一种Micro-LED阵列误差校正方法与校正装置
By testing the performance parameters and establishing models of the packaged Micro-LED array, and combining the target performance parameters for error correction, the problems of low yield and poor consistency in the existing technology are solved, achieving efficient error correction and improving the performance of the Micro-LED array and the reliability of the optical interconnect system.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- SHENZHEN HUACHUANGXINGUANG TECH CO LTD
- Filing Date
- 2026-04-21
- Publication Date
- 2026-07-17
AI Technical Summary
Existing Micro-LED arrays suffer from low yield, poor performance consistency, and low integration in the packaging and error correction stages, making it difficult to identify and compensate for systematic errors caused by structural defects.
By testing the performance parameters of the packaged Micro-LED array, a performance parameter model and signal communication capability are established. Error correction is performed in conjunction with the target performance parameters, and retesting is conducted to ensure that the performance parameters of each pixel unit are within the preset error range.
This maximizes the yield and performance consistency of Micro-LED arrays, ensures the reliability and integration of optical interconnect systems, and reduces costs.
Smart Images
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