Test method and system for connecting tests of different test equipment
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- JINGLONG TECH SUZHOU
- Filing Date
- 2026-06-18
- Publication Date
- 2026-07-21
AI Technical Summary
In current CIS chip testing, cross-platform testing cycles are long, there are risks to the quality of the wafer under test, testing efficiency is reduced and the operation time is extended.
By configuring the transmission control protocol in the server, a data transmission channel is established between the test host and the test slave. A general interface bus is used to connect them to realize the command transmission channel, integrating the test host and the test slave into a test system for unified management of data and commands.
It shortened the testing cycle, reduced testing costs, improved testing efficiency, reduced quality risks, and ensured the security and reliability of test data.
Smart Images

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