Imaging system for use in a test environment

Abstract

This application relates to an imaging system for use in a testing environment. The imaging system is used to capture images of a test object during testing to locate the test object. The imaging system includes a housing having a body extending around an enclosed internal space. An opening extends through the housing and communicates with the internal space. A baffle is positioned within the internal space, wherein the baffle is movable between an open position located away from the opening and a closed position extending across the opening. An imaging device is positioned within the internal space and aligned with the opening, wherein the imaging device is configured to capture an image of the test object when the baffle is in the open position.

Description

Technical Field

[0001] This disclosure relates generally to the field of imaging, and more specifically to imaging systems configured for use in a test environment. Background Technology

[0002] Various objects, including but not limited to materials (e.g., metal specimens) and manufactured components (e.g., vehicle components, building components, industrial machinery), require testing to ensure they meet specific physical requirements. For example, aircraft components are tested to ensure they can withstand the various environments in which they will operate. Testing involves placing the object inside a test chamber. The object is then exposed to a test material, which includes, but is not limited to, salt, water, vapor, and one or more of various corrosive materials. The test material may be applied as a liquid and / or gas (e.g., brine vapor). Depending on the test protocol, the test can be extended for varying durations. An example of such testing includes the American Society for Testing and Materials (ASTM) test standards.

[0003] Images of the test object are acquired during testing. These images are used to analyze the effects of the test materials on the test object. A problem with this process is that the environment within the interior space is unfavorable for capturing accurate images of the test object. For example, the environment may have high humidity levels that cause the imaging equipment to fog up. Furthermore, the environment may damage the imaging equipment.

[0004] Current techniques involve capturing images of the test object during pauses in the testing protocol. This involves stopping the testing protocol and opening the chamber to access the test object within the internal space. Once the chamber is open, an imaging device is used to capture images. A drawback of this technique is that it requires stopping the testing protocol and opening the internal space. This delays the testing protocol during the time the internal space is open and the imaging device is used to capture images. The delay can also include the amount of time required to reseal the internal space and restart the application of the test material. Summary of the Invention

[0005] One aspect relates to an imaging system for capturing images of a test subject during testing. The imaging system includes a housing comprising a body extending around an enclosed internal space. An opening extends through the housing and communicates with the internal space. A shutter is positioned within the internal space, wherein the shutter is movable between an open position positioned away from the opening and a closed position extending across the opening. An imaging device is positioned within the internal space and aligned with the opening, the imaging device being configured to capture an image of the test subject when the shutter is in the open position. The opening is unobstructed, allowing gas within the internal space to escape when the shutter is in the open position.

[0006] On the other hand, when the baffle is in the closed position, the internal space is sealed, and the imaging system also includes an inlet through which gas is introduced into the internal space to increase the pressure within the internal space.

[0007] On the other hand, the baffle is positioned between the opening and the imaging device.

[0008] On the other hand, the seal extends around the opening, and wherein, when the baffle is in the closed position, the baffle abuts against the seal to prevent test material from entering the interior space.

[0009] On the other hand, the light is positioned within the internal space, wherein the light is configured to illuminate the test object when the baffle is in the open position.

[0010] On the other hand, the opening is a first opening and the baffle is a first baffle, the first baffle also includes at least one additional opening extending through the housing and communicating with the interior space, and also includes at least one additional baffle movable between an open position away from the at least one additional opening and a closed position extending across the at least one additional opening.

[0011] On the other hand, the gas supply includes a storage tank and a pipe connected to the housing and in communication with the interior space, wherein the gas supply is configured to supply the gas to the interior space.

[0012] On the other hand, the opening is unobstructed so that when the baffle is in the open position, the gas in the interior space can escape through the opening.

[0013] One aspect relates to a method for capturing images of a test object during testing. The method includes: positioning an imaging device inside a housing when a baffle on the housing is in a closed position; performing the test on the test object, wherein the test includes: applying a test material to the test object while the baffle is positioned across an opening in the housing; during the test, moving the baffle to an open position away from the opening; during the test, capturing an image of the test object through the opening while the baffle is in the open position; and moving the baffle to a closed position during the test and after image capture.

[0014] On the other hand, the step of moving the baffle to the closed position includes: positioning the baffle across the opening; and preventing test material from passing through the opening and moving into the interior of the housing.

[0015] On the other hand, the steps to open the baffle include: moving the baffle away from the opening.

[0016] On the other hand, the method further includes the step of pressurizing the interior of the housing.

[0017] In another aspect, the method further includes the step of reducing the pressure inside the housing by allowing gas inside the housing to escape when the baffle is in the open position.

[0018] On the other hand, the method also includes the step of maintaining the pressure inside the housing above a predetermined threshold.

[0019] In another aspect, the method further includes the step of capturing an image of the object as gas inside the housing escapes through the opening.

[0020] In another aspect, the method further includes the step of preventing gas from the interior of the housing from escaping through the opening by positioning the baffle across the opening in the closed position.

[0021] In another aspect, the method further includes the step of moving the housing and imaging device relative to the object during the test.

[0022] One aspect relates to a method for capturing images of a test object in a test environment. The method includes: positioning an imaging device within an internal space of a housing; pressurizing the internal space of the housing with gas; moving a baffle from a closed position to an open position while the baffle in the internal space seals an opening in the housing; capturing an image of the test object while the gas escapes from the internal space through the opening when the baffle is in the open position; and moving the baffle to a closed position after capturing the image.

[0023] In another aspect, the method further includes the step of: introducing the gas into the internal space when the baffle is in the open position.

[0024] In another aspect, the method further includes the following steps: when the baffle is in the open position, monitoring the pressure in the internal space, and when the pressure drops below a predetermined level, moving the baffle from the open position to the closed position.

[0025] On the other hand, the step of moving the baffle between the closed position and the open position includes rotating the baffle.

[0026] On the other hand, the method also includes the following step: maintaining pressure within the internal space.

[0027] The features, functions, and advantages already discussed can be realized independently in each aspect or combined in other aspects, and further details can be seen in the following description and figures. Attached Figure Description

[0028] Figure 1 It is a schematic diagram of an imaging system that includes the imaging device and the housing positioned inside the chamber.

[0029] Figure 2 This is a schematic diagram of the casing.

[0030] Figure 3A This is a schematic diagram showing the baffle in the open position (away from the opening in the housing).

[0031] Figure 3B yes Figure 3A A schematic diagram showing the baffle now in the closed position (the baffle extends across the opening in the housing).

[0032] Figure 4 This is a schematic diagram of a component located within the internal space of the casing.

[0033] Figure 5 This is a flowchart of a method for capturing images of the test object during the testing process.

[0034] Figure 6 This is a flowchart of a method for capturing images of the test object during the testing process.

[0035] Figure 7 This is a schematic diagram of a track system used to selectively position the housing and imaging equipment within the internal space of a chamber during the testing process.

[0036] Figure 8 This is a flowchart of a method for capturing images of the test object during the testing process.

[0037] Figure 9 This is a schematic diagram of a computing device.

[0038] Figure 10 This is a schematic diagram of a computing device used to capture images of the test object during the testing process. Detailed Implementation

[0039] Figure 1A chamber 120 for performing a test by applying test material 350 to a test object 300 is schematically shown. The chamber 120 includes an outer wall 128 extending around an internal space 127. In some examples, one or more of the outer walls are doors movable between an open and a closed position to access the internal space 127. One or more ports 126 extend through the outer wall 128 to allow the input and / or removal of test material from the internal space 127. In some examples, one or more ports allow fluid to be input into the internal space, and one or more ports act as drains to remove fluid.

[0040] The internal space 127 is sized to accommodate one or more objects to be tested (test objects 300). In test scenarios with different objects (e.g., test objects 300), each of the objects (e.g., test objects 300) can be the same (e.g., multiple aluminum sheets) or different (e.g., aircraft parts and truck parts). In some examples, test objects 300 are raw materials (e.g., aluminum sheets), while other objects are manufactured parts (e.g., struts for aircraft wings). In a specific example, test object 300 is a metal sheet.

[0041] Test material 350 includes one or more test inputs. Examples include, but are not limited to, salt water, fresh water, sodium chloride, and potassium chloride. In some examples, test material 350 is corrosive to perform corrosion tests on test object 300.

[0042] In some examples, test material 350 is stored outside chamber 120, such as in tank 125, and pumped into internal space 127. In some examples, test material 350 is stored within internal space 127. A fluid system is installed in internal space 127 and includes conduit 124 for spraying test material 350 from one or more nozzles 123. In some examples, test material 350 is applied to test object 300 as a spray or gas. In some examples, test material 350 completely or partially submerges test object 300.

[0043] The imaging system is configured to capture images of the test subject 300 during the test protocol and while the test subject 300 is positioned in chamber 120. This allows the test to continue without requiring chamber 120 to be opened to capture images, as is currently necessary. This is advantageous compared to the existing process that requires stopping the test protocol, opening chamber 120, capturing images of the test subject 300, closing chamber 120, and restarting the test protocol.

[0044] One or more imaging devices 100 are positioned within the internal space 127 and configured to capture images of the test object 300 during testing. Examples of imaging devices 100 include, but are not limited to, charge-coupled devices (CCDs), active pixel sensor devices (CMOS sensors), and infrared sensors. In some examples, the imaging device 100 is a camera with one or more lenses. A camera can capture a single image or video. In examples with multiple imaging devices 100, the imaging devices 100 may be the same or different.

[0045] The housing 130 extends around and protects the imaging device 100. The housing 130 includes a protected internal space 139 in which the imaging device 100 is positioned. Figure 2 A housing 130 is shown, its dimensions set and configured to extend around and contain the imaging device 100. The housing 130 includes a body 131 extending around an internal space 139. (The last sentence appears to be incomplete and possibly refers to a different housing.) Figure 2 In some of the examples shown, the body 131 includes a cover 132, which is removable to access the interior space 139. The housing 130 may be made of various materials, including but not limited to various plastics and metals. The housing 130 is configured to prevent and / or reduce the ingress of fluid test material 350 from within the chamber 120 and its potential damage to the imaging device 100.

[0046] In some examples, housing 130 is configured to be pressurized to protect imaging device 100. One or more ports 138 extend through body 131 and into internal space 139. Gas supply 410 (see...) Figure 1 The gas is supplied to and pressurized in the interior space 139. In some examples, the gas supplier 410 supplies ambient air from the external environment into the interior space 139.

[0047] The pressurization level of the internal space 139 can be varied. The pressurization is greater than the pressure within the internal space 127 of chamber 120 to create a positive pressure environment that prevents test material 350 from entering the internal space 139 of housing 130. Pressure sensor 129 can be positioned within the internal space 127 of housing 130, and pressure sensor 143 can be positioned within the internal space 139 of housing 130 to determine relative pressure. Housing 130 is pressurized to a pressure greater than that of the test environment outside housing 130. This can include pressure greater than that within chamber 120 (for the test chamber) and greater than that outside (for testing in an outdoor setting).

[0048] The test environment may include, but is not limited to, chamber 120. The test environment may also be located outside chamber 120 in an indoor or outdoor test environment. In some examples, housing 130 and imaging device 100 are positioned in an outdoor environment and configured to capture images of test object 300 positioned within the outdoor test environment. When in an outdoor test environment, housing 130 allows testing to continue without interference from weather conditions (e.g., rain) that may otherwise damage imaging device 100.

[0049] The housing 130 includes one or more openings 133 extending through the body 131 and into the interior space 139. The openings 133 are aligned with the imaging device 100 and enable the imaging device to capture images of the test object 300. Figure 2 An example with two openings 133 is shown. Other examples include more or fewer openings 133. The openings 133 can be as follows: Figure 2 The location can be along one side of the body 131, or along two or more different sides of the body 131.

[0050] The opening 133 is unobstructed and provides a clear view of the test object 300, enabling the imaging device 100 to capture images. However, the unobstructed opening 133 allows test material 350 to enter the internal space 139 and potentially damage the imaging device 100. To prevent and / or reduce this possibility, one or more baffles 140 are installed in the internal space 139 and are movable relative to the housing 130 to selectively extend above the opening 133. The baffles 140 are movable between a closed position extending above the opening 133 and an open position away from the opening 133.

[0051] Figure 3A An example is shown where a baffle 140 is positioned within an interior space 139 near a pair of openings 133. The baffle 140 includes a pair of bodies, each having a shape and size extending above the openings 133. A motor 141 is operatively connected to rotate the baffle 140 about a pivot P. Figure 3A In the open position shown, the baffle 140 rotates away from the opening 133. This position allows the imaging device 100 to capture an image of the test object 300. Figure 3B In the closed position shown, the baffle 140 is rotated to a second position extending above the opening 133. The baffle 140 prevents the test material 350 from entering the interior space 139. In some examples, the baffle 140 abuts against the inner surface of the contact body 131 to prevent ingress. In some examples, a seal 142, such as a gasket or silicone bead, is installed at each opening 133. The baffle 140 abuts against the seal 142 to prevent ingress.

[0052] exist Figure 3A and Figure 3B In one example, the baffle 140 is sized and shaped to extend over multiple openings 133. In other examples, the baffle 140 is sized to extend over a single opening 133. In some examples with multiple baffles 140, a single baffle 140 is positioned at each opening 133.

[0053] Figure 4 The components positioned within the internal space 139 of housing 130 are schematically shown. Housing 130 includes a pair of openings 133, in which sensors 110 of imaging device 100 (e.g., lenses, infrared sensors) are positioned at each opening 133. A baffle 140 is positioned at each opening 133 between the opening 133 and the sensor 110. In the closed position, as shown, baffle 140 extends across and closes the opening 133. In this example, baffle 140 abuts against a contact seal 142, which extends around the opening 133 and serves to form a watertight connection. In the open position, baffle 140 is positioned away from the opening 133 so that sensor 110 can capture an image of the target. Motor 141 provides power to baffle 140 between the open and closed positions.

[0054] The computing device 200 controls the operation of the imaging device 100 to capture images. The computing device 200 also controls the position of the baffle 140. In some examples, the computing device 200 is configured to determine the time period during which the baffle 140 should be in the open or closed position, and synchronize this timing with the operation of the imaging device 100.

[0055] Power source 420 supplies power to one or more components within internal space 139. Examples of power source 420 include, but are not limited to, alkaline batteries and rechargeable (NiMH) batteries. Gas supply 410 supplies gas to internal space 139 of housing 130 via conduit 425.

[0056] Figure 5 A method 450 for capturing images during testing of test subject 300 is illustrated. Imaging device 100 is positioned within an internal space 139 of housing 130, and housing 130 is sealed. This includes positioning baffle 140 in a closed position across opening 133 in housing 130. Housing 130 with imaging device 100 is positioned within an internal space 127 of chamber 120 (box 452). Test subject 300 is also located within internal space 127. Chamber 120 is closed, and a testing procedure is performed on test subject 300 (box 454). The testing procedure includes applying test material 350 to the test subject.

[0057] During testing, housing 130 is positioned relative to test object 300. Baffle 140 is moved to the open position (box 456), and imaging device 100 captures one or more images of test object 300 (box 458). Once complete, baffle 140 is moved back to the closed position (box 459).

[0058] In some examples, the internal space 139 is pressurized to a pressure higher than that of the internal space 127 of chamber 120 to prevent / reduce the ingress of test material 350. This occurs when gas escapes from the internal space 139 through opening 133 and acts as a purge gas to prevent the ingress of test material 350. In other examples, the internal space 139 is not pressurized.

[0059] Figure 6 Another method 500 is shown whereby an imaging device 100 captures images of a test subject 300 being tested within a chamber 120. Initially, the imaging device 100 is protected within a housing 130 and positioned within the internal space 127 of the chamber 120. The housing 130 is connected to a gas supply 410 via a conduit 425 extending into the housing 130. In some examples, a one-way valve 405 is positioned along the conduit 425 to prevent gas from escaping from the internal space 127 of the housing 130. The internal space 139 of the housing 130 is pressurized to prevent the test material 350 applied to the test subject 300 from immersing (box 505).

[0060] The pressure level of the internal space 139 can be varied. In some examples, pressure sensor 143 (see...) Figure 4 The pressure sensor 129 (see internal space 139) is installed within the internal space 139. Figure 1 It is installed in the internal space 127. The gas flow from the gas supply 410 is controlled such that the pressure in the internal space 139 of the housing 130 is greater than the pressure in the internal space 127 of the chamber 120.

[0061] To capture an image, the baffle 140 is moved from the closed position to the open position (box 510). The open position is away from the opening 133 so that the imaging device 100 can capture an image. In some examples, the open position moves the baffle 140 completely away from the opening 133. In other examples, the baffle 140 partially covers the opening 133 in the open position. While the baffle 140 is in the open position, the imaging device 100 captures one or more images (box 515). The number of images captured can vary depending on testing.

[0062] When baffle 140 is in the open position, gas in the internal space 139 exits through opening 133. This reduces the pressure within the internal space 139 and allows test material 350 to enter. In some examples, when opening 133 is exposed, the gas flow rate increases to maintain a certain pressure within the internal space 139 and prevent or reduce the entry of test material 350. In other examples, the pressure within the internal space 139 is monitored during the time baffle 140 is in the open position. In some examples, monitoring is used to determine whether to maintain a positive pressure in the internal space 139. If the pressure drops below a predetermined threshold, baffle 140 moves to the closed position. In other examples, baffle 140 remains in the open position for a predetermined period of time to capture images.

[0063] After the imaging device 100 captures an image, the baffle 140 is returned to the closed position (box 520). This closes the opening 133 and prevents the test material 350 from entering. The pressure within the internal space 139 can then be re-established to the desired level.

[0064] In some examples, housing 130 and imaging device 100 can be moved within the interior space 127 of chamber 120 to be positioned at different locations to capture images of test object 300 from different viewpoints. Figure 7 This is a schematic diagram of a track system 600 for positioning an imaging device 100 (and housing 130) within an internal space 127. The track system 600 includes a track 605 that engages with the housing 130. The housing 130 can move in three dimensions about one or more of the x, y, and z axes to capture images from different viewpoints. The track system 600 includes a track position controller 610 that controls the position of the housing 130. In some examples, the position controller 610 communicates with and receives signals from a computing device 200 regarding the desired position. The position controller 610 tracks the positions of the housing 130 and the imaging device 100 and transmits the information to the computing device 200.

[0065] Figure 8 This is a method 800 for capturing images from one or more viewpoints within the internal space 127 of chamber 120 during testing of test subject 300. With baffle 140 in the closed position, imaging device 100 is sealed within the internal space 139 of housing 130. Housing 130 is positioned within the internal space 127 of chamber 120. With chamber 120 closed, the test process begins with the application of test material 350 to test subject 300. During testing, and with chamber 120 closed, housing 130 and imaging device 100 are positioned relative to test subject 300 within internal space 127 (box 705).

[0066] Once in place, the baffle 140 is moved to the open position (box 715). The imaging device 100 captures one or more images of the test subject 300 (box 720). The unobstructed opening 133 makes it possible to obtain clear images that would otherwise be unavailable. After the images are captured, the baffle 140 returns to the closed position (box 725).

[0067] The testing process for test object 300 continues. If more images are needed (box 735), the housing 130 and imaging device 100 are moved within the internal space 127 of chamber 120. If not needed, no additional images are captured (box 745).

[0068] In some examples, one or more of methods 450, 500 and 800 are performed by the computing device 200 of the imaging device 100. Figure 9 A computing device 200 configured to operate one or more functions for capturing images of a test object 300 is schematically illustrated. The computing device 200 includes processing circuitry 210, such as that communicatively connected to memory circuitry 230 and interface circuitry 250 via one or more buses 220. Processing circuitry 210 includes one or more microprocessors, microcontrollers, hardware circuitry, discrete logic circuitry, hardware registers, digital signal processors (DSPs), field-programmable gate arrays (FPGAs), application-specific integrated circuits (ASICs), or combinations thereof. In one example, processing circuitry 210 is programmable hardware capable of executing, for example, a software program 240 stored in memory circuitry 230 as a machine-readable computer program.

[0069] In some examples, computing device 200 includes one or more serial ports 280 configured to send and / or receive data with other components of the system and / or remote nodes for monitoring and testing. An example of a serial port 280 is a USB port. In some examples, computing device 200 includes parallel ports.

[0070] Memory circuitry 230 includes non-transitory machine-readable media, whether volatile or non-volatile, including but not limited to solid-state media (e.g., SRAM, DRAM, DDRAM, ROM, PROM, EPROM, flash memory, solid-state drives, etc.), removable storage devices (e.g., Security Digital (SD) cards, miniSD cards, microSD cards, Memory Sticks, thumb drives, USB flash drives, ROM cartridges, universal media disks), fixed drives (e.g., magnetic hard disk drives), etc., all or in various combinations thereof. Memory circuitry 230 can store one or more software programs 240.

[0071] Interface circuitry 250 is configured to transmit data. In some examples, interface circuitry 250 is a controller hub configured to control the input and output (I / O) data paths of computing device 200. Such I / O data paths may include data paths for exchanging signals over a communication network and data paths for exchanging signals with electronic devices or users. For example, interface circuitry 250 includes a transceiver configured to send and receive communication signals over one or more wireless networks, Ethernet, or optical networks. In some examples, interface circuitry 250 is implemented as a single physical component or as multiple physical components arranged continuously or separately, wherein any physical component can be communicatively coupled to any other physical component or can communicate with any other physical component via processing circuitry 210. In some examples, interface circuitry 250 includes output circuitry (e.g., a transmitter 260 configured to send communication signals over a communication network) and input circuitry (e.g., a receiver 270 configured to receive communication signals over a communication network).

[0072] In some examples, the software program 240 is stored on a non-transitory computer-readable medium. When the software program 240 runs on the computing device 200, it causes the computing device 200 to perform the functions described above for capturing images of the test object 300.

[0073] Figure 10 A configuration of a computing device 700, including functions for controlling image capture, is shown. The computing device 700 is communicatively coupled to an imaging device 100, a position controller 610, and a gas supply 410. The computing device 700 also receives input from pressure sensors 129 and 143. The computing device 700 controls image capture based on input from one or more of these components. In some examples, the computing device 700 communicates with a remote node 790 to send and / or receive data regarding test processing and / or image capture.

[0074] The computing device 700 includes circuitry enabling the performance of various functions. This circuitry includes processing circuitry, memory circuitry, and interface circuitry 250, as described above. Figure 9 As described herein. In some examples, interface circuitry 250 includes (or is communicatively connected to) one or more graphics adapters, display ports, video buses, touchscreens, graphics processing units (GPUs), display ports, liquid crystal displays (LCDs), and light-emitting diode (LED) displays for presenting visual information to a user. In some examples, interface circuitry 250 includes one or more of the following: pointing devices (e.g., mice, styluses, touchpads, trackballs, joysticks), touchscreens, microphones for voice input, optical sensors for optical recognition of gestures, and keyboards for text input.

[0075] In some examples, the imaging device 100 includes a lamp 156 for illuminating the test subject 300. The lamp 156 is aligned with an opening 133 in the housing 130. When a corresponding baffle 140 is moved to the open position, the lamp 156 emits light through the opening 133 onto the test subject 300, enabling the imaging device 100 to capture an image.

[0076] This application involves the following provisions:

[0077] 1. An imaging system for capturing images of a test object during testing, the imaging system comprising:

[0078] A housing, the housing comprising a body extending around an enclosed internal space;

[0079] An opening that extends through the housing and communicates with the interior space;

[0080] A baffle, which is positioned within the interior space, is movable between an open position located away from the opening and a closed position extending across the opening;

[0081] An imaging device, positioned within the internal space and aligned with the opening, is configured to capture an image of the test object when the baffle is in the open position; and

[0082] The opening is unobstructed, and when the baffle is in the open position, the gas in the internal space can be discharged through the opening.

[0083] 2. The imaging system according to Clause 1, wherein the internal space is sealed when the baffle is in the closed position, and the imaging system further includes: an inlet through which gas is introduced into the internal space to increase the pressure within the internal space.

[0084] 3. The imaging system according to Clause 1, wherein the baffle is positioned between the opening and the imaging device.

[0085] 4. The imaging system according to Clause 3, further comprising: a seal extending around the opening, wherein, in the closed position, the baffle abuts against the seal to prevent test material from entering the interior space when the baffle is in the closed position.

[0086] 5. The imaging system according to Clause 1, further comprising: a lamp positioned within the interior space, the lamp being configured to illuminate the test object when the baffle is in the open position.

[0087] 6. The imaging system according to Clause 1, wherein the opening is a first opening and the baffle is a first baffle, the imaging system further includes at least one additional opening extending through the housing and communicating with the interior space, and the imaging system further includes at least one additional baffle movable between an open position away from the at least one additional opening and a closed position extending across the at least one additional opening.

[0088] 7. The imaging system according to Clause 1, further comprising a gas supply unit including a tank and a conduit connected to the housing and in communication with the interior space, wherein the gas supply unit is configured to supply the gas to the interior space.

[0089] 8. The imaging system according to Clause 1, wherein the opening is unobstructed, allowing gas in the interior space to escape through the opening when the baffle is in the open position.

[0090] 9. A method for capturing an image of an object during testing, the method comprising the steps of:

[0091] The imaging device is positioned inside the housing, while the baffle on the housing is in the closed position across the opening in the housing;

[0092] The test is performed on the object, the test comprising: applying test material to the object while the baffle is in the closed position;

[0093] During the test, the baffle is moved to an open position away from the opening;

[0094] During the test, with the baffle in the open position, an image of the object is captured through the opening; and

[0095] During the test and after the image was captured, the baffle was moved to the closed position.

[0096] 10. The method according to Clause 9, wherein the step of moving the baffle to the closed position comprises: positioning the baffle across the opening, and preventing the test material from moving through the opening into the interior of the housing.

[0097] 11. The method according to Clause 9, further comprising the step of pressurizing the interior of the housing with gas.

[0098] 12. The method according to Clause 11, the method further comprising the step of: reducing the pressure inside the housing by allowing gas in the interior of the housing to escape through the opening when the baffle is in the open position.

[0099] 13. The method according to Clause 11, the method further comprising the step of maintaining the pressure inside the housing above a predetermined threshold.

[0100] 14. The method according to Clause 11, the method further comprising the step of: preventing the gas inside the housing from escaping through the opening by positioning the baffle across the opening in the closed position.

[0101] 15. The method according to Clause 9, further comprising the step of: moving the housing and the imaging device relative to the object during the test.

[0102] 16. A method for capturing images of objects in a test environment, the method comprising the steps of:

[0103] Position the imaging device within the internal space of the housing;

[0104] The internal space of the housing is pressurized with gas;

[0105] When the baffle in the internal space seals the opening in the housing, the baffle is moved from the closed position to the open position;

[0106] When the baffle is in the open position, an image of the object is captured through the opening, while the gas escapes from the interior space through the opening; and

[0107] After the image is captured, the baffle is moved to the closed position.

[0108] 17. The method according to Clause 16, further comprising the step of: introducing the gas into the interior space when the baffle is in the open position.

[0109] 18. The method according to Clause 16, further comprising the step of:

[0110] When the baffle is in the open position, the pressure within the internal space is monitored; and

[0111] When the pressure drops below a predetermined level, the baffle is moved from the open position to the closed position.

[0112] 19. The method according to Clause 16, wherein the step of moving the baffle between the closed position and the open position includes: rotating the baffle.

[0113] 20. The method according to Clause 16, the method further comprising the step of: maintaining pressure within the interior space.

[0114] For ease of description, spatial relative terms such as "below," "below," "lower part," "above," and "upper part" are used to explain the positioning of one element relative to a second element. These terms are intended to cover different orientations of the device, except for orientations different from those depicted in the accompanying drawings. Furthermore, terms such as "first" and "second" are also used to describe various elements, areas, sections, etc., and are not intended to be limiting. Throughout the description, the same terms refer to the same element.

[0115] Of course, this disclosure may be practiced in ways other than those specifically set forth herein without departing from its essential characteristics. These embodiments are to be considered illustrative in all respects and not restrictive, and all variations falling within the meaning and scope of the appended claims are intended to be included therein.

Claims

1. An imaging system for capturing images of a test object during testing, the imaging system comprising: A housing, the housing comprising a body extending around an enclosed internal space; An opening that extends through the housing and communicates with the interior space; A baffle, which is positioned within the interior space, is movable between an open position located away from the opening and a closed position extending across the opening; An imaging device is positioned within the internal space and aligned with the opening, and is configured to capture an image of the test object when the baffle is in the open position. and The opening is unobstructed, and when the baffle is in the open position, the gas in the internal space can be discharged through the opening.

2. The imaging system of claim 1, wherein, When the baffle is in the closed position, the internal space is sealed, and the imaging system further includes an inlet through which gas is introduced into the internal space to increase the pressure within the internal space.

3. The imaging system of claim 1, wherein, The baffle is positioned between the opening and the imaging device.

4. The imaging system of claim 3, further comprising: A seal extending around the opening, wherein, in the closed position, the baffle abuts against the seal to prevent test material from entering the interior space when the baffle is in the closed position.

5. The imaging system of claim 1, further comprising: A lamp, positioned within the internal space, is configured to illuminate the test object when the baffle is in the open position.

6. The imaging system of claim 1, wherein, The opening is a first opening, and the baffle is a first baffle. The imaging system also includes at least one additional opening that extends through the housing and communicates with the interior space. The imaging system also includes at least one additional baffle that is movable between an open position away from the at least one additional opening and a closed position extending across the at least one additional opening.

7. The imaging system of claim 1, further comprising a gas supply comprising a reservoir and a conduit, the conduit being connected to the housing and in communication with the interior space, wherein, The gas supply is configured to supply the gas to the interior space.

8. The imaging system of claim 1, wherein, The opening is unobstructed, allowing gas in the interior space to escape through the opening when the baffle is in the open position.

9. A method for capturing an image of an object during testing, the method comprising the steps of: The imaging device is positioned inside the housing, while the baffle on the housing is in the closed position across the opening in the housing; The test is performed on the object, the test comprising: applying test material to the object while the baffle is in the closed position; During the test, the baffle is moved to an open position away from the opening; During the test, with the baffle in the open position, an image of the object is captured through the opening; and During the test and after the image was captured, the baffle was moved to the closed position.

10. A method for capturing images of objects in a test environment, the method comprising the following steps: Position the imaging device within the internal space of the housing; The internal space of the housing is pressurized with gas; When the baffle in the internal space seals the opening in the housing, the baffle is moved from the closed position to the open position; When the baffle is in the open position, an image of the object is captured through the opening, while the gas escapes from the interior space through the opening. as well as After the image is captured, the baffle is moved to the closed position.

Images