Test method and system for connecting tests of different test equipment

CN122437791APending Publication Date: 2026-07-21JINGLONG TECH SUZHOU
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
JINGLONG TECH SUZHOU
Filing Date
2026-06-18
Publication Date
2026-07-21

AI Technical Summary

Technical Problem

In current CIS chip testing, cross-platform testing cycles are long, there are risks to the quality of the wafer under test, testing efficiency is reduced and the operation time is extended.

Method used

By configuring the transmission control protocol in the server, a data transmission channel is established between the test host and the test slave. A general interface bus is used to connect them to realize the command transmission channel, integrating the test host and the test slave into a test system for unified management of data and commands.

Benefits of technology

It shortened the testing cycle, reduced testing costs, improved testing efficiency, reduced quality risks, and ensured the security and reliability of test data.

✦ Generated by Eureka AI based on patent content.

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    Figure CN122437791A_ABST
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Abstract

The application relates to the field of semiconductor technology, in particular to a test method and system for communication test of different test equipment. A transmission control protocol is configured in a server; a data transmission channel between a test host and a test slave is established by using the transmission control protocol; a general interface bus is used to connect the test host and the test slave, so that an instruction transmission channel between the test host and the test slave is established; the test host sends test instructions to the test slave through the instruction transmission channel; the test slave obtains the test instructions, executes test on a wafer, and obtains slave test results of the wafer; and the slave test results of the test slave are fed back to the test host through the data transmission channel. The application unifies and analyzes the slave test results of the multiple test equipment, improves the test efficiency, and reduces the quality risk caused by long-distance transfer during cross-platform test.
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