基于三维模型重投影的结构缺陷识别装置及识别方法

By using 3D model reprojection and small sample recognition technology, the images of UAV inspections are unified onto the surface of the 3D structural model for comparison, which solves the problems of geometric consistency and environmental interference across UAV inspections, and realizes high-precision, robust structural defect identification and digital management.

CN122415618APending Publication Date: 2026-07-17SHENZHEN UNIV
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
SHENZHEN UNIV
Filing Date
2026-06-17
Publication Date
2026-07-17

AI Technical Summary

Technical Problem

In existing technologies, when UAVs inspect large structures, there are problems such as poor geometric consistency across flights, scarce defect samples, severe interference from complex environments, and lack of spatial correlation in the identification results. These problems result in low accuracy and poor robustness in structural defect identification, making it difficult to achieve efficient and digital management.

Method used

By acquiring a three-dimensional model of the structure and a health baseline image, and using pose restoration and reprojection techniques, the inspection images are unified onto the surface of the three-dimensional model for comparison. Combined with a small sample recognition model, the precise location and type of defects can be identified.

Benefits of technology

It achieves high-precision structural defect identification, improves automation and digitalization levels, can stably identify minute defects in complex environments, and directly associates the identification results with three-dimensional spatial location, supporting the digital management of infrastructure.

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Abstract

本发明涉及基于三维模型重投影的结构缺陷识别装置及识别方法。识别方法包括,获取目标结构的三维模型,目标结构在健康状态下的健康基准图像,健康基准图像已预先投影至三维模型表面;获取无人机对目标结构巡检的当前巡检图像;提取当前巡检图像中的图像特征,根据三维模型生成投影特征,将图像特征与投影特征匹配,依匹配结果恢复拍摄当前巡检图像无人机相机位姿;根据恢复的相机位姿,将当前巡检图像重投影至三维模型表面,生成当前重投影图像;将当前重投影图像与健康基准图像在同一模型坐标系下配准比对,生成差异图,依差异图确定疑似缺陷候选区域;对疑似缺陷候选区域进行缺陷识别,输出缺陷识别结果,将缺陷识别结果标注至三维模型上。
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