Emissivity determination method and temperature measurement method, device, program product and medium based on AI large model

By using an AI-based large model to determine the emissivity, the emissivity of the infrared thermometer is automatically identified and corrected, solving the problem of inaccurate temperature measurement caused by manual settings and achieving higher precision temperature measurement.

CN122429932APending Publication Date: 2026-07-21FLINT TECHNOLOGY (YANTAI) CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
FLINT TECHNOLOGY (YANTAI) CO LTD
Filing Date
2026-04-24
Publication Date
2026-07-21

AI Technical Summary

Technical Problem

Existing temperature-measuring infrared thermal imagers require manual setting of emissivity, leading to inaccurate temperature measurements and reliance on user confirmation of the target material.

Method used

By employing an AI-based large model approach, the emissivity of the marked area is automatically identified and determined by acquiring visible light images of the target and control information. This is then corrected using temperature data to achieve intelligent determination of the emissivity.

Benefits of technology

It improves the accuracy and reliability of emissivity identification, enhances the overall precision of infrared thermometry, simplifies the operation process, and reduces human error.

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Abstract

The application discloses an emissivity determination method and a temperature measurement method based on an AI large model, equipment, a medium and a program product, and comprises the following steps: acquiring a target visible light image, wherein the target visible light image comprises a marked area; acquiring control information for determining the emissivity of the marked area to prompt an AI large model; and determining the emissivity of the marked area based on the target visible light image and the control information through the AI large model.
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