Method and device for generating multi-wave position pattern, storage medium and electronic equipment

Abstract

The application discloses a kind of generation method, device, storage medium and electronic equipment of multi-wave position pattern, wherein, the method comprises: determining the first sampling signal obtained by sampling equipment to target antenna emission m frequency points n wave position;Determine the position variation of the first position of mobile device relative to the second position, wherein, the first position is the position of mobile device when sampling equipment completes the collection of the nth wave position of the mth frequency point, and the second position is the position of mobile device when sampling equipment collects the first wave position of the first frequency point;Correct the first sampling signal based on position variation, to obtain correction signal;Based on correction signal, generate the multi-wave position pattern of target antenna. Through the present application, the problem of inaccurate multi-wave position pattern generated in the related art is solved, and the accuracy of the generated multi-wave position pattern is improved.

Description

Technical Field

[0001] This application relates to the field of communications, and more specifically, to a method, apparatus, storage medium, and electronic device for generating multi-wavelength pattern. Background Technology

[0002] In related technologies, when testing antennas, such as phased array antennas, the sampling position is accurate when testing the first frequency point and the first wavelet. However, as the mobile device continues to move, the sampling position differs significantly from the initial position when testing the last frequency point and the last wavelet, resulting in inaccurate multi-wavelet radiation patterns of the antenna obtained from the test.

[0003] This indicates that the related technologies suffer from inaccurate multi-wavelength pattern generation.

[0004] There is currently no effective solution to the aforementioned problems in the relevant technologies. Summary of the Invention

[0005] This application provides a method, apparatus, storage medium, and electronic device for generating multi-wavelength radiation patterns, so as to at least solve the technical problem of inaccurate multi-wavelength radiation patterns generated in related technologies.

[0006] According to one aspect of the embodiments of this application, a method for generating a multi-wavelength radiation pattern is provided, comprising: determining a first sampling signal obtained by sampling a sampling device for sampling n waves at m frequency points transmitted by a target antenna; determining a position change amount of a first position relative to a second position, wherein the first position is the position of a mobile device when the sampling device completes sampling the nth wave at the mth frequency point, and the second position is the position of the mobile device when the sampling device collects the first wave at the first frequency point; correcting the first sampling signal based on the position change amount to obtain a corrected signal; and generating a multi-wavelength radiation pattern of the target antenna based on the corrected signal.

[0007] In an exemplary embodiment, correcting the first sampled signal based on the position change to obtain a corrected signal includes: for each first sampled signal, performing the following operations to obtain the corrected signal of the first sampled signal: determining a target wavelength of the first sampled signal; normalizing the target wavelength based on the position change to obtain a normalized wavelength; correcting the original phase of the first sampled signal based on the normalized wavelength to obtain a corrected phase; correcting the original amplitude of the first sampled signal based on the normalized wavelength to obtain a corrected amplitude; correcting the original phase of the first sampled signal to the corrected phase, and correcting the original amplitude of the first sampled signal to the corrected amplitude to obtain the corrected signal.

[0008] In an exemplary embodiment, correcting the original phase of the first sampled signal based on the normalized wavelength to obtain the corrected phase includes: determining a first product of the normalized wavelength and the target degree; determining a first sum of the original phase and the first product; and determining the corrected phase based on the first sum.

[0009] In an exemplary embodiment, determining the corrected phase based on the first sum value includes: performing a target interpolation on the first sum value to obtain the corrected phase.

[0010] In an exemplary embodiment, correcting the original amplitude of the first sampled signal based on the normalized wavelength to obtain a corrected amplitude includes: for any target sampled signal included in the first sampled signal, performing the following operations to obtain the corrected amplitude of the target sampled signal: in response to the target sampled signal being a non-first signal included in the first sampled signal, determining a second sampled signal included in the first sampled signal that is located before and adjacent to the target sampled signal; determining a historical amplitude of the second sampled signal; and correcting the original amplitude based on the normalized wavelength and the historical amplitude to obtain the corrected amplitude.

[0011] In an exemplary embodiment, correcting the original amplitude based on the normalized wavelength and the historical amplitude to obtain the corrected amplitude includes: determining the difference between the historical amplitude and the original amplitude; determining a second product of the difference and the normalized wavelength; determining a second sum of the original amplitude and the second product; and determining the corrected amplitude based on the second sum.

[0012] In one exemplary embodiment, determining the correction magnitude based on the second sum includes: performing a target interpolation on the second sum to obtain the correction magnitude.

[0013] In an exemplary embodiment, generating a multi-wavelength radiation pattern of the target antenna based on the corrected signal includes: generating an initial radiation pattern based on the corrected signal; in response to the first sampling signal being a signal acquired in a first scenario, converting the initial radiation pattern according to a target algorithm to obtain the multi-wavelength radiation pattern, wherein, in the first scenario, the distance from the sampling device to the aperture surface of the target antenna satisfies a preset condition; and in response to the first sampling signal being a signal acquired in a second scenario, determining the initial radiation pattern as the multi-wavelength radiation pattern, wherein the second scenario is a scenario based on a reflector.

[0014] According to another aspect of the embodiments of this application, a multi-wavelength radiation pattern generation apparatus is also provided, comprising: a first determining module, configured to determine a first sampling signal obtained by sampling a sampling device for sampling n waves at m frequency points transmitted by a target antenna; a second determining module, configured to determine a position change amount of a first position relative to a second position, wherein the first position is the position of the mobile device when the sampling device completes the sampling of the nth wave at the mth frequency point, and the second position is the position of the mobile device when the sampling device collects the first wave at the first frequency point; a correction module, configured to correct the first sampling signal based on the position change amount to obtain a corrected signal; and a generation module, configured to generate a multi-wavelength radiation pattern of the target antenna based on the corrected signal.

[0015] According to another aspect of the embodiments of this application, a computer-readable storage medium is also provided, wherein a computer program is stored therein, wherein the computer program is configured to perform the steps in any of the above method embodiments when executed by a processor.

[0016] According to another aspect of the embodiments of this application, a computer program product or computer program is provided, the computer program product or computer program including computer instructions stored in a computer-readable storage medium. A processor of a computer device reads the computer instructions from the computer-readable storage medium, and the processor executes the computer instructions, causing the computer device to perform the steps in any of the method embodiments described above.

[0017] According to another aspect of the embodiments of this application, an electronic device is also provided, including a memory and a processor, wherein the memory stores a computer program, and the processor is configured to perform the steps of any of the above method embodiments through the computer program.

[0018] This application allows for the determination of a first sampling signal obtained by sampling n wavelengths at m frequency points transmitted by a target antenna using a sampling device. It also allows for the determination of the position change of a mobile device at the moment of completing the sampling of the nth wavelength at the mth frequency point relative to its second position at the moment of sampling the first wavelength at the 1st frequency point. The first sampling signal is then corrected based on this position change to obtain a corrected signal, and a multi-wavelength radiation pattern of the target antenna is generated based on the corrected signal. Since the first sampling signal can be corrected based on the position change to offset measurement errors caused by the position change, the inaccuracy of the generated multi-wavelength radiation pattern in related technologies can be solved, thereby improving the accuracy of the generated multi-wavelength radiation pattern. Attached Figure Description

[0019] Figure 1 This is a structural diagram of a test system according to an embodiment of this application;

[0020] Figure 2 This is a flowchart illustrating an optional method for generating a multi-wavelength pattern according to an embodiment of this application.

[0021] Figure 3 This is a schematic diagram illustrating the actual positional differences in multi-frequency point multi-wavelength testing according to an embodiment of this application;

[0022] Figure 4 This is a schematic diagram illustrating the testing principle of a compact field scenario according to an embodiment of this application;

[0023] Figure 5 This is a schematic diagram of the planar near-field testing principle according to an embodiment of this application;

[0024] Figure 6 This is a flowchart of a method for generating a multi-wavelength pattern according to a specific embodiment of this application;

[0025] Figure 7 The phased array antenna far-field radiation pattern is obtained directly without modification according to the embodiments of this application;

[0026] Figure 8 The far-field radiation pattern of the phased array antenna is obtained using modified data according to the embodiments of this application;

[0027] Figure 9 This is a structural block diagram of an optional multi-wavelength pattern generation device according to an embodiment of this application;

[0028] Figure 10 This is a computer system architecture block diagram of an optional electronic device according to an embodiment of this application. Detailed Implementation

[0029] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present application, and not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative effort should fall within the scope of protection of the present application.

[0030] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of this application described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0031] According to one aspect of the embodiments of this application, a method for generating a multi-wavelength radiation pattern is provided. Optionally, in this embodiment, the above-described method for generating a multi-wavelength radiation pattern can be applied, but is not limited to, to applications such as... Figure 1 In the test system shown, such as Figure 1 As shown, the test system includes a sampling device, a target antenna, and a controller. The sampling device may include a probe antenna, the target antenna may be a phased array antenna, and the controller may be a processor. The controller can control the target antenna to transmit signals and control the sampling device to acquire the signals transmitted by the target antenna.

[0032] Taking the method for generating multi-wavelength radiation patterns in this embodiment, executed by a test system, as an example, Figure 2 This is a flowchart illustrating an optional multi-wavelength pattern generation method according to an embodiment of this application, as shown below. Figure 2 As shown, the process of this method may include the following steps:

[0033] Step S202: Determine the first sampled signal obtained by sampling n wave positions at m frequency points emitted by the target antenna of the sampling device;

[0034] In this embodiment, the sampling device can be configured according to the test scenario. The test scenario may include planar near-field, compacted field, spherical near-field, and cylindrical near-field, etc. When the test scenario is a planar near-field, the sampling device can be housed in a mobile device, and the mobile device rotates to drive the sampling device to rotate. The mobile device can be a scanning frame. When the test scenario is a compacted field, the target antenna can be housed in a mobile device, and the mobile device rotates to drive the target antenna to rotate. The mobile device can be a turntable, and the sampling device can be a probe antenna.

[0035] In this embodiment, the target antenna can be a phased array antenna, which can be integrated into equipment such as satellites, ships, and vehicles. A phased array antenna is an antenna array composed of multiple independent radiating elements (such as microstrip patches, dipoles, etc.) arranged according to certain rules. Based on the principle of wave interference, it uses electrical signals to precisely control the phase and amplitude of electromagnetic wave signals emitted or received by each radiating element, thereby forming a directional beam that can move rapidly without mechanical rotation. Phased array antennas use electrical signals to switch beam directions instead of mechanical rotation, allowing the beam to switch within microseconds with almost no inertia, and can simultaneously track a large number of high-speed targets. Phased array antennas have multi-beam capability, allowing an array to generate multiple independent beams simultaneously to perform different tasks, such as searching, tracking, and communicating simultaneously. Based on the principle of wave interference, phased array antennas can perform flexible beamforming, not only controlling the direction but also arbitrarily changing the beam shape; for example, widening or narrowing the beam, or creating a zero depth in the direction of interference. The rapid switching gives the phased array antenna excellent stealth and anti-interference capabilities, making the signal difficult to capture and enabling it to adaptively combat interference.

[0036] The performance of a phased array antenna is the result of the coordinated operation of hundreds or thousands of channels (T / R components, phase shifters, feed networks, etc.). Theoretical models and simulation software have inherent limitations:

[0037] Manufacturing tolerances: There are slight inconsistencies in the amplitude and phase characteristics of each element and each T / R component.

[0038] Mutual coupling effect: The mutual interference of electromagnetic fields between array elements can significantly change their performance in isolated state.

[0039] Thermal effects and nonlinearity: When operating at high power, the chip heats up, causing amplitude and phase parameters to drift and producing nonlinear distortion.

[0040] Integration and assembly errors: Unpredictable errors can be introduced during processes such as wiring, welding, and lamination.

[0041] Therefore, the actual performance of the entire antenna system must be calibrated and verified through actual measurements. A multi-wavelength radiation pattern is a graph showing how the relative field strength (normalized modulus) of the radiated field changes with direction at a certain distance from the antenna. Therefore, radiation pattern testing is an intuitive and comprehensive method for testing the performance of phased array antennas.

[0042] The test parameters for phased array antennas include key parameters such as gain, gain drop, beam pointing accuracy, sidelobe level, null depth, and beamwidth.

[0043] The radiation pattern of a phased array antenna can be tested using far-field, compact field, planar near-field, spherical near-field, and cylindrical near-field methods.

[0044] In this embodiment, multiple sampling positions can be preset. The sampling device can sample the n wave positions of m frequency points emitted by the target antenna at each sampling position to obtain the sampled signal. Here, m and n are both positive integers. The values ​​of m and n can be predetermined according to the test scenario.

[0045] Step S204: Determine the position change of the first position of the sampling device relative to the second position, wherein the first position is the position where the sampling device is located when it has completed the acquisition of the nth wavelet of the mth frequency point, and the second position is the position where the sampling device is located when it has acquired the first wavelet of the 1st frequency point;

[0046] In this embodiment, a schematic diagram illustrating the actual location differences in multi-frequency, multi-wavelength testing can be found in the attached diagram. Figure 3 For a compact field, if the turntable speed is 0.5 degrees per second during the test, and the time to test one frequency point and one waveform is 3 milliseconds, then taking 9 frequency points and 13 waveforms as an example, the angle difference between the final waveform of the last frequency point and the first waveform of the first frequency point is 0.1755 degrees. For a planar near field, if the scanning gantry speed is 20 millimeters per second during the test, and the time to test one frequency point and one waveform is 3 millimeters, then taking 9 frequency points and 13 waveforms as an example, the angle difference between the final waveform of the last frequency point and the first waveform of the first frequency point is 7.02 millimeters.

[0047] In such cases, the frequency positions tested later will show significant errors in gain and sidelobes. The design gain difference for a phased array antenna at different positions of the same frequency is within 5dB, but with positional errors, the measured gain difference can approach 10dB. Even small errors in antenna gain (especially for satellite antennas) can be greatly amplified over transmission distances of tens of thousands of kilometers, directly affecting the signal-to-noise ratio and transmission capacity. Gain error has a significant impact and is primarily caused by positional errors; therefore, it is necessary to address the pattern testing errors, including gain errors, caused by test positional errors.

[0048] Therefore, the positional change of the sampling device when acquiring the nth wave position of the mth frequency point can be determined relative to the second position when acquiring the first wave position of the 1st frequency point. The unit of positional change can be degrees. That is, the angle of rotation of the first position relative to the second position is determined, and this angle is defined as the positional change.

[0049] In this embodiment, the moving speed V of the sampling device and the time interval T between two adjacent samples can be determined. The position change is then determined based on the moving speed, time interval T, number of frequency points, and number of wave positions. The position change Lmn can be expressed as V. T m n.

[0050] Step S206: Correct the first sampled signal based on the position change to obtain a corrected signal;

[0051] In this embodiment, the phase and amplitude of the first sampled signal can be corrected according to the position change to obtain the corrected signal.

[0052] Step S208: Generate a multi-wavelength pattern of the target antenna based on the corrected signal.

[0053] In this embodiment, the sampling signals collected by the acquisition device at each sampling location can be acquired, and the sampling signals can be corrected according to the same steps to obtain corrected signals. A multi-wavelength pattern is generated based on the corrected signals corresponding to each sampling location.

[0054] In the above embodiments, the above steps can be applied to scenarios where a target antenna is tested in a compact field. A schematic diagram of the compact field scenario testing principle can be found in the appendix. Figure 4 Compact Antenna Test Range (CATR) technology offers an efficient, accurate, and reproducible indoor solution. This technology utilizes a precisely designed single- or dual-reflector quasi-plane wave system (commonly such as offset parabolic, hyperboloid, or bi-cylindrical reflectors) to collimate and transform the spherical or cylindrical waves radiated from the feed source within a finite distance. This results in a quasi-plane wave with highly uniform amplitude and phase distribution and wavefront distortion below λ / 20 rms within the quiet zone, thus constructing near-ideal free-space far-field test conditions within a compact space (typically only a few meters to tens of meters). Compact antenna test range systems are widely used for measuring antenna radiation performance, radar cross section (RCS), and system-level RF characteristics, offering significant advantages such as fully enclosed electromagnetic shielding, controllable environment, support for wideband frequency sweeping, multi-polarization, and MIMO OTA testing. Far-field testing methods are similar, differing only in that they directly achieve the far field by increasing the distance, often requiring a greater test distance.

[0055] In the above embodiments, the above steps can also be applied to the scenario of planar near-field testing of target antennas. A schematic diagram of the planar near-field testing principle can be found in the appendix. Figure 5The principle of planar near-field testing is to scan and collect complex field data (including amplitude and phase distribution) of the near-field radiation field on a plane 3 to 5 times the wavelength of the aperture surface of the antenna under test using a high-density grid (typically with a sampling interval of λ / 2 to λ / 4). Then, the radiation parameters such as the antenna's far-field pattern, gain, and sidelobe levels are calculated using near-field to far-field transformation algorithms (such as FFT-based transformation or spherical wave expansion) based on rigorous electromagnetic integral equations or planar wave spectrum expansion theory. Spherical and cylindrical near-field testing methods are similar, the only difference being that the scanning surface is a sphere and a cylinder, respectively.

[0056] The testing processes for compact field and planar near field are similar. The main difference is that in compact field testing, a turntable rotates the phased array antenna, while in planar near field testing, a scanning rig scans the probe antenna. The specific process is as follows:

[0057] 1) After the turntable / scanner reaches a sampling position, the turntable controller sends a trigger pulse signal.

[0058] 2) The beam synchronization controller receives the pulse signal sent by the turntable and sends control commands to the phased array antenna via serial communication. After the phased array antenna turntable switching is completed, the beam synchronization controller sends a pulse signal to the vector network analyzer for sampling, thus completing the first frequency point wavelet 1 test; then another wavelet test is performed until all wavelet tests of the first frequency point are completed; with a phased array antenna switching time of 1 mm, the test system typically completes one wavelet test for one frequency point in about 3 milliseconds.

[0059] 3) The test system then begins testing all waveforms at the next frequency point until all waveforms at all frequencies have been tested. During this process, the turntable / scanning rig remains in motion.

[0060] 4) After that, the turntable / scanning gantry moves to the next sampling position and the above test process is repeated until all sampling positions are tested.

[0061] This application allows for the determination of a first sampling signal obtained by sampling n waveforms at m frequency points transmitted by a target antenna at a first sampling position. It also allows for the determination of the position change of the sampling device at its first position after acquiring the nth waveform at the mth frequency point relative to its second position when acquiring the first waveform at the first frequency point. The first sampling signal is then corrected based on this position change to obtain a corrected signal, and a multi-wavelength radiation pattern of the target antenna is generated based on the corrected signal. Since the first sampling signal can be corrected based on the position change to offset measurement errors caused by the position change, the inaccuracy of the generated multi-wavelength radiation pattern in related technologies can be solved, thereby improving the accuracy of the generated multi-wavelength radiation pattern.

[0062] In an exemplary embodiment, correcting the first sampled signal based on the position change to obtain a corrected signal includes: for each first sampled signal, performing the following operations to obtain the corrected signal: determining the target wavelength of the first sampled signal; normalizing the target wavelength based on the position change to obtain a normalized wavelength; correcting the original phase of the first sampled signal based on the normalized wavelength to obtain a corrected phase; correcting the original amplitude of the first sampled signal based on the normalized wavelength to obtain a corrected amplitude; correcting the original phase of the first sampled signal to the corrected phase, and correcting the original amplitude of the first sampled signal to the corrected amplitude to obtain the corrected signal. In this embodiment, the wavelength of the tested frequency point can be normalized by the position change of the sampling device when the nth wavelength test at the mth frequency point is completed; the wavelength of the tested frequency point, i.e., the target wavelength, is λ, and the normalized wavelength can be expressed as Lmn / λ. Here, Lmn represents the position change. After obtaining the normalized wavelength, the original amplitude and original phase of the first sampled signal can be corrected according to the normalized wavelength to obtain the corrected signal.

[0063] In an exemplary embodiment, correcting the original phase of the first sampled signal based on the normalized wavelength to obtain the corrected phase includes: determining a first product of the normalized wavelength and the target degree; determining a first sum of the original phase and the first product; and determining the corrected phase based on the first sum. In this embodiment, the original phase can be represented as P0, and the first sum can be represented as P0+360. Lmn / λ degrees. Where the target degree is 360°. After determining the first sum, the first sum can be used as the corrected phase, and interpolation can also be performed on the first sum to obtain the corrected phase.

[0064] In one exemplary embodiment, determining the corrected phase based on the first sum includes performing a target interpolation on the first sum to obtain the corrected phase. In this embodiment, the target interpolation may be Cauchy interpolation.

[0065] In an exemplary embodiment, correcting the original amplitude of the first sampled signal based on the normalized wavelength to obtain the corrected amplitude includes: for any target sampled signal included in the first sampled signal, performing the following operations to obtain the corrected amplitude of the target sampled signal: in response to the target sampled signal being a non-first signal included in the first sampled signal, determining a second sampled signal included in the first sampled signal that is located before and adjacent to the target sampled signal; determining the historical amplitude of the second sampled signal; and correcting the original amplitude based on the normalized wavelength and the historical amplitude to obtain the corrected amplitude. In this embodiment, the amplitude test result of the nth wave position at the mth frequency point can be linearly corrected based on the amplitude test results of the same wave position before and after the same frequency point. The target sampled signal can be the jth wave position at the ith frequency point, 1≤i≤m, 1≤j≤n, i traversing from 1 to m, and j traversing from 1 to n. When i=1 and j=1, the original amplitude can be directly determined as the corrected amplitude. When i≠1 and j≠1, the previous sampled signal corresponding to the j-th wavelength of the i-th frequency point can be determined, i.e., the historical amplitude of the second sampled signal. The original amplitude is then corrected based on the historical amplitude and the normalized wavelength. When i≠1 and j=1, the second sampled signal is the n-th signal of the (i-1)-th frequency point. When i≠1 and j≠1, the second sampled signal can be the (i-1)-th signal of the (j-1)-th frequency point.

[0066] In this embodiment, the method for determining the historical amplitude of the second sampled signal is the same as the method for determining the original amplitude of the target sampled signal, and will not be repeated here.

[0067] In an exemplary embodiment, correcting the original amplitude based on the normalized wavelength and the historical amplitude to obtain the corrected amplitude includes: determining the difference between the historical amplitude and the original amplitude; determining a second product of the difference and the normalized wavelength; determining a second sum of the original amplitude and the second product; and determining the corrected amplitude based on the second sum. In this embodiment, the original amplitude can be represented as A1, the historical amplitude can be represented as A0, and the second sum can be represented as A1 + (A0 - A1). Lmn / λ, where Lmn / λ represents the normalized wavelength. After determining the second sum, it can be used as the correction amplitude. Alternatively, the second sum can be interpolated to obtain the correction amplitude.

[0068] In one exemplary embodiment, determining the correction amplitude based on the second sum includes: performing target interpolation on the second sum to obtain the correction amplitude. In this embodiment, Cauchy interpolation can be used on the second sum, and the value obtained after Cauchy interpolation can be determined as the correction amplitude.

[0069] In an exemplary embodiment, generating a multi-wavelength radiation pattern of the target antenna based on the corrected signal includes: generating an initial radiation pattern based on the corrected signal; in response to the first sampling signal being a signal acquired in a first scenario, transforming the initial radiation pattern according to a target algorithm to obtain the multi-wavelength radiation pattern, wherein, in the first scenario, the distance from the sampling device to the aperture surface of the target antenna satisfies a preset condition; and in response to the first sampling signal being a signal acquired in a second scenario, determining the initial radiation pattern as the multi-wavelength radiation pattern, wherein the second scenario is a scenario constructed based on a reflector. In this embodiment, the first scenario can be a planar near-field, and the preset condition can be that the distance from the sampling device to the aperture surface of the target antenna is a preset multiple of the wavelength of the signal emitted by the target antenna. The preset multiple can be between 3 and 5 times. The target algorithm can include near-field to far-field transformation algorithms based on electromagnetic integral equations and planar wave spectrum expansion theory. The first scenario can also be a spherical near-field or a cylindrical near-field.

[0070] In this embodiment, in the first scenario, complex field data (including amplitude and phase distribution) of the near-field radiation field can be collected by scanning with a high-density grid (typically with a sampling interval of λ / 2 to λ / 4), i.e., the first sampled signal. The first sampled signal is then corrected to obtain a corrected signal, and an initial radiation pattern is generated based on the corrected signal. Then, the far-field radiation pattern, gain, and sidelobe levels of the antenna are calculated by a near-field to far-field transformation algorithm (such as FFT-based transformation or spherical wave expansion) based on the rigorous electromagnetic integral equation or plane wave spectrum expansion theory, resulting in a multi-wavelength radiation pattern.

[0071] In this embodiment, the second scenario can be a compact field, and in the second scenario, the initial radiation pattern can be directly determined as a multi-wavelength radiation pattern.

[0072] The following section, using a specific implementation method and taking the test scenario as an example, explains the method for generating multi-wavelength radiation patterns.

[0073] Figure 6 This is a flowchart of a method for generating multi-wavelength radiation patterns according to a specific embodiment of this application, such as... Figure 6 As shown, the process includes:

[0074] Step S602: Install the phased array antenna under test (corresponding to the target antenna mentioned above) onto the turntable and connect the instrumentation equipment; install the adaptive beam controller.

[0075] Set up the phased array antenna on the turntable, connect all the instruments and equipment, and align the phased array antenna under test with the probe antenna.

[0076] Step S604: The host computer sets and sends parameters to the relevant devices.

[0077] The host computer sets the instrument's intermediate frequency (1KHz) and the scanning frame's movement range, with a speed of 20 mm / s. It also sets the test polarization mode, sets the test to 9 frequency points from 27.5GHz to 28.3GHz, with 13 waveforms for each frequency point, generates test tables for the corresponding frequency points and waveforms, and sends the test parameters to the relevant equipment.

[0078] In step S606, the scanning frame moves continuously and sends a trigger signal when it reaches the sampling position.

[0079] The test begins, and the scanning carriage moves continuously. Once the scanning carriage reaches the sampling position, it sends a position trigger signal.

[0080] In step S608, the adaptive beam controller sends a command to the phased array antenna under test to switch it to the first frequency and first wave position of the test.

[0081] After receiving the trigger signal, the beam synchronization controller sends the beam address code to the phased array antenna under test so that the device under test switches to the first position of the first test frequency.

[0082] In step S610, the adaptive beam controller sends pulses to the vector network analyzer to complete one test.

[0083] Based on the previously confirmed time delay, after the beam position is established, the beam synchronization controller sends a pulse signal to the vector network analyzer to start acquiring amplitude and phase data. The time to complete one test, i.e., from the time the beam synchronization controller sends the beam address code to the phased array antenna under test to the time the vector network analyzer completes the test, is 3 milliseconds. If the scanning gantry remains in motion during the test, one test is completed, and the position of the probe antenna on the scanning gantry changes by 0.06 mm.

[0084] Step S612: Repeat steps S608-S610 to complete the testing of all waveforms at this frequency point.

[0085] After the data acquisition is completed, repeat steps S608-S610 to complete the test of all 13 waveforms at the same frequency point.

[0086] Step S614: Repeat steps S608-S612 to complete the testing of all frequency points and wave positions at this sampling location.

[0087] Repeat steps S608-S612 to complete the testing of all 13 waveforms at all 9 frequency points; when the test of the nth waveform at the mth frequency point is completed, the change in the position of the probe antenna on the scanning frame relative to the position after the first test is V. T m n, denoted as Lmn.

[0088] Step S616: The scanning frame moves continuously to complete the testing of all sampling positions.

[0089] After the scanning rig moves to the next sampling position, it sends out a trigger signal again, repeating steps S606-S614 to complete the test of all positions.

[0090] Step S618: Organize the collected data and store it according to frequency and waveform.

[0091] The collected data is processed and stored in different frequency points and different waveforms.

[0092] Step S620: Correct the phase portion of the acquired data according to the distance offset and replace it with interpolation.

[0093] When the test of the nth wavelength at the m-th frequency is completed, the probe antenna position shifts and is normalized to the wavelength of the tested frequency. If the wavelength of the tested frequency is λ, the normalization result is Lmn / λ. Furthermore, the test result is phase corrected; if the original phase test result is P0, the corrected phase is P0+360. Lmn / λ degrees. For the 13th wave position at the 9th frequency point, the phase correction value is 239.7 degrees, which is replaced with 238.6 degrees after Cauchy interpolation. This ensures that the corresponding positions of the test results for multiple frequency points and multiple wave positions are consistent.

[0094] Step S622: Correct the amplitude portion of the collected data according to the distance offset and replace it with interpolation.

[0095] For the amplitude test result of the m-th frequency point and the n-th position, a linear correction is performed based on the amplitude test results of the same frequency point and the same position before and after it. The amplitude test result of the previous position is denoted as A0, and the amplitude test result of the current position is denoted as A1; then the correction value is A1 + (A0 - A1). Lmn / λ was then used, and Cauchy interpolation was used to replace the correction value. For the 13th wave position at the 9th frequency point, the amplitude correction value was 1.5dB, which was replaced by 1.3dB after Cauchy interpolation.

[0096] Step S624: Obtain the phased array far-field antenna radiation pattern using the corrected data.

[0097] For the planar near field, the corrected result is used to perform near-far field conversion to obtain the far field radiation pattern, i.e., the multi-wavelength radiation pattern; if it is a compressed field, the compensation value is directly used as the final result to obtain the far field radiation pattern.

[0098] If the raw data is used without correction, the far-field radiation pattern of the phased array antenna can be obtained directly from the appendix. Figure 7 ,like Figure 7As shown, in the normalized radiation pattern of each wave position at the last frequency point 28.3 GHz, located at... Figure 7 The leftmost image shows the radiation pattern of the last wave position, where its gain differs from the maximum gain by approximately 9 dB. The far-field radiation pattern of the phased array antenna obtained using the corrected data can be found in the appendix. Figure 8 ,like Figure 8 As shown, in the normalized radiation pattern of each wave position at the last frequency point 28.3 GHz, located at... Figure 8 The leftmost one is the radiation pattern of the last wave position, and you can see that its gain is less than 5dB different from the maximum gain.

[0099] In the aforementioned embodiments, considering actual position errors, an algorithm is used to correct the phase and amplitude of the test results, followed by Cauchy interpolation and substitution; this ensures the accuracy of the gain and other parameters of the test pattern in multi-frequency, multi-wavelength phased array antennas. This meets the stringent requirements of satellite communication link budgets for gain accuracy. Furthermore, the test results can be presented at the same location, reducing the time required for near-field to far-field conversion. Compared to techniques using position correction, this application achieves consistent corresponding positions for multi-frequency, multi-wavelength test results, or fast near-field to far-field conversion, avoiding slow conversion speeds due to inconsistent test results at different locations.

[0100] It should be noted that, for the sake of simplicity, the foregoing method embodiments are all described as a series of actions. However, those skilled in the art should understand that this application is not limited to the described order of actions, as some steps may be performed in other orders or simultaneously according to this application. Furthermore, those skilled in the art should also understand that the embodiments described in the specification are preferred embodiments, and the actions and modules involved are not necessarily essential to this application.

[0101] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods according to the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium (such as read-only memory (ROM) / random access memory (RAM), magnetic disk, optical disk), and includes several instructions to cause a terminal device (which may be a mobile phone, computer, server, or network device, etc.) to execute the methods described in the various embodiments of this application.

[0102] According to another aspect of the embodiments of this application, a multi-wavelength pattern generation apparatus is also provided. This apparatus can be used to implement the multi-wavelength pattern generation method provided in the above embodiments, and will not be repeated hereafter. As used below, the term "module" can refer to a combination of software and / or hardware that implements a predetermined function. Although the apparatus described in the following embodiments is preferably implemented in software, hardware implementation, or a combination of software and hardware, is also possible and contemplated.

[0103] Figure 9 This is a structural block diagram of an optional multi-wavelength pattern generation device according to an embodiment of this application, such as... Figure 9 As shown, the apparatus for generating the multi-wavelength pattern includes:

[0104] The first determining module 92 is used to determine the first sampling signal obtained by the sampling device sampling n wave positions at m frequency points transmitted by the target antenna;

[0105] The second determining module 94 is used to determine the position change of the first position of the mobile device relative to the second position, wherein the first position is the position of the mobile device when the sampling device completes the acquisition of the nth wave position of the mth frequency point, and the second position is the position of the mobile device when the sampling device acquires the first wave position of the 1st frequency point;

[0106] Correction module 96 is used to correct the first sampled signal based on the position change to obtain a corrected signal;

[0107] The generation module 98 is used to generate a multi-wavelength pattern of the target antenna based on the corrected signal.

[0108] In an exemplary embodiment, the correction module 96 can correct the first sampled signal based on the position change amount to obtain a corrected signal in the following manner: for each first sampled signal, the following operations are performed to obtain the corrected signal of the first sampled signal: determining the target wavelength of the first sampled signal; normalizing the target wavelength based on the position change amount to obtain a normalized wavelength; correcting the original phase of the first sampled signal based on the normalized wavelength to obtain a corrected phase; correcting the original amplitude of the first sampled signal based on the normalized wavelength to obtain a corrected amplitude; correcting the original phase of the first sampled signal to the corrected phase, and correcting the original amplitude of the first sampled signal to the corrected amplitude to obtain the corrected signal.

[0109] In an exemplary embodiment, the correction module 96 can correct the original phase of the first sampled signal based on the normalized wavelength to obtain the corrected phase by: determining a first product of the normalized wavelength and the target degree; determining a first sum of the original phase and the first product; and determining the corrected phase based on the first sum.

[0110] In an exemplary embodiment, the correction module 96 can determine the correction phase based on the first sum by performing a target interpolation on the first sum to obtain the correction phase.

[0111] In an exemplary embodiment, the correction module 96 can correct the original amplitude of the first sampled signal based on the normalized wavelength to obtain a corrected amplitude by performing the following operations for any target sampled signal included in the first sampled signal: in response to the target sampled signal being a non-first signal included in the first sampled signal, determining a second sampled signal included in the first sampled signal that is located before and adjacent to the target sampled signal; determining the historical amplitude of the second sampled signal; and correcting the original amplitude based on the normalized wavelength and the historical amplitude to obtain the corrected amplitude.

[0112] In an exemplary embodiment, the correction module 96 can correct the original amplitude based on the normalized wavelength and the historical amplitude to obtain the corrected amplitude by: determining the difference between the historical amplitude and the original amplitude; determining a second product of the difference and the normalized wavelength; determining a second sum of the original amplitude and the second product; and determining the corrected amplitude based on the second sum.

[0113] In an exemplary embodiment, the correction module 96 can determine the correction magnitude based on the second sum by performing a target interpolation on the second sum to obtain the correction magnitude.

[0114] In an exemplary embodiment, the generation module 98 can generate a multi-wavelength radiation pattern of the target antenna based on the corrected signal in the following manner: generating an initial radiation pattern based on the corrected signal; in response to the first sampling signal being a signal collected in a first scenario, converting the initial radiation pattern according to the target algorithm to obtain the multi-wavelength radiation pattern, wherein, in the first scenario, the distance from the sampling device to the aperture surface of the target antenna satisfies a preset condition; in response to the first sampling signal being a signal collected in a second scenario, determining the initial radiation pattern as the multi-wavelength radiation pattern, wherein the second scenario is a scenario based on a reflector.

[0115] It should be noted that the above modules can be implemented by software or hardware. For the latter, they can be implemented in the following ways, but are not limited to: all the above modules are located in the same processor; or, the above modules are located in different processors in any combination.

[0116] According to another aspect of the embodiments of this application, a computer-readable storage medium is provided, the computer-readable storage medium including a stored program, wherein the program executes the steps in any of the above method embodiments when it is run.

[0117] In one exemplary embodiment, the aforementioned computer-readable storage medium may include, but is not limited to, various media capable of storing computer programs, such as USB flash drives, ROMs, RAMs, portable hard drives, magnetic disks, or optical disks.

[0118] According to another aspect of the embodiments of this application, an electronic device is provided, including a memory, a processor, and a computer program stored in the memory and executable on the processor. The processor is configured to perform the steps of any of the method embodiments described above via the computer program. In an exemplary embodiment, the electronic device may further include a transmission device and an input / output device, wherein the transmission device is connected to the processor, and the input / output device is connected to the processor.

[0119] Specific examples in this embodiment can be found in the examples described in the above embodiments and exemplary implementations, and will not be repeated here.

[0120] According to another aspect of the embodiments of this application, a computer program product is also provided, comprising a computer program / instructions containing program code for performing the methods shown in the flowchart. In such an embodiment, the computer program can be downloaded and installed from a network via communication section 1009, and / or installed from removable medium 1011. When the computer program is executed by central processing unit 1001, it performs various functions provided in the embodiments of this application. The sequence numbers of the embodiments of this application above are merely descriptive and do not represent the superiority or inferiority of the embodiments.

[0121] Figure 10 A schematic block diagram of a computer system architecture for implementing embodiments of the present application is shown. Figure 10As shown, the computer system 1000 includes a Central Processing Unit (CPU) 1001, which performs various appropriate actions and processes based on programs stored in read-only memory (ROM) 1002 or programs loaded from storage section 1008 into random access memory (RAM) 1003. The RAM 1003 also stores various programs and data required for system operation. The CPU 1001, ROM 1002, and RAM 1003 are interconnected via a bus 1004. An input / output (I / O) interface 1005 is also connected to the bus 1004.

[0122] The following components are connected to I / O interface 1005: an input section 1006 including a keyboard, mouse, etc.; an output section 1007 including a cathode ray tube (CRT), liquid crystal display (LCD), etc., and speakers, etc.; a storage section 1008 including a hard disk, etc.; and a communication section 1009 including a network interface card such as a local area network card, modem, etc. The communication section 1009 performs communication processing via a network such as the Internet. Drive 1010 is also connected to I / O interface 1005 as needed. Removable media 1011, such as a disk, optical disk, magneto-optical disk, semiconductor memory, etc., are installed on drive 1010 as needed so that computer programs read from them can be installed into storage section 1008 as needed.

[0123] Specifically, according to embodiments of this application, the processes described in the various method flowcharts can be implemented as computer software programs. For example, embodiments of this application include a computer program product comprising a computer program carried on a computer-readable medium, the computer program containing program code for performing the methods shown in the flowcharts. In such embodiments, the computer program can be downloaded and installed from a network via communication section 1009, and / or installed from removable medium 1011. When the computer program is executed by central processing unit 1001, it performs various functions defined in the system of this application.

[0124] It should be noted that, Figure 10 The computer system 1000 of the electronic device shown is merely an example and should not impose any limitation on the functionality and scope of use of the embodiments of this application.

[0125] Obviously, those skilled in the art should understand that the modules or steps of this application described above can be implemented using general-purpose computing devices. They can be centralized on a single computing device or distributed across a network of multiple computing devices. They can be implemented using computer-executable program code, and thus can be stored in a storage device for execution by a computing device. In some cases, the steps shown or described can be performed in a different order than those described herein, or they can be fabricated as separate integrated circuit modules, or multiple modules or steps can be fabricated as a single integrated circuit module. Thus, this application is not limited to any particular combination of hardware and software.

[0126] The above are merely preferred embodiments of this application and are not intended to limit this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the principles of this application should be included within the protection scope of this application.

Claims

1. A method for generating multi-wavelength radiation patterns, characterized in that, include: Determine the first sampled signal obtained by the sampling device sampling n wave positions at m frequency points emitted by the target antenna; Determine the position change of the mobile device relative to the second position, wherein the first position is the position of the mobile device when the sampling device completes the acquisition of the nth wave position of the mth frequency point, and the second position is the position of the mobile device when the sampling device acquires the first wave position of the 1st frequency point; The first sampled signal is corrected based on the position change to obtain the corrected signal; A multi-wavelength pattern of the target antenna is generated based on the corrected signal; The correction of the first sampled signal based on the position change amount to obtain the corrected signal includes: for each first sampled signal, performing the following operations to obtain the corrected signal of the first sampled signal: determining the target wavelength of the first sampled signal; normalizing the target wavelength based on the position change amount to obtain a normalized wavelength; correcting the original phase of the first sampled signal based on the normalized wavelength to obtain a corrected phase; correcting the original amplitude of the first sampled signal based on the normalized wavelength to obtain a corrected amplitude; correcting the original phase of the first sampled signal to the corrected phase, and correcting the original amplitude of the first sampled signal to the corrected amplitude to obtain the corrected signal.

2. The method according to claim 1, characterized in that, The original phase of the first sampled signal is corrected based on the normalized wavelength to obtain the corrected phase, which includes: Determine the first product of the normalized wavelength and the target degree; Determine the first sum of the original phase and the first product; The corrected phase is determined based on the first sum.

3. The method according to claim 2, characterized in that, Determining the corrected phase based on the first sum includes: The corrected phase is obtained by performing target interpolation on the first sum.

4. The method according to claim 1, characterized in that, The original amplitude of the first sampled signal is corrected based on the normalized wavelength to obtain the corrected amplitude, which includes: For any target sampled signal included in the first sampled signal, the following operations are performed to obtain the corrected amplitude of the target sampled signal: In response to the target sampling signal being a non-first signal included in the first sampling signal, a second sampling signal included in the first sampling signal that is located before the target sampling signal and adjacent to the target sampling signal is determined; Determine the historical amplitude of the second sampled signal; The original amplitude is corrected based on the normalized wavelength and the historical amplitude to obtain the corrected amplitude.

5. The method according to claim 4, characterized in that, The original amplitude is corrected based on the normalized wavelength and the historical amplitude to obtain the corrected amplitude, which includes: Determine the difference between the historical amplitude and the original amplitude; Determine the second product of the difference and the normalized wavelength; Determine the second sum of the product of the original amplitude and the second product; The correction magnitude is determined based on the second sum.

6. The method according to claim 5, characterized in that, Determining the correction magnitude based on the second sum includes: The target interpolation is performed on the second sum to obtain the corrected amplitude.

7. The method according to claim 1, characterized in that, Generating the multi-wavelength radiation pattern of the target antenna based on the corrected signal includes: An initial radiation pattern is generated based on the corrected signal; In response to the first sampling signal being a signal collected in a first scenario, the initial radiation pattern is transformed according to the target algorithm to obtain the multi-wavelength radiation pattern, wherein, in the first scenario, the distance from the sampling device to the aperture surface of the target antenna satisfies a preset condition; In response to the first sampling signal being a signal acquired in a second scenario, the initial radiation pattern is determined as the multi-wavelength radiation pattern, wherein the second scenario is a scenario constructed based on a reflector.

8. A device for generating multi-wavelength radiation patterns, characterized in that, include: The first determining module is used to determine the first sampled signal obtained by the sampling device sampling n wave positions at m frequency points transmitted by the target antenna; The second determining module is used to determine the position change of the first position of the mobile device relative to the second position, wherein the first position is the position of the mobile device when the sampling device completes the acquisition of the nth wavelet of the mth frequency point, and the second position is the position of the mobile device when the sampling device acquires the first wavelet of the 1st frequency point; The correction module is used to correct the first sampled signal based on the position change to obtain a corrected signal; The generation module is used to generate a multi-wavelength pattern of the target antenna based on the correction signal; The correction module corrects the first sampled signal based on the position change amount to obtain a corrected signal in the following manner: For each first sampled signal, the following operations are performed to obtain the corrected signal of the first sampled signal: determining the target wavelength of the first sampled signal; normalizing the target wavelength based on the position change amount to obtain a normalized wavelength; correcting the original phase of the first sampled signal based on the normalized wavelength to obtain a corrected phase; correcting the original amplitude of the first sampled signal based on the normalized wavelength to obtain a corrected amplitude; correcting the original phase of the first sampled signal to the corrected phase, and correcting the original amplitude of the first sampled signal to the corrected amplitude to obtain the corrected signal.

9. A computer program product comprising a computer program / instructions, characterized in that, When the computer program / instructions are executed by the processor, they implement the steps of the method according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program, wherein the computer program, when executed by a processor, implements the steps of the method according to any one of claims 1 to 7.

11. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the computer program, it implements the steps of the method according to any one of claims 1 to 7.

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