Automatic sampling and counting control method and system for test paper strips

Abstract

The application discloses an automatic sample feeding and counting control method and system for test paper strips. The automatic sample feeding and counting control method belongs to the technical field of test paper strip counting control. The application carries out multi-dimensional signal feature research and judgment of the bagged test paper strip sticking state, bag body shaking state transition analysis and dynamic background and signal distortion quantization of the bag body reflected strong light, carries out test paper strip sticking quantity identification and regulation and control based on the multi-dimensional signal feature research and judgment result, carries out reflected peak weakening control based on the dynamic background and signal distortion quantization result, carries out batch collection discrimination and regulation and control of the bagged test paper strip after the research and judgment, analysis and quantization are finished, and the problems that the test paper full-process control precision in the prior art is difficult to meet the accurate control demand of the test paper strip automatic sample feeding, counting and transfer full process and the efficiency and stability support capability of the test paper strip automatic production are limited are solved.

Description

Technical Field

[0001] This invention relates to the field of test strip counting control technology, and in particular to an automatic sample feeding and counting control method and system for testing test strips. Background Technology

[0002] With the rapid development of fields such as medical clinical testing, food safety testing, and environmental monitoring, test strips are widely used in various rapid testing scenarios due to their advantages of ease of operation and rapid detection. Demand is increasing year by year, and large-scale production and batch testing have become the norm in the industry. However, currently, there are still serious automation bottlenecks in the sample introduction and counting processes of test strips. Although existing automated equipment has been initially applied, it generally suffers from insufficient sample introduction accuracy. Therefore, conducting research on automated sample introduction and counting related to test strips has urgent practical significance. The main collection and counting devices used in existing test strip products... The structure includes an inner packaging collection and counting device and an outer packaging sorting device. The inner packaging collection and counting device consists of a pre-set automatic packaging machine, a collection and counting device, a conveyor belt, photoelectric sensor switches, a storage tank, cylinders, and a main conveyor belt discharge bin. Each automatic packaging machine's discharge end is connected to a conveyor belt, and the other end of the conveyor belt is connected to the inlet end of the corresponding collection and counting device. The storage tank within the collection and counting device is connected to a cylinder, which is connected to a corresponding discharging area. The discharging area corresponds to the main conveyor belt discharge bin, and the discharge end of the discharge bin is connected to the outer packaging sorting device. The pre-set automatic packaging machine is used to produce test strips, and the conveyor belt is responsible for... Each automatic packaging machine's products are conveyed to a corresponding collection and counting device. A photoelectric sensor switch is installed inside the collection and counting device to detect and count the incoming bags. When the photoelectric sensor detects a bag from the conveyor belt, it immediately sends an electrical signal to a small drive motor. Upon receiving the signal, the drive motor starts, driving a connected conveyor paddle. The paddle's trajectory aligns with the conveyor belt's outlet and the storage tank's inlet. The paddle gently presses against the bag's edge, and with the motor's uniform driving force, smoothly guides the bag into the currently idle storage tank within the collection and counting device. Once fully inside the storage tank, the photoelectric sensor switch sends a stop signal, the drive motor shuts down, the conveyor lever resets, and it waits for the next bag to arrive. Each collection and counting device has two storage tanks, left and right, for temporary product storage, enabling alternating counting and collection. The cylinder is used to transfer test strips that have reached the required quantity from the storage tank to the unloading area, and to transfer products from the unloading area to the main conveyor belt discharge bin. The main conveyor belt discharge bin receives the products transferred by the cylinder and transports them to the outer packaging sorting device via the main conveyor belt. The outer packaging sorting device separates the bags from the main conveyor belt to the left and right sides for easy manual sorting and packaging.

[0003] The main process of automatic sample feeding and counting of existing test strips is as follows: First, the automatic packaging machine is started, and the bagged test strips produced by each automatic packaging machine are smoothly conveyed to the corresponding collection and counting device via a dedicated conveyor belt; then, the photoelectric sensor switch in the collection and counting device detects each bagged test strip in real time, completes the counting, and uploads the counting result to the automatic sample feeding and counting center, and simultaneously drags the bagged test strips to one of the storage slots in the collection and counting device to begin batch collection; then, when the number of bagged test strips in one of the storage slots reaches the preset transfer quantity, the cylinder is activated to transfer the bagged test strips from the storage slot. The test strips are transferred to the unloading area. Simultaneously, another storage tank takes over, continuing to receive and count the bagged test strips conveyed by the conveyor belt. Subsequently, a photoelectric sensor continuously monitors the main conveyor belt's discharge bin for bagged test strips. If no bagged test strips are detected in the main conveyor belt's discharge bin, a cylinder immediately actuates, transferring the bagged test strips from the unloading area to the main conveyor belt's discharge bin. Afterward, the main conveyor belt starts, moving the discharge bin until the bagged test strips are conveyed to the product ejection area. The cylinder and servo motor work together to transfer the bagged test strips from the discharge bin to the outer packaging sorting device.

[0004] The following technical problems still exist in the existing technology: In the automatic sample feeding and counting process of test strips, when bagged test strips are stuck together, existing technologies typically use a single photoelectric sensor for counting. This sensor can only identify the overall outline of the bag and cannot distinguish between multiple stuck bags. It is easy to misjudge multiple stuck bagged test strips as a single individual, resulting in an undercount of bagged test strips. When the bagged test strips shake during sample feeding or counting, the shaking will cause the sensor to trigger the signal multiple times, counting the same bagged test strip repeatedly, resulting in an overcount. When there is reflection on the surface of the packaging film of the bagged test strips, the reflection will interfere with the light reception of the photoelectric sensor, causing signal abrupt changes, threshold misjudgment, or even the complete failure to form an effective detection signal. This may lead to detection failure, missed detection, no signal output, or incorrect counting. The occurrence of the above three types of problems, individually or simultaneously, will further lead to a discrepancy between the actual number of bagged test strips stored in the storage tank and the preset transfer number, and will also cause deviations in subsequent transfer and sorting processes.

[0005] In summary, existing control methods for the entire process of automated sample feeding, counting, transfer, and sorting of test strips cannot meet the precise control requirements of complex scenarios such as adhesion, shaking, and reflective packaging films of bagged test strips. The adaptability of single photoelectric sensor detection and conventional signal processing methods is insufficient, and the collaborative efficiency of data signal acquisition, processing, counting, and transfer is lacking. The anti-interference, recognition accuracy, and anti-shake performance of data signals in scenarios of adhesion, shaking, and reflection have not been specifically addressed. As the scale of automated test strip production expands and packaging materials diversify, problems such as counting deviations, detection failures, and disordered transfer and sorting gradually accumulate and are amplified. The accuracy and adaptability of the entire process control continue to decline, making it difficult to meet the precise control requirements of the entire process of automated sample feeding, counting, and transfer of test strips. The efficiency and stability of automated test strip production are limited. Summary of the Invention

[0006] This invention provides an automatic sample feeding and counting control method and system for test strips, which solves the problem in the prior art that the control accuracy of the entire process of test strips is insufficient to meet the precise control requirements of the entire process of automatic sample feeding, counting and transfer of test strips, and that the efficiency and stability of automated test strip production are limited.

[0007] To achieve the aforementioned objectives, the present invention provides the following technical solution: an automatic sample feeding and counting control method for test strips, comprising: simultaneously performing multi-dimensional signal feature analysis of the adhesion state of bagged test strips, analysis of bag shaking state transitions, and dynamic background and signal distortion of bag reflected strong light; identifying and controlling the number of adhered test strips based on the multi-dimensional signal feature analysis results, and controlling the reduction of reflection peaks based on the dynamic background and signal distortion results; and performing batch collection and discrimination control of bagged test strips after the completion of the multi-dimensional signal feature analysis of the adhesion state of bagged test strips, the analysis of bag shaking state transitions, and the dynamic background and signal distortion of bag reflected strong light.

[0008] An automatic sample feeding and counting control system for test strips includes: a multi-source interference parallel sensing module, a counting error compensation and signal repair control module, and a test strip batch collection control module. The multi-source interference parallel sensing module is used to simultaneously perform multi-dimensional signal feature analysis of the adhesion state of the bagged test strips, analyze the transition of the bag's shaking state, and dynamically adjust the background and signal distortion of the bag's reflected strong light. The counting error compensation and signal repair control module is used to identify and control the number of adhered test strips based on the multi-dimensional signal feature analysis results, and to control the reduction of reflection spikes based on the dynamic background and signal distortion results. The test strip batch collection control module is used to perform batch collection discrimination and control of the bagged test strips after the multi-dimensional signal feature analysis of the adhesion state of the bagged test strips, the analysis of the transition of the bag's shaking state, and the dynamic background and signal distortion of the bag's reflected strong light are completed.

[0009] The above technical solution has at least the following advantages compared with the existing technology: 1. By conducting multi-dimensional signal feature analysis of the adhesion state of bagged test strips, analyzing the transition of bag shaking state, and dynamically varying the background and signal distortion of strong light reflected from the bag, it is possible to capture abnormal features in the counting process from multiple dimensions. This enables parallel identification and separation of three main interference sources: adhesion of bagged test strips, shaking, and reflection from packaging film. This reduces missed detections, false detections, and duplicate counts caused by single threshold judgments, thereby improving the accuracy and anti-interference ability of bagged test strip counting. Based on the results of multi-dimensional signal feature analysis, the number of test strips with adhesion can be identified and controlled. Based on the results of dynamic background and signal distortion, the reflection peak attenuation control helps to reduce the impact of the three types of interference on the counting results. The cumulative deviation of the results ensures high-precision quantification of the actual number of bags corresponding to each candidate counting pulse, providing reliable raw data for subsequent batch collection of bagged test strips. After the multi-dimensional signal feature analysis of the bagged test strip adhesion state, the transition analysis of bag shaking state, and the dynamic background and signal distortion of the bag reflected strong light are completed, batch collection discrimination and control of bagged test strips is carried out. This helps to reduce over-transfer or insufficient quantity caused by adhesion pulse overshoot, realize the automatic transfer of remaining bags across batches, and thus improve the control accuracy of the entire process of receiving in the feeding area, transferring on the main conveyor belt, and sorting out packaging. Finally, it realizes the stable and reliable operation of automatic sample feeding, counting, transfer and sorting of test strips.

[0010] 2. When multiple consecutive counting pulses are identified as sticking together, if correction is performed pulse by pulse by pulse by pulse using only the rounding method based on the pulse width ratio, the error from a single rounding may accumulate across multiple pulses, gradually amplifying the batch counting deviation. Furthermore, frequent sticking identification can trigger abnormal batch quantities in subsequent storage slots, increasing the risk of timing conflicts between cylinder transfer actions and conveyor pullers. Therefore, another method of identifying the number of sticking test strips is needed to obtain the cumulative error of bag sticking. The method determines whether the absolute value of the cumulative error exceeds a preset error threshold. If it does, the sticking quantity of the last pulse in the current window is compensated based on the cumulative error. Otherwise, the conventional method of identifying the number of sticking test strips continues. This helps reduce the systematic counting deviation caused by rounding in multiple consecutive sticking pulses, thereby controlling long-term drift in batch counting, improving the accuracy of batch collection in storage slots, and reducing the risk of cylinder malfunction due to counting errors. If the cumulative error of bag sticking is greater than 0, the current window... The number of adhered items in the last pulse is increased by 1 based on the original rounded result. Conversely, if the cumulative error of the bag adhesion is less than 0 and the number of bag adhesions is greater than 1, the number of adhered items in the last pulse of the current window is reduced by 1 based on the original rounded result. Otherwise, the regular identification of the number of adhered items on the test strips continues. The corrected number of adhered items on the bag is used as the actual count accumulation value of the current pulse. This helps to adaptively compensate for the rounding error in both positive and negative directions, reducing the batch quantity from being consistently too high or too low due to unidirectional cumulative deviation. This ensures that the actual number of bags in each storage tank is strictly close to the preset standard value, thereby controlling the consistency of material quantity in subsequent material receiving, main conveyor belt transfer, and outsourcing sorting. This achieves error self-balancing of the adhesion pulse sequence and closed-loop correction of batch counting, thus realizing high-precision and stable control of the entire process of automatic sample feeding, counting, transfer, and sorting of test strips under full adhesion conditions.

[0011] 3. When the total number of bagged test strips in the current storage tank is close to the preset transfer quantity during the batch collection of bagged test strips, and the actual number of bags corresponding to the next candidate counting pulse detected at this time is greater than the current remaining required quantity, it may cause the total number of bagged test strips after one-time accumulation to exceed the preset transfer quantity, resulting in batch overshoot, which in turn causes deviation in the subsequent cylinder transfer quantity and incorrect quantity received in the feeding area. Therefore, it is necessary to perform another test strip adhesion quantity identification to obtain the required number of bagged test strips. Perform conventional test strip adhesion quantity identification on each candidate counting pulse to obtain the number of bags in a single group. This helps to identify the risk of batch overshoot in advance. Through dynamic margin comparison, fine control of adhesion pulses can be achieved. Compare the number of bags in a single group with the required number of bagged test strips. If the number of bags in a single group is not greater than the required number of bagged test strips, then the candidate pulse is accumulated normally. The system selects the total number of bags corresponding to the counting pulse, increases the cumulative count accordingly, and waits for the next candidate counting pulse. If the number of bags in a single group is greater than the required number of bagged test strips, the required number of bags for bagged test strips is added to the cumulative count of the current storage tank. When the cumulative count reaches the preset transfer quantity, the cylinder is immediately triggered to transfer all bagged test strips in the current storage tank to the discharge area. The remaining number of bags in the candidate counting pulse is automatically transferred to the count of the next storage tank as the starting cumulative count for the next storage tank. The automatic sampling and counting operation continues, thereby avoiding the loss or duplicate counting of bags. This helps to achieve accurate counting and transfer across batches, ensuring that the batch quantity of each storage tank is strictly equal to the preset transfer quantity. At the same time, it reduces cylinder malfunctions and quantity deviations in the discharge area caused by overshooting of adhesion pulses, thereby controlling the consistency of the number of bagged test strips and the continuity of production throughout the entire process. Attached Figure Description

[0012] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0013] Figure 1 A flowchart illustrating an automatic sample feeding and counting control method for test strips provided in this application embodiment; Figure 2 This application provides a general flowchart of an automatic sample feeding and counting control method for test strips. Figure 3 A logic diagram for multi-dimensional signal feature analysis of the adhesion state of bagged test strips in an automatic sample feeding and counting control method for test strips provided in this application embodiment; Figure 4 This is a schematic diagram of an automatic sample feeding and counting control system for test strips provided in an embodiment of this application. Detailed Implementation

[0014] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of the present invention. All other embodiments obtained by those skilled in the art based on the described embodiments of the present invention without creative effort are within the scope of protection of the present invention.

[0015] Unless otherwise defined, the technical or scientific terms used in this invention shall have the ordinary meaning understood by one of ordinary skill in the art to which this invention pertains. The terms "an," "a," or "the," and similar words used in this invention do not indicate a limitation of quantity, but rather indicate the presence of at least one. Terms such as "comprising" or "including" mean that the element or object preceding the word encompasses the elements or objects listed following the word and their equivalents, without excluding other elements or objects.

[0016] Example 1, refer to Figure 1 This application provides a flowchart of an automatic sample feeding and counting control method for test strips, which is... Figure 1 It can be seen that: Parallel sensing of source interference is used to simultaneously perform multi-dimensional signal feature analysis of the adhesion state of the bagged test strips, bag shaking state transition analysis, and dynamic background and signal distortion quantification of the bag's reflected strong light during the automatic sample feeding and counting process. The multi-dimensional signal feature analysis of the adhesion state of the bagged test strips is used to quantify the adhesion state of multiple bagged test strips passing through the detection area due to electrostatic adsorption or tight arrangement. The bag shaking state transition analysis is used to determine the front-to-back adhesion caused by conveyor belt vibration or self-shaking of the bagged test strips. In the reciprocating motion state, the dynamic background and signal distortion of the bag reflecting strong light are used to estimate the baseline drift caused by ambient stray light and static reflection of the packaging film. This helps to identify the degree of signal distortion caused by the reflection of the packaging film of the bagged test strip. By sensing the source interference in parallel, it helps to capture the original signal characteristics of three types of interference sources, namely adhesion, jitter and strong light reflection, in a single candidate counting pulse cycle. This avoids feature loss or timing misalignment caused by serial processing, thus providing complete multi-dimensional information input for subsequent error compensation and improving the system's adaptability to complex working conditions.

[0017] The counting error compensation and signal repair control system corrects the counting deviation caused by the adhesion of the bagged test strips based on the multi-dimensional signal feature analysis results. It identifies and controls the number of test strips stuck together, and uses the reflection peak reduction control based on the dynamic background and signal distortion results to repair and restore the pulse edge characteristics. Through counting error compensation and signal repair control, it helps to implement accurate correction strategies for three types of interference sources, reducing the number of missed or repeated counts of bagged test strips.

[0018] The batch collection control of test strips involves analyzing the multi-dimensional signal characteristics of the adhered and sticky state of the bagged test strips, analyzing the transition of the bag's shaking state, and differentiating the dynamic background and signal distortion of the bag's reflected strong light. This process is followed by the batch collection discrimination and regulation of the bagged test strips for high-precision trigger cylinder transfer. This controls the timing accuracy of the batch transfer in the storage tank and the accurate triggering of the cylinder action. The batch collection control helps to dynamically adjust the accumulation strategy based on the adhesion identification results when the cumulative count approaches a preset threshold, improving the timing accuracy of the cylinder transfer and the consistency of the receiving area.

[0019] It should be noted that the automatic sample feeding and counting control method for test strips provided in this application relies on a pre-built dedicated data support platform for its research and development and implementation. This platform integrates and stores multi-dimensional data resources, including basic configuration parameters set by process engineers and control technology teams, such as preset sampling frequency, preset dynamic margin, preset attenuation coefficient, preset standard width of a single bag, and preset waveform amplitude. Simultaneously, the database includes standardized historical production line monitoring data, covering raw voltage waveform sequences, counting pulse width records, and corresponding actual verification quantities and algorithm training and verification data under different packaging film batches, different ambient light conditions, and different conveyor belt speeds. For example, it includes parameter optimization records for rounding the pulse width proportion in adhesion recognition. This database employs a hybrid data storage scheme, including records of window length adjustments for spurious pulse merging in jitter state transition analysis and optimization records of dynamic background filtering window size in reflection spike suppression. It manages structured parameters, such as preset transfer quantities, storage slot switching rules, and cylinder action timing tables, through a relational database, and stores unstructured data, such as raw counting waveform sequences, pulse rise and fall edge spanning time sequences, and distortion feature parameter sets, through a non-relational database. Technicians can periodically verify and optimize the preset parameters stored in the database based on newly collected production line counting feedback and manual sampling results, thereby ensuring that the data system continuously adapts to the evolution of actual working conditions during production, such as changes in packaging film transmittance, fluctuations in workshop stray light, and conveyor belt mechanical wear.

[0020] In this embodiment, by employing parallel source interference sensing, counting error compensation and signal repair control, and test strip batch collection control, a closed-loop control system covering the entire process from raw signal acquisition, interference feature extraction, error compensation correction to batch transfer triggering is constructed. This system enables adaptive suppression of three main interference sources: adhesion, jitter, and strong light reflection, thereby improving the overall control accuracy and production line stability of automatic test strip feeding and counting. Specifically, parallel source interference sensing provides accurate multi-dimensional feature parameters for counting error compensation and signal repair control. Simultaneously, the results of counting error compensation and signal repair control are directly used as input for test strip batch collection control, reducing cylinder malfunctions or batch misalignment caused by counting deviations. Furthermore, the batch transfer information in test strip batch collection control feeds back to counting error compensation. These three elements are interdependent and progressively enhance each other, forming a positive feedback optimization loop, thereby achieving high-precision control over the entire process of automatic test strip feeding, counting, and transfer.

[0021] Reference Figure 2 This application provides a general flowchart of an automatic sample feeding and counting control method for test strips, which is summarized in the embodiments of this application. Figure 2It can be seen that: Simultaneously, multi-dimensional signal feature analysis of the adhesion state of the bagged test strips, bag shaking state transition analysis, and dynamic background and signal distortion transformation of the bag's reflected strong light are performed. Among these, the multi-dimensional signal feature analysis of the adhesion state of the bagged test strips is performed. After the analysis, automatic sampling and counting continue. The bag shaking state transition analysis determines whether the voltage value of the current sampling point in the counting digital waveform sequence is greater than the waveform adaptive threshold, and whether the voltage value of the previous sampling point is not greater than the waveform adaptive threshold. If so, it is marked as a pulse rising transition; otherwise, a pulse falling transition judgment is performed. It determines whether the voltage value of the current sampling point is less than the waveform adaptive threshold, and whether the voltage value of the previous sampling point is not less than the waveform adaptive threshold. If so, it is marked as a pulse falling transition; otherwise, the next sampling point is processed until all sampling points in the counting digital waveform sequence within the candidate counting pulse region have been processed. The system determines whether two or more complete pulse rise and fall combinations are continuously recorded within the candidate counting pulse region. If so, sub-pulse merging is implemented; otherwise, automatic sampling and counting continue. The system also assesses whether the distortion peak amplitude is less than a preset amplitude threshold and the distortion duration is less than a preset time threshold for the dynamic background and signal distortion representation of the bag's reflected strong light. If not, reflection peak attenuation control is implemented; otherwise, automatic sampling and counting continue. Simultaneously, the total number of bagged test strips is acquired, and batch collection and discrimination control of bagged test strips is performed based on this total number. The system determines whether the total number of bagged test strips exceeds a preset transfer quantity. If so, the cylinder is activated, pushing all bagged test strips in the current storage tank to the discharge area, and the system switches to another storage tank to continue automatic sampling and counting; otherwise, automatic sampling and counting continue in the current storage tank.

[0022] Reference Figure 3 This application provides a logic diagram for the multi-dimensional signal feature analysis of the adhesion state of bagged test strips in an automatic sample injection and counting control method for test strips. Figure 3It can be seen that: Multi-dimensional signal feature analysis of the adhesion state of bagged test strips is performed, and the amplitude of the counting waveform is obtained. It is determined whether the amplitude of the counting waveform is greater than the waveform adaptive threshold. If not, the corresponding waveform interval is marked as a pulse-free region; otherwise, it is marked as a candidate counting pulse region. Multi-dimensional feature parameters are obtained based on the candidate counting pulse regions. It is determined whether the proportion of the counting pulse width is less than a preset width proportion threshold. If so, the pulse is counted as one valid bagged test strip count, and the total number of bagged test strips is obtained. Based on the total number of bagged test strips, batch collection of bagged test strips is performed. If no adjustment is made, then the adhesion judgment process will begin. The adhesion judgment process means judging whether the slope of the pulse rising edge is within the preset rising slope range and whether the slope of the pulse falling edge is within the preset falling slope range. If not, an abnormal bag shape prompt will be sent. Otherwise, the flat area judgment process will begin. The flat area judgment process means judging whether the length of the flat area of ​​the test strip is greater than the preset flat length threshold of a single bag. If so, the number of test strips adhering will be identified and controlled. Otherwise, the pulse will be counted as a valid bag test strip count, and a speed abnormality warning will be recorded. Batch collection and judgment control of bag test strips will also be performed.

[0023] Preferably, the specific process for judging the multi-dimensional signal characteristics of the adhered state of the bagged test strip is as follows: First, during the counting sampling time period, at a preset sampling frequency, such as 10kHz, the analog voltage output signal of the photoelectric sensor in the detection area of ​​the counting device is collected, and the analog voltage output signal is converted into a discrete counting digital waveform sequence by an analog-to-digital converter. The preset sampling frequency is set in advance by a preset person. The counting sampling time period represents the time interval experienced by a single bagged test strip from entering to completely leaving the detection area of ​​the photoelectric sensor in the counting device. The starting point of this time interval is the moment when the rising edge of the pulse is first triggered at the front edge of the bag, and the ending point is the moment when the falling edge of the pulse is last triggered at the rear edge of the bag. The counting digital waveform sequence represents a voltage value sequence arranged in chronological order. For example, the counting digital waveform sequence is {x[1],x[2],…,x[N]}, where N is the total number of sampling points, and x[n] represents the voltage value of the nth sampling point in volts. Second, based on the counting digital waveform sequence, the voltage value of the detection area is obtained. The counting waveform amplitude is determined by the presence or absence of bagged test strips obstructing the detection area. The difference between the maximum and minimum voltage values ​​in the counting digital waveform sequence is used as the counting waveform amplitude. If the counting waveform amplitude exceeds a waveform adaptive threshold, it indicates the presence of a valid bagged test strip within the detection area, and the corresponding waveform interval is marked as a candidate counting pulse region. Conversely, if the amplitude is below a threshold, it indicates the absence of a bagged test strip within the detection area, and the corresponding waveform interval is marked as a pulse-free region. The waveform adaptive threshold is represented by summing the background light intensity baseline with a preset dynamic margin. The preset dynamic margin is represented by the maximum value of all differences between the peak value of the pulse signal monitored by the oscilloscope and the corresponding background light intensity baseline. The background light intensity baseline is represented by multiplying the average voltage of the pulse-free region within the counting sampling period with a preset attenuation coefficient. The preset attenuation coefficient is set by a pre-defined operator to adjust the background light intensity baseline's sensitivity to slow drift, reducing baseline fluctuations or response lag caused by excessive noise.

[0024] Step three of the analysis involves extracting multi-dimensional feature parameters based on the candidate counting pulse region, including the counting pulse width ratio, pulse rising edge slope, pulse falling edge slope, and the length of the flat area of ​​the test strip. The counting pulse width ratio is calculated by dividing the counting pulse width by the preset standard width of a single bag, and is used to preliminarily determine whether the current pulse may be generated by multiple bags adhering together. The preset standard width of a single bag is represented by the average width of a single bag test strip over a historical time period. The counting pulse width is represented by the difference between the trigger time of the pulse falling edge and the trigger time of the pulse rising edge, used to quantify the projected length of the bag test strip in the direction of movement. A least squares linear fitting algorithm is used to linearly fit the counting digital waveform sequence within a predetermined time window after the pulse start point, and the fitting slope is used as the pulse rising edge slope to reflect the speed at which the front edge of the bag enters the photoelectric sensor beam. When the edge is neat and passes through the beam perpendicularly, the light intensity changes drastically, and the absolute value of the pulse rising edge slope is large. When the edge is warped or passes through at an angle, the light is gradually blocked, and the absolute value of the rising edge slope decreases. The time window is pre-set by designated personnel. A least-squares linear fitting algorithm is used to linearly fit the counting waveform sequence within the predetermined time window before the pulse end point. The fitting slope is used as the pulse falling edge slope to reflect the speed at which the rear edge of the test strip bag leaves the photoelectric sensor beam. When the edge is neat and leaves vertically, the absolute value of the pulse falling edge slope is larger; when the edge is trailing or tilted, the absolute value of the pulse falling edge slope decreases. In the middle region between the end of the pulse rising edge and the beginning of the falling edge, consecutive counting waveforms with amplitudes less than the preset waveform amplitude are... The length of the continuous interval is used as the length of the flat area of ​​the test strip. The preset waveform amplitude is represented by the average value of the waveform amplitude counted over a historical time period. If the number of separated continuous intervals is greater than 1, for example, if the amplitude briefly rises and then falls due to signal jitter, the longest interval length is taken as the length of the flat area of ​​the test strip. This is because the main characteristic of the bonded state is that there is no drop for a long time, while a brief rise is usually caused by noise and should not be divided into the main flat area. The bonding and adhesion state of the test strip is judged based on multi-dimensional feature parameters, and the multi-dimensional feature parameters are input into the judgment logic.

[0025] Specifically, the judgment logic is as follows: First, it determines whether the width ratio of the counting pulses is less than a preset width ratio threshold. If so, it determines that the single test strip corresponding to the current pulse has passed normally through the photoelectric sensor detection area, and counts this pulse as one valid bagged test strip count. Simultaneously, it obtains the total number of bagged test strips and performs batch collection and discrimination control based on the total number of bagged test strips. Otherwise, it enters the adhesion and bonding judgment process. The preset width ratio threshold is represented by the average value of the width ratio of the counting pulses over a historical time period. The adhesion and bonding judgment process determines whether the pulse rising edge slope is within a preset rising slope range and whether the pulse falling edge slope is within a preset falling slope range. If so, it indicates that the bag edge is clear and there is no warping or... If the overall pulse after tilting and fitting still maintains a steep edge characteristic, it enters the flat zone for discrimination. Otherwise, it indicates that the bag itself has an abnormal shape or unstable posture, sending a bag shape abnormality alert and uploading the multi-dimensional characteristic parameters of the pulse to the automated sample counting center for offline analysis and equipment maintenance early warning. The preset rising slope range and preset falling slope range include both endpoints and are set by preset personnel. It should be noted that the automated sample counting center represents a central control unit integrating data acquisition, storage, analysis, and decision support. This center receives counting digital waveform sequences, pulse characteristic parameters, abnormal event records, and batch collection results from various photoelectric sensors and control modules in real time, and stores the above data for a long time. The discrimination function determines whether the length of the flat area of ​​the test strip exceeds a preset threshold for the flat area length of a single bag. If it does, it indicates that multiple bags are passing through continuously in a bonded state. Because there are no gaps between the bags, there is no signal drop-off in the middle, and the flat area is extended. In this case, the number of test strips adhering is identified and controlled. Conversely, if the length exceeds the threshold, it indicates that the abnormal pulse width is not caused by bonding, but may be due to the width stretching of a single bag caused by abnormal conveyor belt speed. In this case, the pulse is judged as a normal passage of a single bag, and the pulse is counted as a valid bag test strip count. At the same time, a speed abnormality warning is recorded, and these multi-dimensional characteristic parameters are uploaded to the automatic sample counting center for preset personnel to perform closed-loop adjustment of the conveyor belt speed. The preset threshold for the flat area length of a single bag is used for this purpose. The average length of the flat area of ​​the test strips is used to represent the total length of the test strips over a historical period. The batch collection and judgment control of bagged test strips determines whether the total number of bagged test strips exceeds the preset transfer quantity. If so, it means that the current storage tank has been filled with the preset transfer quantity of bagged test strips. The cylinder is then activated, which pushes all the bagged test strips in the current storage tank to the discharge area. At the same time, it switches to another storage tank to continue automatic sampling and counting until the production task is completed, at which point the batch collection and judgment process ends. Conversely, if the current storage tank is not full, it means that the current storage tank is not yet full. Automatic sampling and counting in the current storage tank continue until the total number of bagged test strips reaches the preset transfer quantity. The preset transfer quantity is set by a preset operator.

[0026] In this embodiment, by analyzing the multi-dimensional signal characteristics of the adhesion state of bagged test strips and controlling the batch collection of bagged test strips, it is helpful to accurately identify the adhesion pulses caused by electrostatic adsorption or tight arrangement from the source. This effectively reduces the overshoot or undershoot of counting caused by a single adhesion pulse, reduces cylinder malfunctions, misalignment of the feeding area, and subsequent sorting chaos caused by batch quantity deviations, improves the counting accuracy and production line operation stability of the entire process, and realizes high-precision closed-loop control of automatic sample feeding, counting, and transfer of test strips.

[0027] Preferably, the specific control of the identification of the number of test strips adhering is as follows: the ratio of the counting pulse width is rounded to obtain the integer number of bags adhering. For example, if the ratio of the counting pulse width is 2.1, it is rounded to 2; if the ratio of the counting pulse width is 2.8, it is rounded to 3. The integer number of bags adhering indicates the actual number of bags adhering to the current pulse. The original count value of the current counting pulse is corrected to the number of bags adhering, that is, the corresponding count accumulation value is increased according to the integer number of bags adhering. The corresponding ratio of the counting pulse width is uploaded to the automatic sample injection counting center for offline compensation of batch counting errors. For example, if the integer number of bags adhering is 2, it is counted as 2 bagged test strips passing at the end of the pulse; if the integer number of bags adhering is 3, it is counted as 3 bagged test strips passing.

[0028] In this embodiment, the rounding operation in the control of the detection of the number of sticky test strips has the advantages of minimal computation, high real-time performance, and ease of implementation in embedded controllers. It can meet the real-time counting requirements of most production lines. At the same time, by correcting the original count value to the number of sticky strips and uploading the counting pulse width ratio to the automatic sampling counting center, it can provide accurate deviation basis for subsequent offline compensation of batch errors, thereby effectively reducing the omissions and cumulative deviations caused by bonding and adhesion, and improving the accuracy of batch collection in a single storage tank and the reliability of the entire process counting.

[0029] Preferably, the specific process of bag jitter state transition analysis is as follows: It is determined whether the voltage value of the current sampling point in the counting digital waveform sequence is greater than the waveform adaptive threshold, and whether the voltage value of the previous sampling point is not greater than the waveform adaptive threshold. If so, it is marked as a pulse rising transition; otherwise, a pulse falling transition is judged. Pulse falling transition judgment means determining whether the voltage value of the current sampling point is less than the waveform adaptive threshold, and whether the voltage value of the previous sampling point is not less than the waveform adaptive threshold. If so, it is marked as a pulse falling transition; otherwise, the next sampling point is processed until all sampling points in the counting digital waveform sequence within the candidate counting pulse region are processed. If two or more complete pulse rising and falling transition combinations are continuously recorded within the candidate counting pulse region, it is determined that the candidate counting pulse signal has a jitter state transition, and sub-pulse merging is adopted, i.e., the bag moves back and forth or up and down in the beam. Other than the above, the candidate counting pulse signal is determined to be jitter state transition. If there is no jitter transition, automatic sampling and counting continue, while the total number of bagged test strips is obtained. Based on the total number of bagged test strips, batch collection and discrimination control of bagged test strips are performed. Sub-pulse merging means that if the judgment result is that there is a jitter transition, all sub-pulses in the candidate pulse area are merged into a single valid counting pulse. That is, all rapid fluctuations in the middle are ignored, and only the time interval between the first pulse rising edge and the last pulse falling edge is counted as one bag passing through. At the same time, a jitter abnormality event is recorded, and all pulse rising and falling transitions are combined and uploaded to the automatic sampling and counting center for adjusting conveyor belt tension or reducing vibration sources. Sub-pulses are obtained in the following way: In the candidate counting pulse area, the signal interval between an adjacent pulse rising transition and the immediately following pulse falling transition is defined as a sub-pulse, where the start time of the sub-pulse is the pulse rising transition time, and the end time of the sub-pulse is the pulse falling transition time.

[0030] In this embodiment, the analysis of bag shaking state transitions helps to accurately capture multiple rapid threshold crossings caused by conveyor belt vibration or the bag's own shaking of the test strips. The sub-pulses are merged into a single effective counting pulse, thereby reducing the repeated counting of the same bag due to shaking, reducing false high counting errors, improving counting accuracy and system anti-interference capability under shaking interference, achieving stable and reliable single bag passing discrimination, and ensuring the continuity and consistency of the automatic sampling and counting process.

[0031] Preferably, the specific process for quantizing the dynamic background and signal distortion of the bag's reflected strong light is as follows: Quantization step one: The voltage value of the pulse-free region is used as the original sampling data of the background light intensity baseline; Quantization step two: The original sampling data of the background light intensity baseline is subjected to sliding average filtering based on the sliding window arithmetic average filtering algorithm to obtain the estimated value of the bag's dynamic background; The estimated value of the bag's dynamic background is used to reduce the influence of slow changes in ambient stray light and differences in the light transmittance of batches of packaging film on the baseline drift of the detection signal; Quantization step three: The difference between the voltage value of the current sampling point in the counting digital waveform sequence and the estimated value of the bag's dynamic background is used as the distortion of the bag's reflected signal, which is used to quantify the instantaneous deviation of the reflected light intensity of the bag's packaging film surface relative to the bag's dynamic background, thereby identifying the signal mutation caused by specular reflection; Positive peaks caused by the short-term increase in the reflected light intensity of the bag's packaging film surface and negative peaks caused by the short-term decrease in the reflected light intensity of the bag's packaging film surface are obtained, with positive peaks indicating that the bag's reflected signal distortion is greater than the preset positive peak distortion. The candidate counting pulse continuous interval for the threshold indicates a sharp positive jump in signal amplitude relative to the estimated dynamic background of the bag, reflecting an instantaneous increase in light intensity caused by specular reflection from the packaging film. A negative spike indicates a candidate counting pulse continuous interval where the distortion of the bag's reflected signal is less than a preset negative spike distortion threshold. Within this interval, the signal amplitude exhibits a sharp negative jump relative to the estimated dynamic background of the bag, reflecting an instantaneous decrease in light intensity caused by specular reflection from the packaging film. For example, when the estimated dynamic background of the bag is 2.5 volts, if the voltage at the current sampling point... If the voltage value increases to 4.0 volts, the distortion of the bag's reflected signal will be +1.5 volts, exceeding the preset positive peak distortion threshold of +1.0 volts, thus forming a positive peak. If the voltage value at the current sampling point decreases to 1.0 volts, the distortion of the bag's reflected signal will be -1.5 volts, below the preset negative peak distortion threshold of -1.0 volts, thus forming a negative peak. The preset positive peak distortion threshold is set by a preset person, and the preset negative peak distortion threshold is set in advance by a preset person. The preset positive peak distortion threshold is greater than the preset negative peak distortion threshold.

[0032] Step four of the quantization process involves statistically quantifying the distortion of the bag reflection signal within each candidate counting pulse region, extracting distortion feature parameters including distortion peak amplitude and distortion duration: the difference between the maximum and minimum values ​​of the bag reflection signal distortion within the candidate counting pulse region is used as the distortion peak amplitude, characterizing the maximum interference intensity of the strong light reflected from the bagged test strip; the duration of all positive and negative spikes within the candidate counting pulse region is summed to obtain the total distortion duration, characterizing the persistence of the bagged test strip reflection interference; the specific process for obtaining the duration of positive spikes is as follows: within the candidate counting pulse region... Within the test strip, when the distortion of the bag-reflected signal exceeds the preset positive spike distortion threshold, the time corresponding to the first sampling point within the continuous interval is taken as the start time of the positive spike, and the time corresponding to the last sampling point is taken as the end time of the positive spike. The difference between the end time and the start time of the positive spike is taken as the duration of the positive spike. If there are multiple discontinuous positive spike intervals within the same candidate counting pulse region, the duration of the positive spike in each interval is calculated separately, and the durations of the positive spikes in all positive spike intervals are summed to obtain the final duration of the positive spike. The specific process for obtaining the duration of the negative spike is as follows: within the candidate counting pulse region, when... When the distortion of the bag-reflected signal of the bagged test strip is less than the preset negative peak distortion threshold, the time corresponding to the first sampling point in the continuous interval is taken as the negative peak start time, and the time corresponding to the last sampling point is taken as the negative peak end time. The difference between the negative peak end time and the negative peak start time is taken as the negative peak duration. If there are multiple discontinuous negative peak intervals in the same pulse region, the negative peak duration of each interval is calculated separately, and the negative peak durations of all negative peak intervals are accumulated to obtain the final negative peak duration. Quantization step five: Based on the above distortion characteristic parameters, determine whether the current candidate counting pulse is reflected. Strong light interference: If the distortion peak amplitude is less than the preset amplitude threshold and the distortion duration is less than the preset time threshold, it is determined that there is no reflection interference, and automatic sampling and counting continue. At the same time, the total number of bagged test strips is obtained, and the batch collection and discrimination of bagged test strips is controlled based on the total number of bagged test strips. Otherwise, it is determined that there is strong light distortion in the current pulse, and the corresponding candidate counting pulse is marked as a reflection interference pulse. The reflection peak is weakened based on the reflection interference pulse. The preset amplitude threshold is represented by the average value of the distortion peak amplitude over a historical time period, and the preset time threshold is represented by the average value of the distortion duration over a historical time period.

[0033] Specifically, the process of reflection spike reduction control is as follows: For candidate counting pulse regions marked as reflection interference pulses, the counting digital waveform sequence of this region is subjected to sliding median filtering based on the sliding median filtering algorithm, which helps to remove isolated spikes while preserving the rising and falling edge contours of the pulses; the filtered counting digital waveform sequence replaces the original sequence, and the distortion characteristic parameters are reacquired. If the distortion peak amplitude is still not less than the preset amplitude threshold, or the distortion duration is still not less than the preset time threshold, a reflection spike reduction control failure prompt is sent, a reflection interference event is recorded, and the distortion characteristic parameters before and after repair are uploaded to the automatic sampling and counting center for analyzing the batch change trend of the reflective properties of the packaging film, and providing a basis for preset personnel to adjust the lighting layout of the production workshop or the installation angle of the photoelectric sensor. Otherwise, automatic sampling and counting continue to be performed, and the total number of bagged test strips is obtained. Based on the total number of bagged test strips, batch collection and discrimination control of bagged test strips is performed.

[0034] In this embodiment, by dynamically quantifying the background and signal distortion of strong light reflected from the bag and controlling the reduction of reflection spikes, it is helpful to estimate the baseline drift caused by ambient stray light and static reflection of the packaging film. The amplitude and duration of positive and negative spikes are quantified with high precision. Dynamic background compensation and adaptive threshold repair are used to effectively suppress signal distortion caused by specular reflection, reduce detection failure, missed detection or false counting caused by reflection interference, improve signal integrity and counting reliability under complex lighting and highly reflective packaging conditions, realize waveform recovery of reflection interference pulses, and ensure the stable operation of automatic sample introduction and counting process.

[0035] Reference Figure 4 This application provides a schematic diagram of the structure of an automatic sample feeding and counting control system for test strips. The automatic sample feeding and counting control system includes a multi-source interference parallel sensing module, a counting error compensation and signal repair control module, and a test strip batch collection control module. The multi-source interference parallel sensing module is used to simultaneously perform multi-dimensional signal feature analysis of the adhesion state of the bagged test strips, analyze the transition of the bag's shaking state, and transform the dynamic background and signal distortion of the bag's reflected strong light. Through the multi-source interference parallel sensing module, it is helpful to process the signal features of three types of interference sources in parallel within the same sampling window, improving the system's response speed to composite interference and ensuring that the subsequent error compensation module can obtain time-synchronized, dimensionally complete multi-source feature data, thereby enhancing the system's real-time performance and collaborative processing capabilities.

[0036] The counting error compensation and signal repair control module is used to: identify and control the number of test strips stuck together based on the results of multi-dimensional signal feature analysis; and control the reduction of reflection spikes based on the results of dynamic background and signal distortion. Through the counting error compensation and signal repair control module, it is helpful to implement differentiated correction strategies for different types of interference sources, form an adaptive error correction closed loop, and improve the robustness of the counting algorithm in complex production environments.

[0037] The batch collection control module for test strips is used to: after the multi-dimensional signal feature analysis of the adhesion state of the bagged test strips, the transition analysis of the bag shaking state, and the dynamic background and signal distortion of the strong light reflected by the bag, the batch collection and discrimination control of the bagged test strips is carried out. Through the batch collection control module, it helps to ensure the consistency between the timing of cylinder transfer and the receiving in the feeding area, and reduce the frequency of equipment malfunction.

[0038] In this embodiment, the environmental adaptability and long-term operational stability of the automatic sample feeding and counting process of test strips are improved by using a multi-source interference parallel sensing module, a counting error compensation and signal repair control module, and a test strip batch collection control module. Specifically, the multi-source interference parallel sensing module provides synchronous multi-dimensional feature parameters to the counting error compensation and signal repair control module, enabling error compensation to be targeted based on accurate interference type and intensity. The corrected count value output by the counting error compensation and signal repair control module is directly used as the input of the test strip batch collection control module, reducing cylinder malfunctions or batch misalignment caused by counting deviations. The three modules are interconnected and progressively improve each other, jointly achieving high-precision and high-reliability control of the automatic sample feeding and counting process of test strips.

[0039] Example 2, based on Example 1, as an alternative solution, when multiple consecutive counting pulses are identified as sticking together, if correction is performed pulse by pulse by pulse using only the method of rounding down the pulse width ratio, single rounding errors may accumulate over multiple pulses. For example, 2.1 rounded to 2 may actually be 2.0 or 2.4, gradually amplifying the batch counting deviation. Furthermore, frequent sticking identification can trigger abnormal batch quantities in subsequent storage slots, increasing the risk of timing conflicts between cylinder transfer actions and conveyor levers. Therefore, a second alternative solution for identifying the number of sticking test strips is required. Specifically... The process is as follows: Obtain the total value of the count pulse width ratio and the total value of the integer number of bag adhesions; sum the count pulse width ratios of all items within the current adhesion status recognition sliding window, and use the sum as the total count pulse width ratio; sum the integer number of bag adhesions within the current adhesion status recognition sliding window, and use the sum as the total number of bag adhesions; calculate the difference between the total count pulse width ratio and the total number of bag adhesions, and use the result as the cumulative error of bag adhesions. It should be noted that although the count pulse width ratio is a dimensionless ratio, its physical meaning is the current pulse width ratio. The corresponding equivalent number of bags is the multiple of the actual pulse width relative to the standard width of a single bag. Therefore, the sum of the pulse width ratios of multiple pulses represents a real estimate of the total equivalent number of bags corresponding to these pulses. Its unit is consistent with the unit of the total number of bags with integer adhesion, which is bags. Therefore, the bag adhesion cumulative error obtained by the difference calculation has a clear physical meaning, that is, the deviation between the actual total number of bags that have passed and the total number of rounded counts. This deviation is in bags and can be directly used to quantify the systematic error of rounding. It is then used to determine whether the absolute value of the bag adhesion cumulative error is greater than the preset error threshold. If so, it is determined that there is a systematic deviation in the rounding method within the current adhesion status recognition sliding window. Then, based on the cumulative error of bag adhesion, the adhesion quantity of the last pulse in the current window is compensated and corrected for bag adhesion. Otherwise, the conventional test strip adhesion quantity recognition and control continues to be performed. The preset error threshold is represented by the average of the absolute values ​​of the cumulative error of bag adhesion over a historical time period. The conventional test strip adhesion quantity recognition and control means that the ratio of the counting pulse width is rounded to obtain the integer adhesion quantity of the bag, and the original count value of the current counting pulse is corrected to the adhesion quantity.

[0040] Specifically, the process for compensating for bag adhesion is as follows: If the cumulative error of bag adhesion is greater than 0, it indicates that the overall integer number of bag adhesions is too small. In this case, the adhesion count of the last pulse in the current window is increased by 1 based on the original rounded result. Otherwise, the correction is performed to ensure that the integer number of bag adhesions is too large. The correction to ensure that the integer number of bag adhesions is too large means that if the cumulative error of bag adhesion is less than 0 and the integer number of bag adhesions is greater than 1, it indicates that the overall integer number of bag adhesions is too large. In this case, the adhesion count of the last pulse in the current window is decreased by 1 based on the original rounded result. Otherwise, the conventional test strip adhesion count recognition and control is continued. The compensated and corrected integer number of bag adhesions is used as the actual count accumulation value of the current pulse.

[0041] In this embodiment, by identifying the number of adhesive test strips and compensating for bag adhesion, it is helpful to quantify the systematic deviation caused by rounding in real time under the condition of multiple consecutive bonding and adhesion pulses. By using the sliding window cumulative error detection mechanism, the number of adhesions in the last pulse within the fixed-point compensation correction window is effectively reduced. This reduces the cumulative amplification effect of single rounding errors on multiple pulses, reduces long-term drift in batch counting and deviation in the number of storage slots, and achieves self-balancing and closed-loop correction of counting errors in bonding and adhesion scenarios. This ensures the consistency of materials received in the subsequent feeding area and transferred by the main conveyor belt.

[0042] Example 3, based on Example 1, as another alternative, when the total number of bagged test strips in the current storage tank is close to the preset transfer quantity during the batch collection of bagged test strips, and the actual number of bags corresponding to the next candidate counting pulse detected at this time, after identifying the number of test strips stuck together, is greater than the current remaining required quantity, it may cause the total number of bagged test strips after a one-time accumulation to exceed the preset transfer quantity. For example, the preset transfer quantity is 50 bags, the current cumulative count is 49 bags, the remaining required quantity is 1 bag, and the next candidate counting pulse identifies 3 bags. If directly... The cumulative total of bagged test strips becomes 52 bags, causing batch overshoot, which in turn leads to deviations in the number of subsequent cylinder transfers and errors in the number of items received in the unloading area. Therefore, a third alternative scheme for identifying the number of adhered test strips needs to be implemented. The specific process is as follows: Identification Step 1: During the batch collection of bagged test strips, obtain the required number of bagged test strips. The required number of bagged test strips is represented by the result of a difference calculation between the total number of bagged test strips in the current storage tank, the batch collection judgment and control based on the total number of bagged test strips, and the preset transfer quantity. Identification Step 2: Step two: For each candidate counting pulse, perform routine identification and control of the number of test strips adhered to obtain the number of single-group bags corresponding to that candidate counting pulse; Step three: Compare the number of single-group bags with the required number of bagged test strips; If the number of single-group bags is not greater than the required number of bagged test strips, then normally accumulate the total number of bags corresponding to that candidate counting pulse to increase the cumulative count by the corresponding amount, and continue waiting for the next candidate counting pulse; If the number of single-group bags is greater than the required number of bagged test strips, it indicates that a one-time accumulation will cause overshoot, in which case only the required number of bagged test strips will be added. The number of bags is counted in the current storage tank's cumulative count. When the cumulative count reaches the preset transfer quantity, the cylinder is immediately triggered to transfer all bagged test strips in the current storage tank to the feeding area. In the fourth identification step, the remaining number of bags in the candidate counting pulse is automatically transferred to the count of the next storage tank as the starting cumulative count for the next storage tank, and the automatic sampling and counting operation continues to be performed, thereby avoiding the loss or duplicate counting of bag counts. The remaining number of bags is represented by the result of the difference calculation between the number of bags in a single group corresponding to the candidate counting pulse and the required number of bagged test strips.

[0043] In this embodiment, by identifying the number of sticky test strips, it is helpful to accurately control the number of bags added each time when the batch collection is close to the preset transfer quantity, by using the remaining quantity comparison and batch transfer mechanism. This reduces the one-time overshoot caused by the sticky pulse containing multiple bags, reduces the deviation of the number of bags received in the discharge area, improves the end point control accuracy of batch collection and the timing accuracy of cylinder triggering, realizes the automatic transfer of remaining bags across batches, and ensures that the final cumulative quantity of each storage tank is equal to the preset transfer quantity, thereby ensuring the continuity and consistency of the entire process of counting and transfer.

[0044] The above are merely specific embodiments of the present invention, but the scope of protection of the present invention is not limited thereto. The scope of protection of the present invention should be determined by the scope of the claims.

Claims

1. An automatic sample feeding and counting control method for test strips, characterized in that, The method includes: Simultaneously, multi-dimensional signal feature analysis of the adhesion state of the bagged test strips, transition analysis of the bag shaking state, and dynamic background and signal distortion of the bag reflected strong light were performed. Based on the results of multi-dimensional signal feature analysis, the number of test strips adhering is identified and controlled, and the reflection peak is reduced based on the results of dynamic background and signal distortion. After the analysis of multi-dimensional signal characteristics of the bagged test strips in the state of adhesion, the analysis of bag shaking state transitions, and the dynamic background and signal distortion of the strong light reflected from the bag, the batch collection and discrimination control of the bagged test strips is carried out.

2. The automatic sample feeding and counting control method for test strips according to claim 1, characterized in that, The specific process for analyzing the multi-dimensional signal features of the adhesion state of the bagged test strips is as follows: During the counting sampling period, the analog voltage output signal of the photoelectric sensor in the detection area of ​​the counting device is collected at a preset sampling frequency, and the analog voltage output signal is converted into a discrete counting digital waveform sequence through an analog-to-digital converter. The counting digital waveform sequence represents a sequence of voltage values ​​arranged in chronological order; The amplitude of the counting waveform is obtained based on the counting digital waveform sequence to quantify whether there is a bagged test strip blocking the detection area; The difference between the maximum and minimum voltage values ​​in the counting digital waveform sequence is used as the amplitude of the counting waveform. Determine whether the amplitude of the counting waveform is greater than the waveform adaptive threshold. If it is, mark the corresponding waveform interval as a candidate counting pulse region; otherwise, mark the corresponding waveform interval as a no-pulse region. Multi-dimensional feature parameters are extracted based on candidate counting pulse regions, including the proportion of counting pulse width, the slope of the pulse rising edge, the slope of the pulse falling edge, and the length of the flat area of ​​the test strip; The result of the ratio calculation between the counting pulse width and the preset standard width of a single bag is used as the counting pulse width ratio. The counting pulse width is represented by the difference between the trigger time of the falling edge of the pulse and the trigger time of the rising edge of the pulse, and is used to quantify the projected length of the bagged test strip in the direction of movement. The least squares linear fitting algorithm is used to perform linear fitting on the counting digital waveform sequence within a predetermined time window after the pulse start point, and the fitting slope is used as the pulse rising edge slope. The least squares linear fitting algorithm is used to perform linear fitting on the counting digital waveform sequence within a predetermined time window before the pulse end point, and the fitting slope is used as the pulse falling edge slope. In the middle region between the end of the rising edge of the pulse and the beginning of the falling edge, the length of the continuous interval where the amplitude of the counting waveform is less than the preset waveform amplitude is taken as the length of the flat area of ​​the test strip. The adhesion and bonding status of the test strips are determined based on multi-dimensional feature parameters, which are then input into the discrimination logic.

3. The automatic sample feeding and counting control method for test strips according to claim 2, characterized in that, The judgment logic is as follows: Determine whether the width ratio of the counting pulse is less than the preset width ratio threshold. If so, count the pulse as a valid bagged test strip count and obtain the total number of bagged test strips. Based on the total number of bagged test strips, perform batch collection and discrimination control of bagged test strips. Otherwise, proceed to the adhesion and bonding judgment process. The adhesion and bonding determination process means determining whether the slope of the pulse rising edge is within the preset rising slope range and whether the slope of the pulse falling edge is within the preset falling slope range. If so, it enters the flat area discrimination; otherwise, it sends a bag morphology abnormality prompt and uploads the multi-dimensional characteristic parameters of the pulse to the automatic sample counting center. The flat area discrimination means determining whether the length of the flat area of ​​the test strip is greater than the preset flat length threshold of a single bag. If so, the number of test strips stuck together is identified and controlled. Otherwise, the pulse is counted as a valid bagged test strip count, and a speed abnormality warning is recorded. The multi-dimensional feature parameters are uploaded to the automatic sample counting center. The batch collection and discrimination control of bagged test strips indicates whether the total number of bagged test strips is greater than the preset transfer quantity. If so, the cylinder is activated, and the cylinder pushes all the bagged test strips in the current storage tank to the feeding area. At the same time, it switches to another storage tank to continue to perform automatic sampling and counting. Otherwise, it continues to perform automatic sampling and counting in the current storage tank.

4. The automatic sample feeding and counting control method for test strips according to claim 3, characterized in that, The specific control measures for identifying the number of sticky test strips are as follows: The integer number of adhesive residues in the bag is obtained by rounding down the percentage of the counting pulse width. Correct the original count value of the current counting pulse to the adhesion quantity.

5. The automatic sample feeding and counting control method for test strips according to claim 1, characterized in that, The specific process of the bag shaking state transition analysis is as follows: Determine whether the voltage value of the current sampling point in the counting digital waveform sequence is greater than the waveform adaptive threshold and whether the voltage value of the previous sampling point is not greater than the waveform adaptive threshold. If so, mark it as a pulse rising crossover; otherwise, perform a pulse falling crossover judgment. The pulse drop crossover judgment means determining whether the voltage value of the current sampling point is less than the waveform adaptive threshold and whether the voltage value of the previous sampling point is not less than the waveform adaptive threshold. If so, it is marked as a pulse drop crossover; otherwise, the next sampling point is processed until the sampling points in the counting digital waveform sequence within the candidate counting pulse region are processed. If two or more complete pulse rise and fall transition combinations are recorded consecutively within the candidate counting pulse region, the candidate counting pulse signal is determined to have jitter state transition, and sub-pulse merging is performed. In other cases, the candidate counting pulse signal is determined not to have jitter state transition, and automatic sampling and counting continue. The sub-pulse merging means that when the determination result is that there is a jitter state transition, all sub-pulses in the candidate pulse region are merged into a valid counting pulse, a jitter abnormality event is recorded, and all pulse rise transitions and pulse fall transitions are combined and uploaded to the automatic sample counting center.

6. The automatic sample feeding and counting control method for test strips according to claim 1, characterized in that, The specific process of dynamic background and signal distortion transformation of the strong light reflected by the bag is as follows: The voltage value of the pulse-free region is used as the raw sampling data for the background light intensity baseline; The original sampling data of the background light intensity baseline is processed by sliding window arithmetic mean filtering algorithm to obtain the dynamic background estimate of the bag body. The difference between the voltage value at the current sampling point in the counting digital waveform sequence and the estimated dynamic background value of the bag is used as the distortion variable of the bag's reflected signal; Obtain positive and negative spikes; The distortion of the bag reflection signal within each candidate counting pulse region is statistically quantified, and distortion feature parameters, including the peak amplitude and duration of distortion, are extracted: The difference between the maximum and minimum values ​​of the distortion of the bag reflection signal within the candidate counting pulse region is taken as the distortion peak amplitude. The total distortion duration is obtained by summing the durations of all positive and negative spikes within the candidate counting pulse region. The specific process for obtaining the duration of the positive peak is as follows: Within the candidate counting pulse region, when the distortion of the bag reflection signal of the bagged test strip is greater than the preset positive peak distortion threshold, the time corresponding to the first sampling point in the continuous interval is taken as the positive peak start time, the time corresponding to the last sampling point is taken as the positive peak end time, and the difference between the positive peak end time and the positive peak start time is taken as the positive peak duration. The specific process for obtaining the duration of the negative peak is as follows: Within the candidate counting pulse region, when the distortion of the bag reflection signal of the bagged test strip is less than the preset negative peak distortion threshold, the time corresponding to the first sampling point in the continuous interval is taken as the negative peak start time, the time corresponding to the last sampling point is taken as the negative peak end time, and the difference between the negative peak end time and the negative peak start time is taken as the negative peak duration. Determine whether the current candidate counting pulse is affected by reflected strong light based on the distortion characteristic parameters: If the distortion peak amplitude is less than the preset amplitude threshold and the distortion duration is less than the preset time threshold, it is determined that there is no reflection interference, and automatic sampling and counting continue to be performed. At the same time, the total number of bagged test strips is obtained, and the batch collection and discrimination control of bagged test strips is performed based on the total number of bagged test strips. Otherwise, the corresponding candidate counting pulse is marked as a reflection interference pulse, and the reflection spike reduction control is performed based on the reflection interference pulse.

7. The automatic sample feeding and counting control method for test strips according to claim 6, characterized in that, The specific process of the reflection spike reduction control is as follows: For candidate counting pulse regions marked as reflected interference pulses, the counting digital waveform sequence of this region is subjected to sliding median filtering based on the sliding median filtering algorithm; Replace the original sequence with the filtered counting digital waveform sequence and reacquire the distortion characteristic parameters. If the distortion peak amplitude is still not less than the preset amplitude threshold or the distortion duration is still not less than the preset time threshold, send a reflection spike attenuation control failure prompt, record a reflection interference event, and upload the distortion characteristic parameters before and after repair to the automatic sampling counting center.

8. The automatic sample feeding and counting control method for test strips according to claim 3, characterized in that, The detection and control of the number of sticky test strips also includes: Obtain the total value of the counting pulse width ratio and the total value of the integer number of bag adhesions; The summation of the width proportions of all counting pulses within the current adhesion state identification sliding window is taken as the total value of the width proportion of the counting pulses. The summation of all integer adhesion counts of bags within the current adhesion status identification sliding window is taken as the total integer adhesion count of bags. The difference between the total percentage of counting pulse widths and the total number of integer adhesions in the bag is calculated, and the result is used as the cumulative error of bag adhesion. Determine whether the absolute value of the cumulative error of bag adhesion is greater than the preset error threshold. If so, compensate and correct the number of adhesions in the last pulse in the current window based on the cumulative error of bag adhesion. Otherwise, continue to perform the normal test strip adhesion count identification and control. The conventional test strip adhesion quantity identification and control method involves rounding the ratio of the counting pulse width to obtain the integer adhesion quantity of the bag body, and then correcting the original count value of the current counting pulse to the adhesion quantity. The specific process for compensating and correcting bag adhesion is as follows: If the cumulative error of bag adhesion is greater than 0, the adhesion count of the last pulse in the current window is increased by 1 based on the original rounded result; otherwise, the integer adhesion count of the bag is corrected to be too large. The correction for an excessively large number of integer adhesions in the bag means that if the cumulative error of bag adhesions is less than 0 and the number of integer adhesions in the bag is greater than 1, the number of adhesions in the last pulse in the current window will be reduced by 1 based on the original rounded result. Otherwise, the regular detection and control of the number of adhesions in the test strip will continue. The integer number of adhesions in the bag after compensation and correction is used as the actual count accumulation value of the current pulse.

9. The automatic sample feeding and counting control method for test strips according to claim 3, characterized in that, The detection and control of the number of sticky test strips also includes: During the bulk collection of bagged test strips, the required number of bagged test strips is obtained; For each candidate counting pulse, the number of sticky test strips is identified and controlled using conventional methods to obtain the number of single bags corresponding to that candidate counting pulse. Compare the number of bags in a single set with the required number of bagged test strips; If the number of bags in a single group is not greater than the required number of bagged test strips, then the total number of bags corresponding to the candidate counting pulse will be accumulated normally, increasing the cumulative count by the corresponding amount, and then waiting for the next candidate counting pulse. If the number of bags in a single group is greater than the required number of bagged test strips, the number of bags required for the required number of bagged test strips will be added to the cumulative count of the current storage tank. When the cumulative count reaches the preset transfer quantity, the cylinder will be triggered to transfer all the bagged test strips in the current storage tank to the discharge area. The remaining number of bags in the candidate counting pulse is automatically transferred to the counting of the next storage tank, serving as the starting cumulative count for the next storage tank, and the automatic sample injection and counting operation continues.

10. An automatic sample feeding and counting control system for test strips, employing the automatic sample feeding and counting control method for test strips as described in any one of claims 1-9, characterized in that, include: Multi-source interference parallel sensing module, counting error compensation and signal repair control module, and test strip batch collection control module: The multi-source interference parallel sensing module is used to: simultaneously perform multi-dimensional signal feature analysis of the adhesion state of the bagged test strips, analyze the transition of the bag shaking state, and transform the dynamic background and signal distortion of the strong light reflected by the bag. The counting error compensation and signal repair control module is used to: identify and control the number of test strips stuck together based on the multi-dimensional signal feature analysis results, and control the reduction of reflection spikes based on the dynamic background and signal distortion results. The test strip batch collection control module is used to: perform batch collection discrimination and control of bagged test strips after the multi-dimensional signal feature analysis of the bagged test strip adhesion state, the transition analysis of the bag shaking state, and the dynamic background and signal distortion of the bag reflected strong light.

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