面板纹理走势表征方法、装置和设备
By obtaining the fitted response tensor of the display panel image region, a sparse data structure is constructed using sparse sampling and joint neighborhood peak filtering methods. This solves the problem of accurate localization of the Mura phenomenon in the display panel and improves the efficiency and accuracy of texture trend.
CN122415443APending Publication Date: 2026-07-17ZHONGJIA MICROVISION (SHENZHEN) SEMICONDUCTOR TECHNOLOGY CO LTD
View PDF 0 Cites 0 Cited by
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-03-18
- Publication Date
- 2026-07-17
Smart Images
Figure CN122415443A_ABST
Abstract
本公开实施例提供的面板纹理走势表征方法、装置和设备，包括：获取目标图像中各图像区域所对应的拟合响应张量；根据稀疏采样策略从各图像区域所对应的拟合响应张量中筛出候选集合；根据联合邻域峰值筛选方法，从候选集合中筛选出各图像区域所对应的稀疏数据结构；根据集合编码器对各图像区域所对应的稀疏数据结构进行建模，得到面板纹理走势表征向量。提高确定面板纹理走势的效率和准确性。
Need to check novelty before this filing date? Find Prior Art