Method for detecting a surge arrester and a surge arrester

Abstract

The application is suitable for the technical field of lightning arrester detection, and particularly relates to a lightning arrester detection method and a durable lightning arrester. The method comprises the following steps: acquiring a reference voltage and a reference current; acquiring first detection information in response to a first detection operation; determining an equivalent voltage based on the first detection information, the reference voltage and the reference current, performing a second detection operation based on the equivalent voltage, and acquiring second detection information; and determining maintenance information based on the second detection information. The lightning arrester detection method provided by the application can improve the temperature aging of the lightning arrester and improve the prediction accuracy of the maintenance cycle of the lightning arrester.

Description

Technical Field

[0001] This application belongs to the field of surge arrester testing technology, and in particular relates to a surge arrester testing method and a durable surge arrester. Background Technology

[0002] In the operation and maintenance of power systems, surge arresters, as critical overvoltage protection devices, bear the important responsibility of preventing damage to power equipment from lightning and switching overvoltages. Their performance and lifespan directly affect the safe and stable operation of the power grid. With the continuous expansion of the power grid and the increasing complexity of the operating environment for power equipment, higher demands are placed on the precision and scientific nature of surge arrester lifespan management. Determining the maintenance intervals of surge arresters is of great significance for optimizing equipment replacement strategies, reducing operating costs, and improving the efficiency of power grid operation. The service life of surge arresters is mainly caused by the combined effects of voltage aging and temperature aging.

[0003] In related technologies, voltage aging refers to the high electric field stress experienced by the grain boundary layer inside the surge arrester under continuous operating voltage. This causes electrons to be excited and ions to migrate at the grain boundaries, leading to partial discharge. These phenomena gradually destroy the potential barrier structure of the grain boundaries, resulting in a deterioration of its nonlinear characteristics and thus causing the surge arrester to age. Temperature aging, on the other hand, occurs because the surge arrester itself has leakage current, which generates heat. This significantly accelerates the ion migration and chemical reaction rates in the microstructure of the surge arrester, accelerating the degradation of the grain boundary barrier and irreversibly altering the electrical characteristics of the surge arrester, thus causing the surge arrester to age. Furthermore, voltage aging and thermal aging are not independent. Uneven voltage distribution in the surge arrester can cause a slight increase in the leakage current of the surge arrester's varistors. This increased leakage current generates more heat, raising the varistor temperature and exacerbating the temperature aging effect. This further increases the leakage current, generating even more heat, ultimately creating a vicious cycle where voltage aging reinforces temperature aging, and then temperature aging, in turn, exacerbates voltage aging. Therefore, predicting the service life of surge arresters is of paramount importance. Summary of the Invention

[0004] This application provides a method for testing surge arresters and a withstand voltage surge arrester, which can improve the problem of unpredictable maintenance cycle of surge arresters caused by the combined effects of temperature aging, voltage aging and temperature aging.

[0005] In a first aspect, embodiments of this application provide a method for detecting surge arresters, the method comprising: Obtain a reference voltage and a reference current; wherein the reference voltage is used to reflect the rated AC voltage of a standard surge arrester, and the reference current is used to reflect the peak current under the reference voltage; In response to a first detection operation, first detection information is acquired; wherein, the first detection operation refers to the action of applying a DC voltage to the positive and negative electrodes from zero to a preset target voltage value at a preset pressurization rate, and the first detection information includes the changes in detection voltage and detection current under the first detection operation; The equivalent voltage is determined based on the first detection information, the reference voltage, and the reference current, and a second detection operation is performed based on the equivalent voltage to obtain second detection information; wherein, the equivalent voltage is used to reflect the rated AC voltage converted by the surge arrester under DC voltage, the second detection operation refers to the action of applying the equivalent voltage to the positive electrode and the negative electrode, and the second detection information is used to reflect the pulse wave generated by the resistor array under the second detection operation; Based on the second detection information, maintenance information is determined; wherein the maintenance information is used to reflect the timing of the surge arrester replacement.

[0006] The technical solutions described in this application embodiment have at least the following technical effects: The surge arrester detection method provided in this application first obtains a reference voltage reflecting the rated AC voltage of a standard surge arrester and a reference current reflecting the peak current of the standard surge arrester under the reference voltage. Then, in response to a first detection operation, the DC voltage applied to the positive and negative electrodes of the surge arrester is increased from zero to a preset target voltage value at a preset rate. Next, first detection information is obtained, including information reflecting changes in the detection voltage and detection current under the first detection operation. Based on the first detection information, the reference voltage, and the reference current, the equivalent voltage of the rated AC voltage converted by the surge arrester under the DC voltage is determined. Then, a second detection operation is performed, applying the equivalent voltage to the positive and negative electrodes of the surge arrester. Finally, second detection information is obtained, including information about the pulse wave generated by the resistor array under the second detection operation. Finally, based on the second detection information, the replacement timing of the surge arrester is determined.

[0007] This method effectively obtains initial detection information by performing gradual DC voltage detection on the surge arrester before it is put into operation. Then, by comparing the reference voltage, reference current, and the initial detection information, the production deviation between the surge arrester and the ideal surge arrester is determined, thereby identifying the equivalent voltage that closely reflects actual operating conditions. A second detection operation is then performed based on the equivalent voltage to acquire pulse waves, recording the core electrical characteristics of the surge arrester in its initial, intact state. This provides a direct comparison sample for assessing the aging degree during subsequent use. Finally, the maintenance information is analyzed using the second detection information to comprehensively capture the performance degradation pattern of the surge arrester during use, thereby determining the timing of subsequent maintenance for the manufactured surge arrester. This method also overcomes the limitations of traditional methods that rely solely on operating time. Furthermore, by combining surge arresters with housings featuring flow cavities and resistor elements with through-holes, the impact of temperature aging on surge arrester maintenance information can be reduced, ultimately significantly improving the accuracy and reliability of maintenance information prediction and providing early warning of potential failure risks.

[0008] Secondly, embodiments of this application provide a durable surge arrester, including: The shell has a cavity, and the shell has a flow cavity. Both ends of the flow cavity have channels. The diameter of the flow cavity is larger than the diameter of the channel, and the flow cavity is in communication with the channel. A resistor assembly, wherein the resistor assembly is formed by stacking and connecting at least two resistors, the resistor assembly is located in the cavity, and each resistor has a through hole; and At least two electrical contacts, one of which is connected to the upper end of the resistor group and fixed in the housing at the upper end of the flow cavity, and the other of which is connected to the lower end of the resistor group and fixed in the housing at the lower end of the flow cavity.

[0009] The durable surge arrester provided in this application provides a stable bearing space for the resistor element through the cavity of the housing. The design of the flow cavity and channel allows air to circulate into the interior of the durable surge arrester, reducing the temperature of the contact surface with the resistor element inside the durable surge arrester. This reduces the self-heating of the resistor element during use and reduces the aging effect of temperature aging on the surge arrester. At the same time, the cooperation between the cavity and the flow cavity further improves the stability of the resistor element in the housing, thereby ensuring the flatness of the resistor element stack and reducing the concentration of local electric field caused by poor contact, thus further improving the stability and safety of the surge arrester. Attached Figure Description

[0010] To more clearly illustrate the technical solutions in the embodiments of this application, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0011] Figure 1 This is a schematic diagram of the structure of a durable surge arrester provided in one embodiment of this application; Figure 2 This is a schematic flowchart of a surge arrester detection method provided in an embodiment of this application; Figure 3 This is a schematic diagram illustrating the implementation process of a surge arrester detection method provided in an embodiment of this application; Figure 4 This is a schematic diagram of the structure of a surge arrester detection system provided in one embodiment of this application; Figure 5 This is a schematic diagram of the control device of a surge arrester testing equipment provided in one embodiment of this application; The following are the labeling elements in the figure: 100. Durable surge arrester; 10. Housing; 11. Chamber; 12. Flow cavity; 13. Channel; 20. Resistance element; 30. Electrical contact. Detailed Implementation

[0012] In the following description, specific details such as particular system architectures and techniques are set forth for illustrative purposes and not for limitation, in order to provide a thorough understanding of the embodiments of this application. However, those skilled in the art will understand that this application may also be implemented in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, apparatuses, circuits, and methods have been omitted so as not to obscure the description of this application with unnecessary detail.

[0013] It should be understood that, when used in this application specification and the appended claims, the term "comprising" indicates the presence of the described features, integrals, steps, operations, elements and / or components, but does not exclude the presence or addition of one or more other features, integrals, steps, operations, elements, components and / or a collection thereof.

[0014] It should also be understood that the term “and / or” as used in this application specification and the appended claims means any combination of one or more of the associated listed items and all possible combinations, and includes such combinations.

[0015] It should be noted that when a component is referred to as being "fixed to" or "set on" another component, it can be directly on or indirectly on that other component. When a component is referred to as being "connected to" another component, it can be directly connected to or indirectly connected to that other component.

[0016] It should be understood that the terms "length", "width", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application.

[0017] As used in this application specification and the appended claims, the term "if" may be interpreted, depending on the context, as "when," "once," "in response to determination," or "in response to detection." Similarly, the phrase "if determined" or "if detected [the described condition or event]" may be interpreted, depending on the context, as meaning "once determined," "in response to determination," "once detected [the described condition or event]," or "in response to detection [the described condition or event]."

[0018] Furthermore, in the description of this application and the appended claims, the terms "first," "second," "third," etc., are used only to distinguish descriptions and should not be construed as indicating or implying relative importance.

[0019] References to "one embodiment" or "some embodiments" as described in this specification mean that one or more embodiments of this application include a specific feature, structure, or characteristic described in connection with that embodiment. Therefore, the phrases "in one embodiment," "in some embodiments," "in other embodiments," "in still other embodiments," etc., appearing in different parts of this specification do not necessarily refer to the same embodiment, but rather mean "one or more, but not all, embodiments," unless otherwise specifically emphasized. The terms "comprising," "including," "having," and variations thereof mean "including but not limited to," unless otherwise specifically emphasized.

[0020] In related technologies, voltage aging refers to the high electric field stress experienced by the grain boundary layer inside the surge arrester under continuous operating voltage. This causes electrons to be excited and ions to migrate at the grain boundaries, leading to partial discharge. These phenomena gradually destroy the potential barrier structure of the grain boundaries, resulting in a deterioration of its nonlinear characteristics and thus causing the surge arrester to age. Temperature aging, on the other hand, occurs because the surge arrester itself has leakage current, which generates heat. This significantly accelerates the ion migration and chemical reaction rates in the microstructure of the surge arrester, accelerating the degradation of the grain boundary barrier and irreversibly altering the electrical characteristics of the surge arrester, thus causing the surge arrester to age. Furthermore, voltage aging and thermal aging are not independent. Uneven voltage distribution in the surge arrester can cause a slight increase in the leakage current of the surge arrester's valence layer. This increased leakage current generates more heat, raising the temperature of the surge arrester and exacerbating the temperature aging effect. This further increases the leakage current, generating even more heat, ultimately creating a vicious cycle where voltage aging reinforces temperature aging, and then temperature aging, in turn, exacerbates voltage aging. Therefore, predicting the service life of surge arresters is of paramount importance.

[0021] Based on this, in order to improve the vicious cycle in which the temperature aging of surge arresters in related technologies increases voltage aging, this application provides a durable surge arrester and a method for detecting surge arresters.

[0022] Please refer to the following: Figure 1 The durable surge arrester 100 provided in the embodiments of this application will now be described. The durable surge arrester 100 includes a housing 10, a resistor array, and at least two electrical contacts 30, wherein: The housing 10 has a chamber 11, and a flow cavity 12 is also provided inside the housing 10. Both ends of the flow cavity 12 are provided with channels 13. The diameter of the flow cavity 12 is larger than the diameter of the channel 13. The flow cavity 12 and the channel 13 are interconnected. The flow cavity 12 and the channel 13 are used together to circulate air and cool the resistor array inside the durable surge arrester 100.

[0023] The resistor group is formed by stacking at least two resistors 20 into a whole, and the resistor group is located in the chamber 11. The chamber 11 and the flow cavity 12 together form the inner and outer boundaries of the fixed resistor group. Each resistor has a through hole with the same diameter as the flow cavity 12. The resistor group is used to prevent the working voltage from passing through or to allow overvoltage to flow.

[0024] One of the electrical contacts is connected to the upper end of the resistor assembly and fixed in the housing 10 at the upper end of the flow cavity 12. The other electrical contact 30 is connected to the lower end of the resistor assembly and fixed in the housing 10 at the lower end of the flow cavity 12. One of the electrical contacts is used to connect to the user equipment, and the other electrical contact is used for grounding.

[0025] It is understood that in the use of the durable surge arrester 100, air enters the flow cavity 12 through the channel 13 and cools the resistor element 20 inside the cavity of the housing 10. The housing 10 is a structure capable of supporting the electrode element and providing a mounting base for the electrode element. For example, the housing 10 can be a cylindrical cavity structure, a square container structure, or other irregular cavity structure. Its material is made of insulating material, such as ceramic, silicone rubber, etc., but not limited to these. The resistor element 20 is made of a material capable of preventing the flow of working voltage and allowing the flow of overvoltage, and the size of the through hole opened in the resistor element 20 is the same as the size of the flow cavity 12. For example, the resistor element 20 can be a zinc oxide resistor element or a semiconductor TVS diode material, etc. The electrical contact 30 is used to connect user equipment and ground. For example, the electrical contact 30 can be a cylindrical cavity structure, a square container structure, or other irregular cavity structure. The electrical contact 30 is made of a conductive material.

[0026] As can be seen from the above, the durable surge arrester 100 provided in this application embodiment has a cavity 11 in the housing 10 that can provide a stable bearing space for the resistor 20. The design of the flow cavity 12 and the channel 13 allows air to flow into the interior of the durable surge arrester 100, reducing the temperature of the contact surface between the durable surge arrester 100 and the resistor 20 in the interior of the durable surge arrester 100, thereby reducing the self-heating of the resistor 20 during use and reducing the aging effect of temperature aging on the surge arrester.

[0027] To improve the accuracy of surge arrester maintenance cycle prediction due to the self-heating of the resistor elements during use in the surge arrester testing process of related technologies, this application embodiment also provides a surge arrester testing method, which can be applied to the durable surge arrester 100 described in any of the above embodiments. In this method, a first detection operation is performed in response to the DC voltage applied to the positive and negative electrodes of the surge arrester being increased from zero to a preset target voltage value at a preset rate, by acquiring a reference voltage reflecting the rated AC voltage of the standard surge arrester and a reference current reflecting the peak current of the standard surge arrester under the reference voltage. First detection information is acquired, including the changes in detection voltage and detection current under the first detection operation. Based on the first detection information, the reference voltage, and the reference current, the equivalent voltage of the rated AC voltage converted by the surge arrester under the DC voltage is determined. A second detection operation is then performed, applying the equivalent voltage to the positive and negative electrodes of the surge arrester. Second detection information is acquired, including the pulse wave generated by the resistor array under the second detection operation. Finally, based on the second detection information, the replacement timing of the surge arrester is determined.

[0028] This method effectively obtains initial detection information by performing gradual DC voltage detection on the surge arrester before it is put into operation. Then, by comparing the reference voltage, reference current, and the initial detection information, the production deviation between the surge arrester and the ideal surge arrester is determined, thereby identifying the equivalent voltage that closely reflects actual operating conditions. A second detection operation is then performed based on the equivalent voltage to acquire pulse waves, recording the core electrical characteristics of the surge arrester in its initial, intact state. This provides a direct comparison sample for assessing the aging degree during subsequent use. Finally, the maintenance information is analyzed using the second detection information to comprehensively capture the performance degradation pattern of the surge arrester during use, thereby determining the timing of subsequent maintenance for the manufactured surge arrester. This method also overcomes the limitations of traditional methods that rely solely on operating time. Furthermore, by combining surge arresters with housings featuring flow cavities and resistor elements with through-holes, the impact of temperature aging on surge arrester maintenance information can be reduced, ultimately significantly improving the accuracy and reliability of maintenance information prediction and providing early warning of potential failure risks.

[0029] The surge arrester detection method provided in this application embodiment can be applied to surge arrester detection equipment. In this case, the surge arrester detection equipment is the execution subject of the surge arrester detection method provided in this application embodiment. This application embodiment does not impose any restrictions on the specific type of surge arrester detection equipment.

[0030] For example, surge arrester testing equipment includes a DC testing device and a pulse testing device. The DC testing device is used to perform DC testing on durable surge arresters. The DC testing device includes a high-voltage DC generator, a leakage current acquisition module, and a voltage sampling unit. The high-voltage DC generator is used to apply an adjustable amplitude DC test voltage to the surge arrester. For example, the high-voltage DC generator can be an adjustable constant current constant voltage DC power supply, a voltage multiplier rectifier high-voltage generator, etc. The leakage current acquisition module is used to acquire the leakage current signal of the surge arrester under DC voltage in real time. For example, the leakage current acquisition module can be a microammeter, a high-precision shunt, or a Hall current sensor, etc. The voltage sampling unit is used to acquire the actual applied voltage output by the high-voltage DC generator to ensure the accuracy of the detection voltage. For example, the voltage sampling unit can be a high-voltage divider, a resistor voltage divider sampling circuit, etc. The pulse detection device is used to acquire the discharge pulse signal of a durable surge arrester during AC testing. The device includes an AC high-voltage generator, a phase synchronization module, and an RMS detection unit. The AC high-voltage generator applies a sinusoidal AC test voltage to the surge arrester; for example, it can be a resonant high-voltage generator, a frequency converter series resonant device, or a power frequency high-voltage test transformer. The phase synchronization module synchronizes the AC voltage signal with the pulse detection device to ensure the timely acquisition of the discharge pulse signal; for example, it can be a phase-locked loop circuit or an optocoupler synchronizer. The RMS detection unit acquires the RMS value of the AC test voltage and the RMS value of the surge arrester's AC leakage current in real time; for example, it can be a true RMS converter or a digital sampling analysis module.

[0031] To better understand the surge arrester detection method provided in the embodiments of this application, the specific implementation process of the surge arrester detection method provided in the embodiments of this application will be described by way of example below.

[0032] Figure 1 and Figure 2 A schematic flowchart of the surge arrester detection method provided in this application is shown. Please refer to [link / reference]. Figure 1 and Figure 2 The testing methods for surge arresters include: S100, obtain the reference voltage and reference current; wherein, the reference voltage is used to reflect the rated AC voltage of the standard surge arrester, and the reference current is used to reflect the peak current under the reference voltage.

[0033] It can be understood that the reference voltage refers to the rated AC voltage of a standard surge arrester under rated operating conditions that conforms to industry standards or product design specifications. Its value must meet the insulation coordination requirements and rated voltage level specifications of the surge arrester. It is a reference parameter for measuring the normal operating voltage range of the surge arrester. The reference current refers to the peak value of the current signal passing through the surge arrester when the above reference voltage is applied across the two ends of the standard surge arrester. This peak value reflects the conduction current characteristics of the standard surge arrester under rated voltage and does not include abnormal current components under fault conditions.

[0034] For example, the reference voltage and reference current can be obtained through manual input. Alternatively, they can be obtained directly from a database. A database contains the reference voltage and reference current corresponding to different types of surge arresters under standard production conditions. This data can be obtained through laboratory experiments, on-site measurements and monitoring, and past experience. After acquisition, the collected data is organized, classified, and archived, useful information and patterns are extracted, and the relevant data is then saved into the database to form a database.

[0035] S200, in response to the first detection operation, acquire first detection information; wherein, the first detection operation refers to the action of applying DC voltage to the positive electrode and the negative electrode from zero to a preset target voltage value according to a preset pressurization rate, and the first detection information includes the changes in detection voltage and detection current under the first detection operation.

[0036] It is understandable that due to differences in manufacturing processes, material properties, and installation losses among surge arresters, directly using a reference voltage for the second test would lead to distorted test results. The preset voltage increase rate refers to the pre-set rate of increase of the detection voltage during the first test operation. The preset target voltage value refers to the pre-set target voltage applied during the first test operation. When the detection voltage applied to the positive and negative electrodes increases from zero according to the preset voltage increase rate, the second test operation stops when the detection voltage matches the preset target voltage value. Both the preset voltage increase rate and the preset target voltage value can be obtained through manual input, or directly from a database, and so on.

[0037] S300 determines the equivalent voltage based on the first detection information, the reference voltage, and the reference current, and performs a second detection operation based on the equivalent voltage, and obtains the second detection information; wherein, the equivalent voltage is used to reflect the rated AC voltage converted by the surge arrester under DC voltage, the second detection operation refers to the action of applying the equivalent voltage to the positive electrode and the negative electrode, and the second detection information is used to reflect the pulse wave generated by the resistor group under the second detection operation.

[0038] It is understandable that when an equivalent voltage is applied to a surge arrester, the pulse wave signal generated by the internal resistor array due to the electric field, partial discharge, or changes in material properties, including characteristic parameters such as the amplitude, frequency, rise time, and duration of the pulse wave, forms the second detection information.

[0039] For example, the surge arrester's volt-ampere characteristic curve under the first detection operation can be determined using the first detection information. The current value corresponding to the characteristic point with the same reference voltage is then matched from the volt-ampere characteristic curve. The matched current value is then compared with the reference current to determine the equivalent coefficient. Finally, the equivalent voltage is determined based on the reference voltage and the equivalent coefficient. Alternatively, the detected voltage, detected current, reference voltage, and reference current from the first detection information can be input into a learning model. The learning model outputs the corresponding equivalent voltage. The training process of the learning model can involve inputting the first detection information, reference voltage, reference current, and the corresponding equivalent voltage as training data into the learning model for training to obtain the learning model. And so on, but not limited to these examples.

[0040] In one possible implementation, in step S300, determining the equivalent voltage based on the first detection information, the reference voltage, and the reference current includes: S310, Based on the first detection information, determine the characteristic curve; wherein, the characteristic curve is used to reflect the current-voltage characteristic curve of the surge arrester under the first detection operation.

[0041] It can be understood that the horizontal axis of the characteristic curve represents the detection voltage, and the vertical axis represents the detection current, which intuitively reflects the change in the conductivity of the surge arrester as the DC voltage gradually increases.

[0042] For example, firstly, the detection voltage data sequence and the corresponding detection current data sequence are extracted from the first detection information. Then, the original data is preprocessed to remove interference data and abnormal data, and the correct data is interpolated and completed. Then, the preprocessed detection voltage is used as the horizontal axis and the corresponding detection current is used as the vertical axis. By mapping each pair of voltage and corresponding current data to coordinate points, a smooth fitting algorithm is used to connect the coordinate points to generate a continuous volt-ampere characteristic curve.

[0043] S320 determines the equivalent current from the characteristic curve based on the reference voltage; whereby the equivalent current is used to reflect the leakage current of the surge arrester under the reference voltage.

[0044] It can be understood that the equivalent current refers to the current value corresponding to the data point on the characteristic curve that is equal to the reference voltage.

[0045] S330 determines the equivalence factor based on the equivalent current and the reference current; the equivalence factor is used to reflect the manufacturing differences between the surge arrester and the standard surge arrester.

[0046] It is understandable that the equivalent coefficient = equivalent current ÷ reference current.

[0047] S340 determines the equivalent voltage based on the reference voltage and the equivalent coefficient.

[0048] This is understandable, because the thermal effects generated inside the surge arrester by the rated AC voltage and the rated DC voltage are equivalent, and the equivalent voltage = reference voltage × equivalent coefficient.

[0049] This setup, by quantifying the difference between the actual and standard and converting it into an equivalent voltage, ensures that the pressure conditions for the second test closely match the electrical characteristics of the surge arrester. This provides a prerequisite for the accuracy of the subsequent second test information (pulse wave). It also ensures that the voltage applied during the second test can simulate the equivalent state of the rated AC voltage in actual operation without causing additional damage to the surge arrester. This makes subsequent quality assessments, initial life calculations, and degradation coefficient analyses based on pulse waves more valuable.

[0050] S400, based on the second detection information, determines maintenance information; wherein, the maintenance information is used to reflect the timing of the surge arrester replacement.

[0051] It is understandable that maintenance information is used to determine whether the surge arrester needs to be replaced and the optimal replacement time window.

[0052] For example, the second detection information can be used to determine the measure of the surge arrester's aging degree and information for assessing the current production quality of the surge arrester. Then, based on the information assessing the current production quality of the surge arrester, the maximum service life of the surge arrester can be determined. Finally, based on the measure of aging degree and the maximum service life, maintenance information can be determined. Alternatively, the second detection information can be input into a learning model, and the learning model can output the corresponding maintenance information, and so on, but it is not limited to these methods.

[0053] This setup allows for the acquisition of initial detection information by performing a gradual DC voltage test on the surge arrester before it is put into operation. Then, by comparing the initial detection information with a reference voltage and current, the manufacturing deviation between the surge arrester and a standard surge arrester is determined, thus establishing an equivalent voltage that closely reflects actual operating conditions. A second detection operation is then performed based on this equivalent voltage to acquire pulse wave images, recording the core electrical characteristics of the surge arrester in its initial, intact state (such as the waveform, amplitude, and rise time of the pulse wave). This provides a direct comparison sample for assessing the aging process during subsequent use. Finally, the initial lifespan is calculated using the second detection information, comprehensively capturing the performance degradation pattern of the surge arrester from manufacturing to use. This overcomes the limitations of traditional methods that rely solely on operating time. Furthermore, combined with a surge arrester featuring a casing with a flow cavity and resistance elements with through-holes, the impact of temperature aging on surge arrester maintenance information can be reduced, ultimately significantly improving the accuracy and reliability of maintenance information prediction and providing early warnings of potential failure risks.

[0054] In one possible implementation, in step S400, maintenance information is determined based on the second detection information, including: S410, based on the second detection information, determine the first quality assessment information, the second quality assessment information, and the deterioration coefficient; wherein, the deterioration coefficient is used to measure the degree of aging of the surge arrester.

[0055] It is understandable that the first quality assessment information is used to determine the performance status of the surge arrester at the time of testing. The second quality assessment information is used to determine whether the quality of the surge arrester is continuously stable, slowly deteriorating, or rapidly declining. The larger the deterioration coefficient value, the more severe the aging of the surge arrester. The deterioration coefficient refers to the degree to which the surge arrester is affected by voltage aging during its commissioning.

[0056] For example, the intensity of a single discharge pulse in the second detection information and the number of discharge pulses occurring per unit time in the second detection information can be determined using the second detection information. Then, based on the intensity of a single discharge pulse in the second detection information, the phase angle distribution of each discharge pulse is determined. Finally, the first quality assessment information and the degradation coefficient are determined using the phase angle distribution and the intensity of a single discharge pulse in the second detection information. The second assessment information is determined using the intensity of a single discharge pulse in the second detection information and the number of discharge pulses occurring per unit time in the second detection information. Alternatively, the second detection information can be input into a learning model, and the learning model can output the corresponding first quality assessment information, second quality assessment information, and degradation coefficient, etc., but is not limited to these methods.

[0057] In one possible implementation, step S410 involves determining the first quality assessment information, the second quality assessment information, and the degradation coefficient based on the second detection information, including: S411, Based on the second detection information, discharge quantity information and discharge repetition rate are obtained; wherein, the discharge quantity information is used to reflect the intensity of a single discharge pulse in the second detection information, and the discharge repetition rate is used to reflect the number of discharge pulses that occur per unit time in the second detection information.

[0058] It can be understood that discharge quantity information refers to the charge quantity of a single partial discharge of the surge arrester during the second detection operation, which can reflect the intensity of the partial discharge. Discharge repetition rate refers to the number of times the surge arrester discharges per unit time, which can reflect the frequency of partial discharges.

[0059] For example, for each selected valid pulse, the detected pulse signal can be plotted as a pulse diagram, and the discharge quantity can be learned by analyzing the pulse diagram based on the principle of partial discharge charge calculation. Where i is the signal strength of the pulse signal, and t is the detection time for the second detection operation. The current waveform of the pulse signal is integrated using a numerical integration algorithm to obtain the total charge corresponding to a single pulse. Regarding the discharge repetition rate, a statistical time window is first set, and the entire effective pulse sequence is traversed to count the number of effective pulses within each time window, which is the discharge repetition rate.

[0060] S412, based on the discharge quantity information, determine the phase angle distribution information reflecting each discharge pulse from the second detection information.

[0061] It can be understood that phase angle distribution information refers to the specific phase position corresponding to each effective discharge pulse within the phase period of the equivalent AC voltage applied in the second detection operation. The essence of the phase angle is the time correspondence between the discharge pulse occurrence time and the equivalent AC voltage waveform (e.g., the voltage zero crossing point is 0°, the positive peak value is 180°, and the negative peak value is 360°).

[0062] S413, based on phase angle distribution information and discharge quantity information, determines the first quality assessment information and degradation coefficient.

[0063] For example, the proportion of discharge pulses distributed in the negative half-wave and the proportion of discharge pulses distributed in the positive half-wave in the second detection information can be determined by the phase angle distribution information. The distribution balance of the discharge pulses can be determined by these two proportions. Then, the degree of discharge quantity exceeding the preset discharge quantity in the discharge quantity information is determined according to the discharge quantity information. Finally, the distribution balance is corrected by this degree to obtain the first quality assessment information. The maximum discharge quantity in each cycle phase is determined from the discharge quantity information by the phase angle distribution information. The cycle phase between the i-th maximum discharge quantity and the n-th maximum discharge quantity is taken as the deterioration cycle. The deterioration coefficient is determined by the difference between the i-th maximum discharge quantity and the n-th maximum discharge quantity and the deterioration cycle. Alternatively, the average discharge quantity distributed in the positive half-wave and the average discharge quantity distributed in the negative half-wave can be determined by the phase angle distribution information and the discharge quantity information. The intensity distribution balance of the discharge pulse can be determined by these two average discharge quantities. Then, the extent to which the discharge quantity information exceeds the preset discharge quantity in the total discharge quantity can be determined based on the discharge quantity information. Finally, the distribution balance is corrected based on this extent to obtain the first quality assessment information, and so on, but not limited to these.

[0064] In one possible implementation, in step S413, based on the phase angle distribution information and discharge quantity information, the first quality assessment information and degradation coefficient are determined, including: S4131, Based on the phase angle distribution information, determine the first ratio and the second ratio; wherein, the first ratio is used to reflect the proportion of the number of discharge pulses distributed in the negative half-wave in the second detection information, and the second ratio is used to reflect the proportion of the number of discharge pulses distributed in the positive half-wave in the second detection information.

[0065] It can be understood that the positive half-wave refers to the range of the equivalent AC voltage applied in the second detection operation within a phase angle of 0° to 180°, where the instantaneous voltage value is positive. The negative half-wave refers to the range of the phase angle of 180° to 360°, where the instantaneous voltage value is negative. The first ratio is the ratio of the number of pulses with a phase angle between 180° and 360° to the total number of effective discharge pulses. The second ratio is the ratio of the number of discharge pulses with a phase angle between 0° and 180° to the total number of effective discharge pulses.

[0066] S4132, based on the first ratio and the second ratio, determines the degree of symmetry; wherein, the degree of symmetry is used to reflect the degree of balance of the discharge pulse between the positive half-wave and the negative half-wave of the AC voltage.

[0067] It is understandable that the aging failure of surge arresters is essentially the combined effect of uneven discharge leading to localized wear and the accumulation of discharge energy causing material corrosion. Phase angle distribution information directly reflects the balance of discharge in the positive and negative half-waves of the AC voltage. A defect-free surge arrester should have a roughly symmetrical discharge. If the discharge proportion of one half-wave is too high, it will lead to excessive wear (accelerated aging) of the corresponding resistor element. The degree of symmetry is a quantitative indicator reflecting the balance between the first and second proportions, obtained by quantifying the difference between them. The higher the degree of symmetry, the more balanced the influence of the electric field distribution of the positive and negative half-waves of the AC voltage on the triggering of the discharge pulse. The greater the deviation, the lower the degree of symmetry, indicating a significant difference in the discharge activity of the positive and negative half-waves. The degree of symmetry is calculated as: 1 - (|first proportion - second proportion|) ÷ (|first proportion + second proportion|).

[0068] S4133, Based on the discharge quantity information and the preset discharge quantity, determine the hazard coefficient; wherein, the hazard coefficient is used to reflect the extent to which the discharge quantity information exceeds the preset discharge quantity in the total discharge quantity.

[0069] As we understand it, the hazard factor is the ratio of the number of effective discharge pulses exceeding the preset discharge limit in the statistical discharge data to the total number of effective discharge pulses. Pulses exceeding the preset discharge limit have higher energy, and long-term accumulation will accelerate the expansion of defects in the resistor array. The higher the hazard factor, the higher the proportion of high-energy discharge pulses, and the faster the aging of the surge arrester's performance. The preset discharge limit can be manually entered or obtained directly from a database.

[0070] S4134, based on the hazard factor, corrects the degree of symmetry to obtain the first quality assessment information.

[0071] That's understandable. First quality assessment information = degree of symmetry × hazard coefficient.

[0072] This configuration essentially involves a comprehensive assessment of both the evenness of discharge distribution and the severity of high-energy discharge hazards. Symmetry only reflects the balance in the number of positive and negative half-wave discharge pulses, without considering the actual damage impact of pulse energy on the surge arrester. The hazard coefficient, however, quantifies the proportion of high-energy discharges (exceeding the preset discharge amount). A higher hazard coefficient indicates a greater risk of corrosion and defect propagation of the resistor array by high-energy pulses, even if the discharge distribution is even. Therefore, the core purpose of this correction is to adjust the assessment weight of symmetry through the hazard coefficient, reducing quality misjudgments caused by solely relying on distribution evenness (e.g., even if the symmetry is acceptable, a high concentration of high-hazard pulses may still indicate potential quality issues).

[0073] In one possible implementation, in step S413, the degradation coefficient is determined based on the phase angle distribution information and the discharge quantity information, including: S4135 determines the maximum discharge quantity corresponding to each cycle phase based on phase angle distribution information and discharge quantity information.

[0074] It can be understood that each cycle phase refers to the complete phase cycle (0° to 360°) of the equivalent AC voltage applied in the second detection operation, and the corresponding maximum discharge quantity refers to the maximum value of the discharge quantity data of all effective discharge pulses within each complete cycle.

[0075] S4136, the periodic phase between the i-th maximum discharge quantity and the n-th maximum discharge quantity is taken as the deterioration period; where i and n are both positive integers, and i is less than n.

[0076] It can be understood that multiple maximum discharge quantities refer to the set of maximum discharge quantities corresponding to each complete phase cycle of each cycle within multiple complete equivalent AC voltage cycles continuously acquired in the second detection operation. All maximum discharge quantities are arranged sequentially according to the detection time. The i-th maximum discharge quantity and the n-th maximum discharge quantity refer to the two elements in this sequence that are numbered by positive integers (i and n are both ≥ 1) and satisfy i < n (i corresponds to an earlier detection cycle in time, and n corresponds to a later detection cycle in time). The deterioration period refers to the period phase interval corresponding to these two maximum discharge quantities when the value of the i-th maximum discharge quantity is less than the value of the n-th maximum discharge quantity.

[0077] S4137, based on the difference between the i-th and n-th maximum discharge quantities and the deterioration period, determine the k-th deterioration coefficient.

[0078] It can be understood that the kth deterioration coefficient = (nth maximum discharge - ith maximum discharge) ÷ deterioration cycle.

[0079] This design, through the comparison of maximum discharge quantities in each periodic phase, can accurately capture this gradual aging signal (such as a gradual increase in the maximum discharge quantity of a certain phase over multiple cycles). This makes the degradation coefficient a sensitive indicator reflecting the slow aging of durable surge arresters, solving the problem of insufficient prediction of aging trends in long-life equipment by traditional testing methods and enhancing the solution's specificity for durable surge arresters. It can improve upon the difficulty of traditional testing methods in capturing the core characteristic of surge arresters—the slow aging process and gradual performance degradation—which can easily lead to incorrect maintenance decisions due to misjudgment of the aging rate (such as accelerated aging without detection, failure to replace on time, or slow aging but excessive maintenance). S414, based on discharge quantity information and discharge repetition rate, determine the second quality assessment information.

[0080] For example, the average discharge quantity of a single pulse can be determined using discharge quantity information. Then, based on the average discharge quantity and discharge repetition rate, the degree of erosion of the surge arrester caused by the unaimed internal discharge phenomenon can be determined. Finally, the degree of erosion is used to determine the second quality assessment information. Alternatively, the discharge quantity information and discharge repetition rate can be input into a learning model, and the learning model can output the corresponding second quality assessment information, and so on, but are not limited to these methods.

[0081] This configuration, through the combination of phase angle distribution and discharge quantity, precisely matches the failure mechanism from uneven discharge to local aging. The discharge quantity information reflects the erosion intensity of a single discharge on the resistor element, and the discharge repetition rate reflects the frequency of erosion. The cumulative discharge energy formed by the combination of the two precisely matches the failure mechanism from high-frequency, high-intensity discharge to gradual material degradation, which is in line with the physical characteristics of the surge arrester.

[0082] In one possible implementation, in step S414, second quality assessment information is determined based on the discharge quantity information and the discharge repetition rate, including: S4141, based on the discharge quantity information, determine the average discharge quantity; wherein, the average discharge quantity is used to reflect the average discharge quantity of a single pulse.

[0083] It is understandable that the average discharge quantity refers to the ratio of the total discharge quantity of all valid discharge pulses in the second detection information to the total number of valid discharge pulses. The closer the average discharge quantity is to the preset average threshold, the more controllable the overall discharge intensity is. If it significantly exceeds the threshold, it indicates that the surge arrester has a large-scale or high-intensity defect and the overall discharge risk is high.

[0084] S4142, based on the average discharge quantity and discharge repetition rate, determine the discharge energy information; wherein, the discharge energy information is used to reflect the leakage capacity of the surge arrester per unit time.

[0085] It is understandable that discharge energy information is the total energy of all discharge pulses per unit time. The calculation logic is: energy of a single pulse × number of pulses per unit time. The larger the total energy, the lower the production quality of the surge arrester, and the lower its initial lifespan will be. It can also reflect that the electrical erosion and thermal damage to the resistor array in the surge arrester will be more severe, which will accelerate material aging, defect expansion and even lead to resistor breakdown failure due to long-term accumulated damage.

[0086] S4143, based on discharge energy information and preset adjustment coefficients, determines the second quality assessment information.

[0087] It is understandable that surge arrester aging stems not only from localized unbalanced discharge and single high-intensity discharges, but also from the long-term, high-frequency accumulation of discharge energy (even if a single discharge does not exceed the limit, high-frequency accumulation will gradually erode the resistor material). The preset adjustment coefficient refers to a pre-set adjustment coefficient used to adjust the discharge capacity information to a quantifiable scale. The second quality assessment information = preset adjustment coefficient × log10 (discharge capacity information + 1).

[0088] This setup, through the combined calculation of discharge quantity and discharge repetition rate, accurately captures the failure cause of energy accumulation, which is easily overlooked in traditional detection. It forms a two-way complementarity between single hazard and cumulative damage, as well as distribution balance and energy intensity, with the first quality assessment information. This allows the entire assessment system to comprehensively cover the two core mechanisms of surge arrester aging, further avoiding the one-sided risk of single-dimensional assessment.

[0089] S420, based on the first quality assessment information and the second quality assessment information, determines the initial life; wherein, the initial life is used to reflect the service life of the surge arrester produced.

[0090] For example, the health status of the surge arrester relative to the standard surge arrester can be obtained by determining the ratio between the first quality assessment information of the surge arrester and the first quality assessment information of the standard surge arrester, and the ratio between the second quality assessment information of the surge arrester and the second quality assessment information of the standard surge arrester. Then, by weighted summing these two ratios, the initial lifespan can be determined. Alternatively, the first and second quality assessment information can be input into a learning model, which outputs the corresponding initial lifespan, and so on, but are not limited to these methods.

[0091] In one possible implementation, step S420, determining the initial lifetime based on the first quality assessment information and the second quality assessment information, includes: S421, Based on the first quality assessment information and the first benchmark value, a first comparison value is determined; wherein, the first comparison value is used to reflect the ratio between the first quality assessment information and the first benchmark value.

[0092] It can be understood that the first comparison value = first quality assessment information ÷ first benchmark value. The first benchmark value refers to the first quality assessment information obtained by analyzing the pulse wave detected by the standard surge arrester under the reference voltage. The first benchmark value can be manually entered or obtained from a database.

[0093] S422, Based on the second quality assessment information and the second benchmark value, determine the second comparison value; wherein the second comparison value is used to reflect the ratio between the second quality assessment information and the second benchmark value.

[0094] It can be understood that the second comparison value = second quality assessment information ÷ second benchmark value. The second benchmark value refers to the second quality assessment information obtained by analyzing the pulse wave detected by the standard surge arrester under the reference voltage. The second benchmark value can be manually entered or obtained from a database.

[0095] S423, the first comparison value and the second comparison value are weighted and summed to obtain the relative health score.

[0096] It is understandable that the weights of the first and second comparison values ​​can be manually entered or obtained from a database, etc., but are not limited to these methods.

[0097] S424 determines the initial life based on relative health and baseline life; wherein, the baseline life is used to reflect the initial life of a standard surge arrester.

[0098] Relative health is a proportional parameter derived from the degree of fit between the initial performance of a surge arrester and the initial performance of a standard surge arrester, essentially reflecting the current health status of the arrester. Baseline life refers to the designed rated service life of a standard surge arrester under rated operating conditions and normal usage environments (such as normal humidity and no frequent overvoltages). It is determined by the product technical manual, industry standards (such as GB / T11032), and manufacturer calibration, representing the maximum service life under environmental influences only. Initial life is the remaining usable time of the surge arrester, considering both its current performance baseline and baseline life, without taking into account deterioration trends.

[0099] This setup, through a weighted summation mechanism, allows for flexible adjustment of weighting coefficients based on the application scenario and model characteristics of the surge arrester (e.g., higher weighting for energy accumulation in high-voltage scenarios and higher weighting for balance in low-voltage scenarios). This reduces the tendency to equalize indicators due to simple addition (ignoring core influencing factors) and achieves the organic integration of multi-dimensional assessments. This enables initial life prediction to comprehensively reflect the overall health status of the surge arrester, rather than a one-sided judgment based on a single dimension, further strengthening the advantages of the entire solution in multi-dimensional, blind-spot-free assessment.

[0100] S430 determines maintenance information based on the degradation factor and initial lifespan.

[0101] For example, the degradation rate can be determined by the degradation coefficient, and then the initial life can be analyzed based on the degradation rate to determine maintenance information.

[0102] This setup, by analyzing three core parameters—first quality assessment information, second quality assessment information, and the deterioration coefficient—characterizes the surge arrester's health status from three dimensions: current performance state, cumulative damage level, and performance degradation trend. This provides a comprehensive basis for maintenance decisions, effectively avoiding the limitations of single-indicator assessments. It ensures that maintenance information neither overlooks potential hazards nor wastes resources. This reduces biased decisions caused by analyzing a single parameter (such as only looking at discharge volume) to determine maintenance timing (e.g., normal discharge volume but extremely rapid aging rate may lead to failure due to delayed replacement, or slow aging rate but excessive discharge volume may result in over-maintenance and waste). Furthermore, by analyzing multiple deterioration coefficients, the average value among these coefficients can be determined and used as the deterioration rate.

[0103] In one possible implementation, in step S430, maintenance information is determined based on the deterioration coefficient and the initial lifetime, including: S431, based on the kth deterioration coefficient and the (k+1)th deterioration coefficient, determine the deterioration rate; whereby the deterioration rate is used to reflect the aging rate of the surge arrester.

[0104] The degradation rate can be understood as: ((k+1th degradation coefficient - kth degradation coefficient) ÷ interval time, where the interval time refers to the time between obtaining the kth degradation coefficient and the (k+1th)th degradation coefficient. The kth degradation coefficient is the degradation coefficient obtained from the previous detection and analysis, and the (k+1th)th degradation coefficient is the degradation coefficient obtained from the subsequent detection and analysis. It primarily reflects the aging state of the surge arrester at different time points. The degradation rate is the ratio of the change in the degradation coefficient within the two detection intervals to the time span, representing the rate of increase in aging degree per unit time. A positive degradation rate, and the larger the value, the faster the surge arrester's aging process and the more severe the performance degradation. A negative value or close to zero indicates that the aging trend is slowing down or stabilizing.

[0105] S432 determines maintenance information based on the rate of deterioration and initial lifespan.

[0106] For example, if the deterioration rate is 0.0358 per month, the lifespan of a standard surge arrester is 1.5 years, the failure threshold is 0.9, and the initial lifespan of the surge arrester is 1.2 years, then the remaining deterioration margin is 0.18 [0.9 - (1.2 years × 12 months / year × 0.9 ÷ 1.5 years × 12 months / year)]. Therefore, the maintenance information is 5 (0.18 ÷ 0.0358) months remaining, meaning that the surge arrester needs to be replaced and maintained five months after it is put into use.

[0107] With this setup, the core characteristic of durable surge arresters is a gradual aging process and slow performance degradation, but there is a risk of accelerated aging in the later stages (such as a sudden increase in the deterioration rate after the resistor material deteriorates to a critical state). Traditional static decision-making struggles to capture this acceleration trend, easily leading to sudden failure. However, by tracking the deterioration rate, accelerated aging signals can be accurately identified (such as the (k+1)th deterioration coefficient doubling compared to the kth). Even if the initial lifespan is still relatively long at this point, the risk can be mitigated through maintenance adjustments (such as shortening the inspection cycle or replacing earlier). This perfectly adapts to the long lifespan, gradual aging, and accelerated aging characteristics of durable surge arresters, solving the problem of inaccurate judgment of maintenance timing for long-life equipment by traditional testing methods.

[0108] It should be understood that the sequence number of each step in the above embodiments does not imply the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of this application.

[0109] Corresponding to the surge arrester testing method described in the above embodiments, this application also provides a surge arrester testing system, the various modules of which can implement the various steps of the durable surge arrester testing method. Figure 3 A structural block diagram of a surge arrester detection system provided in an embodiment of this application is shown. For ease of explanation, only the parts related to the embodiments of this application are shown.

[0110] Reference Figure 3 The surge arrester detection system includes: The acquisition unit is used to acquire the reference voltage and reference current; wherein, the reference voltage is used to reflect the rated AC voltage of the standard surge arrester, and the reference current is used to reflect the peak current under the reference voltage.

[0111] The first detection unit is used to acquire first detection information in response to the first detection operation; wherein, the first detection operation refers to the action of applying a DC voltage to the positive electrode and the negative electrode from zero to a preset target voltage value at a preset pressurization rate, and the first detection information includes the changes in detection voltage and detection current under the first detection operation.

[0112] The second detection unit is used to determine the equivalent voltage based on the first detection information, the reference voltage and the reference current, and to perform a second detection operation based on the equivalent voltage, and to acquire the second detection information; wherein, the equivalent voltage is used to reflect the rated AC voltage converted by the surge arrester under DC voltage, the second detection operation refers to the action of applying the equivalent voltage to the positive electrode and the negative electrode, and the second detection information is used to reflect the pulse wave generated by the resistor array under the second detection operation.

[0113] The analysis unit is used to determine maintenance information based on the second detection information; wherein the maintenance information is used to reflect the timing of the surge arrester replacement.

[0114] It should be noted that the information interaction and execution process between the above systems / units are based on the same concept as the method embodiments of this application. For details on their specific functions and technical effects, please refer to the method embodiments section, and they will not be repeated here.

[0115] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the above-described division of functional units and modules is merely an example. In practical applications, the above functions can be assigned to different functional units and modules as needed, that is, the internal structure of the system can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiments can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit. Furthermore, the specific names of the functional units and modules are only for easy differentiation and are not intended to limit the scope of protection of this application. The specific working process of the units and modules in the above system can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.

[0116] The surge arrester testing equipment also includes a control device 5. Both the DC testing device and the pulse testing device of the surge arrester testing equipment are electrically connected to the control device 5. The control device 5 is used to monitor and control the testing process of the durable surge arrester. For example, the control device could be… Figure 5 This is a schematic diagram of the structure of a control device 5 provided in an embodiment of this application. Figure 5 As shown, the control device 5 in this embodiment includes: at least one processor 50 ( Figure 5 Only one is shown in the image), at least one memory 51 ( Figure 5 (Only one is shown in the image) and a computer program 52 stored in the at least one memory 51 and executable on the at least one processor 50, wherein when the processor 50 executes the computer program 52, it causes the control device 5 to perform the steps in any of the above-described epoxy resin homogenization method embodiments, or causes the control device 5 to perform the functions of each module / unit in the above-described system embodiments.

[0117] For example, the computer program 52 may be divided into one or more modules / units, which are stored in the memory 51 and executed by the processor 50 to complete this application. The one or more modules / units may be a series of computer program instruction segments capable of performing a specific function, which describe the execution process of the computer program 52 in the control device 5.

[0118] The control device 5 can be a microcontroller, mobile phone, tablet computer, laptop computer, ultra-mobile personal computer (UMPC), netbook, smart screen, smart TV, handheld device with wireless communication function, desktop computer, computer, laptop computer, handheld computing device, etc. The control device 5 may include, but is not limited to, a processor 50 and a memory 51. Those skilled in the art will understand that... Figure 5 This is merely an example of control device 5 and does not constitute a limitation on control device 5. It may include more or fewer components than shown, or combine certain components, or different components, such as input / output devices, network access devices, buses, etc.

[0119] The processor 50 can be a Central Processing Unit (CPU), or it can be other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor can be a microprocessor or any conventional processor.

[0120] In some embodiments, the memory 51 may be an internal storage unit of the control device 5, such as a hard disk or memory of the control device 5. In other embodiments, the memory 51 may be an external storage device of the control device 5, such as a plug-in hard disk, smart media card (SMC), secure digital (SD) card, flash card, etc., equipped on the control device 5. Furthermore, the memory 51 may include both internal storage units and external storage devices of the control device 5. The memory 51 is used to store operating systems, applications, bootloaders, data, and other programs, such as the program code of computer programs. The memory 51 can also be used to temporarily store data that has been output or will be output.

[0121] This application also provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the steps in any of the above method embodiments.

[0122] This application provides a computer program product that, when run on an electronic device, enables the electronic device to perform the steps described in any of the above method embodiments.

[0123] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, all or part of the processes in the methods of the above embodiments of this application can be implemented by a computer program instructing related hardware. The computer program can be stored in a computer-readable storage medium, and when executed by a processor, it can implement the steps of the various method embodiments described above. The computer program includes computer program code, which can be in the form of source code, object code, executable files, or certain intermediate forms. The computer-readable medium can include at least: any entity or device capable of carrying the computer program code to a surge arrester detection device, a recording medium, a computer memory, a read-only memory (ROM), a random access memory (RAM), an electrical carrier signal, a telecommunication signal, and a software distribution medium, such as a USB flash drive, a portable hard drive, a magnetic disk, or an optical disk.

[0124] In the above embodiments, the descriptions of each embodiment have different focuses. For parts that are not described in detail or recorded in a certain embodiment, please refer to the relevant descriptions of other embodiments.

[0125] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0126] In the embodiments provided in this application, it should be understood that the disclosed surge arrester detection system can be implemented in other ways. For example, the surge arrester detection system embodiments described above are merely illustrative. For instance, the division of modules or units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be an indirect coupling or communication connection through some interfaces, devices, or units, and may be electrical, mechanical, or other forms.

[0127] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0128] The above-described embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application, and should all be included within the protection scope of this application.

Claims

1. A method for testing a surge arrester, characterized in that, The method for detecting surge arresters includes: Obtain a reference voltage and a reference current; wherein the reference voltage is used to reflect the rated AC voltage of a standard surge arrester, and the reference current is used to reflect the peak current under the reference voltage; In response to a first detection operation, first detection information is acquired; wherein, the first detection operation refers to the action of applying a DC voltage to the positive and negative electrodes from zero to a preset target voltage value at a preset pressurization rate, and the first detection information includes the changes in detection voltage and detection current under the first detection operation; The equivalent voltage is determined based on the first detection information, the reference voltage, and the reference current, and a second detection operation is performed based on the equivalent voltage to obtain second detection information; wherein, the equivalent voltage is used to reflect the rated AC voltage converted by the surge arrester under DC voltage, the second detection operation refers to the action of applying the equivalent voltage to the positive electrode and the negative electrode, and the second detection information is used to reflect the pulse wave generated by the resistor array under the second detection operation; Based on the second detection information, discharge quantity information and discharge repetition rate are obtained; wherein, the discharge quantity information is used to reflect the intensity of a single discharge pulse in the second detection information, and the discharge repetition rate is used to reflect the number of discharge pulses that occur per unit time in the second detection information; Based on the discharge quantity information, phase angle distribution information reflecting each discharge pulse is determined from the second detection information; Based on the phase angle distribution information, a first ratio and a second ratio are determined; wherein, the first ratio is used to reflect the proportion of discharge pulses distributed in the negative half-wave in the second detection information, and the second ratio is used to reflect the proportion of discharge pulses distributed in the positive half-wave in the second detection information. Based on the first ratio and the second ratio, the degree of symmetry is determined; wherein, the degree of symmetry is used to reflect the degree of balance of the discharge pulse between the positive half-wave and the negative half-wave of the AC voltage; Based on the discharge quantity information and the preset discharge quantity, a hazard coefficient is determined; wherein, the hazard coefficient is used to reflect the extent to which the discharge quantity information is greater than the preset discharge quantity in the total discharge quantity. The degree of symmetry is corrected based on the hazard coefficient to obtain the first quality assessment information; Based on the phase angle distribution information, the maximum discharge quantity corresponding to each cycle phase is determined from the discharge quantity information; The periodic phase between the i-th maximum discharge quantity and the n-th maximum discharge quantity is defined as the deterioration period; where i and n are both positive integers, and i is less than n; Based on the difference between the i-th maximum discharge quantity and the n-th maximum discharge quantity and the deterioration period, the k-th deterioration coefficient is determined; Based on the discharge quantity information, the average discharge quantity is determined; wherein, the average discharge quantity is used to reflect the average discharge quantity of a single pulse; Based on the average discharge quantity and the discharge repetition rate, discharge energy information is determined; wherein, the discharge energy information is used to reflect the leakage capacity of the surge arrester per unit time. Based on the discharge energy information and the preset adjustment coefficient, the second quality assessment information is determined; Based on the first quality assessment information and the second quality assessment information, the initial lifespan is determined; wherein, the initial lifespan is used to reflect the service life of the surge arrester produced; Maintenance information is determined based on the degradation coefficient and the initial lifespan.

2. The method for detecting surge arresters as described in claim 1, characterized in that, The step of determining the equivalent voltage based on the first detection information, the reference voltage, and the reference current includes: Based on the first detection information, a characteristic curve is determined; wherein, the characteristic curve is used to reflect the current-voltage characteristic curve of the surge arrester under the first detection operation; Based on the reference voltage, the equivalent current is determined from the characteristic curve; wherein the equivalent current is used to reflect the leakage current of the surge arrester under the reference voltage; Based on the equivalent current and the reference current, an equivalence coefficient is determined; wherein, the equivalence coefficient is used to reflect the manufacturing differences between the surge arrester and the standard surge arrester; The equivalent voltage is determined based on the reference voltage and the equivalent coefficient.

3. The method for detecting surge arresters as described in claim 1, characterized in that, The step of determining the initial lifespan based on the first quality assessment information and the second quality assessment information includes: Based on the first quality assessment information and the first benchmark value, a first comparison value is determined; wherein, the first comparison value is used to reflect the ratio between the first quality assessment information and the first benchmark value; Based on the second quality assessment information and the second benchmark value, a second comparison value is determined; wherein, the second comparison value is used to reflect the ratio between the second quality assessment information and the second benchmark value; The first comparison value and the second comparison value are weighted and summed to obtain the relative health score; wherein, the relative health score is used to reflect the health level of the surge arrester compared to the standard surge arrester; The initial lifespan is determined based on the relative health and the baseline lifespan; wherein the baseline lifespan is used to reflect the initial lifespan of a standard surge arrester.

4. The method for detecting surge arresters as described in claim 1, characterized in that, The determination of maintenance information based on the degradation coefficient and the initial lifespan includes: The degradation rate is determined based on the kth degradation coefficient and the (k+1)th degradation coefficient; wherein the degradation rate is used to reflect the aging rate of the surge arrester. Maintenance information is determined based on the deterioration rate and the initial lifespan.

5. The method for testing surge arresters as described in claim 1, characterized in that, The surge arrester includes: The shell has a cavity, and the shell has a flow cavity. Both ends of the flow cavity have channels. The diameter of the flow cavity is larger than the diameter of the channel, and the flow cavity is in communication with the channel. A resistor assembly, wherein the resistor assembly is formed by stacking and connecting at least two resistors, the resistor assembly is located in the cavity, and each resistor has a through hole; and At least two electrical contacts, one of which is connected to the upper end of the resistor group and fixed in the housing at the upper end of the flow cavity, and the other of which is connected to the lower end of the resistor group and fixed in the housing at the lower end of the flow cavity.

Images