Mirror facet single cone based minimum measurable rise time calibration method and system

Abstract

The present application relates to the technical field of pulse field strength metering, and discloses a minimum measurable rise time calibration method and system based on a mirror single cone, which comprises the following steps: obtaining a first rise time of a picosecond fast edge pulse signal emitted by a picosecond pulse source, a second rise time corresponding to a mirror single cone bandwidth, a third rise time corresponding to a high-bandwidth oscilloscope bandwidth, and a probe rise time measured by the high-bandwidth oscilloscope; judging whether a preset condition is met based on the first rise time, the second rise time, the third rise time and the probe rise time, wherein the preset condition comprises a time domain condition; if the first rise time, the second rise time, the third rise time and the probe rise time meet the time domain condition, then the probe rise time is determined as the minimum measurable rise time of the measured probe. The present application improves the anti-interference ability of the calibration process and the accuracy of the result, so as to ensure the universality of the measured probe application.

Description

Technical Field

[0001] This invention relates to the field of pulse field strength measurement technology, and more specifically, to a calibration method and system for the minimum measurable rise time based on a mirror single cone. Background Technology

[0002] Pulse field strength metrology is a crucial foundation for evaluating the survivability and reliability of electronic systems in strong transient electromagnetic environments such as nuclear electromagnetic pulses and lightning. Currently, the core objective of pulse field strength probe metrology is to accurately calibrate the probe's minimum measurable rise time. This parameter directly determines the probe's ability to accurately capture and reproduce nanosecond or even picosecond-level ultrafast transient electromagnetic pulse waveforms, and is a key indicator for evaluating the probe's dynamic performance and the system's effective bandwidth.

[0003] To construct a standard field device that meets the aforementioned calibration requirements, a mirrored monocone is the preferred solution due to its superior broadband characteristics. This structure radiates transverse electromagnetic waves through a metal ground plane and a single cone, making it a recommended transient electromagnetic pulse field generator in international standards. Compared to traditional devices such as TEM cells (Transverse Electromagnetic Cells), which are limited by physical size and bandwidth at high frequencies, the mirrored monocone has a near-infinite bandwidth potential within a theoretical time window.

[0004] Existing methods for measuring pulse field strength using mirror-mounted single-cone probes rely on direct comparison between the incident wave and the probe's reconstructed waveform. This method has inherent limitations: the incident waveform is distorted during transmission due to bandwidth constraints from cables, connectors, and the antenna itself, while the reconstructed waveform is susceptible to measurement noise, interference, and time-domain jitter, making precise alignment and comparison difficult. Therefore, this method has weak anti-interference capabilities, resulting in poor accuracy of the final measurement results. Summary of the Invention

[0005] In view of this, the present invention provides a method and system for calibrating the minimum measurable rise time based on a mirror single cone, so as to solve the problem of poor accuracy of the minimum measurable rise time of the probe.

[0006] In a first aspect, the present invention provides a minimum measurable rise time calibration method based on a mirrored single cone, comprising: a probe under test is mounted in a mirrored single cone device, the mirrored single cone device further comprising a mirrored single cone, a picosecond pulse source, and a high-bandwidth oscilloscope, the picosecond pulse source being used to emit a picosecond fast-edge pulse signal and form a pulse field in the mirrored single cone, the probe under test being used to measure the pulse field formed by the mirrored single cone, and the high-bandwidth oscilloscope being used to measure the probe rise time of the probe under test; the method comprising: acquiring the first rise time of the picosecond fast-edge pulse signal emitted by the picosecond pulse source, and the bandwidth corresponding to the mirrored single cone. The second rise time, the third rise time corresponding to the bandwidth of the high-bandwidth oscilloscope, and the probe rise time measured by the high-bandwidth oscilloscope are used to determine whether preset conditions are met based on the first rise time, the second rise time, the third rise time, and the probe rise time. The preset conditions include time domain conditions, which are determined based on the first rise time, the second rise time, the third rise time, and the probe rise time. If the first rise time, the second rise time, the third rise time, and the probe rise time meet the time domain conditions, then the probe rise time is determined to be the minimum measurable rise time of the probe under test.

[0007] In one optional implementation, the preset conditions further include frequency domain conditions; determining whether the preset conditions are met based on the first rise time, the second rise time, the third rise time, and the probe rise time includes: calculating the bandwidth of the mirror single-cone device based on the first rise time, the second rise time, and the third rise time; determining whether the bandwidth of the mirror single-cone device meets the frequency domain conditions, wherein the frequency domain conditions are determined based on the probe rise time; if the bandwidth of the mirror single-cone device meets the frequency domain conditions, then determining that the probe rise time is the minimum measurable rise time of the probe under test.

[0008] In one optional embodiment, the mirror single-cone device further includes a high-bandwidth monitoring probe for measuring the pulse rise time of the mirror single-cone pulse field; the method further includes: acquiring a first channel reading of a high-bandwidth oscilloscope, the first channel reading being the pulse rise time of the mirror single-cone pulse field measured by the high-bandwidth monitoring probe; obtaining a composite relationship between a first rise time, a second rise time, and a third rise time based on the pulse rise time; determining whether a time-domain condition is satisfied based on the composite relationship between the first rise time, the second rise time, and the third rise time, and the probe rise time; if the composite relationship between the first rise time, the second rise time, and the third rise time, and the probe rise time satisfy the time-domain condition, then determining that the probe rise time is the minimum measurable rise time of the probe under test.

[0009] In one optional implementation, the preset conditions further include frequency domain conditions; determining whether the frequency domain conditions are met based on the synthesis relationship of the first rise time, the second rise time, and the third rise time, as well as the probe rise time, includes: calculating the bandwidth of the mirror single-cone device based on the synthesis relationship of the first rise time, the second rise time, and the third rise time; determining whether the bandwidth of the mirror single-cone device meets the frequency domain conditions, wherein the frequency domain conditions are determined based on the synthesis relationship of the first rise time, the second rise time, and the third rise time, and the probe rise time; if the bandwidth of the mirror single-cone device and the probe rise time meet the frequency domain conditions, then the probe rise time is determined to be the minimum measurable rise time of the probe under test.

[0010] In one alternative implementation, the time-domain condition is: , in, To obtain the first rise time of the picosecond fast-edge pulse signal emitted by the picosecond pulse source. This is the second rise time corresponding to the bandwidth of the mirror-shaped single cone. This refers to the third rise time corresponding to the bandwidth of a high-bandwidth oscilloscope. This refers to the probe rise time of a high-bandwidth oscilloscope. For coefficients, .

[0011] In one alternative implementation, the frequency domain condition is: , in, For the bandwidth of the mirror single-cone device, This refers to the probe rise time of a high-bandwidth oscilloscope. is a coefficient.

[0012] In one alternative implementation, the composition relationship of the first rise time, the second rise time, and the third rise time is calculated using the following method: , in, This indicates the composition relationship between the first rise time, the second rise time, and the third rise time. This is the reading for the first channel of a high-bandwidth oscilloscope.

[0013] In one optional implementation, if the first rise time, the second rise time, the third rise time, and the probe rise time do not meet the time domain conditions, then the mirror single-cone device is determined to be unsuitable for calibrating the minimum measurable rise time of the probe under test; if the bandwidth of the mirror single-cone device and the probe rise time do not meet the frequency domain conditions, then the mirror single-cone device is determined to be unsuitable for calibrating the minimum measurable rise time of the probe under test.

[0014] In one alternative embodiment, the mirror single-cone device further includes an attenuator for monitoring the picosecond fast-edge pulse signal emitted by the picosecond pulse source.

[0015] In a second aspect, the present invention provides a minimum measurable rise time calibration system based on a mirror single cone, comprising: a mirror single cone device and a processor; wherein, the mirror single cone device is used to calibrate the minimum measurable rise time of the probe under test, and the processor is used to execute the minimum measurable rise time calibration method based on a mirror single cone as described above.

[0016] The present invention provides a minimum measurable rise time calibration method based on a mirrored single-cone. First, it obtains the theoretical rise time of the picosecond pulse source, the mirrored single-cone, and the high-bandwidth oscilloscope, along with the measured rise time of the probe, quantitatively constructing a time-domain model of the entire measurement link. This lays the foundation for objectively evaluating the error of the mirrored single-cone device. Second, it verifies the comprehensive performance of the mirrored single-cone device using preset time-domain conditions, ensuring that the response speed of the device is fast enough and the total rise time of the device is sufficiently small relative to the probe under test, allowing it to be used to calibrate the minimum measurable rise time of the probe. This fundamentally eliminates the reference distortion problem caused by transmission distortion in traditional methods. Finally, after the system performance verification is qualified, the high-bandwidth oscilloscope reading is directly identified as the minimum measurable rise time of the probe under test, completely avoiding the waveform alignment problem caused by noise and jitter in traditional methods. Overall, this method not only overcomes the two inherent defects of reference distortion and alignment error by shifting the core of calibration from error-prone waveform comparison to rigorous performance certification of the mirror single-cone device itself, but also improves the anti-interference capability of the calibration process and the accuracy of the results, thus ensuring the universality of the probe under test.

[0017] This invention starts from the essence of signal spectrum analysis, ensuring that the total bandwidth of the mirror single-cone device is large enough relative to the probe under test to fully cover the signal spectrum of the probe under test. This can be used to calibrate the minimum measurable rise time of the probe under test, thereby eliminating high-frequency signal attenuation and waveform distortion caused by the bandwidth bottleneck of the entire device in principle. This provides a solid frequency domain theoretical basis for directly reading and determining the rise time of the probe measured by the high-bandwidth oscilloscope as the minimum measurable rise time of the probe under test, improving the accuracy of the minimum measurable rise time of the calibrated probe under test, and ensuring the universality of the probe under test application.

[0018] This invention solves the cascade error caused by impedance mismatch and transmission loss by directly measuring the pulse rise time of a mirror-shaped single cone by introducing a high-bandwidth monitoring probe. Based on meeting the time domain conditions, it conducts rigorous verification by combining the rise time synthesis relationship of each component of the device. Thus, it provides a theoretical and experimental basis for directly determining the rise time of the high-bandwidth oscilloscope probe as the minimum measurable rise time of the probe under test at the time domain level. This enhances the accuracy of the minimum measurable rise time result of the mirror-shaped single cone device in probe response calibration and improves the practicality and universality of the probe under test.

[0019] This invention calculates the overall bandwidth of the mirror-cone device, which incorporates the effects of all equipment, including components and cables. This comprehensive bandwidth more accurately reflects the actual bandwidth performance of the entire device, reducing errors caused by inaccurate bandwidth measurements. It also verifies that the overall bandwidth of the mirror-cone device meets frequency domain conditions, thus ensuring that the device's response range in the frequency domain far exceeds the theoretical limit of the probe under test. Ultimately, the directly measured probe rise time is reliably determined as the probe's minimum measurable rise time. This improves the accuracy of the minimum measurable rise time of the calibrated probe under test, ensuring the universality of the probe's application. Attached Figure Description

[0020] To more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0021] Figure 1 This is a schematic diagram of the structure of a mirror single-cone device according to an embodiment of the present invention; Figure 2 This is a flowchart illustrating a minimum measurable rise time calibration method based on a mirror single cone according to an embodiment of the present invention. Figure 3 This is a flowchart illustrating another minimum measurable rise time calibration method based on a mirror single cone according to an embodiment of the present invention. Figure 4 This is a schematic diagram of another mirror-finished single-cone device according to an embodiment of the present invention; Figure 5 This is a schematic diagram of another mirror-finished single-cone device according to an embodiment of the present invention. Detailed Implementation

[0022] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0023] This embodiment provides a minimum measurable rise time calibration system based on a mirrored single cone. The system includes a mirrored single cone device and a processor. Figure 1 As shown, the mirror single-cone device includes a picosecond pulse source 1, a T-connector 2, a mirror single-cone 3, a high-bandwidth oscilloscope 4, and a probe under test 5. The picosecond pulse source 1 is connected to the mirror single-cone 3 via the T-connector 2, and the output of the probe under test 5 is connected to the input of the fourth channel of the high-bandwidth oscilloscope 4.

[0024] Picosecond pulse source 1 is used to emit picosecond fast-edge pulse signals to form a pulse field in the mirror single cone.

[0025] The mirror-finish single-cone 3 features high bandwidth within a time window for generating fast-edge pulse fields. Its main structure consists of a metal ground panel (referred to as the "mirror") and an inverted single cone (referred to as the "single cone"). For example, the single cone has a busbar length of 1.5m, a half-cone angle of 47°, and an input impedance of 50Ω. The main body of the single cone is made of aluminum through a die-casting process followed by precision machining, while the top of the cone is machined from stainless steel. The entire cone is suspended from an aluminum profile frame and secured by eight fiberglass rods at the open end of the cone. The other ends of the fiberglass rods are fixed to the aluminum profile support frame. Adjusting the fixing nuts at both ends of the eight fiberglass rods allows for leveling the cone's end face and fine-tuning its height. The mirror panel is constructed from 10mm thick aluminum plates, forming a 3m x 3m square. Aluminum profiles are used for connection and load-bearing under the seams. The single cone and mirror are connected only at the feed port in the center of the mirror via an N-type connector inner conductor. The connection structure is delicate and has a weak mechanical load-bearing capacity. Even a small installation deviation can cause the connection to break and fail. Therefore, the spatial offset at the connection between the single cone and the mirror must be strictly controlled during the installation process.

[0026] The probe under test 5 is used to measure the pulsed field formed by the mirror single cone. It is a pulsed electric field sensor to be calibrated. In this calibration system, the probe under test 5 is the object to be calibrated, and its minimum measurable rise time (i.e., the fastest electric field change rate that the probe can accurately respond to) is a key dynamic performance indicator that needs to be accurately measured in this embodiment. The output is connected to a high-bandwidth oscilloscope 4.

[0027] The high-bandwidth oscilloscope 4 is used to measure the rise time of the probe 5 under test. This rise time is the reading of the fourth channel of the high-bandwidth oscilloscope 4. For example, an Agilent DSA91204A digital oscilloscope can be used, which has 4 channels, a bandwidth of 12GHz, a maximum sampling rate of 40GSa / s, an input impedance of 50Ω, and a maximum range of ±5V.

[0028] The processor is used to execute a minimum measurable rise time calibration method based on a mirrored single cone, as described in the following embodiments.

[0029] According to an embodiment of the present invention, a method for calibrating the minimum measurable rise time based on a mirror single cone is provided. It should be noted that the steps shown in the flowchart in the accompanying drawings can be executed in a computer system such as a set of computer-executable instructions. Furthermore, although a logical order is shown in the flowchart, in some cases, the steps shown or described may be executed in a different order than that shown here.

[0030] This embodiment provides a minimum measurable rise time calibration method based on a mirror-faced single cone, which can be used in the aforementioned mobile terminals, such as mobile phones and tablets. Figure 2 This is a flowchart of the minimum measurable rise time calibration method based on a mirror-faced single cone according to an embodiment of the present invention, as follows: Figure 2 As shown, the process includes the following steps: Step S101: Obtain the first rise time of the picosecond fast-edge pulse signal emitted by the picosecond pulse source, the second rise time corresponding to the bandwidth of the mirror single cone, the third rise time corresponding to the bandwidth of the high-bandwidth oscilloscope, and the probe rise time measured by the high-bandwidth oscilloscope.

[0031] In this embodiment, the first rise time is directly taken from the nominal pulse leading edge performance specified in the picosecond pulse source technical manual, representing the ideal temporal sharpness of the excitation source. For example, the WGPULSE-100P picosecond pulse source produced by Xi'an Weiguo has a square wave waveform, a pulse width of 4ns, and a nominal rise time of 110ps. This rise time is a fixed value to reduce the requirements on the pulse generator, reduce technical difficulty, and lower costs. The second rise time is calculated from the design bandwidth of the mirror single cone 3 using a standard formula, reflecting the inherent broadening of the signal by the antenna radiation element. The third rise time is also obtained by converting the nominal analog bandwidth of the high-bandwidth oscilloscope 4, characterizing the response limitation of the measuring instrument itself. The probe rise time is the original observation value extracted directly from the output waveform of the probe 5 under test by the high-bandwidth oscilloscope 4 during actual measurement. The probe 5 under test is connected to the fourth channel of the high-bandwidth oscilloscope 4, so the reading of the fourth channel is the probe rise time measured by the high-bandwidth oscilloscope 4. These four parameters together constitute the benchmark data set for separating the dynamic performance of the probe itself from the overall system response.

[0032] Step S102: Determine whether preset conditions are met based on the first rise time, second rise time, third rise time, and probe rise time. These preset conditions include time-domain conditions, which are determined based on the first rise time, second rise time, third rise time, and probe rise time. If the first rise time, second rise time, third rise time, and probe rise time meet the time-domain conditions, proceed to step S103.

[0033] The time-domain conditions set in this embodiment are a key mathematical criterion. By analyzing the relationship between the first rise time, the second rise time, the third rise time, and the probe rise time, it is possible to quantitatively determine whether the total rise time of the entire mirror single-cone device is small enough to match and calibrate the limiting performance of the probe 5 under test. Only when the time-domain conditions are met can it be theoretically confirmed that the dynamic response error of the device itself has been compressed to an acceptable level, thus qualifying it as a benchmark platform for calibrating the probe's "minimum measurable rise time".

[0034] Step S103: Determine the probe rise time as the minimum measurable rise time of the probe under test.

[0035] In this embodiment, when the time-domain conditions are met, the rise time value directly read by the high-bandwidth oscilloscope 4 on the fourth channel can be directly identified as the minimum measurable rise time of the probe under test 5. This determination completes the reliable conversion from raw measurement data to final performance parameters, providing a core basis for the calibration and application of the probe under test 5.

[0036] The minimum measurable rise time calibration method based on a mirrored single-cone provided in this embodiment first obtains the theoretical rise time of the picosecond pulse source, the mirrored single-cone, and the high-bandwidth oscilloscope, along with the measured rise time of the probe, to quantitatively construct a time-domain model of the entire measurement link, laying the foundation for objectively evaluating the error of the mirrored single-cone device. Second, the comprehensive performance of the mirrored single-cone device is verified using preset time-domain conditions to ensure that the response speed of the mirrored single-cone device is fast enough and that the total rise time of the mirrored single-cone device is sufficiently small relative to the probe under test, thus enabling calibration of the minimum measurable rise time of the probe under test. This fundamentally eliminates the reference distortion problem caused by transmission distortion in traditional methods. Finally, after the system performance verification is qualified, the high-bandwidth oscilloscope reading is directly identified as the minimum measurable rise time of the probe under test, completely avoiding the waveform alignment problem affected by noise and jitter in traditional methods. Overall, this method not only overcomes the two inherent defects of reference distortion and alignment error by shifting the core of calibration from error-prone waveform comparison to rigorous performance certification of the mirror single-cone device itself, but also improves the anti-interference capability of the calibration process and the accuracy of the results, thus ensuring the universality of the probe under test.

[0037] like Figure 3 As shown, in step S102, when determining whether the preset conditions are met based on the first rise time, the second rise time, the third rise time, and the probe rise time, if the first rise time, the second rise time, the third rise time, and the probe rise time do not meet the time domain conditions, then step S104 is executed.

[0038] Step S104: Determine that the mirror single-cone device is not suitable for calibrating the minimum measurable rise time of the probe under test.

[0039] In this embodiment, if the first rise time, second rise time, third rise time, and probe rise time do not meet the time domain conditions, the probe rise time data obtained in this measurement is invalid and has no calibration reference value.

[0040] In one alternative implementation, if the time domain conditions are not met, any of the devices among the mirror cone, picosecond pulse source, and high-bandwidth oscilloscope can be replaced and the measurement can be repeated until the time domain conditions are met.

[0041] In some alternative implementations, the time-domain condition is: , in, To obtain the first rise time of the picosecond fast-edge pulse signal emitted by picosecond pulse source 1, This is the second rise time corresponding to the bandwidth of the mirror-shaped single cone. This refers to the third rise time corresponding to the bandwidth of a high-bandwidth oscilloscope. This refers to the probe rise time of the high-bandwidth oscilloscope 4. For coefficients, .

[0042] In some optional implementations, the preset conditions also include frequency domain conditions. In this embodiment, the preset conditions can be frequency domain conditions in addition to time domain conditions. These frequency domain conditions, based on the probe rise time, set a more stringent threshold requirement for the entire synthesized bandwidth of the mirror monocone device. Their purpose is to ensure, from the perspective of signal spectrum integrity, that the mirror monocone device can transmit and capture all high-frequency components in the output signal of the probe under test without distortion.

[0043] Furthermore, the determination of whether the preset conditions are met based on the first rise time, the second rise time, the third rise time, and the probe rise time in step S102 includes: Step S1021: Calculate the bandwidth of the mirror single-cone device based on the first rise time, the second rise time, and the third rise time.

[0044] In this embodiment, the time-domain parameters are first converted to the frequency domain, and the synthetic bandwidth of the entire mirror single cone device is calculated by the first rise time, the second and the third rise time, thus completing the quantitative evaluation of the frequency domain capability from the time domain response.

[0045] For example, the bandwidth of a mirror-faced single-cone device can be calculated as follows: , in, The bandwidth of the mirror-faced single-cone device.

[0046] Step S1022: Determine whether the bandwidth of the mirror single-cone device meets the frequency domain conditions. The frequency domain conditions are determined based on the probe rise time. If the bandwidth of the mirror single-cone device meets the frequency domain conditions, then proceed to step S1023.

[0047] In this embodiment, the bandwidth of the mirror single-cone device is obtained according to step S1021. By comparing with the frequency domain conditions, it was verified whether the frequency response range of the mirror single cone device was wide enough. From the frequency domain perspective, it was confirmed that the mirror single cone device could capture all spectral components of the signal under test from the probe without distortion.

[0048] Step S1023: Determine the probe rise time as the minimum measurable rise time of the probe under test.

[0049] In this embodiment, under the premise that the frequency domain conditions are met, the probe rise time (the reading of the fourth channel of the high-bandwidth oscilloscope 4) is finally determined to be the minimum measurable rise time of the probe 5 under test.

[0050] This embodiment starts from the essence of signal spectrum analysis, ensuring that the total bandwidth of the mirror single-cone device is large enough relative to the probe under test to fully cover the signal spectrum of the probe under test. This can be used to calibrate the minimum measurable rise time of the probe under test, thereby eliminating high-frequency signal attenuation and waveform distortion caused by the bandwidth bottleneck of the entire device in principle. This provides a solid frequency domain theoretical basis for directly reading and determining the rise time of the probe measured by the high-bandwidth oscilloscope as the minimum measurable rise time of the probe under test, improving the accuracy of the minimum measurable rise time of the calibrated probe under test, and ensuring the universality of the application of the probe under test.

[0051] In another optional implementation, when determining whether the bandwidth of the mirror single-cone device meets the frequency domain conditions in step S1022, if the bandwidth of the mirror single-cone device and the rise time of the probe do not meet the frequency domain conditions, then it is determined that the mirror single-cone device is not suitable for calibrating the minimum measurable rise time of the probe under test.

[0052] In this embodiment, when the bandwidth of the mirror single-cone device and the probe rise time do not meet the frequency domain conditions, the probe rise time data obtained in this measurement is invalid and has no calibration reference value.

[0053] In one alternative implementation, if the frequency domain conditions are not met, any of the devices among the mirror cone, picosecond pulse source, and high-bandwidth oscilloscope can be replaced and the measurement can be repeated until the frequency domain conditions are met.

[0054] In some alternative implementations, the frequency domain condition is: , in, For the bandwidth of the mirror single-cone device, This refers to the probe rise time of a high-bandwidth oscilloscope. is a coefficient.

[0055] like Figure 4 As shown, the mirror single-cone device also includes an attenuator 6. The picosecond pulse source 1 is connected to the mirror single-cone 3 and the attenuator 6 via a T-connector 2. The output of the attenuator 6 is connected to the input of the third channel of the high-bandwidth oscilloscope 4. The picosecond fast-edge pulse signal emitted by the picosecond pulse source 1 forms a pulse field in the mirror single-cone 3, and a portion of the picosecond fast-edge pulse signal enters the third channel of the high-bandwidth oscilloscope 4 after passing through the attenuator 6.

[0056] Attenuator 6 is used to monitor the picosecond fast-edge pulse signal emitted by the picosecond pulse source. This signal is only used to detect whether the output of the signal source (picosecond pulse source 1) is normal. T-connector 2 is used to simultaneously distribute the pulse source signal to both the mirror single-cone 3 and attenuator 6, while maintaining system impedance matching. For example, a T-connector with a bandwidth greater than 8.5GHz, an attenuator attenuation of 40dB, and a bandwidth of 18GHz can be used.

[0057] In some alternative implementations, such as Figure 5 As shown, the mirror single cone device also includes a high-bandwidth monitoring probe 7, which is used to measure the pulse rise time of the mirror single cone pulse field.

[0058] Because the first rise time of the picosecond fast-edge pulse signal emitted by the picosecond pulse source obtained in the above embodiments, the second rise time corresponding to the bandwidth of the mirror single cone, and the third rise time corresponding to the bandwidth of the high-bandwidth oscilloscope are affected by factors such as impedance mismatch and transmission loss in practical applications, their accuracy deviates from the theoretical model, thus limiting the accuracy of estimating the bandwidth of the mirror single cone through the three rise times and the synthesized bandwidth. Therefore, this embodiment introduces a pulse field strength probe with a sufficiently large bandwidth and a sufficiently fast rise time as the monitoring probe, i.e. Figure 5The high-bandwidth monitoring probe 7 directly measures the pulse field time-domain signal at the output end of the mirror single cone 3. This method bypasses the limitations of traditional methods that rely on the superposition of multiple time-domain parameters and are susceptible to cascade errors. By using the actual pulse rise time captured by the high-bandwidth monitoring probe 7, the true response characteristics of the mirror single cone device can be inferred, thus providing a more direct and reliable evaluation of the pulse radiation performance of the mirror single cone.

[0059] Furthermore, the minimum measurable rise time calibration method based on a mirror-like single cone provided in this embodiment of the invention also includes: Step S201: Obtain the first channel reading of the high-bandwidth oscilloscope. The first channel reading is the pulse rise time of the mirror single-cone pulse field measured by the high-bandwidth monitoring probe.

[0060] like Figure 5 As shown, one end of the high-bandwidth monitoring probe 7 is connected to the first channel of the high-bandwidth oscilloscope 4. Therefore, the reading of the first channel is the pulse rise time of the mirror single-cone pulse field measured by the high-bandwidth oscilloscope 4.

[0061] Step S202: Based on the pulse rise time, obtain the synthesis relationship between the first rise time, the second rise time, and the third rise time.

[0062] In this embodiment, the pulse rise time of the mirror single-cone pulse field measured by the high-bandwidth oscilloscope 4 is essentially a comprehensive reflection of the rise times of each device in the mirror single-cone device (picosecond pulse source 1, mirror single-cone 3, and high-bandwidth oscilloscope 4). Ignoring the bandwidth influence of the high-bandwidth monitoring probe 7, the pulse rise time and the rise time of each device satisfy the following relationship: , Therefore, we can conclude that: , in, The pulse rise time is the pulse rise time of the mirror single-cone pulse field.

[0063] Step S203: Determine whether the time domain condition is met based on the synthesis relationship of the first rise time, the second rise time, and the third rise time, as well as the probe rise time. If the synthesis relationship of the first rise time, the second rise time, and the third rise time, as well as the probe rise time, meets the time domain condition, then proceed to step S204.

[0064] The time-domain conditions in this embodiment are the same as those in step S102, and will not be repeated here. This embodiment uses the relationship between the synthesis of the first rise time, the second rise time, and the third rise time and the probe rise time to quantitatively determine whether the total rise time of the entire mirror single-cone device is small enough to match and calibrate the limiting performance of the probe 5 under test. Only when the time-domain conditions are met can it be theoretically confirmed that the dynamic response error of the device itself has been compressed to an acceptable level, thus qualifying it as a benchmark platform for calibrating the probe's "minimum measurable rise time".

[0065] Step S204: Determine the probe rise time as the minimum measurable rise time of the probe under test.

[0066] In this embodiment, when the time domain conditions are met, the rise time value directly read by the high-bandwidth oscilloscope 4 on the fourth channel can be directly identified as the minimum measurable rise time of the probe 5 under test.

[0067] This embodiment directly measures the pulse rise time of the mirror single cone by introducing a high-bandwidth monitoring probe, thus solving the cascade error caused by impedance mismatch and transmission loss. Based on meeting the time domain conditions, it rigorously verifies the rise time synthesis relationship of each component of the device, thereby providing theoretical and experimental basis for directly determining the rise time of the high-bandwidth oscilloscope probe as the minimum measurable rise time of the probe under test at the time domain level. This enhances the accuracy of the minimum measurable rise time result of the mirror single cone device in probe response calibration and improves the practicality and universality of the probe under test.

[0068] In another optional implementation, when determining whether the time domain conditions are met based on the synthesis relationship of the first rise time, the second rise time, and the third rise time, and the probe rise time in step S203, if the synthesis relationship of the first rise time, the second rise time, and the third rise time, and the probe rise time do not meet the time domain conditions, then it is determined that the mirror single cone device is not suitable for calibrating the minimum measurable rise time of the probe under test.

[0069] In this embodiment, when the synthesis relationship between the first rise time, the second rise time, and the third rise time, as well as the probe rise time, do not meet the time domain conditions, the probe rise time data obtained in this measurement is invalid and has no calibration reference value.

[0070] In one alternative implementation, if the time domain conditions are not met, any of the devices among the mirror cone, picosecond pulse source, and high-bandwidth oscilloscope can be replaced and the measurement can be repeated until the time domain conditions are met.

[0071] In some optional implementations, the preset conditions also include frequency domain conditions, which determine whether the frequency domain conditions are met based on the synthesis relationship of the first rise time, the second rise time, and the third rise time, as well as the probe rise time. This includes: Step 1: Calculate the bandwidth of the mirror single-cone device based on the synthesis relationship between the first rise time, the second rise time, and the third rise time.

[0072] This embodiment utilizes the established time-domain synthesis relationship to convert it into the corresponding frequency-domain bandwidth, thereby calculating the overall bandwidth of the entire mirror monocone device.

[0073] For example, the bandwidth of a mirror-faced single-cone device can be calculated as follows: , in, The bandwidth of the mirror-faced single-cone device.

[0074] Step 2: Determine whether the bandwidth of the mirror single-cone device meets the frequency domain conditions. The frequency domain conditions are determined based on the synthesis relationship of the first rise time, the second rise time, and the third rise time, and the probe rise time. If the bandwidth of the mirror single-cone device and the probe rise time meet the frequency domain conditions, then proceed to Step 3.

[0075] This embodiment verifies whether the frequency domain response range of the mirror single-cone device is large enough by determining whether the bandwidth of the mirror single-cone device is large enough relative to the probe under test, so as to ensure that it will not limit or significantly affect the measurement of the ultimate performance of the probe under test.

[0076] Step 3: Determine the probe rise time as the minimum measurable rise time of the probe under test.

[0077] When the above frequency domain conditions are met, it can be finally confirmed that the probe rise time actually measured by the high-bandwidth oscilloscope 4 effectively reflects the time domain response limit of the probe under test 5 itself, and therefore it can be directly determined as the minimum measurable rise time of the probe under test 5.

[0078] This embodiment calculates the overall bandwidth of the mirror-cone device. This overall bandwidth incorporates the effects of all equipment, including components and cables, providing a more accurate reflection of the actual bandwidth performance of the entire device. This reduces errors caused by inaccurate bandwidth measurements and verifies that the overall bandwidth of the mirror-cone device meets frequency domain conditions. Therefore, in the frequency domain, this ensures that the device's response range far exceeds the theoretical limit of the probe under test. Ultimately, the directly measured probe rise time is reliably determined as the probe's minimum measurable rise time. This improves the accuracy of the calibrated probe's minimum measurable rise time, ensuring the universality of the probe's application.

[0079] In another optional implementation, when determining whether the bandwidth of the mirror single-cone device meets the frequency domain conditions in step two, if the bandwidth of the mirror single-cone device and the rise time of the probe do not meet the frequency domain conditions, then it is determined that the mirror single-cone device is not suitable for calibrating the minimum measurable rise time of the probe under test.

[0080] In this embodiment, when the bandwidth of the mirror single-cone device and the probe rise time do not meet the frequency domain conditions, the probe rise time data obtained in this measurement is invalid and has no calibration reference value.

[0081] In one alternative implementation, if the frequency domain conditions are not met, any of the devices among the mirror cone, picosecond pulse source, and high-bandwidth oscilloscope can be replaced and the measurement can be repeated until the frequency domain conditions are met.

[0082] In the above embodiments, the minimum measurable rise time of the calibrated probe can be directly obtained by verifying either the time domain condition or the frequency domain condition separately.

[0083] In some alternative implementations, if the bandwidth of the mirror-faced single-cone device is satisfied... When the bandwidth of the probe under test is ≥2 times that of the probe under test, a mirror single cone with other half cone angles and other bus lengths can be used, or a pulse field strength probe of other forms or bandwidths can be used, such as an active pulse field strength probe, a ground probe, etc.; an oscilloscope with other bandwidths can also be used; or a pulse source of other types or rise times can be used, such as a Gaussian waveform pulse source, a double exponential waveform pulse source, etc.

[0084] A portion of this invention can be applied as a computer program product, such as computer program instructions, which, when executed by a computer, can invoke or provide the methods and / or technical solutions according to the invention through the operation of the computer. Those skilled in the art will understand that the forms in which computer program instructions exist in a computer-readable medium include, but are not limited to, source files, executable files, installation package files, etc. Correspondingly, the ways in which computer program instructions are executed by a computer include, but are not limited to: the computer directly executing the instructions, or the computer compiling the instructions and then executing the corresponding compiled program, or the computer reading and executing the instructions, or the computer reading and installing the instructions and then executing the corresponding installed program. Here, the computer-readable medium can be any available computer-readable storage medium or communication medium accessible to a computer.

[0085] Although embodiments of the invention have been described in conjunction with the accompanying drawings, those skilled in the art can make various modifications and variations without departing from the spirit and scope of the invention, and such modifications and variations all fall within the scope defined by the appended claims.

Claims

1. A method for calibrating the minimum measurable rise time based on a mirror-faced single cone, characterized in that, The probe under test is installed in a mirror single-cone device, which also includes a mirror single cone, a picosecond pulse source, and a high-bandwidth oscilloscope. The picosecond pulse source is used to emit a picosecond fast-edge pulse signal and form a pulse field in the mirror single cone. The probe under test is used to measure the pulse field formed by the mirror single cone, and the high-bandwidth oscilloscope is used to measure the probe rise time of the probe under test. The method includes: The first rise time of the picosecond fast-edge pulse signal emitted by the picosecond pulse source, the second rise time corresponding to the bandwidth of the mirror single cone, the third rise time corresponding to the bandwidth of the high-bandwidth oscilloscope, and the probe rise time measured by the high-bandwidth oscilloscope are obtained. Based on the first rise time, the second rise time, the third rise time, and the probe rise time, it is determined whether a preset condition is met. The preset condition includes a time domain condition, which is determined based on the first rise time, the second rise time, the third rise time, and the probe rise time. If the first rise time, the second rise time, the third rise time, and the probe rise time satisfy the time domain condition, then the probe rise time is determined to be the minimum measurable rise time of the probe under test. The time-domain condition is as follows: ， in, To obtain the first rise time of the picosecond fast-edge pulse signal emitted by the picosecond pulse source, The second rise time corresponds to the bandwidth of the single cone of the mirror. This refers to the third rise time corresponding to the bandwidth of the high-bandwidth oscilloscope. The probe rise time of the high-bandwidth oscilloscope is [value]. For coefficients, .

2. The method according to claim 1, characterized in that, The preset conditions also include frequency domain conditions; The step of determining whether a preset condition is met based on the first rise time, the second rise time, the third rise time, and the probe rise time includes: The bandwidth of the mirror single-cone device is calculated based on the first rise time, the second rise time, and the third rise time. Determine whether the bandwidth of the mirror single-cone device meets the frequency domain condition, which is determined based on the probe rise time; If the bandwidth of the mirror single-cone device satisfies the frequency domain condition, then the rise time of the probe is determined to be the minimum measurable rise time of the probe under test.

3. The method according to claim 1, characterized in that, The mirror single-cone device also includes a high-bandwidth monitoring probe, which is used to measure the pulse rise time of the mirror single-cone pulse field; The method further includes: Acquire the first channel reading of the high-bandwidth oscilloscope, wherein the first channel reading is the pulse rise time of the mirror single-cone pulse field measured by the high-bandwidth monitoring probe; The synthesis relationship between the first rise time, the second rise time, and the third rise time is obtained based on the pulse rise time; Based on the synthesis relationship between the first rise time, the second rise time, and the third rise time, as well as the probe rise time, it is determined whether the time domain condition is met; If the combination of the first rise time, the second rise time, and the third rise time, as well as the probe rise time, satisfies the time domain condition, then the probe rise time is determined to be the minimum measurable rise time of the probe under test. The composition relationship between the first rise time, the second rise time, and the third rise time is calculated using the following method: ， in, This indicates the composition relationship between the first rise time, the second rise time, and the third rise time. This is the reading of the first channel of the high-bandwidth oscilloscope.

4. The method according to claim 3, characterized in that, The preset conditions also include frequency domain conditions; Based on the synthesis relationship between the first rise time, the second rise time, and the third rise time, and the probe rise time, it is determined whether the frequency domain condition is met, including: The bandwidth of the mirror single-cone device is calculated based on the combined relationship between the first rise time, the second rise time, and the third rise time. Determine whether the bandwidth of the mirror single-cone device meets the frequency domain condition, which is determined based on the synthesis relationship of the first rise time, the second rise time, and the third rise time, and the rise time of the probe; If the bandwidth of the mirror single-cone device and the rise time of the probe satisfy the frequency domain condition, then the rise time of the probe is determined to be the minimum measurable rise time of the probe under test.

5. The method according to claim 2 or 4, characterized in that, The frequency domain condition is: ， in, The bandwidth of the mirror-like single-cone device is [missing information]. The probe rise time of the high-bandwidth oscilloscope is [value]. is a coefficient.

6. The method according to claim 4, characterized in that, If the first rise time, the second rise time, the third rise time, and the probe rise time do not meet the time domain conditions, then the mirror single cone device is determined to be unsuitable for calibrating the minimum measurable rise time of the probe under test. If the bandwidth of the mirror single-cone device and the rise time of the probe do not meet the frequency domain conditions, then the mirror single-cone device is determined to be unsuitable for calibrating the minimum measurable rise time of the probe under test.

7. The method according to claim 1, characterized in that, The mirror-shaped single-cone device further includes an attenuator, which is used to monitor the picosecond fast-edge pulse signal emitted by the picosecond pulse source.

8. A minimum measurable rise time calibration system based on a mirror-faced single cone, characterized in that, include: A mirror-faced single-cone device and a processor; wherein the mirror-faced single-cone device is used to calibrate the minimum measurable rise time of the probe under test, and the processor is used to execute the minimum measurable rise time calibration method based on a mirror-faced single-cone as described in any one of claims 1-7.

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