Target scattering characteristic test method based on support structure pointing difference servo

Abstract

The application provides a target scattering characteristic test method based on support structure pointing difference servo, and belongs to the technical field of low observability. The method is to reduce the coupling relationship between the support rod and the target by making the low scattering support rod produce a known and certain difference rotation when rotating, so as to reduce the influence of the coupling relationship between the support rod and the target on the test precision. The application can reduce the influence of the coupling relationship between the support rod and the target on the test precision on the basis that the overall electromagnetic characteristics of the test background are in a lower order, quickly complete the scattering characteristic test of the low scattering target, and obtain higher target scattering characteristic measurement precision by using the known and certain difference servo motion track of the support rod when the rotary table rotates, reducing the coupling characteristics between the support rod and the target through track fitting. The low scattering characteristic requirement for the support rod is greatly relieved, and the scattering characteristic measurement accuracy of the large target is improved. The application is suitable for all test sites using the support rod to arrange the target in the electromagnetic wave irradiation area.

Description

Technical Field

[0001] This invention belongs to the field of low observability technology, specifically relating to a method for testing target scattering characteristics based on the pointing difference of the support structure. Background Technology

[0002] Measuring the scattering characteristics of a target is a crucial issue in evaluating its scattering performance. Reducing the impact of the support rod on the accuracy of target scattering characteristic measurements is key to improving test precision. Current target scattering characteristic tests primarily rely on using a low-scattering support rod to position the target in a quiet zone. Methods such as designing scattering structures or covering with absorbing materials are used to ensure the support rod exhibits low scattering characteristics in the direction of electromagnetic wave illumination, thus keeping the background electromagnetic characteristics at a low order of magnitude. However, because the low-scattering support rod only exhibits low scattering characteristics within a certain angular range along its wedge direction, when the support rod rotates with the turntable, the high-scattering characteristic region of the support rod pointing towards the incident electromagnetic field significantly increases the background energy of the test scene. This causes the background electromagnetic characteristics to overshadow the electromagnetic characteristics of the target under test, making it impossible to accurately measure the target's scattering characteristics and affecting the measurement accuracy. While this problem can be mitigated to some extent by fixing the support rod and target together on the turntable and rotating them synchronously, ensuring the wedge direction of the support rod always points towards the incident electromagnetic wave direction, controlling the synchronous rotation of the support rod and turntable can maintain the background electromagnetic characteristics at a low level throughout the test. However, the strong coupling between the low-scattering support rod and the target will still seriously affect the test accuracy. Summary of the Invention

[0003] To address the aforementioned technical problems, this invention provides a target scattering characteristic testing method based on the directional difference of the support structure. While maintaining the overall electromagnetic characteristics of the test background at a low level, it reduces the impact of the coupling relationship between the support rod and the target on test accuracy, enabling rapid testing of the scattering characteristics of low-scattering targets. Utilizing the known and definite differential motion law generated by the support rod during turntable rotation, this method weakens the influence of the high-scattering region of the support rod on the test background and reduces the strong coupling scattering characteristics between the support rod and the target at certain test angles. This results in the scattering component of the support rod exhibiting a variation law distinct from that of the target scattering during the test, facilitating the identification, separation, and removal of the support rod scattering component in subsequent data processing. This leads to higher accuracy in target scattering characteristic measurement, significantly reducing the requirements for the low-scattering characteristics of the support rod and improving the accuracy of target scattering characteristic measurement. This invention is applicable to all test sites where targets are placed in electromagnetic wave irradiation areas using support rods, including various types of support methods and different types of support rods.

[0004] To achieve the above objectives, the technical solution adopted by the present invention is as follows:

[0005] A method for testing target scattering characteristics based on the pointing difference of the support structure includes the following steps:

[0006] Step 1: Determine the ground rotation angular velocity of the turntable and the ground rotation angular velocity of the low-scattering support rod based on the measurement angle range of the target to be measured and the scattering characteristics of the selected low-scattering support rod.

[0007] Step 2: Based on the ground rotation angular velocity of the turntable and the ground rotation angular velocity of the low-scattering support rod, calculate the rotation angular velocity of the low-scattering support rod relative to the turntable.

[0008] Step 3: Take the test state after the target under test is installed on the low-scattering support rod as the target test state, and the test state without the target under test as the background test state. Adjust the turntable and the low-scattering support rod to the starting angle position of the corresponding test state respectively.

[0009] Step 4: Under the target test state, control the turntable to rotate at the turntable's rotational angular velocity relative to the ground, and at the same time control the low scattering support rod to rotate at the low scattering support rod's rotational angular velocity relative to the turntable, and simultaneously collect target scattering data.

[0010] Step 5: In the target test state, when the turntable and the low-scattering support rod reach the corresponding test termination angle positions, stop the target scattering data acquisition.

[0011] Step 6: Under background test conditions, adjust the turntable and low-scattering support rod to the corresponding starting angle position for the test;

[0012] Step 7: Under background test conditions, use rotation parameters corresponding to the target test to control the turntable and low scattering support rod to rotate from the starting angle position to the ending angle position, and collect background scattering data;

[0013] Step 8: Based on the target scattering data and background scattering data, and combined with the known motion law of the low-scattering support rod during the test process and the scattering change characteristics formed by the differential motion, identify, separate or filter out the scattering components of the low-scattering support rod from the target scattering data.

[0014] Beneficial effects:

[0015] 1. Compared with the synchronous rotation test method, this invention can reduce the strong coupling scattering characteristics between the low-scattering support rod and the target at some test angles while ensuring that the electromagnetic characteristics of the test background are maintained at a low order of magnitude. It can also identify, separate and remove the scattering components of the low-scattering support rod, thereby reducing the impact of the coupling characteristics between the low-scattering support rod and the target on the test accuracy.

[0016] 2. This invention has a wide range of applications. The rotation azimuth and angular velocity can be flexibly adjusted according to the type of test target, test item, and scattering characteristics of the supporting structure, making it suitable for a variety of test items.

[0017] 3. This invention is widely applicable to various test sites that use different support methods, including but not limited to: test sites supported by a single vertical support rod, test sites supported by traditional inclined support rods, test sites supported by a combination of multiple support rods, test sites supported by a combination of support rods and suspension ropes, and all test sites that use low-scattering support rods to erect targets.

[0018] 4. This invention can replace the low-scattering support rod with different scattering characteristics for testing according to the needs of the test project, including but not limited to: different structures such as rhomboid, low-scattering structure, vertical or inclined, and low-scattering support rods made of different materials or with surface covering of absorbing material. Attached Figure Description

[0019] Figure 1 This is an isometric view of the test scenario in which the present invention uses a low-scattering support rod to support the target;

[0020] Figure 2 This is an isometric view of the test scenario in which the present invention uses two low-scattering support rods to support the target;

[0021] Figure 3 This is a top view schematic diagram of a test scenario in which the present invention uses a low-scattering support rod to support the target;

[0022] Figure 4 This is a top view schematic diagram of a test scenario in which the present invention uses two low-scattering support rods to support the target;

[0023] Figure 5 This is a schematic diagram illustrating the target pointing definition used in this invention;

[0024] Figure 6a A schematic diagram defining the orientation of the rhomboid low-scattering support rod used in this invention;

[0025] Figure 6b This is a schematic diagram defining the orientation of the jujube-shaped low-scattering support rod used in this invention;

[0026] Figure 7 A schematic diagram showing the target's initial state when supported by a low-scattering support rod;

[0027] Figure 8 A schematic diagram showing the state of the target at the end of the test when supported by a low-scattering support rod.

[0028] Figure 9 A schematic diagram showing the initial state of a background test on a low-scattering support rod.

[0029] Figure 10 A schematic diagram showing the state of a low-scattering support rod at the end of a background test.

[0030] Figure 11 A schematic diagram showing the target's initial state when supported by two low-scattering support rods;

[0031] Figure 12 A schematic diagram showing the state of the target at the end of the test when supported by two low-scattering support rods;

[0032] Figure 13 A schematic diagram showing the initial state of the background test for the two low-scattering support rods;

[0033] Figure 14 A schematic diagram showing the state of the two low-scattering support rods at the end of the background test;

[0034] Figure 15 The image shows a comparison of RCS simulations performed on the same test scenario under three conditions: no follow-up, full follow-up, and differential follow-up of the low-scattering support rod.

[0035] The attached diagram is labeled as follows: 1. Target under test, 2. Low-scattering support rod, 3. Low-scattering support rod rotation mechanism, 4. Turntable, 5. Turntable center. Detailed Implementation

[0036] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the invention. Furthermore, the technical features involved in the various embodiments of this invention described below can be combined with each other as long as they do not conflict with each other.

[0037] This invention, based on the angle range required for target testing and the low-scattering angle range of the support rod, controls the rotation range and speed of the turntable and the low-scattering support rod. By utilizing the difference between the turntable and the low-scattering support rod, the scattering components of the low-scattering support rod form a distinguishable and corresponding change pattern during the testing process. This reduces the strong coupling scattering characteristics between the low-scattering support rod and the target at certain testing angles. Consequently, in subsequent data processing, the scattering components of the low-scattering support rod can be identified, separated, and removed, reducing the impact of the coupling characteristics between the low-scattering support rod and the target on the testing accuracy.

[0038] This invention is applicable to test sites employing different support methods, and different support rods can be replaced according to the needs of the test project. For example... Figure 1 As shown, it can be applied to test scenarios where a single low-scattering support rod is used for support, and it can also be used as... Figure 2As shown, the test scenario utilizes multiple low-scattering support rods 2. A low-scattering support rod rotation mechanism 3 connects the turntable 4 and the low-scattering support rods 2. When the turntable 4 rotates, the low-scattering support rods 2 revolve around the turntable center 5 following the target. In addition to revolving, the low-scattering support rods 2 also rotate around their own rotation center with varying angular velocities. A top view of the overall structure is shown below. Figure 3 and Figure 4 As shown, electromagnetic waves are incident from the front, and the target is tested at different angles by rotating the turntable.

[0039] For ease of description and explanation, the electromagnetic wave incident direction is defined as the reference direction in this invention. The angle between the target orientation and the electromagnetic wave incident direction during the test is denoted as... That is, the rotation angle of the turntable, such as Figure 5 As shown. Clockwise rotation is defined as the positive direction. Counterclockwise rotation is recorded as negative. Therefore, in this invention, the rotation angle of the turntable is... The range is denoted as .

[0040] The low-scattering support rod is designed with structure and materials to have both low-scattering and high-scattering angle regions in the horizontal direction. In this invention, the direction of the wedge with low-scattering characteristics in the horizontal orientation of the low-scattering support rod is defined as the low-scattering support rod direction. The angle between the low-scattering support rod direction and the electromagnetic wave incident direction is denoted in this invention as... That is, the rotation angle of the low-scattering support rod, such as Figure 6a , Figure 6b As shown. The positive and negative directions of the rotation angle of the low-scattering support rod are defined in the same way as the rotation angle of the turntable, that is, clockwise rotation is recorded as positive and counterclockwise rotation as negative. Therefore, the rotatable area of ​​the low-scattering support rod during the test can be determined, that is, the rotation angle of the low-scattering support rod. The range is denoted as The maximum angle of rotation range of the low-scattering support rod. The maximum angle that the low-scattering support rod can rotate is determined under the condition that the background electromagnetic characteristics required for the test are met.

[0041] Specifically, the target scattering characteristic testing method based on the pointing difference of the support structure of the present invention includes the following steps:

[0042] Step 1: Based on the testing requirements of different targets, determine the required angle range for the target to be measured, denoted as . Based on the scattering characteristics of the selected low-scattering support rod, the maximum rotation area of ​​the low-scattering support rod is determined and denoted as... Simultaneously, based on testing requirements, the angular velocity of the turntable relative to the ground was determined. If the total time required for the turntable to complete the above measurements is... Therefore, the low-scattering support rod needs to complete a rotation relative to the ground within the corresponding angular range within the same time period. From this, the angular velocity of the low-scattering support rod relative to the ground under these operating conditions can be calculated. The calculation method is shown in the following formula:

[0043] (1)

[0044] Step 2: Reference Figure 1 or Figure 2 The low-scattering support rod and its rotating mechanism are mounted on a turntable and will revolve around the turntable's axis as the turntable rotates. This is to achieve a preset ground-relative rotational angular velocity for the low-scattering support rod. Rotation requires controlling the angular velocity of the low-scattering support rod relative to the turntable. The rotation of the low-scattering support rod relative to the turntable. The calculation method is shown in the following formula: (2)

[0045] when When, it indicates that the low-scattering support rod rotates in the opposite direction relative to the turntable; when When, it indicates that the low-scattering support rod rotates relative to the turntable in the positive direction; when When the low-scattering support rod rotates synchronously with the turntable, there is no relative rotation.

[0046] Step 3: After calculating the motion parameters of the turntable and support rod according to the requirements, the target to be tested can be installed on the low-scattering support rod, and the turntable and low-scattering support rod can be rotated to the desired positions to begin the target test; alternatively, the corresponding test can be performed in the background test state without the target to be tested installed. The following explanation uses the target test state as an example. After installing the target to be tested on the low-scattering support rod, the turntable and low-scattering support rod are first rotated to the desired positions to begin the test. and This serves as the starting state for the target test. A diagram illustrating the target test starting state is shown below. Figure 7 As shown.

[0047] Step 4: Based on the calculated angular velocity of the turntable relative to the ground... and the low-scattering support rod relative to the rotational angular velocity of the turntable The control turntable and low-scattering support rod are differentially servoed, and target data is collected.

[0048] Step 5: When the turntable and the low-scattering support rod rotate to... and At that time, the data collection work on the target is completed. A diagram illustrating the target test completion status is shown below. Figure 8 As shown.

[0049] Step 6: In the background test state, adjust the turntable and low-scattering support rod to the starting position of the corresponding test. If the background test is performed after the target test, remove the target under test from the low-scattering support rod before adjusting the turntable and low-scattering support rod to the starting position; if the background test is performed before the target test, adjust to the starting position directly without installing the target under test, i.e., the turntable and low-scattering support rod should point to... and Direction. Background test start state diagram as shown below. Figure 9 As shown.

[0050] Step 7: Under background test conditions, use the same angular velocity of the turntable relative to the ground as during the target test. The rotational angular velocity of the low-scattering support rod relative to the turntable The background was tested in the same way as the test state. Similarly, when the turntable and low-scattering support rod rotated to... and At that time, the background data collection is completed, and the background test completion status diagram is shown below. Figure 10 As shown. The order of target testing and background testing can be adjusted according to the actual testing conditions, as long as the same or corresponding test parameters and test states are used for both.

[0051] Step 8: In data post-processing, based on the target scattering data and background scattering data, and combined with the known motion patterns of the low-scattering support rod during the test and the distinguishable scattering change patterns formed by differential motion, the scattering components of the low-scattering support rod are identified, separated, and removed. The differential motion can reduce the strong coupling scattering characteristics between the low-scattering support rod and the target at certain test angles while maintaining a low background scattering level, thereby reducing the coupling relationship between the low-scattering support rod and the target and improving the target testing accuracy.

[0052] Example 1:

[0053] This embodiment uses a target passing through a compacted field test target to complete a full horizontal rotation. Taking the RCS (radar cross section) distribution characteristics as an example, the steps include:

[0054] Step 1: Based on the requirements of the test project, the range of test angles can be determined as follows: The support structure uses a low-scattering support rod to position the target in a quiet zone. The isometric schematic diagram of the arrangement is shown below. Figure 1 As shown. Assuming the low-scattering support rod for this test is of a jujube-shaped structure, the low-scattering angle range that satisfies the electromagnetic properties of the test background is... Therefore, the maximum rotation angle range of the low-scattering support rod can be obtained as follows: According to the test requirements, the target takes 6 minutes to complete one rotation. The required angular velocity of the turntable can be calculated as follows: Low-scattering support rod rotation speed about the ground angle for:

[0055] (3)

[0056] Step 2: From this, the rotational angular velocity of the low-scattering support rod relative to the turntable can be calculated. for:

[0057] (4)

[0058] If the calculation result is negative, it means that the low-scattering support rod rotates counterclockwise relative to the turntable.

[0059] Step 3: After installing the target to be tested, rotate the target to... At the same time, rotate the low-scattering support rod to ,like Figure 7 As shown;

[0060] Step 4: Control the turntable at an angular velocity The low-scattering support rod rotates synchronously with the relative rotational angular velocity of the turntable. Perform rotation and conduct target data testing.

[0061] Step 5: Continue until the turntable points to... The low-scattering support rod rotates to The test ends when the target data is tested, such as... Figure 8 As shown.

[0062] Step 6: In this embodiment, the target test is performed first, followed by the background test. In other embodiments, the background test can be performed first, followed by the target test, as long as the same or corresponding test parameters and test states are used for both tests. After removing the target from the low-scattering support rod, the turntable and the low-scattering support rod are restored to their original positions. and The initial state is maintained, and testing is conducted under the same test conditions, such as... Figure 9 As shown.

[0063] Step 7: Control the turntable and the low-scattering support rod to maintain angular velocities respectively. and the rotational angular velocity relative to the turntable The rotation continues until the turntable and low-scattering support rod reach their final positions. and The background data test for the low-scattering support rod and suspension rope without a target was completed in time, such as... Figure 10 As shown;

[0064] Step 8: In data post-processing, using the test data of the target and background, and combining the deterministically known differential motion law of the support structure, the scattering components of the low-scattering support rod are identified, separated, and removed. This differential motion can weaken the strong coupling scattering characteristics between the low-scattering support rod and the target at some test angles, reduce the coupling relationship between the low-scattering support rod and the target, and improve the accuracy of the target RCS test.

[0065] Example 2:

[0066] This embodiment uses a specific target and an outdoor far-field test field to specifically test the target's forward direction. Taking the detailed distribution characteristics of RCS within a given range as an example, the steps include:

[0067] Step 1: Based on the requirements of the test project, the range of test angles can be determined as follows: The target is positioned in a quiet zone using two diamond-shaped low-scattering support rods, as shown in the schematic diagram. Figure 2 As shown. Assuming the low-scattering support rod structure in this test is a rhomboid low-scattering structure, and its surface is covered with absorbing material, the corresponding low-scattering angle range is... Therefore, the maximum rotation angle range of the low-scattering support rod can be obtained as follows: According to the testing requirements, the target to be tested needs to rotate for 12 minutes to achieve the corresponding angle. The required angular velocity of the turntable can be calculated as follows: Low-scattering support rod rotation speed about the ground angle for:

[0068] (5)

[0069] Step 2: From this, the rotational angular velocity of the low-scattering support rod relative to the turntable can be calculated. for:

[0070] (6)

[0071] If the calculation result is negative, it means that the low-scattering support rod rotates counterclockwise relative to the turntable.

[0072] Step 3: In background test mode, first rotate the turntable to... At the same time, rotate the two support structures to ,like Figure 13 As shown;

[0073] Step 4: Control the turntable at an angular velocity The low-scattering support rod rotates synchronously with the relative rotational angular velocity of the turntable. Perform rotation and conduct background data testing.

[0074] Step 5: Continue until the turntable points to... Low-scattering support rod rotates to The test ends when the target is not detected, completing the test of the low-scattering support rod background data. Figure 14 As shown.

[0075] Step 6: After completing the background test, under the same test parameters and conditions, install the target under test onto the low-scattering support rod, and restore the turntable and low-scattering support rod to their original positions. and The initial state is maintained, and testing is conducted under the same test conditions, such as... Figure 11 As shown.

[0076] Step 7: Control the turntable and the low-scattering support rod to maintain angular velocities respectively. and the rotational angular velocity relative to the turntable The rotation continues until the turntable and low-scattering support rod reach their final positions. and Complete the test on the target data in time, such as Figure 12 As shown.

[0077] Step 8: In data post-processing, using the test data of the target and background, and combining the deterministically known differential motion law of the support structure, the scattering components of the low-scattering support rod are identified, separated, and removed. This differential motion can weaken the strong coupling scattering characteristics between the low-scattering support rod and the target at some test angles, reduce the coupling relationship between the low-scattering support rod and the target, and improve the accuracy of the target RCS test.

[0078] In this embodiment, the low-scattering support rod adopts a diamond-shaped low-scattering structure support scheme, and the surface of the low-scattering support rod is covered with a wave-absorbing material.

[0079] Example 3:

[0080] To verify the effect of the differential servoing described in this invention in reducing the coupling characteristics of the support structure, RCS simulations were conducted under three conditions—no servoing, full servoing, and differential servoing—for the same test scenario. The simulation frequency was 1 GHz, and the results are as follows: Figure 15 As shown.

[0081] like Figure 15As shown, under non-follow-motion conditions, the high-scattering region of the low-scattering support rod points towards the electromagnetic wave incident direction in some azimuth angles, resulting in a high overall scattering response of the test scene, which easily raises the test background. Under full follow-motion conditions, although background scattering in some azimuth angles is suppressed, obvious local peaks still appear at some test angles, indicating that there may be strong coupling scattering characteristics between the low-scattering support rod and the target. In contrast, the scattering response under differential follow-motion conditions is generally smoother, and the local peaks appearing under full follow-motion conditions are significantly weakened.

[0082] The simulation results above show that the differential homing method described in this invention is beneficial in maintaining a low background scattering level on the one hand, and can weaken the strong coupling scattering characteristics between the low scattering support rod and the target at some test angles on the other hand. This makes it easier for the scattering components of the low scattering support rod to form a change pattern that is easier to distinguish from the target scattering during the test, and is beneficial for the identification, separation and removal of the scattering components of the low scattering support rod in subsequent data processing.

[0083] The above description is only one of the preferred embodiments of the present invention. It should be noted that for those skilled in the art, several improvements and modifications can be made without departing from the technical principles of the present invention, and these improvements and modifications should also be considered within the scope of protection of the present invention.

Claims

1. A method for testing target scattering characteristics based on the pointing difference of the support structure, characterized in that, Includes the following steps: Step 1: Determine the ground rotation angular velocity of the turntable and the ground rotation angular velocity of the low-scattering support rod based on the measurement angle range of the target to be measured and the scattering characteristics of the selected low-scattering support rod. Step 2: Based on the ground rotation angular velocity of the turntable and the ground rotation angular velocity of the low-scattering support rod, calculate the rotation angular velocity of the low-scattering support rod relative to the turntable. Step 3: Take the test state after the target to be tested is installed on the low-scattering support rod as the target test state, and the test state without the target to be tested as the background test state. Adjust the turntable and the low-scattering support rod to the starting angle position of the corresponding test state respectively. Step 4: Under the target test state, control the turntable to rotate at the turntable's rotational angular velocity relative to the ground, and at the same time control the low scattering support rod to rotate at the low scattering support rod's rotational angular velocity relative to the turntable, and simultaneously collect target scattering data. Step 5: In the target test state, when the turntable and the low-scattering support rod reach the corresponding test termination angle positions, stop the target scattering data acquisition. Step 6: Under background test conditions, adjust the turntable and low-scattering support rod to the corresponding starting angle position for the test; Step 7: Under background test conditions, use rotation parameters corresponding to the target test to control the turntable and low scattering support rod to rotate from the starting angle position to the ending angle position, and collect background scattering data; Step 8: Based on the target scattering data and background scattering data, and combined with the known motion law of the low-scattering support rod during the test process and the scattering change characteristics formed by the differential motion, identify, separate or filter out the scattering components of the low-scattering support rod from the target scattering data.

2. The target scattering characteristic testing method based on the pointing difference of the support structure according to claim 1, characterized in that, The rotational speed of the low-scattering support rod relative to the ground angle is determined based on the measurement angle range of the target under test, the maximum allowable rotation angle range of the low-scattering support rod, and the time required for the turntable to complete the measurement.

3. The target scattering characteristic testing method based on the pointing difference of the support structure according to claim 1, characterized in that, The rotational angular velocity of the low-scattering support rod relative to the turntable is determined by the difference between the ground-oriented angular velocity of the low-scattering support rod and the ground-oriented angular velocity of the turntable.

4. The target scattering characteristic testing method based on the pointing difference of the support structure according to claim 1, characterized in that, The starting angle position of the test is determined by the starting measurement angle of the target under test and the starting pointing angle of the low scattering support rod.

5. The target scattering characteristic testing method based on the pointing difference of the support structure according to claim 1, characterized in that, The termination angle position is determined by the termination measurement angle of the target under test and the termination pointing angle of the low scattering support rod.

6. The target scattering characteristic testing method based on the pointing difference of the support structure according to claim 1, characterized in that, The low-scattering support rod has a rhomboid or jujube-shaped structure.

7. The target scattering characteristic testing method based on the pointing difference of the support structure according to claim 3, characterized in that, The positive or negative difference indicates the clockwise or counterclockwise rotation direction of the low-scattering support rod relative to the turntable, respectively.

8. The target scattering characteristic testing method based on the pointing difference of the support structure according to claim 1, characterized in that, Low-scattering support rods can be single vertical support rods, inclined support rods, multiple combined support rods, or a structure combining support rods and suspension ropes.

9. The target scattering characteristic testing method based on the pointing difference of the support structure according to claim 1, characterized in that, The surface of the low-scattering support rod is covered with a microwave-absorbing material.

10. The method for testing target scattering characteristics based on the pointing difference of the support structure according to claim 1, characterized in that, Suitable for compact field testing or outdoor far field testing.

Images