Part chamfer placement position automatic generation method, device, equipment and medium

Abstract

This invention relates to the field of mechanical parts processing technology, and discloses an automatic generation method, device, equipment, and medium for chamfer placement positions of parts. The method acquires the chamfer trajectory of the part and establishes a collision avoidance boundary model to meet collision avoidance requirements. Based on the chamfer trajectory and the collision avoidance boundary model, it generates preliminary screening candidate positions for the part placed on a magnet array worktable, improving screening efficiency. It traverses the preliminary screening candidate positions along the X and Y axes and performs fine screening according to preset verification rules to obtain fine screening candidate positions, improving the stability of screening positions. By comparing structures, it prioritizes the fine screening candidate positions, and the highest priority fine screening candidate position is used as the target chamfer placement position, achieving optimal selection of the chamfer position. This method is low-cost, highly stable, and meets the needs of various scenarios such as multi-variety, small-batch production, irregularly shaped parts, and parts with complex chamfer trajectories, demonstrating strong adaptability.

Description

Technical Field

[0001] This invention relates to the technical field of machining of mechanical parts, and in particular to a method, apparatus, equipment and medium for automatically generating chamfer placement positions for parts. Background Technology

[0002] In the field of mechanical parts processing, the core requirements of the grinding process (especially for chamfering grinding) are: the placement of the part must be adapted to the chamfering trajectory, interference between the grinding tool and the fixture / non-grinding area of ​​the part must be avoided, and the part must be clamped stably to ensure the consistency of chamfering dimensional accuracy and surface quality. Existing outdated technologies are mainly divided into two types of specific implementation schemes: dedicated fixture positioning technology and manual positioning technology.

[0003] Specialized fixture positioning technology is designed for the chamfering trajectory of a single model of part. It uses customized mechanical fixtures to define the unique placement position of the part by using positioning pins and limit blocks to ensure that the chamfering area is precisely matched with the grinding tool path. For a large batch of single model parts, it can achieve a chamfering dimensional accuracy of ±0.2-0.5mm.

[0004] Manual positioning technology, without dedicated positioning fixtures, requires operators to visually determine the approximate area of ​​the grinding table based on the chamfering requirements of the parts. This results in large deviations in the placement of parts and inconsistent chamfering dimensions.

[0005] Specialized fixture positioning technology requires custom-made fixtures based on the chamfering trajectory and dimensions of specific parts, resulting in high manufacturing costs and limited application scenarios. Manual positioning technology has low equipment investment costs and does not require customized tooling, but the positioning accuracy depends entirely on human experience, leading to large deviations in part placement (typically 1-3mm), resulting in inconsistent chamfering dimensions, incomplete grinding, or over-grinding. None of these technologies can meet the efficient placement requirements of irregularly shaped parts and parts with complex chamfering trajectories in multi-variety, small-batch production scenarios, which demand "precise matching of chamfering paths, automatic interference avoidance, and no need for specialized tooling."

[0006] In shipbuilding, grinding and chamfering techniques are used to handle the free edges of components. Burrs and sharp angles on these free edges can not only injure personnel or other components but also become the starting point for corrosion (sharp angles easily accumulate water and dirt, accelerating rust). Free edges are not directly defined in shipyard drawings, requiring more intelligent equipment to automatically identify them. Shipyards typically produce small batches of many different parts; a single drawing usually corresponds to a single-digit number of parts. This means that, unlike other industries, there isn't enough time to annotate the drawings; the annotation time may even exceed the actual grinding time.

[0007] Therefore, the question is how to automatically generate the optimal placement position for parts, thereby solving the technical problems of high cost, inability to adapt to various scenarios and irregular parts, and difficulty in meeting the demand for efficient placement of parts with complex chamfered trajectories in existing technologies.

[0008] The above content is only used to help understand the technical solution of the present invention and does not represent an admission that the above content is prior art. Summary of the Invention

[0009] The main objective of this invention is to provide a method, apparatus, device, and medium for automatically generating chamfer placement positions for parts, aiming to solve the technical problems in the prior art, such as high cost of generating chamfer positions for parts, inability to adapt to various scenarios and irregularly shaped parts, and difficulty in meeting the demand for efficient placement of parts with complex chamfer trajectories.

[0010] To achieve the above objectives, the present invention provides a method for automatically generating chamfered placement positions for parts, the method comprising the following steps: Obtain the chamfer trajectory of the part and establish a collision avoidance boundary model; Based on the chamfered trajectory and the collision avoidance boundary model, the initial screening candidate positions for the part placed on the magnet array worktable are generated; The initial candidate positions are traversed along the X-axis and Y-axis, and the initial candidate positions are further screened according to the preset verification rules to obtain the refined candidate positions. The candidate positions for fine screening are prioritized by comparing the structures, and the candidate position with the highest priority is used as the target chamfer placement position.

[0011] Preferably, the initial screening candidate positions for the part placed on the magnet array worktable are generated based on the chamfered trajectory and the collision avoidance boundary model, including: Set a margin for collisions; Calculate the boundary of the magnet array stage based on the wall collision margin and the collision avoidance boundary model; Set the resolution based on the length and width of the part; Based on the boundary of the magnet array stage and the resolution, the initial screening candidate positions for placing the part on the magnet array stage are generated.

[0012] Preferably, generating the initial screening candidate positions for the part placed on the magnet array stage based on the boundary of the magnet array stage and the resolution includes: Based on the boundary of the magnet array worktable and the length and width of the part, set the X-axis traversal variables and the Y-axis traversal variables; Construct two-dimensional coordinate points based on the current X-axis traversal variables and the current Y-axis traversal variables; The current X-axis traversal variable and the current Y-axis traversal variable are respectively superimposed with the resolution to obtain new X-axis traversal variables and new Y-axis traversal variables. The effective processing area of ​​the magnet array worktable is traversed to generate new two-dimensional coordinate points until the traversal is completed, resulting in a set of two-dimensional coordinate points. Based on the collision avoidance boundary model, the set of two-dimensional coordinate points is filtered to generate preliminary candidate positions for the part to be placed on the magnet array worktable.

[0013] Preferably, the initial candidate positions are traversed along the X-axis and Y-axis, and the initial candidate positions are further screened according to a preset verification rule to obtain the refined candidate positions, including: The initial screening candidate positions are traversed along the X-axis direction, and the verification is performed based on the X-axis gripping position and the X-axis part corner boundary. Traverse the initial screening candidate positions along the Y-axis and verify them based on the Y-axis gripping position and the Y-axis part corner boundary; The initial candidate positions that pass all verifications will be used as the fine-screen candidate positions.

[0014] Preferably, the candidate positions for fine screening are prioritized by comparing structures, and the candidate position with the highest priority is used as the target chamfer placement position, including: A constraint model is constructed based on trajectory collision avoidance constraints, adsorption area constraints, adsorption force constraints, and position centrality constraints. Based on the constraint model, the constraint modeling of each magnet on the magnet array workbench is accumulated to obtain the comprehensive evaluation standard of the part at the current position; According to the comprehensive evaluation criteria, the candidate positions for fine screening are prioritized by comparing the structures, and the candidate position with the highest priority is used as the target chamfer placement position.

[0015] Preferably, according to the comprehensive evaluation criteria, the candidate positions for fine screening are prioritized by comparing structures, and the candidate position with the highest priority is used as the target chamfer placement position, including: According to the comprehensive evaluation criteria, the pairwise comparison and sorting of all data corresponding to the candidate positions of the fine screening are completed in the order of priority of adsorption area, chamfer trajectory collision avoidance area, adsorption force, and positional centrality. The candidate position with the highest priority is taken as the target chamfer placement position.

[0016] Preferably, a collision avoidance boundary model is established, including: Obtain the robot's motion limit range and the coordinates of the magnet array platform boundary; A collision avoidance boundary model is established based on the robot's motion limit range and the boundary coordinates of the magnet array platform.

[0017] Furthermore, to achieve the above objectives, the present invention also proposes an automatic chamfering placement position generation device for parts, the automatic chamfering placement position generation device comprising: The acquisition module is used to acquire the chamfer trajectory of the part and build a collision avoidance boundary model; The generation module is used to generate the initial screening candidate positions of the part placed on the magnet array worktable based on the chamfer trajectory and the collision avoidance boundary model. The filtering module is used to traverse the initial candidate positions along the X-axis and Y-axis, and to perform fine filtering on the initial candidate positions according to the preset verification rules to obtain the fine candidate positions. The sorting module is used to prioritize the candidate positions of the fine screening by comparing structures, and the candidate position with the highest priority is used as the target bevel placement position.

[0018] Furthermore, to achieve the above objectives, the present invention also proposes an automatic part chamfering placement position generation device, which includes a memory, a processor, and an automatic part chamfering placement position generation program stored in the memory and executable on the processor. The automatic part chamfering placement position generation program is configured to implement the steps of the automatic part chamfering placement position generation method described above.

[0019] In addition, to achieve the above objectives, the present invention also proposes a storage medium storing an automatic part chamfering placement position generation program, wherein when the part chamfering placement position generation program is executed by a processor, the steps of the automatic part chamfering placement position generation method described above are implemented.

[0020] In this invention, by acquiring the chamfer trajectory of the part and establishing a collision avoidance boundary model, collision avoidance requirements can be met. Based on the chamfer trajectory and the collision avoidance boundary model, a preliminary screening candidate position for the part placed on the magnet array worktable is generated, improving screening efficiency. The preliminary screening candidate positions are traversed along the X-axis and Y-axis directions, and the preliminary screening candidate positions are finely screened according to preset verification rules to obtain fine screening candidate positions, improving the stability of the screening position. The fine screening candidate positions are prioritized by comparing structures, and the fine screening candidate position with the highest priority is used as the target chamfer placement position, achieving the optimal selection of the chamfer position. This method is low-cost, highly stable, and meets the needs of various scenarios such as multi-variety, small-batch production, irregularly shaped parts, and parts with complex chamfer trajectories, demonstrating strong adaptability. Attached Figure Description

[0021] Figure 1 This is a schematic diagram of the structure of the automatic generation device for chamfering placement of parts in the hardware operating environment involved in the embodiments of the present invention; Figure 2This is a flowchart illustrating the first embodiment of the method for automatically generating chamfer placement positions for parts according to the present invention; Figure 3 This is a schematic diagram of a part in an embodiment of the automatic generation method for chamfer placement position of parts according to the present invention; Figure 4 This is a schematic diagram of the chamfer trajectory generated on the part drawing in an embodiment of the automatic generation method for chamfer placement position of the present invention; Figure 5 This is a schematic diagram of a chamfering worktable composed of a magnet array in an embodiment of the automatic generation method for chamfering placement positions of parts according to the present invention; Figure 6 This is a schematic diagram of the collision avoidance boundary in an embodiment of the automatic generation method for chamfering placement position of parts according to the present invention; Figure 7 This is a schematic diagram of the target chamfer placement position in an embodiment of the automatic generation method for chamfer placement position of parts according to the present invention; Figure 8 This is a structural block diagram of the first embodiment of the automatic part chamfering placement position generation device of the present invention; The realization of the objective, functional features and advantages of the present invention will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0022] It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.

[0023] Reference Figure 1 , Figure 1 This is a schematic diagram of the automatic generation device structure for the chamfering placement of parts in the hardware operating environment involved in the embodiments of the present invention.

[0024] like Figure 1As shown, the automatic part chamfering placement generation device may include: a processor 1001, such as a central processing unit (CPU), a communication bus 1002, a user interface 1003, a network interface 1004, and a memory 1005. The communication bus 1002 is used to enable communication between these components. The user interface 1003 may include a display screen, and optionally, it may also include a standard wired interface or a wireless interface. In this invention, the wired interface of the user interface 1003 may be a USB interface. The network interface 1004 may optionally include a standard wired interface or a wireless interface (such as a Wi-Fi interface). The memory 1005 may be a high-speed random access memory (RAM) or a non-volatile memory (NVM), such as a disk storage device. The memory 1005 may also optionally be a storage device independent of the aforementioned processor 1001.

[0025] Those skilled in the art will understand that Figure 1 The structure shown does not constitute a limitation on the automatic generation device for chamfering placement of parts, and may include more or fewer parts than shown, or combine certain parts, or have different part arrangements.

[0026] like Figure 1 As shown, the memory 1005, which serves as a computer storage medium, may include an operating system, a network communication module, a user interface module, and an automatic generation program for chamfering placement positions of parts.

[0027] exist Figure 1 In the automatic part chamfering placement position generation device shown, the network interface 1004 is mainly used to connect to the backend server and communicate with the backend server; the user interface 1003 is mainly used to connect to the user equipment; the automatic part chamfering placement position generation device calls the automatic part chamfering placement position generation program stored in the memory 1005 through the processor 1001 and executes the automatic part chamfering placement position generation method provided in the embodiment of the present invention.

[0028] Based on the above hardware structure, an embodiment of the automatic generation method for chamfering placement position of parts according to the present invention is proposed.

[0029] Reference Figure 2 The first embodiment of the method for automatically generating chamfer placement positions of parts according to the present invention is proposed.

[0030] In the first embodiment, the method for automatically generating the chamfer placement position of the part includes the following steps: Step S10: Obtain the chamfer trajectory of the part and establish a collision avoidance boundary model.

[0031] It should be noted that the execution subject of this embodiment is the automatic part chamfering placement position generation device. This device can be an electronic device such as a personal computer or server; this embodiment does not impose any limitations on it. First, data acquisition is performed by parsing part drawings, such as 2D drawings (DXF), 3D drawings (STEP), and text drawings (Gen), to obtain a standardized 2D model of the part. The coordinates of feature points on the part's outline (including the XYZ coordinates of key structures such as outer edges, grooves, and protrusions), the centroid coordinates, and geometric dimension parameters (length and width) are automatically extracted. Based on the AABB bounding box, the center of gravity of the part is calculated. Figure 3 This is a schematic diagram of the part.

[0032] Furthermore, in this embodiment, obtaining the chamfer trajectory of the part includes: The part drawing is analyzed to obtain the feature points of the part's outline. Calculate the center of the part based on the feature points of the part's outer contour; Based on the feature points of the part's outline and the center of the part, a chamfer trajectory for the part is generated.

[0033] It should be noted that, to improve the efficiency of chamfering trajectory generation, the chamfering trajectory of the part can also be automatically loaded and generated based on a chamfering library. This library stores historical chamfering trajectory data for various parts to be processed. The chamfering trajectory includes the three-dimensional coordinate range of the chamfering area, the chamfering path (straight line, arc), and grinding tool parameters (diameter). The reference coordinate system for all trajectories is generated based on the center of the part. Figure 4 for Figure 3 A schematic diagram of the chamfering trajectory generated on the part drawing.

[0034] Furthermore, in this embodiment, establishing the collision avoidance boundary model includes: Obtain the robot's motion limit range and the coordinates of the magnet array platform boundary; A collision avoidance boundary model is established based on the robot's motion limit range and the boundary coordinates of the magnet array platform.

[0035] It should be understood that, in order to achieve efficient machining positioning, this embodiment uses a magnetic array worktable to chamfer the part. The pre-stored physical parameter library of the magnetic array worktable is called up, and key parameters are read, including: the total number of magnetic units, the array arrangement (e.g., a 50×50mm equally spaced matrix), the absolute coordinates of each magnetic unit (a Cartesian coordinate system is established with the platform center as the origin, recording the X / Y coordinates), and the size (length, width) of a single magnetic unit. These parameters provide basic support for subsequent placement position calculations. Figure 5 A chamfered worktable composed of a magnet array.

[0036] Define the basic dataset for collision avoidance constraints, specifically including: the motion limit range of the grasping robot (the robot's arm span is limited, and the placement point of the part must be within a specified range), and the boundary coordinates of the magnet array table (to prevent parts from exceeding the effective area of ​​the worktable, and to restrict the position of the chamfered robot). Establish a standardized collision avoidance boundary model, such as... Figure 6 As shown, Figure 6 A schematic diagram of the boundary to avoid collisions.

[0037] Step S20: Based on the chamfered trajectory and the collision avoidance boundary model, generate the initial screening candidate position for the part placed on the magnet array worktable.

[0038] Understandably, since the workbench area is relatively large, if the fine screening is used directly to generate candidate positions, there will be too many candidate positions, a huge number of calculations, and a slow calculation speed, which will affect the production efficiency of parts. Therefore, the initial screening is used first with a larger step size to generate candidate positions and generate the initial candidate positions.

[0039] Further, in this embodiment, step S20 includes: Set a margin for collisions; Calculate the boundary of the magnet array stage based on the wall collision margin and the collision avoidance boundary model; Set the resolution based on the length and width of the part; Based on the boundary of the magnet array stage and the resolution, the initial screening candidate positions for placing the part on the magnet array stage are generated.

[0040] Further, in this embodiment, generating the initial screening candidate position of the part placed on the magnet array stage based on the boundary of the magnet array stage and the resolution includes: Based on the boundary of the magnet array worktable and the length and width of the part, set the X-axis traversal variables and the Y-axis traversal variables; Construct two-dimensional coordinate points based on the current X-axis traversal variables and the current Y-axis traversal variables; The current X-axis traversal variable and the current Y-axis traversal variable are respectively superimposed with the resolution to obtain new X-axis traversal variables and new Y-axis traversal variables. The effective processing area of ​​the magnet array worktable is traversed to generate new two-dimensional coordinate points until the traversal is completed, resulting in a set of two-dimensional coordinate points. Based on the collision avoidance boundary model, the set of two-dimensional coordinate points is filtered to generate preliminary candidate positions for the part to be placed on the magnet array worktable.

[0041] It should be noted that the minimum and maximum values ​​of the X-axis boundary of the worktable, as well as the minimum and maximum values ​​of the Y-axis boundary of the worktable, are obtained. Based on the collision avoidance boundary data acquisition in step S10, the length and width of the worktable, the grinding tool parameters (diameter), and the collision avoidance allowance are set. For example, if the collision avoidance allowance is 20mm, then the boundary of the worktable is as follows: Minimum X-axis boundary value of the worktable = - length of the worktable / 2 + (collision avoidance allowance + grinding tool parameters); The maximum value of the X-axis boundary of the worktable = length of the worktable / 2 - (collision avoidance allowance + grinding tool parameters); Minimum Y-axis boundary of the worktable = - width of the worktable / 2 + (collision avoidance allowance + grinding tool parameters); The maximum value of the Y-axis boundary of the worktable = width of the worktable / 2 - (collision avoidance allowance + grinding tool parameters).

[0042] Obtain the part length value and the part width, and set the resolution, which is generally set to 100mm; Initialize the X-axis traversal variable to: minimum X-axis boundary value of the worktable + part length value / 2. When the X-axis traversal variable is less than the maximum X-axis boundary value of the worktable - part length value / 2, execute the following steps: Initialize the Y-axis traversal variable to: minimum value of the Y-axis boundary of the workbench + width of the part / 2. When the Y-axis traversal variable is less than the maximum value of the Y-axis boundary of the workbench - width of the part / 2, execute the following steps: Construct two-dimensional coordinate points based on the current X-axis and Y-axis traversal variables; Store the constructed two-dimensional coordinate points into the result set; Y-axis traversal variables increase resolution; X-axis traversal variables increase resolution; After the traversal is complete, the result set stores all the generated two-dimensional coordinate points as initial candidate positions.

[0043] In the specific implementation, based on the chamfering processing requirements and stability requirements, two types of hard constraint rules are initially set as the core judgment criteria for placement position optimization, and the initial candidate positions generated in the above steps are screened.

[0044] Step 201: The first type of hard constraint rule is the movement distance constraint of the grasping robot: the robot has a limited arm span, and the placement point of the part must be within the arm span range. Therefore, based on each initial candidate position, it is determined whether its grasping point is within the specified range. If not, the current candidate position must be discarded.

[0045] Step 202: Determine if the gripping point is within the robot's arm span. The formula is as follows: Step 203: For the center of the workpiece, the position of its gripping point is as follows: Its initial placement position is Then the position of the grab point on the workbench is: = + = .

[0046] Step 204: The second type of hard constraint rule is trajectory collision avoidance constraint: the movement trajectory of the grinding tool should have as little interference as possible with the magnet. Therefore, when the grinding trajectory and the magnet intersect on the projected 2D plane, it is considered that the magnet should not participate in the support. During grinding, the magnet needs to descend.

[0047] Step 205: In addition, adsorption stability constraints can be combined: the total area of ​​magnetic attraction activated within the projection range of the part should be as large as possible.

[0048] In the specific implementation, for the initial candidate positions generated in the above steps, each magnet is traversed, and constraint modeling is performed according to the grasping robot's movement distance constraint, trajectory collision avoidance constraint, and / or adsorption stability constraint to obtain the magnetic attraction area of ​​each initial candidate position:

[0049] Regarding the robot's movement distance constraint in the above steps, if the grasping point is not within the specified range, the magnetic attraction area is 0; regarding the trajectory collision avoidance constraint in the above steps, when the grinding trajectory interferes with the projection of the current magnet, the magnetic attraction area of ​​the current magnet is 0.

[0050] The initial candidate positions are sorted by area, and the initial candidate position with the largest area is selected as the first screening candidate position.

[0051] Step S30: Traverse the initial screening candidate positions along the X-axis and Y-axis, and perform fine screening on the initial screening candidate positions according to the preset verification rules to obtain fine screening candidate positions.

[0052] It should be understood that the initial screening only generates the approximate placement position of the parts, and the step size of the candidate positions generated by the initial screening is large. It does not model the adsorption stability mechanics to constrain the optimal position for the adsorption of the parts. Therefore, the fine screening further optimizes and determines the final adsorption position based on the candidate positions generated by the initial screening.

[0053] Understandably, this involves obtaining the minimum and maximum values ​​of the X-axis boundary of the placement location, as well as the minimum and maximum values ​​of the Y-axis boundary of the placement location.

[0054] Furthermore, the minimum value of the X-axis boundary of the placement position must be greater than -2 / worktable length + collision avoidance allowance, and the maximum value of the X-axis boundary of the placement position must be less than 2 / worktable length - collision avoidance allowance. The minimum value of the Y-axis boundary of the placement position must be greater than 2 / worktable width + collision avoidance allowance, and the maximum value of the Y-axis boundary of the placement position must be less than 2 / worktable width - collision avoidance allowance.

[0055] Get the corner coordinates of the part: corner_min and corner_max.

[0056] Set the traversal step size, which is usually set to 10mm.

[0057] Step S301: Traverse the candidate positions along the X-axis.

[0058] The X-axis traversal starts at "current X-axis position - part length value / 2" and ends at "current X-axis position + part length value / 2". Each candidate X-coordinate is traversed sequentially according to the step size.

[0059] Step S302: X-axis gripping position verification

[0060] According to step 203, the current gripping position of the part relative to the placement position x_ is obtained as pick_x. Then, it is determined whether the candidate X coordinates, after being superimposed with the offset pick_x, exceed the boundary of the placement area. If the placement position x_ + pick position pick_x < the minimum value of the X-axis boundary of the placement position or the placement position x_ + pick position pick_x > the maximum value of the X-axis boundary of the placement position, then skip the current candidate X coordinate and continue to the next X-axis traversal.

[0061] Step S303: X-axis part corner boundary verification.

[0062] Calculate the minimum / maximum X value of the corner point corresponding to the current candidate X coordinate: The minimum X-axis boundary value of the part is part_x_min = minimum X-value of the corner point corresponding to the current candidate X coordinate, corner_min.x + placement position x_; The maximum X-axis boundary value of a part is calculated as: part_x_max = maximum X-value of the corner point corresponding to the current candidate X-coordinate (corner_max.x) + placement position (x_). If the minimum X-axis boundary value of the part is less than the minimum X-axis boundary value of the worktable or the maximum X-axis boundary value of the part is greater than the maximum X-axis boundary value of the worktable, then skip the current candidate X-coordinate and continue to the next X-axis traversal.

[0063] Step S304: Traverse the candidate positions along the Y-axis.

[0064] Starting with "current Y-axis position - part width / 2" and ending with "current Y-axis position + part width / 2", traverse each candidate Y-coordinate y_ sequentially according to the step size.

[0065] Step S305: Y-axis gripping position verification.

[0066] According to step 203, the current gripping position of the part relative to the placement position y_ can be obtained as pick_y. Then, it is determined whether the candidate Y coordinate y_ plus the offset pick_y exceeds the boundary of the placement area. If the placement position y_ + pick position pick_y < the minimum value of the Y-axis boundary of the placement position, or if the placement position y_ + pick position pick_y > the maximum value of the Y-axis boundary of the placement position, then skip the current candidate Y coordinate and continue to the next Y-axis traversal.

[0067] Step S306: Y-axis part corner boundary verification Calculate the minimum / maximum Y value of the corner point corresponding to the current candidate Y coordinate: The minimum Y-axis boundary value of a part is calculated as: part_y_min = minimum Y-value of the corner point corresponding to the current candidate Y-coordinate (corner_min.y) + placement position (y_). The maximum Y-axis boundary value of a part is equal to the maximum Y-value of the corner point corresponding to the current candidate Y-coordinate, which is calculated as `corner_max.y` + the placement position.

[0068] If the minimum Y-axis boundary value of the part is less than the minimum Y-axis boundary value of the worktable, or the maximum Y-axis boundary value of the part is greater than the maximum Y-axis boundary value of the worktable, then skip the current candidate Y-coordinate and continue to the next Y-axis traversal.

[0069] Step S307: Record valid two-dimensional points The candidate coordinates (x_, y_) that pass all the verifications are stored as valid two-dimensional points in the result set.

[0070] Step S308: Repeat steps S301 to S307 until the X-axis and Y-axis have been traversed completely, and output all valid two-dimensional points as valid candidate positions.

[0071] Further, in this embodiment, step S30 includes: The initial screening candidate positions are traversed along the X-axis direction, and the verification is performed based on the X-axis gripping position and the X-axis part corner boundary. Traverse the initial screening candidate positions along the Y-axis and verify them based on the Y-axis gripping position and the Y-axis part corner boundary; The initial candidate positions that pass all verifications will be used as the fine-screen candidate positions.

[0072] Step S40: Prioritize the candidate positions for fine screening by comparing the structures, and use the candidate position with the highest priority as the target chamfer placement position.

[0073] In the specific implementation, based on the chamfering processing requirements and stability requirements, four types of hard constraint rules are set for the initial screening as the core judgment criteria for placement position optimization. The effective candidate positions generated in step S308 are screened to obtain the fine screening candidate positions.

[0074] Step S401 Trajectory collision avoidance constraint: The movement trajectory of the grinding tool should have as little interference as possible with the magnet. Therefore, when the grinding trajectory intersects with the magnet on the projected 2D plane, it is considered that the current magnet should not participate in the support. During grinding, the magnet needs to descend to obtain the current lifting and lowering state of the magnet.

[0075] Step S402 Adsorption Area Constraint: The total activated magnetic adsorption area within the projection range of the part should be as large as possible.

[0076] Step S403 Adsorption force constraint: The part should be considered to be under force balance. When the magnet is only adsorbed on the edge of the part, the workpiece will be displaced under the interference of the grinding force. Therefore, the magnet needs to be adsorbed on the center of the part as much as possible. Therefore, a mathematical model is introduced to evaluate the stability of the magnet's adsorption position on the part.

[0077] For the magnet center, the closer the part's center is to the magnet center, the better the magnet's attraction effect, and vice versa. A parabolic model can be used for evaluation. For the magnet matrix, the part is located on the magnet matrix, and each attracted magnet exerts a force on the part. Therefore, this evaluation function is directional. Let the current centroid coordinate of the part be denoted as... The position of the center of gravity of the i-th magnet is The adsorption force constraint evaluation function is as follows: ; Among them, f i =S i* dir_i*fv i S i Let this be the overlapping area of ​​the magnet and the component. , .

[0078] Step S404 Position Centrality Constraint: When there is no significant difference in the force applied to the magnet, prioritize the position status data of the coordinate point that is closer to the center of the worktable.

[0079] Step S405: Constraint Modeling Traverse the valid candidate positions generated in step S308 and perform constraint modeling.

[0080] For each candidate position The positional centrality constraint in step S404 is as follows: .

[0081] And by iterating through each magnet, we get: For the trajectory collision avoidance constraint in step S401, calculate the overlapping area between the projection of the beveled trajectory at the current position and the magnet, denoted as . ; For the adsorption area constraint in step S402, calculate the overlapping area between the part projection and the magnet at the current position, and denot it as... , and when When greater than 0, =0; Regarding the adsorption force constraint in step S403, the adsorption force can be calculated from step S403. .

[0082] By summing the constraint models for each magnet, we can obtain the comprehensive evaluation criteria for the part at its current position: chamfered trajectory collision avoidance constraint. ; Adsorption area constraint ; Adsorption force constraint .

[0083] Furthermore, in this embodiment, the candidate positions for fine screening are prioritized by comparing structures, and the candidate position with the highest priority is used as the target chamfer placement position, including: A constraint model is constructed based on trajectory collision avoidance constraints, adsorption area constraints, adsorption force constraints, and position centrality constraints. Based on the constraint model, the constraint modeling of each magnet on the magnet array workbench is accumulated to obtain the comprehensive evaluation standard of the part at the current position; According to the comprehensive evaluation criteria, the candidate positions for fine screening are prioritized by comparing the structures, and the candidate position with the highest priority is used as the target chamfer placement position.

[0084] It should be understood that a comparison structure containing threshold parameters is defined. The comparison structure has preset minimum threshold values ​​for adsorption area difference min_mag and minimum threshold values ​​for adsorption force difference min_F. The value of min_mag is assigned to 500 and the value of min_F is assigned to 10. Other values ​​can also be assigned, depending on the actual situation. This embodiment does not limit this.

[0085] Step S406 First Priority: Comparison of Adsorption Area Size Compare the adsorption areas of two positional state data a and b to be sorted: If the adsorption area of ​​data a is greater than or equal to the sum of the adsorption area of ​​data b and min_mag, then the sorting priority of a is determined to be higher than that of b. If the absolute difference between the adsorption areas of a and b is less than min_mag, proceed to the next priority judgment; If the above conditions are not met, then b is determined to have a higher sorting priority than a.

[0086] Step S407 Second Priority: Comparison of Collision Avoidance Area Size Based on Bevel Trajectory Based on the absence of significant differences in adsorption area, a comparison of the collision avoidance area of ​​the chamfered trajectory was performed: If the collision avoidance area of ​​the chamfered trajectory of data a is less than or equal to the difference between the collision avoidance area of ​​the chamfered trajectory of data b and min_mag / 10.0, then the sorting priority of a is determined to be higher than that of b. If the absolute difference between the collision avoidance areas of the chamfered trajectories of a and b is less than min_mag / 10.0, proceed to the next priority judgment; If the above conditions are not met, then b is determined to have a higher sorting priority than a.

[0087] Step S408 Third Priority: Comparison of Adsorption Forces Based on the premise that there is no significant difference in collision area, the absolute values ​​of adsorption forces are compared: If the absolute value of the adsorption force of data a is less than the absolute value of the adsorption force of data b, then the sorting priority of a is determined to be higher than that of b. If the absolute difference between the adsorption forces of a and b is less than min_F, proceed to the next priority judgment; If the above conditions are not met, then b is determined to have a higher sorting priority than a.

[0088] Step S409, Fourth Priority: Comparison of Location Centrality Assuming no significant difference in adsorption force, calculate the positional centrality: If the positional centrality of a is less than that of b, then a has a higher sorting priority than b. If the above conditions are not met, then b is determined to have a higher sorting priority than a.

[0089] Step S410: Perform overall sorting. The multi-dimensional comparison logic described above is applied to all unsorted position state data. Following the priority order of "adsorption area → chamfered trajectory collision avoidance area → adsorption force → position centrality", all data are compared pairwise to obtain an ordered position state dataset.

[0090] Step S411 Output: Select the candidate position with the highest priority after fine screening and sorting as the target chamfer placement position. The target chamfer placement position is as follows: Figure 7As shown.

[0091] Furthermore, in this embodiment, based on the comprehensive evaluation criteria, the candidate positions for fine screening are prioritized by comparing structures, and the candidate position with the highest priority is used as the target chamfer placement position, including: According to the comprehensive evaluation criteria, the pairwise comparison and sorting of all data corresponding to the candidate positions of the fine screening are completed in the order of priority of adsorption area, chamfer trajectory collision avoidance area, adsorption force, and positional centrality. The candidate position with the highest priority is taken as the target chamfer placement position.

[0092] In this embodiment, by acquiring the chamfer trajectory of the part and establishing a collision avoidance boundary model, the collision avoidance requirements can be met. Based on the chamfer trajectory and the collision avoidance boundary model, a preliminary screening candidate position for the part to be placed on the magnet array worktable is generated, improving screening efficiency. The preliminary screening candidate positions are traversed along the X-axis and Y-axis directions, and the preliminary screening candidate positions are finely screened according to preset verification rules to obtain fine screening candidate positions, improving the stability of the screening position. The fine screening candidate positions are prioritized by comparing structures, and the fine screening candidate position with the highest priority is used as the target chamfer placement position, realizing the optimal selection of the chamfer position. This method is low-cost, highly stable, and meets the needs of various scenarios such as multi-variety, small-batch production, irregularly shaped parts, and parts with complex chamfer trajectories, demonstrating strong adaptability.

[0093] Furthermore, this embodiment of the invention also proposes a storage medium storing an automatic part chamfering placement position generation program, which, when executed by a processor, implements the steps of the automatic part chamfering placement position generation method described above.

[0094] In addition, refer to Figure 8 The present invention also proposes an automatic chamfering placement position generation device for parts, the automatic chamfering placement position generation device comprising: Module 10 is used to acquire the chamfer trajectory of the part and establish a collision avoidance boundary model; The generation module 20 is used to generate the initial screening candidate position of the part placed on the magnet array worktable based on the chamfer trajectory and the collision avoidance boundary model. The filtering module 30 is used to traverse the initial screening candidate positions along the X-axis and Y-axis directions, and to perform fine screening on the initial screening candidate positions according to the preset verification rules to obtain fine screening candidate positions. The sorting module 40 is used to prioritize the candidate positions of the fine screening by comparing the structure, and the candidate position with the highest priority is used as the target chamfer placement position.

[0095] Other embodiments or specific implementations of the automatic generation device for chamfering placement of parts described in this invention can be found in the above-described method embodiments, and will not be repeated here.

[0096] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or system that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or system. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or system that includes that element.

[0097] The sequence numbers of the above embodiments of the present invention are for descriptive purposes only and do not represent the superiority or inferiority of the embodiments. In the unit claims listing several devices, several of these devices may be embodied by the same hardware item. The use of the terms first, second, and third, etc., does not indicate any order and can be interpreted as identifiers.

[0098] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods of the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of the present invention, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium (such as a read-only memory image (ROM) / random access memory (RAM), magnetic disk, optical disk), and includes several instructions to cause a terminal device (which may be a mobile phone, computer, server, air conditioner, or network device, etc.) to execute the methods described in the various embodiments of the present invention.

[0099] The above are merely preferred embodiments of the present invention and do not limit the patent scope of the present invention. Any equivalent structural or procedural transformations made based on the content of the present invention's specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of the present invention.

Claims

1. A method for automatically generating a chamfer placement position for a part, the method comprising: receiving a part model; determining a chamfer placement position for the part; and outputting the chamfer placement position. The method for automatically generating the chamfer placement position of the part includes the following steps: Obtain the chamfer trajectory of the part and establish a collision avoidance boundary model; Based on the chamfered trajectory and the collision avoidance boundary model, the initial screening candidate positions for the part placed on the magnet array worktable are generated; The initial candidate positions are traversed along the X-axis and Y-axis, and the initial candidate positions are further screened according to the preset verification rules to obtain the refined candidate positions. The candidate positions for fine screening are prioritized by comparing the structures, and the candidate position with the highest priority is used as the target chamfer placement position.

2. The method of claim 1, wherein, Based on the chamfered trajectory and the collision avoidance boundary model, the initial screening candidate positions for the part placed on the magnet array worktable are generated, including: Set a margin for collisions; Calculate the boundary of the magnet array stage based on the wall collision margin and the collision avoidance boundary model; Set the resolution based on the length and width of the part; Based on the boundary of the magnet array stage and the resolution, the initial screening candidate positions for placing the part on the magnet array stage are generated.

3. The method of claim 2, wherein, Based on the boundary of the magnet array stage and the resolution, the initial screening candidate positions for the parts placed on the magnet array stage are generated, including: Based on the boundary of the magnet array worktable and the length and width of the part, set the X-axis traversal variables and the Y-axis traversal variables; Construct two-dimensional coordinate points based on the current X-axis traversal variables and the current Y-axis traversal variables; The current X-axis traversal variable and the current Y-axis traversal variable are respectively superimposed with the resolution to obtain new X-axis traversal variables and new Y-axis traversal variables. The effective processing area of ​​the magnet array worktable is traversed to generate new two-dimensional coordinate points until the traversal is completed, resulting in a set of two-dimensional coordinate points. Based on the collision avoidance boundary model, the set of two-dimensional coordinate points is filtered to generate preliminary candidate positions for the part to be placed on the magnet array worktable.

4. The method of claim 1, wherein, Traverse the initial candidate positions along the X-axis and Y-axis, and refine the initial candidate positions according to a preset verification rule to obtain refined candidate positions, including: The initial screening candidate positions are traversed along the X-axis direction, and the verification is performed based on the X-axis gripping position and the X-axis part corner boundary. Traverse the initial screening candidate positions along the Y-axis and verify them based on the Y-axis gripping position and the Y-axis part corner boundary; The initial candidate positions that pass all verifications will be used as the fine-screen candidate positions.

5. The method of claim 4, wherein, The candidate positions for fine screening are prioritized by comparing the structures, and the candidate position with the highest priority is used as the target chamfer placement position, including: A constraint model is constructed based on trajectory collision avoidance constraints, adsorption area constraints, adsorption force constraints, and position centrality constraints. Based on the constraint model, the constraint modeling of each magnet on the magnet array workbench is accumulated to obtain the comprehensive evaluation standard of the part at the current position; According to the comprehensive evaluation criteria, the candidate positions for fine screening are prioritized by comparing the structures, and the candidate position with the highest priority is used as the target chamfer placement position.

6. The method for automatically generating chamfer placement positions for parts as described in claim 4, characterized in that, According to the comprehensive evaluation criteria, the candidate positions for fine screening are prioritized by comparing the structures, and the candidate position with the highest priority is used as the target chamfer placement position, including: According to the comprehensive evaluation criteria, the pairwise comparison and sorting of all data corresponding to the candidate positions of the fine screening are completed in the order of priority of adsorption area, chamfer trajectory collision avoidance area, adsorption force, and positional centrality. The candidate position with the highest priority is taken as the target chamfer placement position.

7. The method for automatically generating chamfer placement positions for parts as described in any one of claims 1-6, characterized in that, Establish a collision avoidance boundary model, including: Obtain the robot's motion limit range and the coordinates of the magnet array platform boundary; A collision avoidance boundary model is established based on the robot's motion limit range and the boundary coordinates of the magnet array platform.

8. An automatic part chamfering placement position generation device, characterized in that, The automatic part chamfer placement position generation device includes: The acquisition module is used to acquire the chamfer trajectory of the part and build a collision avoidance boundary model; The generation module is used to generate the initial screening candidate positions of the part placed on the magnet array worktable based on the chamfer trajectory and the collision avoidance boundary model. The filtering module is used to traverse the initial candidate positions along the X-axis and Y-axis, and to perform fine filtering on the initial candidate positions according to the preset verification rules to obtain the fine candidate positions. The sorting module is used to prioritize the candidate positions of the fine screening by comparing structures, and the candidate position with the highest priority is used as the target bevel placement position.

9. An automatic part chamfering placement position generation device, characterized in that, The automatic part chamfering placement position generation device includes: a memory, a processor, and an automatic part chamfering placement position generation program stored in the memory and executable on the processor. When the automatic part chamfering placement position generation program is executed by the processor, it implements the steps of the automatic part chamfering placement position generation method as described in any one of claims 1 to 7.

10. A storage medium, characterized in that, The storage medium stores an automatic part chamfering placement position generation program, which, when executed by a processor, implements the steps of the automatic part chamfering placement position generation method as described in any one of claims 1 to 7.

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