Elastic probe structure and bidirectional plug-in connector

Abstract

This application provides a flexible probe structure and a bidirectional plug-in connector. The flexible probe structure includes a fixing part, a pair of first flexible arms, a pair of second flexible arms, a first contact part, and a second contact part. The length of the first effective force arm of the first flexible arm is shorter than the length of the second effective force arm of the second flexible arm. The first and / or second flexible arms include a curved or zigzag-shaped bending track portion. This application solves the problem of limited selection of positive force by using two pairs of flexible arms with unequal force arm lengths, resolves the contradiction between high-force breakage and poor contact under low force by a reasonable arrangement of short and long arms, and solves the stress concentration problem by using the bending track portion, thus achieving a flexible probe structure that can flexibly output different positive forces and optimize stress within a limited space.

Description

Technical Field

[0001] This application belongs to the field of frequency converter technology, and in particular relates to an elastic probe structure and a bidirectional plug-in connector. Background Technology

[0002] Flexible probes are widely used in board-to-board connectors, RF connectors, battery connectors, and semiconductor test fixtures in electronic devices to achieve separable electrical connections. Key performance indicators of flexible probes include: forward contact force, working stroke (dive), insertion / extraction life, and contact resistance stability.

[0003] Traditional elastic probes often employ a straight-arm cantilever structure. According to the cantilever beam small deformation theory, the normal force is inversely proportional to the cube of the lever arm length and directly proportional to the sinking displacement. Once the structural dimensions of the probe (especially the lever arm length) are fixed, the normal force is uniquely determined for a given sinking displacement.

[0004] To obtain a greater positive force to reduce contact resistance, the traditional approach is to shorten the lever arm length. However, this leads to a sharp increase in stress at the root of the cantilever, significantly reducing fatigue life and even causing premature fracture. Conversely, if the lever arm length is increased to extend life, the positive force will be too small, easily leading to poor contact, signal interruption, or overheating.

[0005] In other words, traditional straight-arm elastic probes suffer from the technical contradiction of "easy breakage under high force and poor contact under low force". In addition, the traditional structure suffers from severe stress concentration, making it impossible to flexibly select different positive forces under the same needle spacing and the same amount of sinking.

[0006] Therefore, there is an urgent need to provide an elastic probe structure that can achieve different positive force selections and optimize stress distribution under a fixed sinking amount.

[0007] Application content In view of this, embodiments of this application provide an elastic probe structure, connector, and electronic device to solve the problems in the prior art where elastic probes cannot flexibly select different positive forces under a fixed sinking amount, and where stress concentration is severe and fatigue life is low.

[0008] A first aspect of this application provides an elastic probe structure, including: Fixing part; A pair of first elastic arms, each first elastic arm having a first fixed end and a first free end, the first fixed end being connected to the fixed part; A pair of second elastic arms, each second elastic arm having a second fixed end and a second free end, the second fixed end being connected to the fixed part; A first contact portion is disposed at each of the first free ends; The second contact portion is disposed at each of the second free ends; The first elastic arm has a first effective lever arm length, the second elastic arm has a second effective lever arm length, and the first effective lever arm length is less than the second effective lever arm length; The first elastic arm and / or the second elastic arm includes a bending track portion, which has an arc-shaped or zigzag bending structure to uniformly distribute stress during deformation.

[0009] In one embodiment, when the first contact portion and the second contact portion are driven to produce the same preset downward displacement, the first positive force generated by the first elastic arm is greater than the second positive force generated by the second elastic arm.

[0010] In one embodiment, the first positive force is configured to achieve stable conductive contact, and the second positive force is configured to slide into contact with the mating terminal during hot-plugging without damaging the terminal plating.

[0011] In one embodiment, a pair of first elastic arms are symmetrically arranged on both sides of the fixing part, and a pair of second elastic arms are symmetrically arranged on both sides of the fixing part, with the first elastic arms and the second elastic arms respectively arranged at opposite ends of the fixing part, and their extension directions being opposite.

[0012] In one embodiment, the bent track portion is configured such that, under space-constrained conditions within the plastic cavity, the maximum stress of both the first elastic arm and the second elastic arm is lower than the material yield strength.

[0013] In one embodiment, under the preset sinking displacement, the stress concentration factor of the first elastic arm and / or the second elastic arm of the bent track section is lower than the preset coefficient value.

[0014] In one embodiment, the first contact portion is configured to mate with the conductive terminal of the first module, and the second contact portion is configured to mate with the conductive terminal of the second module, wherein the second module is an expansion module.

[0015] In one embodiment, the ratio of the first positive force to the second positive force is greater than or equal to a first preset ratio and less than or equal to a second preset ratio.

[0016] The second aspect of this application provides a bidirectional plug-in connector, including: an upper probe module, a connector body, a lower contact terminal module, and a lower probe module; the connector body is an insulating base, and at least one axially penetrating receiving cavity is opened inside, and an elastic probe structure as provided in the first aspect is installed in each receiving cavity to form the conductive structure of the connector.

[0017] In one embodiment, the probe modules on the upper and lower sides are respectively used for inserting probes from the upper and lower ends of the connector body, and cooperate with the corresponding elastic probe structure to realize bidirectional electrical connection.

[0018] The beneficial effects of this application's embodiments are as follows: By setting two pairs of elastic arms with different lever arm lengths, under a unified downward displacement, the first and second contact parts of the elastic arms with different lengths generate two different magnitudes of positive force. This solves the limitation of traditional solutions with only one pair of elastic arms, a unique lever arm length, and a uniquely determined positive force. Furthermore, since the lever arm length of the first elastic arm is shorter than that of the second elastic arm, through reasonable design, the first elastic arm can generate a large positive force, suitable for applications requiring stable contact; the second elastic arm generates a small positive force, suitable for applications requiring protected terminals, such as hot-plugging. The two functions do not interfere with each other, solving the problem that a single lever arm may be prone to breakage if the root stress is high, or may suffer from poor contact due to a small positive force. In addition, this application employs a bent track section, which disperses the stress along the bending path when the elastic arm deforms, preventing local stress peaks from exceeding the material's yield strength, thereby improving fatigue life. In summary, this solution solves the problem of limited selection of positive force by using two pairs of elastic arms with unequal lever arm lengths, resolves the contradiction between easy breakage under high force and poor contact under low force by the reasonable arrangement of short and long arms, and solves the stress concentration problem by using the bent track section. Together, these three aspects enable an elastic probe structure that can flexibly output different positive forces and optimize stress within a limited space. Attached Figure Description

[0019] To more clearly illustrate the technical solutions in the embodiments of this application, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0020] Figure 1 This is an overall schematic diagram of an elastic probe structure provided in an embodiment of this application; Figure 2 A schematic diagram of an elastic probe structure provided in another embodiment of this application; Figure 3 A schematic diagram of an elastic probe structure provided in another embodiment of this application; Figure 4 This is a schematic diagram of the structure of the bidirectional plug-in connector provided in an embodiment of this application. Detailed Implementation

[0021] The embodiments of the technical solution of this application will now be described in detail with reference to the accompanying drawings. These embodiments are only used to more clearly illustrate the technical solution of this application and are therefore merely examples, and should not be used to limit the scope of protection of this application.

[0022] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application pertains; the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the application; the terms “comprising” and “having”, and any variations thereof, in the specification, claims, and foregoing description of the drawings are intended to cover non-exclusive inclusion.

[0023] In the description of the embodiments of this application, technical terms such as "first" and "second" are used only to distinguish different objects and should not be construed as indicating or implying relative importance or implicitly specifying the number, specific order, or primary and secondary relationship of the indicated technical features. In the description of the embodiments of this application, "multiple" means two or more, unless otherwise explicitly defined.

[0024] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0025] In the description of the embodiments in this application, the term "and / or" is merely a description of the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, and B existing alone. Additionally, the character " / " in this document generally indicates that the preceding and following related objects have an "or" relationship.

[0026] See Figures 1 to 3 . Figure 1 This is a schematic diagram of the overall elastic probe structure provided in an embodiment of this application. Figure 1 As can be seen, the embodiments of this application provide an elastic probe structure 100, which is integrally formed from a conductive metal material.

[0027] The elastic probe structure 100 includes a fixing part 110, which is in the form of a flat plate or a block. The fixing part 110 may be provided with mounting holes, a snap-fit ​​structure or a soldering surface for fixing the entire elastic probe structure 100 to the insulating shell of the connector or directly soldering it to the circuit board.

[0028] A pair of first elastic arms 120, including first elastic arms 120a and 120b, are symmetrically arranged on the left and right sides of one end of the fixing part 110. Each first elastic arm 120 has a first fixed end 121 and a first free end 122, with the first fixed end 121 integrally connected to the fixing part 110. A first contact portion 123 is provided at the first free end 122. The first contact portion 123 can be an arc surface or a raised contact point, used to form electrical contact with the mating terminal.

[0029] A pair of second elastic arms 130, including second elastic arms 130a and 130b, are symmetrically arranged on both sides of the other end of the fixing portion 110 (e.g., below the first elastic arm 120). Each second elastic arm 130 has a second fixed end 131 and a second free end 132, the second fixed end 131 being integrally connected to the fixing portion 110. A second contact portion 133 is provided at the second free end 132. The shape of the second contact portion 133 may be the same as or different from that of the first contact portion 123.

[0030] like Figure 2 As shown, Figure 2 This is a schematic diagram of an elastic probe structure provided in another embodiment of this application.

[0031] The first elastic arm 120 has a first effective lever arm length L1 (i.e., the equivalent distance from the stress center of the first fixed end 121 to the force application point of the first contact portion 123).

[0032] The second elastic arm 130 has a second effective lever arm length L2, and the first effective lever arm length L1 is smaller than the second effective lever arm length L2 (i.e., the equivalent distance from the stress center of the second fixed end 131 to the force application point of the second contact portion 133).

[0033] At least one of the first elastic arm 120 and the second elastic arm 130 is provided with a bending track portion 140. In this embodiment, both are provided with a bending track portion 140.

[0034] like Figure 3 As shown, Figure 3 This is a schematic diagram of an elastic probe structure provided in another embodiment of this application.

[0035] In this embodiment, the bent track portion 140 has an arc-shaped bending structure. For example, the bent track portion 140 of the first elastic arm 120 has an arc-shaped bending structure, while the bent track portion 140 of the second elastic arm 120 has a broken line bending structure. In addition, depending on the actual application requirements, the bent track portion 140 can also be parabolic or other multi-broken lines such as V-shape, U-shape, W-shape, etc.

[0036] In this embodiment, as Figures 2 to 3As shown, the bending track section 140 is configured such that when the elastic arm is deformed by the pressure of the mating terminal, the stress is distributed along the bending path to achieve uniform distribution and avoid stress concentration at the root of the fixed end.

[0037] When the elastic probe structure 100 is installed inside the connector and plugged into its mating terminal, the first contact portion 123 and the second contact portion 133 are respectively driven by the mating terminal to generate the same preset downward displacement δ (i.e., the deformation of the elastic arm). In this embodiment, the preset downward displacement δ is set to a fixed constant, such as 0.11mm or 0.15mm, and can be selected within a preset range such as 0.03mm to 0.45mm depending on the actual application.

[0038] Since the length of the first effective lever arm L1 is less than the length of the second effective lever arm L2, according to the cantilever beam deflection formula, under the same downward displacement δ, the first positive force F1 generated by the first elastic arm 120 is greater than the second positive force F2 generated by the second elastic arm 130.

[0039] For example, the deflection formula for a cantilever beam provided in this application is as follows: in, For material properties, Let the moment of inertia of the cross section be... For the downward displacement, F is the positive force, and L is the effective lever arm.

[0040] With material properties E, moment of inertia I, and sinking displacement δ all fixed, the positive force F is inversely proportional to the cube of the effective lever arm length L.

[0041] In this embodiment, L1 is designed to be 0.01 inches to 0.02 inches, and L2 is designed to be 0.03 inches to 0.05 inches.

[0042] Simulation experiments have verified that when δ=0.128mm: the range of the first positive force F1 is 6.58N~12.83N (the shorter the lever arm, the greater the positive force); the range of the second positive force F2 is 0.75N~1.66N (the longer the lever arm, the smaller the positive force).

[0043] The presence of the bending track section 140 ensures that the maximum stress of the elastic arm is always lower than the material yield strength during the above deformation process (for example, the yield strength of beryllium copper is ≥1000MPa, and the measured maximum stress is ≤850MPa), thereby guaranteeing a high insertion and extraction life (tested to be ≥10000 times).

[0044] For example, this application provides various combinations of lever arm lengths to accommodate different positive force requirements. For instance, with L1 being 0.0145 inches and L2 being 0.0359 inches, the downward displacement δ is 0.128 mm, corresponding to F1 of 13 N and F2 of 1.8 N, with an F1 / F2 ratio of 8. This value is suitable for main modules requiring extremely high contact forces. Alternatively, with L1 being 0.0163 inches and L2 being 0.0456 inches, the downward displacement δ is 0.128 mm, corresponding to F1 of 10.5 N and F2 of 0.91 N, with an F1 / F2 ratio of 11.5. This value is suitable for main modules requiring high contact forces and extension modules requiring low contact forces. With L1 set to 0.0183 inches and L2 set to 0.0556 inches, the sink displacement δ is 0.128 mm, corresponding to F1 of 8.7 N and F2 of 0.55 N. The F1 / F2 ratio is 15.8, which is suitable for medium contact force on the main module and ultra-low contact force on the extension module. Alternatively, with L1 set to 0.0203 inches and L2 set to 0.0456 inches, the sink displacement δ is 0.128 mm, corresponding to F1 of 6.5 N and F2 of 0.91 N. The F1 / F2 ratio is 7.1, which is suitable for standard contact force on the main module.

[0045] According to experimental data verification, the positive force is inversely proportional to the cube of the effective lever arm. Furthermore, when the ratio of F1 to F2 is between 5 and 20, it satisfies both the stable contact requirements of the main module and ensures the hot-swap protection effect of the expansion module. Preferably, the ratio of F1 to F2 is greater than or equal to a first preset ratio, such as 7, and less than or equal to a second preset ratio, such as 16.

[0046] According to the formula for bending stress of a cantilever beam, the maximum bending stress at the root is: Substituting the fact that the positive force F is inversely proportional to the cube of the effective lever arm length L, we can find that the maximum bending stress at the root is inversely proportional to the square of the effective lever arm length L. Since stress is inversely proportional to the square of the lever arm length, we can determine that the longer the lever arm, the lower the stress.

[0047] In other words, besides the settlement displacement δ=0.128mm, this application can also be applied to other settlement displacements. For example, with a preset settlement displacement δ=0.08mm, F1 is approximately 7.6N when the stress arm length L1=0.0163 inches; and F2 is approximately 0.66N when L2=0.0456 inches. In another embodiment, with a preset settlement displacement δ=0.15mm, F1 is approximately 11.9N when the stress arm length L1=0.0183 inches; and F2 is approximately 1.24N when L2=0.0456 inches.

[0048] Therefore, it can be seen that the technical solution of this application can flexibly configure the lever arm length and sinking displacement parameters according to different application scenarios.

[0049] This application further optimizes stress distribution by incorporating a bent track section (arc-shaped bend or zigzag bend). In traditional straight-arm structures, stress concentrates at the root of the fixed end, with a stress concentration factor Kt of approximately 3.2 to 4.5. The bent track section of this application disperses stress along the bending path, reducing the stress concentration factor Kt to 1.3 to 1.9 (i.e., Kt ≤ 2.0). Under a fixed downward displacement, by setting different lever arm lengths, both large and small positive forces can be obtained simultaneously to meet different contact requirements. The short arm generates a large positive force for stable contact, while the long arm generates a small positive force for hot-plugging; the two do not interfere with each other. The bent track section disperses stress along the bending path, resulting in a stress concentration factor Kt ≤ 2.0, a mating life ≥ 10,000 cycles, and no need to change the pin pitch, allowing for flexible integration into existing connector insulating housings.

[0050] In the embodiments of this application, the bent track portion 140 has a smooth arc-shaped bending structure. The arc can be a circular arc with a single curvature or a curve with a variable curvature (such as an elliptical arc or a parabolic segment). The advantage of the arc-shaped bending is that the stress distribution is the most uniform, without stress peaks at the bends.

[0051] The radius of curvature R of the curved bend can be designed according to the length of the elastic arm and space constraints. In a specific design, for a first elastic arm with an effective lever arm length of 0.0163 inches, the radius of curvature R of its bent track section is approximately 0.008 inches to 0.012 inches.

[0052] Furthermore, the bent track section 140 can also have a zigzag bending structure, such as a V-shape, U-shape, or W-shape. The advantage of a zigzag bend is that it is simple to manufacture (it can be formed in one step by a stamping die) and can achieve a longer effective lever arm length within a limited planar space.

[0053] Taking a V-shaped bend as an example, the bending angle θ can be selected between 90° and 150°. The smaller the bending angle, the longer the actual lever arm for the same projected length, but the stress will increase accordingly. Tests have shown that when θ = 120° to 135°, the stress and lever arm length reach an optimal balance.

[0054] In applications with extremely limited space (e.g., needle pitch ≤ 1.0 mm), this embodiment employs a multi-layer bending structure, where the bending track section 140 includes two or more bending segments (e.g., zigzag or serpentine bends). The multi-layer bending structure can achieve a long effective lever arm length within a very small planar projected area, while dispersing stress step by step through multiple bending points.

[0055] A pair of first elastic arms 120 are symmetrically arranged on both sides of the fixing part 110, and a pair of second elastic arms 130 are symmetrically arranged on both sides of the fixing part 110. The first elastic arms 120 and the second elastic arms 130 are respectively located at opposite ends of the fixing part 110, and their extension directions are opposite. The advantage of this reverse extension layout is that the first contact part 123 and the second contact part 133 face opposite directions, and can respectively mate with mating terminals located on different sides of the connector (e.g., the upper side and the lower side), achieving double-sided contact in the vertical direction. At the same time, the reverse extension avoids mutual interference between the two elastic arms during deformation.

[0056] It should be noted that, depending on the application scenario, if the connector has sufficient space and requires mating of two different terminals on the same side, the first elastic arm 120 and the second elastic arm 130 can extend from the same side of the fixing part 110, but they are staggered in the vertical direction (i.e., layered arrangement). Alternatively, the extension directions of the first elastic arm 120 and the second elastic arm 130 can form an angle α, 0° < α < 180°, to achieve a three-dimensional spatial layout. This layout is suitable for complex connector structures that require contact with mating terminals from different angles.

[0057] To further improve insertion / removal life and contact reliability, a wear-resistant plating layer can be provided on the surface of the first contact portion 123 and / or the second contact portion 133. For example, nickel plating (thickness 1~3μm) followed by gold plating (thickness 0.1~1.0μm) is performed on a beryllium copper substrate. In this embodiment, the first contact portion is configured to mate with the conductive terminal of the first module, i.e., the factory standard terminal. As for the second contact portion 133, since it is configured to mate with the conductive terminal of the second module, which is a customer's expansion module, frequent sliding contact is required. A hard gold plating layer or a palladium-nickel alloy plating layer can be added to improve wear resistance. The first positive force is configured to achieve stable conductive contact, and the second positive force is configured to allow sliding contact with the mating terminal during hot-plugging without damaging the terminal plating.

[0058] In this embodiment, the fixing part 110, the first elastic arm 120, and the second elastic arm 130 are integrally stamped components. For example, the elastic probe structure 100 is formed by stamping a thin metal sheet (thickness can be selected according to actual needs, such as 0.1mm to 0.5mm) in one step using a precision stamping die. The advantages of one-step stamping are high production efficiency, good consistency, no welding stress, and low cost.

[0059] In practical connector applications, multiple elastic probe structures 100 are typically arranged in an array (e.g., a 2×N, 3×N, or M×N matrix). The integral molding design of this application is also applicable to multi-pin arrangements: that is, multiple independent elastic probe structures 100 are simultaneously stamped on the same metal strip and installed into the insulating housing to form a connector.

[0060] As can be seen from the above analysis, the elastic probe structure provided in this application, by setting two pairs of elastic arms with different lever arm lengths, generates two different magnitudes of positive force at the first and second contact parts of the elastic arms with different lengths under a unified downward displacement. This solves the limitation of traditional solutions with only one pair of elastic arms, where the lever arm length is unique and the positive force is uniquely determined. Furthermore, since the lever arm length of the first elastic arm is shorter than that of the second elastic arm, through reasonable design, the first elastic arm can generate a large positive force, which is suitable for applications requiring stable contact; the second elastic arm generates a small positive force, which is suitable for applications requiring protected terminals, such as hot-plugging. The two functions do not interfere with each other, which solves the problem that a single lever arm may be prone to breakage if the root stress is high, or may lead to poor contact due to a small positive force. In addition, this application uses a bent track section, which disperses the stress along the bending path when the elastic arm deforms, avoiding local stress peaks from exceeding the material yield strength, thereby improving fatigue life. In summary, this solution solves the problem of limited selection of positive force by using two pairs of elastic arms with unequal lever arm lengths, resolves the contradiction between easy breakage under high force and poor contact under low force by the reasonable arrangement of short and long arms, and solves the stress concentration problem by using the bent track section. Together, these three aspects enable an elastic probe structure that can flexibly output different positive forces and optimize stress within a limited space.

[0061] like Figure 4 As shown, Figure 4 This is a schematic diagram of the structure of the bidirectional plug-in connector provided in an embodiment of this application.

[0062] Depend on Figure 4 As can be seen, the bidirectional connector 400 provided in this application embodiment includes an upper probe module 410, a lower contact terminal module 430 of the connector body 420, and a lower probe module 440. The connector body 420 is an insulating base with at least one axially penetrating receiving cavity 421 inside. Each receiving cavity 421 houses an elastic probe structure 100, forming the core conductive structure of the connector 400. The upper and lower probe modules can be used to allow probes to be inserted from both ends of the connector 400 body, cooperating with the corresponding elastic probe structures 100 to achieve bidirectional electrical connection.

[0063] Specifically, the elastic probe structure 100 can be referred to in detail. Figures 1 to 3 The description in the embodiment. In practical applications, when the probes on the upper and lower sides are respectively inserted into the corresponding ports of the connector 400 body, the conductive ends of the probes will respectively squeeze the first elastic arm 120 and the second elastic arm 130 of the elastic probe structure 100, causing the elastic probe structure 100 to undergo elastic deformation, generating a stable positive contact force, forming a complete electrical connection path, and realizing bidirectional reliable transmission of signals or current.

[0064] This application solves the technical contradiction that existing connectors cannot simultaneously meet the requirements of high-reliability connection and low insertion / removal force hot-plugging by setting a double contact part with differentiated positive force on the same elastic terminal. It has the advantages of simple structure, low cost and high reliability.

[0065] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the above-described division of functional units and modules is merely an example. In practical applications, the above functions can be assigned to different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiments can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. Furthermore, the specific names of the functional units and modules are only for easy differentiation and are not intended to limit the scope of protection of this application. The specific working process of the units and modules in the above system can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.

[0066] In the above embodiments, the descriptions of each embodiment have different focuses. For parts that are not described in detail or recorded in a certain embodiment, please refer to the relevant descriptions of other embodiments.

[0067] The above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application, and should all be included within the protection scope of this application.

Claims

1. An elastic probe structure, characterized by, include: Fixing part; A pair of first elastic arms, each first elastic arm having a first fixed end and a first free end, the first fixed end being connected to the fixed part; A pair of second elastic arms, each second elastic arm having a second fixed end and a second free end, the second fixed end being connected to the fixed part; A first contact portion is disposed at each of the first free ends; The second contact portion is disposed at each of the second free ends; The first elastic arm has a first effective lever arm length, the second elastic arm has a second effective lever arm length, and the first effective lever arm length is less than the second effective lever arm length; The first elastic arm and / or the second elastic arm includes a bending track portion, which has an arc-shaped or zigzag bending structure to uniformly distribute stress during deformation.

2. The elastomeric probe structure of claim 1, wherein, When the first contact portion and the second contact portion are driven to produce the same preset downward displacement, the first positive force generated by the first elastic arm is greater than the second positive force generated by the second elastic arm.

3. The elastic probe structure according to claim 2, characterized in that, The first positive force is configured to achieve stable conductive contact, and the second positive force is configured to slide contact with the mating terminal during hot-plugging.

4. The elastic probe structure according to claim 1, characterized in that, A pair of first elastic arms are symmetrically arranged on both sides of the fixing part, and a pair of second elastic arms are symmetrically arranged on both sides of the fixing part. The first elastic arms and the second elastic arms are respectively arranged at opposite ends of the fixing part, and their extension directions are opposite.

5. The elastic probe structure according to claim 1, characterized in that, The bending track is configured such that, under the limited space within the plastic cavity, the maximum stress of both the first elastic arm and the second elastic arm is lower than the material yield strength.

6. The elastic probe structure according to claim 1, characterized in that, Under the preset downward displacement, the stress concentration factor of the first elastic arm and / or the second elastic arm of the bent track section is lower than the preset coefficient value.

7. The elastic probe structure according to claim 1, characterized in that, The first contact portion is configured to mate with the conductive terminal of the first module, and the second contact portion is configured to mate with the conductive terminal of the second module, wherein the second module is an expansion module.

8. The elastic probe structure according to claim 2, characterized in that, The ratio of the first positive force to the second positive force is greater than or equal to a first preset ratio and less than or equal to a second preset ratio.

9. A bidirectional mating connector, characterized in that, include: Includes: upper probe module, connector body, lower contact terminal module and lower probe module; The connector body is an insulating base with at least one axially penetrating receiving cavity inside, each receiving cavity being used to accommodate the elastic probe structure as described in any one of claims 1 to 8.

10. The bidirectional plug-in connector according to claim 9, characterized in that, The probe modules on the top and bottom sides are used to allow probes to be inserted from the top and bottom ends of the connector body, respectively, and cooperate with the corresponding elastic probe structure to achieve bidirectional electrical connection.

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