Electrostatic discharge device high and low temperature working test system and method
By using an insulating protective layer and a three-dimensional adjustable support inside the high and low temperature test chamber, combined with a collaborative control operating table, the problems of test repeatability and safety of electrostatic discharge devices under high and low temperature environments were solved, and high-precision evaluation of discharge characteristics was achieved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- XIAN AIRBORNE ELECTROMAGNETIC TECH
- Filing Date
- 2026-06-16
- Publication Date
- 2026-07-14
AI Technical Summary
Existing technologies struggle to accurately reproduce the discharge characteristics of electrostatic discharge devices under high and low temperature conditions. Poor coordination between temperature control and high voltage application leads to thermal bridging interference, resulting in poor repeatability of test results and safety hazards.
The high and low temperature test chamber adopts a fully covered insulation protective layer, combined with a three-dimensional adjustable support and a collaborative control console, to achieve automatic coordination between the steady state of the temperature field and the application of high voltage. The logic judgment module ensures that the temperature is stable before applying high voltage, and with the high-precision discharge current acquisition, thermal bridge interference is eliminated.
It enables real and reproducible evaluation of discharge characteristics under high and low temperature environments, improves test repeatability and safety, reduces human error, and ensures the accuracy and consistency of test data.
Abstract
Description
Technical Field
[0001] This invention belongs to the field of electrostatic discharge testing technology, specifically relating to a high and low temperature operating test system and method for electrostatic discharge devices. Background Technology
[0002] During flight, aircraft accumulate static electricity on their fuselage surfaces due to friction with atmospheric particles. If this static electricity is not discharged in time, it may cause electromagnetic interference or even the risk of combustion and explosion. As a key component for electrostatic discharge protection, the discharge characteristics of electrostatic discharge devices (such as discharge brushes) in extreme high and low temperature environments (e.g., from -55°C at extremely low altitudes to +550°C in the high-temperature area near the engine) are directly related to flight safety.
[0003] Currently, high and low temperature discharge tests on electrostatic discharge devices are typically conducted using a high and low temperature test chamber in conjunction with an external high-voltage power supply. However, existing technologies have at least the following drawbacks: It is mainly used to simulate electrostatic discharge phenomena under normal temperature conditions. It is difficult to accurately reproduce the actual high and low temperature environment in which the electrostatic discharge device is located. It cannot simulate the alternating working conditions of high altitude low temperature and ground high temperature, resulting in a large deviation between the test results and the actual operating conditions of the aircraft. It is difficult to effectively assess the functional performance and reliability of the electrostatic discharge device under extreme temperatures. Poor coordination between temperature control and discharge application. Operators often need to manually turn on the high-voltage power supply before the temperature field is fully stable, or wait for a long time after the temperature stabilizes due to human delay, resulting in poor repeatability of test results, and even false discharge or abnormal breakdown of the test sample due to thermal transient fluctuations, which cannot truly reflect the working capability of the discharge device under thermal steady state; The contradiction between high-voltage insulation and temperature uniformity is prominent in high and low temperature test chambers. To withstand high temperatures, metal inner walls are often used in high and low temperature test chambers, but under high voltage, metal inner walls are prone to creepage. If thermal insulation materials are used to fully cover the chamber, the metal supports used to fix the test specimens are prone to forming "cold bridges" or "thermal bridges" that penetrate the chamber walls, causing local condensation, frost, or heat leakage, which not only interferes with the uniformity of the temperature field but may also become weak points for high-voltage discharge.
[0004] With the rapid development of my country's aviation industry, civil and military aviation equipment is iterating towards high performance and high reliability, and the requirements for the environmental adaptability and reliability of aircraft components are constantly increasing. Therefore, it is urgent to conduct functional performance tests on electrostatic discharge devices under actual flight environment conditions.
[0005] Based on this, the present invention discloses a high and low temperature operation test system and method for electrostatic discharge devices. Summary of the Invention
[0006] To address the problems in the prior art, the present invention aims to provide a high and low temperature operating test system and method for electrostatic discharge devices, which can achieve automatic coordination between steady-state temperature field and high voltage application, eliminate thermal bridge interference, and accurately maintain the discharge spacing, thereby obtaining a true and reproducible evaluation of discharge characteristics.
[0007] To achieve the above objectives and technical effects, the technical solution adopted by this invention is as follows: A high and low temperature working test system for an electrostatic discharge device includes a high and low temperature test chamber, a high voltage DC power supply, a discharge current acquisition unit, a high temperature resistant high voltage cable, and a collaborative control operating console; The inner wall of the high and low temperature test chamber is fully covered with an insulating protective layer. The high and low temperature test chamber is equipped with a three-dimensional adjustable bracket and a grounding plate. The three-dimensional adjustable bracket is used to fix the electrostatic discharge device under test and to maintain a preset discharge distance between the discharge end of the electrostatic discharge device under test and the grounding plate. The high-voltage DC power supply supplies power to the electrostatic discharge device under test through a high-temperature resistant high-voltage cable that passes through the high and low temperature test chamber. The discharge current acquisition unit is used to measure the discharge current flowing through the grounding plate; The collaborative control console includes a temperature acquisition module, a logic judgment module, and a high-voltage enable module. The temperature acquisition module is used to acquire the temperature signal inside the high and low temperature test chamber in real time. The logic judgment module has a built-in temperature steady-state judgment threshold. It judges whether the current temperature field has reached a steady state based on the temperature signal, and outputs a high-voltage unlock command when it is judged to be in a steady state. The high-voltage enable module is electrically connected to the output circuit of the high-voltage DC power supply. After receiving the high-voltage unlock command, it closes the output circuit to allow high voltage to be applied to the electrostatic discharge device under test. Furthermore, the collaborative control console is configured to automatically trigger the discharge current acquisition unit to synchronously record the current internal temperature of the high and low temperature test chamber, the output voltage of the high voltage power supply, and the discharge current data after the high voltage DC power supply is boosted to the test voltage according to the preset pressurization program.
[0008] Furthermore, the effective volume of the high and low temperature test chamber is ≥30L, the temperature control range is -70℃~+550℃, the temperature control accuracy is ±0.5℃, and the high and low temperature test chamber is equipped with a high-voltage insulated observation window with a shielding mesh.
[0009] Furthermore, the three-dimensional adjustable bracket is connected to the insulating protective layer, which is made of polyetheretherketone / ceramic fiber composite insulating high-temperature resistant material with a thickness of ≥5mm.
[0010] Furthermore, the grounding plate is made of aluminum, stainless steel or brass, with a thickness of ≥1mm. The grounding plate is led out to an independent grounding grid outside the box through a grounding copper busbar, and the contact resistance is ≤0.01Ω.
[0011] Furthermore, the temperature steady-state determination threshold is a temperature fluctuation ≤ ±0.3℃ / 5min; the logic judgment module continuously collects temperature signals and calculates the temperature standard deviation within a sliding time window. When the temperature standard deviation is continuously less than or equal to the temperature steady-state determination threshold within a preset time period, it is determined that the current temperature field has reached a steady state.
[0012] Furthermore, the discharge current acquisition unit includes a non-inductive resistor sampling module connected in series in the grounding plate circuit, a high-precision DC microammeter, and a high-speed oscilloscope.
[0013] Furthermore, the high-temperature resistant cable comprises, from the inside out, a conductor, a fluoroplastic insulation layer, and a stainless steel armor layer, with a temperature range of -70℃ to +550℃ and a rated withstand voltage of ≥100kV.
[0014] This invention also discloses a high and low temperature operation test method for an electrostatic discharge device high and low temperature operation test system, comprising the following steps: S1. Device clamping: The electrostatic discharge device under test is fixed on a three-dimensional adjustable bracket inside the high and low temperature test chamber, and a preset discharge distance is maintained between the discharge end of the electrostatic discharge device under test and the grounding plate. S2. Temperature setting and steady-state determination: The target test temperature is set by setting the collaborative control console, and the high and low temperature test chamber is started to heat up / cool down. The collaborative control console monitors the temperature inside the high and low temperature test chamber in real time and judges whether the temperature field has reached a steady state based on the built-in temperature steady state judgment threshold. S3, Apply high pressure in conjunction: Once the temperature field is determined to have reached a steady state, the collaborative control console issues a high-voltage unlocking command, closes the high-voltage enable module, and allows the high-voltage DC power supply to be output. The high-voltage DC power supply slowly increases the voltage to the test voltage at a preset voltage increase rate and maintains the voltage at the test voltage for a specified time. S4. Automatically record data: After pressurization is completed, the collaborative control console automatically triggers the recording of the current discharge current, the real-time temperature inside the high and low temperature test chamber, and the output voltage of the high voltage power supply to form test data. S5. Blood Pressure Reduction and Recovery: After the test is completed, the high voltage power supply is slowly reduced to zero, and then the high and low temperature test chamber is restored to room temperature before the electrostatic discharge device under test is removed.
[0015] Furthermore, in step S2, the temperature steady-state determination threshold is a temperature fluctuation ≤ ±0.3℃ / 5min; the collaborative control operating platform continuously collects the average temperature of multiple temperature measuring points in the high and low temperature test chamber, calculates the temperature standard deviation within a 5-minute sliding window, and determines that the temperature field has reached a steady state when the temperature standard deviation is ≤ 0.3℃ and lasts for at least 5 minutes.
[0016] Furthermore, in step S3, the preset pressurization rate is ≤5kV / s to avoid instantaneous high-voltage impact on the test sample; the test voltage is 40kV DC, and the specified time is 1min.
[0017] Compared with the prior art, the beneficial effects of the present invention are as follows: 1) By using temperature-high voltage interlocking coordinated control, the interference of thermal transients on discharge testing is eliminated, ensuring that the data corresponds to the real steady-state operating conditions, and the repeatability and confidence of the test are greatly improved; 2) The inner wall of the high and low temperature test chamber is fully covered with an insulating protective layer. Combined with the three-dimensional adjustment bracket without cold bridge, it not only achieves full-coverage high-voltage insulation protection inside the chamber, but also completely eliminates the thermal bridge effect, avoiding local condensation and spacing drift in a wide temperature range. The bracket adjustment accuracy is as high as ±0.1mm. 3) The automatic test sequence and automatic synchronization recording function reduces the human operation links, significantly improves the testing efficiency, and eliminates the safety hazards and errors that may be caused by human error. Detailed Implementation
[0018] The present invention will now be described in detail so that its advantages and features can be more easily understood by those skilled in the art, thereby providing a clearer and more explicit definition of the scope of protection of the present invention.
[0019] The following provides a brief overview of one or more aspects to offer a basic understanding of them. This overview is not an exhaustive summary of all conceived aspects, nor is it intended to identify key or decisive elements of all aspects, nor to define the scope of any or all aspects. Its sole purpose is to present some concepts of one or more aspects in a simplified form to prepare for the more detailed descriptions that follow.
[0020] On one hand, the present invention discloses a high and low temperature working test system for an electrostatic discharge device, including a high and low temperature test chamber, a high voltage DC power supply, a discharge current acquisition unit, a high temperature resistant high voltage cable, and a collaborative control operating console; The inner wall of the high and low temperature test chamber is fully covered with an insulating protective layer. The high and low temperature test chamber is equipped with a three-dimensional adjustable bracket and a grounding plate. The three-dimensional adjustable bracket is used to fix the electrostatic discharge device under test and to maintain a preset discharge distance between the discharge end of the electrostatic discharge device under test and the grounding plate. A high-voltage DC power supply supplies power to the electrostatic discharge device under test through a high-temperature resistant high-voltage cable that passes through the high and low temperature test chamber. The discharge current acquisition unit is used to measure the discharge current flowing through the grounding plate; The collaborative control console includes a temperature acquisition module, a logic judgment module, and a high-voltage enable module. The temperature acquisition module is used to acquire the temperature signal inside the high and low temperature test chamber in real time. The logic judgment module has a built-in temperature steady-state judgment threshold. It judges whether the current temperature field has reached a steady state based on the temperature signal and outputs a high-voltage unlock command when it is judged to be in a steady state. The high-voltage enable module is electrically connected to the output circuit of the high-voltage DC power supply. After receiving the high-voltage unlock command, it closes the output circuit to allow high voltage to be applied to the electrostatic discharge device under test. Furthermore, the collaborative control console is configured to automatically trigger the discharge current acquisition unit to synchronously record the current internal temperature of the high and low temperature test chamber, the output voltage of the high voltage power supply, and the discharge current data after the high voltage DC power supply is boosted to the test voltage according to the preset pressurization program.
[0021] The aforementioned system employs a hard logic interlock of "temperature steady state - high voltage unlock" to ensure that high voltage can only be applied after the temperature field has fully stabilized, thus avoiding thermal transient interference. Simultaneously, the automatically triggered recording function eliminates the time delay error of manual readings, ensuring that temperature, voltage, and current data strictly correspond to the same steady-state moment. This fundamentally solves the problems of poor coordination between temperature field and discharge, and low reliability of test data in existing technologies.
[0022] In some implementations, the effective volume of the high and low temperature test chamber is ≥30L, the temperature control range is -70℃ to +550℃, the temperature control accuracy is ±0.5℃, and the high and low temperature test chamber is equipped with a high-voltage insulated observation window with a shielding mesh.
[0023] In some implementations, the insulating protective layer is made of polyetheretherketone / ceramic fiber composite insulating high-temperature resistant material with a thickness of ≥5mm, which fully covers the inner wall of the high and low temperature test chamber, providing excellent high temperature resistance and high insulation.
[0024] In some implementations, the three-dimensional adjustable support is connected to the insulating protective layer via a cold-bridge-free / thermal-bridge-free connection structure.
[0025] In some specific embodiments, the cold-bridge-free / thermal-bridge-free connection structure includes: a mounting groove formed on the insulating protective layer and a bracket base at least partially embedded in the mounting groove. The bracket base is fastened to the insulating protective layer by ceramic bolts, and the bottom and sides of the bracket base are filled with thermally insulating sealant between the bottom and sides of the bracket base and the groove wall. This structure completely eliminates metal parts penetrating the insulating protective layer, blocks the heat conduction path from the box wall to the bracket, and eliminates condensation, frost, and spacing thermal drift caused by cold / thermal bridges.
[0026] In some implementations, the grounding plate is made of aluminum, stainless steel or brass, with a thickness of ≥1mm. The grounding plate is led out to an independent grounding grid outside the box through a grounding copper busbar, and the contact resistance is ≤0.01Ω.
[0027] In some implementations, the temperature steady-state determination threshold is a temperature fluctuation ≤ ±0.3℃ / 5min; the logic judgment module continuously collects temperature signals and calculates the temperature standard deviation within a sliding time window. When the temperature standard deviation is continuously less than or equal to the temperature steady-state determination threshold within a preset time period, it is determined that the current temperature field has reached a steady state.
[0028] In some implementations, the discharge current acquisition unit includes a non-inductive resistor sampling module connected in series in the grounding plate circuit, a high-precision DC microammeter, and a high-speed oscilloscope, which can accurately measure minute discharge currents at the level of 10μA.
[0029] In some embodiments, the high-temperature resistant cable comprises, from the inside out, a conductor, a fluoroplastic insulation layer, and a stainless steel armor layer, with a temperature range of -70℃ to +550℃ and a rated withstand voltage of ≥100kV.
[0030] In some implementations, the collaborative control console also has an automatic test sequence function, which is configured to: pre-set multiple temperature nodes, the holding time of each temperature node, the corresponding test voltage, and the pressurization rate; the collaborative control console automatically executes the following sequentially according to the automatic test sequence: heating / cooling to the target temperature, holding to a steady state in the temperature field, unlocking the high voltage output, increasing the voltage to the test voltage according to the pressurization rate, triggering the discharge current recording, reducing the voltage to zero, and entering the cycle of the next temperature node. The entire process requires no manual intervention, which greatly improves the testing efficiency and consistency.
[0031] On the other hand, the present invention also discloses a high and low temperature operation test method for a high and low temperature operation test system for an electrostatic discharge device, comprising the following steps: S1. Device clamping: The electrostatic discharge device under test is fixed on a three-dimensional adjustable bracket inside the high and low temperature test chamber, and a preset discharge distance is maintained between the discharge end of the electrostatic discharge device under test and the grounding plate. S2. Temperature setting and steady-state determination: The target test temperature is set by setting the collaborative control console, and the high and low temperature test chamber is started to heat up / cool down. The collaborative control console monitors the temperature inside the high and low temperature test chamber in real time and judges whether the temperature field has reached a steady state based on the built-in temperature steady state judgment threshold. S3, Apply high pressure in conjunction: Once the temperature field is determined to have reached a steady state, the collaborative control console issues a high-voltage unlocking command, closes the high-voltage enable module, and allows the high-voltage DC power supply to be output. The high-voltage DC power supply slowly increases the voltage to the test voltage at a preset voltage increase rate and maintains the voltage at the test voltage for a specified time. S4. Automatically record data: After pressurization is completed, the collaborative control console automatically triggers the recording of the current discharge current, the real-time temperature inside the high and low temperature test chamber, and the output voltage of the high voltage power supply to form test data. S5. Blood Pressure Reduction and Recovery: After the test is completed, the high voltage power supply is slowly reduced to zero, and then the high and low temperature test chamber is restored to room temperature before the electrostatic discharge device under test is removed.
[0032] In some implementations, in step S2, the temperature steady state determination threshold is a temperature fluctuation ≤ ±0.3℃ / 5min; the collaborative control console continuously collects the average temperature of multiple temperature measuring points in the high and low temperature test chamber, calculates the temperature standard deviation within a 5-minute sliding window, and determines that the temperature field has reached a steady state when the temperature standard deviation is ≤ 0.3℃ and lasts for at least 5 minutes.
[0033] In some implementations, in step S3, the preset pressurization rate is ≤5kV / s to avoid instantaneous high-voltage impact on the test sample; the test voltage is 40kV DC, and the specified time is 1min.
[0034] In some implementations, the collaborative control console pre-programs an automatic test sequence, which includes multiple temperature nodes, such as -55°C, 25°C, and 85°C. Steps S2 to S5 are automatically executed at each temperature node, and a test report containing temperature-current-voltage curves is automatically output after all temperature node tests are completed.
[0035] Example 1
[0036] A high and low temperature operating test system for an electrostatic discharge device includes a high and low temperature test chamber, a high voltage DC power supply, a discharge current acquisition unit, a high temperature resistant high voltage cable, and a collaborative control console.
[0037] The high and low temperature test chamber has an effective volume of 35L, a temperature control range of -70℃ to +550℃, and a temperature control accuracy of ±0.5℃. A high-voltage insulated observation window with a shielded mesh is located in the center of the chamber door for easy observation of the internal discharge status. The chamber walls are equipped with high-voltage line input holes and grounding wire input holes.
[0038] The inner wall of the high and low temperature test chamber is fully covered with an insulating protective layer. This insulating protective layer is made of polyetheretherketone / ceramic fiber composite insulating high-temperature resistant material, with a thickness of 5mm and a volume resistivity greater than [missing value]. The temperature resistance exceeds 550℃. The insulating protective layer is bonded to the inner wall of the high and low temperature test chamber with high-temperature resistant adhesive and the seams are coated and sealed a second time, forming a complete insulating inner liner and eliminating the possibility of high voltage creep to the chamber wall.
[0039] The high and low temperature test chamber is equipped with a three-dimensional adjustable bracket and a grounding plate. The three-dimensional adjustable bracket is used to fix the electrostatic discharge device under test and to maintain a discharge distance of 152mm between the discharge end of the electrostatic discharge device under test and the grounding plate.
[0040] At an appropriate location on the bottom of the high and low temperature test chamber, mounting grooves are machined into the insulating protective layer. The base of the three-dimensional adjustable bracket is embedded in the mounting groove. The bracket base is made of the same material as the insulating protective layer and is fastened to the insulating protective layer with ceramic bolts. The bottom and sides of the bracket base are filled with high-temperature silicone-based thermal insulation sealant between them and the groove walls. This connection method eliminates any metal parts penetrating the insulating protective layer, completely blocking the heat conduction path from the chamber wall to the bracket, achieving cold bridge-free / thermal bridge-free installation.
[0041] A grounding plate is fixed to one side of the bottom of the high and low temperature test chamber. The grounding plate is made of stainless steel with a thickness of 1mm. The grounding plate is led out to an independent grounding grid outside the chamber through a grounding copper busbar with a contact resistance of 0.01Ω.
[0042] The high and low temperature test chamber has a through-wall hole for introducing high voltage. A high voltage input sealing assembly is installed in the through-wall hole, which includes a ceramic insulating terminal with an outer conical surface and an inner conical surface formed on the wall of the through-wall hole. The outer conical surface and the inner conical surface are mated by the conical surface and the mating interface is filled with high temperature and high pressure resistant silicone rubber sealant to form a double seal. It can still maintain insulation and sealing performance at 550℃ and withstand voltage test exceeding 50kV without breakdown.
[0043] The high-temperature resistant high-voltage cable passes through ceramic insulated terminals into the high and low temperature test chamber. The high-temperature resistant high-voltage cable consists of silver-plated copper conductor, polytetrafluoroethylene insulation layer and stainless steel armor layer from the inside out. Its temperature range is -70℃ to +550℃ and its rated withstand voltage is 100kV.
[0044] The high-voltage DC power supply supplies power to the electrostatic discharge device under test through a high-temperature resistant high-voltage cable that runs through the high and low temperature test chamber.
[0045] The discharge current acquisition unit is used to measure the discharge current flowing through the grounding plate. The discharge current acquisition unit includes a non-inductive resistor sampling module connected in series in the grounding plate circuit, a high-precision DC microammeter, and a high-speed oscilloscope, which can accurately measure minute discharge currents in the range of 10μA.
[0046] The collaborative control console is based on an industrial-grade PLC and equipped with a 12-inch touch screen. It includes a temperature acquisition module, a logic judgment module, and a high-voltage enable module.
[0047] The temperature acquisition module includes multiple armored thermocouples installed inside the high and low temperature test chamber, used to acquire the temperature signal inside the high and low temperature test chamber in real time.
[0048] The logic judgment module has a built-in temperature steady-state judgment threshold. It determines whether the current temperature field has reached a steady state based on the temperature signal, and outputs a high-voltage unlocking command when it is determined to be in a steady state.
[0049] The high-voltage enable module includes a controlled relay electrically connected to the output circuit of the high-voltage DC power supply. This relay is normally open and closes only when a high-voltage unlock command is received and there are no other safety alarms in the system, so as to allow high voltage to be applied to the electrostatic discharge device under test.
[0050] The collaborative control console is configured to automatically trigger the discharge current acquisition unit to synchronously record the current internal temperature of the high and low temperature test chamber, the output voltage of the high voltage power supply, and the discharge current data after the high voltage DC power supply is boosted to the test voltage according to the preset pressurization program.
[0051] The touchscreen on the collaborative control console allows manual setting of the heating program or recall of pre-stored automatic test sequences. Taking the MIL-DTL-9129G test as an example, the sequence is set as follows: -55℃ for 30 min, 25℃ for 30 min, 85℃ for 30 min, etc.; the high voltage setting for each node is 40kV, the pressurization rate is 5kV / s, and the holding time is 1 min.
[0052] A high and low temperature operation test method for an electrostatic discharge device high and low temperature operation test system includes the following steps: S1. Device clamping: Fix the electrostatic discharge device under test on the three-dimensional adjustable bracket inside the high and low temperature test chamber, and maintain a discharge distance of 152mm between the discharge end of the electrostatic discharge device under test and the grounding plate, and close the door of the high and low temperature test chamber. S2. Temperature setting and steady-state determination: The target test temperature of -55℃ is set through the collaborative control console, and the high and low temperature test chamber is started to cool down. The collaborative control console monitors the temperature inside the high and low temperature test chamber in real time and judges whether the temperature field has reached a steady state based on the built-in temperature steady state judgment threshold. Specifically, the temperature steady state determination threshold is a temperature fluctuation of ±0.3℃ / 5min; the collaborative control console continuously collects the average temperature of multiple temperature measuring points in the high and low temperature test chamber, calculates the temperature standard deviation within a 5-minute sliding window, and determines that the temperature field has reached a steady state when the temperature standard deviation is ≤0.3℃ and lasts for at least 5 minutes. S3, Apply high pressure in conjunction: Once the temperature field is determined to have reached a steady state, the collaborative control console issues a high-voltage unlocking command, closes the high-voltage enable module, and allows the high-voltage DC power supply to be output. The high-voltage DC power supply is slowly increased from zero to 40kV at a rate of 5kV / s and maintained at the test voltage for 1 minute. S4. Automatically record data: After pressurization is completed, the collaborative control console automatically triggers the recording of the current discharge current, the real-time temperature inside the high and low temperature test chamber, and the output voltage of the high voltage power supply to form test data. S5. Blood Pressure Reduction and Recovery: After the test is completed, the high-voltage power supply is slowly reduced to zero at a rate of 5kV / s. The system automatically switches the temperature setting to the next node, 25℃, according to the sequence. Steps S2 to S4 are repeated until all nodes are completed. After the sequence ends, the high and low temperature test chamber is restored to room temperature, and the electrostatic discharge device under test is removed.
[0053] Throughout the process, no condensation or frost appeared inside the chamber due to the elimination of cold and thermal bridges; the discharge spacing showed no perceptible change; and there was no breakdown or flashover at the high-voltage inlet. Comparison of the test results with the room-temperature calibration values allows for a scientific assessment of the impact of high and low temperatures on discharge performance.
[0054] Any parts or structures not specifically described in this invention can be made using existing technologies or products, and will not be elaborated upon here.
[0055] The above description is merely an embodiment of the present invention and does not limit the patent scope of the present invention. Any equivalent structural or procedural transformations made based on the content of the present invention specification, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of the present invention.
Claims
1. A high and low temperature operating test system for an electrostatic discharge device, characterized in that, Includes a high and low temperature test chamber, a high voltage DC power supply, a discharge current acquisition unit, a high temperature resistant high voltage cable, and a collaborative control console; The inner wall of the high and low temperature test chamber is fully covered with an insulating protective layer. The high and low temperature test chamber is equipped with a three-dimensional adjustable bracket and a grounding plate. The three-dimensional adjustable bracket is used to fix the electrostatic discharge device under test and to maintain a preset discharge distance between the discharge end of the electrostatic discharge device under test and the grounding plate. The high-voltage DC power supply supplies power to the electrostatic discharge device under test through a high-temperature resistant high-voltage cable that passes through the high and low temperature test chamber. The discharge current acquisition unit is used to measure the discharge current flowing through the grounding plate; The collaborative control console includes a temperature acquisition module, a logic judgment module, and a high-voltage enable module. The temperature acquisition module is used to acquire the temperature signal inside the high and low temperature test chamber in real time. The logic judgment module has a built-in temperature steady-state judgment threshold. It judges whether the current temperature field has reached a steady state based on the temperature signal, and outputs a high-voltage unlock command when it is judged to be in a steady state. The high-voltage enable module is electrically connected to the output circuit of the high-voltage DC power supply. After receiving the high-voltage unlock command, it closes the output circuit to allow high voltage to be applied to the electrostatic discharge device under test. Furthermore, the collaborative control console is configured to automatically trigger the discharge current acquisition unit to synchronously record the current internal temperature of the high and low temperature test chamber, the output voltage of the high voltage power supply, and the discharge current data after the high voltage DC power supply is boosted to the test voltage according to the preset pressurization program.
2. The high and low temperature operating test system for an electrostatic discharge device according to claim 1, characterized in that, The high and low temperature test chamber has an effective volume of ≥30L, a temperature control range of -70℃ to +550℃, and a temperature control accuracy of ±0.5℃. The high and low temperature test chamber is equipped with a high-voltage insulated observation window with a shielding mesh.
3. The high and low temperature operating test system for an electrostatic discharge device according to claim 1, characterized in that, The three-dimensional adjustable bracket is connected to the insulating protective layer, which is made of polyetheretherketone / ceramic fiber composite insulating high-temperature resistant material with a thickness of ≥5mm.
4. The high and low temperature operating test system for an electrostatic discharge device according to claim 1, characterized in that, The grounding plate is made of aluminum, stainless steel or brass, with a thickness of ≥1mm. The grounding plate is led out to an independent grounding grid outside the box through a grounding copper busbar, and the contact resistance is ≤0.01Ω.
5. The high and low temperature operating test system for an electrostatic discharge device according to claim 1, characterized in that, The temperature steady-state determination threshold is a temperature fluctuation ≤ ±0.3℃ / 5min; the logic judgment module continuously collects temperature signals and calculates the temperature standard deviation within a sliding time window. When the temperature standard deviation is continuously less than or equal to the temperature steady-state determination threshold within a preset time period, the current temperature field is determined to have reached a steady state.
6. The high and low temperature operating test system for an electrostatic discharge device according to claim 1, characterized in that, The discharge current acquisition unit includes a non-inductive resistor sampling module connected in series in the grounding plate circuit, a high-precision DC microammeter, and a high-speed oscilloscope.
7. The high and low temperature operating test system for an electrostatic discharge device according to claim 1, characterized in that, The high-temperature resistant cable comprises, from the inside out, a conductor, a fluoroplastic insulation layer, and a stainless steel armor layer. Its temperature resistance range is -70℃ to +550℃, and its rated withstand voltage is ≥100kV.
8. The high and low temperature operation test method of the electrostatic discharge device high and low temperature operation test system according to any one of claims 1-7, characterized in that, Includes the following steps: S1. Device clamping: The electrostatic discharge device under test is fixed on a three-dimensional adjustable bracket inside the high and low temperature test chamber, and a preset discharge distance is maintained between the discharge end of the electrostatic discharge device under test and the grounding plate. S2. Temperature setting and steady-state determination: The target test temperature is set by setting the collaborative control console, and the high and low temperature test chamber is started to heat up / cool down. The collaborative control console monitors the temperature inside the high and low temperature test chamber in real time and judges whether the temperature field has reached a steady state based on the built-in temperature steady state judgment threshold. S3, Apply high pressure in conjunction: Once the temperature field is determined to have reached a steady state, the collaborative control console issues a high-voltage unlocking command, closes the high-voltage enable module, and allows the high-voltage DC power supply to be output. The high-voltage DC power supply slowly increases the voltage to the test voltage at a preset voltage increase rate and maintains the voltage at the test voltage for a specified time. S4. Automatically record data: After pressurization is completed, the collaborative control console automatically triggers the recording of the current discharge current, the real-time temperature inside the high and low temperature test chamber, and the output voltage of the high voltage power supply to form test data. S5. Blood Pressure Reduction and Recovery: After the test is completed, the high voltage power supply is slowly reduced to zero, and then the high and low temperature test chamber is restored to room temperature before the electrostatic discharge device under test is removed.
9. The high and low temperature operation test method of the electrostatic discharge device high and low temperature operation test system according to claim 8, characterized in that, In step S2, the temperature steady state determination threshold is a temperature fluctuation ≤ ±0.3℃ / 5min; the collaborative control operating platform continuously collects the average temperature of multiple temperature measuring points in the high and low temperature test chamber, calculates the temperature standard deviation within a 5min sliding window, and determines that the temperature field has reached a steady state when the temperature standard deviation is ≤ 0.3℃ and lasts for at least 5min.
10. The high and low temperature operation test method of the electrostatic discharge device high and low temperature operation test system according to claim 8, characterized in that, In step S3, the preset pressurization rate is ≤5kV / s to avoid instantaneous high voltage impact on the test sample; the test voltage is 40kV DC, and the specified time is 1min.