A batch data automatic burning method and system for chip burning

Abstract

The application relates to the technical field of batch data detection, in particular to a batch data automatic burning method and system for chip burning, which comprises the following steps: in the burning process of batch chips, collecting voltage data of each burner in the burning process in real time; obtaining an electrical mismatch degree of a single burner; obtaining a burning abnormal value of the single burner; classifying all burners in the current batch burning process; if one class is obtained, determining that all burners in the current batch burning process are in a normal operating state; otherwise, screening a suspected abnormal class, obtaining an interruption degree of the suspected abnormal class, and evaluating the abnormal condition of the burners in the suspected abnormal class. The application can improve the identification accuracy of abnormal burners, guarantee the batch burning efficiency, and significantly improve the consistency and long-term reliability of products.

Images