A quality detection device for diodes

Abstract

The application discloses a quality detection device for diodes, and relates to the technical field of quality detection. The bottom of the fixed detection mechanism is provided with a conveying and collecting mechanism, one side of the conveying and collecting mechanism is provided with a collecting support, the fixed detection mechanism comprises a lifting support, a lifting cylinder is fixedly installed on the top inner side of the lifting support, a lifting plate is fixedly installed at the bottom of the lifting cylinder, lifting sliding sleeves are fixedly installed around the lifting plate, lifting sliding rods are slidably connected in the lifting sliding sleeves, the diodes are detected by using the digital multimeter, the longitudinal clamps can clamp and fix the longitudinal two sides of the diodes, can extrude the two pins at the same time, and can make the two pins rotate to the horizontal state, so that the diodes with the pins on the same side can be quickly detected.

Description

Technical Field

[0001] This invention relates to the field of quality inspection technology, specifically to a quality inspection device for diodes. Background Technology

[0002] In the manufacturing process of diodes, the testing of their electrical performance and polarity correction are of utmost importance. As a semiconductor device with unidirectional conductivity, diodes are widely used in circuits such as rectification, limiting, and switching. Whether their polarity is correct or not directly affects the function and stability of the circuit. Therefore, the polarity of diodes must be tested and corrected before leaving the factory.

[0003] Publication No. CN213813345U discloses a quality inspection device for light-emitting diodes (LEDs). It includes a second motor. When a light sensor is energized, it illuminates the LEDs on the surface of a conveyor belt. When poor light transmittance is detected, the second motor drives a pusher on the surface of a push rod to push the LEDs into a collection bin, facilitating the removal of LEDs with poor light transmittance. A first motor moves the first pulley and conveyor belt via a second pulley and the belt body, causing the LEDs on the surface to pass through the light sensor in batches, thus increasing the efficiency of inspection and removal. However, this patent still has the following problems in practical use: Although this LED quality inspection device illuminates the LEDs on the conveyor belt surface using a power-activated light sensor, and a second motor drives a pusher block on the push rod surface to push the LED into the recycling bin when poor light transmittance is detected, facilitating the inspection of LEDs with poor light transmittance, the operation is relatively complex and affects the detection efficiency. Existing technology uses a multimeter for diode inspection, but for large-scale diode inspection, the red and black probes of the multimeter need to be connected to the positive and negative terminals of the diode. Furthermore, different diode models have different polarity positions, and some diodes have leads on both sides. Since the diode leads are on the same side, quick connection of the leads is not possible, thus affecting the detection efficiency.

[0004] Therefore, a quality testing device for diodes is proposed to solve the problems mentioned above. Summary of the Invention

[0005] The purpose of this invention is to provide a quality testing device for diodes, to solve the problems mentioned in the background art, which require energizing the diode during testing, making the operation complex and affecting the testing efficiency. Existing technologies use multimeters for diode testing, but in large-scale diode testing, the red and black probes of the multimeter need to be connected to the positive and negative terminals of the diode. Furthermore, different diode models have different positive and negative terminal positions; some diodes have leads on both sides. Because the diode leads are on the same side, it is not possible to quickly connect the lead electrodes, thus affecting the diode testing efficiency.

[0006] To achieve the above objectives, the present invention provides the following technical solution: a quality testing device for diodes, comprising a fixed testing mechanism and a digital multimeter installed inside the fixed testing mechanism; The bottom of the fixed detection mechanism is provided with a conveying and collecting mechanism, and a collecting bracket is provided on one side of the conveying and collecting mechanism. Also includes: The fixed detection mechanism includes a lifting bracket, a lifting cylinder is fixedly installed on the top inner side of the lifting bracket, and a lifting plate is fixedly installed on the bottom of the lifting cylinder. The lifting plate is fixedly installed with lifting sliding sleeves around its perimeter, and a lifting sliding rod is slidably connected inside the lifting sliding sleeves. The lifting sliding rod is fixedly installed inside the lifting bracket around its perimeter. The bottom of the lifting plate is fixedly equipped with a worm gear protective cover, and a rotating bracket is symmetrically installed on the inner side of the lifting plate near the worm gear protective cover. A first rotating motor is fixedly installed on the outer side of the rotating bracket.

[0007] Preferably, a rotating worm is fixedly connected to the output end of the first rotating motor, a rotating worm wheel is meshed with one side of the rotating worm, the rotating worm wheel is rotatably connected to the lifting plate and the worm wheel guard, a second rotating motor is fixedly installed on the outside of the worm wheel guard, a first rotating gear is fixedly connected to the output end of the second rotating motor, a meshing gear ring is meshed with one side of the first rotating gear, the meshing gear ring is rotatably connected to the worm wheel guard, and connecting brackets are symmetrically installed on one side of the inner side of the meshing gear ring.

[0008] Preferably, a translation bracket is fixedly installed between the connecting brackets and on one side of the bottom of the rotating worm gear. A translation motor is fixedly installed at the end of the translation bracket. A translation threaded rod is fixedly connected to the output end of the translation motor. A translation threaded sleeve is threadedly connected to the outer side of the translation threaded rod. A detection pen is fixedly installed at the bottom of each of the two translation threaded sleeves.

[0009] Preferably, a fixed column is fixedly installed near the bottom center of the rotating worm gear on the lifting plate, the digital multimeter is fixedly installed at the bottom of the fixed column, connecting wires are symmetrically installed at the bottom of the digital multimeter, the connecting wires are fixedly connected to the test pen, a fixed bracket is fixedly installed at the bottom of the digital multimeter, and clamping rotating rods are symmetrically rotatably connected to both sides of the bottom of the fixed bracket, and transverse clamping brackets are rotatably connected to the bottom of both sides of the clamping rotating rods.

[0010] Preferably, the transverse clamping bracket is internally rotatably connected to a bidirectional threaded rod, both ends of which are fixedly connected to a second rotating gear. The bottoms of the two second rotating gears are meshed with a meshing rack. The outer side of the bidirectional threaded rod is symmetrically threaded with a longitudinal threaded sleeve. A connecting spring is fixedly connected to one side of the longitudinal threaded sleeve. A longitudinal clamping plate is fixedly connected between the two connecting springs. An adjusting sliding rod is fixedly installed on the inner bottom side of the longitudinal clamping plate. An adjusting sliding sleeve is slidably connected to the outer side of the adjusting sliding rod. An adjusting spring is fixedly installed on the top of the adjusting sliding sleeve. A longitudinal clamping plate is fixedly installed on the outer side of the adjusting sliding sleeve.

[0011] Preferably, a transverse sliding sleeve is symmetrically installed at the bottom of each of the two transverse clamping brackets. A transverse sliding rod is slidably connected inside each transverse sliding sleeve. A transverse spring is fixedly installed on one side of each transverse sliding sleeve. A clamping lifting frame is fixedly installed on the outer side of each transverse sliding rod and transverse spring. The meshing rack is fixedly installed on the top of the clamping lifting frame. A transverse sliding plate is fixedly installed at the bottom of each of the two transverse sliding sleeves. An adjusting bolt is threaded inside each transverse sliding plate. A compression spring is rotatably connected to the end of each adjusting bolt. A transverse clamping plate is fixedly installed at the end of each compression spring.

[0012] Preferably, the conveying and collecting mechanism includes a workbench, a controller is fixedly installed on the outside of the workbench, a conveying bracket is fixedly installed on the top of the workbench, a lifting bracket is fixedly installed on the top of the conveying bracket, a sprocket limiting cover is fixedly installed on the outside of the conveying bracket, a conveying motor is fixedly installed on one side inside the sprocket limiting cover, and a sprocket drive assembly is fixedly connected to the output end of the conveying motor.

[0013] Preferably, conveyor rollers are symmetrically installed on the outer side of the sprocket drive assembly, and a conveyor belt is drivenly connected to the outer side of the two conveyor rollers. A limit baffle is fixedly installed on the surface of the conveyor belt. An ejector cylinder is fixedly installed at the center of one side of the conveyor support. An ejector chute is fixedly installed on the side of the conveyor support away from the ejector cylinder. A defective product collection box is provided at the bottom of the ejector chute.

[0014] Preferably, a collecting motor is fixedly installed on the outer side of the collecting bracket, a collecting rotating roller is fixedly connected to the output end of the collecting motor, collecting rotating rings are symmetrically installed on the outer side of the collecting rotating roller, a plurality of connecting rotating shafts are rotatably connected between the collecting rotating rings, and a collecting rotating box is fixedly connected between two of the connecting rotating shafts.

[0015] Compared with the prior art, the beneficial effects of the present invention are as follows: This diode quality inspection device, by rotating the test pens at the bottom of two translational supports, can move the test pens to the two pin electrodes of the diode respectively, and use a digital multimeter to test the diode. When the digital multimeter displays a negative value, it indicates that the positive and negative terminals of the two test pens of the digital multimeter are reversed. By rotating the two test pens, the diode quality inspection can be performed quickly, improving the inspection efficiency. At the same time, by rotating, the two test pens can be moved to the same side, enabling rapid inspection of diodes with pins on the same side. The longitudinal clamp not only clamps and fixes the diode on both sides of the longitudinal direction, but also squeezes the two pins simultaneously, making the two pins rotate to a horizontal state, facilitating rapid inspection of diodes with pins on the same side and improving the stability of diode inspection. By starting the collection motor, the collection rotating roller and collection rotating ring are driven to rotate, and the collection rotating box can be rotated by the connecting rotating shaft, so that the collection rotating box is always in a vertical state, thereby enabling uninterrupted collection of qualified diodes. The specific details are as follows: 1. By setting up a fixed testing mechanism, not only can the lifting cylinder be activated to move the lifting plate up and down during diode testing, but the first rotating motor can also be activated to drive the rotating worm gear to rotate. Utilizing the meshing connection between the rotating worm gear and the rotating worm wheel, the rotating worm wheel drives the translation bracket on one side of the bottom to rotate. Simultaneously, the second rotating motor is activated to drive the first rotating gear to rotate. Utilizing the meshing connection between the first rotating gear and the meshing gear ring, the meshing gear ring drives the connecting bracket and the translation bracket on the other side to rotate. The translation motor at the end of the translation bracket is activated to drive the translation threaded rod to rotate, causing the translation threaded sleeve to move the test probes. By rotating the test probes at the bottom of the two translation brackets, the test probes can be moved to the two pin electrodes of the diode. A digital multimeter is then used to test the diode. When the digital multimeter displays a negative value, it indicates that the positive and negative terminals of the two test probes are reversed. Adjusting the two test probes by rotating them allows for rapid diode quality testing, improving testing efficiency. Furthermore, rotating the test probes allows them to be moved to the same side. This device enables rapid testing of diodes with pins on the same side. When the lifting plate lowers the digital multimeter and the fixed bracket, the transverse clamping plate contacts the conveyor belt, causing the clamping lifting frame to rise. Under the action of the clamping rotating rod, the transverse clamping bracket moves relative to the transverse sliding sleeve and the transverse sliding plate. The distance between the two transverse clamping plates is adjusted by rotating the adjusting bolt. The pressure spring is used to clamp and fix the transverse sides of the diode. While the transverse clamping bracket moves relative to each other, the second rotating gear and the meshing rack are meshed together, causing the second rotating gear to drive the bidirectional threaded rod to rotate. This causes the longitudinal threaded sleeve to move relative to the connecting spring and the longitudinal clamping plate. The sliding connection between the adjusting sliding rod and the adjusting sliding sleeve inside the longitudinal clamping plate, along with the spring force of the adjusting spring, causes the adjusting sliding sleeve to move the longitudinal clamping plate up and down. The longitudinal clamping plate not only clamps and fixes the longitudinal sides of the diode but also squeezes the two pins simultaneously, causing them to rotate to a horizontal position. This facilitates rapid testing of diodes with pins on the same side and improves the stability of diode testing. 2. By setting up a conveying and collecting mechanism, not only can the conveyor motor drive the sprocket transmission assembly and conveyor rollers to rotate, but also the transmission connection between the conveyor rollers and the conveyor belt can be used to drive the limit baffle to rotate, thereby limiting and conveying the diodes, realizing uninterrupted diode detection and improving the efficiency of diode detection. When a defective product is detected, the ejector cylinder is used to push the diode through the ejector chute to the defective product collection box for collection. By starting the collection motor, the collection rotating roller and collection rotating ring are driven to rotate. The connecting rotating shaft can realize the rotation of the collection rotating box, so that the collection rotating box is always in a vertical state, thereby enabling uninterrupted collection of qualified diodes. Attached Figure Description Figure 1 This is a schematic diagram of the overall three-dimensional structure of the present invention; Figure 2 This is a three-dimensional structural diagram of the fixed detection mechanism in this invention; Figure 3 This is a three-dimensional structural diagram of the rotating worm gear in this invention; Figure 4 This is a three-dimensional cross-sectional structural diagram of the worm gear protective cover in this invention; Figure 5 This is a three-dimensional structural diagram of the translational support cross-section in this invention; Figure 6 This is a three-dimensional structural diagram of the clamping rotating rod and the transverse clamping bracket in this invention; Figure 7 This is a schematic diagram of the three-dimensional cross-sectional structure of the longitudinal clamping plate in this invention; Figure 8 This is a schematic diagram of the three-dimensional structure of the transverse clamping plate in this invention; Figure 9 This is a three-dimensional structural diagram of the conveying and collecting mechanism in this invention; Figure 10 This is a three-dimensional structural diagram of the cross-section of the conveying support in this invention; Figure 11 This is a schematic diagram of the three-dimensional structure of the rotating box in this invention. In the diagram: 1. Fixed detection mechanism; 101. Lifting bracket; 102. Lifting cylinder; 103. Lifting plate; 104. Lifting sliding sleeve; 105. Lifting sliding rod; 106. Worm gear guard; 107. Rotating bracket; 108. First rotating motor; 109. Rotating worm; 110. Rotating worm gear; 111. Second rotating motor; 112. First rotating gear; 113. Meshing gear ring; 114. Connecting bracket; 11 5. Translation bracket; 116. Translation motor; 117. Translation threaded rod; 118. Translation threaded sleeve; 119. Testing pen; 120. Fixing post; 121. Digital multimeter; 122. Connecting wire; 123. Fixing bracket; 124. Clamping rotating rod; 125. Lateral clamping bracket; 126. Bidirectional threaded rod; 127. Second rotating gear; 128. Meshing rack; 129. Longitudinal threaded sleeve; 130. Connecting spring; 131. Longitudinal clamping plate; 132. Adjusting sliding rod; 133. Adjusting sliding sleeve; 134. Adjusting spring; 135. Longitudinal clamping plate; 136. Transverse sliding sleeve; 137. Transverse sliding rod; 138. Transverse spring; 139. Clamping lifting frame; 140. Transverse sliding plate; 141. Adjusting bolt; 142. Compression spring; 143. Transverse clamping plate; 2. Conveying and collecting mechanism; 201. Workbench; 202. Controller; 203. Conveyor support; 204. Sprocket limit cover; 205. Conveyor motor; 206. Sprocket drive assembly; 207. Conveyor roller; 208. Conveyor belt; 209. Limiting baffle; 210. Ejection cylinder; 211. Ejection chute; 212. Defective product collection box; 213. Collection support; 214. Collection motor; 215. Collection rotating roller; 216. Collection rotating ring; 217. Connecting shaft; 218. Collection rotating box. Detailed Implementation

[0016] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0017] Please see Figures 1-11This invention provides a technical solution: a quality testing device for diodes, comprising a fixed testing mechanism 1 and a digital multimeter 121 installed inside the fixed testing mechanism 1. A conveying and collecting mechanism 2 is provided at the bottom of the fixed testing mechanism 1, and a collecting bracket 213 is provided on one side of the conveying and collecting mechanism 2. The fixed testing mechanism 1 includes a lifting bracket 101, a lifting cylinder 102 is fixedly installed on the inner top of the lifting bracket 101, and a lifting plate 103 is fixedly installed on the bottom of the lifting cylinder 102. A lifting sliding sleeve 104 is fixedly installed around the lifting plate 103, and a lifting sliding rod 105 is slidably connected inside the lifting sliding sleeve 104. The lifting sliding rod 105 is fixedly installed around the inside of the lifting bracket 101. A worm gear guard 106 is fixedly installed on the bottom of the lifting plate 103. A rotating bracket 107 is symmetrically installed on the inner side of the lifting plate 103 near the worm gear guard 106. A first rotating motor 108 is fixedly installed on the outer side of the rotating bracket 107. A rotating worm 109 is fixedly connected to the output end of the first rotating motor 108. A rotating worm wheel 110 is meshed with one side of the rotating worm 109. The rotating worm wheel 110 is rotatably connected to the lifting plate 103 and the worm gear guard 106. A second rotating motor 111 is fixedly installed on the outer side of the worm gear guard 106. A first rotating gear 112 is fixedly connected to the output end of the second rotating motor 111. A meshing gear ring 113 is meshed with one side of the first rotating gear 112. The meshing gear ring 113 is meshed with the worm gear guard. A rotating connection is established. A connecting bracket 114 is symmetrically installed on one side of the inner side of the meshing gear ring 113. Translation brackets 115 are fixedly installed between the connecting brackets 114 and on one side of the bottom of the rotating worm gear 110. A translation motor 116 is fixedly installed at the end of the translation bracket 115. A translation threaded rod 117 is fixedly connected to the output end of the translation motor 116. A translation threaded sleeve 118 is threadedly connected to the outer side of the translation threaded rod 117. A test pen 119 is fixedly installed at the bottom of each of the two translation threaded sleeves 118. A fixing post 120 is fixedly installed on the lifting plate 103 near the bottom center of the rotating worm gear 110. A digital multimeter 121 is fixedly installed at the bottom of the fixing post 120. When testing the diode, the lifting cylinder 102 is activated to drive the lifting plate. 103. The lifting and moving mechanism starts by activating the first rotating motor 108, which drives the rotating worm gear 109 to rotate. Utilizing the meshing connection between the rotating worm gear 109 and the rotating worm wheel 110, the rotating worm wheel 110 drives the translation bracket 115 on one side of the bottom to rotate. Simultaneously, the second rotating motor 111 activates the first rotating gear 112, which meshes with the meshing gear ring 113. The meshing gear ring 113 drives the connecting bracket 114 and the translation bracket 115 on the other side to rotate. The translation motor 116 at the end of the translation bracket 115 activates the translation threaded rod 117, which rotates the translation threaded sleeve 118, causing the detection pen 119 to move. By rotating the detection pen 119 at the bottom of the two translation brackets 115...The test probes 119 can be moved to the two pins of the diode, and the diode can be tested using a digital multimeter 121. When the digital multimeter 121 displays a negative value, it indicates that the positive and negative terminals of the two test probes 119 are reversed. The two test probes 119 can be adjusted by rotating them, thus quickly testing the diode's quality and improving testing efficiency. Furthermore, rotating the test probes 119 allows them to be moved to the same side, enabling rapid testing of diodes with pins on the same side.

[0018] A connecting wire 122 is symmetrically mounted on the bottom of the digital multimeter 121. The connecting wire 122 is fixedly connected to the test probe 119. A fixed bracket 123 is fixedly mounted on the bottom of the digital multimeter 121. A clamping rotating rod 124 is symmetrically rotatably connected to both sides of the bottom of the fixed bracket 123. A transverse clamping bracket 125 is rotatably connected to the bottom of both sides of the clamping rotating rod 124. A bidirectional threaded rod 126 is rotatably connected inside the transverse clamping bracket 125. A second rotating gear 127 is fixedly connected to both ends of the bidirectional threaded rod 126. A meshing rack 128 is meshed to the bottom of both second rotating gears 127. A longitudinal threaded sleeve 129 is symmetrically threaded to the outer side of the bidirectional threaded rod 126. A connecting rod is fixedly connected to one side of the longitudinal threaded sleeve 129. A longitudinal clamping plate 131 is fixedly connected between two connecting springs 130. An adjusting sliding rod 132 is fixedly installed on the inner bottom side of the longitudinal clamping plate 131. An adjusting sliding sleeve 133 is slidably connected to the outer side of the adjusting sliding rod 132. An adjusting spring 134 is fixedly installed on the top of the adjusting sliding sleeve 133. A longitudinal clamping plate 135 is fixedly installed on the outer side of the adjusting sliding sleeve 133. A transverse sliding sleeve 136 is symmetrically installed on the bottom of each of the two transverse clamping brackets 125. A transverse sliding rod 137 is slidably connected inside each transverse sliding sleeve 136. A transverse spring 138 is fixedly installed on one side of each transverse sliding sleeve 136. A clamping lifting frame 139 is fixedly installed on the outer side of both the transverse sliding rod 137 and the transverse spring 138. (The text also mentions meshing teeth.) Strip 128 is fixedly installed on the top of the clamping lifting frame 139. Horizontal sliding plates 140 are fixedly installed at the bottom of both sides of the transverse sliding sleeves 136. Adjusting bolts 141 are threadedly connected to the inside of the transverse sliding plates 140. A compression spring 142 is rotatably connected to the end of the adjusting bolt 141. A transverse clamping plate 143 is fixedly installed at the end of the compression spring 142. When the lifting plate 103 lowers the digital multimeter 121 and the fixed bracket 123, the transverse clamping plate 143 contacts the conveyor belt 208, thereby causing the clamping lifting frame 139 to rise. Under the action of the clamping rotation rod 124, the transverse clamping bracket 125 can move the transverse sliding sleeves 136 and the transverse sliding plates 140 relative to each other. The two transverse clamps can be adjusted by rotating the adjusting bolts 141. The spacing between plates 143 utilizes the elastic force of the compression spring 142 to clamp and fix the diode on both sides laterally. Simultaneously, as the lateral clamping bracket 125 moves relative to each other, the meshing connection between the second rotating gear 127 and the meshing rack 128 causes the second rotating gear 127 to drive the bidirectional threaded rod 126 to rotate. This causes the longitudinal threaded sleeve 129 to drive the connecting spring 130 and the longitudinal clamping plate 131 to move relative to each other. Utilizing the sliding connection between the adjusting sliding rod 132 and the adjusting sliding sleeve 133 inside the longitudinal clamping plate 131, and under the elastic force of the adjusting spring 134, the adjusting sliding sleeve 133 drives the longitudinal clamping plate 135 to move up and down. The longitudinal clamping plate 135 not only clamps and fixes the diode on both sides longitudinally, but also...Simultaneously, it can compress two pins, rotating them to a horizontal position, facilitating rapid detection of diodes with pins on the same side and improving the stability of diode detection.

[0019] The conveying and collecting mechanism 2 includes a workbench 201. A controller 202 is fixedly installed on the outer side of the workbench 201. A conveying bracket 203 is fixedly installed on the top of the workbench 201. A lifting bracket 101 is fixedly installed on the top of the conveying bracket 203. A sprocket limit cover 204 is fixedly installed on the outer side of the conveying bracket 203. A conveying motor 205 is fixedly installed on one side inside the sprocket limit cover 204. A sprocket drive assembly 206 is fixedly connected to the output end of the conveying motor 205. Conveying rollers 207 are symmetrically installed on the outer side of the sprocket drive assembly 206. A conveyor belt 208 is drivenly connected to the outer side of the two conveying rollers 207. A limit baffle 209 is fixedly installed on the surface of the conveyor belt 208. One side of the conveying bracket 203... An ejector cylinder 210 is fixedly installed at the center. An ejector chute 211 is fixedly installed on the side of the conveyor bracket 203 away from the ejector cylinder 210. A defective product collection box 212 is set at the bottom of the ejector chute 211. The conveyor motor 205 drives the sprocket transmission assembly 206 and the conveyor roller 207 to rotate. Utilizing the transmission connection between the conveyor roller 207 and the conveyor belt 208, the conveyor belt 208 drives the limit baffle 209 to rotate, thereby limiting and conveying the diode, realizing uninterrupted diode detection, and improving the efficiency of diode detection. When a defective product is detected, the ejector cylinder 210 pushes the diode through the ejector chute 211 to the defective product collection box 212 for defective product collection.

[0020] A collecting motor 214 is fixedly installed on the outside of the collecting bracket 213. A collecting rotating roller 215 is fixedly connected to the output end of the collecting motor 214. A collecting rotating ring 216 is symmetrically installed on the outside of the collecting rotating roller 215. Several connecting shafts 217 are rotatably connected between the collecting rotating rings 216. A collecting rotating box 218 is fixedly connected between two connecting shafts 217. By starting the collecting motor 214, the collecting rotating roller 215 and the collecting rotating ring 216 are driven to rotate. The connecting shafts 217 can realize the rotation of the collecting rotating box 218, so that the collecting rotating box 218 is always in a vertical state, thereby enabling uninterrupted collection of qualified diodes.

[0021] Working principle: Before using this diode quality testing device, it is necessary to check the overall condition of the device to ensure it can operate normally. Figure 1 - Figure 11As shown, firstly, during diode testing, the lifting cylinder 102 is activated to move the lifting plate 103 up and down. The first rotating motor 108 is activated to rotate the rotating worm gear 109. Utilizing the meshing connection between the rotating worm gear 109 and the rotating worm wheel 110, the rotating worm wheel 110 drives the translation bracket 115 on one side of the bottom to rotate. Simultaneously, the second rotating motor 111 is activated to rotate the first rotating gear 112. Utilizing the meshing connection between the first rotating gear 112 and the meshing gear ring 113, the meshing gear ring 113 drives the connecting bracket 114 and the translation bracket 115 on the other side to rotate. The translation motor 116 at the end of the translation bracket 115 is activated to rotate the translation threaded rod 117, causing the translation... The threaded sleeve 118 moves the test probe 119. By rotating the test probe 119 at the bottom of the two translation brackets 115, the test probe 119 can be moved to the two pin electrodes of the diode. The diode is then tested using a digital multimeter 121. When the value displayed by the digital multimeter 121 is negative, it indicates that the positive and negative terminals of the two test probes 119 of the digital multimeter 121 are reversed. The two test probes 119 of the digital multimeter 121 can be adjusted by rotating them, thereby quickly testing the quality of the diode and improving the testing efficiency. At the same time, by rotating them, the two test probes 119 can be moved to the same side, enabling rapid testing of diodes with pins on the same side.

[0022] Secondly, when the lifting plate 103 lowers the digital multimeter 121 and the fixed bracket 123, the transverse clamping plate 143 contacts the conveyor belt 208, thereby causing the clamping lifting frame 139 to rise. Under the action of the clamping rotating rod 124, the transverse clamping bracket 125 can drive the transverse sliding sleeve 136 and the transverse sliding plate 140 to move relative to each other. The distance between the two transverse clamping plates 143 can be adjusted by rotating the adjusting bolt 141. The elastic force of the compression spring 142 is used to clamp and fix the transverse sides of the diode. While the transverse clamping bracket 125 moves relative to each other, the second rotating gear 127 and the meshing rack 128 are meshed together. The second rotating gear 127 drives the bidirectional threaded rod 126 to rotate, causing the longitudinal threaded sleeve 129 to drive the connecting spring 130 and the longitudinal clamping plate 131 to move relative to each other. Taking advantage of the sliding connection between the adjusting sliding rod 132 and the adjusting sliding sleeve 133 inside the longitudinal clamping plate 131, and under the elastic force of the adjusting spring 134, the adjusting sliding sleeve 133 drives the longitudinal clamping plate 135 to move up and down. The longitudinal clamping plate 135 can not only clamp and fix the two longitudinal sides of the diode, but also squeeze the two pins at the same time, so that the two pins rotate to a horizontal state, which facilitates the rapid detection of diodes with pins on the same side and improves the stability of diode detection.

[0023] Finally, the conveyor motor 205 drives the sprocket transmission assembly 206 and the conveyor roller 207 to rotate. Utilizing the transmission connection between the conveyor roller 207 and the conveyor belt 208, the conveyor belt 208 drives the limit baffle 209 to rotate, thereby limiting and conveying the diodes, achieving uninterrupted diode detection and improving the efficiency of diode detection. When a defective product is detected, the ejector cylinder 210 pushes the diode through the ejector chute 211 to the defective product collection box 212 for collection. By starting the collection motor 214, the collection rotating roller 215 and the collection rotating ring 216 are driven to rotate. The connecting shaft 217 enables the collection rotating box 218 to rotate, keeping the collection rotating box 218 in a vertical state, thus enabling uninterrupted collection of qualified diodes.

[0024] Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A quality testing device for diodes, comprising a fixed testing mechanism (1) and a digital multimeter (121) installed inside the fixed testing mechanism (1). The bottom of the fixed detection mechanism (1) is provided with a conveying and collecting mechanism (2), and a collecting bracket (213) is provided on one side of the conveying and collecting mechanism (2). Its features are, Also includes: The fixed detection mechanism (1) includes a lifting bracket (101), a lifting cylinder (102) is fixedly installed on the top inner side of the lifting bracket (101), and a lifting plate (103) is fixedly installed on the bottom of the lifting cylinder (102). Among them, a lifting sliding sleeve (104) is fixedly installed around the lifting plate (103), and a lifting sliding rod (105) is slidably connected inside the lifting sliding sleeve (104), and the lifting sliding rod (105) is fixedly installed around the inside of the lifting bracket (101); Among them, a worm gear protective cover (106) is fixedly installed at the bottom of the lifting plate (103), and a rotating bracket (107) is symmetrically installed on the inner side of the lifting plate (103) near the worm gear protective cover (106). A first rotating motor (108) is fixedly installed on the outer side of the rotating bracket (107).

2. The quality testing device for diodes according to claim 1, characterized in that: The output end of the first rotating motor (108) is fixedly connected to a rotating worm (109). A rotating worm wheel (110) is meshed with one side of the rotating worm (109). The rotating worm wheel (110) is rotatably connected to the lifting plate (103) and the worm wheel guard (106). A second rotating motor (111) is fixedly installed on the outside of the worm wheel guard (106). A first rotating gear (112) is fixedly connected to the output end of the second rotating motor (111). A meshing gear ring (113) is meshed with one side of the first rotating gear (112). The meshing gear ring (113) is rotatably connected to the worm wheel guard (106). A connecting bracket (114) is symmetrically installed on one side of the inside of the meshing gear ring (113).

3. The quality testing device for diodes according to claim 2, characterized in that: Translation brackets (115) are fixedly installed between the connecting brackets (114) and on one side of the bottom of the rotating worm gear (110). Translation motors (116) are fixedly installed at the ends of the translation brackets (115). Translation threaded rods (117) are fixedly connected to the output ends of the translation motors (116). Translation threaded sleeves (118) are threadedly connected to the outer side of the translation threaded rods (117). Detection pens (119) are fixedly installed at the bottom of the two translation threaded sleeves (118).

4. The quality testing device for diodes according to claim 3, characterized in that: A fixed column (120) is fixedly installed on the bottom center of the lifting plate (103) near the rotating worm gear (110). The digital multimeter (121) is fixedly installed on the bottom of the fixed column (120). A connecting line (122) is symmetrically installed on the bottom of the digital multimeter (121). The connecting line (122) is fixedly connected to the test pen (119). A fixed bracket (123) is fixedly installed on the bottom of the digital multimeter (121). A clamping rotating rod (124) is symmetrically rotatably connected to both sides of the bottom of the fixed bracket (123). A transverse clamping bracket (125) is rotatably connected to the bottom of both sides of the clamping rotating rod (124).

5. A quality testing device for diodes according to claim 4, characterized in that: The transverse clamping bracket (125) is internally rotatably connected to a bidirectional threaded rod (126). Both ends of the bidirectional threaded rod (126) are fixedly connected to a second rotating gear (127). The bottoms of the two second rotating gears (127) are meshed with a meshing rack (128). The outer side of the bidirectional threaded rod (126) is symmetrically threaded with a longitudinal threaded sleeve (129). One side of the longitudinal threaded sleeve (129) is fixedly connected to a connecting spring (130). The two connecting springs (130) are fixedly connected to a longitudinal clamping plate (131). An adjusting sliding rod (132) is fixedly installed on the inner bottom side of the longitudinal clamping plate (131). An adjusting sliding sleeve (133) is slidably connected to the outer side of the adjusting sliding rod (132). An adjusting spring (134) is fixedly installed on the top of the adjusting sliding sleeve (133). A longitudinal clamping plate (135) is fixedly installed on the outer side of the adjusting sliding sleeve (133).

6. The quality testing device for diodes according to claim 5, characterized in that: A transverse sliding sleeve (136) is symmetrically installed at the bottom of each of the two transverse clamping brackets (125). A transverse sliding rod (137) is slidably connected inside each of the transverse sliding sleeves (136). A transverse spring (138) is fixedly installed on one side of each transverse sliding sleeve (136). A clamping lifting frame (139) is fixedly installed on the outside of each of the transverse sliding rod (137) and the transverse spring (138). A meshing rack (128) is fixedly installed on the top of the clamping lifting frame (139). A transverse sliding plate (140) is fixedly installed at the bottom of each of the two transverse sliding sleeves (136). An adjusting bolt (141) is threaded inside the transverse sliding plate (140). A compression spring (142) is rotatably connected to the end of the adjusting bolt (141). A transverse clamping plate (143) is fixedly installed at the end of the compression spring (142).

7. The quality testing device for diodes according to claim 1, characterized in that: The conveying and collecting mechanism (2) includes a workbench (201), a controller (202) is fixedly installed on the outside of the workbench (201), a conveying bracket (203) is fixedly installed on the top of the workbench (201), a lifting bracket (101) is fixedly installed on the top of the conveying bracket (203), a sprocket limit cover (204) is fixedly installed on the outside of the conveying bracket (203), a conveying motor (205) is fixedly installed on one side inside the sprocket limit cover (204), and a sprocket drive assembly (206) is fixedly connected to the output end of the conveying motor (205).

8. A quality testing device for diodes according to claim 7, characterized in that: The sprocket drive assembly (206) is symmetrically equipped with conveyor rollers (207) on its outer side. The two conveyor rollers (207) are connected to a conveyor belt (208) on their outer sides. A limit baffle (209) is fixedly installed on the surface of the conveyor belt (208). An ejector cylinder (210) is fixedly installed at the center of one side of the conveyor support (203). An ejector chute (211) is fixedly installed on the side of the conveyor support (203) away from the ejector cylinder (210). A defective product collection box (212) is provided at the bottom of the ejector chute (211).

9. A quality testing device for diodes according to claim 8, characterized in that: A collection motor (214) is fixedly installed on the outside of the collection bracket (213). A collection rotating roller (215) is fixedly connected to the output end of the collection motor (214). A collection rotating ring (216) is symmetrically installed on the outside of the collection rotating roller (215). A plurality of connecting shafts (217) are rotatably connected between the collection rotating rings (216). A collection rotating box (218) is fixedly connected between two of the connecting shafts (217).

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