Mechanical switching software programmable multi-parameter automatic test system and method

Abstract

The present application relates to the technical field of electronic measurement and automatic test, and particularly relates to a mechanical switching type software programmable multi-parameter automatic test system and method, a first input interface of a measured part adaptation module is connected with a multi-core wire harness or a connector, the first input interface is provided with a plurality of pins, an internal replication circuit expands each pin of the first input interface into an electrical contact point one by one, a plurality of independent movable probes directly contact the electrical contact points replicated by the pins, and combined with programmable control of an upper computer, full-automatic comprehensive test of insulation resistance, voltage resistance, thermocouple, capacitance and other parameter test and wire harness or connector on-off detection is realized, electrical switching errors can be eliminated in principle, and high flexibility and automation level are achieved.

Description

Technical Field

[0001] This invention relates to the field of electronic measurement and automatic testing technology, specifically to a mechanically switchable, software-programmable, multi-parameter automatic testing system and method. Background Technology

[0002] In fields such as aerospace, rail transportation, and new energy vehicles, it is crucial to inspect equipment quality using multi-core wire harnesses and connector assemblies. Typical test items include: insulation resistance (up to 100TΩ), withstand voltage (up to 5kV), thermocouple signal (microvolt level), capacitance, and wire harness continuity. These tests place extremely stringent and conflicting requirements on the measurement system.

[0003] Traditional testing methods mainly have the following problems:

[0004] 1. Low efficiency of manual operation: Traditional testing relies on manual plugging and unplugging of wire harnesses or connectors and manual switching of instruments, which is not only inefficient but also prone to operational errors, making it difficult to meet the testing needs of mass production.

[0005] 2. Electrical switching introduces inherent errors: When using a relay matrix for signal switching, high-voltage relays cannot achieve extremely low leakage current, and low thermoelectric potential relays cannot withstand high voltage. A single relay cannot simultaneously meet the extreme parameter requirements. In addition, the leakage current and thermoelectric potential of the relay itself will be directly added to the measurement results, becoming an unavoidable systematic error.

[0006] 3. Fixed test process: Existing automated test systems mostly use fixed test sequences, which cannot flexibly configure test items and parameters according to the type of device under test and test requirements, resulting in poor adaptability.

[0007] 4. Separation of continuity testing and parameter testing: Wire harness continuity testing is usually conducted at different stations or on different equipment than insulation, withstand voltage and other parameter tests. This requires multiple plugging and unplugging, which increases the testing cycle and error. Summary of the Invention

[0008] This invention provides a mechanically switching, software-programmable, multi-parameter automatic testing system and method. By having multiple independent active probes directly contact the electrical contacts replicated by the pin under test, and combined with a host computer programmable control, it can realize fully automatic comprehensive testing of parameters such as insulation resistance, withstand voltage, thermocouple, and capacitance, as well as continuity detection of wire harnesses or connectors. It can eliminate electrical switching errors in principle and has a high degree of flexibility and automation.

[0009] To solve the above-mentioned technical problems, the technical solution of the present invention is as follows:

[0010] A mechanically switchable, software-programmable, multi-parameter automatic testing system includes a multi-core wire harness or connector, the multi-core wire harness or connector including a first end, and the system further includes:

[0011] frame;

[0012] The device under test (DUT) adapter module includes a first input interface for connecting to a first end and an internal replication circuit connected to the first input interface. The first input interface is provided with multiple pins, and the internal replication circuit expands each pin of the first input interface into an electrical contact. All electrical contacts are fixed on the frame.

[0013] A suite of multi-parameter measuring instruments, including at least one of an insulation resistance tester, a withstand voltage tester, a digital multimeter, and a capacitance tester;

[0014] Multiple movable probes are connected to the input and output ports of each instrument in the multi-parameter measuring instrument cluster. All movable probes are mounted on the frame via a three-dimensional moving component and can move in three-dimensional space above the electrical contacts.

[0015] The automated control unit includes a motion controller, a measurement controller, and a host computer. The host computer is connected to the motion controller and the measurement controller respectively and sends control commands to them. The motion controller is connected to the three-dimensional movement component of each active probe and controls the corresponding active probe to move to contact the corresponding electrical contact according to the control command. The measurement controller is connected to each instrument in the multi-parameter measuring instrument cluster and controls the corresponding instrument to start measurement according to the control command. Each instrument in the multi-parameter measuring instrument cluster is connected to the host computer and uploads the measurement data to the host computer.

[0016] The multi-core wire harness or connector also includes a second end, and the device under test adapter module also includes a second input interface for connecting the second end. The second input interface is provided with multiple pins, and the internal replication circuit expands each pin of the second input interface into an electrical contact. All electrical contacts are fixed on the frame.

[0017] All electrical contacts are arranged in an array on the rack.

[0018] The electrical contact is a vertical column. The bottom of the movable probe is provided with a groove for accommodating the vertical column. The three-dimensional moving component moves the movable probe to directly above the electrical contact and moves the movable probe down to cover the vertical column in its groove, thereby achieving contact connection between the movable probe and the electrical contact.

[0019] A force sensor is installed in the groove. The force sensor is connected to the motion controller. The force sensor provides real-time feedback on the contact force between the movable probe and the electrical contacts. When the preset threshold is reached, the motion controller stops the descent.

[0020] The movable probe connected to the insulation resistance tester includes a probe rod, a high-insulation material layer covering the probe rod, and a shielding layer disposed outside the high-insulation material layer, the shielding layer being connected to the Guard terminal of the insulation resistance tester.

[0021] The movable probe connected to the withstand voltage tester is made of high withstand voltage insulating material.

[0022] The two active probes connected to the digital multimeter are made of matched low thermoelectric materials and integrate cold junction compensation sensors.

[0023] The host computer includes:

[0024] The pin configuration module supports user-defined pin information for the first input interface;

[0025] The test function library includes built-in standard test function modules for insulation resistance testing, withstand voltage testing, thermocouple testing, and capacitance testing.

[0026] The test sequence editor provides a graphical interface and supports user-defined combinations of pin test functions;

[0027] The sequence execution engine parses the test sequence and sends control commands to control hardware execution.

[0028] This invention also provides a testing method for a mechanically switching, software-programmable, multi-parameter automatic testing system, comprising the following steps:

[0029] Step 1: Connect the first end of the multi-core wire harness or connector to the first input interface, and generate a test sequence by using the custom pin test function combination on the host computer;

[0030] Step 2: The automated control unit parses the test sequence and determines the required combination of active probes and the location of the target electrical contacts based on the current test command;

[0031] Step 3: The motion controller moves the required active probes directly above the target electrical contacts.

[0032] Step 4: The measurement controller controls the required moving probes to descend until they contact the target electrical contacts;

[0033] Step 5: Start the corresponding measuring instrument to perform the measurement, record the data and store it in association with the pin information;

[0034] Step 6: Control the movable probe to rise, disengage from the electrical contacts, and return to a safe height;

[0035] Step 7: Repeat steps 2-6 until all test commands have been executed;

[0036] Step 8: The host computer generates a test report.

[0037] Compared with the prior art, the beneficial effects of the present invention are:

[0038] (1) The present invention replaces the switching of electrical relays by directly contacting the electrical contacts with the active probe, thereby physically eliminating the influence of relay leakage current and thermoelectric potential on the measurement results, and improving the insulation resistance test level and thermocouple measurement accuracy.

[0039] (2) The automatic testing system of the present invention integrates continuity detection and multi-parameter testing. It can simultaneously complete the insulation, withstand voltage, thermocouple, capacitance and other parameter tests of the test component, as well as the continuity detection of the wire harness or connector in the same system. There is no need to replace the equipment or re-plug it, which greatly improves the testing efficiency.

[0040] (3) The test task can be flexibly defined through the software programmable of the host computer. Users can freely define any combination of test functions for any pin pair (including mixed test sequences) and adapt to different wire harness or connector models and test standards without modifying the hardware.

[0041] (4) The automatic testing system provided by the present invention requires no manual intervention throughout the entire process from test program loading, probe positioning, contact control, measurement execution to data recording, thereby reducing labor costs and operational errors.

[0042] (5) The automatic testing system provided in this invention has the characteristics of modularity and scalability. The first input interface and the second input interface adopt standardized interfaces, and can support wire harnesses with different pin numbers and different spacings by changing the adapter. Attached Figure Description

[0043] Figure 1 A partial structural schematic diagram of the mechanical switching type software programmable multi-parameter automatic testing system provided by the present invention;

[0044] Figure 2 This is a schematic diagram showing the connection between the movable probe and the electrical contacts in this invention;

[0045] Figure 3 This is a schematic diagram of the internal replication circuit of the device under test adapter module in this invention;

[0046] In the diagram: 1-frame, 2-electrical contacts, 3-3D moving component, 4-moving probe. Detailed Implementation

[0047] The present invention will be further described below with reference to the accompanying drawings and embodiments.

[0048] The structure of the mechanical switching type software programmable multi-parameter automatic testing system provided in this embodiment is as follows: Figure 1As shown, the system can perform tests on parameters such as insulation resistance, withstand voltage, thermocouples, and capacitance, as well as continuity tests on wire harnesses or connectors. The system includes a multi-core wire harness or connector, a frame 1, a device-under-test (DUT) adapter module, a cluster of multi-parameter measuring instruments, multiple movable probes 4, and an automated control unit. The multi-core wire harness or connector includes a first end and a second end, enabling the automated testing system to connect to external devices. The frame serves as the basic support structure for the entire system.

[0049] The device under test (DUT) adapter module includes a first input interface, a second input interface, and an internal replication circuit. Both the first and second input interfaces have multiple pins; in this embodiment, both have 32 pins. Both the first and second input interfaces use a standardized 32-pin interface, allowing for the support of wiring harnesses or connectors with different pin counts and spacings by replacing the adapter. The internal replication circuit expands each pin of the first and second input interfaces into an electrical contact 2, such as... Figure 3 As shown, an internal replication circuit ensures that each electrical contact corresponds one-to-one with the pins of the first and second input interfaces. All electrical contacts are fixed to the rack to ensure their position is fixed. Specifically, all electrical contacts are arranged in an array on the rack; in this embodiment, they are arranged in a matrix. Preferably, the electrical contacts are made of gold-plated material.

[0050] The multi-parameter measurement instrument cluster includes an insulation resistance tester (for insulation resistance measurement), a withstand voltage tester (for withstand voltage measurement), a digital multimeter (for thermocouple and continuity testing), and a capacitance tester (for capacitance measurement). The multi-parameter measurement instrument cluster can be mounted on a rack or placed separately as needed.

[0051] Multiple movable probes are connected to the input / output ports of each instrument in the multi-parameter measuring instrument cluster. In this embodiment, the movable probes include a first and second probe connected to the high-voltage output and measurement input of the insulation resistance tester; a third and fourth probe connected to the high-voltage output and leakage current measurement of the withstand voltage tester; a fifth and sixth probe connected to the positive and negative input of the digital multimeter; and a seventh and eighth probe connected to both ports of the capacitance tester. In this embodiment, each input / output port of each instrument is connected to its corresponding movable probe via wires. In this embodiment, the active probe is specifically designed according to the measurement characteristics of the connected instrument. Specifically, the active probe connected to the insulation resistance tester includes a probe rod, a high-insulation material layer covering the probe rod, and a shielding layer disposed outside the high-insulation material layer. The shielding layer is connected to the Guard terminal of the insulation resistance tester. The active probe connected to the withstand voltage tester is made of high-withstand-voltage insulating material. The two active probes connected to the digital multimeter use matched low thermoelectric potential materials (such as nickel-chromium / nickel-silicon) and integrate cold junction compensation sensors. That is, the two active probes include a positive probe and a negative probe. The positive probe and the negative probe use materials that match their thermocouples. An isothermal block is embedded at the root of the two probes, and a temperature sensor is provided on the isothermal block for cold junction temperature compensation.

[0052] Multiple movable probes are mounted on the frame via a three-dimensional moving assembly 3 and can move in three-dimensional space above the electrical contacts. The three-dimensional moving assembly is a conventional technology and typically includes an X-axis moving mechanism, a Y-axis moving mechanism, a Z-axis moving mechanism, and an end effector mounting base. The movable probes are fixed to the end effector mounting base and move in three-dimensional space along with the X-axis, Y-axis, and Z-axis moving mechanisms. In this embodiment, the electrical contacts are vertical columns, and the bottom of the movable probes has grooves for accommodating the vertical columns. The three-dimensional moving assembly moves the movable probes to directly above the electrical contacts and then moves them down until their grooves cover the vertical columns. Figure 2 As shown, the movable probe and electrical contacts are connected. A force sensor is installed in the groove and connected to the motion controller. The force sensor provides real-time feedback on the contact force between the movable probe and the electrical contacts. When the force reaches a preset threshold (e.g., 0.5N), the motion controller stops the descent. Additionally, if abnormal resistance is detected during descent, the descent will stop immediately and an alarm will sound. An emergency stop button is provided on the frame to cut off the power supply to the three-dimensional motion components at any time.

[0053] In practical setup, each active probe can be mounted and moved using an independent three-dimensional moving component. Each active probe then possesses independent X, Y, and Z degrees of freedom, allowing it to move arbitrarily to any electrical contact and supporting combined testing of any two pins. Alternatively, multiple active probes can share an X-axis moving mechanism. For example, two sets of three-dimensional moving mechanisms can be configured. Each set includes one X-axis moving mechanism, four Y-axis moving mechanisms, four Z-axis moving mechanisms, and four end effector mounting bases. The four Y-axis moving mechanisms are all mounted together on the same X-axis moving mechanism for overall X-axis movement, and can also move independently in the Y-axis simultaneously. The four Z-axis moving mechanisms are each mounted on one of the four Y-axis moving mechanisms for independent Z-axis movement, and the four end effector mounting bases are each mounted on one of the four Z-axis moving mechanisms. In this embodiment, the four active probes share an X-axis moving mechanism and a Y-axis moving mechanism for overall X-axis and Y-axis movement. Each active probe has an independent Z-axis moving mechanism for independent Z-axis movement. At this time, the relative position between two active probes connected to the same instrument needs to be matched with the relative position of the two electrical contacts of the corresponding test item. After X-axis and Y-axis movement, the two corresponding active probes are positioned directly above the two corresponding electrical contacts.

[0054] The automated control unit includes a motion controller, a measurement controller, and a host computer. The host computer is connected to the motion controller and the measurement controller respectively and sends control commands to them. The motion controller is connected to the three-dimensional movement components of each active probe and controls the corresponding active probe to move to contact the corresponding electrical contact according to the control commands. The measurement controller is connected to each instrument in the multi-parameter measuring instrument cluster and controls the corresponding instrument to start measurement according to the control commands, realizing the testing of parameters such as insulation resistance, withstand voltage, thermocouple, and capacitance, as well as the continuity detection of wire harnesses or connectors. Specifically, the host computer software provides a user programming interface, supporting user-defined pin test function combinations (including testing parameters such as insulation resistance, withstand voltage, thermocouple, and capacitance between each pin of the first input interface, and continuity detection between corresponding pins of the first input interface and the second input interface) and generating executable test sequences. The automated control unit parses the test sequences, coordinates the movement of the active probes and the start-up of each instrument, and realizes a fully automated testing process. Furthermore, the host computer includes a pin configuration module, a test function library, a test sequence editor, and a sequence execution engine. The pin configuration module allows users to define pin information for the first and second input interfaces. The test function library includes built-in standard test function modules such as insulation resistance testing, withstand voltage testing, thermocouple testing, capacitance testing, and continuity detection. The test sequence editor provides a graphical interface that supports user-defined combinations of pin test functions (including parameter testing between pins of the first input interface and continuity detection between pins of the first and second input interfaces, for example: first testing the insulation resistance between pins 1 and 2 of the first input interface, then testing the continuity between pins 1 of the first input interface and pin 1 of the second interface, and then measuring the thermocouple between pins 3 and 4 of the first input interface, etc.). The sequence execution engine parses the test sequence and sends control commands for controlling hardware execution. Each instrument in the multi-parameter measurement instrument cluster is connected to the host computer, uploading measurement data to the host computer. The host computer sequentially collects channel measurement values ​​according to the test sequence and generates a test report.

[0055] This invention also provides a testing method for a mechanically switching, software-programmable, multi-parameter automatic testing system, comprising the following steps:

[0056] Step 1: Connect the first end of the multi-core wire harness or connector to the first input interface, and generate a test sequence by using the host computer's custom pin test function combination (including parameter testing between the pins of the first input interface);

[0057] Specifically, users can freely combine test items such as insulation resistance, withstand voltage, thermocouple, and capacitance, and specify the pin pairs to be tested.

[0058] Step 2: The automated control unit parses the test sequence and determines the required combination of active probes and the location of the target electrical contact (i.e., the corresponding target pin) based on the current test command. Specifically, it determines the test type (insulation resistance, withstand voltage, thermocouple, or capacitance) and the position (column and row coordinates) of the target pin based on the current test command.

[0059] Insulation resistance test between the pins of the first input interface: Using the first probe and the second probe connected to the insulation resistance tester, respectively contact the electrical contacts corresponding to two different pins of the first input interface;

[0060] Withstand voltage test between the pins of the first input interface: Use the third and fourth probes connected to the withstand voltage tester to contact the electrical contacts corresponding to two different pins of the first input interface respectively;

[0061] Thermocouple or capacitance test between the pins of the first input interface: Use a digital multimeter to connect the fifth and sixth probes and contact the electrical contacts corresponding to two different pins of the first input interface respectively;

[0062] Step 3: The motion controller moves the required active probes directly above the target electrical contacts.

[0063] Step 4: The measurement controller controls the required active probes to descend to make contact with the target electrical contacts (i.e., mechanical contact); during high-voltage testing, the control unit prohibits the descent of other unrelated probes.

[0064] Step 5: Start the corresponding measuring instrument to perform the measurement, record the data (insulation resistance value, withstand voltage result, temperature value, capacitance value or continuity result) and store it in association with the pin information;

[0065] The specific steps for starting the corresponding measuring instrument to perform the measurement are as follows:

[0066] Apply a test voltage (e.g., 1000V) to the insulation resistance tester and read the insulation resistance value.

[0067] The withstand voltage tester applies a test voltage (e.g., 5kV), monitors the leakage current, and determines whether a breakdown has occurred.

[0068] Switch the digital multimeter to the appropriate range (DC voltage range for thermocouples, capacitance range for capacitance) and read the measured value.

[0069] Step 6: Control the movable probe to rise, disengage from the electrical contacts, and return to a safe height;

[0070] Step 7: Repeat steps 2-6 until all test commands have been executed;

[0071] Specifically, the sequence execution engine reads the next test instruction in the test sequence and determines whether there are any unexecuted instructions; if not, it jumps to step S8; if so, it executes step 2.

[0072] Step 8: After all test instructions have been executed, the host computer summarizes the test data and generates a test report containing the pass / fail determination.

[0073] When testing the continuity of a wire harness or connector, in step 1, the first and second ends of the multi-core wire harness or connector are connected to the first and second input interfaces, respectively. A test sequence is generated using a custom pin test function combination on the host computer (including continuity testing between pins of the first and second input interfaces). In step 2, the fifth and sixth probes are connected to a digital multimeter and used to contact the electrical contacts corresponding to pins of the first and second input interfaces, respectively, measuring the resistance value (the digital multimeter is switched to resistance mode). The measured value is read. If the resistance is less than a set threshold (e.g., 1Ω), continuity is determined, thus performing continuity testing between the corresponding pins of the first and second input interfaces. Other steps refer to the parameter test procedure.

Claims

1. A mechanically switchable, software-programmable, multi-parameter automatic testing system, comprising a multi-core wire harness or connector, wherein the multi-core wire harness or connector includes a first end, characterized in that: The system also includes: frame; The device under test (DUT) adapter module includes a first input interface for connecting to a first end and an internal replication circuit connected to the first input interface. The first input interface is provided with multiple pins, and the internal replication circuit expands each pin of the first input interface into an electrical contact. All electrical contacts are fixed on the frame. A suite of multi-parameter measuring instruments, including at least one of an insulation resistance tester, a withstand voltage tester, a digital multimeter, and a capacitance tester; Multiple movable probes are connected to the input and output ports of each instrument in the multi-parameter measuring instrument cluster. All movable probes are mounted on the frame via a three-dimensional moving component and can move in three-dimensional space above the electrical contacts. The automated control unit includes a motion controller, a measurement controller, and a host computer. The host computer is connected to the motion controller and the measurement controller respectively and sends control commands to them. The motion controller is connected to the three-dimensional movement component of each active probe and controls the corresponding active probe to move to contact the corresponding electrical contact according to the control command. The measurement controller is connected to each instrument in the multi-parameter measuring instrument cluster and controls the corresponding instrument to start measurement according to the control command. Each instrument in the multi-parameter measuring instrument cluster is connected to the host computer and uploads the measurement data to the host computer.

2. The mechanical switching type software programmable multi-parameter automatic testing system according to claim 1, characterized in that: The multi-core wire harness or connector also includes a second end, and the device under test adapter module also includes a second input interface for connecting the second end. The second input interface is provided with multiple pins, and the internal replication circuit expands each pin of the second input interface into an electrical contact. All electrical contacts are fixed on the frame.

3. The mechanical switching type software programmable multi-parameter automatic testing system according to claim 1, characterized in that: All electrical contacts are arranged in an array on the rack.

4. The mechanical switching type software programmable multi-parameter automatic testing system according to claim 1, characterized in that: The electrical contact is a vertical column. The bottom of the movable probe is provided with a groove for accommodating the vertical column. The three-dimensional moving component moves the movable probe to directly above the electrical contact and moves the movable probe down to cover the vertical column in its groove, thereby achieving contact connection between the movable probe and the electrical contact.

5. The mechanical switching type software programmable multi-parameter automatic testing system according to claim 4, characterized in that: A force sensor is installed in the groove. The force sensor is connected to the motion controller. The force sensor provides real-time feedback on the contact force between the movable probe and the electrical contacts. When the preset threshold is reached, the motion controller stops the descent.

6. The mechanical switching type software programmable multi-parameter automatic testing system according to claim 1, characterized in that: The movable probe connected to the insulation resistance tester includes a probe rod, a high-insulation material layer covering the probe rod, and a shielding layer disposed outside the high-insulation material layer, the shielding layer being connected to the Guard terminal of the insulation resistance tester.

7. The mechanical switching type software programmable multi-parameter automatic testing system according to claim 1, characterized in that: The movable probe connected to the withstand voltage tester is made of high withstand voltage insulating material.

8. The mechanical switching type software programmable multi-parameter automatic testing system according to claim 1, characterized in that: The two active probes connected to the digital multimeter are made of matched low thermoelectric materials and integrate cold junction compensation sensors.

9. The mechanical switching type software programmable multi-parameter automatic testing system according to claim 1, characterized in that: The host computer includes: The pin configuration module supports user-defined pin information for the first input interface; The test function library includes built-in standard test function modules for insulation resistance testing, withstand voltage testing, thermocouple testing, and capacitance testing. The test sequence editor provides a graphical interface and supports user-defined combinations of pin test functions; The sequence execution engine parses the test sequence and sends control commands to control hardware execution.

10. A testing method for a mechanically switching, software-programmable, multi-parameter automatic testing system according to claim 1, characterized in that... Includes the following steps: Step 1: Connect the first end of the multi-core wire harness or connector to the first input interface, and generate a test sequence by using the custom pin test function combination on the host computer; Step 2: The automated control unit parses the test sequence and determines the required combination of active probes and the location of the target electrical contacts based on the current test command; Step 3: The motion controller moves the required active probes directly above the target electrical contacts. Step 4: The measurement controller controls the required moving probes to descend until they contact the target electrical contacts; Step 5: Start the corresponding measuring instrument to perform the measurement, record the data and store it in association with the pin information; Step 6: Control the movable probe to rise, disengage from the electrical contacts, and return to a safe height; Step 7: Repeat steps 2-6 until all test commands have been executed; Step 8: The host computer generates a test report.

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