In-situ synchrotron radiation nano-ct characterization method for rsofc anode
CN122430367APending Publication Date: 2026-07-21SHANGHAI INSTITUTE OF APPLIED PHYSICS CHINESE ACADEMY OF SCIENCES
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- SHANGHAI INSTITUTE OF APPLIED PHYSICS CHINESE ACADEMY OF SCIENCES
- Filing Date
- 2026-04-17
- Publication Date
- 2026-07-21
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Figure CN122430367A_ABST
Abstract
The present application relates to a kind of RSOFC anode in-situ synchrotron nanometer CT characterization method, it includes selecting NiO / YSZ composite material as sample, using FIB-SEM processing technology is shaped into fine cylindrical and fixed with sample;Assemble and include direct current heating module with H2 atmosphere control module in-situ RSOFC environment simulation unit;Sample is from room temperature to working temperature;Every temperature preset temperature interval, pause heating and constant temperature, start synchrotron nanometer CT scanning;After heating to working temperature and constant temperature stable, switch to H2 atmosphere and make sample reduction reaction, collect the three-dimensional CT data of anode after reduction;To the CT projection image of acquisition three-dimensional reconstruction fitting, obtain the internal structure information of anode under different working conditions.The present application can reproduce RSOFC anode actual working condition, reduce sample vibration, accurately obtain anode key structure parameter, provide data support for RSOFC anode process optimization.
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