A dormant wake-up pressure test device and test method applied to a multi-in-one electric drive assembly

Abstract

The application relates to the technical field of new energy electric drive assembly control system detection, and discloses a hibernation wake-up pressure test device and a test method applied to a multi-in-one electric drive assembly, which comprises an upper computer module, a lower computer module electrically connected with the upper computer, and a standard test interface group arranged on the lower computer module. The upper computer is configured to control the lower computer to send a wake-up or hibernation instruction to a measured piece through a standard interface, monitor a response state, and trigger the lower computer to capture and return invalid site information when an exception occurs. The application can realize long-time and large-cycle wake-up and hibernation durability test, capture sudden faults and solve problems, and avoid hidden defects from flowing into mass production through the cooperative control of the upper computer and the lower computer and the standard interface design. Meanwhile, the standardized interface is suitable for different types of measured pieces, does not need to be customized into a wire harness, improves the universality of equipment, reduces test preparation time and cost, and provides an efficient and automatic test scheme for the multi-in-one electric drive assembly.

Description

Technical Field

[0001] This invention relates to the field of testing technology for new energy electric drive assembly control systems, specifically to a sleep / wake-up stress testing device and method for all-in-one electric drive assemblies. Background Technology

[0002] Currently, new energy electric drive assemblies are rapidly developing towards multi-functionality, high integration, and systematization. All-in-one electric drive assemblies integrate multiple high-voltage and low-voltage electronic control modules, such as motor controllers, DC-DC converters, on-board chargers, and power distribution units, significantly improving power density and vehicle assembly efficiency, and have become the mainstream technology solution in the industry. In actual vehicle operation, the electric drive assembly needs to frequently respond to vehicle controllers or user commands, repeatedly switching between power-on wake-up and power-off sleep states. Therefore, the stability and reliability of the sleep / wake-up mechanism directly affects core functions such as normal vehicle startup, low-voltage battery management, high-voltage safety protection, and energy consumption control. For testing the aforementioned sleep / wake-up function, existing technologies typically employ two methods: 1. During bench testing, testers manually control the on / off of power and signal circuits to simulate vehicle wake-up and sleep commands, and observe controller local area network messages or status indicator lights to determine if the system response is normal; 2. A simple automated script is written, and in conjunction with a programmable power supply and communication interface card, executes several cycles of wake-up and sleep operations at preset fixed time intervals.

[0003] However, with the continuous improvement of the integration of electric drive assemblies and the increasing complexity of control logic, the above-mentioned existing practices have gradually exposed significant technical defects: First, they are difficult to adapt to the requirements of long-term, multi-cycle durability testing, resulting in an extremely low reproducibility rate of occasional failures: Since the electric drive assembly involves multiple real-time interactive events such as high and low voltage timing matching and capacitive load pre-charging during the sleep-wake transient process, any slight timing deviation or state latching error may cause occasional failures such as wake-up failure or inability to enter sleep mode. Such faults often occur only once in hundreds or thousands of cycles. Manual monitoring or short-term script testing, limited by test duration and execution count, is almost impossible to effectively capture, leading to a large number of hidden defects entering the mass production or vehicle assembly stage. Second, in existing testing solutions, the host computer and slave computer are usually deployed separately, relying on non-standard wiring harnesses or additional adapter modules, resulting in poor versatility of the testing equipment: In existing solutions, the host computer for control logic and the slave computer for execution signal acquisition are connected to the electric drive assembly separately through dedicated interfaces and wiring harnesses. Different models of the test device often have different low-voltage signal interface definitions and control protocols. Testers have to customize wiring harnesses or add adapter circuits for each test device, increasing test preparation time and equipment costs, and reducing the versatility of the testing equipment. Summary of the Invention

[0004] The technical problem addressed by this invention is that existing technologies lack the capability to perform sufficient endurance stress testing on the sleep-wake process of electric drive assemblies. They cannot operate stably under configurable long-term, high-cycle conditions, and the separate deployment of the host and slave computers, along with reliance on non-standard wiring harnesses, results in poor versatility of the testing equipment. Therefore, this invention provides a sleep-wake stress testing device and method for all-in-one electric drive assemblies. The specific technical solution is as follows: A sleep / wake-up stress testing device for an all-in-one electric drive assembly is characterized by comprising: an upper computer module and a lower computer module. The upper computer module is used to generate test logic, process acquired data, and perform human-machine interaction. The lower computer module is electrically connected to the upper computer module and is used to execute excitation signal and command response acquisition. A standard test interface group is set in the lower computer module for connecting to the interface of the electric drive assembly under test via a single standard wiring harness. The standard test interface includes at least a CAN interface, a low-voltage power input interface, and a high-voltage power input interface. The upper computer module is configured to: control the lower computer module to send wake-up or sleep commands to the electric drive assembly under test through the standard test interface group, monitor its response status, and trigger the lower computer module to capture and transmit failure site information when an anomaly is detected.

[0005] Furthermore, the host computer module includes a human-machine interface for inputting test conditions. The test conditions include: test parameters, test personnel information, and the number of the electric drive assembly under test. The test parameters include: total number of cycles, single sleep duration range, wake-up duration, fault capture low voltage threshold, fault capture low voltage current threshold, fault capture high voltage threshold, and fault capture high voltage current threshold.

[0006] Preferably, the host computer module also includes a remote communication unit, through which fault notifications are sent out regarding the failure site information; The remote communication unit supports at least one of the following communication methods: Ethernet, WIFI, or 4G / 5G cellular networks; Fault notifications are sent in at least one of the following formats: email, instant messaging, MQTT message, or system log.

[0007] Preferably, the lower-level machine module includes: The low-voltage control unit is used to receive output signals from the host computer module and control the operation of the high-voltage drive unit; The high-voltage drive unit is electrically connected to the low-voltage control unit via a 24-pin ribbon cable to drive the electric drive assembly under test and to sample the voltage and current of the electric drive assembly under test.

[0008] Preferably, the low-voltage control unit includes: The main control MCU is used to output high or low levels according to the output signal from the host computer module. The KL30 relay is used to turn the KL30 control unit on or off. The power output unit is used to provide low-voltage power supply 1 to the low-voltage logic section of the low-voltage control unit and low-voltage power supply 2 to the high-voltage logic section of the high-voltage drive unit. Low-voltage relays are used to turn on or off the high-voltage power supply to the high-voltage drive unit and the electric drive assembly under test. The collision signal output unit is used to amplify the collision signal output from the collision signal interface and transmit it to the electric drive assembly under test.

[0009] Preferably, the high-voltage drive unit includes: The drive power supply unit is used to convert a low-voltage power supply into three asymmetrical bipolar DC power supplies, and to provide a high-voltage power supply to the electric drive assembly under test. The high-voltage control unit is used to realize the pre-charging, conduction, and active discharge of the tested electric drive assembly; High-voltage relays are used to control the conduction or disconnection of the drive power supply unit and the tested electric drive assembly based on the opening and closing status of the low-voltage relay. The high-voltage isolation sampling unit is used to sample the high-voltage input current, high-voltage input voltage, high-voltage output current, high-voltage output voltage, pre-charge resistor temperature, and discharge resistor temperature in real time.

[0010] Preferably, the drive power supply unit includes a plurality of gate drivers for amplifying the low-voltage power supply II. The gate drivers are electrically connected to a push-pull bridge for converting the low-voltage power supply II into AC power. The push-pull bridge is electrically connected to an isolation transformer, which includes a rectifier and filter circuit for converting the AC power into a bipolar DC power.

[0011] A test method based on a pressure testing device includes the following steps: a host computer module sends a wake-up command to a slave computer module; the slave computer module outputs high-voltage power to the electric drive assembly under test; the host computer module and the slave computer module respectively monitor whether the electric drive assembly under test has entered a wake-up state; when the electric drive assembly under test is in a wake-up state, a collision command is sent to the electric drive assembly under test, and the system under test outputs a fault alarm signal; when the electric drive assembly under test is in a wake-up state and the system under test outputs a fault alarm signal, the sleep-wake-up collision cycle is repeatedly executed according to a preset number of cycles, each cycle including sending a sleep command, waiting to enter a sleep state, waiting for a preset sleep duration, sending a wake-up command, sending a collision command, and reconfirming the wake-up state; when the response state does not match the expected state, the failure scene information at the time of the fault occurrence is automatically captured and sent to the host computer module, and a fault notification is sent out through the remote communication unit of the host computer module, and the sleep-wake-up collision cycle is stopped; the test result output includes at least the number of completed cycles and the failure scene information.

[0012] Preferably, the high-voltage power supply output to the tested electric drive assembly includes: when the lower-level module receives a wake-up command from the upper-level module, the main control MCU controls the conduction of the KL30 relay and KL30 PMOS through the KL30 interface of the standard test interface group via the KL30 control unit to provide low-voltage power to the low-voltage control unit and the high-voltage drive unit; when the low-voltage power supply is connected, the main control MCU controls the conduction of the KL15 PMOS through the KL15 control unit in the low-voltage control unit via the KL15 interface of the standard test interface group to output a wake-up command to the high-voltage drive unit and the tested electric drive assembly; the voltage and current of the KL30 control unit are monitored in real time through the KL30 voltage sampling and KL30 current sampling in the KL30 control unit to determine whether the high-voltage drive unit is in a wake-up state; when the high-voltage drive unit is in a wake-up state, the main control MCU controls the low-voltage relay to conduct, thereby closing the high-voltage relay, connecting the drive power supply unit and the high-voltage control unit, realizing the connection of the high-voltage circuit with the tested electric drive assembly, and monitoring the high-voltage drive.

[0013] Preferably, the high-voltage control unit includes: Three isolated gate drivers are used to open and close according to the output signal of the low-voltage control unit; The precharge MOS, main positive MOS, and discharge MOS are electrically connected to the isolation gate drive, respectively; When the isolated gate driver receives a wake-up command from the low-voltage control unit, the isolated gate driver closes the pre-charge MOS. The pre-charge MOS charges the capacitor through the pre-charge resistor until the capacitor voltage rises to 90%-95% of the battery voltage, thus completing the pre-charge. After the pre-charge is completed, the pre-charge MOS is disconnected and the main positive MOS is closed, and the tested electric drive assembly is in working condition. When the isolation gate driver receives the sleep signal output by the low-voltage control unit, the isolation gate driver disconnects the main positive MOS and closes the discharge MOS, and the tested electric drive assembly discharges through the discharge resistor.

[0014] Preferably, the host computer module and the slave computer module respectively monitor whether the tested electric drive assembly has entered the wake-up state, specifically including: The host computer module collects CAN bus data of the tested electric drive assembly in real time through the CAN interface. The CAN bus data includes CAN bus voltage and the working status of the tested electric drive assembly. The collected CAN bus data is compared with the preset wake-up data threshold. The lower-level module connects to the upper-level module through the USB interface and USB bus of the standard test interface group. The lower-level module transmits KL30 voltage sampling, KL30 current sampling, high-voltage input current, high-voltage input voltage, high-voltage output current, high-voltage output voltage, pre-charge resistor temperature, and discharge resistor temperature to the upper-level module through the USB bus. The upper-level module compares the acquired voltage and current data with the preset voltage threshold and preset current threshold in the wake-up state. When the acquired CAN bus data falls into the preset wake-up threshold, and when the acquired data falls into the preset voltage threshold and preset current threshold, the tested electric drive assembly enters the wake-up state.

[0015] Preferably, sending a collision command to the tested electric drive assembly specifically includes: By stopping the output of hard-wire collision signals to the tested electric drive assembly through the collision signal interface, or by changing the duty cycle of the hard-wire collision signal, a vehicle collision accident can be simulated. Monitoring whether the tested electric drive assembly outputs a fault alarm signal includes: When the host computer module fails to collect the fault alarm signal through the CAN bus, the tested electric drive assembly cannot detect the change in the hard wire collision signal; When the host computer module collects the fault alarm signal through the CAN bus, the tested electric drive assembly can detect the change in the hard wire collision signal.

[0016] Preferably, the preset number of loops is any integer between 1 and 1,000,000, which is configured by the user through the human-computer interaction interface of the host computer module; The conditions for determining that the tested electric drive assembly has entered a sleep state include: The monitoring showed that the voltage sampling of KL30, the current sampling of KL30, the high voltage input current of the high voltage circuit, the high voltage input voltage, the high voltage output current, the high voltage output voltage, the pre-charge resistor temperature, and the discharge resistor temperature were all below the sleep setting threshold. During the preset sleep duration, there are no active messages on the CAN interface; The preset sleep duration is either a fixed duration or a duration randomly selected from a preset duration range.

[0017] According to the test method of claim 8, the situation in S4 where the response state does not match the expected state includes: After the wake-up command was sent, the tested electric drive assembly was not detected to enter the wake-up state for more than the first preset time. After the collision command was sent, no fault alarm signal was detected from the tested electric drive assembly. After the second preset time has elapsed since the hibernation command was sent, the tested electric drive assembly has still not been detected to enter hibernation mode. Without sending any hibernation command, the tested electric drive assembly automatically exited the wake-up state.

[0018] Preferably, the failure site information includes: The data includes KL30 voltage sampling, KL30 current sampling, high voltage input current, high voltage input voltage, high voltage output current, high voltage output voltage, pre-charge resistor temperature, and discharge resistor temperature within a preset time window before and after the fault occurs. The operating status data of the host computer module within a preset time window before and after the fault occurred; A snapshot of the internal fault codes of the tested electric drive assembly at the moment the fault occurred; and The current number of test loops and the test conditions.

[0019] As can be seen from the above technical solution, the present invention has the following beneficial effects: This invention utilizes the coordinated control of a host computer module and a slave computer module, and sets up a standard test interface group including a CAN interface, a low-voltage power input interface, and a high-voltage power input interface. This enables a single standard wiring harness connection to the electric drive assembly under test, thereby improving the sleep / wake-up endurance stress testing capability. The host computer can be configured with long-duration, high-cycle wake-up / sleep command sequences, automatically monitoring the response status and capturing failure scene information by the slave computer in case of anomalies, thus discovering faults and problems and preventing hidden defects from entering mass production. Secondly, the standardized interface adapts to different models of the tested components, eliminating the need for customized wiring harnesses or adapter modules, significantly improving the versatility of the test equipment and reducing test preparation time and equipment costs. This device can stably execute transient real-time interactive event monitoring, providing an efficient and standardized automated testing solution for all-in-one electric drive assemblies. Attached Figure Description

[0020] Figure 1 This is a block diagram of the low-voltage control unit; Figure 2 This is a structural block diagram of the high-voltage drive unit.

[0021] In the diagram: 1. Host computer module; 11. Human-machine interface; 12. Remote communication unit; 13. CAN interface; 2. Sub-computer module; 2100. Low-voltage control unit; 2101. Main control MCU; 2102. Low-voltage power input interface; 2103. USB interface; 2104. KL30 interface; 2105. KL31 interface; 2106. KL15 interface; 2107. Collision signal interface; 2108. KL30 control unit; 2109. KL30 relay; 2110. KL30 PMOS; 2111. KL30 current sampling; 2112. KL30 voltage sampling; 2113. KL15 control unit; 2114. KL15 PMOS; 2115. Power output unit 2116, 5V LDO; 2117, 3V LDO; 2118, OCP; 2119, Boots; 2120, Collision Signal Output Unit; 2121, Signal Amplifier; 2122, Power Transistor; 2123, Low-Voltage Relay; 2200, High-Voltage Drive Unit; 2201, Drive Power Supply Unit; 2202, Gate Driver; 2203, Push-Pull Bridge; 2204, Isolation Transformer; 2205, High-Voltage Control Unit; 2206, Isolation Gate Driver; 2207, Precharge MOS; 2208, Main Positive MOS; 2209, Discharge MOS; 2210, High-Voltage Isolation Sampling Unit; 2220, High-Voltage Relay; 2230, High-Voltage Power Input Interface; 3, 24-PIN Ribbon Cable. Detailed Implementation

[0022] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0023] In the description of the embodiments of the present invention, it should be noted that the terms "inner", "outer", "upper", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, or the orientation or positional relationship in which the product of the invention is usually placed when in use. They are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limiting the present invention.

[0024] Example 1 like Figure 1 , Figure 2As shown, this embodiment is a sleep / wake-up stress test device applied to an all-in-one electric drive assembly. The stress test device includes: an upper computer module 1 and a lower computer module 2. The upper computer module 1 is used to generate test logic, process collected data, and perform human-machine interaction. The lower computer module 2 is electrically connected to the upper computer module 1 and is used to execute excitation signal and command response acquisition. A standard test interface group is set in the lower computer module 2 for connecting to the interface of the electric drive assembly under test through a single standard wiring harness. The standard test interface includes at least a CAN interface 13, a KL30 interface 2104 for power-on, and a KL15 interface 2106 for wake-up. The upper computer module 1 is configured to: control the lower computer module 2 to send wake-up or sleep commands to the electric drive assembly under test through the standard test interface group, monitor its response status, and trigger the lower computer module 2 to capture and transmit failure scene information when an abnormality is detected.

[0025] Specifically, the host computer module 1 uses a WinForm-developed PC host computer system. Operators set the test process and test data through the human-machine interface 11 of the host computer module 1. The host computer module 1 is equipped with a USB interface 2103, which supports two USB-CAN debugging tools: Kvaser Hybris CAN / LIN and Tongxing TC1011. It supports the CANFD standard protocol, thus forming a CAN interface 13. This interface connects to the electric drive assembly under test via the CAN bus, receiving CAN messages sent by the electric drive assembly. It then collects the corresponding operating data of the electric drive assembly executing corresponding instructions in real time and compares it with a preset wake-up data threshold. The corresponding operating data includes: the CAN bus voltage, the operating mode, speed, torque, and other operating status of the electric drive assembly when it is in wake-up state. This allows the electric drive assembly under test and the host computer module 1 to connect solely through the standard CAN bus wiring harness. Furthermore, the host computer module 1 is also equipped with another USB interface 2103, which connects to the USB bus via the CAN bus wiring harness. The upper computer module 1 is electrically connected to the lower computer module 2, enabling the upper computer module 1 to send test commands in the test logic to the lower computer module 2 sequentially. The lower computer module 2 is electrically connected to the electric drive assembly under test, specifically through low-voltage power supply harness, high-voltage power supply harness, and signal harness. This allows the electric drive assembly under test and the lower computer module 2 to be connected through standard harnesses, thereby improving the versatility of the pressure testing device. Secondly, after receiving the test command sent by the upper computer module 1, the lower computer module 2 provides or cuts off the low-voltage power supply and high-voltage power supply to the electric drive assembly under test according to the test command, thereby driving the electric drive assembly under test to execute the test command. At the same time, the lower computer module 2 monitors the voltage and current data of the electric drive assembly under test and transmits it to the upper computer module 1 to realize the data acquisition of the response status of the electric drive assembly under test.

[0026] Secondly, the working process of this embodiment includes: the host computer module 1 and the slave computer module 2 are connected via a USB bus. The slave computer module 2 is connected to the electric drive assembly under test via a standard wiring harness. The electric drive assembly under test is connected to the host computer module 1 via a CAN bus. The host computer module 1 sends a wake-up command or a sleep command to the slave computer module 2. The slave computer module 2 provides or cuts off low-voltage power and high-voltage power to the electric drive assembly under test, and sends a low-voltage signal corresponding to the command. The slave computer module 2 monitors the voltage and current of the electric drive assembly under test in real time. The electric drive assembly under test sends operating data to the host computer module 1 in real time. The electric drive assembly under test repeatedly performs cyclic testing until the number of cyclic testing cycles is reached or a fault occurs. The slave computer module 2 immediately packages the failure site information and sends it to the host computer module 1 to issue an alarm and stop the test, thus achieving stable operation under configurable long-term and large-cycle conditions.

[0027] Furthermore, the host computer module 1 includes a human-machine interface 11 for inputting test conditions. The test conditions include: test parameters, test personnel information, and the number of the electric drive assembly under test. The test parameters include: total number of cycles, single sleep duration range, wake-up duration, fault capture low voltage threshold, fault capture low voltage current threshold, fault capture high voltage threshold, and fault capture high voltage current threshold.

[0028] Specifically, the host computer module 1 provides a graphical human-machine interface 11. The human-machine interface 11 adopts a hierarchical layout and mainly includes the following areas: a test information input area, used to record test metadata, including test personnel information (such as name and employee number) and the number of the electric drive assembly under test; a test parameter setting area, used to input the test parameters for this cycle of stress test; a run control area, including buttons such as "Start Test", "Pause", "Stop", and "Data Export"; a real-time monitoring area, which displays the current low voltage / low voltage current, high voltage / current, CAN message status, etc. of the lower computer module 2 in the form of curves and values; and a recording area, used to list the number of cycles that have been completed, the commands being executed, and the faults that have occurred and the time of their occurrence. Secondly, the total number of cycles refers to the planned number of sleep / wake cycles, ranging from 1 to 1,000,000; the single sleep duration range refers to the length of time the tested drive assembly remains in sleep mode after each power outage, which can be a fixed value or have upper and lower limits; the wake-up hold time refers to the time the tested drive assembly remains in normal working mode after each wake-up, ranging from 1 to 360 seconds; the fault capture low-voltage threshold refers to the threshold at KL30 interface 2104, where a voltage below or above this threshold is considered a low-voltage power supply abnormality, such as 12V; the fault capture low-voltage current threshold refers to the current at KL30 interface 2104, where a current exceeding this value is considered a low-voltage fault. An abnormal current, such as 2A; the fault capture high voltage threshold refers to the voltage on the high-voltage side of the tested electric drive assembly exceeding this range, which is considered abnormal, such as 300V; the fault capture high voltage current threshold refers to the current on the high-voltage side of the tested electric drive assembly exceeding this current value, which is considered an abnormal high voltage current, such as 150A; among them, the voltage at KL30 interface 2104 is obtained through KL30 voltage sampling 2112, the current at KL30 interface 2104 is obtained through KL30 current sampling 2111, and the high voltage and current of the tested electric drive assembly are obtained through the high voltage isolation sampling unit 2210, and then uploaded to the host computer module 1 via the USB bus.

[0029] Furthermore, the host computer module 1 also includes a remote communication unit 12, through which fault notifications are sent out of the failure site via the remote communication unit 12; the remote communication unit 12 supports at least one of the following communication methods: Ethernet, WIFI or 4G / 5G cellular network; the fault notification is sent in at least one of the following forms: email, instant messaging, MQTT message or system log.

[0030] Specifically, the remote communication unit 12 is used to proactively send fault notifications once a fault is detected during the test, enabling unattended operation and remote alarm of the pressure testing device, thereby achieving stable operation over long periods and with a large number of cycles. Secondly, operators can configure different communication methods according to the network environment of the test site. Ethernet communication is stable and has high bandwidth, suitable for fixed test benches; WiFi deployment is flexible and suitable for temporary or mobile testing occasions; 4G / 5G cellular networks do not rely on wired or WiFi infrastructure on site, suitable for test sites without fixed network coverage. The host computer module 1 detects available network interfaces during initialization and allows operators to select the preferred communication channel through the human-machine interface 11 (a primary / backup switching strategy can be set, such as prioritizing Ethernet and automatically switching to 4G / 5G when unavailable). Secondly, when any fault occurs during the test (including but not limited to: low voltage / current exceeding the threshold, high voltage / current exceeding the threshold, CAN wake-up failure message, collision response abnormality, the speed of the tested electric drive assembly does not conform to the preset speed corresponding to the current command, etc.), the host computer module 1 immediately generates and sends a fault notification through the remote communication unit 12. In this embodiment, the notification form prioritizes instant messaging information, such as DingTalk, and sends the failure site information package file to the operator through the DingTalk API, so that the operator can receive the alarm on the mobile phone or computer as soon as possible and view the detailed data for fault analysis. This enables this embodiment to realize unattended automated testing and instant fault response. Even if the operator is not on site, he can know the abnormality and obtain the fault data as soon as possible, which significantly improves the testing efficiency and problem reproduction rate. It is especially suitable for long-term stress testing that lasts for several days or even tens of thousands of cycles.

[0031] Furthermore, the lower-level module 2 includes: a low-voltage control unit 2100, used to receive output signals from the upper-level module 1 and control the operation of the high-voltage drive unit 2200; the high-voltage drive unit 2200 is electrically connected to the low-voltage control unit 2100 via a 24-pin ribbon cable 3 to drive the electric drive assembly under test and to sample the voltage and current of the electric drive assembly under test.

[0032] Specifically, the host computer module 1 sends the corresponding output signal of the wake-up command or sleep command to the low-voltage control unit 2100 via the USB bus. The low-voltage control unit 2100 controls the high-voltage circuit of the high-voltage drive unit 2200 to switch on and off according to the output signal. When the high-voltage circuit is on, the high-voltage drive unit 2200 drives the tested electric drive assembly to enter the wake-up state. When the high-voltage circuit is off, the high-voltage drive unit 2200 drives the tested electric drive assembly to enter the sleep state. Secondly, during the process of driving the tested electric drive assembly, the high-voltage drive unit 2200 monitors the high-voltage voltage and high-voltage current of the tested electric drive assembly in real time and uploads the monitoring data to the host computer module 1 for comparison.

[0033] Further, the low-voltage control unit 2100 includes: a main control MCU 2101, used to output a high level or a low level according to the output signal of the host computer module 1; a KL30 relay 2109, used to turn on or off the KL30 control unit 2108; a power output unit 2115, used to provide low-voltage power supply one to the low-voltage logic section of the low-voltage control unit 2100 and low-voltage power supply two to the high-voltage logic section of the high-voltage drive unit 2200; a low-voltage relay 2123, used to turn on or off the high-voltage power supply of the high-voltage drive unit 2200 and the electric drive assembly under test; and a collision signal output unit 2120, used to amplify the collision signal output by the collision signal interface 2107 and transmit it to the electric drive assembly under test.

[0034] Specifically, after receiving the output signal from the host computer module 1, the main control MCU 2101 processes it and outputs a high or low level at the corresponding port. Secondly, the KL30 relay 2109 is electrically connected to a port of the main control MCU 2101. The KL30 relay 2109 and the KL30 control unit 2108 form a circuit. The KL30 control unit 2108 includes a KL30 PMOS 2110, a KL30 current sampler 2111, and a KL30 voltage sampler 2111, all connected to the KL30 relay 2109. 2; When the main control MCU2101 receives the output signal corresponding to the wake-up command, it outputs a high level at the port connected to the KL30 relay 2109, turning on the KL30 relay 2109. At the same time, it outputs a high level at the port connected to the KL30 PMOS 2110 to turn on the KL30 PMOS 2110. Then, the KL30 current sampling 2111 and KL30 voltage sampling 2112 form a loop with the external low-voltage DC power supply through the low-voltage power input interface 2102, thereby monitoring the low-voltage voltage and low-voltage current.

[0035] Secondly, the power output unit 2115 is connected to the external low-voltage DC power supply through the low-voltage power input interface 2102. The power output unit 2115 first outputs 3V3 low voltage to the main control MCU 2101 through the 5V LDO2116 (low dropout linear regulator) and 3V3 LDO2117 in sequence to realize the power supply to the low-voltage logic section. Then, after overcurrent protection and boosting to 18V, it supplies power to the high-voltage logic section of the high-voltage drive unit 2200. The high-voltage logic section is the drive power supply unit 2201, the first low-voltage power supply is 3V3 low voltage, and the second low-voltage power supply is 18V low voltage.

[0036] Secondly, the main control MCU2101 is also electrically connected to the low-voltage relay 2123. It controls the high-voltage power supply of the high-voltage drive unit 2200 and the electric drive assembly under test to be turned on or off through the high-voltage relay 2220. When the main control MCU2101 receives the output signal corresponding to the wake-up command, it controls the low-voltage relay 2123 to be turned on, and then turns on the high-voltage relay 2220 to turn on the high-voltage power supply and provide high-voltage power to the electric drive assembly under test.

[0037] Secondly, the collision signal output unit 2120 includes a signal amplifier 2121 and a power transistor 2122. The signal amplifier 2121 is electrically connected to a port of the main control MCU 2101. The main control MCU 2101 continuously outputs a normal collision signal to the collision signal output unit 2120. When the main control MCU 2101 receives a collision command sent by the host computer module 1, the main control MCU 2101 changes the duty cycle of the normal collision signal or stops outputting the normal collision signal. The abnormal collision signal with a changed duty cycle is amplified by the signal amplifier 2121, and then amplified by the power transistor 2122 and the power output unit 2115 that provides power to it. Then, the abnormal collision signal is sent to the tested electric drive assembly through the collision signal interface 2107. When the tested electric drive assembly detects the abnormal collision signal or does not detect a normal collision signal, it sends a collision message to the host computer module 1 through the CAN bus.

[0038] Furthermore, the high-voltage drive unit 2200 includes: a drive power supply unit 2201, used to convert low-voltage power supply into three asymmetrical bipolar DC power supplies, and to provide high-voltage power to the electric drive assembly under test; a high-voltage control unit 2205, used to realize the pre-charging, conduction, and active discharge of the electric drive assembly under test; a high-voltage relay 2220, used to control the conduction or isolation of the drive power supply unit 2201 and the electric drive assembly under test according to the opening and closing state of the low-voltage relay 2123; and a high-voltage isolation sampling unit 2210, used to sample the high-voltage input current, high-voltage input voltage, high-voltage output current, high-voltage output voltage, pre-charge resistor temperature, and discharge resistor temperature of the high-voltage circuit in real time.

[0039] Specifically, the drive power supply unit 2201 includes a gate driver 2202 for amplifying low-voltage power supply two. The gate driver 2202 is electrically connected to a push-pull bridge 2203 for converting low-voltage power supply two into AC power. The push-pull bridge 2203 is electrically connected to three isolation transformers 2204. Each isolation transformer 2204 includes a rectifier and filter circuit for converting AC power into bipolar DC power. In this embodiment, the isolation transformers 2204 can output three 16V / -7V bipolar DC power supplies respectively. Furthermore, the isolation transformers 2204 are connected to a high-voltage control unit 2205. The control unit 2205 includes three isolated gate drivers 2206, each connected to an isolation transformer 2204. These drivers are used to open and close according to the output signal of the low-voltage control unit 2100. When the main control MCU 2101 receives a wake-up command, the isolation transformer 2204 outputs a DC voltage of 16V. The isolated gate drivers 2206 connected to it turn on the connected MOS transistors. Simultaneously, the low-voltage relay 2123 controls the high-voltage relay 2220 to turn on, thus realizing the high-voltage circuit connection. This allows the external high-voltage power supply to be delivered to the tested electric drive assembly through the high-voltage power input interface 2230 of the drive power unit 2201. In this embodiment, the isolated gate drivers 2206 are NXP isolated drivers.

[0040] Secondly, when the main control MCU2101 receives a wake-up command, the precharge MOS2207, which is electrically connected to the isolation gate driver 2206, is turned on first, so that the high voltage power supply enters the tested electric drive assembly through the precharge resistor for precharge until the voltage of the tested electric drive assembly reaches the precharge voltage threshold (such as 80% of the working voltage). Then, the conduction MOS, which is electrically connected to another isolation gate driver 2206, is turned on, so that the high voltage power supply is connected to the tested electric drive assembly. When the main control MCU2101 receives a sleep command or a discharge command, the discharge MOS2209, which is electrically connected to the isolation gate driver 2206, is turned on, so that the internal voltage of the tested electric drive assembly is discharged through the discharge resistor.

[0041] Secondly, the high-voltage isolation sampling unit 2210 uses a resistor voltage divider to monitor the high-voltage input voltage of the high-voltage power supply and the high-voltage output voltage of the electric drive assembly under test. The high-voltage isolation sampling unit 2210 uses a shunt to monitor the high-voltage input current of the high-voltage power supply and the high-voltage output current of the electric drive assembly under test. The high-voltage isolation sampling unit 2210 uses a temperature sensor or thermistor to monitor the temperature of the pre-charge resistor and the discharge resistor.

[0042] Example 2 This second embodiment is a test method based on the first embodiment, and it includes the following steps: Step 1: The host computer module 1 sends a wake-up command to the slave computer module 2. The slave computer module 2 outputs high-voltage power to the electric drive assembly under test. The host computer module 1 and the slave computer module 2 respectively monitor whether the electric drive assembly under test has entered the wake-up state.

[0043] Furthermore, the output of high-voltage power to the tested electric drive assembly includes: when the lower-level module 2 receives a wake-up command from the upper-level module 1, the main control MCU 2101 controls the conduction of KL30 relay 2109 and KL30 PMOS 2110 through KL30 interface 2104 to provide low-voltage power to the low-voltage drive unit and high-voltage control unit 2205; when the low-voltage power is on, through the KL15 control unit 2113 in the low-voltage control unit 2100, the KL15 control unit 2113 includes KL15 PMOS 2114, and the KL15 interface 2106 is connected to a port of the main control MCU 2101, and the main control MCU 2101 outputs high-voltage power through the KL15 interface 2106. Port 2106 outputs a high level to KL15PMOS2114 to enable conduction, and outputs a wake-up command to the high-voltage drive unit 2200 and the electric drive assembly under test. The voltage and current of KL30 control unit 2108 are monitored in real time through KL30 voltage sampling 2112 and KL30 current sampling 2111 to determine whether the high-voltage drive unit 2200 is in the wake-up state. When the high-voltage drive unit 2200 is in the wake-up state, the main control MCU 2101 controls the low-voltage relay 2123 to conduct, thereby closing the high-voltage relay 2220, connecting the drive power supply unit 2201 and the electric drive assembly under test, realizing the connection between the high-voltage circuit and the electric drive assembly under test, and monitoring the input voltage and input current of the high-voltage circuit.

[0044] Furthermore, when the isolation gate driver 2206 receives a wake-up command output by the low-voltage control unit 2100, the isolation gate driver 2206 closes the pre-charge MOS 2207. The pre-charge MOS 2207 charges the capacitor of the tested electric drive assembly through the pre-charge resistor until the capacitor voltage rises to 90%-95% of the battery voltage (the operating voltage of the tested electric drive assembly), thus completing the pre-charge. After the pre-charge is completed, another isolation gate driver 2206 disconnects the pre-charge MOS 2207 and closes the main positive MOS 2208, and the tested electric drive assembly is in normal working condition. When the main control MCU 2101 receives a sleep command, the high-voltage drive unit 2200 drives another isolation gate driver 2206 to disconnect the main positive MOS 2208 and close the discharge MOS 2209. The tested electric drive assembly discharges through the discharge resistor until it is in sleep state, at which point the discharge MOS 2209 is disconnected.

[0045] Furthermore, the monitoring of whether the tested electric drive assembly enters the wake-up state by the host computer module 1 and the slave computer module 2 respectively includes: the host computer module 1 collects the CAN bus data of the tested electric drive assembly in real time through the CAN interface 13. The CAN bus data includes the CAN bus voltage and the working status of the tested electric drive assembly (such as pre-charge state, working state, sleep state). The collected CAN bus data is compared with the preset wake-up data threshold (set according to the tested electric drive assembly and production requirements); the slave computer module 2 is connected to the host computer module 1 through the USB interface 2103 and the USB bus. The voltage data from the KL30 voltage sampling 2112, the current data from the KL30 current sampling 2111, the high-voltage input current and high-voltage input voltage of the high-voltage power supply, the high-voltage output current and high-voltage output voltage of the tested electric drive assembly, the pre-charge resistor temperature, and the discharge resistor temperature are transmitted to the host computer module 1 via the USB bus. The host computer module 1 compares the acquired voltage and current data with the preset voltage threshold and preset current threshold set in the wake-up state, respectively. When the acquired CAN bus data falls into the preset wake-up threshold, and when the acquired data falls into the preset voltage threshold and preset current threshold, the tested electric drive assembly enters the wake-up state.

[0046] Step 2: With the electric drive assembly under test in the wake-up state, send a collision command to the electric drive assembly under test and monitor whether the electric control system under test outputs a fault alarm signal.

[0047] Furthermore, sending a collision command to the electric drive assembly under test specifically includes: stopping the output of hard-wire collision signals to the electric drive assembly under test through the collision signal interface 2107, or changing the duty cycle of the hard-wire collision signal to simulate a vehicle collision accident.

[0048] Furthermore, monitoring whether the tested electric drive assembly outputs a fault alarm signal includes: when the host computer module 1 does not collect a fault alarm signal through the CAN bus, the tested electric drive assembly cannot detect a change in the hard wire collision signal; when the host computer module 1 collects a fault alarm signal through the CAN bus, the tested electric drive assembly can detect a change or disappearance in the duty cycle of the hard wire collision signal.

[0049] Step 3: When the tested electric drive assembly is in the wake-up state and the tested electric control system is outputting a fault alarm signal, repeat the sleep-wake collision cycle according to the preset number of cycles. Each cycle includes sending a sleep command, waiting to enter the sleep state, waiting for the preset sleep duration, sending a wake-up command, sending a collision command, and confirming the wake-up state again.

[0050] Furthermore, the preset number of cycles is any integer between 1 and 1,000,000, which is configured by the user through the human-machine interface 11 of the host computer module 1. The conditions for determining that the tested electric drive assembly enters the sleep state include: monitoring the voltage data of KL30 voltage sampling 2112, the current data of KL30 current sampling 2111, the high-voltage input current and high-voltage input voltage of the high-voltage power supply, the high-voltage output current and high-voltage output voltage of the tested electric drive assembly, and the pre-charge resistor temperature and discharge resistor temperature being lower than the sleep setting threshold; within the preset sleep duration, there are no active messages on the CAN interface 13; the preset sleep duration is a fixed duration or a duration randomly selected from the preset duration range. The preset values ​​are all set by the operator according to the tested electric drive assembly and production requirements.

[0051] Step 4: When the response status of the tested electric drive assembly does not match the expected status set in the host computer module 1, the lower computer module 2 automatically captures the failure site information at the moment the fault occurs and sends it to the host computer module 1. It also sends a fault notification to DingTalk through the remote communication unit 12 of the host computer module 1 and stops executing the sleep-wake collision loop.

[0052] Furthermore, situations where the response state does not match the expected state include: after sending a wake-up command, if a first preset time (e.g., 0.5s) is exceeded, the tested electric drive assembly is still not detected to enter the wake-up state; after sending a collision command, if the tested electric drive assembly is not detected to immediately output a fault alarm signal; after sending a sleep command, if a second preset time (e.g., 1s) is exceeded, if the tested electric drive assembly is still not detected to enter the sleep state; or if the tested electric drive assembly exits the wake-up state on its own without sending any sleep command.

[0053] Step 5: Test Result Output: Output at least the number of completed cycles and failure site information.

[0054] Furthermore, the failure site information includes: voltage data of KL30 voltage sampling 2112 and current data of KL30 current sampling 2111 within a preset time window before and after the failure occurrence; high voltage input current and high voltage input voltage of the high voltage power supply; high voltage output current and high voltage output voltage of the tested electric drive assembly; pre-charge resistor temperature and discharge resistor temperature; operating status data of host computer module 1 within a preset time window before and after the failure occurrence; internal fault code snapshot of the tested electric drive assembly at the time of the failure occurrence; and the number of current test cycles and test conditions.

[0055] Specifically, the test conditions in this embodiment are set as follows: the total number of cycles is 10,000, the single sleep duration ranges from 15 to 35 seconds (randomly selected), the wake-up duration is 20 seconds, the fault capture low voltage threshold is 9.5V-15.5V, the fault capture low voltage current threshold is 1.8A, the fault capture high voltage threshold is 320V-380V, the fault capture high voltage current threshold is 120A, the tester information is Li Si (employee number E5678), the tested electric drive assembly number is EDS-2025-2809, the remote communication unit 12 is configured with Ethernet and 4G / 5G dual-path backup, and the fault notification is sent to DingTalk PC and DingTalk mobile terminal simultaneously.

[0056] Fault Occurrence Process: During the 8471st test cycle, the randomly generated sleep duration for this cycle was 28 seconds, and the wake-up duration was 20 seconds. In the 12th second after waking up, the KL30 voltage sampling value (2112) dropped sharply from the normal 12.3V to 9.1V, below the lower threshold of 9.5V. Upon detecting this voltage drop, the host computer determined a low-voltage power supply undervoltage fault. The lower-level module 2 and the tested electric drive assembly sent the failure information to the host computer module 1, packaged it into a file, and sent it to the DingTalk PC and DingTalk mobile terminals. Upon receiving the notification, the operator logged into DingTalk to view and analyze the data, analyze the cause of the fault, resolve the problem, and then retest until the same fault did not recur.

[0057] Although embodiments of the invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the appended claims and their equivalents.

[0058] The technologies, shapes, and structures not described in detail in this invention are all known technologies.

Claims

1. A sleep / wake-up stress testing device applied to an all-in-one electric drive assembly, characterized in that, The pressure testing device includes: The host computer module (1) and the slave computer module (2) are used to generate test logic, process collected data and human-computer interaction. The slave computer module (2) is electrically connected to the host computer module (1) and is used to execute excitation signal and instruction response acquisition. The standard test interface group set in the lower-level module (2) is used to connect to the interface of the electric drive assembly under test through a single standard wire harness. The standard test interface includes at least a CAN interface (13), a low-voltage power input interface (2102), and a high-voltage power input interface (2230). The host computer module (1) is configured to control the slave computer module (2) to send a wake-up command or a sleep command to the electric drive assembly under test through the standard test interface group, monitor its response status, and trigger the slave computer module (2) to capture and transmit the failure site information when an abnormality is detected.

2. The pressure testing device according to claim 1, characterized in that: The host computer module (1) includes a human-machine interface (11) for inputting test conditions. The test conditions include test parameters, test personnel information and the number of the electric drive assembly under test. The test parameters include total number of cycles, single sleep duration range, wake-up duration, fault capture low voltage threshold, fault capture low voltage current threshold, fault capture high voltage threshold, and fault capture high voltage current threshold.

3. The pressure testing device according to claim 2, characterized in that: The host computer module (1) also includes a remote communication unit (12), through which the failure site information is sent to the outside for fault notification; The remote communication unit (12) supports at least one of the following communication methods: Ethernet, WIFI or 4G / 5G cellular network; The fault notification is sent in at least one of the following forms: email, instant messaging, MQTT message, or system log.

4. The pressure testing device according to claim 1, characterized in that: The lower-level machine module (2) includes: The low-voltage control unit (2100) is used to receive output signals from the host computer module (1) and control the operation of the high-voltage drive unit (2200); The high-voltage drive unit (2200) is electrically connected to the low-voltage control unit (2100) via a 24-pin ribbon cable (3) to drive the electric drive assembly under test and to sample the voltage and current of the electric drive assembly under test.

5. The pressure testing device according to claim 4, characterized in that: The low-voltage control unit (2100) includes: The main control MCU (2101) is used to output a high level or a low level according to the output signal of the host computer module (1); KL30 relay (2109) is used to turn KL30 control unit (2108) on or off; The power output unit (2115) is used to provide low-voltage power supply one to the low-voltage logic section of the low-voltage control unit (2100) and low-voltage power supply two to the high-voltage logic section of the high-voltage drive unit (2200). A low-voltage relay (2123) is used to turn on or off the high-voltage power supply of the high-voltage drive unit (2200) and the electric drive assembly under test; The collision signal output unit (2120) is used to amplify the collision signal output by the collision signal interface (2107) and transmit it to the electric drive assembly under test.

6. The pressure testing device according to claim 5, characterized in that: The high-voltage drive unit (2200) includes: The drive power supply unit (2201) is used to convert the low-voltage power supply into three asymmetrical bipolar DC power supplies, and to provide high-voltage power to the electric drive assembly under test. The high-voltage control unit (2205) is used to realize the pre-charging, conduction and active discharge of the electric drive assembly under test; A high-voltage relay (2220) is used to control the conduction or disconnection of the drive power supply unit (2201) and the tested electric drive assembly according to the opening and closing state of the low-voltage relay (2123); The high-voltage isolation sampling unit (2210) is used to sample the high-voltage input current, high-voltage input voltage, high-voltage output current, high-voltage output voltage, pre-charge resistor temperature, and discharge resistor temperature of the high-voltage circuit in real time.

7. The pressure testing device according to claim 6, characterized in that: The drive power supply unit (2201) includes a plurality of gate drivers (2202) for amplifying the low-voltage power supply. The gate drivers (2202) are electrically connected to a push-pull bridge (2203) for converting the low-voltage power supply into AC power. The push-pull bridge (2203) is electrically connected to an isolation transformer (2204). The isolation transformer (2204) includes a rectifier and filter circuit for converting the AC power into the bipolar DC power.

8. A testing method based on the pressure testing device according to any one of claims 1 to 7, characterized in that, Includes the following steps: S1: The host computer module (1) sends a wake-up command to the slave computer module (2), the slave computer module (2) outputs high voltage power to the electric drive assembly under test, and the host computer module (1) and the slave computer module (2) respectively monitor whether the electric drive assembly under test enters the wake-up state; S2: When the tested electric drive assembly is in the wake-up state, send a collision command to the tested electric drive assembly and monitor whether the tested electric control system outputs a fault alarm signal; S3: When the tested electric drive assembly is in a wake-up state and the tested electric control system outputs a fault alarm signal, the sleep-wake collision cycle is repeatedly executed according to the preset number of cycles. Each cycle includes sending a sleep command, waiting to enter a sleep state, waiting for the preset sleep duration, sending a wake-up command, sending a collision command, and confirming the wake-up state again. S4: When the response state does not match the expected state, automatically capture the failure site information at the time of the fault occurrence and send it to the host computer module (1), and send the fault notification to the outside through the remote communication unit (12) of the host computer module (1), and stop executing the sleep wake-up collision loop; S5: Test result output: Output at least the number of completed cycles and the failure site information.

9. The test method according to claim 8, characterized in that: In S1, the step of outputting high-voltage power to the tested electric drive assembly includes: S11: When the lower-level module (2) receives the wake-up command from the upper-level module (1), the main control MCU (2101) controls the KL30 relay (2109) and KL30 PMOS (2110) to conduct through the KL30 interface (2104) of the standard test interface group via the KL30 control unit (2108), so as to provide low-voltage power to the low-voltage control unit (2100) and the high-voltage drive unit (2200); S12: When the low-voltage power supply is turned on, the main control MCU (2101) controls the conduction of KL15PMOS (2114) through the KL15 control unit (2113) in the low-voltage control unit (2100) via the KL15 interface (2106) of the standard test interface group, and outputs a wake-up command to the high-voltage drive unit (2200) and the electric drive assembly under test; S13: By monitoring the voltage and current of the KL30 control unit (2108) in real time through the KL30 voltage sampling (2112) and KL30 current sampling (2111) in the KL30 control unit (2108), it is determined whether the high voltage drive unit (2200) is in the wake-up state; S14: When the high-voltage drive unit (2200) is in the wake-up state, the main control MCU (2101) controls the low-voltage relay (2123) to turn on, so as to close the high-voltage relay (2220), connect the drive power supply unit (2201) and the high-voltage control unit (2205), realize the connection of the high-voltage circuit with the electric drive assembly under test, and monitor the high-voltage drive.

10. The test method according to claim 9, characterized in that: In S14, the high-voltage control unit (2205) includes: Three isolated gate drivers (2206) are used to open and close according to the output signal of the low-voltage control unit (2100); The precharge MOS (2207), main positive MOS (2208), and discharge MOS (2209) are electrically connected to the isolation gate drive (2206), respectively. When the isolation gate driver (2206) receives a wake-up command output by the low-voltage control unit (2100), the isolation gate driver (2206) closes the pre-charge MOS (2207), and the pre-charge MOS (2207) charges the capacitor through the pre-charge resistor until the capacitor voltage rises to 90%-95% of the battery voltage, thus completing the pre-charge; after the pre-charge is completed, the pre-charge MOS (2207) is disconnected, and the main positive MOS (2208) is closed, and the tested electric drive assembly is in working state; When the isolation gate driver (2206) receives the sleep signal output by the low voltage control unit (2100), the isolation gate driver (2206) disconnects the main positive MOS (2208) and closes the discharge MOS (2209), and the tested electric drive assembly discharges through the discharge resistor.

11. The test method according to claim 10, characterized in that: In S1, the monitoring of whether the tested electric drive assembly enters the wake-up state by the host computer module (1) and the slave computer module (2) respectively includes: The host computer module (1) collects the CAN bus data of the tested electric drive assembly in real time through the CAN interface (13). The CAN bus data includes the CAN bus voltage and the working status of the tested electric drive assembly. The collected CAN bus data is compared with a preset wake-up data threshold. The lower-level module (2) is connected to the upper-level module (1) through the USB interface (2103) and USB bus of the standard test interface group. The lower-level module (2) transmits the KL30 voltage sampling (2112), the KL30 current sampling (2111), the high-voltage input current, high-voltage input voltage, high-voltage output current, high-voltage output voltage, pre-charge resistor temperature and discharge resistor temperature to the upper-level module (1) through the USB bus. The upper-level module (1) compares the acquired voltage and current data with the preset voltage threshold and preset current threshold in the wake-up state. When the collected CAN bus data falls into the preset wake-up threshold, and when the acquired data falls into the preset voltage threshold and the preset current threshold, the tested electric drive assembly enters the wake-up state.

12. The test method according to claim 8, characterized in that: In S2, sending a collision command to the tested electric drive assembly specifically includes: By stopping the output of hard-wire collision signal to the tested electric drive assembly through the collision signal interface (2107), or changing the duty cycle of the hard-wire collision signal, a vehicle collision accident can be simulated. The monitoring of whether the tested electric drive assembly outputs a fault alarm signal includes: When the host computer module (1) fails to collect the fault alarm signal through the CAN bus, the tested electric drive assembly cannot detect the change in the hard wire collision signal; When the host computer module (1) collects the fault alarm signal through the CAN bus, the tested electric drive assembly can detect the change in the hard wire collision signal.

13. The test method according to claim 8, characterized in that: In S3, the preset number of cycles is any integer between 1 and 1,000,000, which is configured by the user through the human-computer interaction interface (11) of the host computer module (1); The conditions for determining that the tested electric drive assembly has entered a sleep state include: The monitoring showed that the voltage sampling (2112) and current sampling (2111) of KL30, the high voltage input current, high voltage input voltage, high voltage output current, high voltage output voltage, pre-charge resistor temperature, and discharge resistor temperature of the high voltage circuit were all below the sleep setting threshold. During the preset sleep duration, there are no active messages on the CAN interface (13); The preset sleep duration is a fixed duration or a duration randomly selected from a preset duration range.

14. The test method according to claim 8, characterized in that: In S4, the situations where the response state does not match the expected state include: If the test electric drive assembly is not detected to enter the wake-up state after the first preset time has elapsed since the wake-up command was sent; After the collision command was sent, no fault alarm signal was detected from the tested electric drive assembly. If the test electric drive assembly is not detected to enter a sleep state after the second preset time has elapsed since the sleep command was sent; Without sending any sleep command, the tested electric drive assembly automatically exits the wake-up state.

15. The test method according to claim 8, characterized in that: In S4, the failure scene information includes: KL30 voltage sampling (2112), KL30 current sampling (2111), high voltage input current, high voltage input voltage, high voltage output current, high voltage output voltage, pre-charge resistor temperature and discharge resistor temperature within a preset time window before and after the fault occurs; The operating status data of the host computer module (1) within a preset time window before and after the fault occurred; A snapshot of the internal fault codes of the tested electric drive assembly at the time of the fault occurrence; and The current number of test loops and the test conditions.

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