Measuring features on a part using depth data

Abstract

This application discloses measuring features on a part using depth data. One example provides a method (700) for measuring a part (102). The method (700) includes obtaining depth data (704) of one or more features on the part scanned by a plurality of depth imaging devices, and establishing an origin of a three-dimensional coordinate system (708) in the depth data. The method (700) also includes determining a measurement distance (712) of at least one of the one or more features from the depth data and based on at least an inspection plan and the origin of the three-dimensional coordinate system. The method (700) additionally includes outputting a result (726) including the measurement distance of the at least one feature.

Description

Background Technology

[0001] Parts inspection helps ensure the quality, reliability, and safety of parts. In many cases, trained individuals visually inspect and assess the quality, integrity, and compliance of various parts using specific parameters, identifying any defects, deviations, or anomalies they observe or are alerted to during the inspection. The inspection process may involve identifying measurement points on the parts (e.g., determining the features to be measured on the parts by referring to engineering drawings). Measurements themselves can be performed using various tools such as tape measures, calipers, and thickness gauges. The inspection process may also include manual visual inspection of cut lines, smearing and chip welding, mismatches, gouges, elongated holes, missing or misaligned parts, and identification of other defects. Summary of the Invention

[0002] One example provides a method for measuring a part. The method includes obtaining depth data of one or more features on the part scanned by multiple depth imaging devices, and establishing the origin of a three-dimensional coordinate system in the depth data. The method also includes determining a measurement distance of at least one of the one or more features based on the depth data and at least based on an inspection plan and the origin of the three-dimensional coordinate system.

[0003] This summary is provided to introduce a series of concepts in a simplified form, which will be further described in the detailed description below. This summary is not intended to identify key or essential features of the claimed subject matter, nor is it intended to limit the scope of the claimed subject matter. Furthermore, the claimed subject matter is not limited to embodiments that address any or all the shortcomings mentioned in any part of this disclosure. Attached Figure Description

[0004] Figure 1 An example measurement system for scanning parts is schematically depicted.

[0005] Figure 2 A block diagram of an example measurement system is shown, illustrating the measurement results used to determine features on a part using depth data of the part.

[0006] Figure 3 A flowchart illustrates an example method for determining the measurement distance of features on a part using depth data.

[0007] Figure 4 An example part with the features to be measured is schematically depicted.

[0008] Figure 5 schematic depiction Figure 4 Example measurement results of the features of the parts.

[0009] Figure 6A and Figure 6B schematic depiction Figure 5 Example height measurement results for the features.

[0010] Figure 7 A flowchart illustrating an example method for determining the measurement distance of features on a part.

[0011] Figure 8 A block diagram of an example computing system is shown. Detailed Implementation

[0012] As described above, in many cases, parts inspection involves manual visual inspection and measurement of parts. For example, tools such as tape measures and calipers can be used to measure parts to determine dimensions across multiple sections of a component. This process requires the person performing the measurements to be familiar with the inspection plan and engineering drawings, and to maintain accuracy across different parts whose lengths can vary from less than a foot to over 100 feet. This is labor-intensive, repetitive, and often time-consuming to perform, let alone to do so accurately. For example, a human quality assurance (QA) inspector using calipers might measure an aircraft stringer at a rate of about half a foot per minute, which would take the inspector approximately 200 minutes to complete successfully.

[0013] In some cases, laser measuring equipment can be used to determine one or more dimensions of a part. However, these measuring devices require physical calibration of the sensor's mechanical mounting structure, precise part mounting, and controlled temperature conditions to obtain reliable measurement results. Obtaining measurements of multiple dimensions and manipulating the part in multiple degrees of freedom during the measurement process can also be challenging.

[0014] Therefore, this paper discloses an example involving determining the measurement distance of features on a part using depth data from multiple depth imaging devices. In short, a method obtains depth data of one or more features on a part scanned by multiple depth imaging devices. Furthermore, the method establishes the origin of a three-dimensional coordinate system in the depth data. For example, the origin can be established at a predetermined point on the selected part. Furthermore, the method determines the measurement distance of at least one of the one or more features based on the depth data and at least based on an inspection plan and the origin of the three-dimensional coordinate system. The result is generated using the measurement distance of at least one feature. Additionally, the result may include appropriate information such as the measurement distances of other features.

[0015] This method can be used to measure any suitable part. Examples include aircraft stringers, aircraft wing spars, channel vents, C-channels, pipes, ducts, metal parts (e.g., aluminum, titanium, or steel parts), and composite material parts (e.g., carbon fiber parts). A measurement system configured to perform the disclosed example method can perform automated dimensional checks on aircraft stringers at speeds exceeding 10 feet per minute, thus significantly faster than human QA inspectors. In other examples, any other suitable part can be measured according to this disclosure.

[0016] Figure 1 An example of a measurement system 100 for scanning part 102 is shown. As discussed in more detail below, this scan can be used as depth data to determine the measurement outcome of part 102 (e.g., as part of an inspection process). In the current example, the measurement system 100 includes a part support 104 with a base 106 configured to hold part 102 along a scan path 108. This configuration facilitates positioning part 102 in the desired orientation for imaging. Knowing the approximate physical location means that surfaces on part 102 can be isolated to establish the part's coordinate system in the imaging data. Furthermore, the orientation of the feature to be measured on part 102 is defined by the inspection plan. In other examples, the part may be arranged on the part support in a different manner.

[0017] The measurement system 100 includes a plurality of depth imaging devices 110 arranged on a measuring head 112. This configuration facilitates having the depth imaging devices 110 in a desired orientation relative to each other. For example, the plurality of depth imaging devices 110 are arranged such that the part 102 on the part support 104 is imaged from a sufficient number of different angles to obtain the desired measurement results. Furthermore, one or more of the measuring head 112 and / or the part support 104 are selectively controllable to move relative to the part 102 along a scan path 108. In this configuration, the plurality of depth imaging devices 110 can acquire depth images along the length of the part 102. The depth images are used to form three-dimensional depth data of the part 102. In various examples, any suitable type and number of depth imaging devices can be used. Examples of depth imaging devices include light detection and ranging (LIDAR) sensors, time-of-flight (ToF) depth cameras, structured light depth cameras, stereo camera arrangements, or other suitable depth sensors. In some examples, one or more of the depth imaging devices 110 may include suitable optical filters, such as, for example, polarization filters or wavelength bandpass filters. While this article refers to the aerospace industry, the measurement system 100 can also be used in other applications, including automotive, railroad, marine, aerospace, military, energy, construction and engineering applications, or any other application that requires the inspection of tolerances during manufacturing, service and / or inspection. Figure 1This is illustrative. In other examples, the measurement system 100 may have a different configuration.

[0018] Figure 2 A block diagram of an example measurement system 200 for a part is shown. Measurement system 100 is an example of measurement system 200. Thus, similar to measurement system 100, measurement system 200 includes a part support 202 and a plurality of depth imaging devices 204 arranged on a measuring head 206.

[0019] In the current example, the measurement system 200 includes a motor 208 selectively controllable to change the position 210 of the measuring head 206, for example, along the part support 202 and thus along the scan path. The motor 208 is operatively coupled to a first encoder 212 to aid in controlling the movement of the measuring head 206. In some examples, the first encoder 212 may not have sufficient accuracy to provide the position 210 of the measuring head 206 within the desired tolerances. Therefore, the measurement system 200 may also include a second encoder 214 with relatively higher accuracy than the first encoder 212. Here, the second encoder 214 is configured to provide the position 210 of the measuring head 206 along the scan path. In some examples, the position 210 is provided in real time along with the operation of multiple depth imaging devices 204. This configuration helps to integrate multiple positions 210 with data from the depth imaging devices 204. In various examples, the second encoder 214 may include a magnetic encoder, an optical encoder, a laser interferometer, and / or another suitable encoder with sufficient accuracy and speed. In other examples, a transmission device other than a motor can be used to move the measuring head 206. Examples include magnetic levitation drive systems and pneumatic systems. The drive housing 215 is operatively coupled to the motor 208, the first encoder 212 and the second encoder 214, and a plurality of depth imaging devices 204 to facilitate communication.

[0020] The measurement system 200 also includes a controller 216 for controlling various aspects of the measurement system 200. For example, the controller 216 is configured to control the measuring head 206 and multiple depth imaging devices 204 based at least on an inspection plan 218 from, for example, the recording system 220 or another suitable source. The inspection plan 218 includes relevant information for measuring one or more features on a part. As a specific example, each or some features to be measured may be associated in the inspection plan 218 with a feature identifier, the desired location for imaging the feature for measurement, and acceptable tolerances for the measurement. Furthermore, the inspection plan 218 can be retrieved based on the part number. In some examples, different part numbers may have different inspection plans.

[0021] Furthermore, controller 216 is configured to acquire raw depth data 222 of the part from multiple depth imaging devices 204. The raw depth data 222 may include point clouds obtained during scanning, or depth data in other suitable formats (e.g., surface reconstruction formed by identifying surfaces from point cloud data). Here, controller 216 is configured to align the raw depth data 222 from the respective depth imaging devices 204 to form aligned depth data 224. In the example using point clouds, the individual point clouds can be transformed using transformation matrices of at least multiple depth imaging devices 204 and / or using another suitable transformation. Controller 216 may also acquire the position 210 of the measuring head 206 from the second encoder 214, for example, for integration with the raw depth data 222. In this configuration, controller 216 can utilize position 210 to align the raw depth data 222 within desired tolerances.

[0022] exist Figure 2 In this example, controller 216 is configured to determine one or more measurements of a part. In short, controller 216 defines the origin of a three-dimensional coordinate system in aligned depth data 224. Furthermore, based at least on the origin of the three-dimensional coordinate system and optionally utilizing inspection plan 218, it determines one or more distances to at least one feature of one or more features of the part according to the aligned depth data 224. In some examples, controller 216 may also acquire and utilize temperature data to determine one or more measured distances 226. In other examples, inspection plan 218 may be omitted. In this current example, controller 216 may output the results in the form of an inspection report 228, which includes the measured distances 226 for at least one feature. Inspection report 228 may also include other suitable information, such as a portion of inspection plan 218. Inspection report 228 may be stored in recording system 220 (as shown) or another suitable location. In other examples, the results may have a different configuration. Reference Figure 3 and Figure 7 Other aspects of determining one or more measurement distances 226 have been discussed. In other examples, controller 216 may be configured to output aligned depth data 224. In such examples, a suitable computing system connected to measurement system 200 can determine the measurement distance based on the aligned depth data 224 in a manner similar to that discussed above with reference to controller 216. Reference Figure 8 Discuss example computing systems.

[0023] Compared to manual inspection techniques known and used prior to the filing date of this patent application, the measuring system 200 enables faster acquisition of depth data of the scanned part and extraction of appropriate measurement results. For example, a 100-foot-long part can be scanned and measured within five minutes. Furthermore, the measuring distance 226 can be determined in a manner at least comparable to the accuracy tolerances of manual inspection and / or other inspection tools, such as automatic calipers or laser measuring devices, but with less human intervention. In other examples, the measuring system 200 may have other components not depicted.

[0024] Figure 3 A flowchart illustrating an example method 300 for determining measurement distances of features on a part is provided. In various examples, method 300 may be performed on a controller 216, a suitable computing system connected to the measurement system 200, or a suitable combination thereof. In this document, a part includes one or more features to be measured (e.g., as part of an inspection process). Examples of features to be measured include: 1) the height of the part, 2) the width and / or thickness of a flange, 3) the depth and / or orientation of a groove, and 4) the width, height, thickness, length, and / or orientation of the part or a portion thereof. In other examples, other suitable distances on the features may be measured.

[0025] At 302, method 300 includes retrieving an inspection plan from one or more suitable locations, such as a production database or inspection plan repository, based on the part number of the part. The inspection plan includes dimensional information for one or more features to be measured. The dimensional information may include the location along the part where the selected feature is measured, tolerances for the measurement distance of that feature, and / or other suitable information. In some examples, the location along the part may be defined relative to a C-datum, as will be discussed. In some such examples, retrieving the inspection plan includes decoding the inspection plan for the selected feature to be measured and the corresponding distance relative to the C-datum, as indicated at 304. In other such examples, the inspection plan may be used in another suitable manner.

[0026] At 306, method 300 includes acquiring depth data in the form of a point cloud representing the scanned part. For example, the point cloud can be obtained from measurement system 200. In other examples, other suitable depth data may be used. Herein, method 300 also includes removing noise and depth data at 308 representing a fixture (e.g., base 106) that holds or supports the part during scanning. In some such examples, as referenced... Figure 1 The method discussed involves removing depth data representing a fixture from a point cloud during imaging, utilizing the expected orientation of the part. This configuration helps remove irrelevant information from the depth data.

[0027] Method 300 further includes aligning a first reference datum with a first predetermined surface of the part at 310, and aligning a second reference datum with a second predefined surface of the part at 312. In some examples, the first reference datum is in the form of a plane corresponding to the YZ axis of the part's three-dimensional coordinate system in the depth data. Similarly, the second reference datum may be in the form of a plane corresponding to the XZ axis. As an example, the predetermined surface may include the surface of a flange, the surface of a web, or another suitable surface of the part.

[0028] At 314, method 300 includes establishing the origin of the three-dimensional coordinate system of the part in the depth data. The origin can be established based on the part number of the part. For example, the origin can be established using two or three planes aligned with a predetermined surface of the selected part. Furthermore, in some examples, the C-datum in the depth data is defined relative to the origin. This can help correlate the position of the depth image with the orientation in the depth data.

[0029] Figure 4 The diagram schematically illustrates a specific example of a three-dimensional coordinate system for a part in the form of a stringer 400 in depth data. As shown, datum A 402, in planar form on the YZ axis, is aligned with the first side of the stringer 400. Similarly, datum B 404, in planar form on the XZ axis, is aligned with the surface of the web of the stringer 400. Furthermore, datum C 406 is defined as the origin of the three-dimensional coordinate system of the stringer 400. Specifically, the distance from datum C 406 is along the intersection of datum B 404 and the plane representing the second edge of the stringer 400. Thus, the origin of the three-dimensional coordinate system of the stringer 400 is established together with the three reference datums. In other examples, the three-dimensional coordinate system of the part can be established in another suitable manner. Figure 4 This is illustrative. While this article discusses stringers, depth data for another suitable part may be used in other examples.

[0030] return Figure 3Method 300 includes forming a cross-section of depth data for one or more features to be measured at a distance from a C datum listed in the inspection plan. Specifically, the point cloud is sliced ​​into 0.1-inch pieces in the YX plane, as shown in 316. For the selected feature and the corresponding cross-section of the point cloud, a reference datum is specified based on the measurement results of the feature. This helps to isolate the relevant depth data at the region of interest for measuring the feature. In this document, method 300 includes fitting a reference plane to points in the cross-section of the point cloud located on the reference datum, as shown in 318. In some examples, the reference plane can be evaluated against predetermined statistical criteria. As discussed in 310 and 312, the reference datum can be aligned with a predefined surface of the part. Thus, the first surface of the feature to be measured includes the predefined surface of the part and is therefore aligned with the corresponding reference datum. In various examples, the reference datum can include a A datum (at 320) or a B datum (at 322) (depending on the feature being measured). In other examples, another suitable reference datum can be used. Furthermore, method 300 includes calculating the distance from the reference plane to a point on the corresponding surface (e.g., a second surface of the feature to be measured, as shown in 324). In other examples, points in the point cloud can be fitted to another suitable shape. For example, a cylinder can be fitted to a groove. In such examples, the distance can be calculated from the intersection of the cylinder and the plane.

[0031] Refer to the example of stringer 400, Figure 5 schematically depicted Figure 4 The depth data is shown in an example cross-section at 5-5. It can be seen that reference A 402 is aligned with the first surface of stringer 400. In this document, the height measurement 500 reflects the measurement from reference A 402 to the corresponding side (e.g., the second surface of stringer 400). Furthermore, the first thickness measurement 502 reflects the measurement from the opposite side of the first flange to reference A 402. Similarly, reference B 404 is aligned with the surface of the web of stringer 400. The width 504 of the second flange and the second thickness 506 of the web can be measured with reference to reference B 404.

[0032] In addition, the height measurement result is 500. Figure 6A and Figure 6B The diagram is illustrated in more detail. As discussed above, method 300 fits the reference plane to points on the reference datum. Figure 6A In this diagram, points on reference 402 are isolated, as shown in 600. These points 600 represent the first surface of the feature to be measured. Similarly, points on the second surface are also isolated, as shown in 602. Figure 6B In this process, a reference plane 604 is fitted to a point 600 on a reference datum (e.g., datum A 402). Furthermore, multiple distances 606 from the reference plane 604 to the point 602 on the second surface are measured. Figure 5 , Figure 6A and Figure 6B This is illustrative. In other examples, multiple distances between the surfaces of a feature can be determined in another suitable way.

[0033] return Figure 3 Method 300 includes fitting the calculated distances (from 324) to a Gaussian distribution at 326. Furthermore, as shown in 328, the Gaussian mean of this distribution is used as the measured distance for the feature. In other examples, the range of the root sum squared (RSS) of the calculated distances can be determined. In these examples, the median value of the RSS range can be used as the measured distance for the feature. In some such examples, the minimum, maximum, and / or standard deviation of the RSS range can also be determined and reported. In further examples, another suitable distribution, range, and / or statistical parameters can be used.

[0034] Method 300 also includes comparing the measured distance of the feature at 330 with predetermined nominal conditions (such as tolerance range). In some examples, comparing the measured distance includes marking the measured distance as an anomaly if it is not within the tolerance range, as shown at 332. In some examples, for one or more additional features to be measured, method 300 may return to 318. In other examples, 330 and / or 332 may be omitted.

[0035] Furthermore, method 300 includes recording the measured distance as a measurement result of a part in the recording system, or another suitable location, as shown in 334. In some examples, additional suitable information may also be recorded. Although discussed here with reference to point clouds, other suitable depth data may be used in other examples. Figure 3 It is illustrative.

[0036] Figure 7 A flowchart illustrating another example method 700 for determining the measurement distance of features on a part is shown. Method 700 can be performed, for example, by measurement system 100 or measurement system 200. Furthermore, a computing system connected to measurement system 200 can also perform method 700.

[0037] Method 700 may optionally include obtaining an inspection plan for the part at 702. For example, inspection plan 218 may be used. Furthermore, the part includes one or more features to be measured. Method 700 also includes obtaining depth data of one or more features of the part scanned by multiple depth imaging devices at 704. For example, aligned depth data 224 from measurement system 200 may be used. In some examples, method 700 may optionally include at 706: 1) removing noise from the depth data and / or 2) removing depth data from the fixture (e.g., base 106) holding the part during scanning.

[0038] Furthermore, method 700 includes establishing the origin of a three-dimensional coordinate system in the depth data at point 708. For example, this can be done as described in reference... Figure 4 The origin is established as discussed. In some examples, method 700 optionally includes aligning the reference datum with a predefined surface of the part, as shown in 710. In some such examples, the predefined surface may include a first surface of the feature to be measured or another suitable surface.

[0039] At 712, method 700 includes determining a measurement distance of at least one of one or more features based on depth data. Furthermore, the measurement distance is based at least on the inspection plan and the origin of the three-dimensional coordinate system. In some examples, determining the measurement distance of at least one feature includes determining multiple distances from a first surface to a second surface of the at least one feature and using these multiple distances to determine the measurement distance, as shown at 714. For example, it can be used... Figure 6B Multiple distances 606. In some such examples, using multiple distances to determine the measured distance involves fitting multiple distances to a distribution and using the mean of that distribution as the measured distance, as shown in 716. Alternatively or additionally, using multiple distances to determine the measured distance involves determining the range of the square root (RSS) of the sum of the multiple distances and using the median of the RSS range as the measured distance, as shown in 718. In other examples, multiple distances can be used to determine the measured distance of a feature in another suitable manner.

[0040] Furthermore, in some examples, determining multiple distances from the first surface to the second surface includes fitting a reference plane to the depth data representing the first surface in a cross-section of depth data at the region of interest of at least one feature at 720. In these examples, determining multiple distances also includes using the reference plane to determine multiple distances to the depth data representing the second surface in the cross-section, also shown at 720. In other examples, one or more of 712, 714, 716, 718, or 720 may be repeated for one or more additional features from one or more features of the part.

[0041] Method 700 may optionally include comparing the measured distance with a predetermined tolerance condition for at least one feature, as shown in 722. In some such examples, comparing the measured distance with the predetermined tolerance condition includes: if the measured distance does not meet the predetermined tolerance condition, then marking the measured distance as an anomaly, as shown in 724. Further, method 700 may optionally include outputting a result at 726 that includes the measured distance of at least one feature. In examples where more than one measured distance is determined, the result may include additional measured distances.

[0042] Compared to manual inspection, method 700 helps to measure parts in a significantly reduced time, thereby increasing flow time. Furthermore, performing method 700 on measurement system 200 and / or a computing system connected to measurement system 200 can help reduce operator / inspector ergonomic stress and / or environmental / health / safety (EHS) related injuries. Additionally, method 700 can encode human knowledge into a repeatable system. Specifically, compared to manual inspection, method 700 helps improve the repeatability and reliability of measurement results.

[0043] In some embodiments, the examples described herein may be associated with a computing system of one or more computing devices. In particular, aspects of such methods and processes may be implemented as computer applications or services, APIs, libraries, and / or other computer program products.

[0044] Figure 8 A non-limiting embodiment of a computing system 800 capable of implementing one or more of the above examples is illustrated schematically. For example, the computing system 800 can be used to execute instructions to implement... Figure 3 Method 300 Figure 7 Method 700 and / or potentially implement other functions.

[0045] The computing system 800 is shown in a simplified form. The computing system 800 may take the form of one or more personal computers, server computers, tablet computers, network computing devices, mobile computing devices, mobile communication devices (e.g., smartphones), and / or other computing devices. In some examples, Figure 2 The controller 216 includes one or more aspects of the computing system 800. In other examples, the computing system 800 may be configured to connect to the measurement system 200.

[0046] The computing system 800 includes a logic subsystem 802, a storage subsystem 804, and an optional display subsystem 806. The computing system 800 may optionally include an input subsystem 808, a communication subsystem 810, and / or... Figure 8 Other calculation-related components are not shown in the diagram.

[0047] Logic subsystem 802 includes one or more physical devices configured to execute instructions. For example, logic subsystem 802 may be configured to execute instructions that are part of one or more application programs, services, programs, routines, libraries, objects, components, data structures, or other logical constructs. Such instructions can be implemented to perform tasks, implement data types, transition the state of one or more components, achieve technical effects, or otherwise achieve desired results. For example, logic subsystem 802 may be used to execute instructions to implement… Figure 3 Method 300 and / or Figure 7 Method 700.

[0048] The logic subsystem 802 may include one or more processors configured to execute software instructions. Additionally or alternatively, the logic subsystem 802 may include one or more hardware or firmware logic machines configured to execute hardware or firmware instructions. The processor of the logic subsystem 802 may be single-core or multi-core, and the instructions executed thereon may be configured for sequential, parallel, and / or distributed processing. Components of the logic subsystem 802 may optionally be distributed across two or more independent devices that may be remotely located and / or configured for coordinated processing. Aspects of the logic subsystem 802 may be virtualized and executed by remotely accessible networked computing devices configured in a cloud computing configuration.

[0049] Storage subsystem 804 includes one or more physical devices configured to hold instructions executable by logic subsystem 802 to implement the methods and processes described herein. For example, storage subsystem 804 may hold instructions executable to implement... Figure 3 Method 300 Figure 7 Method 700 and / or potentially implement other functions. When these methods and processes are implemented, the state of the storage subsystem 804 can be transformed—for example, to maintain different data.

[0050] Storage subsystem 804 may include removable and / or built-in devices. Storage subsystem 804 may include optical storage (e.g., CD, DVD, HD-DVD, Blu-ray disc, etc.), semiconductor storage (e.g., RAM, EPROM, EEPROM, etc.), and / or magnetic storage (e.g., hard disk drive, floppy disk drive, magnetic tape drive, MRAM, etc.). Storage subsystem 804 may include volatile, non-volatile, dynamic, static, read / write, read-only, random access, sequential access, location-addressable, file-addressable, and / or content-addressable devices.

[0051] Those skilled in the art will understand that, without excessive experimentation, the storage subsystem 804 includes one or more physical devices. However, aspects of the instructions described herein may alternatively be propagated via a communication medium (e.g., electromagnetic signals, optical signals, etc.) that is not held by a physical device for a finite duration.

[0052] Various aspects of the logic subsystem 802 and the storage subsystem 804 can be integrated together into one or more hardware logic components. For example, such hardware logic components may include field-programmable gate arrays (FPGAs), application-specific integrated circuits (PASICs / ASICs), application-specific standard products (PSSPs / ASSPs), system-on-a-chip (SOCs), and complex programmable logic devices (CPLDs).

[0053] When included, the display subsystem 806 can be used to present a visual representation of the data held by the storage subsystem 804. This visual representation can take the form of a graphical user interface (GUI). Since the methods and processes described herein change the data held by the storage subsystem 804, thereby transforming the state of the storage machine, the state of the display subsystem 806 can also be translated into a visual representation of the changes in the underlying data.

[0054] When included, display subsystem 806 may include one or more display devices utilizing virtually any type of technology. Such display devices may be combined with logic subsystem 802 and / or storage subsystem 804 in a shared housing, or such display devices may be peripheral display devices.

[0055] When included, the input subsystem 808 may include or interface with one or more user input devices, such as a keyboard, mouse, touchscreen, or joystick. In some embodiments, the input subsystem 808 may include or interface with selected Natural User Input (NUI) components. Such components may be integrated or peripheral, and the transduction and / or processing of input actions may be handled on-board or off-board. Example NUI components may include: a microphone for speech and / or voice recognition; infrared, color, stereo, and / or depth cameras for machine vision and / or gesture recognition; head trackers, eye trackers, accelerometers, and / or gyroscopes for motion detection and / or intent recognition; and electric field sensing components for assessing brain activity.

[0056] When included and without considering the aforementioned dynamic and reconfigurable communication systems, the communication subsystem 810 can be configured to communicatively couple the computing system 800 to one or more other computing devices. The communication subsystem 810 may include wired and / or wireless communication devices compatible with one or more different communication protocols. As a non-limiting example, the communication subsystem may be configured to communicate via a wireless telephone network or a wired or wireless local area network or wide area network. In some embodiments, the communication subsystem 810 may allow the computing system 800 to send and / or receive messages (e.g., aligned depth data 224, inspection plan 218, and / or inspection report 228) to and / or from other devices via a network such as the Internet. For example, the communication subsystem 810 may be used to receive data or send data to another computing system. As another example, the communication subsystem may be used to communicate with other computing systems (e.g., during the execution of method 300 and / or method 700 in a distributed computing environment).

[0057] In addition, this disclosure includes configurations as described in the following terms.

[0058] Clause 1. A method for measuring a part, the method comprising: obtaining depth data of one or more features on the part scanned by a plurality of depth imaging devices, establishing an origin of a three-dimensional coordinate system in the depth data, and determining a measurement distance of at least one of the one or more features based on the depth data and at least based on an inspection plan and the origin of the three-dimensional coordinate system.

[0059] Clause 2. The method according to Clause 1, wherein determining the measurement distance of the at least one feature comprises determining a plurality of distances from a first surface of the at least one feature to a second surface, and using the plurality of distances to determine the measurement distance.

[0060] Clause 3. The method according to Clause 2, wherein using the plurality of distances to determine the measured distance includes fitting the plurality of distances to a distribution and using the average of the distribution as the measured distance.

[0061] Clause 4. The method according to Clause 1 further includes outputting a result of the measured distance including the at least one of the features.

[0062] Clause 5. The method according to Clause 2, wherein determining the plurality of distances from the first surface to the second surface comprises a cross-section of the depth data at a region of interest of the at least one feature, fitting a reference plane to the depth data representing the first surface, and using the reference plane to determine the plurality of distances to the depth data representing the second surface.

[0063] Clause 6. The method according to Clause 1 further includes aligning a reference datum with a predefined surface of the part in the depth data.

[0064] Clause 7. The method according to Clause 1 further includes comparing the measured distance with a predetermined tolerance condition of the at least one feature, and marking the measured distance as an anomaly in the result if the measured distance does not meet the predetermined tolerance condition.

[0065] Clause 8. The method according to Clause 1 further includes one or more of the following: removing noise from the depth data or removing depth data representing the fixture holding the part during the scan.

[0066] Clause 9. A measurement system for a part, the measurement system comprising: a plurality of depth imaging devices arranged on a measuring head; and a controller configured to: obtain raw depth data by scanning one or more features on the part using the plurality of depth imaging devices, align the raw depth data to form aligned depth data, establish an origin of a three-dimensional coordinate system in the aligned depth data, and determine a measurement distance of at least one of the one or more features based on the aligned depth data and at least based on an inspection plan and the origin of the three-dimensional coordinate system.

[0067] Clause 10. The measurement system according to Clause 9, wherein the controller is configured to determine the measurement distance of the at least one feature by determining a plurality of distances from a first surface of the at least one feature to a second surface and using the plurality of distances to determine the measurement distance.

[0068] Clause 11. The measurement system according to Clause 10, wherein the controller is configured to determine the measurement distance using the plurality of distances by fitting the plurality of distances to a distribution and using the average of the distribution as the measurement distance.

[0069] Clause 12. The measurement system according to Clause 9, wherein the controller is further configured to output a result of the measured distance including the at least one of the features.

[0070] Clause 13. The measurement system according to Clause 10, wherein the controller is configured to determine the plurality of distances from the first surface to the second surface by fitting a reference plane to the depth data representing the first surface in a cross section of the depth data at the region of interest of the at least one feature and using the reference plane to determine the plurality of distances to the depth data representing the second surface.

[0071] Clause 14. The measurement system according to Clause 9, wherein the controller is further configured to compare the measured distance with a predetermined tolerance condition of the at least one feature, and, if the measured distance does not meet the predetermined tolerance condition, mark the measured distance as an anomaly in the result.

[0072] Clause 15. A computing system configured to communicate with a measurement system for a part, the computing system comprising: a logic subsystem; and a storage subsystem including an inspection plan and instructions for the part, the instructions being executable by the logic subsystem to: obtain depth data of one or more features of the part scanned by a plurality of depth imaging devices on the measurement system, establish an origin of a three-dimensional coordinate system in the depth data, and determine a measurement distance of at least one of the one or more features based on the depth data and at least based on the inspection plan and the origin of the three-dimensional coordinate system.

[0073] Clause 16. The computing system according to Clause 15, wherein the instructions capable of executing the determination of the measurement distance of the at least one feature include instructions capable of executing the determination of a plurality of distances from a first surface to a second surface of the at least one feature and using the plurality of distances to determine the measurement distance.

[0074] Clause 17. The computing system according to Clause 16, wherein the ability to execute the instructions to determine the measured distance using the plurality of distances includes the ability to execute instructions to fit the plurality of distances to a distribution and use the average of the distribution as the measured distance.

[0075] Clause 18. The computing system according to Clause 15, wherein the instructions are also capable of being executed to output a result of the measured distance including the at least one of the features.

[0076] Clause 19. The computing system according to Clause 15, wherein the instructions are also capable of being executed to align a reference datum with a predefined surface of the part in the depth data.

[0077] Clause 20. The computing system according to Clause 15, the instructions are also capable of comparing the measured distance with a predetermined tolerance condition of the at least one feature, and marking the measured distance as an anomaly in the result if the measured distance does not meet the predetermined tolerance condition.

[0078] This disclosure is presented by way of example and with reference to the associated accompanying drawings. Components, process steps, and other elements that may be substantially the same in one or more drawings are identified in a coordinated manner and described with minimal repetition. However, it is worth noting that the elements identified in a coordinated manner may also differ to some extent. It should also be noted that some drawings may be schematic and not drawn to scale. Various drawing scales, aspect ratios, and numbers of parts shown in the drawings may be intentionally distorted to make certain features or relationships easier to see.

[0079] As used in this document, "and / or" is defined as including or ∨, as specified by the following truth table: As used herein, the term "one or more of A or B" includes A, B, or a combination of A and B. The term "one or more of A, B, or C" is equivalent to A, B, and / or C. Therefore, as used herein, "one or more of A, B, or C" includes A alone, B alone, C alone, a combination of A and B, a combination of A and C, a combination of B and C, or a combination of A, B, and C.

[0080] It should be understood that the configurations and / or methods described herein are exemplary in nature, and these specific embodiments or examples should not be considered in a limiting sense, as many variations are possible. The specific routines or methods described herein may represent one or more of any number of strategies. Therefore, the various actions shown and / or described may be performed in the order shown and / or described, in other orders, in parallel, or omitted. Similarly, the order of the above processes may be changed.

[0081] The subject matter of this disclosure includes all novel and non-obvious combinations and sub-combinations of the various processes, systems and configurations disclosed herein, as well as any and all equivalents thereof.

[0082] Parts list: Measurement System 100 Part 102 Parts support components 104, 202 Frame 106 Scan path 108 Depth imaging devices 110, 204 Measuring heads 112, 206 Measurement System 200 Motor 208 Position 210 First encoder 212 Second encoder 214 Drive box 215 Controller 216 Inspection Plan 218 Record 220 Raw depth data 222 Aligned depth data 224 Measured distance 226 Inspection Report 228 Method 300 Steps 302, 304, 306, 308, 310, 312, 314, 316, 318, 324, 326, 328, 330, 332, 334 400 stringers A Standard 402 B Standard 404 C Standard 406 Height measurement result 500 Thickness measurement results: 502, 506 Width 504 Points 600 and 602 Reference plane 604 Distance 606 Method 700 Steps 702, 704, 706, 708, 710, 712, 714, 716, 718, 720, 722, 724, 726 Computing System 800 Logic Subsystem 802 Storage Subsystem 804 Optional display subsystem 806 Input Subsystem 808 Communication Subsystem 810.

Claims

1. A method (700) for measuring a part (102), the method (700) comprising: Obtain depth data (704) of one or more features on the part scanned by multiple depth imaging devices. Establish the origin (708) of the three-dimensional coordinate system in the depth data; as well as The measured distance (712) of at least one of the one or more features is determined based on the depth data and at least on the inspection plan and the origin of the three-dimensional coordinate system.

2. The method (700) of claim 1, wherein determining the measurement distance of the at least one feature comprises determining a plurality of distances from a first surface of the at least one feature to a second surface, and using the plurality of distances to determine the measurement distance (714).

3. The method (700) of claim 2, wherein determining the measured distance using the plurality of distances comprises fitting the plurality of distances to a distribution and using the average value of the distribution as the measured distance (716).

4. The method (700) according to claim 1, further comprising outputting a result of the measured distance including the at least one feature (726).

5. The method (700) of claim 2, wherein determining the plurality of distances from the first surface to the second surface comprises a cross-section of the depth data at the region of interest of the at least one feature, fitting a reference plane to the depth data representing the first surface, and using the reference plane to determine the plurality of distances to the depth data representing the second surface (720).

6. The method of claim 1 (700) further includes aligning a reference datum with a predefined surface of the part in the depth data (710).

7. The method (700) according to claim 1, further comprising comparing the measured distance with a predetermined tolerance condition of the at least one feature (722), and marking the measured distance as an anomaly in the result if the measured distance does not meet the predetermined tolerance condition (724).

8. The method (700) according to claim 1, further comprising one or more of the following: removing noise from the depth data or removing depth data representing a fixture holding the part during the scan (706).

9. A measuring system (100) for a part (102), the measuring system (200) comprising: Multiple depth imaging devices (110, 204) are arranged on the measuring head (112, 206). and The controller (216) is configured as follows: Raw depth data is obtained by scanning one or more features on the part using the plurality of depth imaging devices. Align the original depth data to form aligned depth data. The origin (708) of the three-dimensional coordinate system is established in the aligned depth data, and The measured distance (712) of at least one of the one or more features is determined based on the aligned depth data and at least based on the inspection plan and the origin of the three-dimensional coordinate system.

10. The measurement system (100) of claim 9, wherein the controller (216) is configured to determine the measurement distance of the at least one feature by determining a plurality of distances from a first surface to a second surface of the at least one feature and using the plurality of distances to determine the measurement distance (714).

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