A clamping device and method for a scanning probe

Abstract

The application relates to the technical field of material testing instruments, and discloses a clamping device and method for a scanning probe, which comprises a probe mounting frame, a mounting hole is formed in the middle of the probe mounting frame, a probe is arranged in the mounting hole, a positioning ring is fixedly connected to the surface of the probe, a limiting ring is fixedly connected to the inner wall of the mounting hole, and a mounting groove is formed in the top of the probe mounting frame. The clamping assembly is arranged, specifically, the probe is placed in the mounting hole, the position of the probe is limited through the positioning ring, then the convex plate is gradually loosened, the elastic reset of the spring pushes the sliding seat to slide along the fixed rod, the two clamping plates are moved to approach each other and are in contact with the surface of the probe, the probe is tightly clamped through the clamping plates, the probe can be quickly installed and fixed, the working efficiency is improved, and the flexibility during use is improved according to different models of the probe.

Description

Technical Field

[0001] This invention relates to the field of materials testing instrument technology, and in particular to a clamping device and method for scanning probes. Background Technology

[0002] A scanning tunneling microscope (STM) is a type of scanning probe microscope (SPM). STM utilizes the quantum tunneling effect between the tip and the sample, resulting in an exponential relationship between the tunneling current and the spacing, to achieve atomic-level resolution of microstructures on material surfaces. STM can be applied in various complex environments: ultra-high vacuum and high-pressure environments, low-temperature (mK range) or high-temperature (1300K range) environments, and even various liquid environments. Furthermore, STM has a wide range of applications, including thin film growth, self-assembled monolayers, electrochemistry, and catalysts.

[0003] Different test materials require different probe models. Therefore, when SPM changes probe models during testing, it is necessary to remove the probe to be changed and put the replacement probe into the probe holder. However, the process of installing and removing probes is relatively troublesome, and the probe holder is difficult to adapt to different probe models, which reduces the flexibility of use. Therefore, we propose a clamping device for scanning probes. Summary of the Invention

[0004] To address the aforementioned technical problems, the present invention provides a clamping device and method for scanning probes.

[0005] The present invention is achieved by the following technical solution: a clamping device and method for scanning probes, including a probe mounting frame, a mounting hole in the middle of the probe mounting frame, a probe disposed inside the mounting hole, a positioning ring fixedly connected to the surface of the probe, a limit ring fixedly connected to the inner wall of the mounting hole, a mounting groove in the top of the probe mounting frame, and a clamping component disposed inside the mounting groove;

[0006] The clamping assembly includes a fixing rod, a spring sleeved on the surface of the fixing rod, a sliding seat slidably connected to the surface of the fixing rod, a clamping plate fixedly connected to one end of the sliding seat, and a protruding plate fixedly connected to the surface of the clamping plate.

[0007] With the above technical solution, during installation, the probe is placed inside the mounting hole, and the position of the probe is limited by the positioning ring. Then, the protruding plate is gradually released, allowing the elastic return of the spring to push the sliding seat to slide along the fixed rod. This causes the two clamping plates to move closer to each other and contact the surface of the probe, tightly clamping the probe. This facilitates quick installation and fixation of the probe, improving work efficiency. It also allows for greater flexibility in use when using different probe models. During disassembly, the protruding plate is pushed to both sides by a robotic arm, causing the clamping plates to slide along the surface of the fixed rod, thus releasing the probe from its fixation. This allows for quick removal of the probe, facilitating subsequent replacement and improving ease of use.

[0008] As a further improvement to the above solution, one end of the fixing rod is fixedly connected to the inner wall of the mounting groove.

[0009] The above technical solution uses a fixed rod to limit the sliding seat, ensuring the stability of the clamping plate during movement.

[0010] As a further improvement to the above solution, one end of the spring is fixedly connected to the surface of the sliding seat.

[0011] The above technical solution allows the sliding seat to move by the elastic reset of the spring. When the clamping plate contacts the probe surface, the spring force causes the clamping plate to clamp the probe tightly, preventing displacement during the test and ensuring the accuracy of the test.

[0012] As a further improvement to the above solution, the end of the spring away from the sliding seat contacts the inner wall of the mounting groove.

[0013] As a further improvement to the above solution, one end of the clamping plate is in contact with the surface of the probe, and the protruding plate is located at the upper end of the probe mounting bracket.

[0014] The above technical solution provides a through hole on the inner wall of the clamping plate, allowing the clamping plate to slide on the surface of the fixing rod.

[0015] As a further improvement to the above solution, the probe passes through the probe mounting bracket via a mounting hole.

[0016] The above technical solution allows the probe to penetrate the mounting base through the mounting hole, facilitating subsequent testing via the probe.

[0017] As a further improvement to the above solution, the lower surface of the positioning ring contacts the upper surface of the limiting ring.

[0018] The above technical solution uses a limiting ring to limit the positioning ring, thereby limiting the position of the probe and facilitating subsequent installation and fixation.

[0019] Compared with the prior art, the beneficial effects of the present invention are as follows:

[0020] This invention features a clamping assembly. Specifically, the probe is placed inside the mounting hole, and the position of the probe is limited by a positioning ring. Then, the protruding plate is gradually released, allowing the elastic return of the spring to push the sliding seat along the fixed rod. This causes the two clamping plates to move closer to each other and contact the surface of the probe, thus clamping the probe tightly. This facilitates quick installation and fixation of the probe, improving work efficiency. It also allows for greater flexibility in use when using different probe models. Attached Figure Description

[0021] Figure 1 This is a schematic diagram of the overall structure of the present invention;

[0022] Figure 2 This is a schematic diagram of the cross-sectional structure of the present invention;

[0023] Figure 3 For the present invention Figure 2 Enlarged structural diagram of section A in the middle;

[0024] Figure 4 This is a top view of the structure of the present invention;

[0025] Figure 5 This is a schematic diagram of the clamping component structure of the present invention.

[0026] Explanation of key symbols:

[0027] 1. Probe mounting bracket; 2. Mounting hole; 3. Probe; 4. Positioning ring; 5. Limiting ring; 6. Clamping assembly; 601. Fixing rod; 602. Spring; 603. Sliding seat; 604. Clamping plate; 605. Protruding plate; 7. Mounting groove. Detailed Implementation

[0028] The present invention will now be further described in conjunction with the accompanying drawings and specific embodiments. It should be noted that, without conflict, the various embodiments or technical features described below can be arbitrarily combined to form new embodiments.

[0029] Example:

[0030] Please combine Figure 1-5 This embodiment provides a clamping device and method for scanning probes, including a probe mounting frame 1, a mounting hole 2 in the middle of the probe mounting frame 1, a probe 3 inside the mounting hole 2, a positioning ring 4 fixedly connected to the surface of the probe 3, a limit ring 5 fixedly connected to the inner wall of the mounting hole 2, and a mounting groove 7 at the top of the probe mounting frame 1, with a clamping component 6 inside the mounting groove 7.

[0031] The clamping assembly 6 includes a fixed rod 601, a spring 602 sleeved on the surface of the fixed rod 601, a sliding seat 603 slidably connected to the surface of the fixed rod 601, a clamping plate 604 fixedly connected to one end of the sliding seat 603, and a protruding plate 605 fixedly connected to the surface of the clamping plate 604. During installation, the clamping plate 604 is first moved to both sides by the protruding plate 605, causing the sliding seat 603 to slide along the fixed rod 601, while simultaneously compressing the spring 602. Then, the probe 3 is inserted into the mounting hole 2, and the position of the probe 3 is limited by the positioning ring 4. Then, the protruding plate 605 is gradually released, causing the elastic return of the spring 602 to push the sliding seat 603 to slide along the fixed rod 601, causing the two clamping plates 604 to move closer to each other and contact the surface of the probe 3. The clamping plates 604 tightly clamp the probe 3, facilitating quick installation and fixing of the probe 3, improving work efficiency, and also facilitating subsequent use of different models of probe 3, thus increasing flexibility during use.

[0032] One end of the fixing rod 601 is fixedly connected to the inner wall of the mounting groove 7.

[0033] One end of the spring 602 is fixedly connected to the surface of the sliding seat 603. The elastic reset of the spring 602 can push the sliding seat 603 to move. When the clamping plate 604 contacts the surface of the probe 3, the force of the spring 602 makes the clamping plate 604 tightly clamp the probe 3, avoiding displacement during the test and ensuring the accuracy of the test.

[0034] The end of spring 602 away from sliding seat 603 contacts the inner wall of mounting groove 7.

[0035] One end of the clamping plate 604 contacts the surface of the probe 3, and the protruding plate 605 is located at the upper end of the probe mounting frame 1. The protruding plate 605 located at the upper end of the probe mounting frame 1 facilitates the opening of the clamping plate 604 to both sides by a robotic arm.

[0036] The probe 3 passes through the probe mounting bracket 1 through the mounting hole 2.

[0037] The lower surface of the positioning ring 4 contacts the upper surface of the limiting ring 5, and the limiting ring 5 limits the positioning ring 4, which facilitates subsequent installation and fixation.

[0038] The implementation principle of the clamping device and method for scanning probes in this application embodiment is as follows: During installation, the clamping plate 604 is first moved to both sides by the protruding plate 605, so that the sliding seat 603 slides along the fixed rod 601. At the same time, the spring 602 is compressed. Then, the probe 3 is placed into the mounting hole 2. The position of the probe 3 is limited by the positioning ring 4. Then, the protruding plate 605 is gradually released, so that the elastic reset of the spring 602 pushes the sliding seat 603 to slide along the fixed rod 601. This causes the two clamping plates 604 to move closer to each other and contact the surface of the probe 3. The clamping plates 604 tightly clamp the probe 3, which facilitates the quick installation and fixation of the probe 3, improves work efficiency, and facilitates subsequent use of different models of probes 3, thus improving the flexibility of use.

[0039] The above embodiments are merely preferred embodiments of the present invention and should not be construed as limiting the scope of protection of the present invention. Any non-substantial changes and substitutions made by those skilled in the art based on the present invention shall fall within the scope of protection claimed by the present invention.

Claims

1. A clamping device and method for a scanning probe, characterized in that, The device includes a probe mounting bracket (1), a mounting hole (2) is provided in the middle of the probe mounting bracket (1), a probe (3) is provided inside the mounting hole (2), a positioning ring (4) is fixedly connected to the surface of the probe (3), a limit ring (5) is fixedly connected to the inner wall of the mounting hole (2), a mounting groove (7) is provided at the top of the probe mounting bracket (1), and a clamping assembly (6) is provided inside the mounting groove (7). The clamping assembly (6) includes a fixing rod (601), a spring (602) is sleeved on the surface of the fixing rod (601), a sliding seat (603) is slidably connected to the surface of the fixing rod (601), a clamping plate (604) is fixedly connected to one end of the sliding seat (603), and a protruding plate (605) is fixedly connected to the surface of the clamping plate (604).

2. The clamping device and method for scanning probes as described in claim 1, characterized in that: One end of the fixing rod (601) is fixedly connected to the inner wall of the mounting groove (7).

3. The clamping device and method for scanning probes as described in claim 1, characterized in that: One end of the spring (602) is fixedly connected to the surface of the sliding seat (603).

4. The clamping device and method for a scanning probe as described in claim 3, characterized in that: The end of the spring (602) away from the sliding seat (603) contacts the inner wall of the mounting groove (7).

5. The clamping device and method for a scanning probe as described in claim 1, characterized in that: One end of the clamping plate (604) is in contact with the surface of the probe (3), and the protruding plate (605) is located at the upper end of the probe mounting bracket (1).

6. The clamping device and method for a scanning probe as described in claim 1, characterized in that: The probe (3) passes through the probe mounting bracket (1) through the mounting hole (2).

7. The clamping device and method for scanning probes as described in claim 1, characterized in that: The lower surface of the positioning ring (4) is in contact with the upper surface of the limiting ring (5).

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