Adhesion prevention pretreatment and peeling force dynamic calibration method for ultra-thin adhesive tape web
By identifying defects in real time and dynamically resetting them during ultra-thin tape testing, combined with environmental compensation, the problems of self-adhesion and data distortion in ultra-thin tape testing are solved, improving the success rate and accuracy of the test.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- GUANGDONG POOTAB SHINING TECH CO LTD
- Filing Date
- 2026-04-21
- Publication Date
- 2026-07-21
AI Technical Summary
Existing technologies for testing ultrathin tapes suffer from problems such as self-adhesion, curling, interlayer transfer, interference from microscopic defects, data distortion caused by temperature and humidity sensitivity, and low test success rate.
By acquiring the initial peeling front image as a reference template, dynamic images, force values, displacements, and environmental data of the peeling front are collected in real time to identify defect characteristics, dynamically reset the trigger index, and perform environmental compensation. Combined with laser cutting and servo clamping, the accuracy and continuity of the data are ensured.
It improves the success rate and accuracy of peel force testing for ultra-thin tapes, reduces testing costs, and achieves uniformity and reliability under different environmental conditions.
Smart Images
Figure CN122430232A_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of adhesive tape testing technology, and in particular to a method for anti-adhesion pretreatment and dynamic calibration of peel force for ultra-thin adhesive tape rolls. Background Technology
[0002] Currently, the peel strength testing of adhesive tapes mainly follows standards such as GB / T 2792 or ASTM D3330, using a tensile testing machine to perform 180° or 90° peel tests. For conventional tapes with relatively thick thickness, the above standard methods can obtain relatively stable and repeatable test results. However, when the tape thickness is reduced to below 50μm, i.e., "ultra-thin tapes," existing testing methods reveal the following inherent defects:
[0003] 1) Due to its extremely low bending stiffness and high surface adhesion, ultra-thin tape is prone to self-adhesion, curling, or interlayer transfer during the process of cutting, transferring, and bonding from the roll material to the test steel plate. Operators usually need to use release film support and manually "open the film," which inevitably introduces tensile deformation, edge warping, or micro-air bubbles, resulting in initial defects in the sample itself.
[0004] 2) Traditional methods assume a continuous, interference-free testing process, directly using the acquired force-displacement curves as test results. However, in actual testing, microscopic defects at the peeling front (such as bubbles, wrinkles, and adhesive filaments), fixture slippage, and fluctuations in ambient temperature and humidity can couple into the peeling force signal in real time, causing data distortion. Existing technologies typically address this by "increasing the sample size and taking the statistical average," which essentially uses statistics to mask measurement errors rather than performing dynamic calibration at the signal source. More importantly, when significant defects appear during testing, traditional methods can only discard the entire data set and resample, resulting in low test success rates and impacting R&D and quality control efficiency.
[0005] 3) The adhesion performance of ultra-thin tapes is extremely sensitive to temperature and humidity. Traditional methods only record environmental conditions in the test report and do not consider the relationship between temperature and humidity parameters and peel force value, thus affecting the accuracy of test results. Summary of the Invention
[0006] To address at least one of the aforementioned technical problems, this invention provides a method for anti-adhesion pretreatment and dynamic peel force calibration of ultra-thin adhesive tape rolls.
[0007] In a first aspect, the present invention provides a method for anti-adhesion pretreatment and dynamic peel force calibration of ultra-thin adhesive tape rolls, the method comprising:
[0008] Obtain an image of the initial peeling front formed when the ultra-thin tape is adhered to the test substrate, and store the image as a reference template;
[0009] During the peel test of the ultra-thin tape, real-time dynamic images of the peel front, real-time peel force value, real-time peel displacement, and temperature and humidity of the test environment are collected synchronously at a preset frequency.
[0010] The real-time dynamic image is compared with the reference template to identify whether there is at least one defect feature at the peeling front. The preset defect features include bubbles, wrinkles, glue threads or foreign particles.
[0011] When the defect feature is identified, the defect area is determined. The dynamic reset trigger index is calculated based on the defect area, real-time peeling force value, and real-time peeling displacement. When the dynamic reset trigger index exceeds a preset threshold, the dynamic reset process is triggered to obtain the effective force-displacement data segment.
[0012] The effective force-displacement data segments obtained between all dynamic reset processes are spliced in the spatiotemporal domain. The force values are compensated for environmental factors such as temperature and humidity in the test environment, and the calibrated peel force curve is output.
[0013] In a second aspect, the present invention also provides a system for anti-adhesion pretreatment and dynamic peel force calibration of ultra-thin adhesive tape rolls for implementing the method as described in any of the first aspects, the system comprising:
[0014] The main body of the tensile testing machine has built-in force and displacement sensors;
[0015] The machine vision module, mounted directly above the stripping front, includes an industrial camera, a telecentric lens, and a ring light source, for acquiring images of the stripping front in real time.
[0016] The dynamic cutting module, installed between the clamp and the peeling interface, is used to cut the tape upon triggering.
[0017] Servo clamping module, including a programmable clamping force electric clamp and a displacement feedback unit;
[0018] The control and computing unit is electrically connected to the tensile testing machine host, machine vision module, dynamic cutting module, and servo clamping module, respectively.
[0019] The control and calculation unit is configured to perform the anti-adhesion pretreatment and peel force dynamic calibration method for ultra-thin adhesive tape rolls as described in any one of claims 1-6.
[0020] Thirdly, the present invention also provides a computer-readable storage medium storing a computer program, the computer program including program instructions that, when executed by a processor of an electronic device, cause the processor to perform a method as described in the first aspect above and any possible implementation thereof.
[0021] Compared with the prior art, the beneficial effects of the present invention are as follows:
[0022] 1) By dynamically resetting the trigger index, a comprehensive quantitative evaluation of defect area, real-time force value, and peeling speed is performed. Resetting is only triggered when the cumulative impact of the defect on the peeling work exceeds the critical fracture toughness, avoiding excessively frequent test interruptions due to small, recoverable defects. A variable-speed strategy of "pre-peeling at the first rate until the defect area is completely passed, and then continuing the test at the second rate" ensures that the defect area is smoothly removed without affecting subsequent tape application. Through the combined effect of the above mechanisms, the success rate of a single test is improved.
[0023] 2) By defining an "effective data acquisition period" and removing initial and final fluctuations, each effective data segment corresponds precisely to a "defect-free peeling" process. Simultaneously, the defect area term and peeling work term in the dynamically reset trigger index are coupled within the same integral framework, enabling the system to output a four-dimensional correlation report of "location-type-area-force attenuation" for each defect. This is a function completely impossible with existing technologies, providing a new data dimension for improving tape production processes. Using the Sigmoid function for splicing point smoothing simulates the physical nature of continuous and smooth derivatives of the peeling force at the splicing point, ensuring that the curve after splicing is statistically equivalent to the result obtained from a single continuous test.
[0024] 3) A two-factor Gaussian-logarithmic correction model was constructed. Unlike traditional linear correction, this model uses a Gaussian function to describe the asymmetric decay effect caused by temperature deviation (both higher and lower deviations from the standard temperature reduce adhesion), and a logarithmic function to describe the diminishing marginal effect of humidity. This model allows the original force values measured under arbitrary temperature and humidity conditions to be converted to equivalent values under standard conditions, ensuring testing accuracy and consistency across different conditions.
[0025] 4) When the defect area and peeling speed satisfy a specific relationship, the dynamic reset trigger index will automatically return to zero after the defect passes through, and the peeling force value of the subsequent valid data segment will not differ significantly from that of the defect-free sample. By designing a technical approach of "removing the defect segment + retaining the valid segment" instead of the industry-standard "discarding the entire set", testing efficiency is greatly improved and testing costs are saved.
[0026] It should be understood that the above general description and the following detailed description are exemplary and explanatory only, and are not intended to limit this disclosure. Attached Figure Description
[0027] To more clearly illustrate the technical solutions in the embodiments of the present invention or the background art, the accompanying drawings used in the embodiments of the present invention or the background art will be described below.
[0028] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this disclosure and, together with the specification, serve to illustrate the technical solutions of this disclosure.
[0029] Figure 1 This is a flowchart illustrating a method for anti-adhesion pretreatment and dynamic peel force calibration of ultra-thin adhesive tape rolls, provided in an embodiment of the present invention.
[0030] Figure 2 This is a schematic diagram of a system for anti-adhesion pretreatment and dynamic peel force calibration of ultra-thin adhesive tape rolls, provided in an embodiment of the present invention. Detailed Implementation
[0031] To enable those skilled in the art to better understand the present invention, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.
[0032] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of the invention. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.
[0033] Please see Figure 1 , Figure 1 This is a schematic flowchart illustrating a method for anti-adhesion pretreatment and dynamic peel force calibration of ultra-thin adhesive tape rolls, provided in an embodiment of the present invention. Figure 1 As shown, the method includes:
[0034] S10. Obtain an initial peeling front image formed by the ultra-thin tape being adhered to the test substrate, and store the image as a reference template.
[0035] S20. During the peel test of the ultra-thin tape, real-time dynamic images of the peel front, real-time peel force value, real-time peel displacement, and temperature and humidity of the test environment are collected synchronously at a preset frequency.
[0036] S30. Compare the real-time dynamic image with the reference template to identify whether there is at least one defect feature at the peeling front. The preset defect features include bubbles, wrinkles, glue threads or foreign particles.
[0037] S40. When the defect feature is identified, the defect area of the defect feature is determined. The dynamic reset trigger index is calculated based on the defect area, real-time peeling force value and real-time peeling displacement. When the dynamic reset trigger index exceeds the preset threshold, the dynamic reset process is triggered to obtain the effective force-displacement data segment.
[0038] S50: Split the effective force-displacement data segments obtained between all dynamic reset processes in the spatiotemporal domain, perform environmental compensation on the force values according to the temperature and humidity of the test environment, and output the calibrated peel force curve.
[0039] In this embodiment, firstly, an initial peel front image of the ultra-thin tape adhered to the substrate is acquired as a reference template before testing. During the peel test, real-time images of the peel front, peel force, displacement, and temperature and humidity data are simultaneously acquired at high frequency. Then, the real-time images are compared with the reference template to identify defects such as bubbles, wrinkles, adhesive threads, or foreign particles. Once a defect is detected, a "dynamic reset trigger index" is calculated based on the defect area, real-time force value, and displacement. If the index exceeds a threshold, a dynamic reset process is initiated, retaining only valid force-displacement data segments. Finally, all valid data segments between dynamic reset processes are spliced in the spatiotemporal domain, and the force value is compensated according to temperature and humidity to output a calibrated peel force curve. During the peel test of ultra-thin tape, accidental defects such as bubbles, wrinkles, adhesive threads, or foreign objects can interfere, causing abnormal fluctuations or invalid data in the measured peel force curve. Traditional methods struggle to distinguish the impact of defects from changes in actual adhesive performance, thus affecting the accuracy and repeatability of peel force assessment. By identifying defects in real-time images and dynamically filtering valid data segments, combined with temperature and humidity compensation, the accuracy and reliability of the peel force test are significantly improved.
[0040] In one embodiment, during step S10, when preparing the test sample, the ultra-thin tape roll is adhered to the specified test substrate (such as glass, stainless steel, or silicon wafer) using a standard method (e.g., bubble-free bonding) to ensure good initial contact between the tape and the substrate. A high-resolution industrial camera or microscope is installed directly above or to the side of the peeling front edge of the peeling test device, along with a coaxial or ring light source, to ensure uniform illumination and clear imaging of the peeling front edge area. Before peeling begins, the peeling start point (i.e., the peeling front edge) of the adhered ultra-thin tape is focused and photographed to acquire one or more clear initial images. Further, the initial images undergo preprocessing such as grayscale conversion, filtering and noise reduction, and edge enhancement to extract features such as the contour, texture, and brightness distribution of the peeling front edge, storing them as a reference template (e.g., saved as a standard image matrix or feature descriptor) for comparison in subsequent steps. By acquiring the initial peeling front edge image in a well-adhesive state, a defect-free and interference-free standard reference is provided for subsequent defect identification, improving the accuracy and sensitivity of defect detection. The initial bonding state of each batch or each piece of tape may vary slightly. Using the initial image of the current test sample itself as a template avoids the matching error caused by using a fixed template.
[0041] In one embodiment, step S20 is used to collect data during the peel test for defect identification in subsequent steps. The real-time dynamic image of the peel front is collected because the peeling behavior of ultra-thin tape is extremely sensitive; even minute defects (bubbles, wrinkles, etc.) can significantly interfere with the local stress distribution, causing abnormal fluctuations in the peel force curve. These anomalies are not inherent properties of the tape but rather constitute "noise." By comparing this image with a reference template, the algorithm can automatically and objectively identify the occurrence and type of defects. Peel force is the most direct and core quantitative indicator for measuring the adhesive performance of the tape and is the main data for outputting the calibrated peel force curve. Furthermore, the peel force in defective areas will exhibit abnormal peaks or valleys; collecting this data can be used to evaluate the dynamic reset trigger index. Real-time peel displacement is also a key data point in the output calibrated peel force curve. When a defect is identified, its location on the sample can be precisely pinpointed using the corresponding displacement value. To ensure the comparability and repeatability of the test results, the environmental conditions during the test must be recorded. Before the final output curve, the peeling force value can be compensated by a mathematical model based on temperature and humidity data, converting all data to theoretical values under standard temperature and humidity, thereby eliminating errors caused by environmental fluctuations.
[0042] Specifically, when collecting this data, a high-speed / high-resolution industrial camera, a force sensor, a displacement encoder, and a temperature and humidity sensor are integrated into an automated peel test device. A unified preset sampling frequency, such as 100 Hz or 1000 Hz, is set via host computer software, and a synchronous trigger signal is sent to ensure that all sensors start operating under the same clock reference. Simultaneously, as the peel test machine moves the test substrate at a constant speed (or the peeling head is lifted at a constant speed), the high-speed camera is triggered. The camera lens is aimed at the peeling front (i.e., the area where the tape and substrate are about to separate), continuously capturing clear images of this area at a preset frequency, and transmitting them to the host computer in real time. The image sequence is timestamped. The force sensor is directly connected to the clamp holding the free end of the tape. During the peeling process, the sensor converts the vertical or approximately 90-degree tension on the tape into an electrical signal in real time. After signal amplification and conditioning, the data acquisition card synchronously acquires and records the force-time data at the same preset frequency. A high-precision displacement encoder is coupled to the drive motor or linear module of the peel test machine. The encoder measures the rotation angle of the drive shaft or the linear motion distance of the module in real time and converts it into the absolute or relative displacement of the peeling head. This displacement-time data is also synchronously acquired and recorded at a preset frequency. Temperature and humidity sensor probes are positioned near the peeling test area to avoid direct interference from airflow and equipment. The sensors acquire and record ambient temperature and relative humidity data at a slightly lower frequency (still synchronized with the master clock). The host computer software packages the image, force, displacement, temperature, and humidity data at the same timestamp into a structured data frame. All data frames are stored chronologically to the hard drive or memory, forming a complete, strictly time-synchronized multidimensional test data stream for subsequent steps.
[0043] In peel tests of ultra-thin adhesive tapes, the following microscopic defects can severely interfere with the validity of the test results:
[0044] Air bubbles: The tape failed to adhere completely to the test substrate, leaving air pockets. In the image, these appear as nearly circular or elliptical dark spots with smooth edges.
[0045] Wrinkles: The tape undergoes compressive buckling along its length or width, forming localized bulges or ripples. In images, this appears as parallel, alternating light and dark stripes.
[0046] Adhesive filaments: During the peeling process, the adhesive undergoes cohesive failure rather than interfacial failure, and some of the adhesive is stretched into filaments, forming bridges between the tape and the substrate. In the image, these appear as slender, translucent, and possibly floating fibrous structures connecting the two sides of the peel.
[0047] Foreign particles: Tiny hard particles (such as dust, fibers, adhesive particles) from the environment or the substrate are trapped between the tape and the substrate. In the image, they appear as irregular, high-contrast small white or black dots, usually accompanied by localized detachment (bubbles) around them.
[0048] To identify any potential defects and eliminate image differences caused by non-defect factors, ensuring that the comparison is performed under the same benchmark, step S30 performs preprocessing such as denoising and contrast enhancement on the real-time acquired dynamic images.
[0049] The preprocessed real-time image is registered with a reference template. Feature point matching (such as SIFT, ORB) or template matching algorithms are used to compensate for overall image translation and rotation caused by minor stage vibrations or installation tolerances, ensuring pixel-level alignment of the "stripping front" region. Then, the absolute difference map between the real-time image and the reference template is calculated. In the difference map, the background (unchanged areas) is nearly black, while the changed areas (i.e., defects) appear as bright areas. These bright areas are initially binarized and extracted using adaptive thresholding. For each extracted suspected defect connected region, its morphology, texture, grayscale, and other features are calculated and compared with a predefined defect feature library for classification.
[0050] Bubbles / wrinkles: These have larger areas but different textures. Bubble areas are usually uniform in grayscale and have smooth edges (circular / elliptical); wrinkles, on the other hand, appear as continuous, alternating light and dark stripes, which can be distinguished by combining directional gradient histograms or texture analysis (such as local binary patterns).
[0051] Fiber filaments: These are thin, curved lines with a high aspect ratio, and can be identified using edge detection (such as Canny) combined with Hough transform or skeletonization algorithms.
[0052] Foreign particles: These are usually irregular, high-contrast small spots. They are small in area but have a large difference in gray level from the background and can be identified through spot detection.
[0053] After comparison and classification, a series of binary mask images with defect type labels (bubbles, wrinkles, glue threads, foreign objects) are obtained. For each defect mask, the total number of pixels it contains is counted, and it is converted into the actual physical area according to the camera's calibrated scale (micrometers / pixel). The real-time peeling displacement (X coordinate) and timestamp when the defect is identified are recorded, so as to achieve precise positioning of the defect on the "force-displacement" curve.
[0054] After identifying the defect features and locating the defect location, step S40 will calculate the dynamic reset trigger index based on the defect area, real-time peeling force value, and real-time peeling displacement.
[0055] In one embodiment, the calculation of the dynamic reset trigger index based on the defect area, real-time peel force value, and real-time peel displacement includes:
[0056] ;
[0057] In the formula, For the current moment The dynamic reset trigger index, Let be the integral variable, representing any historical moment within the time window; This is the real-time peeling force value. The width of the tape. Real-time peeling speed, i.e., displacement Regarding time The derivative of This represents the critical fracture toughness of this type of tape under standard conditions. The area of the identified defects, For the set peeling speed, The time interval between two image acquisitions. For sliding time windows; For integration variables From the past From moment to the present moment The points.
[0058] In the above formula, This represents the measured peel power density, which indicates the energy input rate used to peel the tape as actually measured by the current testing system. This indicates the current defect area. Under the influence of [the expected], the theoretical power density that a healthy stripping process should consume. It is the critical fracture toughness (or interfacial fracture energy) of the tape material under standard conditions. This is an intrinsic parameter of the material, representing the energy required to form a new interface per unit area. This represents a perfect interface and fast settings. The theoretical power density of the stripping layer. This represents a defect area influence factor. This indicates that within the sliding time window Inside, a time slice The theoretical normal peeling area corresponding to the time interval between two image acquisitions. This represents the proportion of the current defect area to the theoretically required normal peel area, i.e., the "loss rate of effective bond area". "1 - loss rate" represents the effective bond ratio at the current moment. The theoretical power density needs to be reduced based on this effective ratio. The integral term represents the integral term of length . Within the sliding time window, the aforementioned "difference between measured and theoretical power density" is cumulatively integrated, that is, the calculation is performed over the past... The total energy consumed (or lost abruptly) due to defects within a given time period. If the process is perfect, the two terms are equal, the difference is zero, and the integral is... The difference is small; however, if the defect causes abnormal fluctuations in force (such as a sudden drop and then a spike in force due to air bubbles), this difference can accumulate significantly. When the accumulated abnormal energy... Exceeding a preset threshold indicates that the defect has caused a non-negligible, systematic distortion of the test data, necessitating a reset to discard the contaminated data. Preferably, the tape width... The standard critical fracture toughness of this type of tape The peeling speed was obtained through preliminary calibration experiments. The length of the sliding time window is set according to the experimental requirements, while the preset threshold is derived from the experience or theoretical derivation of a large number of experiments.
[0059] It is a dynamic variable. This means that the triggering decision is not fixed, but is adjusted in real time according to the severity (area) of the defect. The smaller the value, the less the theoretical power density is reduced, and the smaller the difference from the measured value. Slow accumulation may not trigger a reset, thus avoiding excessive intervention. If this value is large, the effective bonding ratio is low, and the theoretical power density is significantly reduced. If, at this point, the measured force value shows a spike due to stress concentration, the power density difference increases sharply. Accumulates quickly and triggers a reset. This implements an intelligent strategy of "tolerating minor defects and correcting major defects".
[0060] Traditional methods typically only set upper and lower limits for peel force as anomaly criteria, which can easily lead to misjudgments (misclassifying fluctuations in the material itself as anomalies) or omissions (defects causing complex changes but not exceeding the force limit). The dynamic reset trigger index calculated using the above formula, based on the principles of fracture mechanics energy, dynamically correlates force, velocity, defect size, and intrinsic material properties, achieving a physical quantification of the degree of data anomalies and making the judgment standard more reliable. Sudden changes in force value at a single point may be noise. By applying a time window... Integrating, only sustained or significant anomalous energy dissipation will cause... This achieves high values. It effectively filters out instantaneous electrical noise or minor, transient irrelevant interference, improving the system's robustness. Precise reset triggered by this formula ensures that each spliced "effective force-displacement data segment" is minimized from defect interference, thereby fundamentally improving the accuracy and reliability of ultra-thin tape peel force testing.
[0061] Furthermore, in step S40, when the dynamic reset trigger index exceeds a preset threshold, the dynamic reset process is triggered to obtain the effective force-displacement data segment.
[0062] In one embodiment, the dynamic reset process includes:
[0063] Pause the stripping action and maintain the current force value;
[0064] The ultra-thin tape is cut using laser cutting at a predetermined distance in front of the defective area;
[0065] Reset the clamp to re-clamp the tape behind the defective area;
[0066] A pre-peeling operation is performed, peeling at a first rate until the defect area is completely passed. Then, using the displacement point corresponding to the last effective force value as the reference point, the peeling test continues at a second rate; wherein, the first rate is less than the second rate.
[0067] In this embodiment, after dynamic reset is initiated, the control system sends a command to the motor of the peel tester to immediately stop its movement, but maintains the current output force of the servo system. This is equivalent to "gripping" the device and keeping it stationary in its current state. The purpose of this is to freeze the current mechanical state, preventing inertial rebound or stress relaxation caused by sudden stopping, and providing a stable mechanical starting point for subsequent fine operations. The laser cutting head integrated on the device moves to a preset distance in front of the defect area (e.g., 2-3 mm before the defect leading edge) and emits a laser pulse to cut the ultra-thin tape. This avoids directly forcibly peeling off the defect area (which would generate complex force signals that are difficult to interpret). By cutting in a "clean" area in front, the entire section of tape containing the defect is physically isolated from subsequent testing. During the reset and re-clamping process, the clamp automatically releases the cut waste material containing the defective tape. The clamp moves to the tape position behind the defect area (i.e., the part still attached to the substrate) and re-clamps the tape there. This process establishes a new, defect-free clamping point for the continuation of the test, ensuring that subsequent peeling starts from a clean interface. In the two-stage rate recovery test:
[0068] Phase 1 (Low-speed pre-peeling): Peeling begins at a low “first rate” (e.g., 10% of the normal rate). This phase continues until the vision system confirms that the defective area has been completely bypassed (i.e., the entire defective segment between the laser cutting point and the fixture has been completely detached from the substrate).
[0069] Phase Two (Continued Testing at Normal Rate): The system automatically locates the displacement position corresponding to the last effective force value data point as the new reference point. Then, the peeling speed is increased to the normal "second rate" to continue standard peeling tests and data acquisition.
[0070] Low-speed pre-peeling ensures a very smooth transition from the re-clamping point to the stable peeling zone, avoiding shocks or new interface disturbances caused by restarting. Displacement datum alignment accurately connects the displacement coordinates of new test data with those of previously valid data, laying the spatiotemporal foundation for subsequent data stitching.
[0071] Preferably, the acquisition of the effective force-displacement data segment includes:
[0072] Each time the dynamic reset process is triggered, the time interval between the end time of the previous dynamic reset process and the trigger time of the current dynamic reset process is defined as the effective data collection period;
[0073] Extract the real-time stripping force value sequence and real-time stripping displacement sequence corresponding to the effective data acquisition period, remove a preset number of fluctuating data points at the beginning and end of the sequence, and form independent data segments;
[0074] The criteria for removing the fluctuating data points are adjacent data points whose force value change rate exceeds a set smoothing threshold.
[0075] The effective data acquisition period represents the time between the last reset and the point when the system was running stably until the occurrence of this critical defect. Data during this period is relatively pure. To extract and remove fluctuation points, all (force, displacement) data pairs corresponding to the effective data acquisition period are extracted from the database. The rate of change of force value between each data point in the sequence and its predecessor (first-order difference) is calculated. At the beginning and end of the sequence, consecutive data points with an absolute value of the rate of change of force value exceeding the "set smoothing threshold" are removed. Typically, dozens of data points are removed immediately after the reset operation and just before the trigger operation begins. Even within the effective period, the beginning and end of a data segment may be affected by the "relaxation effect" at the end of the reset operation and the "initial disturbance" when the defect begins to form. By removing these points with drastic force fluctuations, it is ensured that each independent data segment contains only data from a stable stripping state, thus obtaining a high-fidelity force-displacement curve segment.
[0076] Traditional methods, when encountering large defects, either render the data unusable and require retesting, or the data contains inseparable interfering segments. This method, through laser cutting and re-clamping, precisely removes the defect-affected segments, allowing testing to continue on healthy material segments. This fundamentally ensures that every data segment acquired originates from the intrinsic, undisturbed interfacial adhesion behavior between the tape and the substrate. There is no need to discard the entire long sample due to localized defects. The system discards only clearly identified and confirmed contaminated data segments, retaining a large amount of valid data between defects. This is extremely valuable for evaluating the uniformity of roll materials or performing statistical analyses (such as calculating the average peel force and standard deviation), significantly reducing sample and time waste.
[0077] Furthermore, the low-speed pre-peeling and displacement reference alignment mechanism ensures a smooth transition in initial conditions (peeling angle, stress state) and displacement coordinates when different data segments restart testing. This enables the subsequent "spatiotemporal stitching" in the S50 step, allowing the construction of a continuous and calibrated force-displacement curve representing the complete peeling behavior of the entire sample (after defect removal). The rule for automatically removing fluctuations at the beginning and end is based on the physical fact that the peeling force should change smoothly under steady-state conditions. This step removes transitional noise unrelated to interfacial adhesion performance, resulting in a very high signal-to-noise ratio within each data segment. The fluctuations in the final stitched curve will truly reflect the material's inherent performance changes, rather than operational interference.
[0078] In one embodiment, step S50 splices the effective force-displacement data segments obtained between all dynamic reset processes in the spatiotemporal domain, then performs environmental compensation on the force values according to the temperature and humidity of the test environment, and outputs the calibrated peel force curve.
[0079] Specifically, the spatiotemporal splicing includes:
[0080] Time domain alignment is performed based on the acquisition timestamps corresponding to each effective force-displacement data segment to ensure that the data segments are arranged in chronological order.
[0081] The Sigmoid function or linear interpolation is used to smoothly transition the five data points before and after the splicing point.
[0082] In this embodiment, firstly, spatiotemporal reference alignment is performed. The system arranges the data segments according to their actual occurrence order based on their timestamps, constructing a correct timeline. Next, critical connection of displacement values is performed: since the fixture position changes after each reset, causing discontinuities in displacement records, the system automatically adds an offset to the displacement values of subsequent data segments using an algorithm, ensuring that the starting point precisely connects to the ending point of the previous segment, thus forming a physically continuous X-axis in the displacement dimension. Secondly, smooth transition processing is performed. Near the splicing point between every two data segments, slight force value jumps may be introduced due to test interruptions and restarts, resulting in unnatural "seams" in the curve. To address this, the system extracts five data points before and after the splicing point to form a local window, and recalculates and merges the force values within this window using the Sigmoid function or linear interpolation. This operation achieves a natural, gradual transition of force values from the end of one segment to the beginning of the next, eliminating visually noticeable jumps and making the spliced curve mathematically continuous and smooth. Finally, environmental compensation calibration is implemented. Based on the complete force-displacement curve formed by splicing, the system calls the synchronously recorded temperature and humidity data, and performs normalization calculations on each force value point on the curve according to the environmental coefficient model preset by the material properties (such as temperature and humidity compensation coefficient), correcting it to the theoretical value under standard laboratory environmental conditions, thereby eliminating the influence of environmental fluctuations on the measurement results.
[0083] Specifically, the environmental compensation of the force value based on the temperature and humidity of the test environment includes:
[0084] ;
[0085] In the formula, This is the peeling force correction factor. and These are the reference temperature and reference humidity under standard testing conditions. and These are the temperature and humidity of the test environment, respectively. These are the material property coefficients calibrated through experiments;
[0086] Using correction factors Original peel force value Compensation is performed to obtain the compensated standard force value. :
[0087] ;
[0088] Based on the compensated standard force value A calibrated peel force curve is constructed using the corresponding displacement.
[0089] The modulus, cohesive strength, and interfacial adhesion of adhesives are extremely sensitive to temperature. At standard temperatures... Performance is at its optimal design level at (typically 23°C). When the temperature... Deviation At this time, the mobility of molecular chain segments changes, leading to a decrease in peeling force. This embodiment uses a Gaussian function to describe the attenuation. It is the key to the model. This means that the temperature deviates from either a high or low temperature range. All of these will lead to the correction factor Decrease, that is An increase in this value aligns with the reality that the peel force of many adhesives can change abnormally at both excessively cold temperatures (leading to brittleness and cohesive failure) and excessively hot temperatures (leading to softening and cohesive breakdown). Furthermore, the greater the deviation, the more quadratic the effect, providing a more accurate description of the dramatic changes in performance near the critical temperature.
[0090] Humidity primarily affects two aspects: firstly, the hygroscopic plasticization of the adhesive itself (leading to a decrease in modulus); and secondly, the competitive adsorption of water molecules at the interface (weakening interfacial adhesion). A logarithmic approach is used. This is because the effects of humidity typically vary significantly in the low to medium humidity range, while tending to saturate in the high humidity region. Logarithmic functions can better fit this nonlinear saturation effect, and are more consistent with physical reality than simple linear proportions. The structure ensures that it operates at standard humidity. When this term equals 1, it does not affect the calculation result. Coefficient This is the humidity sensitivity coefficient of the material. The value is usually negative because increased humidity generally leads to a decrease in peel strength. Decrease.
[0091] Ultimately, the effects of temperature and humidity are combined in a multiplicative manner, meaning that the mechanisms by which temperature and humidity affect adhesion performance are relatively independent, but their effects can be coupled and superimposed. This represents a comprehensive environmental reduction factor. It uses the original peel force value. Divide by That is, to obtain the standard environment ( , Theoretical force value under ) .
[0092] By transforming all test results to the same benchmark—a standard laboratory environment—data from tests conducted in different seasons, regions, and even at different times within the same laboratory can be directly and fairly compared. This compensation model quantitatively eliminates the systematic errors introduced by environmental variables, making the final curve more reflective of differences in the material itself and the process, rather than variations in the weather on that day, thus significantly improving the repeatability and accuracy of the test results.
[0093] See Figure 2 In one embodiment, the present invention also provides a system for anti-adhesion pretreatment and dynamic peel force calibration of ultra-thin adhesive tape rolls for implementing the method described in any of the foregoing embodiments, the system comprising:
[0094] The main body of the tensile testing machine has built-in force and displacement sensors;
[0095] The machine vision module, mounted directly above the stripping front, includes an industrial camera, a telecentric lens, and a ring light source, for acquiring images of the stripping front in real time.
[0096] The dynamic cutting module, installed between the clamp and the peeling interface, is used to cut the tape upon triggering.
[0097] Servo clamping module, including a programmable clamping force electric clamp and a displacement feedback unit;
[0098] The control and computing unit is electrically connected to the tensile testing machine host, machine vision module, dynamic cutting module, and servo clamping module, respectively.
[0099] The control and calculation unit is configured to perform the anti-adhesion pretreatment and peel force dynamic calibration method for ultra-thin tape rolls as described in any of the foregoing embodiments.
[0100] In one embodiment, the industrial camera has an image acquisition frame rate of ≥30fps and a pixel resolution of ≥5 million pixels; the ring light source has an illumination angle of 45°~60°.
[0101] During system integration, an industrial camera with a frame rate of at least 30fps and a resolution of at least 5 megapixels is selected and installed directly above the peeling front edge in conjunction with a ring light source at a specific angle (45°~60°). This is triggered uniformly by the control unit to achieve synchronous acquisition of image and mechanical data. The high frame rate ensures complete capture of the dynamics of the rapid peeling process; the high resolution guarantees clear imaging and accurate area measurement of minute defects; and the ring light at a specific angle provides uniform, shadowless illumination, significantly enhancing the contrast of surface defects such as bubbles and wrinkles. The combination of these three elements provides a high-quality, highly reliable visual data foundation for subsequent intelligent defect identification and decision-making.
[0102] In one embodiment, the control and computing unit is configured to two selectable operating modes, specifically:
[0103] The standard test mode is configured to only activate the main tensile testing machine to record the peel force-displacement curve output by the main tensile testing machine.
[0104] The intelligent calibration mode is configured to simultaneously activate the machine vision module, the dynamic cutting module, and the servo clamping module to perform the peel force dynamic calibration test method for ultra-thin tape rolls as described in any of the foregoing embodiments.
[0105] The standard testing mode is designed for rapid, routine testing. During implementation, the system only calls the tensile testing machine host, performs a traditional peel test, and directly records the force-displacement curve. This mode is simple, fast, and has low hardware load, making it suitable for rapid screening and routine quality control scenarios where high testing efficiency is required or where there is sufficient confidence in the consistency of the tape's quality. The intelligent calibration mode, on the other hand, utilizes a complete dynamic calibration system. During implementation, the system synchronously coordinates four modules: tensile testing machine, machine vision, dynamic cutting, and servo clamping, strictly adhering to the aforementioned entire process, including image recognition, dynamic reset, data stitching, and environmental compensation. This mode has high resource consumption and a complex process, but its core value lies in its ability to proactively identify and eliminate defect interference, outputting a high-fidelity calibration curve reflecting the intrinsic properties of the material. It is specifically designed for R&D analysis, precision measurement, anomaly investigation, and the establishment of high-quality standards—occurrences requiring extremely high data accuracy.
[0106] The dual-mode design balances efficiency and accuracy. Users can flexibly choose the mode according to their testing objectives, saving time and costs in routine batch testing and obtaining the highest quality data in critical analysis. This achieves an optimal match between application scenarios, resource investment, and result reliability, significantly improving the practicality and cost-effectiveness of the equipment.
[0107] It is understood that the system provided in this embodiment has functions or includes modules that can be used to execute the methods described in the above method embodiments. The specific implementation can be referred to the description of the above method embodiments, and for the sake of brevity, it will not be repeated here.
[0108] The present invention also provides a computer-readable storage medium storing a computer program, the computer program including program instructions that, when executed by a processor of an electronic device, cause the processor to perform a method as described in any of the above possible implementations.
[0109] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementations should not be considered beyond the scope of this invention.
Claims
1. A method for anti-adhesion pretreatment and dynamic peel force calibration of ultra-thin adhesive tape rolls, characterized in that, The method includes: Obtain an image of the initial peeling front formed when the ultra-thin tape is adhered to the test substrate, and store the image as a reference template; During the peel test of the ultra-thin tape, real-time dynamic images of the peel front, real-time peel force value, real-time peel displacement, and temperature and humidity of the test environment are collected synchronously at a preset frequency. The real-time dynamic image is compared with the reference template to identify whether there is at least one defect feature at the peeling front. The preset defect features include bubbles, wrinkles, glue threads or foreign particles. When the defect feature is identified, the defect area is determined. The dynamic reset trigger index is calculated based on the defect area, real-time peeling force value, and real-time peeling displacement. When the dynamic reset trigger index exceeds a preset threshold, the dynamic reset process is triggered to obtain the effective force-displacement data segment. The effective force-displacement data segments obtained between all dynamic reset processes are spliced in the spatiotemporal domain. The force values are compensated for environmental factors such as temperature and humidity in the test environment, and the calibrated peel force curve is output.
2. The method for anti-adhesion pretreatment and dynamic peel force calibration of ultra-thin adhesive tape rolls according to claim 1, characterized in that, The dynamic reset process includes: Pause the stripping action and maintain the current force value; The ultra-thin tape is cut using laser cutting at a predetermined distance in front of the defective area; Reset the clamp to re-clamp the tape behind the defective area; A pre-peeling operation is performed, peeling at a first rate until the defect area is completely passed. Then, using the displacement point corresponding to the last effective force value as the reference point, the peeling test continues at a second rate; wherein, the first rate is less than the second rate.
3. The method for anti-adhesion pretreatment and dynamic peel force calibration of ultra-thin adhesive tape rolls according to claim 1, characterized in that, The acquisition of effective force-displacement data segment includes: Each time the dynamic reset process is triggered, the time interval between the end time of the previous dynamic reset process and the trigger time of the current dynamic reset process is defined as the effective data collection period; Extract the real-time stripping force value sequence and real-time stripping displacement sequence corresponding to the effective data acquisition period, remove a preset number of fluctuating data points at the beginning and end of the sequence, and form independent data segments; The criteria for removing the fluctuating data points are adjacent data points whose force value change rate exceeds a set smoothing threshold.
4. The method for anti-adhesion pretreatment and dynamic peel force calibration of ultra-thin adhesive tape rolls according to claim 1, characterized in that, The spatiotemporal splicing includes: Time domain alignment is performed based on the acquisition timestamps corresponding to each effective force-displacement data segment to ensure that the data segments are arranged in chronological order. The Sigmoid function or linear interpolation is used to smoothly transition the five data points before and after the splicing point.
5. The method for anti-adhesion pretreatment and dynamic peel force calibration of ultra-thin adhesive tape rolls according to claim 1, characterized in that, The calculation of the dynamic reset trigger index based on the defect area, real-time peeling force value, and real-time peeling displacement includes: ； In the formula, For the current moment The dynamic reset trigger index, Let be the integral variable, representing any historical moment within the time window; This is the real-time peeling force value. The width of the tape. Real-time peeling speed, i.e., displacement Regarding time The derivative of This represents the critical fracture toughness of this type of tape under standard conditions. The area of the identified defects, For the set peeling speed, The time interval between two image acquisitions. For sliding time windows; For integration variables From the past From moment to the present moment The points.
6. The method for anti-adhesion pretreatment and dynamic peel force calibration of ultra-thin adhesive tape rolls according to claim 1, characterized in that, The environmental compensation of the force value based on the temperature and humidity of the test environment includes: ； In the formula, This is the peeling force correction factor. and These are the reference temperature and reference humidity under standard testing conditions. and These are the temperature and humidity of the test environment, respectively. These are the material property coefficients calibrated through experiments; Using correction factors Original peel force value Compensation is performed to obtain the compensated standard force value. : ； Based on the compensated standard force value A calibrated peel force curve is constructed using the corresponding displacement.
7. A system for anti-adhesion pretreatment and dynamic peel force calibration of ultra-thin adhesive tape rolls for implementing the method as described in any one of claims 1-6, characterized in that, The system includes: The main body of the tensile testing machine has built-in force and displacement sensors; The machine vision module, mounted directly above the stripping front, includes an industrial camera, a telecentric lens, and a ring light source, for acquiring images of the stripping front in real time. The dynamic cutting module, installed between the clamp and the peeling interface, is used to cut the tape upon triggering. Servo clamping module, including a programmable clamping force electric clamp and a displacement feedback unit; The control and computing unit is electrically connected to the tensile testing machine host, machine vision module, dynamic cutting module, and servo clamping module, respectively. The control and calculation unit is configured to perform the anti-adhesion pretreatment and peel force dynamic calibration method for ultra-thin adhesive tape rolls as described in any one of claims 1-6.
8. The anti-adhesion pretreatment and peel force dynamic calibration system for ultra-thin adhesive tape rolls according to claim 7, characterized in that, The industrial camera has an image acquisition frame rate of ≥30fps and a pixel resolution of ≥5 million pixels; the ring light source has an illumination angle of 45°~60°.
9. The anti-adhesion pretreatment and peel force dynamic calibration system for ultra-thin adhesive tape rolls according to claim 7, characterized in that, The control and computing unit is configured with two selectable operating modes, specifically: The standard test mode is configured to only activate the main tensile testing machine to record the peel force-displacement curve output by the main tensile testing machine. The intelligent calibration mode is configured to simultaneously activate the machine vision module, the dynamic cutting module, and the servo clamping module to perform the peel force dynamic calibration test method for ultra-thin adhesive tape rolls as described in any one of claims 1-6.
10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program, which includes program instructions that, when executed by a processor of an electronic device, cause the processor to perform the method for anti-adhesion pretreatment and dynamic peel force calibration of ultra-thin adhesive tape rolls as described in any one of claims 1 to 6.