Test case generation method, device and electronic equipment

Abstract

The application discloses a test case generation method and device and electronic equipment, and relates to the technical field of computers, and comprises the following steps: determining target similarity vectors between test cases according to code coverage information corresponding to the test cases; performing clustering analysis on the test cases based on the target similarity vectors between the test cases, to obtain a multi-cluster test case set; analyzing and processing multi-dimensional test data and code coverage information corresponding to the test cases, to obtain defect detection potential scores corresponding to the test cases; and determining a test case execution sequence in the multi-cluster test case set according to the defect detection potential scores corresponding to the test cases, the code coverage information and the multi-dimensional test data. The subjectivity defects of artificial decision-making can be avoided, the defect discovery speed can be accelerated, the defect detection rate can be improved, and the overall test reliability can be improved based on the similarity clustering and multi-target intelligent sorting mechanism.

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