe movement sub-path includes the following steps.

[0076] Step S331: Based on the planar moving grid, start visiting from the stage starting point of the continuous probe moving sub-path, traverse multiple unvisited grid neighbor points of the currently visited grid node, and use a greedy algorithm to select the unvisited grid neighbor point with the minimum comprehensive movement cost as the next visited grid node.

[0077] In one embodiment, backtracking, dynamic programming, greedy algorithms, heuristic search algorithms, genetic algorithms, simulated annealing, and reinforcement learning algorithms can be used to solve for the shortest access path of the continuous probe movement sub-path.

[0078] The core principle of backtracking is to recursively try all unvisited neighboring nodes, and backtrack if it fails; it is suitable for small-scale traveling salesman problems. The advantage is that it is simple to implement and can obtain the optimal solution with precision, but the search volume may explode exponentially for large-scale traveling salesman problems, resulting in high memory consumption.

[0079] The core principle of dynamic programming is to use memoization search based on currently visited and already visited grid nodes; it is suitable for small-scale traveling salesman problems. The advantage is that it can obtain the optimal solution and the optimal solution is accurate, and the search speed is faster than the backtracking method, but the search volume is still exponential and the memory consumption is still very large.

[0080] The core principle of heuristic search algorithms is to select the most recently unvisited grid node at each step; suitable for small-scale traveling salesman problems. The advantage is that it can obtain the optimal solution and has a fast search speed, but it is difficult to design a heuristic and is complex to implement.

[0081] The core principle of genetic algorithms is based on population evolution, crossover, and mutation to generate access paths; it is suitable for large-scale traveling salesman problems. Its advantage is its global search capability, but it does not guarantee that the optimal solution can be obtained, and its convergence is slow.

[0082] The core principle of the simulated annealing algorithm is based on random perturbation and probability acceptance of inferior solutions; it is suitable for medium to large-scale traveling salesman problems; its advantage is that it can escape local optima, but it is sensitive to parameters, the results are unstable, and it may not always obtain the optimal solution.

[0083] The core principle of reinforcement learning algorithms is to select the next visited grid node based on the agent's learning strategy; it is suitable for medium to large-scale traveling salesman problems; its advantage is that it can adapt to the environment, but it requires a lot of training, the model has limited generalization, and it may not be able to obtain the optimal solution.

[0084] It should be understood that a greedy algorithm is an algorithmic strategy that makes locally optimal choices at each step, hoping to eventually lead to a globally optimal solution. Greedy algorithms are useful in engineering practice for exact solutions to small-scale Traveling Salesman Problems (TSPs) with fewer than 15 points, as well as efficient approximate solutions to large-scale TSPs. While they may not yield globally optimal solutions for all problems, they can produce globally optimal solutions or approximate solutions for a wide range of problems, and their search speed is extremely fast.

[0085] It should be noted that users can choose a suitable algorithm to solve the shortest access path of the continuous probe movement sub-path according to their needs, and this application does not specifically limit it.

[0086] In a preferred embodiment, this application employs a greedy algorithm. Furthermore, to further improve the accuracy, engineering feasibility, algorithmic intelligence, and physical realism of the optimal solution of the greedy algorithm, diagonal weighting and a finite-depth backoff mechanism are introduced.

[0087] In this embodiment, the present application employs a diagonally weighted 8-direction greedy algorithm, supporting movement in eight directions from the currently visited grid node: up, down, left, right, upper left, lower left, upper right, and lower right. Figure 4 As shown, and the movement is unidirectional, each accessible grid node of the planar moving grid can only be accessed once, and the access path cannot intersect itself.

[0088] Based on the aforementioned planar moving mesh, the movement cost between two points is calculated using Chebyshev distance:

[0089] ;Formula (9)

[0090] in, For point and points Chebyshev distance between them.

[0091] Therefore, the actual movement cost for each step can be calculated. for:

[0092] ;Formula (10)

[0093] in, This is a diagonal weighting factor. The actual cost of moving up, down, left, or right. While moving to the upper left, lower left, upper right, and lower right, although diagonal movement is geometrically equivalent to one step as shown in formula (9), it often incurs additional costs in engineering implementation (such as motor steering inertia and amplification of positioning errors). Therefore, this application introduces a diagonal weighting factor. Calibrate based on measured positioning error or energy consumption data. The value is between 1.1 and 1.4. Based on formula (10), it can be suggested that in the case of multiple solutions, axial movement is preferred to improve path stability and accuracy.

[0094] In this embodiment, the greedy algorithm is used to find the shortest access path for the continuous probe movement sub-path as follows: Based on the planar movement grid, starting from the stage starting point of the continuous probe movement sub-path, the algorithm traverses multiple unvisited grid neighbors of the currently visited grid node, and selects the unvisited grid neighbor with the lowest overall movement cost as the next visited grid node. That is, from the eight unvisited grid neighbors in eight directions of the currently visited grid node, the unvisited grid neighbor with the lowest overall movement cost is selected as the next visited grid node. It should be noted that all eight unvisited grid neighbors are accessible. If they are inaccessible due to obstacles, or because the path cannot intersect itself, or because they have already been visited and are therefore inaccessible, they should be eliminated, and the search should only be performed on the remaining accessible grid neighbors.

[0095] The formula for calculating the comprehensive mobility cost is as follows:

[0096] ;Formula (11)

[0097] in, For the currently accessing grid node To unvisited grid neighbors The overall cost of movement; For the currently accessing grid node To unvisited grid neighbors The actual movement cost is calculated using formula (10). If the currently accessing grid node... To unvisited grid neighbors If the movement direction is up, down, left, or right, then... If the currently accessed grid node To unvisited grid neighbors If the movement direction is up, down, left, or right, then... The value ranges from 1.1 to 1.4; Unvisited grid neighbors To the end point of the stage of the continuous probe movement sub-path The Chebyshev distance is the guiding term of the comprehensive movement cost, and the calculation formula is shown in formula (9); Target-oriented weights.

[0098] The method of selecting the unvisited grid neighbor with the minimum overall movement cost as the next visited grid node is obtained by solving formula (12).

[0099] ;Formula (12)

[0100] in, For the currently accessing grid node Unvisited grid neighbors gather.

[0101] Repeat the above steps, progressively selecting the next grid node to visit, until the stage endpoint of the continuous probe movement sub-path is reached. .

[0102] Step S332: If access is restricted, roll back a preset number of access steps, and traverse all the remaining unaccessed grid neighbors of the currently accessed grid node, selecting the unaccessed grid neighbor with the lowest overall movement cost as the next accessed grid node.

[0103] In this embodiment, the present application introduces a finite depth backoff mechanism into the 8-direction greedy algorithm. When the greedy selection results in restricted access, i.e., the currently accessed grid node lacks accessible unaccessible grid neighbors, such as due to obstacles, non-intersecting paths, or already visited nodes, resulting in all grid neighbors of the currently accessed grid node being inaccessible, then based on the finite depth backoff mechanism, a preset number of access steps are backed up, and the remaining unaccessible grid neighbors of the new currently accessed grid node after the backoff are retraced. Step S331 is then used to re-search for an accessible path. If access is still restricted, the preset number of access steps can be backed up again until an accessible path is found.

[0104] The finite-depth backoff mechanism defines the access steps for each backoff and the threshold for the number of backoffs. It should be noted that users can set these parameters according to their needs; this application does not impose specific limitations. Furthermore, the backoff is only used for internal algorithm searching, and the final output shortest access path still satisfies unidirectional movement, without actual "reversing."

[0105] In a preferred embodiment, it can be defined that only one step is back each time, and a maximum of 3 backs are allowed, that is, the threshold for the number of backs is 3.

[0106] Step S333: Repeat the above steps until the stage end of the continuous probe movement sub-path is reached, and obtain the shortest access path of the continuous probe movement sub-path.

[0107] This application employs a weighted greedy backtracking algorithm to solve for the shortest access path for each continuous probe movement sub-path. This effectively reduces the total probe movement distance, reduces dependence on compensation direction, avoids jamming, and balances efficiency and reliability. Comparative verification shows that it is 10–100 times faster than the single backtracking method and has a success rate of more than 30% higher than the single greedy algorithm in obtaining the optimal solution.

[0108] After obtaining each shortest access path, these paths can be connected to obtain the shortest probe movement path under the access order of the key probe movement nodes. This yields the shortest probe movement path under the access order of each key probe movement node.

[0109] Step S34: Calculate the actual movement cost of each shortest probe movement path, and select the shortest probe movement path with the smallest actual movement cost as the target probe movement path of the mechanical impedance tuner, so as to determine the movement sequence, movement path and movement direction of each probe key movement node, and generate the probe target movement strategy of the mechanical impedance tuner.

[0110] The actual movement cost of the shortest probe movement path can be obtained by calculating the sum of the actual movement costs between every two adjacent accessible grid nodes on the shortest probe movement path. The actual movement cost between every two adjacent accessible grid nodes is calculated using formula (10).

[0111] The actual movement costs of each shortest probe movement path are compared, and the shortest probe movement path with the lowest actual movement cost is selected as the target probe movement path of the mechanical impedance tuner. The target probe movement path defines the movement path from the probe movement starting point, passing through each probe movement path node, to the probe movement ending point. It includes: the target position coordinates, movement sequence, movement path, and movement direction of each key probe movement node; specifically, it includes: the probe movement starting point, the probe movement ending point, and the target position coordinates, movement sequence, movement path, and movement direction of each probe movement path node.

[0112] At this time, the probe target movement strategy includes: the target position coordinates, movement order, movement path and movement direction of each key probe movement node; specifically including: the probe movement start point, the probe movement end point and the target position coordinates, movement order, movement path and movement direction of each probe movement path node.

[0113] The probe movement strategy of existing mechanical impedance tuners usually adopts a sequential traversal method from the starting position to multiple target positions, without optimizing the sorting of each target position, resulting in an excessively long total probe movement path and an excessively long overall impedance tuning test time.

[0114] This application intelligently reorders the sequence of key probe movement nodes based on the nonlinear mapping relationship between impedance values ​​and probe physical positions represented by the impedance-probe position mapping model, effectively avoiding invalid or repeated travel. Furthermore, this application treats solving the target probe movement path of the mechanical impedance tuner as a traveling salesman problem, i.e., solving the Hamiltonian path problem traversing all non-obstacle points to each key probe movement node, thereby eliminating redundant movements, reducing the total probe movement distance, and optimizing the global probe movement path.

[0115] In one embodiment, such as Figure 3 As shown, the method of performing probe movement strategy planning operation in step S3 further includes step S35.

[0116] Step S35: Determine the multi-level proximity distance of each key probe moving node, set the multi-level probe moving speed of each key probe moving node, and update the probe target moving strategy.

[0117] In one embodiment, a first proximity distance can be determined for each key probe moving node, and a first probe moving speed and a second probe moving speed can be set accordingly. The first probe moving speed is greater than the second probe moving speed. When the current position of the probe is greater than the first proximity distance from the key probe moving node to be moved, the probe moving speed is the first probe moving speed, meaning the probe moves rapidly towards the key probe moving node at the first probe moving speed; when the current position of the probe is less than the first proximity distance from the key probe moving node to be moved, the probe moving speed is the second probe moving speed, meaning the probe moves towards the key probe moving node at a slower second probe moving speed, as shown in formula (13).

[0118] ;Formula (13)

[0119] in, for The moving speed of the probe at any given time, i.e. the moving speed of the multi-stage probe; The first probe's moving speed; This refers to the movement speed of the second probe. for The position coordinates of the probe at any given time; The target position coordinates are the key moving nodes of the probe to be moved; The first nearest neighbor distance is set.

[0120] In a preferred embodiment, as shown in formula (13), the first probe moving speed The maximum probe movement speed that can be achieved using the mechanical impedance tuner is... Second probe movement speed Based on It is confirmed that, among them, This is used to fine-tune the proportional gain to ensure smooth convergence of probe movement.

[0121] It should be noted that the maximum movement speed Fine-tuning the proportional gain and the first nearest distance The specific parameter values ​​can be set by the user according to their needs; this application does not specifically limit them.

[0122] Because mechanical impedance tuners have non-ideal characteristics such as inertia, vibration, and hysteresis, if the probe moves at high speed throughout the entire movement, it is easy to cause slow oscillation decay after reaching the target position, resulting in overshoot and poor accuracy. However, if the probe moves at low speed throughout the entire movement, it is easy to cause high accuracy but long time consumption and low throughput.

[0123] This application, based on the first proximity distance, employs a segmented high-speed / low-speed moving probe, dividing the probe's single movement process into two stages: "coarse adjustment" and "fine adjustment." The "coarse adjustment" stage rapidly approaches the target area of ​​the probe's key moving node; the "fine adjustment" stage slowly and precisely positions the probe at the target location of the key moving node. This approach balances probe movement efficiency and positioning accuracy, achieving both speed without jerking and slowness with precision. Simultaneously, it effectively shortens the overall impedance tuning test time, improves test throughput, and meets the requirements of high-efficiency automated testing.

[0124] In another embodiment, this application can also set multiple proximity distances and multiple corresponding probe movement speeds, upgrading the two-stage speed-adjustment movement strategy to a multi-stage speed-adjustment movement strategy. This achieves a probe movement strategy that transitions from high-speed coarse adjustment to medium-speed to low-speed fine adjustment, allowing the probe to move quickly and accurately to the designated position. For example, for low-frequency mechanical impedance tuners, due to their large size and long movement distance, a multi-stage speed-adjustment movement strategy can be adopted.

[0125] Based on the multi-level probe movement speed of each key probe movement node, the updated probe target movement strategy includes: the target position coordinates, movement order, movement path, movement direction, and multi-level probe movement speed of each key probe movement node; specifically, it includes: the probe movement start point, the probe movement end point, and the target position coordinates, movement order, movement path, movement direction, and multi-level probe movement speed of each probe movement path node.

[0126] Step S4: Based on the pre-built mechanical hysteresis compensation model, perform impedance offset compensation operation according to the probe target movement strategy, and update the probe target movement strategy of the mechanical impedance tuner.

[0127] Mechanical hysteresis refers to the systematic deviation in the actual position of an electromechanical system under the same command during forward and reverse motion. This is caused by factors such as transmission backlash due to minute gaps in the screw and nut meshing or gear engagement, elastic deformation due to bending of the motor shaft, coupling, and support under stress, frictional asymmetry due to differences in static / dynamic friction and uneven lubrication, and micro-thermal expansion / material creep due to prolonged operation. In the aforementioned mechanical impedance tuner, mechanical hysteresis can lead to technical problems such as decreased positioning repeatability, inaccurate impedance mapping, and drifting test results.

[0128] This application improves the accuracy and reliability of the mechanical impedance tuner by pre-constructing a mechanical hysteresis compensation model, performing impedance offset compensation operations, and correcting the target position coordinates of key moving nodes of each probe in real time, thereby actively offsetting mechanical hysteresis errors.

[0129] In one embodiment, the impedance offset compensation operation is performed by the following steps.

[0130] ① Obtain the target position coordinates and movement direction of each key moving node of the probe, and calculate the impedance offset compensation amount of each key moving node of the probe based on the pre-built mechanical hysteresis compensation model.

[0131] Specifically, the formula for calculating the impedance offset compensation is as follows:

[0132] ;Formula (14)

[0133] in, This is the impedance offset compensation amount for the key moving node of the probe; The target position coordinates of the key moving node of the probe; The direction of movement of the key moving node of the probe describes whether the probe moves to the key moving node from a forward or reverse direction. If it moves forward, then... If it moves in the opposite direction, then ; This is the mechanical hysteresis compensation function, i.e., the mechanical hysteresis compensation model.

[0134] In one embodiment, the mechanical hysteresis compensation model can be constructed using a lookup table method, a Preisach model method, or a direction and history dependency dynamic model method. Specific users can choose according to their needs; this application is not limited to any particular method.

[0135] ① The core principle of the lookup table method is to obtain the physical positions and movement directions of multiple calibration points through experiments, collect the actual physical positions of the control probe at each calibration point, calculate the corresponding multiple calibration impedance offset compensation amounts, and thus establish a mapping relationship between the probe's physical position and movement direction and the impedance offset compensation amounts, enabling real-time interpolation. The main characteristics of the lookup table method are: compensation accuracy can reach... However, it is highly dependent on sampling density; using linear / cubic interpolation results in extremely low computational overhead. High performance; low implementation complexity, easily implemented in embedded systems; moderate calibration cost, requires full-stroke bidirectional scanning; high robustness, no model assumptions, strong noise resistance; static adaptability, requires recalibration after environmental / wear changes, and also requires periodic full calibration; supports embedded deployment; suitable for mechanical impedance tuners, semiconductor probe stations, industrial automation positioning systems, etc.

[0136] ②The Preisach model, proposed by German scientist F. Preisach, is based on the superposition theory of hysteresis operators and uses weighted "relay units" to describe the modeling of nonlocal memory characteristics. The Preisach weight function needs to be identified during modeling. It also requires complete input of the historical running trajectory to satisfy the "erasure property". The Preisach model is characterized by: high compensation accuracy, theoretically approximating any hysteresis loop; and high computational cost due to the use of double integration or discrete summation, reaching [amount missing]. High-performance photolithography is required; it necessitates the use of numerical integration and parameter identification tools, resulting in high complexity; it requires dense primary / secondary loop measurements, reaching hundreds of points, leading to high calibration costs; it exhibits moderate robustness but is sensitive to measurement noise and prone to overfitting; the model is fixed, does not support adaptation, and is almost impossible to maintain; it has high computational / storage requirements, making it unsuitable for embedded deployments; it is suitable for high-end lithography precision platforms, magnetostrictive / piezoelectric actuators, academic research, etc.

[0137] ③ The core principle of the direction-history dependent dynamic model is to introduce movement direction, speed, temperature, and historical errors to construct a parameterized or adaptive compensation function. It is modeled using a hybrid driving mode of experiment-driven and theory-driven approaches. It employs finite memory and relies on the most recent 1-2 historical errors or movement direction sequences. The characteristics of the direction-history dependent dynamic model include: high compensation accuracy, which gradually improves with online learning; using simple addition / multiplication and optional filtering, resulting in moderate computational overhead; requiring a state machine and update logic, leading to moderate implementation complexity; requiring initial coarse calibration and online fine-tuning, resulting in low calibration costs; relying on the learning rate design, which may diverge, but exhibits moderate robustness; capable of dynamic adaptation and tracking temperature drift and aging; a lightweight algorithm supporting embedded deployment; capable of autonomous maintenance and online updates of compensation amounts; and suitable for 24 / 7 automated testing systems and environments with severe temperature changes during long-term operation of robot joints.

[0138] In a preferred embodiment, the lookup table method is chosen to construct the mechanical hysteresis compensation model due to its reliability, low overhead, and ease of maintenance, and to calculate the impedance offset compensation amount for each key moving node of the probe.

[0139] ②Based on the coordinates of each target location and the impedance offset compensation amount, calculate the compensation position coordinates of each key probe moving node, and update the probe target moving strategy.

[0140] Specifically, the formula for calculating the compensation position coordinates is as follows:

[0141] ;Formula (15)

[0142] in, These are the compensated position coordinates of the key moving nodes of the probe; The target position coordinates of the key moving node of the probe; This is the impedance offset compensation amount for the key moving node of the probe.

[0143] Based on the compensated position coordinates of each key probe moving node, the updated probe target movement strategy includes: the target position coordinates, compensated position coordinates, movement order, movement path, movement direction, and multi-level probe movement speed of each key probe moving node; specifically, it includes: the target position coordinates, compensated position coordinates, movement order, movement path, movement direction, and multi-level probe movement speed of the probe movement start point, the probe movement end point, and each probe movement path node.

[0144] The purpose of this design in this embodiment is to introduce a direction-dependent mechanical hysteresis compensation model into the probe movement path planning, dynamically correct the target position coordinates of each key movement node of the probe, effectively suppress the systematic deviation caused by forward / reverse movement, thereby improving positioning accuracy and positioning repeatability.

[0145] Step S5: Control the probe movement of the mechanical impedance tuner according to the updated probe target movement strategy to perform the current impedance tuning test.

[0146] Specifically, based on the updated probe target movement strategy, control commands are generated to control the probe movement of the mechanical impedance tuner, execute the current impedance tuning test, and meet its impedance tuning test requirements. These control commands include, but are not limited to: the target position coordinates, compensation position coordinates, movement sequence, movement path, movement direction, and multi-level probe movement speeds of each probe's key movement nodes, namely the probe movement start point, the probe movement end point, and each probe movement path node.

[0147] In one embodiment, controlling the probe movement of the mechanical impedance tuner includes controlling the probe movement of the mechanical impedance tuner by controlling a drive motor connected to the mechanical impedance tuner. In this case, the target position coordinates and compensation position coordinates of each key probe movement node in the control command should be converted into corresponding motor drive parameters.

[0148] In one embodiment, after performing the current impedance tuning test, the output power Pout, power-added efficiency (PAE), noise figure, etc. of each probe's key moving node can be evaluated, and the optimal probe physical position can be obtained. Based on the impedance-probe position mapping model, the optimal impedance conditions that minimize the output power Pout, power-added efficiency (PAE), noise figure, etc., can be obtained to complete impedance tuning tests such as load traction test, noise traction test, robustness and stability test.

[0149] This application utilizes an impedance-probe position mapping model to represent the nonlinear mapping relationship between impedance values ​​and probe physical positions. It intelligently reorders the sequence of key probe movement nodes, effectively eliminating redundant movements. Furthermore, through a global path optimization strategy and a mechanical hysteresis compensation model, it minimizes the cumulative displacement error of the mechanical impedance tuner during multi-impedance point switching, thereby improving probe positioning accuracy and repeatability, and enhancing the overall impedance tuning test response speed. This significantly improves the reliability and scalability of the impedance tuning test control method, achieving synergistic optimization of accuracy, efficiency, and robustness. The impedance tuning test control method provides reliable technical support for demanding RF testing scenarios such as load-driven and noise-driven testing.

[0150] like Figure 6 The diagram shown illustrates the structure of an impedance tuning test control device 600 according to an embodiment of this application.

[0151] It should be understood that a control device is a general term for equipment or components in an automatic control system that receive measurement signals, perform calculations according to predetermined rules (control algorithms), and output control signals to drive actuators, thereby achieving automatic adjustment of the controlled object. The impedance tuning test control device 600 can be a controller or a host computer.

[0152] The impedance tuning test control device 600 described in this embodiment mainly includes: a tuner calibration module 601, a probe movement point positioning module 602, a probe movement strategy planning module 603, an impedance offset compensation module 604, and an impedance tuning test execution module 605, which are connected in sequence.

[0153] The tuner calibration module 601 is used to perform calibration operations on the mechanical impedance tuner and construct an impedance-probe position mapping model.

[0154] The probe movement point positioning module 602 is used to acquire and analyze the impedance tuning test requirements, so as to determine multiple key probe movement nodes of the mechanical impedance tuner based on the impedance-probe position mapping model.

[0155] The probe movement strategy planning module 603 is used to perform probe movement strategy planning operations based on the principle of minimizing global movement cost and according to the key movement nodes of each probe, to generate the probe target movement strategy of the mechanical impedance tuner.

[0156] The impedance offset compensation module 604 is used to perform impedance offset compensation operations based on a pre-built mechanical hysteresis compensation model and according to the probe target movement strategy, and update the probe target movement strategy of the mechanical impedance tuner.

[0157] The impedance tuning test execution module 605 is used to control the probe movement of the mechanical impedance tuner according to the updated probe target movement strategy in order to perform the current impedance tuning test.

[0158] It should be understood that the module division in the embodiments of this application is illustrative and only represents a logical functional division. In actual implementation, there may be other division methods. Furthermore, the functional modules in the various embodiments of this application can be integrated into a single processor or functional module, exist as separate physical entities, or be broken down into more functional modules. The integrated modules described above can be implemented in hardware or as software functional modules.

[0159] It should also be understood that the impedance tuning test control device and the impedance tuning test control method provided in the above embodiments belong to the same inventive concept. The specific implementation steps of each functional module are detailed in the method embodiments, and will not be repeated here.

[0160] like Figure 7 The diagram shown illustrates the structure of an impedance tuning test system 700 according to an embodiment of this application. The impedance tuning test system 700 in this embodiment mainly includes: an impedance tuning test control device 701, a drive motor 702, and a mechanical impedance tuner 703 connected in sequence.

[0161] The impedance tuning test control device 701 is configured to perform an impedance tuning test by controlling the drive motor to move the probe of the mechanical impedance tuner using an impedance tuning test control method. The impedance tuning test control method has been described in detail in the above embodiments and will not be repeated here for brevity.

[0162] It should be noted that those skilled in the art will understand that the impedance tuning test control method disclosed in the above embodiments of this application can be implemented using a computer program, and the computer program can be stored in a computer-readable storage medium. When the computer program is executed by relevant hardware, it performs the steps of the above-described method embodiments. The computer-readable storage medium includes various media capable of storing program code, such as ROM, RAM, magnetic disk, or optical disk.

[0163] In summary, this application provides an impedance tuning test control method, control device, and impedance tuning test system. It performs calibration operations on a mechanical impedance tuner and constructs an impedance-probe position mapping model. It acquires and analyzes the impedance tuning test requirements to determine multiple key probe movement nodes of the mechanical impedance tuner based on the impedance-probe position mapping model. For each key probe movement node, it performs probe movement strategy planning and impedance offset compensation operations to generate a target probe movement strategy for the mechanical impedance tuner, thereby controlling the probe movement and executing the current impedance tuning test. This reorders the sequence of key probe movement nodes, reducing the total probe movement distance, improving probe positioning accuracy and repeatability, shortening the impedance tuning test time, and increasing test throughput.

[0164] Therefore, this application effectively overcomes the various shortcomings of the prior art and has high industrial application value.

[0165] The above embodiments are merely illustrative of the principles and effects of this application and are not intended to limit this application. Any person skilled in the art can modify or alter the above embodiments without departing from the spirit and scope of this application. Therefore, all equivalent modifications or alterations made by those skilled in the art without departing from the spirit and technical concept disclosed in this application should still be covered by the claims of this application.

Claims

1. An impedance tuning test control method for controlling a mechanical impedance tuner to perform an impedance tuning test, characterized in that, include: A calibration operation is performed on the mechanical impedance tuner, and an impedance-probe position mapping model is constructed. The impedance tuning test requirements are acquired and analyzed to determine multiple key probe movement nodes of the mechanical impedance tuner based on the impedance-probe position mapping model. Based on the principle of minimizing global movement cost, a probe movement strategy planning operation is performed according to the key movement nodes of each probe to generate the probe target movement strategy of the mechanical impedance tuner. Based on the pre-built mechanical hysteresis compensation model, according to the probe target movement strategy, an impedance offset compensation operation is performed to update the probe target movement strategy of the mechanical impedance tuner. Based on the updated probe target movement strategy, the probe movement of the mechanical impedance tuner is controlled to perform the current impedance tuning test.

2. The impedance tuning test control method according to claim 1, characterized in that, The calibration operation for the mechanical impedance tuner includes the following methods: The probe of the mechanical impedance tuner is controlled to move to multiple calibration points, and the calibration impedance value output by the mechanical impedance tuner at each calibration point is measured using a vector network analyzer. A function fitting algorithm is used to establish the mapping relationship between the location of each calibration point and the calibration impedance value, and an impedance-probe position mapping model is constructed.

3. The impedance tuning test control method according to claim 1, characterized in that, The methods for determining the critical moving nodes of each probe include: Obtain and parse the impedance tuning test requirements of the current impedance tuning test to determine the impedance space to be tested and multiple impedance values ​​to be tested in the current impedance tuning test. Based on the impedance and probe position mapping model, the probe movement start point, probe movement end point, and multiple probe movement path nodes of the mechanical impedance tuner are determined according to each impedance value to be measured, so as to serve as multiple key probe movement nodes respectively. Based on the space of the impedance to be measured, the movable space of the probe of the mechanical impedance tuner is determined.

4. The impedance tuning test control method according to claim 1, characterized in that, The methods for executing probe movement strategy planning operations include: Construct a planar moving mesh for the probe's movable space, and map each key moving node of the probe to the planar moving mesh to obtain the target position coordinates of each key moving node of the probe; Enumerate all possible access sequences of the key moving nodes of each probe to generate a set of probe movement sequences; Traverse the access order of multiple key probe movement nodes in the probe movement order set, and solve the shortest probe movement path for each key probe movement node access order. Calculate the actual movement cost of each shortest probe movement path, and select the shortest probe movement path with the smallest actual movement cost as the target probe movement path of the mechanical impedance tuner to determine the movement sequence, movement path and movement direction of each probe's key movement nodes, and generate the probe target movement strategy of the mechanical impedance tuner.

5. The impedance tuning test control method according to claim 4, characterized in that, The methods for solving the shortest probe movement path based on the access order of the key probe movement nodes include: Based on the access order of the key probe moving nodes, multiple consecutive probe moving sub-paths are obtained. A weighted greedy backtracking algorithm is then used to solve for the shortest access path for each consecutive probe moving sub-path, so as to obtain the shortest probe moving path under the access order of the key probe moving nodes.

6. The impedance tuning test control method according to claim 5, characterized in that, The weighted greedy backtracking algorithm is used to solve for the shortest access path for the continuous probe movement sub-paths, including: Based on the planar moving grid, the visit starts from the stage starting point of the continuous probe moving sub-path, traverses multiple unvisited grid neighbor points of the currently visited grid node, and uses a greedy algorithm to select the unvisited grid neighbor point with the minimum comprehensive movement cost as the next visited grid node. If access is restricted, roll back a preset number of access steps, and traverse all other unaccessed grid neighbors of the currently accessed grid node, selecting the unaccessed grid neighbor with the lowest overall movement cost as the next accessed grid node; Repeat the above steps until the stage end of the continuous probe movement sub-path is reached, and obtain the shortest access path of the continuous probe movement sub-path.

7. The impedance tuning test control method according to claim 4, characterized in that, Other ways to perform probe movement strategy planning operations include: Determine the multi-level proximity distance for each key probe moving node, set the multi-level probe movement speed for each key probe moving node, and update the probe target movement strategy.

8. The impedance tuning test control method according to claim 4, characterized in that, The methods for performing impedance offset compensation include: Obtain the target position coordinates and movement direction of each key moving node of the probe, and calculate the impedance offset compensation amount of each key moving node of the probe based on the pre-built mechanical hysteresis compensation model. Based on the coordinates of each target location and the impedance offset compensation amount, the compensated position coordinates of each key probe moving node are calculated, and the probe target moving strategy is updated.

9. An impedance tuning test control device, characterized in that, include: The tuner calibration module is used to perform calibration operations on the mechanical impedance tuner and construct an impedance-probe position mapping model. The probe movement point positioning module is connected to the tuner calibration module and is used to acquire and analyze the impedance tuning test requirements in order to determine multiple key probe movement nodes of the mechanical impedance tuner based on the impedance-probe position mapping model. The probe movement strategy planning module, connected to the probe movement point positioning module, is used to perform probe movement strategy planning operations based on the principle of minimizing global movement cost and according to the key movement nodes of each probe, to generate the probe target movement strategy of the mechanical impedance tuner. The impedance offset compensation module, connected to the probe movement strategy planning module, is used to perform impedance offset compensation operations based on the pre-built mechanical hysteresis compensation model and the probe target movement strategy, and update the probe target movement strategy of the mechanical impedance tuner. The impedance tuning test execution module, connected to the impedance offset compensation module, is used to control the probe movement of the mechanical impedance tuner according to the updated probe target movement strategy in order to perform the current impedance tuning test.

10. An impedance tuning test system, characterized in that, include: Mechanical impedance tuner; Drive motor, connected to the mechanical impedance tuner; An impedance tuning test control device is connected to the drive motor; The impedance tuning test control device is configured to perform an impedance tuning test by controlling the probe of the mechanical impedance tuner to move by controlling the drive motor according to any one of claims 1 to 8.

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