In-situ synchrotron radiation nano-ct characterization method for rsofc anode

CN122430367APending Publication Date: 2026-07-21SHANGHAI INSTITUTE OF APPLIED PHYSICS CHINESE ACADEMY OF SCIENCES
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
SHANGHAI INSTITUTE OF APPLIED PHYSICS CHINESE ACADEMY OF SCIENCES
Filing Date
2026-04-17
Publication Date
2026-07-21

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Abstract

The present application relates to a kind of RSOFC anode in-situ synchrotron nanometer CT characterization method, it includes selecting NiO / YSZ composite material as sample, using FIB-SEM processing technology is shaped into fine cylindrical and fixed with sample;Assemble and include direct current heating module with H2 atmosphere control module in-situ RSOFC environment simulation unit;Sample is from room temperature to working temperature;Every temperature preset temperature interval, pause heating and constant temperature, start synchrotron nanometer CT scanning;After heating to working temperature and constant temperature stable, switch to H2 atmosphere and make sample reduction reaction, collect the three-dimensional CT data of anode after reduction;To the CT projection image of acquisition three-dimensional reconstruction fitting, obtain the internal structure information of anode under different working conditions.The present application can reproduce RSOFC anode actual working condition, reduce sample vibration, accurately obtain anode key structure parameter, provide data support for RSOFC anode process optimization.
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