Eye pattern processing method, eye pattern drawing method, device, medium and program product

Abstract

The application provides an eye diagram processing method, an eye diagram drawing method, equipment, a medium and a program product, which can be used in the technical field of signal processing. The eye diagram processing method comprises the following steps: acquiring a sampling point set of a to-be-tested eye in a projection area; wherein the projection area comprises a continuous area formed by a plurality of rows and at least one column of first measurement grids; and projecting the sampling point set to a projection sub-area in the projection area to obtain a target virtual eye diagram; wherein the projection sub-area is part or all of the continuous area in the projection area, the projection sub-area comprises a plurality of rows and a plurality of columns of second measurement grids, the number of rows of the second measurement grids in the projection sub-area is greater than or equal to the number of rows of the first measurement grids in the projection area, and the number of columns of the second measurement grids in the projection sub-area is greater than the number of columns of the first measurement grids in the projection area. The application further divides the measurement grids corresponding to the to-be-tested eye in the projection area, improves the resolution of the projection area, and thus obtains a clearer target virtual eye diagram.

Description

Technical Field

[0001] This application relates to the field of signal processing technology, and in particular to eye diagram processing methods, eye diagram drawing methods, devices, media and program products. Background Technology

[0002] An eye diagram is a core tool used in high-speed digital communication to assess signal integrity. Essentially, it uses measuring instruments such as oscilloscopes to superimpose periodic serial signals and display them as an "eye"-like graphic.

[0003] The essence of an eye diagram is the result of projecting a series of signal sampling points of different codes in a periodic signal onto the observation range of a measuring instrument such as an oscilloscope according to a certain rule. The observation range refers to the area formed by the time range in the horizontal direction and the voltage range in the vertical direction. The two together define the visible boundary and measurement dimension of the eye diagram.

[0004] For current measuring instruments such as oscilloscopes, the resolution of the original two-dimensional grid is limited. When the observation range is configured to be large, the resolution of the eye diagram will decrease, making it difficult to measure the relevant parameters of the eye diagram based on the two-dimensional grid. Summary of the Invention

[0005] This application provides an eye diagram processing method, an eye diagram drawing method, an apparatus, a medium, and a program product to solve the technical problem that when the measuring instrument is configured with a large observation range, the resolution of the eye diagram decreases, making it difficult to measure the relevant parameters of the eye diagram.

[0006] According to a first aspect disclosed in this application, an eye diagram processing method is provided, comprising: acquiring a sampling point set of the eye to be tested in a projection area; wherein the sampling point set includes all sampling points corresponding to the eye to be tested, the projection area is used to project the sampling point set of the eye to be tested, the projection area includes a continuous region composed of multiple rows and at least one column of first measurement grids, each first measurement grid having a horizontal range of one time slot and a vertical range of one voltage slot; projecting the sampling point set onto a projection sub-region in the projection area to obtain a target virtual eye diagram; wherein the projection sub-region is part or all of the continuous region in the projection area, the projection sub-region includes multiple rows and columns of second measurement grids, the number of rows of the second measurement grids in the projection sub-region is greater than or equal to the number of rows of the first measurement grids in the projection area, and the number of columns of the second measurement grids in the projection sub-region is greater than the number of columns of the first measurement grids in the projection area. In this solution, by further subdividing the first measurement grid of the projection sub-region corresponding to the eye to be tested relative to the first measurement grids at other locations to obtain multiple rows and / or multiple columns of second measurement grids, the grid granularity of the projection sub-region is higher than the granularity of other locations. When the sampling point set of the eye under test is projected onto the projection sub-region, the projection sub-region has better resolution for the eye under test, which helps to improve the problem of low eye diagram resolution when dealing with large observation ranges in related technologies. In turn, it can improve the problem of difficulty in measuring the relevant parameters of the eye diagram for eye diagrams with large observation ranges in related technologies.

[0007] In one feasible implementation, projecting a set of sampling points onto a projection sub-region within a projection area to obtain a target virtual eye diagram includes: projecting the set of sampling points onto a candidate projection sub-region to obtain a candidate virtual eye diagram; wherein the candidate projection sub-region is a portion or all of a continuous region within the projection area, and the candidate projection sub-region includes a second measurement grid with multiple rows and columns; determining whether the candidate virtual eye diagram is resolvable; if the candidate virtual eye diagram is indistinguishable, increasing the number of rows and / or columns of the second measurement grid in the candidate projection sub-region to update the candidate projection sub-region, and projecting the set of sampling points onto the updated candidate projection sub-region to obtain an updated candidate virtual eye diagram, returning to the step of determining whether the candidate virtual eye diagram is resolvable; if the candidate virtual eye diagram is resolvable, determining the candidate projection sub-region as a projection sub-region, and determining the candidate virtual eye diagram as the target virtual eye diagram. In this embodiment, the candidate virtual eye map is repeatedly judged to determine whether it is resolvable. When the candidate virtual eye map is indistinguishable, the first measurement grid in the projection sub-region is dynamically divided into a second measurement grid with multiple rows and / or columns, and the number of rows and / or columns of the second measurement grid is continuously increased to continuously improve the resolution of the projection sub-region, thereby obtaining a clear target virtual eye map.

[0008] In one feasible implementation, before projecting the sampling point set onto the candidate projection sub-region to obtain the candidate virtual eye diagram, the method further includes: determining a first time base scale and a first voltage scale of a first measurement grid based on the observation range and two-dimensional grid of the eye diagram to be observed; wherein, the observation range is the time range and voltage range covered by the eye diagram to be observed, the eye diagram to be observed includes multiple observation eyes, the eye to be measured is one of the multiple observation eyes, the two-dimensional grid includes a multi-row, multi-column first measurement grid, the projection area is a portion of the two-dimensional grid, the first time base scale is the width of the time slot of the first measurement grid, and the first voltage scale is the height of the voltage slot of the first measurement grid; determining a first standard number of divisions of the first measurement grid along the horizontal direction based on the first time base scale and the time base threshold; determining a second standard number of divisions of the first measurement grid along the vertical direction based on the first voltage scale and the voltage threshold; and dividing the candidate projection sub-region into one or more columns and one or more rows of a second measurement grid within the boundary of the candidate projection sub-region based on the first standard number and the second standard number, so as to obtain the candidate projection sub-region. In this embodiment, before the initial projection of the sampling point set, the first standard number of horizontal divisions and the second standard number of vertical divisions of the first measurement grid are determined using information such as the first time base scale, time base threshold, first voltage scale, and voltage threshold. Then, based on the first and second standard numbers, the candidate projection sub-region is divided into one or more columns or rows of second measurement grids. This ensures that the projection sub-region has good resolution during the initial projection of the sampling point set of the eye under test. Furthermore, this method only refines the candidate projection sub-region. This is equivalent to retaining only the second measurement grids within the candidate projection sub-region when dividing all first measurement grids into second measurement grids according to the first standard number, without dividing other areas of the projection region into second measurement grids. This method can improve the resolution of the candidate projection sub-region for the eye under test while reducing the specific number of first measurement grids, thereby reducing the computational power requirement.

[0009] In one feasible implementation, determining the first standard number of horizontally divided measurement grids based on a first time base scale and a time base threshold includes: if the first time base scale is less than or equal to the time base threshold, determining the first standard number as one; and if the first time base scale is greater than the time base threshold, determining the first standard number based on the quotient of the first time base scale and the time base threshold. Determining the second standard number of vertically divided measurement grids based on a first voltage scale and a voltage threshold includes: if the first voltage scale is less than or equal to the voltage threshold, determining the second standard number as one; and if the first voltage scale is greater than the voltage threshold, determining the second standard number based on the quotient of the first voltage scale and the voltage threshold. In this implementation, by using the relationship between the first time base scale and the time base threshold of the first measurement grid, and the relationship between the first voltage scale and the voltage threshold of the first measurement grid, the first standard number and the second standard number of second measurement grids in the candidate projection sub-region, respectively, divided along the horizontal and vertical directions, are determined, thereby improving the resolution of the candidate projection sub-region in the horizontal and / or vertical directions as needed.

[0010] In one feasible implementation, a second measurement grid is divided within the candidate projection sub-region according to a first standard quantity and a second standard quantity, comprising: determining a second time base scale of the second measurement grid based on the quotient of a first time base scale and a first standard quantity; determining a second voltage scale of the second measurement grid based on the quotient of a first voltage scale and a second standard quantity; and dividing the candidate projection sub-region within its boundary according to the second time base scale and the second voltage scale, comprising a second measurement grid. In this implementation, dividing the candidate projection sub-region based on the second time base scale is equivalent to retaining only the second measurement grid divided within the candidate projection sub-region when dividing all first measurement grids in the projection region into second measurement grids according to the first standard quantity, without dividing other areas in the projection region into second measurement grids. This method can improve the resolution of the candidate projection sub-region for the eye under test while reducing the specific number of first measurement grids, thereby reducing the computational power requirement.

[0011] In one feasible implementation, the candidate projection sub-region is a partial continuous region within the projection region; the starting position and ending position of the eye to be tested are respectively a first starting position and a first ending position, and the starting position and ending position of the boundary of the candidate projection sub-region along the horizontal direction are respectively a second starting position and a second ending position; the second starting position is earlier than the first starting position but not earlier than the starting position of the first measurement grid where the first starting position is located, and the second ending position is later than the first ending position but not later than the ending position of the first measurement grid where the first ending position is located. In this implementation, since the candidate projection sub-region is a partial continuous region within the projection region, when performing grid division, the candidate projection sub-region can be gridded, without needing to grid other regions within the projection region. This improves the resolution of the candidate projection sub-region for the eye to be tested while reducing the specific number of grid divisions, thereby reducing the computational power requirement during the update and division of the candidate projection sub-region.

[0012] In one feasible implementation, the second starting position and the second ending position are determined based on the following method: A second starting position is determined according to a first starting position and a second time base scale; wherein the second time base scale is the time base scale when the first measurement grid is divided into a first standard number, the interval between the starting position of the first measurement grid where the first starting position is located and the second starting position is an integer multiple of the second time base scale, and the interval between the first starting position and the second starting position is less than the second time base scale; A second ending position is determined according to a first ending position and the second time base scale; wherein the interval between the ending position of the first measurement grid where the first ending position is located and the second ending position is an integer multiple of the second time base scale, and the interval between the first ending position and the second ending position is less than the second time base scale. In this embodiment, the starting and ending positions of the candidate projection sub-region are integer multiples of the starting and ending positions of the corresponding first measurement grid from the second time base scale. This is equivalent to retaining only the number of columns with the projected sampling point set when dividing the first measurement grid into second measurement grids according to the second time base scale, and the multiple columns of the second measurement grid of the candidate projection sub-region are complete, so as to ensure the resolution capability of the candidate projection sub-region for the eye under test.

[0013] In one feasible implementation, increasing the number of rows and / or columns of the second measurement grid in the candidate projection sub-region to update the candidate projection sub-region includes: updating the time base threshold according to a time base threshold and a first reduction factor; updating the first standard number according to a first time base scale and the updated time base threshold; updating the voltage threshold according to a voltage scale threshold and a second reduction factor; updating the second standard number according to a first voltage scale and the updated voltage threshold; and dividing multiple rows and / or columns of the second measurement grid within the boundary of the candidate projection sub-region according to the updated first standard number and the updated second standard number. In this implementation, in each iterative step of dividing the first measurement grid in the candidate projection sub-region into a second measurement grid, the time base threshold and voltage threshold are continuously reduced by the first reduction factor and the second reduction factor to continuously update the first standard number of the first measurement grid divided horizontally and the second standard number divided vertically. This updates the grid division of the candidate projection sub-region according to the updated first standard number and the updated second standard number, thereby continuously improving the resolution of the candidate projection sub-region until the resolvable requirements of the eye diagram under test are met.

[0014] In one feasible implementation, before the step of dividing the candidate projection sub-region into multiple rows and / or columns of second measurement grids within the boundary according to the updated first standard number and the updated second standard number, the number of rows and / or columns of the second measurement grids in the candidate projection sub-region is increased to update the candidate projection sub-region. This further includes updating the boundary of the candidate projection sub-region according to the updated first standard number. Since the first standard number changes continuously during the iteration process and is relative to the first measurement grid, updating the boundary of the candidate projection sub-region first, and then dividing the boundary based on the second time base scale, ensures that the number of columns of the second measurement grids divided according to the second time base scale in the candidate projection sub-region is equivalent to dividing the first measurement grid in the projection region according to the second time base scale, retaining the number of columns with projected sampling point sets, and ensuring that all second measurement grids in the candidate projection sub-region are complete. Therefore, the updated candidate projection sub-region and the scheme of directly dividing the first measurement grid according to the second time base scale to obtain multiple columns of second measurement grids can have essentially the same resolution capability, while requiring less computational power.

[0015] In one feasible implementation, the candidate projection sub-region is the entire continuous area within the projection area. In this implementation, the candidate projection sub-region is the entire continuous area within the projection area, thereby dividing the first measurement grid in the projection area into grids to ensure that the eye under test can be completely resolved. This method eliminates the need for further determination of candidate projection sub-regions / projection sub-regions within the projection sub-region, thus offering the advantage of a simpler process.

[0016] In one feasible implementation, determining whether a candidate virtual eye diagram is resolvable includes: if the interior of the candidate virtual eye diagram is not separated by at least one second measurement grid in the horizontal direction, or if the interior of the candidate virtual eye diagram is not separated by at least one second measurement grid in the vertical direction, then the candidate virtual eye diagram is determined to be indistinguishable; if the interior of the candidate virtual eye diagram is separated by at least one second measurement grid in both the horizontal and vertical directions, then the candidate virtual eye diagram is determined to be resolvable. In this implementation, by identifying whether the interior of the candidate virtual eye diagram is separated by at least one second measurement grid in both the horizontal and vertical directions, it is possible to determine whether the candidate virtual eye diagram is open in both directions, thereby determining whether the candidate virtual eye diagram is resolvable, which has the advantages of simplicity and efficiency.

[0017] In one feasible implementation, determining whether a candidate virtual eye diagram is resolvable includes: acquiring a reference measurement grid; wherein the reference measurement grid is a second measurement grid within the candidate projection sub-region; if at least one sampling point hits both first reference grids, and / or at least one sampling point hits both second reference grids, the candidate virtual eye diagram is determined to be indistinguishable; wherein the first reference grid is a second measurement grid adjacent to the reference measurement grid in the horizontal direction, with the two first reference grids located on opposite sides of the reference measurement grid; the second reference grid is a second measurement grid adjacent to the reference measurement grid in the vertical direction, with the two second reference grids located on opposite sides of the reference measurement grid; if neither of the two first reference grids is hit by any sampling point, and neither of the two second reference grids is hit by any sampling point, the candidate virtual eye diagram is determined to be resolvable. In this implementation, because the eye diagram pattern should be continuous, by identifying the sampling point hit status of the first reference grids adjacent to the reference measurement grid in the horizontal direction and the second reference grids adjacent to the reference measurement grid in the vertical direction, it can be determined whether the current reference measurement grid has not been hit by any sampling point. When neither the first nor the second reference grid is hit, it indicates that the baseline measurement grid is also not hit, and the nearby reference grids are also not hit. There is a continuous blank area inside the candidate virtual eye diagram, and the current candidate virtual eye diagram is resolvable. When at least one of the first or the second reference grid is hit, it indicates that the baseline measurement grid may be hit. It cannot be determined that there is a continuous blank area inside the candidate virtual eye diagram, so the candidate virtual eye diagram is determined to be indistinguishable. In this way, the reliability of the result is high when determining that the candidate virtual eye diagram is resolvable.

[0018] In one feasible implementation, the method further includes: determining eye diagram characteristic parameters based on the target virtual eye diagram; wherein the eye diagram characteristic parameters include at least one parameter selected from eye width, eye height, eye opening, total jitter, random jitter, deterministic jitter, time margin, amplitude noise, voltage margin, signal-to-noise ratio, rise time, and fall time; and attaching a preset mark to the characteristic parameters; wherein the preset mark is used to characterize that the second measurement grid used when acquiring the characteristic parameters is different from the first measurement grid. In this implementation, by acquiring the target virtual eye diagram, relevant characteristic parameters of the eye diagram can be measured to achieve eye diagram measurement. Eye diagram measurement can quantify the amplitude margin, timing stability, and anti-interference capability of the signal, thereby accurately locating the root causes of signal degradation such as noise, inter-symbol interference, crosstalk, or clock skew, thus providing key signal quality indicators for high-speed communication systems, guiding the system to optimize equalization design, adjust impedance matching, or suppress jitter, enabling the system to achieve reliable and stable signal transmission. Furthermore, the feature parameter results obtained from the reprojected target virtual eye diagram calculation can be marked in measurement scenarios involving oscilloscopes, etc., to clearly inform the user that the current feature parameter results are not based on the original two-dimensional mesh, thus prompting the user that the two-dimensional mesh used by the measuring instrument to draw the eye diagram has changed, which conforms to industry standards.

[0019] According to a second aspect disclosed in this application, this application provides an eye diagram drawing method, comprising: determining a target virtual eye diagram according to the eye diagram processing method of any one of the first aspects; determining a virtual eye diagram image corresponding to the target virtual eye diagram based on the target virtual eye diagram; and stitching together multiple virtual eye diagram images to obtain a target eye diagram image. In this solution, after converting the target virtual eye diagram into a virtual eye diagram image, multiple virtual eye diagram images are stitched together to form a complete target eye diagram image. This allows for the rapid drawing of the entire eye diagram using a single target virtual eye diagram, eliminating the need to traverse all data points and improving the efficiency of eye diagram drawing.

[0020] According to a third aspect disclosed in this application, an eye diagram processing apparatus is provided, comprising: a data acquisition module for acquiring a set of sampling points of an eye to be tested in a projection area; wherein the set of sampling points includes all sampling points corresponding to the eye to be tested, the projection area is used to project the set of sampling points of the eye to be tested, the projection area includes a continuous region composed of multiple rows and at least one column of first measurement grids, each first measurement grid having a horizontal range of a time slot and a vertical range of a voltage slot; and an eye diagram projection module for projecting the set of sampling points onto a projection sub-region in the projection area to obtain a target virtual eye diagram; wherein the projection sub-region is part or all of the continuous region in the projection area, the projection sub-region includes multiple rows and columns of second measurement grids, the number of rows of the second measurement grids in the projection sub-region is greater than or equal to the number of rows of the first measurement grids in the projection area, and the number of columns of the second measurement grids in the projection sub-region is greater than the number of columns of the first measurement grids in the projection area. In this scheme, the eye diagram processing device further divides the first measurement grid of the projection sub-region corresponding to the eye under test relative to the first measurement grids at other locations to obtain a second measurement grid with multiple rows and / or columns. Therefore, the grid granularity of the projection sub-region is higher than that of other locations. When the sampling point set of the eye under test is projected onto the projection sub-region, the projection sub-region has better resolution for the eye under test. This helps to improve the problem of low eye diagram resolution when processing large observation ranges in related technologies, and further improves the problem of difficulty in measuring relevant parameters of eye diagrams for large observation ranges in related technologies.

[0021] According to the fourth aspect disclosed in this application, this application provides an eye diagram drawing apparatus, comprising: an eye diagram acquisition module, configured to determine a target virtual eye diagram according to the eye diagram processing method of any one of the first aspects; an image conversion module, configured to determine a virtual eye diagram image corresponding to the target virtual eye diagram based on the target virtual eye diagram; and an image stitching module, configured to stitch together multiple virtual eye diagram images to obtain a target eye diagram image. In this solution, after converting the target virtual eye diagram into a virtual eye diagram image, the eye diagram drawing apparatus stitches together multiple virtual eye diagram images to form a complete target eye diagram image. This allows for the rapid drawing of the entire eye diagram using only a single target virtual eye diagram, eliminating the need to traverse all data points and improving the efficiency of eye diagram drawing.

[0022] According to the fifth aspect disclosed in this application, an electronic device is provided, including a processor and a memory communicatively connected to the processor; the memory stores computer-executable instructions; the processor executes the computer-executable instructions stored in the memory to implement the method of either the first or second aspect. In this solution, the electronic device further divides the first measurement grid corresponding to the projection sub-region of the eye under test relative to the first measurement grid at other locations to obtain a second measurement grid with multiple rows and / or columns, thus the grid granularity of the projection sub-region is higher than that of other locations. When the sampling point set of the eye under test is projected onto the projection sub-region, the projection sub-region has better resolution for the eye under test, which helps to improve the problem of low eye diagram resolution when processing large observation ranges in related technologies, and further improves the problem of difficulty in measuring relevant parameters of eye diagrams for large observation ranges in related technologies.

[0023] According to the sixth aspect disclosed in this application, this application provides a computer-readable storage medium storing computer-executable instructions. When executed, these instructions are used to implement the method of either the first or second aspect. In this solution, when the computer instructions are executed, the first measurement grid corresponding to the projection sub-region of the eye under test is further subdivided relative to the first measurement grid at other locations to obtain a second measurement grid with multiple rows and / or columns. Therefore, the grid granularity of the projection sub-region is higher than that at other locations. When the sampling point set of the eye under test is projected onto the projection sub-region, the projection sub-region has better resolution for the eye under test, which helps to improve the problem of low eye diagram resolution when processing large observation ranges in related technologies. This, in turn, improves the problem in related technologies where it is difficult to measure relevant parameters of eye diagrams for large observation ranges.

[0024] According to the seventh aspect disclosed in this application, this application provides a computer program product, including a computer program, which, when executed, is used to implement the method of either the first or second aspect. In this solution, when the computer program is executed, the first measurement grid corresponding to the projection sub-region of the eye under test is further subdivided relative to the first measurement grid at other locations to obtain a second measurement grid with multiple rows and / or columns. Therefore, the grid granularity of the projection sub-region is higher than that at other locations. When the sampling point set of the eye under test is projected onto the projection sub-region, the projection sub-region has better resolution for the eye under test, which helps to improve the problem of low eye diagram resolution when processing large observation ranges in related technologies. This, in turn, can improve the problem in related technologies where it is difficult to measure relevant parameters of the eye diagram for eye diagrams with large observation ranges. Attached Figure Description

[0025] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this application and, together with the description, serve to explain the principles of this application.

[0026] Figure 1 A schematic diagram of the architecture of an oscilloscope provided in an embodiment of this application;

[0027] Figure 2 An eye diagram provided for an embodiment of this application;

[0028] Figure 3 This is a schematic diagram of the projection of signal sampling points in the grid provided in the embodiments of this application;

[0029] Figure 4 A schematic flowchart of an eye diagram processing method provided in an embodiment of this application;

[0030] Figure 5 This is a schematic diagram of grid division when the projection sub-region is the entire continuous area of ​​the projection region, as provided in an embodiment of this application;

[0031] Figure 6 A flowchart illustrating a method for projecting a set of sampling points onto a projection sub-region in a projection area to obtain a target virtual eye diagram, provided in an embodiment of this application;

[0032] Figure 7 A schematic diagram illustrating the hit situation between signal sampling points and a reference measurement grid, a first reference grid, and a second reference grid, provided for embodiments of this application;

[0033] Figure 8 A schematic diagram showing the relationship between signal sampling points and the projection of measurement grids in a candidate projection area before and after grid division of the first measurement grid in a candidate projection sub-region, as provided in an embodiment of this application.

[0034] Figure 9 This is a flowchart illustrating a method for projecting a set of sampling points onto a candidate projection sub-region to obtain a candidate virtual eye diagram, as provided in an embodiment of this application.

[0035] Figure 10 This is a schematic diagram illustrating a candidate projection sub-region as a portion of a continuous region within a projection area, provided in an embodiment of this application.

[0036] Figure 11 A flowchart illustrating a method for determining the boundary of a candidate projection sub-region, provided in an embodiment of this application;

[0037] Figure 12 This application provides a schematic diagram of grid division when the projection sub-region is a partially continuous area of ​​the projection region;

[0038] Figure 13 This is a schematic diagram illustrating a candidate projection sub-region that is all continuous regions within the projection area, as provided in an embodiment of this application.

[0039] Figure 14A flowchart illustrating a method for updating a candidate projection sub-region by increasing the number of rows and / or columns of a second measurement grid in the candidate projection sub-region, as provided in an embodiment of this application.

[0040] Figure 15 This application provides a flowchart illustrating an eye diagram drawing method.

[0041] Figure 16 A schematic diagram of stitching a target eye diagram image provided in an embodiment of this application;

[0042] Figure 17 This is a schematic diagram of the structure of an eye diagram processing device provided in an embodiment of this application;

[0043] Figure 18 This is a schematic diagram of the structure of an eye diagram drawing device provided in an embodiment of this application;

[0044] Figure 19 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application.

[0045] The accompanying drawings have illustrated specific embodiments of this application, which will be described in more detail below. These drawings and descriptions are not intended to limit the scope of the concept in any way, but rather to illustrate the concept of this application to those skilled in the art through reference to specific embodiments. Detailed Implementation

[0046] Exemplary embodiments will now be described in detail, examples of which are illustrated in the accompanying drawings. When the following description relates to the drawings, unless otherwise indicated, the same numbers in different drawings denote the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with this application. Rather, they are merely examples of apparatuses and methods consistent with some aspects of this application as detailed in the appended claims.

[0047] An eye diagram is a core tool in high-speed digital communication used to evaluate signal integrity. Essentially, it uses measuring instruments like oscilloscopes to superimpose periodic serial signals into an eye-like graphic. In ideal conditions without intersymbol interference (ISI) and noise, the signal waveform is undistorted, and each symbol overlaps, forming a clear trace with an open eye diagram. When ISI or noise is present, the signal waveform is distorted, the eye diagram trace becomes blurred, and the degree of eye closure increases. Therefore, the size of the "eye" in the eye diagram reflects the strength of ISI; a larger "eye" and a more upright eye diagram indicate less ISI, and vice versa. By measuring relevant eye diagram parameters (such as eye height, eye width, jitter, crossover ratio, and extinction ratio), the degree of signal distortion can be directly reflected, and the quality of the system can be evaluated to help improve the system's transmission performance.

[0048] See Figure 1 Taking an oscilloscope as an example, the architecture of an oscilloscope mainly includes a hardware system, an operating system, and application software. The hardware system includes a CPU, memory / RAM, sampling hardware, etc., while the application software includes eye diagram detection software, template testing software, etc. The sampling hardware is used to acquire the sampled signal and send the acquired single-frame sampled dataset to the eye diagram detection software for processing to generate an eye diagram.

[0049] The essence of an eye diagram is to divide a series of signal sampling points of different codes in a periodic signal into units based on the observation range. The signal sampling points within each observation range are projected onto a two-dimensional grid on a measuring instrument such as an oscilloscope according to a certain rule. The result of accumulating signal sampling points from multiple observation ranges within this two-dimensional grid can be visualized on the measuring instrument's display panel as multiple eye-shaped patterns. It should be noted that the "two-dimensional grid" in this application does not refer to the visual grid on the oscilloscope's display panel, but rather to a two-dimensional array used to receive the sampled signal points, the meaning of which will be explained in detail below.

[0050] The two-dimensional grid comprises multiple measurement grids arranged horizontally and vertically. The observation range refers to the area formed by the horizontal time range and the vertical voltage range, which together define the projection boundary and measurement dimension of the eye diagram. It's important to note that the observation range refers to the area covered by all eyes under test projected onto the two-dimensional grid in both the time and voltage domains. Therefore, the horizontal width of each measurement grid is the quotient of the duration corresponding to the aforementioned time range and the number of columns of the multiple measurement grids, and the vertical height of each measurement grid is the quotient of the voltage difference corresponding to the aforementioned voltage range and the number of rows of the multiple measurement grids. Thus, the more grids in the two-dimensional grid, the stronger its resolution and the higher its resolution, resulting in a clearer eye diagram displayed on the display panel, and more accurate measurement and drawing of the eye diagram. For example, the resolution of the two-dimensional grid is... This indicates that the two-dimensional grid includes 1024 grids in the horizontal direction and 1280 grids in the vertical direction, which represents the resolution of the two-dimensional grid.

[0051] Because eye diagrams represent the number of times a sampling point hits the measurement grid by counting, when at least two sampling points are simultaneously projected onto the same measurement grid, it's impossible to distinguish their specific locations within the grid; only the exact number of sampling points hitting the grid can be determined. Furthermore, color can typically be used to visually and hierarchically display the number of times a 2D grid is hit, such as... Figure 2 As shown in the figure, the closer the color of the measurement grid is to red, the higher the number of times it is hit. Thus, the measurement grids that are not hit by the sampling points are black or white, and the measurement grids that are hit by the sampling points are colored. After all the sampling points within the observation range are projected onto the two-dimensional grid, the corresponding graphic, i.e., the eye diagram, can be obtained.

[0052] However, for current measuring instruments such as oscilloscopes, the resolution of their two-dimensional grids is fixed (e.g., Therefore, as the observation range increases, due to the resolution limitation of the two-dimensional grid, the number of signal sampling points may far exceed the number of measurement grids. (See also...) Figure 3 , Figure 3 (a) illustrates the case where there are 2 signal sampling points projected onto 2 measurement grids within the observation range. In this case, each measurement grid projects and displays one sampling point, and each measurement grid is hit by the sampling point once. Figure 3 (b) illustrates the situation where, when the observation range increases and the number of signal sampling points increases, but the number of measurement grids remains unchanged, 6 signal sampling points within the observation range are projected onto 2 measurement grids. In this case, the original two measurement grids can only project and display two sampling points, and each measurement grid will be hit by the sampling points three times. Figure 3Figure (c) illustrates the situation where, as the observation range increases, the number of signal sampling points and the number of measurement grids also increase, six signal sampling points are projected onto six measurement grids. In this case, the six measurement grids can completely project and display the six sampling points, with each measurement grid being hit once by a sampling point. It can be seen that, since the resolution of the two-dimensional grid of the current measuring instrument is fixed, if the horizontal time range of the observation range is too large, multiple sampling points with large time intervals will be projected onto the same measurement grid, making the eye diagram difficult to distinguish on the two-dimensional grid. Instead, it presents a continuous sequence of hit measurement grids (visualized in color). This causes the eye diagram to become blurred, the resolution of the eye diagram to decrease, and the eye diagram may not be able to be separated by at least one measurement grid in the horizontal and / or vertical directions, making it difficult or even impossible to measure the relevant parameters of the eye diagram subsequently.

[0053] To address this, existing measuring instruments typically ensure eye diagram resolution by limiting the maximum configurable parameter of the observation range. For example, the measuring instrument might set the maximum configurable parameter of the time range of its observation range to 20 UI (Unit Interval). By limiting the time range of the observation range to no more than 20 UI, the measuring instrument can obtain a clear eye diagram. However, while this approach avoids situations where the observation range is configured too large, it also causes existing measuring instruments to lose their eye diagram processing capabilities for large observation ranges, thus failing to meet the eye diagram processing requirements under large observation range conditions.

[0054] To address the aforementioned technical problems, this application proposes an eye diagram processing method, eye diagram drawing method, device, medium, and program product. By dividing the two-dimensional grid corresponding to the observation range into granular differentials, the resolution of the eye diagram is improved, thereby addressing the problem that related technologies struggle to measure relevant parameters of the eye diagram when dealing with a large observation range.

[0055] The technical solutions of the eye diagram processing method and eye diagram drawing method provided in this application will be described in detail below through specific embodiments. It should be noted that the following embodiments may exist alone or in combination with each other, and the same or similar content may not be described again in different embodiments.

[0056] It should be noted that the eye diagram processing method provided in this application embodiment is executed by an oscilloscope or other measuring instrument with eye diagram processing function, and correspondingly, the eye diagram processing device is also set in the oscilloscope or other measuring instrument with eye diagram processing function.

[0057] Example 1

[0058] Figure 4 A schematic flowchart of an eye diagram processing method provided in this application embodiment is shown below. Figure 4In some embodiments, the eye diagram processing method includes the following steps S410-S420.

[0059] S410, Obtain the sampling point set of the eye under test in the projection area; wherein, the sampling point set includes all sampling points corresponding to the eye under test, the projection area is used to project the sampling point set of the eye under test, the projection area includes a continuous region composed of multiple rows and at least one column of first measurement grids, the horizontal range of each first measurement grid is a time slot, and the vertical range of each first measurement grid is a voltage slot.

[0060] Among them, the eye-catching display required by devices such as oscilloscopes Figure 1 Typically, an eye diagram includes multiple observation eyes, with the eye under test being one of these observation eyes. During eye diagram processing, one of the observation eyes can be selected as the eye under test, and its sampling point set can be obtained as the data basis for subsequent eye diagram projection. Obtaining the sampling point set of the eye under test can involve obtaining a single sampling point set or multiple sampling point sets, depending on the specific requirements.

[0061] Specifically, eye diagrams are a measurement method for periodic signals. According to the basic principles of eye diagrams, each observation eye within a given observation range is equivalent. This is reflected in eye diagram-dependent measurement instruments such as oscilloscopes, meaning that eye diagram processing only needs to process the specific eye selected by the user, without needing to process every single observation eye within the observation range. Therefore, for eye diagram processing, only the sampling point set of the eye under test needs to be acquired for subsequent processing, thus improving processing efficiency.

[0062] The projection area is the projected coverage of the sampling point set, which includes a continuous area consisting of multiple rows and at least one column of a first measurement grid. The first measurement grid is the original resolution unit of the device, which includes a time slot representing its horizontal range and a voltage slot representing its vertical range.

[0063] Specifically, taking a two-dimensional grid consisting of h×v first measurement grids as an example, the time slot is used to define the time interval for the first measurement grid of all columns (h) to divide the time range at equal intervals, and its dimension is seconds; the voltage slot is used to define the voltage interval for the first measurement grid of all rows (v) to divide the voltage range at equal intervals, and its dimension is V (volts).

[0064] S420, the sampling point set is projected onto a projection sub-region in the projection area to obtain the target virtual eye diagram; wherein, the projection sub-region is part or all of the continuous region in the projection area, the projection sub-region includes a second measurement grid with multiple rows and columns, the number of rows of the second measurement grid in the projection sub-region is greater than or equal to the number of rows of the first measurement grid in the projection area, and the number of columns of the second measurement grid in the projection sub-region is greater than the number of columns of the first measurement grid in the projection area.

[0065] In this process, all sampling points from the sampling point set are projected onto a projection sub-region within the projection area. The projection sub-region is a partial or complete continuous area within the projection area. Projecting the sampling point set onto this sub-region yields the target virtual eye diagram. Simultaneously, since the number of rows in the second measurement grid within the projection sub-region is greater than or equal to the number of rows in the first measurement grid within the projection area, and the number of columns in the second measurement grid within the projection sub-region is greater than the number of columns in the first measurement grid within the projection area, the resolution of the eye under test is improved by increasing the number of measurement grids, resulting in a higher-resolution eye diagram.

[0066] Specifically, under the condition of a fixed observation range, the horizontal resolution of the eye diagram is determined by the number of horizontal measurement grids (h) of the two-dimensional grid composed of h×v measurement grids. The more horizontal measurement grids (h) there are, the higher the horizontal resolution of the eye diagram. The vertical resolution of the eye diagram is determined by the number of vertical measurement grids (v). The more vertical measurement grids (v) there are, the higher the vertical resolution of the eye diagram, and the clearer the eye diagram is.

[0067] Therefore, by further dividing the projection sub-region corresponding to the eye under test into a multi-row, multi-column second measurement grid, the granularity of the projection sub-region is higher than that of the undivided region. When the sampling point set of the eye under test is projected onto the projection sub-region, the projection sub-region has better resolution for the eye under test, which helps to improve the problem of low eye diagram resolution when processing large observation ranges in related technologies.

[0068] In this embodiment, a second measurement grid with multiple rows and columns is obtained by further dividing the projection sub-region corresponding to the eye under test into a multi-row, multi-column grid. This increases the number of grids in the projection sub-region. As the number of grids in the projection sub-region increases, the resolution of the projection sub-region is improved, resulting in a clearer target virtual eye diagram. This alleviates the resolution bottleneck of traditional measuring instruments using a fixed number of first measurement grids and improves the resolution of the eye diagram over a large observation range. (See also...) Figure 5 Taking the entire continuous region of the projection area as an example, the first measurement grid corresponding to the projection sub-region is divided into... A new grid region for the second measurement grid is added to improve the resolution of the measurement projection sub-region.

[0069] In some embodiments, the eye diagram processing method further includes: determining eye diagram feature parameters based on the target virtual eye diagram; wherein the eye diagram feature parameters include at least one of eye width, eye height, eye diagram opening, overall jitter, random jitter, deterministic jitter, time margin, amplitude noise, voltage margin, signal-to-noise ratio, rise time, and fall time; and attaching a preset label to the feature parameters; wherein the preset label is used to characterize that the cell used when acquiring the feature parameters is different from the measurement grid.

[0070] In this embodiment, by acquiring the target virtual eye diagram, relevant characteristic parameters of the eye diagram can be measured to achieve eye diagram measurement. Eye diagram measurement can quantify the signal's amplitude margin, timing stability, and anti-interference capability, thereby accurately locating the root causes of signal degradation such as noise, inter-symbol interference (ISI), crosstalk, or clock skew. This provides key signal quality indicators for high-speed communication systems (such as 5G, fiber optic transmission, high-speed serial interfaces, etc.), guiding the system to optimize equalization design, adjust impedance matching, or suppress jitter, enabling the system to achieve reliable and stable signal transmission.

[0071] Based on the characteristic parameter results calculated from the target virtual eye diagram, in measurement scenarios involving oscilloscopes, the characteristic parameter results can be marked to clearly inform the user that the current characteristic parameter results are not based on the original two-dimensional grid, thus prompting the user that the two-dimensional grid used by the measuring instrument to draw the eye diagram has changed. The preset mark can be a specific character, pattern, a combination of character and pattern, or other visual mark.

[0072] Example 2

[0073] Figure 6 A flowchart illustrating step S420 is provided for an embodiment of this application. (See attached diagram.) Figure 6 In some embodiments, step S420 may include the following steps S610 to S640.

[0074] S610, the sampling point set is projected onto the candidate projection sub-region to obtain the candidate virtual eye diagram; wherein, the candidate projection sub-region is part or all of the continuous region in the projection area, and the candidate projection sub-region includes a second measurement grid with multiple rows and columns.

[0075] The candidate projection sub-region is a portion or continuous area determined within the projection area during the current projection. The candidate projection sub-region represents the shape before its determination and also includes a multi-column, multi-row second measurement grid. Assuming the oscilloscope needs to display 1000 observation eyes, the number of the first measurement grid is... For example, the 1000 observation eyes cover the range of 1024 first measurement grids in the horizontal direction. The eye to be measured is one of the 1000 observation eyes, which covers approximately one column of the first measurement grid in the horizontal direction. Then, according to the distribution of the eye to be measured in the two-dimensional grid, the projection area can be one or two columns of the first measurement grid at the corresponding position, while the candidate projection sub-area is a part or continuous area determined in this projection area, specifically the area of ​​the above area further divided into multiple rows and columns of second measurement grids.

[0076] After obtaining the sampling point set of the eye to be tested, the sampling point set can be projected onto the determined candidate projection sub-region, and a candidate virtual eye map can be obtained in the above candidate projection sub-region.

[0077] S620 determines whether the candidate virtual eye map is distinguishable.

[0078] In this process, after projecting the set of sampling points of the eye to be tested onto the candidate projection sub-region to generate a candidate virtual eye map, the discernibility of the candidate virtual eye map is further judged to determine whether the candidate virtual eye map can be used as the target virtual eye map for measuring the above-mentioned eye map feature parameters.

[0079] Optionally, step S620 may include steps S621 to S622.

[0080] Step S621: If the interior of the candidate virtual eye diagram is not separated by at least one second measurement grid in the horizontal direction, or if the interior of the candidate virtual eye diagram is not separated by at least one second measurement grid in the vertical direction, then the candidate virtual eye diagram is determined to be indistinguishable.

[0081] In this process, the candidate projection sub-region used for projecting the eye under test includes multiple rows and columns of second measurement grids, and the eye width, eye height, and other parameters of the eye diagram are determined by counting in units of grids. If the candidate virtual eye diagram is horizontally spaced by a maximum of 5 second measurement grids, the eye width can be obtained by multiplying the duration of the time slot corresponding to each second measurement grid by 5. The calculation principles for other parameters are roughly the same and will not be elaborated here.

[0082] Therefore, if the candidate virtual eye map is not separated by at least one second measurement grid in the horizontal direction, or is not separated by at least one second measurement grid in the vertical direction, it indicates that the candidate virtual eye map is blurred together in the horizontal or vertical direction, the "eye" of the candidate virtual eye map is not open, the candidate virtual eye map is indistinguishable, and it is difficult to measure the above-mentioned feature parameters based on the virtual eye map; in this case, it is determined that the virtual eye map is indistinguishable.

[0083] Step S622: If the interior of the candidate virtual eye diagram is spaced apart by at least one second measurement grid in the horizontal direction, and the interior of the candidate virtual eye diagram is spaced apart by at least one second measurement grid in the vertical direction, then the candidate virtual eye diagram is determined to be resolvable.

[0084] Specifically, if the interior of the candidate virtual eye diagram is spaced apart by at least one second measurement grid in the horizontal direction and the interior of the candidate virtual eye diagram is spaced apart by at least one second measurement grid in the vertical direction, it indicates that the candidate virtual eye diagram is clear in both the horizontal and vertical directions, the "eye" of the candidate virtual eye diagram is open, and the resolution of the candidate virtual eye diagram meets the requirements.

[0085] Optionally, step S620 may also include steps S623 to S625.

[0086] Step S623: Obtain the reference measurement grid; wherein, the reference measurement grid is a second measurement grid within the candidate projection sub-region.

[0087] The reference measurement grid can be any second measurement grid within the candidate projection sub-region. Preferably, the reference measurement grid can be a second measurement grid near the center of the candidate projection sub-region. Generally, the center of the observation eye is farther from its extreme positions (up, down, left, right), and this position is where the "eye" first opens. Using the second measurement grid near the center of the candidate projection sub-region as the reference measurement grid helps to determine the resolvable result more quickly when the eye diagram is resolvable.

[0088] Step S624: If at least one sampling point hits both first reference grids, and / or at least one sampling point hits both second reference grids, then the candidate virtual eye diagram is determined to be indistinguishable; wherein, the first reference grid is a second measurement grid adjacent to the reference measurement grid in the horizontal direction, and the two first reference grids are located on both sides of the reference measurement grid, and the second reference grid is a second measurement grid adjacent to the reference measurement grid in the vertical direction, and the two second reference grids are located on both sides of the reference measurement grid.

[0089] If at least one sampling point hits both first reference grids, and / or at least one sampling point hits both second reference grids, it indicates that there are sampling points around the reference measurement grid. In this case, there is a risk that the eye diagram is not open, and the candidate virtual eye diagram can be temporarily determined to be indistinguishable.

[0090] Specifically, Figure 7 Figure (a) illustrates a scenario where both the first reference grid, which is horizontally adjacent to the baseline measurement grid, and the second reference grid, which is vertically adjacent to the baseline measurement grid, are hit by a single sampling point. In this case, the baseline measurement grid and its surrounding reference grids are all projected with sampling points, and there is a risk that the eye diagram may not be fully open. Therefore, the candidate virtual eye diagram can be temporarily determined to be indistinguishable.

[0091] Step S625: If neither of the two first reference grids is hit by any sampling point and neither of the two second reference grids is hit by any sampling point, then the candidate virtual eye diagram is determined to be resolvable.

[0092] If neither of the two first reference grids is hit by any sampling point, and neither of the two second reference grids is hit by any sampling point, it indicates that no sampling points are projected around the reference measurement grid, that is, the area near the reference measurement grid is a blank area, and the candidate virtual eye diagram can be determined to be resolvable.

[0093] Specifically, Figure 7Figure (b) illustrates a scenario where neither the first reference grid, which is horizontally adjacent to the reference measurement grid, nor the second reference grid, which is vertically adjacent to the reference measurement grid, is hit by any sampling point. In this case, neither the reference measurement grid nor its surrounding reference grids have any sampling points projected, and the candidate virtual eye diagram can be determined to be resolvable.

[0094] S630, if the candidate virtual eye diagram is indistinguishable, increase the number of rows and / or columns of the second measurement grid in the candidate projection sub-region to update the candidate projection sub-region, and project the sampling point set onto the updated candidate projection sub-region to obtain the updated candidate virtual eye diagram, and return to the step of determining whether the candidate virtual eye diagram is distinguishable.

[0095] When a candidate virtual eye diagram is determined to be indistinguishable, the number of rows and / or columns of the second measurement grid in the candidate projection sub-region is increased to update the candidate projection sub-region. Then, the sampling point set is projected onto the updated candidate projection sub-region to update the candidate virtual eye diagram. Finally, the process jumps back to step S620 to determine again whether the updated candidate virtual eye diagram is distinguishable. The candidate projection sub-region is then repeatedly divided into grids until the candidate virtual eye diagram is distinguishable.

[0096] S640, if the candidate virtual eye map is distinguishable, then the candidate projection sub-region is determined to be the projection sub-region, and the candidate virtual eye map is determined to be the target virtual eye map.

[0097] If the candidate virtual eye diagram is resolvable, it means that the candidate virtual eye diagram meets the resolution requirements of the eye diagram and is used as the target virtual eye diagram. If the candidate projection sub-region also meets the projection requirements of the eye diagram, it is determined as the projection sub-region and the above steps for determining feature parameters can be performed to determine the quality of the signal.

[0098] In this embodiment, by iteratively judging whether the candidate virtual eye diagram is resolvable, the dynamic division of the second measurement grid in the candidate projection sub-region is realized until the candidate virtual eye diagram of the candidate projection sub-region meets the eye diagram resolvability requirement, thereby obtaining a clear target virtual eye diagram.

[0099] Specifically, see Figure 8 To illustrate the complete eye diagram and signal waveform, Figure 8 The diagram illustrates the sampling point set of the waveforms corresponding to the two eyes under test. Figure 8 Figure (a) shows the candidate virtual eye diagram corresponding to step S610. The sampling point sets of the two eyes to be tested are distributed in four first measurement grids. All four measurement grids are hit measurement grids, and the feature parameters of the above eye diagram cannot be calculated based on the current situation. Figure 8Figure (b) illustrates the target virtual eye diagram corresponding to step S640. The sampling point sets of the two eyes to be tested are distributed across 80 cells. The internal region of the waveform corresponding to each eye to be tested has several untargeted cells. The feature parameters of the eye diagram can be calculated based on the current situation. It can be seen that high-resolution calculations are performed only on the projection areas of the two eyes to be tested selected by the user. Figure 8 The signal sampling points in (a) located in the projection sub-region are reprojected to Figure 8 The projection sub-region with more cells in (b) improves the local resolution of the eye diagram under observation. Thus, even with a large observation range, the eye diagram can still be measured, i.e., the aforementioned feature parameters can be obtained.

[0100] Example 3

[0101] Figure 9 A flowchart illustrating step S610 provided in an embodiment of this application is shown below. Figure 9 In some embodiments, before step S610, the method provided in this application may further include the following steps S910 to S940.

[0102] S910, based on the observation range of the eye diagram to be observed and the two-dimensional grid, determine the first time base scale and the first voltage scale of the first measurement grid; wherein, the observation range is the time range and voltage range covered by the eye diagram to be observed, the eye diagram to be observed includes multiple observation eyes, the eye to be measured is one of the multiple observation eyes, the two-dimensional grid includes a multi-row and multi-column first measurement grid, the projection area is a part of the two-dimensional grid, the first time base scale is the width of the time slot of the first measurement grid, and the first voltage scale is the height of the voltage slot of the first measurement grid.

[0103] The eye diagram to be observed is the eye diagram that is expected to be drawn and displayed on the screen of a measuring instrument such as a monitor. It includes multiple identical observation eyes. Therefore, one of the observation eyes can be selected as the eye to be tested for eye diagram processing, without having to process every observation eye in the eye diagram to be observed, thus improving the efficiency of eye diagram processing.

[0104] The observation range refers to the time and voltage range covered by the eye diagram to be observed; it is a specific physical range. For example, if 1000 observation eyes need to be observed, and the horizontal range of each observation eye is one unit interval (UI), then the time range of the observation range is 1000UI, and the voltage range is 0V~1V. Alternatively, the voltage range can be normalized to 0~1. The observation range can be pre-configured or set according to user needs. For example, users can input the required observation range, such as the specific number of UIs, using peripherals such as a keyboard, mouse, or touchscreen.

[0105] Based on the observation range and resolution (as mentioned above) Then, the first time base scale of the first measurement grid can be determined based on the time range and the number of first measurement grids in the horizontal direction. For example, the width of a single first measurement grid time slot, i.e., the aforementioned first time base scale, can be determined based on the quotient of the time range and the number of first measurement grids in the horizontal direction. Similarly, the first voltage scale of the first measurement grid can be determined based on the voltage range and the number of first measurement grids in the vertical direction.

[0106] Correspondingly, based on the definition of resolution, given a fixed observation range, the smaller the time base scale or voltage scale of the measurement grid, the more measurement grids there are within the observation range, and the higher the resolution of the projection area composed of the measurement grids.

[0107] Specifically, the time base scale and the voltage scale satisfy the following formulas (1) to (2):

[0108]

[0109]

[0110] in, The time base scale is represented by t, the time range is represented by h, and the number of measurement grids in the horizontal direction is represented by h. This indicates the voltage scale, 'a' indicates the voltage range, and 'v' indicates the number of measurement grids in the vertical direction.

[0111] S920, based on the first time base scale and the time base threshold, determine the first standard number of the first measurement grid divided along the horizontal direction.

[0112] The time base threshold is a pre-configured grid duration parameter, representing the initial judgment condition for the virtual eye diagram to be distinguishable in the horizontal direction. By configuring a reasonable time base threshold, it can be ensured that: when the first time base scale is less than or equal to the time base threshold, the virtual eye diagram corresponding to the eye under test is distinguishable in the horizontal direction; when the first time base scale is greater than the time base threshold, the virtual eye diagram corresponding to the eye under test is indistinguishable in the horizontal direction. Based on the time base threshold and the first time base scale, the first standard number of the first measurement grid divided along the horizontal direction can be determined.

[0113] Specifically, step S920 may include: if the first time base scale is less than or equal to the duration threshold time base threshold, determining the first standard quantity as one; and if the first time base scale is greater than the duration threshold time base threshold, determining the first standard quantity based on the quotient of the first time base scale and the duration threshold time base threshold.

[0114] Specifically, when the first time base scale is greater than the time base threshold, it indicates that too many sampling points are projected onto the same column of the first measurement grid, i.e., the same time slot, which will cause the candidate virtual eye diagram to be blurred in the horizontal direction. In this case, the first measurement grid involved in the candidate projection sub-region can be divided along the horizontal direction to obtain multiple columns of second measurement grids. This operation is equivalent to reducing the size of the first measurement grid to increase the number of grids, thereby improving the resolution of the candidate virtual eye diagram in the projection area.

[0115] When the time base scale is less than or equal to the time base threshold, it indicates that a small number of sampling points are projected onto the same column of measurement grids, i.e., the same time slot. In this case, the candidate virtual eye diagram may be clear in the horizontal direction. At this time, the first measurement grid involved in the candidate projection sub-region can be kept unchanged in the horizontal direction without being further divided, i.e., the number of the first standard is determined to be one.

[0116] Specifically, the selection of the time base threshold can be based on experience or determined based on a preset multiple of a UI. For example, the time base threshold can be half the duration of a UI.

[0117] Since the first standard quantity is an integer, when determining the first standard quantity based on the quotient of the first time base scale and the time base threshold, the result of dividing the first time base scale and the time base threshold can be rounded up, rounded down, or rounded to the nearest integer.

[0118] For example, the first standard quantity can be determined by dividing the first time base scale by the time base threshold, which can be obtained based on the following formula (3):

[0119]

[0120] in, This indicates the first standard number of measurements that need to be divided horizontally. This represents the floor function, where k represents the magnification factor, and k ≥ 1. Indicates the first time base scale. This represents the time base threshold. In this example, when determining... During the process, the expression on the right side of the equation was rounded up. This not only yields an integer but also makes the result more accurate. Using a larger integer makes it easier to obtain a second measurement grid with more columns during this division, thereby improving the resolution of the projection area and reducing the number of times the above step S403 is performed, thus shortening the cycle of obtaining the target virtual eye diagram.

[0121] In addition, the above formula (3) is configured with a magnification factor k, which can further increase the number of second measurement grids in the horizontal direction of the candidate projection sub-region, so as to improve the resolution of the projection area in the horizontal direction.

[0122] S930, based on the first voltage scale and the voltage threshold, determine the second standard number of the first measurement grid divided along the vertical direction.

[0123] The voltage threshold is a pre-configured grid voltage amplitude parameter, representing the initial judgment condition under which the virtual eye diagram can be resolved in the vertical direction. Based on the voltage threshold and the first voltage scale, the second standard number of the first measurement grid divided in the vertical direction can be determined.

[0124] Specifically, step S930 may include: if the first voltage scale is less than or equal to the voltage threshold, determining the second standard quantity as one; and if the first voltage scale is greater than the voltage threshold, determining the second standard quantity based on the quotient of the first voltage scale and the voltage threshold.

[0125] When the voltage scale exceeds the voltage threshold, it indicates that too many sampling points are projected onto the same row of the first measurement grid, i.e., the same voltage slot, which will cause the candidate virtual eye diagram to be blurred in the vertical direction. In this case, the first measurement grid involved in the candidate projection sub-region can be divided along the vertical direction to obtain multiple rows of second measurement grids. This operation is equivalent to reducing the size of the first measurement grid to increase the number of grids, thereby improving the resolution of the candidate virtual eye diagram by the candidate projection sub-region.

[0126] When the first voltage scale is less than or equal to the voltage threshold, it indicates that a small number of sampling points are projected onto the same row of the first measurement grid, i.e., the same voltage slot. At this time, the candidate virtual eye diagram may be clear in the vertical direction. In this case, the measurement grid of the projection area can be kept unchanged in the vertical direction without further division, i.e., the number of second standards is determined to be one.

[0127] Specifically, the voltage threshold can be selected based on experience or determined based on a preset multiple of a basic voltage unit.

[0128] Since the second standard quantity is an integer, when determining the second standard quantity based on the quotient of the first voltage scale and the voltage threshold, the result of dividing the first voltage scale and the voltage threshold can be rounded up, rounded down, or rounded to the nearest integer.

[0129] For example, the second standard quantity can be determined by dividing the first voltage scale by the voltage threshold, based on the following equation (4):

[0130]

[0131] in, This indicates the number of second standard divisions required in the vertical direction of the first measurement grid. This represents the floor function, where k represents the magnification factor, and k ≥ 1. Indicates the first voltage scale. This represents the voltage threshold. In this example, when determining... During the process, the expression on the right side of the equation was rounded up. This not only yields an integer but also makes the result more accurate. Using a larger integer makes it easier to obtain a second measurement grid with more rows during this partitioning, thereby improving the resolution of candidate projection sub-regions and reducing the number of times the above step S403 is executed, thus shortening the cycle of obtaining the target virtual eye map.

[0132] In addition, the above equation (4) is configured with a magnification factor k, which can further increase the number of divisions of the second measurement grid in the vertical direction in the candidate projection sub-region, so as to improve the resolution of the candidate projection sub-region in the vertical direction.

[0133] S940, based on the first standard quantity and the second standard quantity, divide the candidate projection sub-region into one or more columns and one or more rows of second measurement grids within the boundary of the candidate projection sub-region to obtain the candidate projection sub-region.

[0134] After determining the first standard quantity and the second standard quantity, the boundary of the candidate projection sub-region is divided into one or more columns, one or more rows of second measurement grid according to the first standard quantity and the second standard quantity, thereby obtaining the candidate projection sub-region.

[0135] Specifically, step S940 may include steps S941 to S943:

[0136] S941, determine the second time base scale of the second measurement grid based on the quotient of the first time base scale and the first standard quantity.

[0137] The first standard number represents the number of second measurement grids that can be divided into in the horizontal direction of the first measurement grid. Therefore, by dividing the first time base scale of the first measurement grid by the first standard number, the second time base scale corresponding to the second measurement grid can be obtained.

[0138] S942, determine the second voltage scale of the second measurement grid based on the quotient of the first voltage scale and the second standard quantity.

[0139] The second standard number represents the number of second measurement grids that the first measurement grid can be divided into in the vertical direction. Therefore, by dividing the first voltage scale of the first measurement grid by the second standard number, the second voltage scale corresponding to the second measurement grid can be obtained.

[0140] S943, based on the second time base scale and the second voltage scale, divide the candidate projection sub-region into one or more columns, one or more rows of the second measurement grid.

[0141] Accordingly, by dividing the time domain interval of the candidate projection sub-region by the second time base scale, the number of second measurement grids in the horizontal direction in the candidate projection sub-region can be obtained, thereby dividing the candidate projection sub-region into multiple columns of second measurement grids according to the second time base scale.

[0142] Dividing the voltage range of the candidate projection sub-region by the second voltage scale yields the number of second measurement grids in the vertical direction within the candidate projection sub-region. Thus, based on the second voltage scale, the candidate projection sub-region is divided into multiple rows of second measurement grids.

[0143] Specifically, Figure 10 This is a schematic diagram showing that the candidate projection sub-region is a partially continuous area within the projection area. The starting and ending positions of the eye under test are the first starting position and the first ending position, respectively. The starting and ending positions of the boundary of the candidate projection sub-region along the horizontal direction are the second starting position and the second ending position, respectively. The second starting position is earlier than the first starting position but not earlier than the starting position of the first measurement grid where the first starting position is located, and the second ending position is later than the first ending position but not later than the ending position of the first measurement grid where the first ending position is located.

[0144] Specifically, the starting position refers to the starting time in the time domain. Taking the eye under test as an example, its starting position is the position of the sampling time of the earliest sampling point in the time domain within the time interval when it is converted into the observation range; the starting position of the first measurement grid is the time corresponding to the beginning of its grid.

[0145] Specifically, the termination position refers to the termination time in the time domain. Taking the eye under test as an example, its termination position is the position of the sampling time of the latest sampling point in the time domain within the time interval when it is converted into the observation range; the termination position of the first measurement grid is the time corresponding to the termination of its grid.

[0146] In this case, the candidate projection sub-region is a part of the continuous area in the projection area. Therefore, when performing grid division, it is only necessary to further divide the candidate projection sub-region into grids, rather than further dividing the entire projection area into cells. This can reduce the amount of data processing for grid division and improve the processing efficiency of eye diagrams.

[0147] Optionally, the second starting position and the second ending position are determined based on the following method: The second starting position is determined according to the first starting position and the second time base scale; wherein the second time base scale is the time base scale when the first measurement grid is divided into a first standard number, the interval between the starting position of the first measurement grid where the first starting position is located and the second starting position is an integer multiple of the second time base scale, and the interval between the first starting position and the second starting position is less than the second time base scale; The second ending position is determined according to the first ending position and the second time base scale; wherein the interval between the ending position of the first measurement grid where the first ending position is located and the second ending position is an integer multiple of the second time base scale, and the interval between the first ending position and the second ending position is less than the second time base scale.

[0148] Specifically, Figure 11 A flowchart illustrating a method for determining the boundary of a candidate projection sub-region, as provided in this application embodiment, is shown below. Figure 11 In some embodiments, when the candidate projection sub-region is a part of a continuous region in the projection area, determining the boundary of the candidate projection sub-region may include the following steps S1110~S1130.

[0149] S1110, determine one or more first scale positions in the horizontal direction of the first measurement grid where the starting position of the eye to be tested is located according to the first standard quantity, and take the first scale position that is earlier than the starting position of the eye to be tested and adjacent to the starting position of the eye to be tested as the starting boundary of the candidate projection sub-region.

[0150] In this process, the first measurement grid in which the starting position of the eye to be tested is located is determined. Since the first standard number is used to represent the number of columns into which the first measurement grid is divided horizontally, the actual scale position for marking the grid division position in the first measurement grid in which the starting position of the eye to be tested is located can be determined according to the first standard number. Then, the first scale position that is earlier than the starting position of the eye to be tested and adjacent to the starting position of the eye to be tested is selected as the starting boundary of the candidate projection sub-region.

[0151] S1120, determine one or more second scale positions in the horizontal direction of the first measurement grid where the termination position of the eye to be tested is located according to the first standard quantity, and take the second scale position that is later than the termination position of the eye to be tested and adjacent to the termination position of the eye to be tested as the termination boundary of the candidate projection sub-region.

[0152] In this process, the first measurement grid where the termination position of the eye under test is located is determined. Since the first standard number is used to represent the number of columns into which the first measurement grid is divided horizontally, the actual scale position for marking the grid division position in the first measurement grid where the termination position of the eye under test is located can be determined according to the first standard number. Then, a second scale position that is later than and adjacent to the termination position of the eye under test is selected as the termination boundary of the candidate projection sub-region.

[0153] S1130, determine the candidate projection sub-region based on the time domain interval between the starting boundary and the ending boundary.

[0154] Among them, the time domain interval between the starting boundary and the ending boundary is used as the candidate projection sub-region.

[0155] Specifically, since the first measurement grid containing the starting position of the eye under test can be divided into one or more columns horizontally according to a first standard quantity, a first scale position for marking the division position can be determined within the first measurement grid containing the starting position of the eye under test, and the time domain interval between two adjacent first scale positions is the second time base scale. Therefore, the interval between the second starting position, with one of the first scale positions as the boundary, and the starting position of the first measurement grid containing the first starting position is an integer multiple of the second time base scale, and the interval between the first starting position and the second starting position is less than the second time base scale.

[0156] Specifically, the interval d1 between the starting position of the first measurement grid where the first starting position is located and the second starting position is an integer multiple of the second time base scale, and the interval d2 between the first starting position and the second starting position is less than the second time base scale.

[0157] Accordingly, since the first measurement grid where the termination position of the eye under test is located can be divided into one or more columns horizontally according to the first standard quantity, a second scale position applied to the marked division position can be determined in the first measurement grid where the termination position of the eye under test is located, and the time domain interval between two adjacent second scale positions is the second time base scale. Therefore, the interval between the second termination position with one of the second scale positions as the boundary and the termination position of the first measurement grid where the first termination position is located is an integer multiple of the second time base scale, and the interval between the first termination position and the second termination position is less than the second time base scale.

[0158] Specifically, the interval d3 between the first termination position and the second termination position of the first measurement grid where the first termination position is located is an integer multiple of the second time base scale, and the interval d4 between the first termination position and the second termination position is less than the second time base scale.

[0159] Specifically, see Figure 12When the candidate projection sub-region is a part of a continuous region in the projection region, the candidate projection sub-region can be meshed during the meshing process, without needing to mesh other regions in the projection region. This can improve the resolution of the candidate projection sub-region for the eye under test while reducing the specific number of meshes, thereby reducing the computational power requirement during the update and partitioning of the candidate projection sub-region.

[0160] Specifically, Figure 13 This is a schematic diagram showing that the candidate projection sub-regions are all continuous regions within the projection area.

[0161] The starting position of the candidate projection sub-region is the starting position of the first measurement grid where the starting position of the eye under test is located, and the ending position of the candidate projection sub-region is the ending position of the first measurement grid where the ending position of the eye under test is located.

[0162] Specifically, determining the candidate projection sub-region may include: determining the candidate projection sub-region based on the time domain interval between the starting position of the first measurement grid where the starting position of the eye under test is located and the ending position of the first measurement grid where the ending position of the eye under test is located.

[0163] Since the candidate projection sub-region is the entire continuous region in the projection area, the candidate projection sub-region is determined by the time domain interval between the starting position of the first measurement grid where the starting position of the eye under test is located and the ending position of the first measurement grid where the ending position of the eye under test is located.

[0164] Accordingly, determining the projection area may include: determining the projection area based on the time domain interval between the starting position of the first measurement grid where the starting position of the eye under test is located and the ending position of the first measurement grid where the starting position of the eye under test is located.

[0165] Specifically, the projection area is determined based on the time-domain interval between the starting position of the first measurement grid where the starting position of the eye under test is located and the ending position of the first measurement grid where the starting position of the eye under test is located.

[0166] After determining the observation range of the eye diagram to be observed and the time base scale and voltage scale of the two-dimensional grid, the measurement grid corresponding to each observation eye can be determined based on the above information. In this embodiment, the eye to be observed needs to be processed so that the above characteristic parameters can be determined based on the eye to be observed; therefore, multiple measurement grids corresponding to the eye to be observed in the two-dimensional grid can be determined, and the area formed by these multiple measurement grids is the projection area.

[0167] Example 4

[0168] Figure 14 A flowchart illustrating step S630 provided in an embodiment of this application is shown below. Figure 10 In some embodiments, step S630 may include the following steps S1410 to S1450.

[0169] S1410, Update the time base threshold based on the time base threshold and the first shrinkage factor.

[0170] The first reduction factor is a factor less than one. By reducing the time base threshold with the first reduction factor, the time base threshold is updated. Then, the first standard number of the first measurement grid in the horizontal direction can be recalculated based on the updated time base threshold. The first standard number is more than before the update, so as to further improve the resolution of the virtual eye diagram by the candidate projection sub-region.

[0171] S1420, Update the first standard quantity based on the first time base scale and the updated time base threshold.

[0172] Since the time base threshold is smaller after being updated by the first reduction factor, the quotient between the first time base scale and the time base threshold is larger, and the more second measurement grids can be divided in the horizontal direction of the candidate projection sub-region, the stronger the resolution of the candidate projection sub-region in the horizontal direction.

[0173] Specifically, if the first time base scale is less than or equal to the updated time base threshold, the number of updated first standards is determined to be one; and if the first time base scale is greater than the updated time base threshold, the number of updated first standards is determined based on the quotient of the first time base scale and the updated time base threshold.

[0174] Specifically, for example, if the first reduction factor is 0.5, then let If the updated time base threshold is half of the previous one, then the number of columns divided into the first measurement grid this time will be approximately twice that of the previous one.

[0175] Specifically, the first standard number of the first measurement grid divided along the horizontal direction can be updated by using the first time base scale and the updated time base threshold. The candidate projection sub-region is then re-divided by the updated first standard number, so that the candidate projection sub-region is divided into more and smaller second measurement grids in the horizontal direction, thereby further improving the resolution of the candidate projection sub-region in the horizontal direction.

[0176] S1430, update the voltage threshold based on the voltage scale threshold and the second reduction factor.

[0177] The second reduction factor is a factor less than one. By reducing the voltage threshold using the second reduction factor, the voltage threshold can be updated. Based on the updated voltage threshold, the number of second standards in the vertical direction of the first measurement grid can be recalculated. The number of second standards is greater than before, which further improves the ability of the candidate projection sub-region to resolve the virtual eye diagram.

[0178] S1440, update the second standard quantity based on the first voltage scale and the updated voltage threshold.

[0179] Since the voltage threshold is smaller after being updated by the second reduction factor, the quotient between the first voltage scale and the voltage threshold is larger. Therefore, each first measurement grid in the candidate projection sub-region can be divided into more second measurement grids along the vertical direction, and the resolution of the candidate projection sub-region in the vertical direction is stronger.

[0180] Specifically, if the first voltage scale is less than or equal to the updated voltage threshold, the number of updated second standards is determined to be one; and if the first voltage scale is greater than the updated voltage threshold, the number of updated second standards is determined based on the quotient of the first voltage scale and the updated voltage threshold.

[0181] Specifically, for example, if the second reduction factor is 0.5, then let If the updated voltage threshold is half of the previous one, then the number of rows in the first measurement grid of the candidate projection sub-region will be approximately twice that of the previous one.

[0182] Specifically, the second standard number of each first measurement grid in the candidate projection sub-region can be updated along the vertical direction by using the first voltage scale and the updated voltage threshold. This allows the first measurement grid in the candidate projection sub-region to be re-divided by the updated second standard number, thereby dividing each first measurement grid in the candidate projection sub-region into more and smaller second measurement grids in the vertical direction, further improving the vertical resolution of the candidate projection sub-region.

[0183] S1450, based on the updated first standard number and the updated second standard number, divide the candidate projection sub-region into multiple rows and / or multiple columns of second measurement grids.

[0184] Specifically, the candidate projection sub-region is updated and reclassified based on the updated first standard number and the updated second standard number, so as to divide the candidate projection sub-region into multiple rows and / or multiple columns of second measurement grid within the boundary of the candidate projection sub-region.

[0185] Specifically, step S1450 may include: determining a second time base scale updated for the second measurement grid based on the quotient of a first time base scale and an updated number of first standards; and dividing the candidate projection sub-region into a second measurement grid with multiple columns based on the updated second time base scale. Correspondingly, determining a second voltage scale updated for the second measurement grid based on the quotient of a first voltage scale and an updated number of second standards; and dividing the candidate projection sub-region into a second measurement grid with multiple rows based on the updated second voltage scale.

[0186] Specifically, dividing the first time base scale of the first measurement grid by the updated number of first standards yields the updated second time base scale for the second measurement grid. Correspondingly, dividing the time domain interval of the candidate projection sub-region by the updated second time base scale yields the updated number of second measurement grids in the candidate projection sub-region, thus dividing the candidate projection sub-region into multiple columns of second measurement grids based on the updated second time base scale. Similarly, dividing the first voltage scale of the first measurement grid by the updated number of second standards yields the updated second voltage scale for the second measurement grid. Correspondingly, dividing the voltage domain interval of the candidate projection sub-region by the updated second voltage scale yields the updated number of second measurement grids in the candidate projection sub-region, thus dividing the candidate projection sub-region into multiple rows of second measurement grids based on the updated second voltage scale.

[0187] Optionally, before the step of dividing the candidate projection sub-region into multiple rows and / or columns of second measurement grids within the boundary of the candidate projection sub-region according to the updated first standard number and the updated second standard number, increasing the number of rows and / or columns of the second measurement grid in the candidate projection sub-region to update the candidate projection sub-region further includes: updating the boundary of the candidate projection sub-region according to the updated first standard number.

[0188] The method for updating the boundary of the candidate projection sub-region can refer to the method for determining the candidate projection sub-region described above. The difference lies in the change of the number of the first standard, which will not be elaborated here. Since the number of the first standard changes continuously during the iteration process, and it is relative to the first measurement grid, updating the boundary of the candidate projection sub-region first, and then dividing the boundary of the candidate projection sub-region based on the second time base scale, makes the number of columns of the second measurement grid divided according to the second time base scale in the candidate projection sub-region equivalent to dividing the first measurement grid in the projection area according to the second time base scale and retaining the number of columns with the projected sampling point set. Furthermore, the second measurement grids in the candidate projection sub-region are all complete. Therefore, the updated candidate projection sub-region and the scheme of directly dividing the first measurement grid according to the second time base scale to obtain multiple columns of second measurement grids can have basically the same resolution capability, while requiring less computing power.

[0189] Furthermore, steps S1410-S1420 and S1430-S1440 can be executed individually or simultaneously. For example, when the first time base scale is less than the updated time threshold, and the first voltage scale is greater than the updated voltage threshold, the candidate projection sub-region does not need to be divided in the horizontal direction, but the first measurement grid of the candidate projection sub-region needs to be divided in the vertical direction. That is, only steps S1410-S1420 need to be executed, and steps S1430-S1440 do not need to be executed. Similarly, steps S1430-S1440 can be executed individually, or steps S1410-S1420 and steps S1430-S1440 can be executed simultaneously.

[0190] After updating the candidate projection sub-region, the sampled point set can be reprojected onto the candidate projection sub-region to update the candidate virtual eye diagram. This is the complete process of step S630. After executing steps S620-S630 once or multiple times, the candidate virtual eye diagram will be presented in a resolvable manner in the candidate projection sub-region. At this time, proceed to step S640: if the candidate virtual eye diagram is resolvable, then the candidate virtual eye diagram is determined as the target virtual eye diagram, and the candidate projection sub-region is determined as the projection sub-region.

[0191] In Example 4, the measurement grid in the projection area is divided to update the projection area, thereby increasing the number of cells in the projection area. After executing at least one step S1410~S1440, the projection area's ability to distinguish virtual eye diagrams is continuously improved until it can meet the requirements for distinguishing candidate virtual eye diagrams.

[0192] Example 5

[0193] Figure 15 This is a flowchart illustrating an eye diagram drawing method provided in an embodiment of this application. (See attached diagram.) Figure 15 In some embodiments, the eye diagram drawing method includes the following steps:

[0194] S1510, Determine the target virtual eye diagram according to the aforementioned eye diagram processing method.

[0195] The specific process of step S1510 can be referred to in Embodiments 1 to 4 above, and will not be repeated here.

[0196] S1520, Based on the target virtual eye diagram, determine the virtual eye diagram image corresponding to the target virtual eye diagram.

[0197] After determining the target virtual eye diagram, the corresponding image, i.e., the virtual eye diagram image, can be obtained based on the target virtual eye diagram. For example, an image with the same resolution as the number of second measurement grids in the projection sub-region can be configured first, and the pixels in the image correspond to the second measurement grids in the projection sub-region. The first pixels corresponding to the first measurement grids that are not hit by the sampling points are configured as black or white, and the second pixels corresponding to the second measurement grids that are hit by the sampling points are configured as color to obtain the virtual eye diagram image. The grayscale of each second pixel can be configured to be the same or different.

[0198] S1530: The target eye image is obtained by stitching together multiple virtual eye diagram images.

[0199] Among them, the virtual eye diagram image is a template of the virtual eye diagram image, and the target eye diagram image is the image corresponding to all observation eyes in the entire observation range. The number of UIs corresponding to the target eye diagram image is the same as the number of UIs corresponding to the entire observation range.

[0200] After obtaining the virtual eye diagram image, it can be used as a template to copy multiple virtual eye diagram images and then stitch them together to form a complete target eye diagram image. The number of copied virtual eye diagram images is related to the observation range mentioned above; for example, if the virtual eye diagram image is one UI and the observation range of the eye diagram to be observed is 1000 UIs, then 1000 virtual eye diagram images need to be copied and stitched together; of course, 999 virtual eye diagram images can also be copied and stitched together sequentially with the first virtual eye diagram image obtained earlier. As another example, if the virtual eye diagram image is two UIs and the observation range of the eye diagram to be observed is 1000 UIs, then 500 virtual eye diagram images need to be copied and stitched together; of course, 499 virtual eye diagram images can also be copied and stitched together sequentially with the first virtual eye diagram image obtained earlier. This method eliminates the need to divide all the first measurement grids in the entire two-dimensional grid and project all the sampling points within the entire observation range when drawing the entire eye diagram; instead, it only requires dividing and projecting the projection sub-region corresponding to the eye to be measured, which helps to improve the efficiency of eye diagram drawing.

[0201] Specifically, for example, see Figure 16 , Figure 16 Image (a) shows a virtual eye diagram. Figure 16 In (b), it is shown that: a copy is made based on the virtual eye diagram image in (a), and then spliced ​​with the virtual eye diagram image in (a) to obtain a candidate virtual eye diagram image, which includes two virtual eye diagram images; Figure 16(c) illustrates the following: A copy of the virtual eye diagram image in (b) is made and then stitched together with the candidate virtual eye diagram image in (b) to obtain an updated candidate virtual eye diagram image, which includes four virtual eye diagram images. The number of virtual eye diagram images can be increased continuously in increments of 2. Considering that the number of UIs corresponding to the observation range is not necessarily an integer number of 2, if the copy of the candidate virtual eye diagram at the (P-1)th iteration exceeds the expected observation range, the excess portion can be cropped to obtain the target eye diagram image, where P ≥ 2. Alternatively, the candidate virtual eye diagram at the (P-1)th iteration can be stitched together with an earlier obtained candidate virtual eye diagram, ensuring that the number of UIs corresponding to the updated candidate virtual eye diagram does not exceed the number of UIs corresponding to the observation range and continuously approaches the number of UIs corresponding to the observation range. Subsequent stitching processes follow the same principle until the target eye diagram image is obtained.

[0202] Optionally, the generated target eye diagram image can be displayed on the user interface of the measuring instrument by displaying the target eye diagram image.

[0203] In this embodiment, as the observation range increases, the number of sampling points inevitably increases. If all sampling points are mechanically projected, the drawing performance will degrade. In this embodiment, based on the principle of equivalent observation eyes within the observation range, a target virtual eye diagram is first obtained using the aforementioned eye diagram processing method. Then, a virtual eye diagram image is further obtained based on this target virtual eye diagram and used as a template. Finally, multiple virtual eye diagram images are stitched together to obtain the target virtual eye diagram image. This embodiment avoids the process of acquiring and projecting a large number of sampling points through graphics processing, which helps reduce the hardware computing power requirements for eye diagram drawing. In other words, under the same hardware computing power conditions, the drawing efficiency of eye diagrams can be improved.

[0204] Example 6

[0205] Figure 17 This is a schematic diagram of the structure of an eye diagram processing device provided in an embodiment of this application. (See attached diagram.) Figure 17 The eye diagram processing apparatus includes various functional modules for implementing the aforementioned eye diagram processing method, and any functional module can be implemented by software and / or hardware.

[0206] In some embodiments, the eye diagram processing device 1700 includes a data acquisition module 1710 and an eye diagram projection module 1720. The data acquisition module 1710 is used to acquire a set of sampling points of the eye to be tested in a projection area. The set of sampling points includes all sampling points corresponding to the eye to be tested. The projection area is used to project the set of sampling points of the eye to be tested. The projection area includes a continuous region composed of multiple rows and at least one column of first measurement grids. The horizontal range of each first measurement grid is a time slot, and the vertical range of each first measurement grid is a voltage slot. The eye diagram projection module 1720 is used to project the set of sampling points onto a projection sub-region in the projection area to obtain a target virtual eye diagram. The projection sub-region is part or all of the continuous region in the projection area. The projection sub-region includes multiple rows and columns of second measurement grids. The number of rows of the second measurement grids in the projection sub-region is greater than or equal to the number of rows of the first measurement grids in the projection area, and the number of columns of the second measurement grids in the projection sub-region is greater than the number of columns of the first measurement grids in the projection area.

[0207] In some embodiments, the eye diagram projection module 1720 further includes an initialization module 1721, an eye diagram judgment module 1722, an eye diagram update module 1723, and an eye diagram determination module 1724; wherein, the initialization module 1721 is used to project the sampling point set onto the candidate projection sub-region to obtain a candidate virtual eye diagram; wherein, the candidate projection sub-region is part or all of the continuous region in the projection region, and the candidate projection sub-region includes a second measurement grid with multiple rows and columns; the eye diagram judgment module 1722 is used to determine whether the candidate virtual eye diagram is resolvable; the eye diagram update module 1723 is used to, if the candidate virtual eye diagram is not resolvable, increase the number of rows and / or columns of the second measurement grid in the candidate projection sub-region to update the candidate projection sub-region, and project the sampling point set onto the updated candidate projection sub-region to obtain the updated candidate virtual eye diagram, and return to the step of determining whether the candidate virtual eye diagram is resolvable; the eye diagram determination module 1724 is used to, if the candidate virtual eye diagram is resolvable, determine the candidate projection sub-region as a projection sub-region, and determine the candidate virtual eye diagram as a target virtual eye diagram.

[0208] In some embodiments, the initialization module 1721 is further configured to: determine a first time base scale and a first voltage scale of a first measurement grid based on the observation range of the eye diagram to be observed and a two-dimensional grid; wherein the observation range is the time range and voltage range covered by the eye diagram to be observed, the eye diagram to be observed includes multiple observation eyes, the eye to be measured is one of the multiple observation eyes, the two-dimensional grid includes a multi-row, multi-column first measurement grid, the projection area is a portion of the two-dimensional grid, the first time base scale is the width of the time slot of the first measurement grid, and the first voltage scale is the height of the voltage slot of the first measurement grid; determine a first standard number of divisions of the first measurement grid along the horizontal direction based on the first time base scale and the time base threshold; determine a second standard number of divisions of the first measurement grid along the vertical direction based on the first voltage scale and the voltage threshold; and divide one or more columns and one or more rows of a second measurement grid within the boundary of the candidate projection sub-region based on the first standard number and the second standard number to obtain the candidate projection sub-region.

[0209] In some embodiments, the initialization module 1721 is further configured to: determine a first standard quantity of one if the first time base scale is less than or equal to a time base threshold; and determine a first standard quantity based on the quotient of the first time base scale and the time base threshold if the first time base scale is greater than the time base threshold; and determine a second standard quantity for dividing the first measurement grid along the vertical direction based on the first voltage scale and the voltage threshold, including: determining a second standard quantity of one if the first voltage scale is less than or equal to the voltage threshold; and determining a second standard quantity based on the quotient of the first voltage scale and the voltage threshold if the first voltage scale is greater than the voltage threshold.

[0210] In some embodiments, the initialization module 1721 is further configured to: determine a second time base scale of the second measurement grid based on the quotient of a first time base scale and a first standard quantity; determine a second voltage scale of the second measurement grid based on the quotient of a first voltage scale and a second standard quantity; and divide a second measurement grid into one or more columns, one or more rows within the boundary of the candidate projection sub-region based on the second time base scale and the second voltage scale.

[0211] In some embodiments, the candidate projection sub-region is a portion of a continuous region within the projection area; the starting position and the ending position of the eye to be tested are respectively the first starting position and the first ending position, and the starting position and the ending position of the boundary of the candidate projection sub-region relative to each other in the horizontal direction are respectively the second starting position and the second ending position; the second starting position is earlier than the first starting position and not earlier than the starting position of the first measurement grid where the first starting position is located, and the second ending position is later than the first ending position and not later than the ending position of the first measurement grid where the first ending position is located.

[0212] In some embodiments, the second starting position and the second ending position are determined based on the following method: A second starting position is determined according to a first starting position and a second time base scale; wherein the second time base scale is the time base scale when the first measurement grid is divided into a first standard number, the interval between the starting position of the first measurement grid where the first starting position is located and the second starting position is an integer multiple of the second time base scale, and the interval between the first starting position and the second starting position is less than the second time base scale; A second ending position is determined according to a first ending position and the second time base scale; wherein the interval between the ending position of the first measurement grid where the first ending position is located and the second ending position is an integer multiple of the second time base scale, and the interval between the first ending position and the second ending position is less than the second time base scale.

[0213] In some embodiments, the eye diagram update module 1723 is specifically configured to: update the time base threshold according to the time base threshold and the first reduction factor; update the first standard number according to the first time base scale and the updated time base threshold; update the voltage threshold according to the voltage scale threshold and the second reduction factor; update the second standard number according to the first voltage scale and the updated voltage threshold; and divide multiple rows and / or multiple columns of second measurement grids within the boundary of the candidate projection sub-region according to the updated first standard number and the updated second standard number.

[0214] In some embodiments, prior to the step of dividing a second measurement grid into multiple rows and / or columns within the boundary of the candidate projection sub-region according to the updated first standard number and the updated second standard number, increasing the number of rows and / or columns of the second measurement grid in the candidate projection sub-region to update the candidate projection sub-region further includes: updating the boundary of the candidate projection sub-region according to the updated first standard number.

[0215] In some embodiments, the candidate projection sub-region is the entire continuous region within the projection area.

[0216] In some embodiments, the eye diagram determination module 1722 is specifically configured to: determine that the candidate virtual eye diagram is indistinguishable if the interior of the candidate virtual eye diagram is not separated by at least one second measurement grid in the horizontal direction, or if the interior of the candidate virtual eye diagram is not separated by at least one second measurement grid in the vertical direction; and determine that the candidate virtual eye diagram is distinguishable if the interior of the candidate virtual eye diagram is separated by at least one second measurement grid in the horizontal direction and if the interior of the candidate virtual eye diagram is separated by at least one second measurement grid in the vertical direction.

[0217] In some embodiments, the eye diagram determination module 1722 is specifically used to: acquire a reference measurement grid; wherein the reference measurement grid is a second measurement grid within a candidate projection sub-region; if at least one sampling point hits both first reference grids, and / or at least one sampling point hits both second reference grids, then the candidate virtual eye diagram is determined to be indistinguishable; wherein the first reference grid is a second measurement grid adjacent to the reference measurement grid in the horizontal direction, and the two first reference grids are respectively located on both sides of the reference measurement grid, and the second reference grid is a second measurement grid adjacent to the reference measurement grid in the vertical direction, and the two second reference grids are respectively located on both sides of the reference measurement grid; if neither of the two first reference grids is hit by any sampling point, and neither of the two second reference grids is hit by any sampling point, then the candidate virtual eye diagram is determined to be distinguishable.

[0218] In some embodiments, the eye diagram processing apparatus 1700 further includes an eye diagram measurement module 1730, which is specifically used for: determining eye diagram feature parameters based on a target virtual eye diagram; wherein the eye diagram feature parameters include at least one of eye width, eye height, eye diagram opening, overall jitter, random jitter, deterministic jitter, time margin, amplitude noise, voltage margin, signal-to-noise ratio, rise time, and fall time; and attaching preset marks to the feature parameters; wherein the preset marks are used to characterize that the second measurement grid used when acquiring the feature parameters is different from the first measurement grid.

[0219] The eye diagram processing device 1700 provided in this application embodiment is used to execute the technical solution provided in the aforementioned eye diagram processing method embodiment. Its implementation principle and technical effect are similar to those in the aforementioned method embodiment, and will not be repeated here.

[0220] Figure 18 This is a schematic diagram of the structure of an eye diagram drawing device provided in an embodiment of this application. (See attached diagram.) Figure 18 The eye diagram drawing device includes various functional modules for implementing the aforementioned eye diagram drawing method, and any functional module can be implemented by software and / or hardware.

[0221] In some embodiments, the eye diagram drawing apparatus 1800 includes an eye diagram acquisition module 1810, an image conversion module 1820, and an image stitching module 1830; the eye diagram acquisition module 1810 is used to determine a target virtual eye diagram according to the aforementioned eye diagram processing method; the image conversion module 1820 is used to determine a virtual eye diagram image corresponding to the target virtual eye diagram according to the target virtual eye diagram; and the image stitching module 1830 is used to stitch together multiple virtual eye diagram images to obtain a target eye diagram image.

[0222] The eye diagram drawing device 1800 provided in this application embodiment is used to execute the technical solution provided in the aforementioned eye diagram drawing method embodiment. Its implementation principle and technical effect are similar to those in the aforementioned method embodiment, and will not be repeated here.

[0223] It should be noted that the division of the various modules in the above device is merely a logical functional division. In actual implementation, they can be fully or partially integrated into a single physical entity, or they can be physically separated. Furthermore, these modules can be implemented entirely in software via processing element calls, entirely in hardware, or partially in software calls via processing element calls, with some modules implemented in hardware. For example, the eye diagram projection module 1720 can be a separate processing element, or it can be integrated into a chip within the above device. Alternatively, it can be stored as program code in the device's memory, and its functions can be called and executed by a processing element within the device. The implementation of other modules is similar. Moreover, these modules can be fully or partially integrated together, or they can be implemented independently. The processing element here can be an integrated circuit with signal processing capabilities. During implementation, each step of the above method or each of the above modules can be completed through integrated logic circuits in the hardware of the processor element or through software instructions.

[0224] Figure 19 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. (See attached diagram.) Figure 19 The electronic device 1900 includes a processor 1910 and a memory 1920 communicatively connected to the processor 1910;

[0225] The 1920 memory stores the computer's executable instructions;

[0226] The processor 1910 executes computer execution instructions stored in the memory 1920 to implement the aforementioned eye diagram processing method.

[0227] In the aforementioned electronic device 1900, the memory 1920 and processor 1910 are electrically connected directly or indirectly to achieve data transmission or interaction. For example, these components can be electrically connected to each other through one or more communication buses or signal lines, such as bus connections. The bus can be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, or an Extended Industry Standard Architecture (EISA) bus, etc. Buses can be classified as address buses, data buses, control buses, etc., but this does not mean that there is only one bus or one type of bus. The memory 1920 stores computer execution instructions that implement the aforementioned eye diagram processing method, including at least one software functional module that can be stored in the memory 1920 in the form of software or firmware. The processor 1910 executes various functional applications and data processing by running the software programs and modules stored in the memory 1920.

[0228] The memory 1920 includes at least one type of readable storage medium, not limited to Random Access Memory (RAM), Read Only Memory (ROM), Programmable Read-Only Memory (PROM), Erasable Programmable Read-Only Memory (EPROM), Electrically Erasable Programmable Read-Only Memory (EEPROM), etc. The memory 1920 stores programs, and the processor 1910 executes the programs after receiving execution instructions. Furthermore, the software programs and modules within the memory 1920 may also include an operating system, which may include various software components and / or drivers for managing system tasks (e.g., memory management, storage device control, power management, etc.) and can communicate with various hardware or software components to provide an operating environment for other software components.

[0229] Processor 1910 can be an integrated circuit chip with signal processing capabilities. The aforementioned processor 1910 can be a general-purpose processor, including a Central Processing Unit (CPU), a Network Processor (NP), a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), etc. It can implement or execute the methods, steps, and logic block diagrams disclosed in the embodiments of this application. The general-purpose processor can be a microprocessor, or processor 1910 can be any conventional processor.

[0230] The electronic device 1900 is used to execute the technical solution provided in the aforementioned eye diagram processing method embodiment. Its implementation principle and technical effect are similar to those in the aforementioned method embodiment, and will not be repeated here.

[0231] This application also provides a computer-readable storage medium storing computer-executable instructions, which, when executed, are used to implement the technical solution of the aforementioned eye diagram processing method.

[0232] The aforementioned computer-readable storage medium can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic storage, flash memory, magnetic disk, or optical disk. The computer-readable storage medium can be any available medium accessible to a general-purpose or special-purpose computer.

[0233] An exemplary readable storage medium is coupled to a processor, enabling the processor to read information from and write information to the readable storage medium. Of course, the readable storage medium can also be a component of the processor. The processor and the readable storage medium can reside in an Application Specific Integrated Circuit (ASIC). Alternatively, the processor and the readable storage medium can exist as discrete components in the control unit of an eye diagram processing device.

[0234] This application also provides a computer program product, including a computer program, which, when executed, is used to implement the technical solution of the eye diagram processing method described above.

[0235] This application also provides a measuring instrument, which includes the above-described electronic device.

[0236] In this embodiment, the measuring instrument can perform eye diagram processing and eye diagram drawing based on the aforementioned eye diagram processing method and eye diagram drawing method, so as to improve eye diagram resolution and eye diagram drawing efficiency.

[0237] In the above embodiments, those skilled in the art will understand that the above method embodiments can be implemented entirely or partially by software, hardware, firmware, or any combination thereof. When implemented in software, it can be implemented entirely or partially in the form of a computer program product. A computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, all or part of the flow or function according to the embodiments of this application is generated. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions can be stored in a computer-readable storage medium or transmitted from one computer-readable storage medium to another. For example, computer instructions can be transmitted from one website, computer, server, or data center to another website, computer, server, or data center via wired (e.g., coaxial cable, fiber optic, digital subscriber line (DSL)) or wireless (e.g., infrared, wireless network, microwave, etc.) means. The computer-readable storage medium can be any available medium that a computer can access or a data storage device such as a server or data center that integrates one or more available media. The available media can be magnetic media (e.g., floppy disks, hard disks, magnetic tapes), optical media (e.g., DVDs), or semiconductor media (e.g., solid-state drives (SSDs)).

[0238] In the above embodiments, the descriptions of each embodiment have their own emphasis. For parts not described in detail in a certain embodiment, please refer to the relevant descriptions of other embodiments. The technical features of the above embodiments can be combined arbitrarily. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as the combination of these technical features does not contradict each other, it should be considered within the scope of this specification.

[0239] Other embodiments of this application will readily occur to those skilled in the art upon consideration of the specification and practice of the invention disclosed herein. This application is intended to cover any variations, uses, or adaptations of this application that follow the general principles of this application and include common knowledge or customary techniques in the art not disclosed herein. The specification and examples are to be considered exemplary only, and the true scope and spirit of this application are indicated by the appended claims.

[0240] It should be understood that this application is not limited to the precise structure described above and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope. The scope of this application is limited only by the appended claims.

Claims

1. An eye diagram processing method, characterized in that, include: Obtain the sampling point set of the eye to be tested in the projection area; wherein, the sampling point set includes all sampling points corresponding to the eye to be tested, the projection area is used to project the sampling point set of the eye to be tested, the projection area includes a continuous region composed of multiple rows and at least one column of first measurement grids, the horizontal range of each first measurement grid is a time slot, and the vertical range of each first measurement grid is a voltage slot; The sampling point set is projected onto a projection sub-region within the projection area to obtain a target virtual eye map; wherein, the projection sub-region is a part or all of a continuous region within the projection area, the projection sub-region includes a second measurement grid with multiple rows and columns, the number of rows of the second measurement grid in the projection sub-region is greater than or equal to the number of rows of the first measurement grid in the projection area, and the number of columns of the second measurement grid in the projection sub-region is greater than the number of columns of the first measurement grid in the projection area; The step of projecting the sampling point set onto a projection sub-region within the projection area to obtain a target virtual eye map includes: The sampling point set is projected onto the candidate projection sub-region to obtain the candidate virtual eye diagram; wherein, the candidate projection sub-region is part or all of the continuous region in the projection region, and the candidate projection sub-region includes a second measurement grid with multiple rows and columns; Determine whether the candidate virtual eye diagram is distinguishable; If the candidate virtual eye diagram is indistinguishable, the number of rows and / or columns of the second measurement grid in the candidate projection sub-region is increased to update the candidate projection sub-region, and the sampling point set is projected onto the updated candidate projection sub-region to obtain the updated candidate virtual eye diagram, and the process returns to the step of determining whether the candidate virtual eye diagram is distinguishable. If the candidate virtual eye map is distinguishable, then the candidate projection sub-region is determined to be the projection sub-region, and the candidate virtual eye map is determined to be the target virtual eye map; Before projecting the sampling point set onto the candidate projection sub-region to obtain the candidate virtual eye map, the method further includes: Based on the observation range of the eye diagram to be observed and the two-dimensional grid, the first time base scale and the first voltage scale of the first measurement grid are determined; wherein, the observation range is the time range and voltage range covered by the eye diagram to be observed, the eye diagram to be observed includes multiple observation eyes, the eye to be measured is one of the multiple observation eyes, the two-dimensional grid includes the first measurement grid with multiple rows and columns, the projection area is a part of the two-dimensional grid, the first time base scale is the width of the time slot of the first measurement grid, and the first voltage scale is the height of the voltage slot of the first measurement grid; Based on the first time base scale and the time base threshold, determine the first standard number of the first measurement grid divided along the horizontal direction; Based on the first voltage scale and voltage threshold, determine the second standard number of the first measurement grid divided along the vertical direction; Based on the first standard quantity and the second standard quantity, one or more columns and one or more rows of the second measurement grid are divided within the boundary of the candidate projection sub-region to obtain the candidate projection sub-region.

2. The method according to claim 1, characterized in that: The step of determining the first standard number of the first measurement grid divided horizontally according to the first time base scale and the time base threshold includes: If the first time base scale is less than or equal to the time base threshold, the first standard quantity is determined to be one; and If the first time base scale is greater than the time base threshold, then the first standard quantity is determined based on the quotient of the first time base scale and the time base threshold; The step of determining the second standard number of the first measurement grid divided along the vertical direction based on the first voltage scale and voltage threshold includes: If the first voltage scale is less than or equal to the voltage threshold, the second standard quantity is determined to be one; and If the first voltage scale is greater than the voltage threshold, then the second standard quantity is determined based on the quotient of the first voltage scale and the voltage threshold.

3. The method according to claim 1, characterized in that, The step of dividing the candidate projection sub-region into one or more columns and one or more rows of the second measurement grid based on the first standard quantity and the second standard quantity includes: The second time base scale of the second measurement grid is determined based on the quotient of the first time base scale and the first standard quantity; The second voltage scale of the second measurement grid is determined based on the quotient of the first voltage scale and the second standard quantity; and Based on the second time base scale and the second voltage scale, one or more columns, one or more rows of the second measurement grid are divided within the boundary of the candidate projection sub-region.

4. The method according to claim 1, characterized in that, The candidate projection sub-region is a portion of a continuous region within the projection region; The starting position and ending position of the eye to be tested are respectively the first starting position and the first ending position, and the starting position and ending position of the boundary of the candidate projection sub-region along the horizontal direction are respectively the second starting position and the second ending position. The second starting position is earlier than the first starting position and not earlier than the starting position of the first measurement grid in which the first starting position is located, and the second ending position is later than the first ending position and not later than the ending position of the first measurement grid in which the first ending position is located.

5. The method according to claim 4, characterized in that, The second starting position and the second ending position are determined based on the following method: The second starting position is determined based on the first starting position and the second time base scale; wherein, the second time base scale is the time base scale when the first measurement grid is divided into a first standard number, the interval between the starting position of the first measurement grid where the first starting position is located and the second starting position is an integer multiple of the second time base scale, and the interval between the first starting position and the second starting position is less than the second time base scale; The second termination position is determined based on the first termination position and the second time base scale; wherein the interval between the termination position of the first measurement grid where the first termination position is located and the second termination position is an integer multiple of the second time base scale, and the interval between the first termination position and the second termination position is less than the second time base scale.

6. The method according to claim 1, characterized in that, The step of increasing the number of rows and / or columns of the second measurement grid in the candidate projection sub-region to update the candidate projection sub-region includes: The time base threshold is updated based on the time base threshold and the first shrinkage factor; The first standard quantity is updated based on the first time base scale and the updated time base threshold; The voltage threshold is updated based on the voltage threshold and the second reduction factor; The second standard quantity is updated based on the first voltage scale and the updated voltage threshold. Based on the updated first standard number and the updated second standard number, multiple rows and / or columns of the second measurement grid are divided within the boundary of the candidate projection sub-region.

7. The method according to claim 6, characterized in that, Before the step of dividing the candidate projection sub-region into multiple rows and / or columns of the second measurement grid based on the updated first standard number and the updated second standard number, the step of increasing the number of rows and / or columns of the second measurement grid in the candidate projection sub-region to update the candidate projection sub-region further includes: The boundaries of the candidate projection sub-regions are updated based on the updated first standard number.

8. The method according to any one of claims 1 to 6, characterized in that, The candidate projection sub-region is all the continuous regions in the projection area.

9. The method according to any one of claims 1 to 7, characterized in that, The determination of whether the candidate virtual eye map is distinguishable includes: If the candidate virtual eye diagram is not separated by at least one second measurement grid in the horizontal direction, or if the candidate virtual eye diagram is not separated by at least one second measurement grid in the vertical direction, then the candidate virtual eye diagram is determined to be indistinguishable. If the interior of the candidate virtual eye diagram is spaced apart by at least one second measurement grid in the horizontal direction, and the interior of the candidate virtual eye diagram is spaced apart by at least one second measurement grid in the vertical direction, then the candidate virtual eye diagram is determined to be resolvable.

10. The method according to any one of claims 1 to 7, characterized in that, The determination of whether the candidate virtual eye map is distinguishable includes: Obtain a reference measurement grid; wherein the reference measurement grid is a second measurement grid within the candidate projection sub-region; If at least one of the sampling points hits two first reference grids, and / or at least one of the sampling points hits two second reference grids, then the candidate virtual eye diagram is determined to be indistinguishable; wherein, the first reference grid is a second measurement grid adjacent to the reference measurement grid in the horizontal direction, and the two first reference grids are respectively located on both sides of the reference measurement grid; the second reference grid is a second measurement grid adjacent to the reference measurement grid in the vertical direction, and the two second reference grids are respectively located on both sides of the reference measurement grid; If neither of the two first reference grids is hit by any of the sampling points, and neither of the two second reference grids is hit by any of the sampling points, then the candidate virtual eye diagram is determined to be resolvable.

11. The method according to any one of claims 1 to 6, characterized in that, The method further includes: Based on the target virtual eye diagram, eye diagram feature parameters are determined; wherein, the eye diagram feature parameters include at least one of the following parameters: eye width, eye height, eye opening, overall jitter, random jitter, deterministic jitter, time margin, amplitude noise, voltage margin, signal-to-noise ratio, rise time, and fall time. A preset marker is attached to the feature parameter; wherein the preset marker is used to indicate that the second measurement grid used when acquiring the feature parameter is different from the first measurement grid.

12. A method for drawing an eye diagram, characterized in that, include: The eye diagram processing method according to any one of claims 1 to 11 determines the target virtual eye diagram; Based on the target virtual eye diagram, determine the virtual eye diagram image corresponding to the target virtual eye diagram; The target eye image is obtained by stitching together multiple virtual eye images.

13. An eye diagram processing apparatus, characterized in that, include: A data acquisition module is used to acquire a set of sampling points for the eye under test in a projection area; wherein the set of sampling points includes all sampling points corresponding to the eye under test, the projection area is used to project the set of sampling points for the eye under test, and the projection area includes a continuous region composed of multiple rows and at least one column of first measurement grids, wherein the horizontal range of each first measurement grid is a time slot, and the vertical range of each first measurement grid is a voltage slot; and An eye diagram projection module is used to project the sampling point set onto a projection sub-region within the projection area to obtain a target virtual eye diagram; wherein, the projection sub-region is a portion or all of a continuous region within the projection area, the projection sub-region includes a multi-row, multi-column second measurement grid, the number of rows in the second measurement grid of the projection sub-region is greater than or equal to the number of rows in the first measurement grid of the projection area, and the number of columns in the second measurement grid of the projection sub-region is greater than the number of columns in the first measurement grid of the projection area; The eye diagram projection module includes an initialization module, an eye diagram judgment module, an eye diagram update module, and an eye diagram determination module; wherein... The initialization module is used to project the sampling point set onto the candidate projection sub-region to obtain a candidate virtual eye diagram; wherein, the candidate projection sub-region is part or all of the continuous region in the projection region, and the candidate projection sub-region includes a second measurement grid with multiple rows and columns; The eye diagram determination module is used to determine whether the candidate virtual eye diagram is distinguishable; The eye diagram update module is used to update the candidate projection sub-region by increasing the number of rows and / or columns of the second measurement grid in the candidate projection sub-region if the candidate virtual eye diagram is indistinguishable, and projecting the sampling point set onto the updated candidate projection sub-region to obtain the updated candidate virtual eye diagram, and then returning to the step of determining whether the candidate virtual eye diagram is distinguishable. The eye diagram determination module is used to determine the candidate projection sub-region as the projection sub-region if the candidate virtual eye diagram is distinguishable, and to determine the candidate virtual eye diagram as the target virtual eye diagram; The initialization module is also used for: Based on the observation range of the eye diagram to be observed and the two-dimensional grid, the first time base scale and the first voltage scale of the first measurement grid are determined; wherein, the observation range is the time range and voltage range covered by the eye diagram to be observed, the eye diagram to be observed includes multiple observation eyes, the eye to be measured is one of the multiple observation eyes, the two-dimensional grid includes the first measurement grid with multiple rows and columns, the projection area is a part of the two-dimensional grid, the first time base scale is the width of the time slot of the first measurement grid, and the first voltage scale is the height of the voltage slot of the first measurement grid; Based on the first time base scale and the time base threshold, determine the first standard number of the first measurement grid divided along the horizontal direction; Based on the first voltage scale and voltage threshold, determine the second standard number of the first measurement grid divided along the vertical direction; Based on the first standard quantity and the second standard quantity, one or more columns and one or more rows of the second measurement grid are divided within the boundary of the candidate projection sub-region to obtain the candidate projection sub-region.

14. An eye diagram drawing device, characterized in that, include: The eye diagram acquisition module is used to determine the target virtual eye diagram according to any one of claims 1 to 11; An image conversion module is used to determine a virtual eye diagram image corresponding to the target virtual eye diagram based on the target virtual eye diagram; The image stitching module is used to stitch together multiple virtual eye diagram images to obtain a target eye diagram image.

15. An electronic device, characterized in that, Includes a processor and a memory communicatively connected to the processor; The memory stores computer-executed instructions; The processor executes computer execution instructions stored in the memory to implement the method as described in any one of claims 1 to 11.

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