Link test fixture and link test method

Abstract

This application provides a link test fixture and a link test method, which can be applied to the field of link test technology. The fixture includes: a controller, used to determine channel configuration information and test strategy for at least one extended link under test on the motherboard according to test instructions; generate channel detection instructions based on the channel configuration information and provide them to a multi-stage RF switch module; generate channel activation instructions based on power detection results, test strategy, and channel configuration information and provide them to the multi-stage RF switch module to activate at least one target RF channel; a multi-stage RF switch module, used to activate the RF channel under test between the controller and at least one extended link under test, or to activate the target RF channel between one of the test devices and the controller and the extended link under test, to test at least one extended link under test; and a power detection module, used to perform power detection on at least one RF channel under test, obtain the power detection results, and provide them to the controller.

Description

Technical Field

[0001] This application relates to the field of link testing technology, and more specifically to a link testing fixture and a link testing method. Background Technology

[0002] Multiple serial expansion links on the server motherboard can receive or transmit serial expansion signals to other servers. Therefore, the integrity and quality of signals transmitted via these serial expansion links are crucial aspects of the testing process. However, existing testing equipment requires repeated plugging and unplugging between different test interfaces and necessitates connecting external testing equipment via multiple cables to meet various testing requirements, making efficient and convenient testing of serial expansion links difficult. Summary of the Invention

[0003] In view of the above problems, this application provides a link testing fixture and a link testing method.

[0004] According to a first aspect of this application, a link test fixture is provided, comprising: a controller, configured to determine channel configuration information and test strategy for at least one extended link under test on a motherboard according to test instructions; generate channel detection instructions based on the channel configuration information and provide them to a multi-level RF switch module; generate channel activation instructions based on power detection results, test strategy, and channel configuration information and provide them to the multi-level RF switch module to activate at least one target RF channel; a multi-level RF switch module, electrically connected to the controller, configured to activate the RF channel under test between the controller and at least one extended link under test according to the channel detection instructions; and activate the target RF channel between one of the test device and the controller and at least one extended link under test according to the channel activation instructions to test at least one extended link under test; and a power detection module, electrically connected to the controller and the multi-level RF switch module, configured to perform power detection on at least one RF channel under test when the RF channel under test between the controller and at least one extended link under test is activated, obtain power detection results, and provide them to the controller.

[0005] A second aspect of this application provides a link testing method, comprising: a controller determining channel configuration information and a test strategy for at least one extended link under test on a motherboard according to a test instruction; generating a channel detection instruction based on the channel configuration information and providing it to a multi-level RF switch module; the multi-level RF switch module activating the RF channel under test between the controller and at least one extended link under test according to the channel detection instruction; a power detection module performing power detection on the activated at least one RF channel under test, obtaining a power detection result and providing it to the controller; the controller generating a channel activation instruction based on the power detection result, the test strategy, and the channel configuration information and providing it to the multi-level RF switch module; and the multi-level RF switch module activating a target RF channel between one of the test device and the controller and at least one extended link under test according to the channel activation instruction, so as to test at least one extended link under test.

[0006] According to embodiments of this application, a controller, a multi-stage RF switch module, and a power detection module can be integrated within the link test fixture. The controller autonomously determines the RF channel under test (RTD), test strategy, and channel configuration information corresponding to the RTD extension link based on test commands. It also determines the target RTD channel based on power detection results for testing the RTD extension link. This achieves highly autonomous and automated decision-making regarding the test sequence and channel conduction control, and allows for precise and flexible transmission of test signals within any RTD RF channel and RTD extension link. This simplifies the testing process while efficiently and accurately testing the RTD extension link.

[0007] Then, a power detection module is used to detect in real time whether the RF channel under test has the test conditions for signal transmission. Combined with a multi-level RF switch module that can control the switching of multiple RF channels, the reliability of the link test fixture is significantly improved. While ensuring that the test channels are isolated and independent, the complexity of related test interfaces, internal layout of the test fixture, and external wiring is reduced. This allows the link test fixture itself to have self-diagnostic capabilities for its internal structure, quickly locating internal anomalies through pre-test self-checks. This greatly reduces costs and operational complexity while enabling testing functions such as different test requirements and RF channel redundancy switching. Attached Figure Description

[0008] The above-mentioned contents, other objects, features and advantages of this application will become clearer from the following description of embodiments of this application with reference to the accompanying drawings.

[0009] Figure 1 A schematic diagram of a link test fixture according to an embodiment of this application is shown.

[0010] Figure 2A schematic diagram of a multi-stage radio frequency switch module according to an embodiment of this application is shown.

[0011] Figure 3a A schematic diagram of the target RF channel between the conduction controller and the extended link under test according to an embodiment of this application is shown.

[0012] Figure 3b A schematic diagram of the target radio frequency channel between the continuity test apparatus and the extended link under test according to an embodiment of this application is shown.

[0013] Figure 4 A schematic diagram of a two-stage radio frequency switch module according to an embodiment of this application is shown.

[0014] Figure 5 A schematic diagram of a target RF channel between a conduction controller and an extension link under test, according to another embodiment of this application, is shown.

[0015] Figure 6 A schematic diagram of the control of a secondary radio frequency switch module according to an embodiment of this application is shown.

[0016] Figure 7 A schematic diagram of a link test fixture according to another embodiment of this application is shown.

[0017] Figure 8a A schematic diagram of a link test according to an embodiment of this application is shown.

[0018] Figure 8b A schematic diagram of a link test according to another embodiment of this application is shown.

[0019] Figure 8c A schematic diagram of a link test according to yet another embodiment of this application is shown.

[0020] Figure 9 A flowchart of a link testing method according to an embodiment of this application is shown. Detailed Implementation

[0021] The embodiments of this application will now be described with reference to the accompanying drawings. However, it should be understood that these descriptions are exemplary only and are not intended to limit the scope of this application. In the following detailed description, numerous specific details are set forth to provide a thorough understanding of the embodiments of this application for ease of explanation. However, it will be apparent that one or more embodiments may be implemented without these specific details. Furthermore, descriptions of well-known structures and technologies are omitted in the following description to avoid unnecessarily obscuring the concepts of this application.

[0022] The terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the scope of this application. The terms “comprising,” “including,” etc., as used herein indicate the presence of the stated features, steps, operations, and / or components, but do not exclude the presence or addition of one or more other features, steps, operations, or components.

[0023] All terms used herein (including technical and scientific terms) have the meanings commonly understood by those skilled in the art, unless otherwise defined. It should be noted that the terms used herein are to be interpreted in a manner consistent with the context of this specification, and not in an idealized or overly rigid way.

[0024] When using expressions such as "at least one of A, B and C", they should generally be interpreted in accordance with the meaning that is commonly understood by those skilled in the art (e.g., "a system having at least one of A, B and C" should include, but is not limited to, a system having A alone, a system having B alone, a system having C alone, a system having A and B, a system having A and C, a system having B and C, and / or a system having A, B and C, etc.).

[0025] Multiple serial expansion links on the server motherboard can receive or transmit serial expansion signals to other servers. Therefore, the integrity and quality of signals transmitted via these serial expansion links are crucial aspects of the testing process. However, existing testing equipment requires repeated plugging and unplugging between different test interfaces and necessitates connecting external testing equipment via multiple cables to meet various testing requirements, making efficient and convenient testing of serial expansion links difficult.

[0026] An embodiment of this application provides a link test fixture, comprising: a controller, configured to determine channel configuration information and test strategy for at least one extended link under test on a motherboard according to test instructions; generate channel detection instructions based on the channel configuration information and provide them to a multi-level RF switch module; generate channel activation instructions based on power detection results, test strategy, and channel configuration information and provide them to the multi-level RF switch module to activate at least one target RF channel; a multi-level RF switch module, electrically connected to the controller, configured to activate the RF channel under test between the controller and at least one extended link under test according to the channel detection instructions; and activate the target RF channel between one of the test device and the controller and at least one extended link under test according to the channel activation instructions to test at least one extended link under test; and a power detection module, electrically connected to the controller and the multi-level RF switch module, configured to perform power detection on at least one RF channel under test when the RF channel under test between the controller and at least one extended link under test is activated, obtain power detection results, and provide them to the controller.

[0027] Figure 1A schematic diagram of a link test fixture according to an embodiment of this application is shown.

[0028] like Figure 1 As shown, the link test fixture may include a controller, a multi-stage RF switch module, and a power detection module. By electrically connecting one end of the link test fixture to multiple expansion links on the motherboard and the other end of the link test fixture to a test device (such as a bit error rate tester, oscilloscope, etc.), at least one of the multiple expansion links under test (PCIE (Peripheral Component Interconnect Express) link) can be tested.

[0029] Specifically, the controller can be used to determine the channel configuration information and test strategy for at least one extended link under test on the motherboard according to the test instructions; generate channel detection instructions and provide them to the multi-level RF switch module according to the channel configuration information; and generate channel turn-on instructions and provide them to the multi-level RF switch module according to the power detection results, test strategy and channel configuration information, so as to turn on at least one target RF channel.

[0030] The test instructions may include relevant test information for the current motherboard and at least one expansion link under test, such as the motherboard serial number, the test mode required for different expansion links under test, etc., but are not limited to this.

[0031] The controller can parse test commands received from external control devices such as host computers. After obtaining the relevant test information, it verifies the serial numbers of the multiple expansion links on the motherboard, the motherboard serial number, and the contents of the test information. If the verification is correct, the controller can generate an autonomous test strategy, including information such as the test order, based on the number, identification, and test mode of the expansion links under test.

[0032] Meanwhile, if the verification is correct, the controller can also determine from the channel configuration table the channel configuration information corresponding to the current extended link under test, which is used to control the conduction and closure of the RF channel in the multi-level RF switch module.

[0033] Then, the controller generates a channel detection command based on the channel configuration information and sends it to the multi-level RF switch module so that the extension link under test is electrically connected to the controller via the corresponding RF channel under test. Thus, the power detection module can perform power detection on the channel that is currently in operation, thereby determining whether the RF channel under test can operate normally, that is, whether it has the transmission conditions for signal testing.

[0034] Upon receiving the power detection result (information) of the RF channel under test from the power detection module, the controller can determine the target RF channel to be tested based on the current power detection result. Then, based on the test strategy generated by the pre-decision and the determined channel configuration information, it generates channel turn-on instructions related to the test and controls the multi-level RF switch modules to turn on the corresponding target RF channels in sequence, thereby performing relevant tests on the RF link under test.

[0035] The multi-stage RF switch module can be electrically connected to the controller to conduct the RF channel under test between the controller and at least one extended link under test according to the channel detection command; and to conduct the target RF channel between one of the test device and the controller and at least one extended link under test according to the channel conduction command, so as to test at least one extended link under test.

[0036] The multi-level RF switch module can control the conduction and de-conduction of multiple internal RF channels according to the channel detection command and channel conduction command sent by the controller, so that the test signal or related power information can be transmitted between the test device and the controller and the extension link under test.

[0037] The power detection module can be electrically connected to the controller and the multi-stage RF switch module. It is used to perform power detection on at least one RF channel under test when the controller is connected to at least one extended link under test, obtain the power detection result and provide it to the controller.

[0038] When the RF channel under test between the controller and the extended link under test is connected, the power detection module can detect the signal transmission status of the RF channel under test and send the relevant detection feedback results to the controller.

[0039] Meanwhile, the power detection module can also monitor the status of the signal channel during the testing of the extended link under test. When an abnormal state occurs in the target RF channel, it can promptly transmit the relevant detection results to the controller to avoid faults such as device damage or large error in test results caused by test abnormalities.

[0040] According to embodiments of this application, a controller, a multi-stage RF switch module, and a power detection module can be integrated within the link test fixture. The controller autonomously determines the RF channel under test (RTD), test strategy, and channel configuration information corresponding to the RTD extension link based on test commands. It also determines the target RTD channel based on power detection results for testing the RTD extension link. This achieves highly autonomous and automated decision-making regarding the test sequence and channel conduction control, and allows for precise and flexible transmission of test signals within any RTD RF channel and RTD extension link. This simplifies the testing process while efficiently and accurately testing the RTD extension link.

[0041] Then, a power detection module is used to detect in real time whether the RF channel under test has the test conditions for signal transmission. Combined with a multi-level RF switch module that can control the switching of multiple RF channels, the reliability of the link test fixture is significantly improved. While ensuring that the test channels are isolated and independent, the complexity of related test interfaces, internal layout of the test fixture, and external wiring is reduced. This allows the link test fixture itself to have self-diagnostic capabilities for its internal structure, quickly locating internal anomalies through pre-test self-checks. This greatly reduces costs and operational complexity while enabling testing functions such as different test requirements and RF channel redundancy switching.

[0042] Figure 2 A schematic diagram of a multi-stage radio frequency switch module according to an embodiment of this application is shown.

[0043] like Figure 2 As shown, in Figure 1 Based on the link test fixture shown, the multi-stage RF switch module can include a first-stage RF switch module and a second-stage RF switch module. The first-stage RF switch module can include two RF channels, and the second-stage RF switch module can include multiple RF channels (Lane 0~Lane 15), with no specific limit on the number of channels. The test strategy can include test modes, which can represent the test conditions performed on the extended link under test. For example, test modes can include signal transmission tests, signal reception tests, and random bit sequence tests.

[0044] Specifically, the first end of the primary RF switch module can be electrically connected to the controller and the test device, and the second end of the primary RF switch module can be electrically connected to the power detection module.

[0045] The primary RF switch module can be used to activate the RF channel under test between the controller and the power detection module according to the channel detection command when performing power detection; to activate the target RF channel between the test device and the power detection module according to the channel activation command when the test mode is communication test; and to activate the RF channel between the controller and the power detection module according to the channel activation command when the test mode is random bit sequence test.

[0046] Communication testing can include signal transmission testing and signal reception testing.

[0047] The primary RF switch module can be used to electrically connect the extension link under test to the test device or controller. By controlling the conduction and switching of the RF channel inside the primary RF switch module, the channel between the test device or controller and the power detection module can be made conductive. Thus, under different test modes or power detection conditions, the electrical connection between the extension link under test and different test instruments can be flexibly controlled to facilitate link testing or channel testing.

[0048] The first end of the secondary RF switch module can be electrically connected to the power detection module, and the second end of the secondary RF switch module can be electrically connected to the motherboard.

[0049] The secondary RF switch module can be used to, in the case of power detection, to conduct the RF channel under test between the primary RF switch module and at least one extended link under test according to the channel detection command; and in the case of communication test or random bit sequence test, to conduct the target RF channel between the primary RF switch module and at least one extended link under test according to the channel conduction command.

[0050] Based on the primary RF switch module, a secondary RF switch module is integrated between the power detection module and the extension link under test (DUT). By controlling the secondary RF switch module, the transmission of test signals can be controlled in stages and time periods, enabling the channel between the power detection module and the DUT to be connected. This allows the power detection module to perform relevant testing conditions on multiple RF channels within the secondary RF switch module. Combined with the channel control of the primary RF switch module, this jointly establishes signal transmission channels between the DUT and different test instruments.

[0051] According to embodiments of this application, by using a secondary RF switch module in conjunction with a primary RF switch module, the independence and isolation between multiple test channels can be maintained, while reducing the number of interfaces for electrical connections with external test devices. This avoids repeated plugging and unplugging and replacement of the link test fixture with external test devices and the extension link under test via high-frequency cables, improving component reliability. Responding to the controller's joint control of the primary and secondary RF switch modules, during the detection phase, the segmented RF channels are flexibly controlled to enable the power detection module to perform power detection on multiple RF channels within the secondary RF switch module. During the testing phase, in response to different test modes, the test device electrically connected to the extension link under test is flexibly activated to test the performance of the extension link under test. This achieves channel switching within milliseconds by controlling multiple RF switch modules via the controller, reducing physical operations and related mechanical friction on cables and fixture interfaces during testing, improving the long-term stability of the test fixture and various line connections, and simplifying the testing process while providing efficient, accurate, and reliable testing of the extension link under test.

[0052] Figure 3a A schematic diagram of the target RF channel between the conduction controller and the extended link under test according to an embodiment of this application is shown.

[0053] like Figure 3a As shown, in Figure 2 Based on the link test fixture shown, in response to the channel detection command issued by the controller, the controller and the power detection module are connected through the RF channel in the first-level RF switch module, and simultaneously, the power detection module and the first extended link under test on the motherboard are connected through the RF channel in the second-level RF switch module, thus forming a complete and connected RF channel for power detection. The connection between the fixture and the motherboard includes the first RF channel under test (Lane0), the second RF channel under test (Lane1), the third RF channel under test (Lane2), ..., the sixteenth RF channel under test (Lane15).

[0054] Figure 3b A schematic diagram of the target radio frequency channel between the continuity test apparatus and the extended link under test according to an embodiment of this application is shown.

[0055] like Figure 3b As shown, in Figure 2 Based on the link test fixture shown, in response to the channel activation command issued by the controller, the test device and the power detection module are connected through the RF channel in the first-level RF switch module. At the same time, the power detection module and the third extended link under test on the motherboard are connected through the RF channel in the second-level RF switch module, thus forming a complete RF channel to facilitate the transmission of test signals between the test device and the extended link under test and to perform link testing.

[0056] Figure 4 A schematic diagram of a two-stage radio frequency switch module according to an embodiment of this application is shown.

[0057] like Figure 4 As shown, in Figure 2 Based on the link test fixture shown, the secondary RF switch module can include a first secondary RF switch module and a second secondary RF switch module. Both the redundant first and second secondary RF switch modules can electrically connect the extended link under test to the test device or controller, thereby enabling the transmission of test signals in its RF channels.

[0058] Specifically, the first end of the first and second stage RF switch modules can be electrically connected to the power detection module, and the second end of the first and second stage RF switch modules can be electrically connected to the motherboard.

[0059] The first and second stage RF switch modules are used to conduct at least one first RF channel under test according to the channel detection command when the RF channel power is detected; when the power detection result is normal, at least one first target RF channel is conducted according to the channel configuration address in the channel conduction command, and the test device or controller tests the test signal from the motherboard.

[0060] When power detection of RF channels is required, the first RF channels under test are sequentially activated according to the configuration information of the first RF channel under test corresponding to the extended link under test as indicated in the channel detection command, thereby utilizing the power detection module to perform power detection on the first RF channel under test. The multiple first RF channels under test include the first first RF channel Lane0', the second first RF channel Lane1', the third first RF channel Lane2', and the sixteenth first RF channel Lane15'.

[0061] Based on the power detection results, the controller determines the first available RF channel under test within the first and second-level RF switch modules and uses it as the first target RF channel. Then, in response to the channel activation command issued by the controller based on the test strategy, the first and second-level RF switch modules sequentially activate the first target RF channel, thereby enabling link testing of the extended link under test using the test device or the controller.

[0062] According to embodiments of this application, the first and second stage RF switch modules can be used to switch internal RF channels quickly and accurately according to relevant control commands issued by the controller, thereby enabling different signal transmission paths as needed for testing. In the case of link testing, there is no need to repeatedly plug and unplug the test device from multiple interfaces to establish different conduction paths between the extended link under test and the test device, allowing test signals to be flexibly and accurately transmitted in any RF channel and the extended link under test, achieving one-to-many signal routing.

[0063] Further references are as follows Figure 4 As shown, the first end of the second-level RF switch module can be electrically connected to the power detection module, and the second end of the second-level RF switch module can be electrically connected to the motherboard.

[0064] The second-level RF switch module is used to, when the power detection result of the first RF channel under test is abnormal, conduct the second RF channel under test corresponding to the first RF channel under test with abnormal power according to the updated channel detection command received from the controller, and the power detection module performs power detection on the second RF channel under test; when the power detection result is normal, the second target RF channel is conducted according to the updated channel configuration address in the channel conduction command, and the test device or controller tests the test signal received from the motherboard.

[0065] If the power detection result of the first RF channel under test corresponding to the extended link under test is abnormal, it indicates that the first RF channel under test cannot transmit test signals normally. Therefore, the channel configuration information of the second RF channel under test corresponding to the abnormal first RF channel under test is obtained, and the relevant channel detection command is regenerated to control the conduction of the second RF channel under test within the second-level RF switch module. The multiple second RF channels under test include the first second RF channel Lane0'', the second second RF channel Lane1'', the third second RF channel Lane2'', and the sixteenth second RF channel Lane15''.

[0066] Then, the power detection module is used to perform power detection on the second RF channel under test. If the power detection result of the second RF channel under test is normal, it is determined as the second target RF channel for transmitting test signals. Subsequently, when it is necessary to test this extended link under test, the second-level RF switch module responds to the channel conduction command issued by the controller based on the test strategy, and conducts the second target RF channel, thereby using the test device or controller to perform link testing on the extended link under test.

[0067] Both the first and second level RF switch modules are electrically connected to multiple extension links, and each RF channel in the first and second level RF switch modules corresponds one-to-one with each RF channel in the second level RF switch module.

[0068] By using redundant first and second-level RF switch modules, when the RF channel in the first-level RF switch module is abnormal, the test signal can be introduced to another second-level RF switch module for transmission. Similarly, when the RF channel in the second-level RF switch module is abnormal, the test signal can be introduced to another first-level RF switch module for transmission, so as to avoid test failure caused by channel abnormality.

[0069] According to an embodiment of this application, a second-level RF switch module is set up as a redundant backup of the first-level RF switch module, based on the first-level RF switch module. When an abnormality occurs in the power detection of the first RF channel in the first-level RF switch module, the second RF channel in the corresponding second-level RF switch module can be turned on and its power detected. If the power detection of the second RF channel is normal, the second RF channel can be turned on to test the extended link under test. Thus, in terms of hardware structure, fault-tolerant conditions are set for the RF channel and the test environment, and the controller can perform a possible self-correction and reset environment. Through fixture self-testing, internal abnormalities can be quickly located, greatly reducing costs and operational complexity, while efficiently and accurately testing the extended link under test.

[0070] Figure 5 A schematic diagram of a target RF channel between a conduction controller and an extension link under test, according to another embodiment of this application, is shown.

[0071] like Figure 5 As shown, in Figure 4 Based on the link test fixture shown, for multiple extended links on the current motherboard, link testing is required for the first, second, and sixteenth extended links under test. Following the test strategy parsed from the test command and the determined channel configuration information, the controller sequentially activates the first first-under-test RF channel Lane0', the second first-under-test RF channel Lane1', and the sixteenth first-under-test RF channel Lane15' within the first and second-level RF switch modules, and performs power detection on them. If the controller receives a power detection result for the second first-under-test RF channel indicating an anomaly, it retrieves the configuration information of the second second-under-test RF channel Lane1'' corresponding to the second first-under-test RF channel from the channel configuration information, regenerates the channel detection command, and sends it to the second and second-level RF switch modules. If the power test result of the second RF channel under test is normal, the first RF channel under test Lane0', the second RF channel under test Lane1'', and the sixteenth RF channel under test Lane15' are identified as target RF channels to facilitate link testing.

[0072] Figure 6 A schematic diagram of the control of a secondary radio frequency switch module according to an embodiment of this application is shown.

[0073] like Figure 6As shown, for the channel activation within any secondary RF switch module, it can be considered that the controller determines the activation control address of the RF channel corresponding to each extended link. Then, based on the specific activation control address, a control command is sent to the secondary RF switch module to switch the activation of the internal RF channel.

[0074] For example, any two-stage RF switch module can have five digital control pins, ① to ⑤. GPIO (General-Purpose Input / Output) pins correspond to control pins, and a 5-bit binary address is set by outputting high or low levels. After this address is decoded by the two-stage RF switch module, the corresponding RF channel can be activated, electrically connecting it to the extension link under test. The mapping relationship between the binary address and the RF channel activation is shown in Table 1.

[0075] Table 1

[0076]

[0077] During relevant communication tests, the controller, based on test instructions and pre-stored control logic (such as the channel switching truth table above), determines the channel configuration information corresponding to the extended link under test. When any RF channel needs to be activated, the level signal corresponding to the binary address is applied to the digital control pin of the secondary RF switch module, so that the decoding circuit of the secondary RF switch module can recognize the address and quickly activate the corresponding RF channel.

[0078] Furthermore, multiple tertiary RF switch modules can be installed on the PCB traces on the side of the link test fixture where the secondary RF switch module is electrically connected to the extended link. Each tertiary RF switch module can be installed on two adjacent PCB traces corresponding to two adjacent extended links. When the RF channel is normal or the redundant RF channel is normal, the tertiary RF switch modules can maintain normal channel connections; that is, the first RF channel corresponds to the first extended link, and the second RF channel corresponds to the second extended link. However, when both the normal RF channel and the redundant RF channel are abnormal, it can be confirmed whether the adjacent RF channel or redundant RF channel connected to the same tertiary RF switch module is normal and in test mode. If it is normal but not in test mode, the link connection can be switched using the tertiary RF switch module, temporarily transmitting the test signal of the extended link under test via the RF channel or redundant RF channel corresponding to another extended link under test. During the test, the controller can control the flashing light to flash at a predetermined frequency to provide anomaly indication, thereby improving the stability and reliability of the link test fixture.

[0079] Figure 7 A schematic diagram of a link test fixture according to another embodiment of this application is shown.

[0080] like Figure 7 As shown, the link test fixture may also include an attenuator.

[0081] Specifically, the attenuator can be electrically connected to a multi-stage RF switch module to adjust the attenuation value of the attenuator to a first value according to the attenuation adjustment command from the controller when performing a transmit communication test or a random bit sequence test on at least one extended link under test; and to adjust the attenuator to a second value according to the attenuation adjustment command when performing a receive communication test on at least one extended link under test.

[0082] The first value is less than the second value.

[0083] When receiving communication tests are required on the extended link under test, the controller generates an attenuation adjustment command and sends it to the attenuator, adjusting the attenuation value within the attenuator to a second value. This facilitates interference to the signal transmitted to the extended link under test, attenuating and degrading the signal quality. During the formal test, an external test device (Bit Error Rate Tester) generates an initial signal, which is then transmitted to the attenuator via a primary RF switch module within the link test fixture. The attenuator performs interference attenuation processing on the received initial signal, obtaining an attenuated signal, which is then transmitted to the extended link under test via a secondary RF switch module. Upon receiving the attenuated signal, the motherboard analyzes it and generates a test signal containing the analyzed information. The attenuation value within the attenuator is then adjusted to a first value, and the test signal is returned to the Bit Error Rate Tester via the primary and secondary RF switch modules. The Bit Error Rate Tester analyzes the test signal and the initial signal to determine the motherboard and the extended link under test's ability to receive and identify interference signals.

[0084] When communication testing of the extended link under test is required, the controller generates an attenuation adjustment command and sends it to the attenuator, adjusting the attenuation value in the attenuator to a first value (close to 0) to avoid interference with the test signal transmitted in the RF channel. During the formal testing process, the primary and secondary RF switch modules inside the continuity test fixture generate test signals, which are transmitted to the target RF channel via the extended link under test, and then to an oscilloscope. The oscilloscope is used to analyze the test signals (e.g., precise measurement of physical layer parameters such as eye diagram, jitter, amplitude, etc., to verify whether they meet the standard specifications), thereby determining whether the test signal transmitted by the extended link under test is distorted.

[0085] According to embodiments of this application, by integrating an attenuator between the secondary RF switch module of the link test device and the extended link under test, the traditional ISI (Inter-Symbol Interference Test Board) that requires complex connections with numerous cables is replaced. With the controller's control commands on the attenuation value of the attenuator, signal loss can be actively and controllably introduced during the test as needed, influencing the signal generated by the bit error rate tester under received communication tests. This simplifies the connection of external devices and the testing process before testing, reduces system complexity and testing costs, and improves testing efficiency and operability.

[0086] According to an embodiment of this application, the controller can also be used to: determine at least one extended link to be tested and channel configuration information based on the test link information and motherboard serial number in the test instruction, wherein the channel configuration information includes the channel configuration address of at least one extended link to be tested.

[0087] The controller can parse test commands received from external control devices such as host computers to obtain test link information and the serial number of the motherboard currently under test. It then performs connection verification based on the motherboard serial number in the test command and the serial number of the currently connected motherboard. If the verification passes, the controller can determine the corresponding channel configuration address and generate channel configuration information based on the number, identifier, and test mode of the expansion links under test.

[0088] To confirm the channel configuration address and information, the test fixture can also include a non-volatile memory electrically connected to the controller. This non-volatile memory records and backs up the RF channels used in each test corresponding to the motherboard. After identifying the motherboard serial number, the historical information corresponding to that motherboard is retrieved from the stored records in the non-volatile memory. If historical records exist, the historical target RF channel corresponding to the extension link in the historical records is preferentially used as the current RF channel under test for subsequent power detection.

[0089] According to an embodiment of this application, a test strategy is determined based on the test mode and the number of extended links to be tested in the test instruction, and based on the link identifier of at least one extended link to be tested.

[0090] Once the channel configuration information is determined, a test strategy containing information such as the test order is determined based on the test mode required for each extended link under test and attribute information such as link identifier.

[0091] For example, link testing is required for both the first and second extended links under test. The first extended link needs to undergo both transmit and receive communication tests, while the second extended link needs to undergo both transmit communication and random bit sequence tests. Based on relevant basic attribute information, the controller can generate a test strategy that first performs receive communication tests on the first extended link, then sequentially performs transmit communication tests on both the first and second extended links, and finally performs random bit sequence tests on the second extended link.

[0092] According to an embodiment of this application, a channel detection command is generated based on the channel configuration information and provided to a multi-level RF switch module to perform power detection on the conducted RF channel using the power detection module.

[0093] Once the relevant channel configuration information and test strategy are determined, corresponding channel detection commands are sent to the primary and secondary RF switch modules according to the channel configuration information. This is to enable the channel under test between the controller, the power detection module, and the extended link under test, and to receive power detection information or power detection results sent by the power detection module.

[0094] According to an embodiment of this application, when the power detection result is normal, a channel activation command is generated based on the channel configuration information, the test mode and test sequence in the test strategy, and provided to the multi-level RF switch module to detect at least one extended link under test.

[0095] If the power test result is normal, the slight differences in the RF characteristics (such as insertion loss and return loss) of each signal path (especially between RF switches, PCB traces and connectors of different channels) inside the fixture caused by manufacturing tolerances can be calibrated and quantified to ensure that the fidelity of the signal arriving at the test port is consistent, regardless of which extension link the test signal originates from.

[0096] Specifically, for transmission communication testing, a vector network analyzer can be used beforehand to measure the link between the gold finger pins, the RF channel, the interface, and the oscilloscope, generating a corresponding S-parameter model. This S-parameter model is then saved as an s4p file (Scattering Parameter 4-Port File) and imported into the oscilloscope or controller. Before formal testing, the oscilloscope can automatically calculate corrections and use the S-parameter model to compensate for link errors. This eliminates the influence of non-ideal signal paths (such as cables, clamps, and probes), allowing the measurement reference point to move closer to the position corresponding to the extended link under test, better reproducing the signal and enabling accurate analysis, thus improving the accuracy and consistency of the test.

[0097] After completing the relevant calibrations before testing, the corresponding channel configuration addresses are retrieved from the channel configuration information according to the test mode and test sequence in the test strategy. Then, the corresponding channel turn-on command is generated and provided to the multi-level RF switch module to perform autonomous and orderly link testing on at least one extended link under test.

[0098] According to embodiments of this application, the controller parses the received test commands, determines the test strategy based on the parsed test information, performs operations such as power detection, and generates channel activation commands for the next stage of testing based on the power detection results. This achieves highly autonomous and automated decision-making regarding the test sequence and channel activation control of the link test, and allows for precise and flexible transmission of test signals in any RF channel and the extended link under test. This simplifies the test process while efficiently and accurately testing the extended link under test.

[0099] Furthermore, during link testing, the power detection module can also detect channel power in real time. The power detection module may include a second controller, one end of which can be electrically connected to the power detection module, and the other end can be electrically connected to the main controller (the aforementioned controller) via a control switch. During communication testing or random bit sequence testing, the main controller controls the control switch to turn on. The power detection module can then send power monitoring information to the second controller while transmitting test signals normally. The second controller then directly transmits the power detection results to the main controller (the aforementioned controller) in the fixture via the turned-on control switch, allowing the main controller to monitor and control the test status. When performing channel power detection beforehand, the main controller can control the control switch to turn off, and the power detection results can be transmitted to the main controller via a first-level RF switch module.

[0100] According to an embodiment of this application, the controller can also be used to: when the power detection result is normal, generate an attenuation adjustment command for regulating the attenuator according to the test mode, and provide it to the attenuator.

[0101] For receive communication testing, since the purpose of the receive communication test is to simulate the worst-case insertion loss condition so that the expansion link under test and the motherboard can still work normally, it is necessary to determine the operating voltage of the attenuator and adjust the attenuation value of the attenuator. Therefore, a link channel can be pre-constructed between the gold finger pin, the RF channel, the interface, the bit error rate tester, and the oscilloscope. The transmitting end of the interface is electrically connected to the oscilloscope, and the receiving end of the interface is electrically connected to the bit error rate tester. The bit error rate tester generates an initial signal and displays the corresponding initial signal on the oscilloscope. Then, it is transmitted to the attenuator through the above link channel. The attenuation value of the attenuator is adjusted so that the eye diagram displayed on the oscilloscope is at the minimum specification of the protocol (the minimum eye width of the diagram can be 0.3UI, and the eye height can be 15mV). Then, the attenuation value at this time is recorded as the second value and saved in the controller so that the attenuation value of the attenuator can be adjusted according to the test mode.

[0102] According to an embodiment of this application, a channel activation command is generated based on channel configuration information, test mode, and test sequence, and provided to a multi-level RF switch module.

[0103] After adjusting the attenuation value of the attenuator according to different test modes, a channel activation command is generated based on the predetermined test strategy and relevant information.

[0104] According to embodiments of this application, by conducting pre-connection tests, the attenuation values ​​corresponding to the receive communication test and the transmit communication test are determined. Then, before entering the formal test, the controller determines the attenuation value according to the current test mode and sends an attenuation adjustment command to the attenuator to adjust it. This realizes the replacement of the traditional ISI interference board, which requires complex connections with many cables, with the attenuator. With the controller automatically adjusting the attenuation value of the attenuator, it can be adapted to various test environments, so as to introduce signal loss into the signal generated by the bit error rate tester under the receive communication test, simplify the connection of external devices and the test process before testing, reduce system complexity and test costs, and improve test efficiency and operability.

[0105] According to embodiments of this application, the controller can also be used to: generate a random sequence and transmit it to at least one extended link under test through at least one radio frequency channel when performing a random bit sequence test on at least one extended link under test.

[0106] In addition to communication testing, link test fixtures can also perform random bit sequence testing on the extended link under test. Random bit sequence testing can be characterized as link bit error rate testing, thereby testing and verifying the information carrying capacity and anti-interference capability of the signals transmitted in the link.

[0107] The random bit sequence test is specifically designed for two types of motherboards: one where the CPU (Central Processing Unit) directly connects to the device, and another where the device-to-CPU link uses a retimer or switch chip to ensure signal quality. These motherboards typically also support PRBS testing and loopback functionality. By performing random bit sequence testing, high-speed links can be evaluated in segments to pinpoint the main bottlenecks causing signal distortion, providing a direct basis for subsequent link optimization.

[0108] In random bit sequence testing, the RF channel between the controller and the extension link under test needs to be activated. The controller then generates a random binary sequence (random sequence) based on a deterministic algorithm. This random sequence itself can be predetermined and periodically repeating, but its statistical properties (such as the distribution of "0" and "1") make it approximate a truly random sequence. The random sequence is then transmitted to the corresponding extension link under test via the RF channel.

[0109] After receiving the random sequence via the extension link under test, the motherboard parses and verifies the random sequence using the same algorithm and pre-agreed initial values ​​to obtain and generate a test sequence. The test sequence is then transmitted to the controller via the original RF channel.

[0110] According to an embodiment of this application, in response to a test sequence received from the motherboard via at least one extended link under test, an error check is performed on the test sequence based on a random sequence to obtain a random link test result.

[0111] The test sequence is obtained by the motherboard after parsing and verifying the random sequence.

[0112] The controller performs error checking on the received test sequence based on the random sequence it generates, thereby obtaining the error checking result, and then determining the random link test result based on the error checking result.

[0113] According to the embodiments of this application, based on communication testing, random bit sequence testing is introduced for different motherboards, thereby enabling diverse link tests on extended links without the need to build a complex testing environment, thus improving the flexibility and reliability of the link testing fixture.

[0114] According to an embodiment of this application, the link test fixture may further include: a high-speed serial interface that can be electrically connected to a multi-stage RF switch module for electrically connecting the test device to the multi-stage RF switch module.

[0115] High-speed cables allow the high-speed serial interface of the link test fixture to be electrically connected to external test equipment. The transmitting port of the high-speed serial interface can be electrically connected to the receiving end of a bit error rate tester (BERT) or an oscilloscope, and the receiving port of the high-speed serial interface can be electrically connected to the transmitting end of the BERT. During testing, the transmitting port of the link test fixture can be electrically connected to both the receiving end of the BERT and the receiving end of the oscilloscope. In this case, separate control switches are required at the cable connections between the high-speed serial interface and the oscilloscope and BERT, respectively. These switches are controlled by a controller to operate in different test modes, thereby further reducing the need for repeated plugging and unplugging of the link test fixture from the oscilloscope and BERT.

[0116] According to an embodiment of this application, the gold finger pins can be electrically connected to a multi-level RF switch module to electrically connect the multi-level RF switch module to multiple extension links on the motherboard.

[0117] According to an embodiment of this application, the serial port can be electrically connected to the controller and the host computer, and the controller receives control commands from the host computer via the serial port.

[0118] The serial port serves as a communication bridge connecting the host computer and the internal controller (MCU, Microcontroller Unit) of the fixture. The serial port channel is bidirectional. Downlink (from host computer to controller) is responsible for transmitting various control commands, such as "switch to Lane 3," "enable attenuator," and "query current status." Uplink (from controller to host computer) is responsible for feeding back fixture status information and self-test results collected by the controller to the host computer. This provides a stable and reliable data transmission channel.

[0119] The host computer serves as the human-machine interface and top-level decision-making center for the entire testing system. Users can pre-program complex test procedures on the host computer software. For example, they can set up a configuration table of channels that need to be traversed for testing and configure corresponding test parameters (such as signal rate and encoding scheme) for each test mode. During testing, the host computer can link with external bit error rate testers or oscilloscopes to perform measurements, achieving "one-click" fully automated testing, greatly improving efficiency and reliability. In addition, users can perform in-depth configuration of the fixture through the host computer, downloading different signal compensation parameters for different channels to achieve software calibration for specific channels and improve test accuracy.

[0120] The link test fixture may also include devices such as a display screen and diodes. The controller can project relevant results onto the display screen for display, and at the same time, control the blinking of the diodes to assist in providing test prompts.

[0121] Figure 8a A schematic diagram of a link test according to an embodiment of this application is shown.

[0122] like Figure 8a As shown, when performing transmission communication tests on the third extended link under test, lane2, the relevant device connection structure can be referenced. Figure 7 The controller parses the test commands to determine the channel configuration information and test strategy. After verifying and determining the target RF channel, it turns on the RF channel in the first-level RF switch module, connects the power detection module to the oscilloscope through the high-speed serial interface, turns on the RF channels in the first and second-level RF switch modules, and connects the power detection module to the attenuator. The test signal generated on the motherboard is transmitted to the oscilloscope through the third extended link under test lane2, the gold finger pin, the attenuator with the attenuation value of the first value, and the target RF channel for transmission communication test.

[0123] Figure 8b A schematic diagram of a link test according to another embodiment of this application is shown.

[0124] like Figure 8b As shown, when performing receive communication tests on the first extended link under test, lane 0, the relevant device connection structure can be referenced. Figure 7 The controller parses the test commands to determine the channel configuration information and test strategy. After verifying and determining the target RF channel, it activates the RF channel in the first-level RF switch module, electrically connects the power detection module to the bit error rate tester via a high-speed serial interface, activates the RF channels in the first and second-level RF switch modules, and electrically connects the power detection module to the attenuator. The bit error rate tester generates a signal, which is transmitted to the attenuator via the target RF channel. The attenuator with the second attenuation value performs signal attenuation and interference processing, and then transmits it to the motherboard via the first extended link under test, lane 0. After parsing the attenuated signal, the motherboard generates a test signal. The test signal is transmitted to the bit error rate tester via the first extended link under test, lane 0, the gold finger pin, the attenuator with the first attenuation value, and the target RF channel for receiving communication testing.

[0125] Figure 8c A schematic diagram of a link test according to yet another embodiment of this application is shown.

[0126] like Figure 8c As shown, when performing random bit sequence testing on the sixteenth extended link under test, lane 15, the relevant device connection structure can be referenced. Figure 7 With the target RF channel verified and determined, the RF channel in the first-stage RF switch module is activated, electrically connecting the power detection module to the controller. The RF channels in the second-stage RF switch modules are then activated, electrically connecting the power detection module to the attenuator. The controller, based on a deterministic algorithm, randomly generates a sequence and transmits it to the corresponding extended link under test (DUT) via the target RF channel. Upon receiving the random sequence via the DUT, the motherboard parses and verifies it using the same algorithm and pre-agreed initial values ​​to generate a test sequence. This test sequence is then transmitted to the controller via the original RF channel. The controller performs error checking on the received test sequence based on its own generated random sequence, obtaining the error checking result, and then determines the random link test result based on the error checking result.

[0127] Figure 9 A flowchart illustrating a link testing method according to an embodiment of this application is shown schematically.

[0128] like Figure 9 As shown, the link testing method in this embodiment includes operations S910 to S950.

[0129] When operating the S910, the controller determines the channel configuration information and test strategy for at least one extended link under test on the motherboard according to the test instructions; based on the channel configuration information, it generates channel detection instructions and provides them to the multi-level RF switch module.

[0130] When operating the S920, the multi-stage RF switch module activates the RF channel under test between the controller and at least one extended link under test according to the channel detection command.

[0131] When operating the S930, the power detection module performs power detection on at least one of the conducted radio frequency channels under test, obtains the power detection result, and provides it to the controller.

[0132] When operating the S940, the controller generates a channel activation command based on the power detection results, test strategy, and channel configuration information, and provides it to the multi-level RF switch module.

[0133] When operating the S950, the multi-stage RF switch module, according to the channel turn-on command, turns on the target RF channel between one of the test devices and controllers and at least one extension link under test, in order to test at least one extension link under test.

[0134] The effectiveness of the above testing methods can be referenced from the effectiveness of the link testing fixture mentioned above, and will not be repeated here.

[0135] The flowcharts and block diagrams in the accompanying drawings illustrate the architecture, functionality, and operation of possible implementations of systems, methods, and computer program products according to various embodiments of this application. In this regard, each block in a flowchart or block diagram may represent a module, segment, or portion of code containing one or more executable instructions for implementing a specified logical function. It should also be noted that in some alternative implementations, the functions indicated in the blocks may occur in a different order than those indicated in the drawings. For example, two consecutively indicated blocks may actually be executed substantially in parallel, and they may sometimes be executed in reverse order, depending on the functions involved. It should also be noted that each block in a block diagram or flowchart, and combinations of blocks in a block diagram or flowchart, may be implemented using a dedicated hardware-based system that performs the specified function or operation, or using a combination of dedicated hardware and computer instructions.

[0136] Those skilled in the art will understand that the features described in the various embodiments of this application can be combined and / or combined in various ways, even if such combinations or combinations are not explicitly described in this application. In particular, the features described in the various embodiments of this application can be combined and / or combined in various ways without departing from the spirit and teachings of this application. All such combinations and / or combinations fall within the scope of this application.

[0137] The embodiments of this application have been described above. However, these embodiments are merely illustrative and not intended to limit the scope of this application. Although various embodiments have been described above, this does not mean that the measures in the various embodiments cannot be used advantageously in combination. Without departing from the scope of this application, those skilled in the art can make various substitutions and modifications, all of which should fall within the scope of this application.

Claims

1. A link test fixture, comprising: The link test fixture includes: The controller is configured to determine, according to test instructions, channel configuration information and test strategy for at least one extended link under test on the motherboard; generate channel detection instructions and provide them to the multi-level RF switch module according to the channel configuration information; and generate channel activation instructions and provide them to the multi-level RF switch module according to the power detection results, the test strategy and the channel configuration information, so as to activate at least one target RF channel. A multi-stage RF switch module, electrically connected to the controller, is used to conduct the RF channel under test between the controller and at least one extended link under test according to the channel detection command; and to conduct the target RF channel between one of the test device and the controller and at least one extended link under test according to the channel conduction command, so as to test the at least one extended link under test. The power detection module is electrically connected to the controller and the multi-stage RF switch module. It is used to perform power detection on at least one RF channel under test when the controller is connected to at least one RF channel under test, obtain the power detection result and provide it to the controller.

2. The link test fixture of claim 1, wherein, The testing strategy includes testing modes; the multi-level RF switch module includes: A primary RF switch module is provided, with its first terminal electrically connected to the controller and the test device, and its second terminal electrically connected to the power detection module. The primary RF switch module is used to, in power detection mode, activate the RF channel under test between the controller and the power detection module according to the channel detection command; in communication test mode, activate the target RF channel between the test device and the power detection module according to the channel activation command; and in random bit sequence test mode, activate the RF channel between the controller and the power detection module according to the channel activation command. A secondary RF switch module, with its first terminal electrically connected to the power detection module and its second terminal electrically connected to the motherboard, is used to, under power detection conditions, activate the RF channel under test between the primary RF switch module and at least one extended link under test according to the channel detection command; and under test modes of communication testing or random bit sequence testing, activate the target RF channel between the primary RF switch module and at least one extended link under test according to the channel activation command.

3. The link test fixture of claim 2, wherein, The secondary radio frequency switch module includes: The first and second stage RF switch modules have a first terminal electrically connected to the power detection module and a second terminal electrically connected to the motherboard. The first and second stage RF switch modules are used for... When power detection is performed on the radio frequency channel, at least one first radio frequency channel under test is turned on according to the channel detection command; If the power detection result is normal, at least one first target RF channel is turned on according to the channel configuration address in the channel turn-on instruction, and the test device or the controller tests the test signal from the motherboard.

4. The link test fixture of claim 3, wherein, The secondary radio frequency switch module also includes: The second-level RF switch module has a first terminal electrically connected to the power detection module and a second terminal electrically connected to the motherboard. The second-level RF switch module is used for... If the power detection result of the first radio frequency channel under test is abnormal, the second radio frequency channel under test corresponding to the first radio frequency channel under test with abnormal power is turned on according to the updated channel detection command received from the controller, and the power detection module performs power detection on the second radio frequency channel under test. If the power detection result is normal, the second target RF channel is turned on according to the updated channel configuration address in the channel turn-on instruction, and the test device or the controller tests the test signal received from the motherboard.

5. The link testing fixture of claim 1, wherein, The test fixture also includes: An attenuator, electrically connected to the multi-stage RF switch module, is used to adjust the attenuation value of the attenuator to a first value according to an attenuation adjustment command from the controller when performing a transmit communication test or a random bit sequence test on at least one extended link under test; and to adjust the attenuation value of the attenuator to a second value according to an attenuation adjustment command when performing a receive communication test on at least one extended link under test, wherein the first value is less than the second value.

6. The link test fixture of claim 1, wherein, The controller is also used for: Based on the test link information and motherboard serial number in the test instruction, determine the at least one extended link to be tested and the channel configuration information, wherein the channel configuration information includes the channel configuration address of at least one extended link to be tested; Based on the test mode and the number of extended links to be tested in the test command, the test strategy is determined according to the link identifier of at least one extended link to be tested; Based on the channel configuration information, the channel detection command is generated and provided to the multi-level RF switch module so that the power detection module can be used to detect the power of the conducted RF channel. If the power detection result is normal, the channel activation command is generated according to the channel configuration information, the test mode and test sequence in the test strategy, and provided to the multi-level RF switch module to test at least one extended link under test.

7. The link testing fixture of claim 6, wherein, The controller is also used for: If the power detection result is normal, an attenuation adjustment command for regulating the attenuator is generated according to the test mode and provided to the attenuator. Based on the channel configuration information, the test mode, and the test sequence, the channel activation command is generated and provided to the multi-level RF switch module.

8. The link test fixture according to claim 7, characterized in that, The controller is also used for: In the case of performing random bit sequence testing on at least one extended link under test, a random sequence is generated and transmitted to at least one extended link under test through at least one radio frequency channel; In response to a test sequence received from the motherboard via at least one extended link under test, the test sequence is subjected to bit error checking based on the random sequence to obtain a random link test result, wherein the test sequence is obtained by the motherboard after parsing and verifying the random sequence.

9. The link test fixture according to claim 1, characterized in that, The link test fixture also includes: A high-speed serial interface is electrically connected to the multi-stage RF switch module, used to electrically connect the test device to the multi-stage RF switch module; The gold finger pins are electrically connected to the multi-level RF switch module and are used to electrically connect the multi-level RF switch module to multiple extension links on the motherboard. The serial port is electrically connected to the controller and the host computer, and the controller receives control commands from the host computer via the serial port.

10. A link testing method, applied to a link testing fixture as described in any one of claims 1-9, characterized in that, The link testing method includes: The controller determines the channel configuration information and test strategy for at least one extended link under test on the motherboard according to the test instructions; and generates channel detection instructions according to the channel configuration information and provides them to the multi-level RF switch module. According to the channel detection command, the multi-level RF switch module activates the RF channel under test between the controller and at least one extended link under test. The power detection module performs power detection on at least one of the conducted radio frequency channels under test, obtains the power detection result, and provides it to the controller; The controller generates a channel activation command based on the power detection result, the test strategy, and the channel configuration information, and provides it to the multi-level RF switch module. The multi-level RF switch module, according to the channel activation command, activates the target RF channel between one of the test devices and controllers and at least one extended link under test, so as to test at least one extended link under test.

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