A phased array antenna black box test device and method of use thereof

Abstract

The application discloses a phased array antenna dark box testing device and a use method thereof. The device comprises a wave-absorbing box body, a dual-polarization multi-feed array is installed in the wave-absorbing box body, a dual-polarization horn probe in the center of the dual-polarization multi-feed array has a 360-degree polarization freedom degree, an AUT testing turntable is also installed in the wave-absorbing box body, the AUT testing turntable is oppositely arranged with the dual-polarization multi-feed array, the AUT testing turntable has a rotation freedom degree in a horizontal direction, the AUT testing turntable has a rotation freedom degree in a vertical direction, and an output end of the AUT testing turntable is connected with a to-be-tested antenna, and the AUT testing turntable is used for adjusting the attitude of the to-be-tested antenna. Through parallel testing of the dual-polarization horn probes in the dual-polarization multi-feed array, the testing efficiency is improved, and complex testing tasks can be completed in a short time.

Description

Technical Field

[0001] This invention specifically relates to a phased array antenna anechoic chamber testing device and its usage method. Background Technology

[0002] Phased array antennas, with their advantages of beam agility, multi-target tracking, high gain, and strong anti-interference capabilities, have been widely and critically applied in military and civilian fields such as satellite communication, mobile communication, airborne fire control radar, and electronic warfare. As communication and radar technologies develop towards higher frequencies, larger arrays, and integrated systems, the array size of phased array antennas continues to expand and their structural complexity increases, placing higher demands on the efficiency, accuracy, and convenience of their performance testing.

[0003] Traditional phased array antenna testing methods primarily employ far-field and near-field testing. Far-field testing requires meeting specific far-field conditions, typically necessitating a test area tens or even hundreds of meters long. This not only imposes stringent space requirements but also makes the test results susceptible to external electromagnetic interference, compromising stability. While near-field testing can reduce the required space, it necessitates complex equipment such as high-precision scanning robotic arms and vector network analyzers. Furthermore, the testing process involves extensive data acquisition and complex near-field / far-field transformation calculations, resulting in test cycles of several hours or even days for a single antenna, leading to extremely low efficiency. Moreover, traditional testing methods are mostly offline, making them ill-suited for the agile development processes of rapid prototyping and iterative optimization required in modern communication equipment development. Summary of the Invention

[0004] Purpose of the invention: To provide a phased array antenna anechoic chamber testing device and its usage method, thereby solving the aforementioned problems existing in the prior art.

[0005] Technical Solution: A phased array antenna anechoic chamber testing device includes an absorbing chamber, in which a dual-polarized multi-feed array is installed. The dual-polarized horn probe at the center of the dual-polarized multi-feed array has 360° polarization degree of freedom. An AUT test turntable is also installed in the absorbing chamber. The AUT test turntable is arranged opposite to the dual-polarized multi-feed array. The AUT test turntable has one rotational degree of freedom in the horizontal direction and one rotational degree of freedom in the vertical direction. The output end of the AUT test turntable is connected to the antenna under test. The AUT test turntable is used to adjust the attitude of the antenna under test.

[0006] Preferably, the absorbing chamber includes a steel support frame. The bottom surface of the steel support frame is formed by splicing several interlocking panels to create a closed structure. All other surfaces of the steel support frame are formed by splicing several interlocking blocks to enclose each surface of the steel support frame and form a microwave anechoic chamber. The interlocking blocks are made of color-coated clean steel plates. The seams of the interlocking blocks are spliced ​​using a double-layer conductive copper foil staggered covering method. Each interlocking block and splicing panel has an absorbing layer installed on its inner wall. The splicing plates are made of galvanized steel plates. The seams of the splicing plates are spliced ​​using a conductive adhesive shielding method.

[0007] Preferably, the AUT test turntable includes a mounting shell, which is installed inside the absorbing box. A servo motor is installed inside the mounting shell. A rotating block is horizontally mounted on the top surface of the mounting shell. The rotating block is connected to the output end of the servo motor. A mounting column is longitudinally mounted on the edge of the rotating block. The mounting column rotates circumferentially along the horizontal direction of the mounting shell under the cooperation of the servo motor and the rotating block. A pitch adjustment component is installed on the top of the mounting column. A translation adjustment component is installed on the moving end of the pitch adjustment component. The antenna under test is mounted on the moving end of the translation adjustment component.

[0008] Preferably, the pitch adjustment component includes an arc-shaped housing, which is a hollow structure with an open side. The arc-shaped housing is installed on the side of the mounting column. An arc-shaped gear is installed on the inner wall of the arc-shaped housing near the dual-polarization multi-feed array. A mounting part is slidably installed at the open end of the arc-shaped housing. A drive source is installed on the mounting part. The output end of the drive source is connected to the arc-shaped gear through a spur gear. The translation adjustment component is installed on the mounting part. Preferably, in the dual-polarized horn probe, each set of arc-shaped sidewalls of the arc-shaped housing has slide rails on both the inner and outer sides. The mounting part includes a movable plate, and several limiting wheels are installed on the movable plate near the sidewall of the arc-shaped housing. The limiting wheels are slidably installed in pairs in the slide rails on the inner and outer sides of the arc-shaped sidewalls. The driving source is installed on the side of the movable plate away from the arc-shaped housing. The output end of the driving source passes through the movable plate. The movable plate reciprocates along the arc direction of the arc-shaped housing under the cooperation of the circular gear installed at the output end of the driving source and the arc-shaped gear on the inner wall of the arc-shaped housing.

[0009] Preferably, the translation adjustment component includes a translation housing, which is mounted on the moving plate. A translation axis is installed inside the translation housing, a polarization axis is installed at the moving end of the translation axis, and an antenna under test is installed at the end of the polarization axis.

[0010] Preferably, the dual-polarized multi-feed array includes a mounting frame, which is installed on the side wall of the absorbing box. An arc-shaped frame is installed on the side of the mounting frame near the AUT test turntable. Several dual-polarized horn probes are circumferentially arrayed on the arc-shaped frame. The dual-polarized horn probe located at the center of the arc-shaped frame is installed in the center of the arc-shaped frame by a rotating component.

[0011] Preferably, the rotating component includes a rotating mounting base, which is mounted at the center of the mounting frame. The dual-polarized horn probe at the center is mounted on the rotating mounting base. A rotating polarization motor is mounted at the center of the mounting frame and is connected to the dual-polarized horn probe.

[0012] A method for using a phased array antenna dark box testing device, implemented using the aforementioned phased array antenna dark box testing device, includes the following steps:

[0013] S1. Measure the link cable loss and the free space loss between the antenna under test and the receiving horn antenna.

[0014] S2. After setting the antenna under test and the receiving horn antenna to be of the same polarization, install the antenna under test on the AUT test turntable. Use the AUT test turntable to adjust the antenna under test so that the rotation center of the AUT test turntable is aligned with the phase center in the dual-polarized multi-feed array. At this time, the angle of the pitch adjustment component in the AUT test turntable is 0 degrees.

[0015] S3. Simultaneously acquire far-field data from multiple antenna positions using the dual-polarized horn probe in the dual-polarized multi-feed array. At the same time, use the AUT test turntable to rotate the antenna under test 360°. Adjust the elevation beam angle of the antenna under test using the elevation adjustment component. Control the AUT test turntable to deflect by the same angle so that the antenna beam under test is aligned with the dual-polarized horn probe. Record the received power of the spectrum analyzer and calculate the equivalent omnidirectional radiated power.

[0016] S4. Obtain test data at the required angle using an external vector network analyzer, and synthesize the axis ratio pattern using software to obtain the axis ratio;

[0017] S5. Align the antenna beam under test with the dual-polarized horn probe using the AUT test turntable, adjust the pitch angle of the pitch adjustment component to 0°, set the test frequency and output power using the signal source, provide the excitation signal to the antenna under test, and pre-measure the cable insertion loss Ls and the low-noise amplifier gain G between the dual-polarized horn probe and the spectrum analyzer. LNA The spectrum analyzer records the clutter power P within a specified spurious test bandwidth deviating from the test frequency. 读数 The stray power is calculated using the following formula: P 杂散 =P 读数 +Ls-GLNA ;

[0018] S6. Set the normal beam of the antenna under test, adjust the pitch angle of the pitch adjustment device to 0°, preset the test frequency, transmit power P0 and waveform signal in the modulation signal simulator, provide the excitation signal for the dual-polarized horn probe, and pre-measure the cable insertion loss Ls between the dual-polarized horn probe and the spectrum analyzer, the insertion loss La of the programmable attenuator, and the gain G of the dual-polarized horn probe. 喇叭 Power amplifier gain G PA and spatial attenuation R l Simultaneously, the AUT receives the demodulation test signal and sends feedback signals to the host computer indicating successful or failed demodulation. When the AUT receives a demodulation signal indicating demodulation failure, it records the attenuation reading P of the programmable attenuator. 读数 The minimum demodulated power level of the receiver is calculated using the formula for receiving sensitivity. The formula is as follows: P 灵敏度 =P0-P 读数 -Ls-La+G PA+ +G 喇叭 -R l It automatically obtains the receiver sensitivity level value by reading the attenuation level of the programmable attenuator and saves the test data according to the frequency point.

[0019] Preferably, the calculation process for the equivalent isotropic radiated power in step S3 is as follows:

[0020] When the antenna under test is linearly polarized, the formula for calculating the equivalent isotropic radiated power of the antenna under test is as follows:

[0021] EIRP 线极化 =PR1+L+L bs -G; where: EIRP 线极化 PR1 represents the equivalent isotropic radiated power of the antenna under test, PR1 represents the received power of the spectrum analyzer; L represents the cable loss between the spectrum analyzer and the receiving antenna and the insertion loss of other components; L bs G represents the free space loss between the antenna under test and the dual-polarized horn probe, and G represents the receiving horn antenna gain.

[0022] When the antenna under test is circularly polarized, the formula for calculating the equivalent isotropic radiated power of the antenna under test is as follows:

[0023] In the formula: lg represents the equivalent isotropic radiated power of the antenna under test, and log represents the power of the antenna under test. This represents the equivalent isotropic radiated power value for horizontal polarization. This represents the equivalent isotropic radiated power value of vertical polarization.

[0024] Beneficial effects: This invention relates to a phased array antenna anechoic chamber testing device and its usage method. By using several dual-polarized horn probes in a dual-polarized multi-feed array for parallel testing, the testing efficiency is improved, and complex testing tasks can be completed in a short time.

[0025] By coordinating the servo motors, pitch adjustment components, and translation adjustment components in the AUT test turntable, the antenna under test (AUT) mounted on the moving end of the translation adjustment component can achieve six degrees of freedom adjustment in space. This allows the AUT to accurately reach the preset test posture, meeting the position and posture requirements in diverse test scenarios. Attached Figure Description

[0026] Figure 1 This is an overall schematic diagram of the present invention;

[0027] Figure 2 This is a schematic diagram of the AUT test turntable of the present invention;

[0028] Figure 3 for Figure 2 Enlarged view of point A;

[0029] Figure 4 This is an exploded view of the AUT test turntable of the present invention;

[0030] Figure 5 for Figure 4 Enlarged view of point B;

[0031] Figure 6 This is a partial schematic diagram of the AUT test turntable of the present invention;

[0032] Figure 7 This is a schematic diagram of the translation adjustment component of the present invention;

[0033] Figure 8 This is a block diagram of the standard horn rotation axis ratio testing system of the present invention;

[0034] Figure 9 This is a block diagram of the circular polarization synthesis axial ratio testing system of the present invention;

[0035] Figure 10 This is a block diagram of the equivalent isotropic radiated power testing system of the present invention;

[0036] Figure 11 This is a block diagram of the stray gas testing system of the present invention;

[0037] Figure 12 This is a block diagram of the sensitivity testing system of the present invention;

[0038] Figure 13 This is the output result for the 1GHz band of this invention;

[0039] Figure 14This is the output result for the 2GHz band of this invention;

[0040] Figure 15 This is the output result for the 5GHz band of this invention;

[0041] Figure 16 This is the output result for the 10GHz band of this invention;

[0042] Figure 17 This is the output result of the 18GHz band of the present invention;

[0043] Figure 18 This is the output result of the 31GHz band of the present invention;

[0044] Figure 19 This is the output result of the 38GHz band of the present invention;

[0045] Figure 20 This is a polyline plot of the far-field three-dimensional data of the present invention;

[0046] Figure 21 The test results are for the 3D radiation pattern of the antenna under test according to the present invention.

[0047] Figures 1 to 7 The reference numerals in the attached diagram are as follows: 1. Absorbing box; 2. Dual-polarized multi-feed array; 3. AUT test turntable; 4. Mounting shell; 5. Servo motor; 6. Rotating block; 7. Mounting column; 8. Pitch adjustment component; 9. Translation adjustment component;

[0048] 21. Mounting bracket; 22. Dual-polarized horn probe; 23. Rotary mounting base; 24. Rotary polarization motor;

[0049] 81. Arc-shaped housing; 82. Arc-shaped gear; 83. Drive source; 84. Slide rail; 85. Moving plate; 86. Limiting wheel; 87. Circular gear;

[0050] 91. Translation shell; 92. Translation axis; 93. Polarization axis. Detailed Implementation

[0051] like Figures 1 to 21As shown, the present invention provides a technical solution: a phased array antenna anechoic chamber testing device, comprising an absorbing chamber 1, wherein the absorbing chamber 1 includes a steel support frame, the bottom surface of the steel support frame is formed by splicing several splicing plates together to form a closed structure, and each of the other surfaces of the steel support frame is formed by splicing several assembly blocks together to close each surface of the steel support frame to form a microwave anechoic chamber. The assembly blocks are made of color steel clean plate, and the seams of the assembly blocks are spliced ​​by a double-layer conductive copper foil staggered covering method. Each assembly block and splicing plate has an absorbing layer installed on its inner wall. The splicing plates are made of galvanized plate, and the seams of the splicing plates are spliced ​​by a conductive adhesive shielding method. A dual-polarized multi-feed array 2 and an AUT test turntable 3 are respectively installed on the splicing plates, wherein the dual-polarized horn probe 22 at the center of the dual-polarized multi-feed array 2 has 360° polarization. The AUT test turntable 3 and the dual-polarized multi-feed array 2 are set opposite each other, that is, the dual-polarized horn probes 22 in the dual-polarized multi-feed array 2 face the AUT test turntable 3. The AUT test turntable 3 has one rotational degree of freedom in the horizontal direction and one rotational degree of freedom in the vertical direction. The output end of the AUT test turntable 3 is connected to the antenna under test. The AUT test turntable 3 is used to adjust the attitude of the antenna under test, so that the antenna under test has six degrees of freedom of adjustment, which can enable the antenna under test to accurately reach the preset test attitude and meet the position and attitude requirements in various test scenarios. At the same time, by testing several dual-polarized horn probes 22 in the dual-polarized multi-feed array 2 in parallel, the test efficiency is improved, and complex test tasks can be completed in a short time.

[0052] In a further embodiment, the absorbing chamber 1 includes a steel support frame. In this embodiment, it adopts dimensions of 5m (L) × 3.2m (W) × 5.2m (H) to achieve a shielding effectiveness ≥60dB@1~40GHz. The bottom surface of the steel support frame is formed by splicing several splicing plates together to form a closed structure. The other surfaces of the steel support frame are also formed by splicing several assembly blocks together to enclose each surface of the steel support frame and form a microwave anechoic chamber. The assembly blocks are made of color steel cleanroom panels, and the seams of the assembly blocks are spliced ​​using a double-layer conductive copper foil staggered covering method. The splicing plates are made of galvanized steel plates, and the seams of the splicing plates are spliced ​​using a conductive adhesive shielding method. Each assembly block and splicing plate has an absorbing layer installed on its inner wall. The absorbing layer is made of polyurethane absorbing material, so that the reflectivity level of the microwave anechoic chamber is ≤-35dB@1GHz~≤-50dB@6GHz and above.

[0053] like Figure 2 , 5As shown in Figure 7, in a further embodiment, the AUT test turntable 3 includes a mounting shell 4, which is installed inside the microwave absorbing box 1. A servo motor 5 is installed inside the mounting shell 4. A rotating block 6 is horizontally mounted on the top surface of the mounting shell 4. The rotating block 6 is connected to the output end of the servo motor 5. A mounting column 7 is longitudinally mounted on the edge of the rotating block 6. The mounting column 7 rotates circumferentially along the horizontal direction of the mounting shell 4 under the cooperation of the servo motor 5 and the rotating block 6. A pitch adjustment component is installed on the top of the mounting column 7. 8. A translation adjustment component 9 is installed at the moving end of the pitch adjustment component 8. The antenna under test is installed at the moving end of the translation adjustment component 9. The pitch adjustment component 8 includes an arc-shaped housing 81, which is a hollow structure with one open side. The arc-shaped housing 81 is installed on the side of the mounting column 7. An arc-shaped gear 82 is installed on the inner wall of the arc-shaped housing 81 near the dual-polarized multi-feed array 2. A mounting part is slidably installed at the open end of the arc-shaped housing 81. A drive source 83 is installed on the mounting part. The output of the drive source 83 is... The output end is connected to the arc gear 82 via a spur gear 87. The translation adjustment component 9 is installed on the mounting part. Each set of arc sidewalls of the arc housing 81 has a slide rail 84 on both the inner and outer sides. The mounting part includes a movable plate 85. Several limiting wheels 86 are installed on the sidewall of the movable plate 85 near the arc housing 81. The limiting wheels 86 are slidably installed in pairs in the slide rails 84 on both the inner and outer sides of the arc sidewall. The drive source 83 is installed on the side of the movable plate 85 away from the arc housing 81. The output end of the drive source 83 The movable plate 85 is penetrated by a circular gear 87 installed at the output end of the drive source 83, which cooperates with the arc gear 82 on the inner wall of the arc housing 81 to reciprocate along the arc direction of the arc housing 81. The translation adjustment component 9 includes a translation housing 91, which is installed on the movable plate 85. A translation shaft 92 is installed inside the translation housing 91. The effective stroke of the translation shaft 92 is ≥250mm. A polarization shaft 93 is installed at the moving end of the translation shaft 92. The antenna under test is installed at the end of the polarization shaft 93.

[0054] Specifically, the servo motor 5 drives the rotating block 6 to rotate, causing the antenna under test to rotate 360° in the horizontal direction. The pitch adjustment component 8 adjusts the antenna under test to move back and forth along the arc-shaped housing 81 to adjust the angle of the antenna under test. The translation axis 92 drives the antenna under test to move back and forth along the length of the moving plate 85 to adjust the distance between the antenna under test and the dual-polarized horn probe 22. Under the drive of the drive source 83, the antenna under test is driven to rotate 360° in the vertical direction, realizing the adjustment of the six degrees of freedom of the antenna under test.

[0055] like Figure 2-3As shown, in a further embodiment, the dual-polarized multi-feed array 2 includes a mounting frame 21, which is mounted on the side wall of the absorbing box 1. An arc-shaped frame is mounted on the side of the mounting frame 21 near the AUT test turntable 3. Several dual-polarized horn probes 22 are mounted circumferentially on the arc-shaped frame. In this embodiment, five sets of dual-polarized horn probes 22 are used. The dual-polarized horn probes 22 are evenly distributed on the mounting frame 21 at 30° intervals. The dual-polarized horn probe 22 located at the center of the arc-shaped frame is mounted in the center of the arc-shaped frame by a rotating component. The rotating component includes a rotating mounting base 23, which is mounted in the center of the mounting frame 21. The central dual-polarized horn probe 22 is mounted on the rotating mounting base 23. A rotating polarization motor 24 is mounted in the center of the mounting frame 21 and is connected to the dual-polarized horn probe 22.

[0056] The method of using the phased array antenna dark box test device, implemented through the aforementioned phased array antenna dark box test device, includes the following steps:

[0057] Step 1: Measure the link cable loss and the free space loss between the antenna under test and the receiving horn antenna;

[0058] Step 2: After setting the antenna under test (DUT) and the receiving horn antenna to be of the same polarization, mount the DUT on the AUT test turntable 3. Use the AUT test turntable 3 to adjust the DUT until the rotation center of the AUT test turntable 3 is aligned with the phase center in the dual-polarized multi-feed array 2. At this time, the angle of the pitch adjustment component 8 in the AUT test turntable 3 is 0 degrees. Figure 8 and 9 As shown, the antenna under test (AUT) is adjusted using the AUT test turntable 3. With the cooperation of an external spectrum analyzer, signal source, and radar antenna beam controller, the axial ratio test results for each test beam are recorded, completing the axial ratio test of the antenna under test, covering the 1GHz to 40GHz frequency band, with a dynamic range ≥63dB. Figures 13 to 19 The figures shown are antenna performance diagrams for the receiving horn antenna at frequencies of 1GHz, 2GHz, 5GHz, 10GHz, 18GHz, 31GHz, and 38GHz. It can be concluded that the test can be completed in the 1GHz to 40GHz frequency band without replacing the receiving horn antenna. There is no need to replace the receiving horn antenna for different frequency bands, which shortens the test cycle, reduces the complicated operation of disassembling and assembling the receiving horn antenna, and improves the system stability.

[0059] Step 3, as follows Figure 10As shown, the dual-polarized horn probe 22 in the dual-polarized multi-feed array 2 simultaneously acquires far-field data from multiple antenna positions. Simultaneously, the AUT test turntable 3 rotates the antenna under test 360°. The elevation beam angle of the antenna under test is adjusted using the elevation adjustment component 8, and the AUT test turntable 3 is shifted by the same angle to align the antenna beam with the dual-polarized horn probe 22. The received power of the spectrum analyzer is recorded, and the equivalent isotropic radiated power is calculated. The calculation process for the equivalent isotropic radiated power is as follows:

[0060] When the antenna under test is linearly polarized, the formula for calculating the equivalent isotropic radiated power of the antenna under test is as follows:

[0061] EIRP 线极化 =PR1+L+L bs -G; where: EIRP 线极化 PR1 represents the equivalent isotropic radiated power of the antenna under test, PR1 represents the received power of the spectrum analyzer; L represents the cable loss between the spectrum analyzer and the receiving antenna and the insertion loss of other components; L bs G represents the free space loss between the antenna under test and the dual-polarized horn probe, and G represents the receiving horn antenna gain.

[0062] When the antenna under test is circularly polarized, the formula for calculating the equivalent isotropic radiated power of the antenna under test is as follows:

[0063] In the formula: lg represents the equivalent isotropic radiated power of the antenna under test, and log represents the power of the antenna under test. This represents the equivalent isotropic radiated power value for horizontal polarization. This represents the equivalent isotropic radiated power value for vertical polarization.

[0064] Step 4: Obtain test data at the required angle using an external vector network analyzer, and synthesize the axial ratio radiation pattern using software to obtain the axial ratio, such as... Figure 20 The image shown is a three-dimensional cross-sectional view of the antenna in the far field. Figure 21 The corresponding far-field three-dimensional test results diagram visually presents the complete radiation distribution of the antenna in the three-dimensional space of azimuth and elevation angles, further proving that the receiving horn antenna has good radiation characteristics in the 1GHz to 40GHz frequency band, meeting the system's ultra-wideband frequency coverage requirements.

[0065] Step 5, as follows Figure 11 As shown, the beam of the antenna under test (AUT) was aligned with the dual-polarized horn probe using the AUT test turntable. The pitch angle of the pitch adjustment component was adjusted to 0°. The test frequency and output power were set using a signal source to provide the excitation signal to the antenna under test. The cable insertion loss Ls between the dual-polarized horn probe and the spectrum analyzer and the low-noise amplifier gain G were measured in advance. LNAThe spectrum analyzer records the clutter power P within a specified spurious test bandwidth deviating from the test frequency. 读数 The stray power is calculated using the following formula: P 杂散 =P 读数 +Ls-G LNA ;

[0066] Step Six, as Figure 12 As shown, the normal beam of the antenna under test is set, the pitch angle of the pitch adjustment device is adjusted to 0°, the modulation signal simulator is preset to the test frequency, the transmit power P0 and waveform signal are provided, the excitation signal of the dual-polarized horn probe is provided, and the cable insertion loss Ls between the dual-polarized horn probe and the spectrum analyzer, the insertion loss La of the programmable attenuator, and the gain G of the dual-polarized horn probe are measured in advance. 喇叭 Power amplifier gain G PA and spatial attenuation R l Simultaneously, the AUT receives the demodulation test signal and sends feedback signals to the host computer indicating successful or failed demodulation. When the AUT receives a demodulation signal indicating demodulation failure, it records the attenuation reading P of the programmable attenuator. 读数 The minimum demodulated power level of the receiver is calculated using the formula for receiving sensitivity. The formula is as follows: P 灵敏度 =P0-P 读数 -Ls-La+G PA+ +G 喇叭 -R l It automatically obtains the receiver sensitivity level value by reading the attenuation level of the programmable attenuator and saves the test data according to the frequency point.

[0067] The preferred embodiments of the present invention have been described in detail above. However, the present invention is not limited to the specific details in the above embodiments. Within the scope of the technical concept of the present invention, various equivalent transformations can be made to the technical solutions of the present invention, and these equivalent transformations all fall within the protection scope of the present invention.

Claims

1. A method for using a phased array antenna dark box testing device, comprising an absorbing box (1), wherein a dual-polarized multi-feed array (2) is installed inside the absorbing box (1), and a dual-polarized horn probe (22) at the center of the dual-polarized multi-feed array (2) has 360° polarization degree of freedom; an AUT test turntable (3) is also installed inside the absorbing box (1), the AUT test turntable (3) is arranged opposite to the dual-polarized multi-feed array (2), the AUT test turntable (3) has one rotational degree of freedom in the horizontal direction and one rotational degree of freedom in the vertical direction, the output end of the AUT test turntable (3) is connected to the antenna under test, and the AUT test turntable (3) is used to adjust the attitude of the antenna under test, characterized in that, Includes the following steps: S1. Measure the link cable loss and the free space loss between the antenna under test and the receiving horn antenna. S2. After setting the antenna under test and the receiving horn antenna to be of the same polarization, install the antenna under test on the AUT test turntable. Use the AUT test turntable to adjust the antenna under test so that the rotation center of the AUT test turntable is aligned with the phase center in the dual-polarized multi-feed array. At this time, the angle of the pitch adjustment component in the AUT test turntable is 0 degrees. S3. Simultaneously acquire far-field data from multiple antenna positions using the dual-polarized horn probe in the dual-polarized multi-feed array. At the same time, use the AUT test turntable to rotate the antenna under test 360°. Adjust the elevation beam angle of the antenna under test using the elevation adjustment component. Control the AUT test turntable to deflect by the same angle so that the antenna beam under test is aligned with the dual-polarized horn probe. Record the received power of the spectrum analyzer and calculate the equivalent omnidirectional radiated power. S4. Obtain test data at the required angle using an external vector network analyzer, and synthesize the axis ratio pattern using software to obtain the axis ratio; S5. Align the antenna beam under test with the dual-polarized horn probe using the AUT test turntable, adjust the pitch angle of the pitch adjustment component to 0°, set the test frequency and output power using the signal source, provide the excitation signal to the antenna under test, and pre-measure the cable insertion loss Ls and the low-noise amplifier gain G between the dual-polarized horn probe and the spectrum analyzer. LNA The spectrum analyzer records the clutter power P within a specified spurious test bandwidth deviating from the test frequency. 读数 The stray power is calculated using the following formula: P 杂散 =P 读数 +Ls-G LNA ; S6. Set the normal beam of the antenna under test, adjust the pitch angle of the pitch adjustment device to 0°, preset the test frequency, transmit power P0 and waveform signal in the modulation signal simulator, provide the excitation signal for the dual-polarized horn probe, and pre-measure the cable insertion loss Ls between the dual-polarized horn probe and the spectrum analyzer, the insertion loss La of the programmable attenuator, and the gain G of the dual-polarized horn probe. 喇叭 Power amplifier gain G PA and spatial attenuation R l Simultaneously, the AUT receives the demodulation test signal and sends feedback signals to the host computer indicating successful or failed demodulation. When the AUT receives a demodulation signal indicating demodulation failure, it records the attenuation reading P of the programmable attenuator. 读数 The minimum demodulated power level of the receiver is calculated using the formula for receiving sensitivity. The formula is as follows: P 灵敏度 =P0-P 读数 -Ls-La+G PA+ +G 喇叭 -R l It automatically obtains the receiver sensitivity level value by reading the attenuation level of the programmable attenuator and saves the test data according to the frequency point.

2. The method of using the phased array antenna dark box testing device according to claim 1, characterized in that, The microwave absorbing box (1) includes a steel support frame. The bottom surface of the steel support frame is formed by splicing several splicing plates together to form a closed structure. All other surfaces of the steel support frame are spliced ​​together by several assembly blocks, so that each surface of the steel support frame is closed to form a microwave anechoic chamber. The assembly blocks are made of color steel clean plate. The seams of the assembly blocks are spliced ​​by double-layer conductive copper foil in an alternating manner. Each assembly block and splicing plate has a microwave absorbing layer installed on its inner wall. The splicing plate is made of galvanized plate. The seams of the splicing plates are spliced ​​by conductive adhesive shielding.

3. The method of using the phased array antenna dark box testing device according to claim 1, characterized in that, The AUT test turntable (3) includes a mounting shell (4), which is installed inside the absorbing box (1). A servo motor (5) is installed inside the mounting shell (4). A rotating block (6) is horizontally installed on the top surface of the mounting shell (4). The rotating block (6) is connected to the output end of the servo motor (5). A mounting column (7) is installed along the longitudinal direction of the edge of the rotating block (6). The mounting column (7) rotates circumferentially along the horizontal direction of the mounting shell (4) under the cooperation of the servo motor (5) and the rotating block (6). A pitch adjustment component (8) is installed on the top of the mounting column (7). A translation adjustment component (9) is installed at the moving end of the pitch adjustment component (8). The antenna under test is installed at the moving end of the translation adjustment component (9).

4. The method of using the phased array antenna dark box testing device according to claim 3, characterized in that, The pitch adjustment component (8) includes an arc-shaped housing (81), which is a hollow structure with an open side. The arc-shaped housing (81) is installed on the side of the mounting column (7). An arc-shaped gear (82) is installed on the inner wall of the arc-shaped housing (81) near the dual-polarized multi-feed array (2). A mounting part is slidably installed at the open end of the arc-shaped housing (81). A drive source (83) is installed on the mounting part. The output end of the drive source (83) is meshed with the arc-shaped gear (82) through a spur gear (87). The translation adjustment component (9) is installed on the mounting part.

5. The method of using the phased array antenna dark box testing device according to claim 4, characterized in that, Each set of arc-shaped sidewalls of the arc-shaped housing (81) is provided with slide rails (84) on both the inner and outer sides. The mounting part includes a movable plate (85). Several limiting wheels (86) are installed on the movable plate (85) near the sidewall of the arc-shaped housing (81). The limiting wheels (86) are slidably installed in pairs in the slide rails (84) on both the inner and outer sides of the arc-shaped sidewall. The driving source (83) is installed on the side of the movable plate (85) away from the arc-shaped housing (81). The output end of the driving source (83) passes through the movable plate (85). The movable plate (85) moves back and forth along the arc direction of the arc-shaped housing (81) under the cooperation of the spherical gear (87) installed at the output end of the driving source (83) and the arc-shaped gear (82) on the inner wall of the arc-shaped housing (81).

6. The method of using the phased array antenna dark box testing device according to claim 5, characterized in that, The translation adjustment component (9) includes a translation housing (91), which is mounted on the moving plate (85). A translation axis (92) is installed inside the translation housing (91). A polarization axis (93) is installed at the moving end of the translation axis (92), and an antenna to be tested is installed at the end of the polarization axis (93).

7. The method of using the phased array antenna dark box testing device according to claim 1, characterized in that, The dual-polarized multi-feed array (2) includes a mounting frame (21), which is installed on the side wall of the absorbing box (1). An arc-shaped frame is installed on the side of the mounting frame (21) near the AUT test turntable (3). Several dual-polarized horn probes (22) are installed circumferentially on the arc-shaped frame. The dual-polarized horn probe (22) located at the center of the arc-shaped frame is installed in the center of the arc-shaped frame by a rotating component.

8. The method of using the phased array antenna dark box testing device according to claim 7, characterized in that, The rotating component includes a rotating mounting base (23), which is mounted in the center of the mounting frame (21). The dual-polarized horn probe (22) in the center is mounted on the rotating mounting base (23). A rotating polarization motor (24) is mounted in the center of the mounting frame (21), and the rotating polarization motor (24) is connected to the dual-polarized horn probe (22).

9. The method of using the phased array antenna dark box testing device according to claim 1, characterized in that, The calculation process for the equivalent isotropic radiated power in step S3 is as follows: When the antenna under test is linearly polarized, the formula for calculating the equivalent isotropic radiated power of the antenna under test is as follows: EIRP 线极化 =PR1+L+L bs -G; where: EIRP 线极化 PR1 represents the equivalent isotropic radiated power of the antenna under test, PR1 represents the received power of the spectrum analyzer; L represents the cable loss between the spectrum analyzer and the receiving antenna and the insertion loss of other components; L bs G represents the free space loss between the antenna under test and the dual-polarized horn probe, and G represents the receiving horn antenna gain. When the antenna under test is circularly polarized, the formula for calculating the equivalent isotropic radiated power of the antenna under test is as follows: In the formula: lg represents the equivalent isotropic radiated power of the antenna under test, and log represents the power of the antenna under test. This represents the equivalent isotropic radiated power value for horizontal polarization. This represents the equivalent isotropic radiated power value of vertical polarization.

Images