A network card communication link quality test parameter determination method, device and medium

Abstract

The application provides a network card communication link quality test parameter determination method, device and medium, the method comprises the following steps: determining a second module information group according to test link module information of a to-be-tested optical module; determining a target parameter value range of each test parameter according to a global parameter value range of each test parameter and a mean value and a standard deviation of each test parameter of the second module information group; combining an optional parameter value in each target parameter value range to obtain a plurality of test parameter value groups; performing communication link quality test on the to-be-tested optical module to obtain a corresponding bit error rate fluctuation ratio; deleting a test parameter value group with a bit error rate fluctuation ratio greater than a fluctuation ratio threshold, and determining the remaining as a key parameter value group; and determining a key parameter value group representing the minimum bit error rate as a target parameter value group, so as to reduce the value range of the test parameter value and improve the test efficiency of the communication link quality test.

Description

Technical Field

[0001] This invention relates to the field of network interface card (NIC) communication testing, and in particular to a method, device, and medium for determining NIC communication link quality test parameters. Background Technology

[0002] PRBS (Pseudo-Random Binary Sequence) is a highly efficient and standardized physical layer test signal widely used for link verification and signal integrity analysis in high-speed network devices (such as network interface cards (NICs) and switches). By directly connecting the NIC to or through a switch, hardware link problems can be quickly located, ensuring stable system operation under high bandwidth and low bit error rate (BER). It is typically used for connectivity verification before service activation (quickly verifying whether devices at both ends can communicate normally before a new network or link is established, such as assessing signal integrity and transmission reliability by detecting the connectivity of the communication link through BER), fault location and delimitation (when service interruptions or quality degradation occur, PRBS testing is used to check segment by segment (whether the BER is below a threshold) to determine whether the problem lies within the device or on the transmission line), and long-term link quality monitoring (periodic PRBS testing to monitor the BER trend of the link and prevent potential faults). When performing PRBS testing (i.e., communication link quality testing), a test environment needs to be set up and test parameters configured to test the BER of the communication link of the optical module connected to the NIC under different test parameters.

[0003] Existing PRBS testing methods for network cards typically pre-define a large global range for each test parameter (equalization parameters used for signal integrity in high-speed serial links), and then randomly select a parameter value from the global range for combined testing to obtain the bit error rate of that parameter combination in this test. The quality of the communication link is judged by the magnitude of the bit error rate. However, this method of traversing all parameter values ​​for testing requires too much workload, and for different types of optical modules, some parameter values ​​in the full set of parameters may not be compatible with the communication link test of that optical module. If staff have to manually test and eliminate these, it is very time-consuming, resulting in low testing efficiency. Summary of the Invention

[0004] To address the aforementioned technical problems, the technical solution adopted by this invention is as follows: According to one aspect of this application, a method for determining network interface card (NIC) communication link quality test parameters is provided, comprising: Step S100: In response to the connection between the optical module under test and the network card, determine the second module information group from several preset first module information groups based on the test link module information corresponding to the optical module under test; the first module information group includes preset test link module information corresponding to the optical module. Step S200: Determine the target parameter value range for each test parameter based on the preset global parameter value range corresponding to each test parameter and the mean and standard deviation of each test parameter corresponding to the second module information group. Step S300: Select any parameter value from the target parameter value range corresponding to each test parameter, and combine the selected parameter values ​​for each test parameter to obtain several test parameter value groups; any test parameter value group includes the parameter value corresponding to each test parameter. Step S400: Based on any set of test parameter values, perform a preset number of communication link quality tests on the optical module to be tested to obtain the bit error rate corresponding to each communication link quality test performed by the set of test parameter values. Step S500: Among all the bit error rates corresponding to the test parameter value group, the ratio of the largest bit error rate to the smallest bit error rate is determined as the bit error rate fluctuation ratio corresponding to the test parameter value group. Step S600: Delete the test parameter value groups in a number of test parameter value groups whose corresponding bit error rate fluctuation ratio is greater than the preset fluctuation ratio threshold, and determine the remaining test parameter value groups as key parameter value groups; Step S700: Among several key parameter value groups, the key parameter value group corresponding to the smallest bit error rate is determined as the target parameter value group corresponding to the optical module to be tested; the bit error rate is the bit error rate with the largest value among all the bit error rates corresponding to the key parameter value group.

[0005] According to another aspect of this application, a non-transitory computer-readable storage medium is provided, wherein the storage medium stores at least one instruction or at least one program, wherein the at least one instruction or the at least one program is loaded and executed by a processor to implement the aforementioned method for determining network interface card communication link quality test parameters.

[0006] According to another aspect of this application, an electronic device is provided, including a processor and the aforementioned non-transitory computer-readable storage medium.

[0007] The present invention has at least the following beneficial effects: In the method for determining network interface card (NIC) communication link quality test parameters of the present invention, when the optical module under test is connected to the NIC, based on the test link module information corresponding to the optical module under test, a second module information group similar to the module information of the optical module under test is determined from several preset first module information groups. Then, based on the preset global parameter value range corresponding to each test parameter and the mean and standard deviation of each test parameter corresponding to the second module information group, a target parameter value range corresponding to each test parameter is determined. The parameter values ​​for link quality testing of the optical module under test are then determined from the target parameter value range. A parameter value is randomly selected from the target parameter value range corresponding to the test parameter. The selected parameter values ​​for each test parameter are combined to obtain several test parameter value groups. A communication link quality test is performed on each test parameter value group. Based on any given test parameter value group, a preset number of communication link quality tests are conducted on the optical module under test to obtain the bit error rate (BER) corresponding to each communication link quality test for that test parameter value group. The ratio of the highest BER to the lowest BER among all the BER values ​​corresponding to that test parameter value group is then determined as the BER fluctuation ratio corresponding to that test parameter value group. The stability of the bit error rate (BER) obtained from the test parameter value set is determined by the BER fluctuation ratio. Test parameter value sets with BER fluctuation ratios greater than a preset threshold are deleted, and the remaining sets are designated as key parameter value sets. This ensures that the stability of the subsequently determined optimal test parameter value set meets preset requirements. Finally, the key parameter value set with the smallest BER (the highest BER value among all BER values ​​in the key parameter value set) is determined as the target parameter value set for the optical module under test. By processing the global parameter value range corresponding to each test parameter and the mean and standard deviation of each test parameter in the determined second module information set, the target parameter value range of each test parameter is made smaller than the corresponding global parameter value range. This narrows the range of test parameter values, reduces the data processing volume of communication link quality testing, and improves the testing efficiency. Furthermore, using the BER fluctuation ratio to determine the stability of the corresponding test parameter value set reduces noise interference, avoids selecting test parameter value sets as locally inferior solutions, and improves the testing stability of communication link quality testing. Attached Figure Description

[0008] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0009] Figure 1A flowchart illustrating the method for determining network interface card (NIC) communication link quality test parameters according to an embodiment of the present invention. Detailed Implementation

[0010] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0011] This application proposes a method for determining network interface card (NIC) communication link quality test parameters, such as... Figure 1 As shown, it includes: Step S100: In response to the connection between the optical module under test and the network card, determine the second module information group from several preset first module information groups according to the test link module information corresponding to the optical module under test. The optical module to be tested is the optical module that needs to undergo PRBS link communication quality testing.

[0012] The test link module information includes module type identifier (type identifier of the optical module under test), module manufacturer identifier (manufacturer identifier of the optical module under test), link communication rate mode (communication rate of the optical module under test), and ambient temperature value during operation (temperature value of the environment in which the optical module under test is located when the optical module under test is communicating).

[0013] The first module information group includes the test link module information corresponding to the preset optical module, including the module type identifier, module manufacturer identifier, link communication rate mode, and test temperature range corresponding to the preset optical module.

[0014] Several first module information groups and the parameter value with the lowest bit error rate for each test parameter at each temperature value within the test temperature range corresponding to each first module information group are stored in a preset parameter library.

[0015] The test parameters include the parameters corresponding to the receiving end of the communication link (rx lte) and the parameters corresponding to the sending end (ffepre2, ffe pre1, ffe main, ffe post1).

[0016] The first module information group contains pre-determined test link module information for several optical modules. The testers pre-select several optical modules as initial modules, and then perform PRBS link communication quality tests on each initial module under preset link communication rate modes and ambient temperature values ​​(selecting one parameter value from the global range of each test parameter as the corresponding test parameter value to form a test parameter group). This yields the bit error rate (BER) for each test parameter group of the initial module under each preset link communication rate mode and each preset ambient temperature value. Rate (the ratio of error bits to total transmitted bits) is used to determine the optimal parameter set for the initial module under the same link communication rate mode and ambient temperature value. This optimal parameter set is then used to determine the optimal parameter set for the initial module under the same link communication rate mode and ambient temperature value. Subsequently, the optimal parameter sets for the initial module under the same link communication rate mode and a range of consecutive ambient temperature values ​​(e.g., 30°C to 40°C) are all determined as the test parameters corresponding to the first module information set (which includes the module type identifier and module manufacturer identifier corresponding to the initial module, the link communication rate mode used for testing the initial module, and the test temperature range for a range of consecutive ambient temperature values).

[0017] Therefore, each first module information group corresponds to a test temperature range, and each test temperature range corresponds to several test parameter groups (each test temperature has a corresponding test parameter group).

[0018] Furthermore, step S100 includes steps S110-S150: Step S110: In response to the connection between the optical module under test and the network card, obtain the test link module information corresponding to the optical module under test; Step S120: Obtain several preset first module information groups; Step S130: If the module type identifier included in any first module information group is the same as the module type identifier corresponding to the optical module to be tested, then the first module information group is determined as the pending module information group, and step S150 is executed. If all the module type identifiers included in the first module information group are different from the module type identifiers corresponding to the optical module under test, then proceed to step S140. Step S140: Traverse each first module information group. If the module manufacturer identifier included in any first module information group is the same as the module manufacturer identifier corresponding to the optical module under test, and the link communication rate mode included in the first module information group is the same as the link communication rate mode corresponding to the optical module under test, then the first module information group is determined as the pending module information group, and step S150 is executed. Furthermore, step S140 also includes steps S141-S144: Step S141: If the module manufacturer identifier or link communication rate mode included in all the first module information groups is different from the module manufacturer identifier or link communication rate mode corresponding to the optical module under test, then obtain the communication cable length corresponding to the optical module under test. Step S142: Based on the link communication rate mode corresponding to the optical module under test, the ambient temperature value during operation, and the communication cable length, determine the first information list A=(A1,A2,A3,A4); where A1 is the communication rate of the link communication rate mode corresponding to the optical module under test; A2 is the ambient temperature value corresponding to the optical module under test during operation; A3 is the ambient temperature value corresponding to the optical module under test during operation; and A4 is the communication cable length corresponding to the optical module under test. Step S143: Based on the link communication rate mode, test temperature range, and communication cable length of the optical module corresponding to each first module information group, determine several second information lists B1, B2, ..., B j ,...,B m Where j=1,2,...,m; m is the number of information groups in the first module; B j This is the second information list corresponding to the j-th first module information group; B j =(B j1 B j2 B j3 B j4 ); B j1 B represents the communication rate of the link communication rate mode of the optical module corresponding to the j-th first module information group; j2 B represents the maximum temperature value within the test temperature range of the optical module corresponding to the j-th first module information group; j3 B is the minimum temperature value within the test temperature range of the optical module corresponding to the j-th first module information group; j4 The length of the communication cable for the optical module corresponding to the j-th first module information group; Step S144: If the first information list A and the second information list B... j If the cosine similarity is greater than the preset similarity threshold, then the j-th first module information group is determined as the pending module information group, and step S150 is executed.

[0019] Step S150: Traverse each pending module information group. If the ambient temperature value of the optical module to be tested during operation is within the test temperature range included in any pending module information group, then the pending module information group is determined as the second module information group.

[0020] Based on the compatibility between the test link module information corresponding to the optical module under test and each first module information group, a second module information group is determined from several first module information groups. The first module information group with the highest compatibility with the test link module information is determined as the second module information group, so as to narrow down the selection range of test parameters.

[0021] Step S200: Determine the target parameter value range for each test parameter based on the preset global parameter value range corresponding to each test parameter and the mean and standard deviation of each test parameter corresponding to the second module information group. Each test parameter corresponds to a global parameter value range. For example, the global parameter value range of test parameter ffe post1 is [0,7], which means that any value in this global parameter value range is selected as the test parameter value of test parameter ffe post1.

[0022] Furthermore, step S200 includes steps S210-S230: Step S210: Obtain the preset global parameter value range corresponding to each test parameter to obtain a global parameter value range list C=(C1,C2,...,C...). i ,...,C n ); where i = 1, 2, ..., n; n is the number of test parameters; C i C represents the preset global parameter value range corresponding to the i-th test parameter; i =[C i1 C i2 ];C i1 C represents the minimum value within the global parameter value range corresponding to the i-th test parameter. i2 This represents the maximum value within the global parameter value range corresponding to the i-th test parameter. Step S220: Obtain the parameter value with the lowest bit error rate for each temperature value within the test temperature range corresponding to the information group of the second module for each test parameter, to obtain a list of several parameter values ​​D1, D2, ..., D i ,...,D n ; where D i This is a list of parameter values ​​corresponding to the i-th test parameter; D i =(D i1 D i2 ,...,D ip ,...,Diq ); p=1,2,...,q; q is the number of temperature values ​​within the test temperature range corresponding to the second module information group; D ip The parameter value with the lowest bit error rate for the i-th test parameter under the p-th temperature value within the test temperature range corresponding to the second module information group; Step S221, if F i2 If the value is greater than the preset standard deviation threshold, then the target parameter value range corresponding to the i-th test parameter is determined to be [F]. i1 -1,F i1 +1]; otherwise, proceed to step S230; F i1 D i1 D i2 ,...,D ip ,...,D iq The mean of F; i2 D i1 D i2 ,...,D ip ,...,D iq Standard deviation; Step S230: Determine the target parameter value range corresponding to the i-th test parameter as [E]. i1 E i2 ]; Among them, E i1 E represents the minimum value within the range of target parameter values ​​corresponding to the i-th test parameter. i2 The maximum value within the range of target parameter values ​​corresponding to the i-th test parameter; E i1 =MAX(C i1 ,round(F i1 -2×F i2 MAX() is the default function for determining the maximum value; round() is the default function for rounding. E i2 =MIN(C i2 ,round(F i1 +2×F i2 MIN() is a preset function to determine the minimum value.

[0023] If F i2 If the value is greater than the preset standard deviation threshold, it indicates that the i-th test parameter is not sensitive to the optical module. Therefore, the target parameter value range for the i-th test parameter is set to [F]. i1 -1,F i1 +1], otherwise, determine the target parameter value range corresponding to the i-th test parameter as [E]. i1 E i2This further narrows down the range of parameter values ​​selected for each test parameter, eliminating the need for a full traversal test within the global parameter value range for each test parameter. Instead, a full traversal test is only required within the determined target parameter value range, thus improving the testing efficiency of subsequent PRBS tests.

[0024] Step S300: Select any parameter value from the target parameter value range corresponding to each test parameter, and combine the selected parameter values ​​for each test parameter to obtain several test parameter value groups; Each test parameter value group includes the parameter value corresponding to each test parameter.

[0025] Furthermore, step S300 includes steps S310-S320: Step S310, from [E] i1 E i2 Choose any one of the parameter values ​​from the list as the test parameter value G corresponding to the i-th test parameter. i ; Step S320: Determine the test parameter value group as (G1, G2, ..., G i ,...,G n ).

[0026] The test parameter value group is the parameter value group corresponding to (ffe pre2, fff pre1, fff main, fff post1, rx lte), which is n=5 in step S320. The first parameter value G1 in the test parameter value group is the test parameter value of test parameter fff pre2, the second parameter value G2 is the test parameter value of test parameter fff pre1, the third parameter value G3 is the test parameter value of test parameter fff main, the fourth parameter value G4 is the test parameter value of test parameter fff post1, and the fifth parameter value G5 is the test parameter value of test parameter rx lte.

[0027] Step S400: Based on any set of test parameter values, perform a preset number of communication link quality tests on the optical module to be tested to obtain the bit error rate corresponding to each communication link quality test performed by the set of test parameter values. Communication link quality testing, also known as PRBS testing, can be found in the existing PRBS testing procedures for its specific testing process.

[0028] As a feasible implementation, the preset number of tests is 3, meaning that three communication link quality tests are performed on each set of test parameter values. This repeated testing based on the same parameters improves the stability of the final bit error rate. Most traditional communication link quality tests perform one test for each set of test parameter values, then select the test parameter set with the lowest bit error rate among several sets of test parameter values ​​as the optimal parameter set for subsequent tests. However, this method has a problem: the bit error rate fluctuates, is susceptible to noise interference, and may select a locally inferior solution. For example, if a certain set of test parameter values ​​is tested during a communication link quality test... During the quality test, the obtained bit error rate was extremely low. However, the bit error rate of this set of test parameter values ​​is relatively high in most communication link quality tests. It just so happens that the bit error rate is low in this particular communication link quality test. According to the traditional method of selecting test parameters, this set of test parameter values ​​would be selected as the optimal parameters. However, this set of test parameter values ​​has large fluctuations and is unstable, so it is not suitable as the optimal parameters. Therefore, this application performs multiple communication link quality tests on the same set of test parameter values, and then processes the bit error rate obtained from the multiple communication link quality tests to ensure that the subsequent target parameter value set has high stability.

[0029] Step S410: If (G1, G2, ..., G...) i ,...,G n If the lowest bit error rate among all the corresponding bit error rates is lower than the historical lowest bit error rate of the i-th test parameter, then the parameter value with the lowest bit error rate of the i-th test parameter in the parameter library at the ambient temperature value corresponding to the second module information group is replaced with G. i ; If the minimum bit error rate obtained in this communication link quality test is lower than the historical minimum bit error rate stored in the parameter library for this test parameter, then the minimum bit error rate in the parameter library will be replaced to improve the parameter library and dynamically update the parameter library.

[0030] Step S500: Among all the bit error rates corresponding to the test parameter value group, the ratio of the largest bit error rate to the smallest bit error rate is determined as the bit error rate fluctuation ratio corresponding to the test parameter value group. Step S600: Delete the test parameter value groups in a number of test parameter value groups whose corresponding bit error rate fluctuation ratio is greater than the preset fluctuation ratio threshold, and determine the remaining test parameter value groups as key parameter value groups; The bit error rate fluctuation ratio reflects the degree of fluctuation of several bit error rates corresponding to a set of test parameter values. The larger the bit error rate fluctuation ratio, the more unstable the bit error rate obtained by the set of test parameter values. Therefore, test parameter value sets with bit error rate fluctuation ratios greater than the preset fluctuation ratio threshold are removed in order to select the target parameter value set from the remaining key parameter value sets (test parameter value sets with higher bit error rate stability).

[0031] Step S700: Among several key parameter value groups, the key parameter value group that represents the lowest bit error rate is determined as the target parameter value group corresponding to the optical module to be tested. The bit error rate represents the highest bit error rate among all bit error rates corresponding to the key parameter value group.

[0032] In the method for determining network interface card (NIC) communication link quality test parameters of the present invention, when the optical module under test is connected to the NIC, based on the test link module information corresponding to the optical module under test, a second module information group similar to the module information of the optical module under test is determined from several preset first module information groups. Then, based on the preset global parameter value range corresponding to each test parameter and the mean and standard deviation of each test parameter corresponding to the second module information group, a target parameter value range corresponding to each test parameter is determined. The parameter values ​​for link quality testing of the optical module under test are then determined from the target parameter value range. A parameter value is randomly selected from the target parameter value range corresponding to the test parameter. The selected parameter values ​​for each test parameter are combined to obtain several test parameter value groups. A communication link quality test is performed on each test parameter value group. Based on any given test parameter value group, a preset number of communication link quality tests are conducted on the optical module under test to obtain the bit error rate (BER) corresponding to each communication link quality test for that test parameter value group. The ratio of the highest BER to the lowest BER among all the BER values ​​corresponding to that test parameter value group is then determined as the BER fluctuation ratio corresponding to that test parameter value group. The stability of the bit error rate (BER) obtained from the test parameter value set is determined by the BER fluctuation ratio. Test parameter value sets with BER fluctuation ratios greater than a preset threshold are deleted, and the remaining sets are designated as key parameter value sets. This ensures that the stability of the subsequently determined optimal test parameter value set meets preset requirements. Finally, the key parameter value set with the smallest BER (the highest BER value among all BER values ​​in the key parameter value set) is determined as the target parameter value set for the optical module under test. By processing the global parameter value range corresponding to each test parameter and the mean and standard deviation of each test parameter in the determined second module information set, the target parameter value range of each test parameter is made smaller than the corresponding global parameter value range. This narrows the range of test parameter values, reduces the data processing volume of communication link quality testing, and improves the testing efficiency. Furthermore, using the BER fluctuation ratio to determine the stability of the corresponding test parameter value set reduces noise interference, avoids selecting test parameter value sets as locally inferior solutions, and improves the testing stability of communication link quality testing.

[0033] Embodiments of the present invention also provide a computer program product including program code, which, when the program product is run on an electronic device, causes the electronic device to perform the steps of the methods described above in various exemplary embodiments of the present invention.

[0034] Furthermore, although the steps of the method in this disclosure are described in a specific order in the accompanying drawings, this does not require or imply that the steps must be performed in that specific order, or that all the steps shown must be performed to achieve the desired result. Additional or alternative steps may be omitted, multiple steps may be combined into one step, and / or a step may be broken down into multiple steps.

[0035] From the above description of the embodiments, those skilled in the art will readily understand that the exemplary embodiments described herein can be implemented by software or by combining software with necessary hardware. Therefore, the technical solutions according to the embodiments of this disclosure can be embodied in the form of a software product, which can be stored in a non-volatile storage medium (such as a CD-ROM, USB flash drive, external hard drive, etc.) or on a network, including several instructions to cause a computing device (such as a personal computer, server, mobile terminal, or network device, etc.) to execute the methods according to the embodiments of this disclosure.

[0036] In an exemplary embodiment of this disclosure, an electronic device capable of implementing the above-described method is also provided.

[0037] Those skilled in the art will understand that various aspects of the present invention can be implemented as systems, methods, or program products. Therefore, various aspects of the present invention can be specifically implemented in the following forms: entirely in hardware, entirely in software (including firmware, microcode, etc.), or in a combination of hardware and software, collectively referred to herein as “circuit,” “module,” or “system.”

[0038] An electronic device according to this embodiment of the invention. The electronic device is merely an example and should not be construed as limiting the functionality or scope of the embodiments of the invention.

[0039] Electronic devices are manifested in the form of general-purpose computing devices. Components of an electronic device may include, but are not limited to: at least one processor, at least one memory, and buses connecting different system components (including memory and processor).

[0040] The storage device stores program code that can be executed by the processor to perform the steps described in the "Exemplary Methods" section above, according to various exemplary embodiments of the present invention.

[0041] The storage may include readable media in the form of volatile storage, such as random access memory (RAM) and / or cache memory, and may further include read-only memory (ROM).

[0042] The storage may also include programs / utilities having a set (at least one) of program modules, including but not limited to: an operating system, one or more applications, other program modules, and program data, each or some combination of these examples may include an implementation of a network environment.

[0043] A bus can represent one or more of several bus architectures, including a memory bus or memory controller, a peripheral bus, a graphics acceleration port, a processor, or a local bus that uses any of the various bus architectures.

[0044] Electronic devices can also communicate with one or more external devices (such as keyboards, pointing devices, Bluetooth devices, etc.), one or more devices that enable users to interact with the electronic device, and / or any device that enables the electronic device to communicate with one or more other computing devices (such as routers, modems, etc.). This communication can be performed through input / output (I / O) interfaces. Furthermore, electronic devices can also communicate with one or more networks (such as local area networks (LANs), wide area networks (WANs), and / or public networks, such as the Internet) via network adapters.

[0045] From the above description of the embodiments, those skilled in the art will readily understand that the exemplary embodiments described herein can be implemented by software or by combining software with necessary hardware. Therefore, the technical solutions according to the embodiments of this disclosure can be embodied in the form of a software product, which can be stored in a non-volatile storage medium (such as a CD-ROM, USB flash drive, external hard drive, etc.) or on a network, including several instructions to cause a computing device (such as a personal computer, server, terminal device, or network device, etc.) to execute the methods according to the embodiments of this disclosure.

[0046] In exemplary embodiments of this disclosure, a computer-readable storage medium is also provided, on which a program product capable of implementing the methods described above is stored. In some possible embodiments, various aspects of the invention may also be implemented as a program product comprising program code that, when the program product is run on a terminal device, causes the terminal device to perform the steps of the various exemplary embodiments of the invention described in the "Exemplary Methods" section of this specification.

[0047] The program product may employ any combination of one or more readable media. A readable medium may be a readable signal medium or a readable storage medium. A readable storage medium may be, for example, but not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination thereof. More specific examples of readable storage media (a non-exhaustive list) include: electrical connections having one or more wires, portable disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fibers, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination thereof.

[0048] Computer-readable signal media may include data signals propagated in baseband or as part of a carrier wave, carrying readable program code. Such propagated data signals may take various forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination thereof. A readable signal medium may also be any readable medium other than a readable storage medium, capable of sending, propagating, or transmitting programs for use by or in conjunction with an instruction execution system, apparatus, or device.

[0049] The program code contained on the readable medium may be transmitted using any suitable medium, including but not limited to wireless, wired, optical fiber, RF, etc., or any suitable combination thereof.

[0050] Program code for performing the operations of this invention can be written in any combination of one or more programming languages, including object-oriented programming languages ​​such as Java and C++, and conventional procedural programming languages ​​such as C or similar languages. The program code can execute entirely on the user's computing device, partially on the user's device, as a standalone software package, partially on the user's computing device and partially on a remote computing device, or entirely on a remote computing device or server. In cases involving remote computing devices, the remote computing device can be connected to the user's computing device via any type of network, including a local area network (LAN) or a wide area network (WAN), or it can be connected to an external computing device (e.g., via the Internet using an Internet service provider).

[0051] Furthermore, the above figures are merely illustrative of the processes included in the method according to exemplary embodiments of the present invention, and are not intended to be limiting. It is readily understood that the processes shown in the above figures do not indicate or limit the temporal order of these processes. Additionally, it is readily understood that these processes may be executed synchronously or asynchronously, for example, in multiple modules.

[0052] It should be noted that although several modules or units for the device used to perform actions have been mentioned in the detailed description above, this division is not mandatory. In fact, according to embodiments of this disclosure, the features and functions of two or more modules or units described above can be embodied in one module or unit. Conversely, the features and functions of one module or unit described above can be further divided and embodied by multiple modules or units.

[0053] The above description is merely a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in the present invention should be included within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of the claims.

Claims

1. A method for determining network interface card (NIC) communication link quality test parameters, characterized in that, include: Step S100: In response to the connection between the optical module under test and the network card, determine the second module information group from several preset first module information groups according to the test link module information corresponding to the optical module under test; The first module information group includes the test link module information corresponding to the preset optical module; Step S200: Determine the target parameter value range for each test parameter based on the preset global parameter value range corresponding to each test parameter and the mean and standard deviation of each test parameter corresponding to the second module information group. Step S300: Select any parameter value from the target parameter value range corresponding to each test parameter, and combine the selected parameter values ​​for each test parameter to obtain several test parameter value groups; any test parameter value group includes the parameter value corresponding to each test parameter. Step S400: Perform a preset number of communication link quality tests on the optical module under test according to any test parameter value group, so as to obtain the bit error rate corresponding to each communication link quality test performed by the test parameter value group; Step S500: Among all the bit error rates corresponding to the test parameter value group, the ratio of the largest bit error rate to the smallest bit error rate is determined as the bit error rate fluctuation ratio corresponding to the test parameter value group. Step S600: Delete the test parameter value groups in the plurality of test parameter value groups whose corresponding bit error rate fluctuation ratio is greater than the preset fluctuation ratio threshold, and determine the remaining test parameter value groups as key parameter value groups; Step S700: Among the several sets of key parameter values, the set of key parameter values ​​that represents the lowest bit error rate is determined as the target parameter value set corresponding to the optical module to be tested. The representative bit error rate is the bit error rate with the largest value among all the bit error rates corresponding to the key parameter value group.

2. The method according to claim 1, characterized in that, Step S100 includes: Step S110: In response to the connection between the optical module under test and the network card, obtain the test link module information corresponding to the optical module under test; the test link module information includes module type identifier, module manufacturer identifier, link communication rate mode, and ambient temperature value during operation; Step S120: Obtain several preset first module information groups; the first module information group includes the preset module type identifier, module manufacturer identifier, link communication rate mode, and test temperature range corresponding to the optical module; Step S130: If any module type identifier included in the first module information group is the same as the module type identifier corresponding to the optical module to be tested, then the first module information group is determined as the pending module information group, and step S150 is executed. If all the module type identifiers included in the first module information group are different from the module type identifiers corresponding to the optical module under test, then step S140 is executed. Step S140: Traverse each first module information group. If the module manufacturer identifier included in any first module information group is the same as the module manufacturer identifier corresponding to the optical module under test, and the link communication rate mode included in the first module information group is the same as the link communication rate mode corresponding to the optical module under test, then the first module information group is determined as a pending module information group, and step S150 is executed. Step S150: Traverse each of the pending module information groups. If the ambient temperature value of the optical module under test is within the test temperature range included in any of the pending module information groups, then the pending module information group is determined as the second module information group.

3. The method according to claim 2, characterized in that, Step S140 further includes: Step S141: If the module manufacturer identifier or link communication rate mode included in all the first module information groups is different from the module manufacturer identifier or link communication rate mode corresponding to the optical module under test, then obtain the communication cable length corresponding to the optical module under test. Step S142: Based on the link communication rate mode corresponding to the optical module under test, the ambient temperature value during operation, and the communication cable length, determine the first information list A=(A1,A2,A3,A4); where A1 is the communication rate of the link communication rate mode corresponding to the optical module under test; A2 is the ambient temperature value corresponding to the optical module under test during operation; A3 is the ambient temperature value corresponding to the optical module under test during operation; and A4 is the communication cable length corresponding to the optical module under test. Step S143: Based on the link communication rate mode, test temperature range, and communication cable length of the optical module corresponding to each first module information group, determine several second information lists B1, B2, ..., B j ,...,B m Where j = 1, 2, ..., m; m is the number of information groups in the first module; B j This is the second information list corresponding to the j-th information group of the first module; B j =(B j1 B j2 B j3 B j4 );B j1 B is the communication rate of the link communication rate mode of the optical module corresponding to the j-th first module information group; j2 B is the maximum temperature value within the test temperature range of the optical module corresponding to the j-th information group of the first module; j3 B is the minimum temperature value within the test temperature range of the optical module corresponding to the j-th information group of the first module; j4 The length of the communication cable for the optical module corresponding to the j-th information group of the first module; Step S144: If the first information list A and the second information list B j If the cosine similarity is greater than the preset similarity threshold, then the j-th first module information group is determined as the pending module information group, and step S150 is executed.

4. The method according to claim 1, characterized in that, Step S200 includes: Step S210: Obtain the preset global parameter value range corresponding to each test parameter to obtain a global parameter value range list C=(C1,C2,...,C...). i ,...,C n ); where i = 1, 2, ..., n; n is the number of test parameters; C i C represents the preset global parameter value range corresponding to the i-th test parameter; i =[C i1 C i2 ]; C i1 C is the minimum value within the global parameter value range corresponding to the i-th test parameter; i2 The maximum value of the global parameter value range corresponding to the i-th test parameter; Step S220: Obtain the parameter value with the lowest bit error rate for each test parameter at each temperature value within the test temperature range corresponding to the second module information group, to obtain a list of several parameter values ​​D1, D2, ..., D i ,...,D n ; where D i This is a list of parameter values ​​corresponding to the i-th test parameter; D i =(D i1 D i2 ,...,D ip ,...,D iq ); p=1,2,...,q; q is the number of temperature values ​​within the test temperature range corresponding to the second module information group; D ip The parameter value with the lowest bit error rate for the i-th test parameter at the p-th temperature value within the test temperature range corresponding to the second module information group; Step S230: Determine the target parameter value range corresponding to the i-th test parameter as [E]. i1 E i2 ]; Among them, E i1 E is the minimum value within the range of target parameter values ​​corresponding to the i-th test parameter; i2 The maximum value within the range of target parameter values ​​corresponding to the i-th test parameter; E i1 =MAX(C i1 ,round(F i1 -2×F i2 )); MAX() is the default function for determining the maximum value; round() is the default function for rounding; F i1 D i1 D i2 ,...,D ip ,...,D iq The mean of F; i2 D i1 D i2 ,...,D ip ,...,D iq Standard deviation; E i2 =MIN(C i2 ,round(F i1 +2×F i2 MIN() is a preset function for determining the minimum value.

5. The method according to claim 4, characterized in that, Step S220 further includes: Step S221, if F i2 If the value is greater than the preset standard deviation threshold, then the target parameter value range corresponding to the i-th test parameter is determined to be [F]. i1 -1,F i1 +1]; otherwise, proceed to step S230.

6. The method according to claim 5, characterized in that, Step S300 includes: Step S310, from [E] i1 E i2 Choose any one of the parameter values ​​from the list as the test parameter value G corresponding to the i-th test parameter. i ; Step S320: Determine the test parameter value group as (G1, G2, ..., G i ,...,G n ).

7. The method according to claim 6, characterized in that, The parameter value with the lowest bit error rate for each temperature value within the test temperature range corresponding to each of the first module information groups and each test parameter is stored in a preset parameter library.

8. The method according to claim 7, characterized in that, Following step S400, the method further includes: Step S410: If (G1, G2, ..., G...) i ,...,G n If the lowest bit error rate among all the corresponding bit error rates is lower than the historical lowest bit error rate of the i-th test parameter, then the parameter value with the lowest bit error rate of the i-th test parameter in the parameter library at the ambient temperature value corresponding to the second module information group is replaced with G. i .

9. A non-transitory computer-readable storage medium, characterized in that, The storage medium stores at least one instruction or at least one program segment, which is loaded and executed by a processor to implement the method as described in any one of claims 1-8.

10. An electronic device, characterized in that, Includes a processor and the non-transitory computer-readable storage medium as described in claim 9.

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