一种集成电路基本检测装置
By utilizing the rotation and movement structure of the integrated circuit testing device, the problems of long testing lines, low efficiency, and limited testing angle range are solved, thus achieving efficient and accurate circuit board testing.
CN122408646APending Publication Date: 2026-07-17
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Filing Date
- 2026-05-19
- Publication Date
- 2026-07-17
AI Technical Summary
Technical Problem
Existing integrated circuit testing methods suffer from problems such as low efficiency due to excessively long testing lines, difficulty in detecting the deformation location of circuit boards, and limitations in testing angle and range.
Method used
It adopts a structure including a rotating shaft, rotating platform, fixed frame, inspection frame and inspection camera, and performs integrated circuit inspection by rotation and movement. Combined with contact mechanism and traction mechanism, it realizes multi-angle photographic comparison inspection.
Benefits of technology
It improves testing efficiency, expands the testing range, and can accurately identify minute defects and deformation problems on circuit boards, thereby improving testing quality.
✦ Generated by Eureka AI based on patent content.
Smart Images
Figure CN122408646A_ABST
Abstract
本发明公开了一种集成电路基本检测装置，涉及集成电路检测技术领域。包括转动轴，所述转动轴的上端面固定连接有跟随架，所述跟随架的侧壁转动连接有固定架，所述固定架的下端面固定连接有安装架，所述跟随架的侧壁固定连接有旋转平台，所述旋转平台的上端面固定连接有多个固定板，所述固定板的一侧开设有活动槽，优点在于：通过设置旋转平台以及贴合板结构，可通过旋转的方式对电路板进行旋转检测，提高线路板检测效率的同时，配合接触板与线路板在移动过程中的滑动接触，可实现线路板变形问题的快速检测，通过放置架在旋转平台上的往复移动过程，可通过检测相机对线路板上的元器件进行多个方位的拍照对比检测，可扩大检测范围，提高检测质量。
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