Storage device, test system and method of operating a test system

Abstract

Disclosed are a storage device, a test system, and an operation method of a test system. The test system includes: a power supply device that supplies power to a storage device including a plurality of nonvolatile memories; a current measurement device that measures a current consumed by the storage device; and a host device that controls the power supply device to cut off power when the storage device is executing a target operation. The host device stores a plurality of current profiles corresponding to a plurality of operations of the storage device, respectively, and identifies whether the storage device is executing the target operation based on a current measured by the current measurement device and the plurality of current profiles.

Description

[0001] This application claims priority to Korean Patent Application No. 10-2025-0009049, filed on January 21, 2025, with the Korean Intellectual Property Office, the disclosure of which is incorporated herein by reference in its entirety. Technical Field

[0002] This disclosure provides a storage device, a test system, and a method for operating the test system. Background Technology

[0003] In some cases, storage devices may be expected to maintain data consistency even under unpredictable operating conditions. To ensure system reliability and data integrity, it may be necessary to evaluate the performance of the storage device during such events. Summary of the Invention

[0004] In some cases, unexpected sudden power failures may occur (hereinafter referred to as "sudden power outages (SPO)"). In such cases, the storage device processes data according to a predefined strategy based on data consistency.

[0005] Sudden Power Outage Recovery (SPOR) testing is used to determine whether a storage device processes data according to its policy during a Sudden Power Outage (SPO) event. Typically, SPOR testing can be performed with the storage device's operation randomly blocked, regardless of the type of operation being performed by the storage device or whether the non-volatile memory included in the storage device is performing a storage operation.

[0006] In such cases, because the objective of the SPOR test (i.e., the extent to which the data is corrupted by the SPOR) cannot be clearly specified, it can be difficult to determine test coverage. Consequently, test time can be extended, and test efficiency can be reduced.

[0007] The embodiments of this disclosure provide a test system capable of performing sudden power outage recovery (SPOR) tests more efficiently.

[0008] In some aspects, this disclosure provides a test system comprising: a power supply device for supplying power to a storage device including a plurality of non-volatile memories; a current measuring device for measuring the current consumed by the storage device; and a host device for controlling the power supply device to cut off power when the storage device is performing a target operation. The host device may store a plurality of current distributions corresponding to a plurality of operations of the storage device, and may identify whether the storage device is performing a target operation based on the current measured by the current measuring device and the plurality of current distributions.

[0009] In some implementations, the host device can recognize that the storage device is performing a target operation when the current measured by the current measuring device corresponds to one of the plurality of current distributions associated with the target operation.

[0010] In some implementations, each of the plurality of current distributions may include at least one of the waveforms or representative values ​​of the current consumed by the storage device during the corresponding operation.

[0011] In some implementations, when a target non-volatile memory among the plurality of non-volatile memories is operating according to a target operation, the host device may control the power supply to cut off power.

[0012] In some implementations, whether the target non-volatile memory is operating can be identified based on a busy signal output from the target non-volatile memory, and the busy signal may have one of a first voltage corresponding to the state that the target non-volatile memory is operating or a second voltage corresponding to the state that the operation of the target non-volatile memory is completed.

[0013] In some implementations, the host device may send a selection signal to the storage device, the selection signal being used to select a busy signal output from a target non-volatile memory from among busy signals output from the plurality of non-volatile memories respectively.

[0014] In some embodiments, a busy signal output from the target non-volatile memory may be received by the host device, and when the current measured by the current measuring device corresponds to the current distribution associated with the target operation among the plurality of current distributions and the received busy signal has a first voltage, the host device may control the power supply device to cut off power.

[0015] In some implementations, the busy signal output by the target non-volatile memory can be received by the power supply device. The host device can send information about the power cut-off time point to the power supply device based on the current distribution among the plurality of current distributions that are associated with the target operation, which is measured by the current measuring device. The power supply device can identify whether the power cut-off time point has been reached based on the received busy signal and can cut off the power at the identified time point.

[0016] In some implementations, the multiple operations of the storage device may be test operations implemented by a combination of commands defined by a protocol for communication between the host device and the storage device, and the protocol may include Non-Volatile Memory Rapid (NVMe), Universal Flash Storage (UFS), Small Computer System Interface (SCSI), Serial Attached SCSI (SAS), or Serial ATA (SATA).

[0017] In some implementations, the host device may control the storage device to perform each of the plurality of operations, and may obtain a current distribution corresponding to each of the plurality of operations based on the current measured by a current measuring device while the storage device is performing each of the plurality of operations.

[0018] In some implementations, the host device can control the power supply device to restore power to the storage device after the power supply to the storage device is cut off, and can check from the storage device the results of the storage device's operations performed during the target operation when the power was cut off.

[0019] In some implementations, the power supply device may include a power management integrated circuit (PMIC) for managing the power to be supplied, and the current measuring device may be implemented using the power management integrated circuit of the power supply device.

[0020] In some implementations, the storage device may include a power management integrated circuit (PMIC) for managing the power used within the storage device, and a current measuring device may be implemented using the power management integrated circuit of the storage device.

[0021] In some aspects, this disclosure provides a storage device comprising: a plurality of non-volatile memories, each of the plurality of non-volatile memories including a busy signal through which a busy signal is output; a controller for controlling the operation of the plurality of non-volatile memories; and a multiplexer connected to a busy pin of the plurality of non-volatile memories and outputting the busy signal of a non-volatile memory selected from the plurality of non-volatile memories to an external location.

[0022] In some implementations, in response to receiving a selection signal for selecting a target non-volatile memory among the plurality of non-volatile memories, the controller may control the multiplexer to output the busy signal of the plurality of non-volatile memories corresponding to the target non-volatile memory.

[0023] In some embodiments, the storage device may further include a power management integrated circuit for managing the power used within the storage device, and the controller may use the power management integrated circuit to obtain information about the current consumed when the storage device is operating, and may transmit the obtained current information to an external device via a sideband interface.

[0024] In some aspects, this disclosure provides a method of operating a testing system. The method includes: supplying power to a storage device comprising a plurality of non-volatile memories; measuring the current consumed by the storage device; identifying whether the storage device is performing a target operation based on the measured current and a plurality of current distributions; and cutting off the power supply to the storage device based on the storage device performing the target operation, wherein the plurality of current distributions may respectively correspond to a plurality of operations of the storage device.

[0025] In some implementations, the step of cutting off power may include cutting off power to a target non-volatile memory among the plurality of non-volatile memories while it is operating according to a target operation.

[0026] In some implementations, whether the target non-volatile memory is operating can be identified based on a busy signal from the target non-volatile memory, and the busy signal of the target non-volatile memory may have one of a first voltage corresponding to the state that the target non-volatile memory is operating or a second voltage corresponding to the state that the operation of the target non-volatile memory is completed.

[0027] In some embodiments, the method may further include: sending a selection signal to a storage device, the selection signal being used to select a busy signal corresponding to a target non-volatile memory from among the busy signals of the plurality of non-volatile memories, and the busy signal of the target non-volatile memory being output from the storage device based on the selection signal. Attached Figure Description

[0028] Figure 1 This is a block diagram of an example test system.

[0029] Figure 2 This is a diagram illustrating an example of a method for obtaining current distribution.

[0030] Figure 3 This is a flowchart illustrating an example of how the test system operates.

[0031] Figure 4 This is a block diagram of an example test system.

[0032] Figure 5 This is a flowchart illustrating the operation methods of the example test system.

[0033] Figure 6 This is a block diagram of an example test system.

[0034] Figure 7 This is a block diagram of an example test system.

[0035] Figure 8 This is a block diagram of an example test system.

[0036] Figure 9 This is a block diagram of an example test system.

[0037] Figure 10 This is a flowchart illustrating the operation methods of the example test system. Detailed Implementation

[0038] The embodiments of this disclosure will now be described in detail and clearly to the extent that those skilled in the art can readily implement this disclosure.

[0039] Figure 1 This is a block diagram of a test system according to some embodiments of the present disclosure.

[0040] According to some embodiments of this disclosure, the test system 1000 can perform a sudden power failure recovery (SPOR) test on the storage device 2000. In the SPOR test, the test system 1000 can cut off the power supply to the storage device 2000 while the storage device 2000 is operating.

[0041] In this context, according to some implementations, when the storage device 2000 performs a specific operation (hereinafter referred to as the "target operation"), the test system 1000 may cut off the power supply to the storage device 2000. For this purpose, the test system 1000 may identify the operation (or type of operation) currently being performed by the storage device 2000 based on the current consumed by the storage device 2000 during operation.

[0042] Furthermore, according to some embodiments, when a specific non-volatile memory (hereinafter referred to as the "target non-volatile memory") among a plurality of non-volatile memories included in the storage device 2000 is performing an operation according to a target operation, the test system 1000 may cut off the power supply to the storage device 2000. For this purpose, the test system 1000 may identify whether the target non-volatile memory is currently operating based on a busy signal (or ready / busy signal) provided from the storage device 2000.

[0043] In other words, according to some embodiments of this disclosure, the test system 1000 can specify the operation of the storage device 2000 for performing SPOR tests. Furthermore, the test system 1000 can specify a non-volatile memory included in the storage device 2000 for performing SPOR tests. In this case, the target of the SPOR test (i.e., the degree of data corruption by SPOR) can be clearly specified, and the coverage of the performed SPOR test can be clearly determined. Based on the above description, the SPOR test time can be shortened, i.e., the SPOR test can be performed more efficiently.

[0044] Reference Figure 1Provide a detailed description. (Refer to...) Figure 1 The test system 1000 may include a host device 100, a current measuring device 200, and a power supply device 300.

[0045] The power supply device 300 can control the power supplied to the storage device 2000. For example, under the control of the host device 100, the power supply device 300 can supply power to the storage device 2000, or can cut off the power being supplied to the storage device 2000. For this purpose, the power supply device 300 can be connected to the power pin of the storage device 2000.

[0046] The current measuring device 200 can measure the current consumed by the storage device 2000 while the storage device 2000 is operating. In some examples, the current measuring device 200 can be connected to a power pin of the storage device 2000. In some examples, the current measuring device 200 can provide information about the measured current (hereinafter referred to as the "current profile") to the host device 100. In this case, the current profile may include at least one of the waveform of the measured current over time and a representative value of the measured current. Here, the representative value may include an average value, a center value, or a root mean square (RMS) value.

[0047] The host device 100 can control all operations of the test system 1000. The host device 100 can be implemented using various computing devices that perform host functions on the storage device 2000.

[0048] Specifically, host device 100 can perform SPOR testing on storage device 2000. For this purpose, host device 100 can control the operation of storage device 2000. Host device 100 and storage device 2000 can communicate with each other using protocols such as Non-Volatile Memory Express (NVMe), Universal Flash Storage (UFS), Small Computer System Interface (SCSI), Serial Attached SCSI (SAS), or Serial Advanced Technology Attachment (ATA) (SATA)). Furthermore, host device 100 can control the operation of current measuring device 200 and power supply device 300. In some examples, host device 100 can communicate with current measuring device 200 and power supply device 300 using the Internal Integrated Circuit (I2C) protocol.

[0049] For example, when the storage device 2000 is performing a target operation, the host device 100 can control the power supply device 300 to cut off the power being supplied to the storage device 2000.

[0050] To this end, the host device 100 may store multiple current distributions corresponding to multiple operations of the storage device 2000, respectively. Here, the multiple operations of the storage device 2000 may be multiple test operations implemented through a combination of commands defined by the protocol used for communication between the host device 100 and the storage device 2000. Furthermore, each of the multiple current distributions may include at least one of the waveform and representative value of the current consumed by the storage device 2000 during the corresponding operation.

[0051] Based on the above description, the host device 100 can identify whether the storage device 2000 is performing a target operation based on the current measured by the current measuring device 200 and multiple current distributions. Specifically, when the current measured by the current measuring device 200 corresponds to a current distribution among multiple current distributions associated with the target operation, the host device 100 can identify that the storage device 2000 is performing the target operation.

[0052] Furthermore, when the target non-volatile memory included in the storage device 2000 is operating according to the target operation, the host device 100 can control the power supply device 300 to cut off the power being supplied to the storage device 2000.

[0053] In this scenario, whether the target non-volatile memory is operational can be identified based on a busy signal output from the target non-volatile memory (hereinafter referred to as the "target busy signal"). The busy signal may have one of a first voltage corresponding to the state where the non-volatile memory is operating and a second voltage corresponding to the state where the operation of the non-volatile memory is completed. Therefore, when the target busy signal has the first voltage, the target non-volatile memory can be identified as being operational.

[0054] According to some implementations, the target busy signal may be transmitted to the host device 100 or to the power supply device 300.

[0055] When a target busy signal is transmitted to the host device 100, the host device 100 can identify whether the target non-volatile memory is operating based on the target busy signal. When it is identified that the target non-volatile memory is operating, the host device 100 can control the power supply device 300 to cut off the power being supplied to the storage device 2000.

[0056] In this scenario, the host device 100 controls the power supply device 300 such that the timing at which the power supply to the storage device 2000 is cut off can be selected by the host device 100. For example, while a target operation is being performed, in some cases, the target non-volatile memory may be operated multiple times, rather than just once. That is, while the storage device 2000 is performing a target operation, the target busy signal may have multiple transitions between a first voltage and a second voltage. Therefore, the host device 100 can select the timing at which the power supply to the storage device 2000 is cut off by selecting one of multiple timing points when the target busy signal has the first voltage and controlling the power supply device 300 at the selected timing point.

[0057] Simultaneously, when a target busy signal is transmitted to the power supply unit 300, the power supply unit 300 can identify whether the target non-volatile memory is operating based on the target busy signal. In this case, the host device 100 can send information about the power cut-off time point in advance to the power supply unit 300, and therefore, when the target non-volatile memory is operating, the power supply to the storage device 2000 can be cut off.

[0058] In this case, the information regarding the power cut-off time may include information about a time point selected by the host device 100 from a plurality of time points where the target busy signal has a first voltage. Thus, for example, when a third time point where the target busy signal has a first voltage is selected as the power cut-off time point, the power supply device 300 may identify the corresponding time point based on the target busy signal and may cut off the power being supplied to the storage device 2000 at the corresponding time point.

[0059] Meanwhile, according to some embodiments, the host device 100 may send a selection signal to the storage device 2000, the selection signal being used to select a target busy signal from among busy signals output from a plurality of non-volatile memories included in the storage device 2000. Based on the above description, the storage device 2000 may provide the test system 1000 with the target busy signal from among the busy signals output from the plurality of non-volatile memories. This will be described in detail later.

[0060] According to the above embodiments of this disclosure, a test system capable of performing SPOR tests more efficiently can be provided.

[0061] Figure 2 This is a diagram illustrating a method for obtaining current distribution according to some embodiments of the present disclosure.

[0062] The host device 100 can obtain multiple current distributions corresponding to multiple operations of the storage device 2000, respectively. In this case, the multiple operations of the storage device 2000 may include multiple test operations implemented by a combination of commands defined in protocol specifications such as Non-Volatile Memory Fast (NVMe), Universal Flash Storage (UFS), Small Computer System Interface (SCSI), Serial Attached SCSI (SAS), or Serial ATA (SATA)).

[0063] Reference Figure 2 Multiple operations may include combinations of write commands, combinations of write and read commands, combinations of write commands and garbage collection (G / C) operations, combinations of sanitize operations, etc. In this case, each combination can be provided differently by setting different amounts of data associated with the corresponding command or different numbers of corresponding commands. For example, combinations of write commands can be provided differently by setting different amounts of data to be written to the storage device 2000 or different numbers of consecutive write operations. The above description also applies to the other combinations.

[0064] According to some embodiments, the host device 100 can control the storage device 2000 to perform multiple operations, and can obtain a current distribution corresponding to each operation based on the current measured by the current measuring device 200 while the storage device 2000 is performing each operation. In this case, the current distribution may include at least one of the waveform and representative value of the current consumed by the storage device 2000 during each operation. The current distribution obtained in association with the operation of the storage device 2000 may be stored in the host device 100.

[0065] At the same time, as from Figure 2 As understood from the graphs shown, the current distribution associated with multiple operations of the storage device 2000 may differ for each operation. Therefore, when the host device 100 performs a SPOR test, the host device 100 can identify whether the storage device 2000 is performing a target operation based on the multiple current distributions thus stored, and when the storage device 2000 is performing the target operation, the host device 100 can cut off the power being supplied to the storage device 2000.

[0066] Specifically, when the host device 100 performs a SPOR test, the host device 100 can control the storage device 2000 to perform at least one test operation including a target operation. In this case, the current measuring device 200 can measure the current consumed by the storage device 2000 and can provide a current distribution to the host device 100. According to the above description, the host device 100 can identify whether a target operation is being performed based on the current distribution provided from the current measuring device 200 corresponding to the current distribution in the stored current distribution associated with the target operation. Therefore, when the storage device 2000 is performing a target operation, the host device 100 can control the power supply device 300 to cut off the power being supplied to the storage device 2000.

[0067] Figure 3 This is a flowchart illustrating a method of operating a test system according to some embodiments of the present disclosure. (Refer to...) Figure 3 The operation method of the described test system can be referred to in the reference. Figure 1 The operating method of the test system 1000 is described.

[0068] Reference Figure 3 In operation S310, the test system 1000 can supply power to the storage device 2000, which includes multiple non-volatile memories. For example, the host device 100 can control the power supply device 300 to supply power to the storage device 2000.

[0069] In operation S320, the test system 1000 can measure the current consumed by the storage device 2000. For example, when power is supplied to the storage device 2000, the storage device 2000 can perform a predefined operation even if no command corresponding to a single test operation is applied from the host device 100. Furthermore, when commands corresponding to multiple operations are received from the host device 100 according to a test scenario, the storage device 2000 can perform the operation corresponding to the received command. In this case, the current measuring device 200 can measure the current consumed by the storage device 2000 from the point in time when power is supplied to the storage device 2000, and can provide the host device 100 with a current distribution that varies over time.

[0070] In operation S330, the test system 1000 can identify whether the storage device 2000 is performing a target operation based on the measured current and multiple current distributions. Specifically, the host device 100 can store multiple current distributions corresponding to multiple operations of the storage device 2000, respectively. Therefore, for example, when a current distribution similar to the current distribution corresponding to the target operation in the stored current distributions is provided from the current measuring device 200, the host device 100 can identify that the storage device 2000 is performing the target operation.

[0071] In operation S340, the test system 1000 may cut off the power supply to the storage device 2000 based on the fact that the storage device 2000 is performing a target operation. According to some embodiments, when a target non-volatile memory among a plurality of non-volatile memories is operating according to the target operation of the storage device 2000, the test system 1000 may cut off the power supply to the storage device 2000. In this case, whether the target non-volatile memory is operating can be identified based on the busy signal of the target non-volatile memory.

[0072] Figure 4 This is a block diagram of a test system according to some embodiments of the present disclosure. Figure 4 The test system 1000 and storage device 2000 can respectively correspond to Figure 1 The test system 1000 and storage device 2000. In Figure 4 In this document, descriptions associated with components that are the same as those above will be omitted or simplified.

[0073] As described above, the storage device 2000 can provide a target busy signal to the test system 1000. To this end, the host device 100 can send a selection signal to the storage device 2000, the selection signal being used to select a target busy signal from among busy signals 20 output from a plurality of non-volatile memories included in the storage device 2000. Based on the above description, the storage device 2000 can provide the test system 1000 with the target busy signal from among the busy signals 20.

[0074] For details, refer to Figure 4 The storage device 2000 may include multiple non-volatile memories (NVMs) 2200, a controller 2100, and a multiplexer (MUX) 2300.

[0075] For example, the plurality of non-volatile memories 2200 may be NAND flash memory chips. According to some embodiments, the plurality of non-volatile memories 2200 may be vertical NAND (VNAND) flash memory chips. A vertical NAND flash memory chip may include word lines stacked on a substrate in a vertical direction and cell strings each including a plurality of memory cells respectively connected to the word lines. In some embodiments, the plurality of non-volatile memories 2200 may be NOR flash memory chips.

[0076] Multiple non-volatile memories 2200 can receive commands and addresses from controller 2100 through at least one channel, and can exchange data with controller 2100.

[0077] Each of the plurality of non-volatile memories 2200 may include a busy pin that outputs a busy signal 20. In this case, the busy signal may have one of a first voltage corresponding to the state in which the corresponding non-volatile memory is operating and a second voltage corresponding to the state in which the operation of the corresponding non-volatile memory is completed.

[0078] The multiplexer 2300 can be connected to the busy pins of multiple non-volatile memories 2200, and can output the busy signal of one of the multiple non-volatile memories 2200 selected by the controller 2100 to the outside.

[0079] The controller 2100 can control the operation of multiple non-volatile memories 2200 via at least one channel. For example, the controller 2100 can write data into the multiple non-volatile memories 2200 upon request from the host device 100. Furthermore, the controller 2100 can read or erase data stored in the multiple non-volatile memories 2200 upon request from the host device 100. Additionally, the controller 2100 can perform operations such as garbage collection (G / C) or wear leveling on the multiple non-volatile memories 2200.

[0080] In response to a selection signal received from the host device 100 for selecting a target non-volatile memory among a plurality of non-volatile memories 2200, the controller 2100 can control the multiplexer 2300 to output a target busy signal among the busy signals 20 of the plurality of non-volatile memories 2200. Based on the above description, the storage device 2000 can provide the target busy signal to the test system 1000.

[0081] According to some implementation methods, such as by Figure 4 As indicated by the dashed arrow, a target busy signal can be transmitted to the host device 100. In this case, the host device 100 can cut off power to the storage device 2000 while the target non-volatile memory is operating simultaneously with the storage device 2000 performing the target operation.

[0082] For example, when the current measured by the current measuring device 200 corresponds to a current distribution associated with the target operation among a plurality of current distributions and the received target busy signal has a first voltage, the host device 100 may apply a control signal to the power supply device 300 to cut off the power being supplied to the storage device 2000.

[0083] In this case, as described above, the timing at which the control signal for cutting off power is applied to the power supply device 300 can be determined by the host device 100. For example, the host device 100 can select one of a plurality of times when the target non-volatile memory is operating according to the target operation, and can apply the control signal for cutting off the power being supplied to the power supply device 300 to the storage device 2000 at the selected time.

[0084] Furthermore, according to some implementation methods, such as by Figure 4 As indicated by the solid arrow, a target busy signal can be transmitted to the power supply unit 300. In this case, the host device 100 can transmit information in advance about the timing of the power cutoff to the storage device 2000.

[0085] The SPOR test objective (i.e., whether to cut off power to storage device 2000 while any non-volatile memory is operating during any target operation) can be determined in advance according to the SPOR test plan associated with storage device 2000. Therefore, host device 100 can send information in advance about the timing of power cut-off from the power supply to storage device 2000. In this case, the information about the power cut-off timing may include information about a timing selected from a plurality of timing points where the target busy signal has a first voltage.

[0086] For example, based on the current distribution that corresponds to the target operation among multiple current distributions measured by the current measuring device 200, the host device 100 can send information about the power cut-off time to the power supply device 300.

[0087] Based on the above description, the power supply device 300 can identify whether the power cut-off time point has arrived based on the received target busy signal, and can cut off the power being supplied to the storage device 2000 at the identified power cut-off time point.

[0088] Compared to the two embodiments described above, in terms of the reaction speed of cutting off the power to the storage device 2000 immediately after the power cut-off time point, the embodiment that transmits the target busy signal to the power supply device 300 is more advantageous than the embodiment that transmits the target busy signal to the host device 100.

[0089] Figure 5 This is a flowchart describing a method of operating a test system according to some embodiments of the present disclosure. (Refer to...) Figure 5 The operation method of the described test system can be referred to in the reference. Figure 3 The operation described is S340.

[0090] Reference Figure 5 , as reference Figure 3 As described, in operation S330, the test system 1000 can identify whether the storage device 2000 is performing a target operation based on the current measured by the current measuring device 200 and multiple current distributions.

[0091] When the identification result indicates that the storage device 2000 has not performed the target operation ("No" in operation S340-1), the test system 1000 may perform operation S330 again.

[0092] Conversely, when the identification result indicates that the storage device 2000 is performing the target operation ("Yes" in operation S340-1), the test system 1000 can identify whether the target non-volatile memory among the multiple non-volatile memories 2200 is operating.

[0093] In this case, whether the target non-volatile memory is operating can be identified based on the busy signal of the target non-volatile memory (i.e., the aforementioned target busy signal). To this end, the test system 1000 can send a selection signal to the storage device 2000 for selecting the busy signal corresponding to the target non-volatile memory from among the busy signals 20 of the plurality of non-volatile memories 2200, and the storage device 2000 can provide the target busy signal to the test system 1000 based on the selection signal.

[0094] When the target non-volatile memory is detected to be operating based on the target busy signal ("Yes" in operation S340-2), the test system 1000 can cut off the power to the storage device 2000 (S340-3). This is in reference to... Figure 1 and Figure 4 Since it is described in detail, additional descriptions will be omitted to avoid redundancy.

[0095] Meanwhile, according to some embodiments, after the power supply to the storage device 2000 is cut off during operation S340-3, the host device 100 can control the power supply device 300 to restore power to the storage device 2000. Based on the above description, when the power is cut off during operation S340-3, the host device 100 can check the results of the operations performed by the storage device 2000 from the storage device 2000.

[0096] Figure 6 This is a block diagram of a test system according to some embodiments of this disclosure. (Refer to...) Figure 6 The test system 1000A may include a host device 100, a current measuring device 200, and a power supply device 300. In addition to providing information about the current measured by the current measuring device 200 to the power supply device 300, Figure 6 The test system 1000A and Figure 1 or Figure 4The test system is the same as 1000. Therefore, operations that are the same as those of the same components described above will not be described or will be described in a simplified manner.

[0097] According to some embodiments of this disclosure, the power supply device 300 can identify whether the storage device 2000 is performing a target operation. For this purpose, the host device 100 can provide multiple current distributions to the power supply device 300. In this case, the power supply device 300 can store multiple current distributions. Furthermore, the current measuring device 200 can provide the power supply device 300 with current distributions measured during operation of the storage device 2000.

[0098] In this case, the power supply device 300 can identify whether the storage device 2000 is performing a target operation based on the current distribution received from the current measuring device 200 and the stored current distribution. Specifically, when the current (or current distribution) measured by the current measuring device 200 corresponds to a current distribution among a plurality of current distributions associated with the target operation, the power supply device 300 can identify that the storage device 2000 is performing a target operation.

[0099] Simultaneously, the power supply unit 300 can receive information about the power cut-off time from the host unit 100. Furthermore, the power supply unit 300 can receive a target busy signal from the storage device 2000. In this case, based on the information about the power cut-off time and the target busy signal, the power supply unit 300 can cut off the power to the storage device 2000 when the target non-volatile memory is operating according to the target operation.

[0100] In response to the above operations, according to some implementations, the power supply device 300 may include a microcontroller and a memory.

[0101] Figure 7 This is a block diagram of a test system according to some embodiments of the present disclosure. Except that the current measuring device 200 is not separately provided, Figure 7 The test system 1000B and Figure 1 and Figure 4 Test system 1000 or Figure 6 The test system is the same as the 1000A. Therefore, operations that are the same as those of the same components described above will not be described or will be simplified.

[0102] According to some embodiments of this disclosure, the above functions of the current measuring device 200 can be performed by a power management integrated circuit 200A included in the power supply device 300A.

[0103] Reference Figure 7The test system 1000B may include a host device 100 and a power supply device 300A. In this case, the power supply device 300A may include a power management integrated circuit (PMIC) 200A. The power management integrated circuit 200A manages the power supplied by the power supply device 300A to the storage device 2000.

[0104] The power supplied to the storage device 2000 when it is operating corresponds to the current consumed during the operation of the storage device 2000. Therefore, information associated with the current consumed by the storage device 2000 (i.e., current distribution) can be obtained by the power management integrated circuit 200A.

[0105] According to some implementations, the power supply device 300A may provide the host device 100 with a current distribution obtained through the power management integrated circuit 200A. In this case, the host device 100 may identify whether the storage device 2000 is performing a target operation based on the current distribution received from the power supply device 300A and the stored current distribution.

[0106] Optionally, according to some embodiments, the power supply device 300A may receive and store multiple current distributions from the host device 100. In this case, the power supply device 300A may identify whether the storage device 2000 is performing a target operation based on the current distributions obtained through the power management integrated circuit and the stored current distributions.

[0107] Simultaneously, the power supply unit 300A can receive information about the power cut-off time from the host unit 100 and can receive a target busy signal from the storage device 2000. In this case, based on the information about the power cut-off time and the target busy signal, the power supply unit 300A can cut off the power to the storage device 2000 when the target non-volatile memory is operating according to the target operation.

[0108] Figure 8 This is a block diagram of a test system according to some embodiments of the present disclosure. Except that the current measuring device 200 is not separately provided, Figure 8 The test system 1000C and Figure 1 and Figure 4 Test system 1000 or Figure 6 The test system is the same as the 1000A. Therefore, operations that are the same as those of the same components described above will not be described or will be simplified.

[0109] According to some embodiments of this disclosure, the above functions of the current measuring device 200 can be performed by a power management integrated circuit 200B included in the storage device 2000A.

[0110] Reference Figure 8The test system 1000C may include a host device 100 and a power supply device 300. Additionally, the storage device 2000A may include a power management integrated circuit (PMIC) 200B. The power management integrated circuit 200B manages the power used within the storage device 2000A.

[0111] The power consumed when the storage device 2000A is operating can correspond to the current consumed during the operation of the storage device 2000A. Therefore, information associated with the current consumed by the storage device 2000A (i.e., current distribution) can be obtained through the power management integrated circuit 200B.

[0112] According to some embodiments, the storage device 2000A may provide the host device 100 with a current distribution obtained through the power management integrated circuit 200B. In some embodiments, the current distribution obtained through the power management integrated circuit 200B may be provided to the host device 100 through a sideband interface between the storage device 2000A and the host device 100. In this case, the host device 100 may identify whether the storage device 2000A is performing a target operation based on the current distribution received from the storage device 2000A and the stored current distribution.

[0113] Simultaneously, the power supply unit 300 can receive information about the power cut-off time from the host unit 100 and can receive a target busy signal from the storage device 2000A. Therefore, based on the information about the power cut-off time and the target busy signal, the power supply unit 300 can cut off the power to the storage device 2000A when the target non-volatile memory is operating according to the target operation.

[0114] According to some implementations, when a target busy signal is provided to the host device 100, the host device 100 can identify whether the target non-volatile memory is operating based on the target busy signal. In this case, the host device 100 can apply a control signal to the power supply device to cut off the power to the storage device 2000A when the target non-volatile memory is operating according to the target operation, and the power supply device 300 can cut off the power to the storage device 2000A based on the applied control signal.

[0115] Figure 9 This is a block diagram of a test system according to some embodiments of the present disclosure. According to some embodiments of the present disclosure, the above-described test system 1000 can be implemented using a SPOR test apparatus. Figure 9 The test system 1000D, implemented using a single device, is shown.

[0116] Reference Figure 9 The test system 1000D may include a processor 1100, a memory 1200, a current measurement unit 200C, and a power supply unit 300B.

[0117] Power supply unit 300B may correspond to the power supply device 300 described above. Therefore, power supply unit 300B can perform the functions of the power supply device 300 described above. For example, under the control of processor 1100, power supply unit 300B can supply power to storage device 2000, or can cut off the power being supplied to storage device 2000. For this purpose, power supply unit 300B may be connected to the power pin of storage device 2000.

[0118] The current measuring unit 200C may correspond to the current measuring device 200 described above. Therefore, the current measuring unit 200C can perform the functions of the current measuring device 200. For example, the current measuring unit 200C can measure the current consumed by the storage device 2000 when the storage device 2000 is operating. For this purpose, the current measuring unit 200C may be connected to the power pin of the storage device 2000.

[0119] The memory 1200 can store various programs and data used to control the operation of the test system 1000D. Furthermore, the memory 1200 can store multiple current distributions corresponding to multiple operations of the storage device 2000. Here, the multiple operations of the storage device 2000 can include multiple test operations implemented through combinations of commands defined in protocol specifications such as Non-Volatile Memory Faster (NVMe), Universal Flash Storage (UFS), Small Computer System Interface (SCSI), Serial Attached SCSI (SAS), or Serial ATA (SATA)).

[0120] The memory 1200 may include volatile memory (such as static random access memory (SRAM), dynamic RAM (DRAM) or synchronous DRAM (SDRAM)) and / or non-volatile memory (such as phase change RAM (PRAM), magnetoresistive RAM (MRAM), resistive RAM (ReRAM) or ferroelectric RAM (FRAM)).

[0121] The processor 1100 controls all operations of the test system 1000D. The processor 1100 may include a central processing unit (CPU) or a microprocessor.

[0122] The processor 1100 can perform the above operations of the host device 100 based on the program and data stored in the memory 1200. For example, the processor 1100 can perform a SPOR test on the storage device 2000.

[0123] Specifically, when the storage device 2000 is performing a target operation, the processor 1100 can control the power supply unit 300B to cut off the power being supplied to the storage device 2000. To this end, the processor 1100 can identify whether the storage device 2000 is performing a target operation based on the current measured by the current measurement unit 200C and multiple current distributions stored in the memory 1200.

[0124] Furthermore, when the target non-volatile memory included in the storage device 2000 is operating according to the target operation, the processor 1100 can control the power supply unit 300B to cut off the power being supplied to the storage device 2000. To this end, the processor 1100 can identify whether the target non-volatile memory is operating based on a target busy signal provided from the storage device 2000.

[0125] Simultaneously, the processor 1100 can send a selection signal to the storage device 2000, which is used to select a target busy signal from among busy signals output from a plurality of non-volatile memories included in the storage device 2000. Based on the above description, the storage device 2000 can provide the test system 1000D with the target busy signal from among the busy signals output from the plurality of non-volatile memories.

[0126] Figure 10 This is a flowchart describing the operation method of a test system according to some embodiments of the present disclosure.

[0127] Reference Figure 10 In operation S1010, test systems 1000, 1000A, 1000B, 1000C, or 1000D can determine the scope of the SPOR test. For example, host device 100 can determine the target operation and target non-volatile memory of storage device 2000.

[0128] During operation S1020, test systems 1000, 1000A, 1000B, 1000C, or 1000D may allow the operation of storage device 2000 to continue. For example, host device 100 may send commands and data to storage device 2000, causing storage device 2000 to sequentially execute multiple operations according to a predefined test scenario. In this case, current measuring device 200 may measure the current consumed by storage device 2000 and provide the current distribution to host device 100 in real time.

[0129] In operation S1030, test systems 1000, 1000A, 1000B, 1000C, or 1000D can determine whether storage device 2000 is performing a target operation. For example, when the current distribution received from current measuring device 200 matches the current distribution corresponding to the target operation among a plurality of pre-stored current distributions, host device 100 can determine that storage device 2000 is performing the target operation.

[0130] When it is determined that the storage device 2000 is performing a target operation, in operation S1040, the test system 1000 can determine whether the target non-volatile memory is operating. In this case, the operation of the target non-volatile memory can be determined based on the target busy signal provided from the storage device 2000.

[0131] According to some embodiments, a target busy signal may be provided to the host device 100. In this case, the host device 100 may determine whether the target non-volatile memory is operating based on the target busy signal. Alternatively, according to some embodiments, the target busy signal may be provided to the power supply device 300. In this case, the power supply device 300 may determine whether the target non-volatile memory is operating based on the target busy signal.

[0132] When it is determined that the storage device 2000 is performing a target operation, in operation S1050, the test system 1000 may cut off the power supply to the storage device 2000.

[0133] According to some implementations, the host device 100 may apply a control signal to the power supply device 300 to cut off power to the storage device 2000 at a power-off time determined based on a target busy signal. The power supply device 300 may then cut off power to the storage device 2000 according to the applied control signal.

[0134] Optionally, according to some embodiments, the host device 100 may provide information about the power cut-off time to the power supply device 300. Based on the above description, the power supply device 300 may cut off power to the storage device 2000 based on the information about the power cut-off time and a target busy signal.

[0135] Meanwhile, if it is determined in operation S1030 that the storage device 2000 has not performed the target operation, or if it is determined in operation S1040 that the target non-volatile memory has not performed an operation, the test system 1000 may execute operation S1020 again. In this case, the operation of the storage device 2000 can be performed continuously according to the test scenario, and the current measuring device 200 can continuously provide the host device 100 with real-time measured current distribution.

[0136] In operation S1060, the test system 1000 can check the result of the SPOR operation performed by the storage device 2000 when the power was cut off. For example, in operation S1060, the host device 100 can control the power supply device 300 to supply power to the storage device 2000 again, and can check from the storage device 2000 the result of the operation performed by the storage device 2000 when the power was cut off in operation S1050.

[0137] According to some embodiments, methods according to various embodiments of this disclosure may be included and incorporated into a computer program product. The computer program product may be traded as a commodity between a seller and a buyer. The computer program product may be in the form of a machine-readable storage medium (e.g., an optical disc read-only memory (CD-ROM)) or through an app store (e.g., the Play Store). TM Online distribution. In the case of online distribution, at least a portion of the computer program product may be stored at least temporarily in a storage medium (such as the manufacturer's server, the app store's server, or the memory of a relay server) or may be temporarily generated.

[0138] According to the various embodiments of this disclosure described above, a test system capable of performing SPOR tests more efficiently can be provided.

[0139] According to embodiments of this disclosure, a test system capable of performing SPOR tests more efficiently can be provided.

[0140] As used herein, the term “at least one of…” may mean and cover any and all possible combinations of one or more of the associated listed terms. For example, the term “at least one of A, B or C” means that: (i) at least one of A, (ii) at least one of B, (iii) at least one of C, (iv) at least one of A and at least one of B, (v) at least one of B and at least one of C, (vi) at least one of A and at least one of C, or (vi) at least one of A, at least one of B and at least one of C is possible, wherein A, B and C may be singular or plural.

[0141] Although this disclosure has been described with reference to embodiments thereof, it will be apparent to those skilled in the art that various changes and modifications may be made thereto without departing from the spirit and scope of this disclosure as set forth in the appended claims.

Claims

1. A testing system, comprising: A power supply device is configured to supply power to a storage device comprising multiple non-volatile memories; A current measuring device is configured to measure the current consumed by a storage device; as well as The host device is configured to control the power supply to cut off power based on the storage device performing a target operation. The host device is configured as follows: The storage corresponds to multiple current distributions for multiple operations of the storage device, and The target operation of the storage device is determined based on the current measured by the current measuring device and the distribution of the multiple currents.

2. The testing system according to claim 1, wherein, The host device is configured as follows: Based on the matching of the current measured by the current measuring device with a first current distribution among the plurality of current distributions that is associated with the target operation, it is determined that the storage device is performing the target operation.

3. The testing system according to claim 1, wherein, Each of the plurality of current distributions includes: the waveform and / or representative value of the current consumed by the storage device during the corresponding operation.

4. The testing system according to claim 1, wherein, The host device is configured as follows: Based on the target operation, the control power supply device cuts off power when the target non-volatile memory among the plurality of non-volatile memories is in operation.

5. The testing system according to claim 4, wherein, The process of determining that the storage device is performing a target operation includes: determining that the target non-volatile memory is operating based on a busy signal output from the target non-volatile memory, and The busy signal includes: a first voltage corresponding to the state in which the target non-volatile memory is operating, or a second voltage corresponding to the state in which the operation of the target non-volatile memory is completed.

6. The testing system according to claim 5, wherein, The host device is also configured as follows: A selection signal is sent to the storage device, the selection signal being used to select, from among a plurality of busy signals output by the plurality of nonvolatile memories, a busy signal output by a target nonvolatile memory.

7. The testing system according to claim 5, wherein, The host device is configured as follows: Receive the busy signal output from the target non-volatile memory; and Based on the current measured by the current measuring device matching the current distribution associated with the target operation among the plurality of current distributions and the received busy signal including a first voltage, the power supply device is controlled to cut off power.

8. The testing system according to claim 5, wherein, The power supply is also configured to receive a busy signal output from the target non-volatile memory. The host device is also configured to: send information about the power cut-off time to the power supply device based on matching the current measured by the current measuring device with a current distribution among the plurality of current distributions associated with the target operation; The power supply unit is also configured as follows: Based on the received busy signal, the arrival time of the power cut-off is determined, and Power is cut off at the designated time.

9. The test system according to any one of claims 1 to 4, wherein, The aforementioned multiple operations of the storage device are test operations performed through a combination of commands defined by a protocol for communication between the host device and the storage device, and The protocol includes: non-volatile memory fast, general-purpose flash memory, small computer system interface, serial attachment small computer system interface or serial advanced technology attachment.

10. The test system according to any one of claims 1 to 4, wherein, The host device is also configured as follows: The control storage device performs each of the plurality of operations; and The current distribution corresponding to each of the plurality of operations is obtained based on the current measured by the current measuring device at each of the plurality of operations being performed by the storage device.

11. The testing system according to claim 4, wherein, The host device is also configured as follows: Based on the fact that the power supply to the storage device is cut off, the control power supply device will supply power to the storage device; and The result of the operation of the storage device is determined based on the power being cut off during the target operation.

12. The test system according to any one of claims 1 to 4, wherein, The power supply device includes a power management integrated circuit configured to manage the supply of power, and The current measuring device is also configured to operate based on a power management integrated circuit that uses a power supply device.

13. The test system according to any one of claims 1 to 4, wherein, The storage device includes a power management integrated circuit configured to manage the supply of power used within the storage device, and The current measuring device is also configured to operate based on a power management integrated circuit that uses a storage device.

14. A storage device, comprising: Multiple non-volatile memories, each of which is configured to output a busy signal; The controller is configured to control the operation of the plurality of non-volatile memories; as well as A multiplexer is connected to the busy pin of the plurality of nonvolatile memories and is configured to output a busy signal for a nonvolatile memory selected from the plurality of nonvolatile memories.

15. The storage device according to claim 14, wherein, The controller is also configured as follows: Based on the received selection signal for selecting a target non-volatile memory among the plurality of non-volatile memories, the control multiplexer outputs the busy signal corresponding to the target non-volatile memory from among the busy signals of the plurality of non-volatile memories.

16. The storage device of claim 14, further comprising: A power management integrated circuit is configured to manage the supply of power used within the storage device. The controller is also configured as follows: Information about the current consumed during operation of the storage device is obtained by using a power management integrated circuit; and The obtained current information is sent to the outside of the controller via the sideband interface.

17. A method for operating a testing system, the method comprising: Power is supplied to a storage device that includes multiple non-volatile memories; Measure the current consumed by the storage device; The target operation being performed by the storage device is determined based on the current and multiple current distributions. as well as Power is cut off to the storage device based on the determination that the storage device is performing the target operation. The multiple current distributions correspond to multiple operations of the storage device.

18. The operating method according to claim 17, wherein, The steps to cut off power to the storage device include: Based on the target operation, power is cut off when the target non-volatile memory among the plurality of non-volatile memories is in operation.

19. The operating method according to claim 18, further comprising: The target non-volatile memory is determined to be operational based on the busy signal from the target non-volatile memory. The busy signal of the target non-volatile memory includes: a first voltage corresponding to the state in which the target non-volatile memory is operating, or a second voltage corresponding to the state in which the operation of the target non-volatile memory is completed.

20. The operating method according to claim 19, further comprising: A selection signal is sent to the storage device. This selection signal is used to select the busy signal corresponding to the target non-volatile memory from among the multiple busy signals of the plurality of non-volatile memories. The busy signal of the target non-volatile memory is output from the memory device based on the selection signal.

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