A multi-channel analog-to-digital converter chip with wide temperature range and high dynamic range

Abstract

The application discloses a multi-channel analog-to-digital converter chip with a wide temperature range and a high dynamic range. The chip includes an analog input stage, a sample-and-hold circuit, a quantization and encoding circuit, a digital correction logic unit, an output interface, and a clock management module connected in series. The digital correction logic unit internally integrates a temperature adaptive compensation module, which includes a high-precision temperature sensor, a bias current adjustment unit, and a reference voltage reference adjustment unit. The temperature sensor monitors the chip temperature in real time and generates a feedback signal. The bias current adjustment unit increases the bias current of the analog input stage in a high-temperature environment according to the feedback signal. The reference voltage reference adjustment unit adjusts the reference voltage reference of the analog input stage in a low-temperature environment according to the feedback signal. The two units work together to form a closed-loop compensation mechanism, ensuring that the chip maintains a stable signal-to-noise ratio within a predetermined wide operating temperature range. The application significantly widens the operating temperature range of the analog-to-digital converter and improves environmental adaptability.

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