A testing device for resistors

Abstract

The application provides a kind of resistor testing device, it relates to resistor, including rack, the inside of the rack is equipped with sealed test chamber, one side of the sealed test chamber is equipped with transmission unit;The bottom of the rack is equipped with resistance test unit, the resistance test unit is assembled with the sealed test chamber, for the resistance detection of the resistor to be tested in the test cavity of sealed test chamber.The application forms a sealed test chamber by closing the positioning test cylinder and the movable test cylinder, completely wraps the resistor to be tested in the closed test cavity, effectively isolates the external airflow, dust, moisture and electromagnetic interference, avoids the influence of external environment on the resistance test process, significantly improves the stability and precision of resistance value detection.

Description

Technical Field

[0001] This invention relates to the field of resistors, and more specifically, to a resistor testing apparatus. Background Technology

[0002] As one of the most widely used basic components in electronic circuits, the resistance accuracy and continuity reliability of resistors directly affect the quality of the entire product. In the mass production and factory testing of resistors, rapid and stable resistance testing and good product screening are typically required.

[0003] Existing resistor testing devices are mostly open structures, with the resistor under test directly exposed to the external environment for power-on testing. This is easily affected by airflow, dust, moisture and electromagnetic interference in the workshop, which can lead to test data drift, poor contact or misjudgment. Therefore, a resistor testing device is proposed.

[0004] Therefore, we have made improvements to this and proposed a resistor testing device. Summary of the Invention

[0005] The purpose of this invention is to provide a resistor testing device. By setting up a sealed test chamber, it solves the problem that most existing resistor testing devices have an open structure, in which the resistor under test is directly exposed to the external environment for power-on testing. This makes it susceptible to airflow, dust, moisture and electromagnetic interference in the workshop, which can lead to test data drift, poor contact or misjudgment.

[0006] To achieve the above-mentioned objectives, the present invention provides the following technical solution:

[0007] A resistor testing device includes a frame, a sealed test chamber is installed inside the frame, and a transmission unit is provided on one side of the sealed test chamber;

[0008] The bottom of the frame is provided with a resistance testing unit, which is assembled with the sealed test chamber and is used to detect the resistance of the resistor to be tested in the test chamber inside the sealed test chamber.

[0009] The sealed test chamber includes a positioning test cylinder and a movable test cylinder. The positioning test cylinder is provided with a guide cylinder above it, and the positioning test cylinder and the movable test cylinder can be opened or closed by the action of the transmission unit.

[0010] As a preferred technical solution of this application, the transmission unit includes a mounting frame fixed to the surface of the frame and a support frame fixed to the middle of the mounting frame. A support shaft is fixed on the surface of the support frame at the position corresponding to the sealed test chamber. A gear is movably connected to the surface of the support shaft. A first toothed plate and a second toothed plate are respectively meshed on both sides of the gear.

[0011] The first toothed plate is fixedly connected to the movable test cylinder via a connecting column, and the second toothed plate is fixedly connected to the guide cylinder;

[0012] The bottom of the first toothed plate and the second toothed plate are slidably fitted with guide stabilizing plates, and the bottom of the multiple guide stabilizing plates are connected to a fixing frame installed on the surface of the frame.

[0013] As a preferred technical solution of this application, the surface of the guide cylinder is provided with an avoidance groove at the position corresponding to the connecting column, and the bottom outlet of the guide cylinder is provided corresponding to the test cavity inside the positioning test cylinder.

[0014] As a preferred technical solution of this application, resistance test terminals are installed on the outer ends of both the positioning test cylinder and the movable test cylinder. T-shaped test blocks are provided inside the positioning test cylinder and the movable test cylinder at positions corresponding to the resistance test terminals. The T-shaped test blocks are slidably assembled in the corresponding positioning test cylinder and the movable test cylinder through sliding grooves. A spring is also sleeved on the surface of the T-shaped test block, and the two ends of the spring are respectively connected to the corresponding T-shaped test block and the side wall of the sliding groove.

[0015] The T-shaped test block is electrically connected to the resistance test terminal via a wire.

[0016] As a preferred technical solution of this application, the resistance test terminal located on the movable test cylinder is connected to the resistance test unit through an upper lead wire, and the resistance test terminal located on the positioning test cylinder is connected to the resistance test unit through a lower lead wire.

[0017] The surface portion of the upper lead wire is fitted with a rigid guide tube fixed to the top of the movable test tube.

[0018] As a preferred technical solution of this application, an electric telescopic rod is also fixed at the bottom of the mounting frame, and a synchronous drive plate is connected to the top of the electric telescopic rod. The synchronous drive plate is fixedly connected to a plurality of second toothed plates.

[0019] As a preferred technical solution of this application, the resistance testing unit includes a housing fixed to the bottom of the frame and a main control module, a constant current source unit and a voltage acquisition unit disposed inside the housing.

[0020] As a preferred technical solution of this application, the constant current source unit is electrically connected to the main control module and receives control signals sent by the main control module to output a constant test current to the resistor under test;

[0021] The constant current source unit is also electrically connected to the upper lead wire and the lower lead wire to form a closed current path;

[0022] The voltage acquisition unit is connected in parallel between the two sets of resistance test terminals to acquire the voltage signal across the resistor under test. The voltage acquisition unit is also electrically connected to the main control module to transmit the acquired voltage signal back to the main control module.

[0023] The main control module is used to issue test control commands, receive voltage signals returned by the voltage acquisition unit, calculate the actual resistance value of the resistor under test according to Ohm's law, and compare it with the preset resistance value range to complete the good product determination of the resistor under test.

[0024] As a preferred technical solution of this application, the voltage acquisition unit includes a differential amplifier circuit and an analog-to-digital converter (ADC) circuit, which is used to convert the acquired analog voltage signal into a digital signal and then transmit it back to the main control module.

[0025] As a preferred technical solution of this application, the constant current source unit further includes an LED indicator light, which is disposed on the surface of the rigid guide cylinder and electrically connected to the main control module through a wire, for displaying the actual good product judgment result of the resistor under test.

[0026] Compared with the prior art, the beneficial effects of the present invention are as follows:

[0027] In the scheme of this application:

[0028] 1. By closing the positioning test cylinder and the movable test cylinder to form a sealed test chamber, the resistor under test is completely wrapped in the sealed test chamber, which effectively isolates external airflow, dust, moisture and electromagnetic interference, avoids the influence of the external environment on the resistance test process, and significantly improves the stability and accuracy of resistance detection.

[0029] Meanwhile, the sealed structure can prevent the heat, smoke, and splashes generated by the resistor during the power-on test from spreading outward, playing a protective role against fire, electric shock, and pollution, ensuring the safety and reliability of the test process, and extending the service life of the equipment;

[0030] 2. The linkage action between the movable test cylinder and the guide cylinder is realized through the transmission unit: When the movable test cylinder moves away from the positioning test cylinder, the guide cylinder automatically fits into the upper opening of the positioning test cylinder to form a stable guide channel, so that the resistor falls into the test chamber accurately and smoothly along the guide trajectory, avoiding deviation and jamming, and improving the success rate of feeding and the consistency of testing.

[0031] After the guide tube is raised, the movable test tube and the positioning test tube close quickly, automatically completing the sealing and test preparation, realizing the integrated linkage of feeding guidance, sealing and testing, with simple structure, synchronous action and high efficiency.

[0032] 3. By switching the position of the guide cylinder, it is placed over the LED indicator in the test state. On the one hand, the cylinder wall structure physically blocks the light source of the indicator lights of adjacent workstations, avoiding mutual scattering and crosstalk of light, and ensuring that the indication results of each workstation are clear and independent;

[0033] On the other hand, the guide tube helps to focus and diffuse the LED light upwards, making the indicator light signal brighter and more recognizable. Operators can quickly judge the detection status from a distance, greatly improving the intuitiveness and efficiency of batch detection.

[0034] 4. By using a single frame and a single resistance testing unit, multiple sealed test chambers can be driven simultaneously to complete the parallel testing of resistors at multiple stations. There is no need to configure a separate test module for each station. While simplifying the overall structure and reducing the cost and size of the device, it can realize the synchronous continuity testing and resistance measurement of multiple resistors, which can significantly shorten the batch testing time and improve the testing efficiency and capacity of resistors on the production line. It is especially suitable for the rapid screening of large batches of resistors in industrial production. Attached Figure Description

[0035] Figure 1 This is a schematic diagram of the structure of a resistor testing device provided in this application;

[0036] Figure 2 A schematic diagram of a second-mode structure of a resistor testing device provided in this application;

[0037] Figure 3 A schematic diagram of a third-mode structure of a resistor testing device provided in this application;

[0038] Figure 4 A schematic diagram of a fourth embodiment of a resistor testing device provided in this application;

[0039] Figure 5 A partial structural schematic diagram of a resistor testing device provided in this application;

[0040] Figure 6 This application provides a resistor testing device. Figure 3 Enlarged structural diagram at point B;

[0041] Figure 7 A cross-sectional view of a resistor testing device provided in this application;

[0042] Figure 8 This application provides a resistor testing device. Figure 7 Enlarged structural diagram at point A;

[0043] Figure 9This is a schematic diagram of the structure of a resistance testing unit of a resistor testing device provided in this application.

[0044] The image shows:

[0045] 1. Frame; 2. Sealed test chamber; 3. Transmission unit; 4. Resistance test unit; 5. Resistance test terminal;

[0046] 21. Positioning test cylinder; 22. Movable test cylinder; 23. Guide cylinder; 24. Resistor to be tested;

[0047] 230. Clearance groove;

[0048] 31. Mounting bracket; 32. Support bracket; 33. Support shaft; 34. Gear; 35. First gear plate; 36. Second gear plate; 37. Connecting column; 38. Guide and stabilizing frame; 39. Fixing frame;

[0049] 310. Electric telescopic pole; 311. Synchronous drive plate;

[0050] 41. Housing; 42. Main control module; 43. Constant current source unit; 44. Voltage acquisition unit; 45. LED indicator;

[0051] 51. T-shaped test block; 52. Slide groove; 53. Spring; 54. Upper lead wire; 55. Rigid guide cylinder; 56. Lower lead wire. Detailed Implementation

[0052] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments.

[0053] Therefore, the following detailed description of embodiments of the present invention is not intended to limit the scope of the claimed invention, but merely illustrates some embodiments of the invention. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without inventive effort are within the scope of protection of the present invention.

[0054] It should be noted that, unless otherwise specified, the embodiments and features and technical solutions in the present invention can be combined with each other.

[0055] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0056] In the description of this invention, it should be noted that the terms "upper," "lower," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, or the orientation or positional relationship commonly used when the product of this invention is in use, or the orientation or positional relationship commonly understood by those skilled in the art. These terms are only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this invention. In addition, the terms "first," "second," etc., are only used to distinguish descriptions and should not be construed as indicating or implying relative importance.

[0057] Please see Figures 1 to 9 The present invention provides a technical solution: a resistor testing device, including a frame 1, a sealed test chamber 2 installed inside the frame 1, and a transmission unit 3 provided on one side of the sealed test chamber 2;

[0058] The bottom of the frame 1 is provided with a resistance testing unit 4, which is assembled with the sealed test chamber 2 and is used to perform resistance detection on the resistor 24 to be tested in the test chamber inside the sealed test chamber 2.

[0059] The sealed test chamber 2 includes a positioning test cylinder 21 and a movable test cylinder 22. The positioning test cylinder 21 is fixed to the surface of the frame 1, and multiple positioning test cylinders 21 are fixed to the surface of a single frame 1. The multiple positioning test cylinders 21 are evenly distributed along the length direction of the frame 1. In this way, multiple resistors can be tested synchronously through a single frame and the resistance testing unit 4 on the single frame. A guide cylinder 23 is provided above the positioning test cylinder 21. Under the action of the transmission unit 3, the positioning test cylinder 21 and the movable test cylinder 22 can be opened or closed.

[0060] Because the resistor testing device of the present invention has the above structure, the whole machine adopts an integrated frame layout structure, and multiple sealed test chambers are neatly arranged. All test stations can be controlled in a unified manner by relying on the same set of resistance testing units. There is no need to equip each station with an independent test host. The overall layout is compact and orderly, which can reduce the overall space occupied by the equipment and the manufacturing cost. At the same time, multiple groups of resistors under test can be simultaneously powered on for testing, simultaneously acquired for data and simultaneously judged for results by relying on a unified test circuit, which can effectively improve the overall coordination and testing efficiency of batch testing.

[0061] The transmission unit 3 includes a mounting frame 31 fixed to the surface of the frame 1 and a support frame 32 fixed to the middle of the mounting frame 31. A support shaft 33 is fixed on the surface of the support frame 32 at the position corresponding to the sealed test chamber 2. A gear 34 is movably connected to the surface of the support shaft 33. The gear 34 can rotate at the end of the support shaft 33 without falling off. A first toothed plate 35 and a second toothed plate 36 are respectively meshed on both sides of the gear 34. Through the meshing action of the gear 34, the sliding directions of the first toothed plate 35 and the second toothed plate 36 can be reversed.

[0062] The first toothed plate 35 is fixedly connected to the movable test cylinder 22 via a connecting post 37, so that when the first toothed plate 35 slides, it can drive the movable test cylinder 22 to move synchronously. The second toothed plate 36 is fixedly connected to the guide cylinder 23, so that when the second toothed plate 36 slides, it can drive the guide cylinder 23 to move synchronously.

[0063] like Figure 5 and Figure 6 As shown, the bottom of the first toothed plate 35 and the second toothed plate 36 are slidably fitted with guide stabilizing plates 38. The bottom of the multiple guide stabilizing plates 38 is connected to a fixing frame 39 installed on the surface of the frame 1. Through the function of the guide stabilizing plates 38, the first toothed plate 35 and the second toothed plate 36 can be supported, thereby improving their stability under sliding assembly. Moreover, the first toothed plate 35 and the second toothed plate 36 will not detach from the corresponding guide stabilizing plate 38 when sliding in any state.

[0064] Since the resistor testing device of the present invention has the above structure, it relies on the meshing transmission of gear 34 to realize the reverse linkage motion of two sets of tooth plates, thereby realizing the reverse synchronous action of the movable test cylinder 22 and the guide cylinder 23, and the motion logic is simple and reliable.

[0065] The guide plate 38 and the fixed frame 39 are combined to form a sliding limit support structure, which limits and guides the toothed plate throughout its entire movement. This effectively avoids problems such as offset, jamming, and loosening during the sliding process of the toothed plate, ensuring precise and smooth transmission. It allows the sealing opening and closing and material guiding actions to be accurately matched with the test process, ensuring the stability of the equipment during long-term continuous operation.

[0066] The guide cylinder 23 has a clearance groove 230 at the position corresponding to the connecting post 37 on its surface. The bottom outlet of the guide cylinder 23 is corresponding to the test cavity inside the positioning test cylinder 21. Through the design of the clearance groove 230, when the guide cylinder 23 slides down to contact the surface of the positioning test cylinder 21, it can avoid the connecting post 37 connected to the upward sliding test cylinder 22. This can avoid motion interference and will not affect the guiding function of the guide cylinder 23 for the resistor 24 to be tested.

[0067] Because the resistor testing device of the present invention has the above structure, the avoidance groove 230 can avoid the connecting column 37 structure during the process of the guide cylinder 23 descending and fitting the positioning test cylinder 21, completely eliminating the mechanical interference problem in the linkage motion process, and ensuring that the guide cylinder and the movable test cylinder 22 move in opposite directions without hindering each other; at the same time, the discharge port of the guide cylinder 23 is precisely aligned with the test chamber, which can accurately limit and guide the falling resistor 24 to be tested, so that the resistor falls smoothly into the designated test position, eliminating the situation of material tilting, jamming, misplacement, etc., and laying a good foundation for subsequent sealed clamping and precise electrical contact.

[0068] The outer ends of both the positioning test cylinder 21 and the movable test cylinder 22 are equipped with resistance test terminals 5. Inside the positioning test cylinder 21 and the movable test cylinder 22, at positions corresponding to the resistance test terminals 5, there are T-shaped test blocks 51. The end faces of the T-shaped test blocks 51 are provided with conductive contacts (such as copper-plated gold layers) to ensure low contact resistance. The T-shaped test blocks 51 are slidably assembled in the corresponding positioning test cylinder 21 and the movable test cylinder 22 through sliding grooves 52. The surface of the T-shaped test blocks 51 is also fitted with springs 53, and the two ends of the springs 53 are respectively connected to the side walls of the corresponding T-shaped test blocks 51 and the sliding grooves 52.

[0069] With the action of spring 53, the T-shaped test block 51 can slide away from the resistance test end 5 in the natural state. In this way, after the resistor to be tested is placed into the test chamber, the contact action between the pins at both ends of the resistor to be tested can be ensured, thus achieving stability in the test state.

[0070] The T-shaped test block 51 is electrically connected to the resistance test terminal 5 via a wire, and the length of the wire reserved at the connection point can meet the sliding stroke requirements of the T-shaped test block 51.

[0071] Because the resistor testing device of the present invention has the above structure, it adopts an elastic sliding T-shaped test block 51 and a spring 53 to form an elastic contact structure, which can adapt to resistors under test with different pin sizes and different placement slight deviations. The elastic clamping force of the spring 53 makes the test block and the resistor pin fit tightly together, automatically compensating for assembly gaps. It effectively solves the problems of loose connection, poor contact, and loose contact that are easy to occur in rigid connection, and maintains a stable electrical conduction state throughout the process. From the hardware structure level, it ensures the authenticity and accuracy of the resistance value acquisition data and greatly reduces the probability of test misjudgment.

[0072] The resistance test terminal 5 located on the movable test cylinder 22 is connected to the resistance test unit 4 through the upper lead wire 54, and the resistance test terminal 5 located on the positioning test cylinder 21 is connected to the resistance test unit 4 through the lower lead wire 56.

[0073] The surface portion of the upper lead wire 54 is fitted with a rigid guide tube 55 fixed to the top of the movable test tube 22. In this embodiment, the upper lead wire 54 located outside the rigid guide tube 55 will eventually pass through the housing 41 and be electrically connected to the resistance test unit 4. The wiring structure of the upper lead wire 54 introduced into the housing 41 is omitted in the figure. In actual applications, the wiring can be adapted according to the specific application scenario. At the same time, the wiring also needs to meet the reserved length required for the up and down movement of the movable test tube 22.

[0074] Because the resistor testing device of the present invention has the above structure, the upper and lower sets of lead wires respectively establish an electrical connection channel between the test end and the bottom resistance testing unit, forming a complete test electrical circuit; the rigid guide cylinder can play a role in regulating, protecting and limiting the lead wires at the movable end, avoiding problems such as bending and wear, pulling and breaking, and tangled lines caused by the frequent movement of the movable test cylinder, while reserving sufficient wiring slack to adapt to the reciprocating motion stroke of the cylinder, taking into account both the stability of electrical connection and the flexibility of mechanical movement of the equipment, and adapting to the wiring needs of multiple working conditions.

[0075] The bottom of the mounting bracket 31 is also fixed with an electric telescopic rod 310. The top of the electric telescopic rod 310 is connected to a synchronous drive plate 311. The synchronous drive plate 311 is fixedly connected to multiple second toothed plates 36. Activating the electric telescopic rod 310 can drive the drive plate 311 at its output end to move. In this way, the drive plate 311 can synchronously drive multiple second toothed plates 36 to slide. The second toothed plates 36 can drive the first toothed plate 35 to slide through the action of the gear 34. At the same time, the second toothed plates 36 can also drive the guide cylinder 23 connected to them to slide.

[0076] Because the resistor testing device of the present invention has the above structure, the electric telescopic rod 310 is used in conjunction with the synchronous drive board 311 to realize the multi-station synchronous drive structure. A single power source can synchronously drive all the second toothed plates 36 to move in a unified manner, thereby synchronously driving the guide cylinders 23 and the movable test cylinders 22 of all stations to complete the linkage switching action. There is no need to set up a separate drive element for each station, which simplifies the overall power control system, realizes the high degree of uniformity and timing of multi-station actions, and further improves the automation level of the equipment and the regularity of batch testing operations.

[0077] The resistance testing unit 4 includes a housing 41 fixed to the bottom of the frame 1 and a main control module 42, a constant current source unit 43 and a voltage acquisition unit 44 disposed inside the housing 41.

[0078] The main control module is a microcontroller or FPGA, used to realize unified control of the test process, data operation and judgment result output.

[0079] The constant current source unit 43 can adjust the amplitude of the output constant test current according to the instructions of the main control module, adapting to resistors under test with different resistance ranges.

[0080] Because the resistor testing device of the present invention has the above structure, the enclosed housing 41 can provide a dustproof, collision-proof, and external electromagnetic interference-proof installation environment for various internal electrical testing modules, extending the service life of electrical components; the main control module coordinates all test logic, can flexibly adjust the output current of the constant current source, and can adapt to the test conditions of resistors of different specifications such as high resistance, medium resistance, and low resistance, with strong versatility, high integration of the entire test module, and convenient inspection and maintenance.

[0081] The constant current source unit 43 is electrically connected to the main control module 42 and receives the control signal sent by the main control module 42, which is used to output a constant test current to the resistor under test 24.

[0082] The constant current source unit 43 is also electrically connected to the upper lead wire 54 and the lower lead wire 56 to form a closed current path;

[0083] The voltage acquisition unit 44 is connected in parallel between the two sets of resistance test terminals 5 to acquire the voltage signal across the resistor 24 under test. The voltage acquisition unit 44 is electrically connected to the main control module 42 and transmits the acquired voltage signal back to the main control module 42.

[0084] The main control module 42 is used to issue test control commands, receive voltage signals returned by the voltage acquisition unit 44, calculate the actual resistance value of the resistor under test 24 according to Ohm's law, and compare it with the preset resistance value range to complete the good product determination of the resistor under test 24.

[0085] The voltage acquisition unit 44 includes a differential amplifier circuit and an analog-to-digital converter (ADC) circuit, which is used to convert the acquired analog voltage signal into a digital signal and then transmit it back to the main control module 42.

[0086] Because the resistor testing device of the present invention has the above structure, the overall resistance detection is completed by following the constant current voltage measurement principle. The constant current source outputs a stable test current that flows through the resistor under test to form a current loop. The voltage acquisition unit 44 accurately picks up the voltage difference across the resistor and completes signal amplification and digital-to-analog conversion. The standardized digital signal is transmitted to the main control module to complete the resistance value calculation and good product comparison. The entire detection circuit has mature operating logic and high acquisition accuracy, which can effectively avoid manual measurement errors and realize automated, standardized, and high-precision resistance value detection and good product screening.

[0087] The constant current source unit 43 also includes an LED indicator 45, which is located on the surface of the rigid guide cylinder 55 and electrically connected to the main control module 42 via a wire, for displaying the actual good product judgment result of the resistor under test 24.

[0088] Because the resistor testing device of the present invention has the above structure, the LED indicator 45 is directly integrated and placed in a conspicuous position outside the workstation. The main control module accurately controls the switching of light colors according to the judgment result, intuitively distinguishing between good and bad products. Combined with the movable guide tube 23 above to form a light-shielding and light-focusing structure, it can not only block the mutual interference of lights in adjacent workstations, but also enhance the light visibility effect, making it convenient for operators to quickly sort and screen from a distance, effectively improving the efficiency of batch testing and sorting operations on site.

[0089] In practical applications: Figure 4 In the indicated state, the operator first places multiple sets of resistors 24 to be tested into the guide cylinder 23 above the frame 1. The resistors 24 fall smoothly into the testing chamber inside the positioning test cylinder 21 along the guide cylinder 23, completing precise feeding. After starting the equipment, the electric telescopic rod 310 drives multiple sets of second toothed plates 36 to slide upward synchronously through the synchronous drive plate 311. The gear 34 meshes and drives the first toothed plate 35 to move in the opposite direction until the movable test cylinder 22 contacts the inside of the positioning test cylinder 21, at which point the electric telescopic rod 310 stops extending. The movable test cylinder 22 moves towards the positioning test cylinder 21 and closes to form a sealed test chamber 2, completely sealing the resistors 24 to isolate them from external environmental interference.

[0090] Once the test chamber is closed, the guide cylinder 23 moves upward to the outside of the LED indicator 45, forming a shape similar to... Figure 1 , Figure 2 and Figure 3 As shown in the diagram, during the closing process, the T-shaped test block 51, which is internally fitted with a spring 53, slides elastically inside the groove 52 and automatically presses against the pins at both ends of the resistor under test 24, ensuring stable electrical contact between the resistance test terminal 5 and the resistor under test 24.

[0091] After the sealed clamping is completed, the resistance testing unit 4 located inside the housing 41 at the bottom of the frame 1 is officially started. The main control module 42 issues control commands to regulate the constant current source unit 43 to output a constant test current. The current flows through the upper lead wire 54, the lower lead wire 56 and the resistance testing terminal 5 in sequence through the resistor under test 24 to form a complete closed current path. The voltage acquisition unit 44 synchronously and in parallel acquires the voltage signal across the resistor under test 24 and performs analog-to-digital conversion before sending it back to the main control module 42. The main control module 42 calculates the actual resistance value according to Ohm's law and compares it with the preset qualified range to complete the good product judgment. After the judgment is completed, the main control module 42 controls the LED indicator 45 installed on the outside of the rigid guide tube 55 to light up different colored light sources (green light for passing the resistance test, red light for failing). The raised guide tube 23 is used to focus the light and block the light source of the adjacent workstation, making it convenient for the staff to intuitively distinguish the test results. All workstations can complete the synchronous batch testing of multiple resistors under test 24 by relying on the same set of resistance testing units 4. After the test is completed.

[0092] Those that pass the test are removed and placed in their corresponding workstations, while those that fail are placed in another corresponding workstation. When the next test operation is required, the electric telescopic rod 310 is activated again, causing the guide cylinder 23 to move downwards and finally contact the surface of the positioning test cylinder 21, causing the movable test cylinder 22 to move upwards to form a... Figure 4 The states shown indicate that the continuous batch testing operation is completed in a loop.

[0093] The above embodiments are only used to illustrate the present invention and are not intended to limit the technical solutions described herein. Although the present invention has been described in detail with reference to the above embodiments, the present invention is not limited to the specific embodiments described above. Therefore, any modifications or equivalent substitutions to the present invention, as well as all technical solutions and improvements that do not depart from the spirit and scope of the invention, are covered within the scope of the claims of the present invention.

Claims

1. A testing apparatus for resistors, characterized by, Includes a frame (1), inside which a sealed test chamber (2) is installed, and a transmission unit (3) is provided on one side of the sealed test chamber (2). The bottom of the frame (1) is provided with a resistance testing unit (4), which is assembled with the sealed test chamber (2) and is used to test the resistance of the resistor (24) in the test chamber inside the sealed test chamber (2). The sealed test chamber (2) includes a positioning test cylinder (21) and a movable test cylinder (22). A guide cylinder (23) is provided above the positioning test cylinder (21). The positioning test cylinder (21) and the movable test cylinder (22) can be opened or closed by the transmission unit (3).

2. The apparatus of claim 1, wherein The transmission unit (3) includes a mounting frame (31) fixed to the surface of the frame (1) and a support frame (32) fixed to the middle of the mounting frame (31). A support shaft (33) is fixed on the surface of the support frame (32) at the position corresponding to the sealed test chamber (2). A gear (34) is movably connected to the surface of the support shaft (33). A first toothed plate (35) and a second toothed plate (36) are respectively meshed on both sides of the gear (34). The first toothed plate (35) is fixedly connected to the movable test cylinder (22) via a connecting post (37), and the second toothed plate (36) is fixedly connected to the guide cylinder (23); Among them, the bottom of the first toothed plate (35) and the second toothed plate (36) are slidably fitted with guide stabilizing plates (38), and the bottom of the multiple guide stabilizing plates (38) are connected to a fixing frame (39) installed on the surface of the frame (1).

3. The resistor testing apparatus according to claim 2, characterized in that, The guide cylinder (23) has a clearance groove (230) at the position corresponding to the connecting column (37) on its surface, and the bottom outlet of the guide cylinder (23) is set to correspond to the test cavity inside the positioning test cylinder (21).

4. The resistor testing apparatus according to claim 1, characterized in that, The outer ends of the positioning test cylinder (21) and the movable test cylinder (22) are each equipped with a resistance test terminal (5). The interior of the positioning test cylinder (21) and the movable test cylinder (22) is provided with a T-shaped test block (51) at the position corresponding to the resistance test terminal (5). The T-shaped test block (51) is slidably assembled in the corresponding positioning test cylinder (21) and the movable test cylinder (22) through a sliding groove (52). The surface of the T-shaped test block (51) is also fitted with a spring (53). The two ends of the spring (53) are respectively connected to the side wall of the corresponding T-shaped test block (51) and the sliding groove (52). The T-type test block (51) is electrically connected to the resistance test terminal (5) via a wire.

5. A resistor testing apparatus according to claim 4, characterized in that, The resistance test terminal (5) located on the active test cylinder (22) is connected to the resistance test unit (4) through the upper lead wire (54), and the resistance test terminal (5) located on the positioning test cylinder (21) is connected to the resistance test unit (4) through the lower lead wire (56). The surface portion of the upper lead wire (54) is fitted with a rigid guide tube (55) fixed to the top of the movable test tube (22).

6. The resistor testing apparatus according to claim 2, characterized in that, The bottom of the mounting bracket (31) is also fixed with an electric telescopic rod (310), and the top of the electric telescopic rod (310) is connected with a synchronous drive plate (311). The synchronous drive plate (311) is fixedly connected with a plurality of second toothed plates (36).

7. The resistor testing apparatus according to claim 5, characterized in that, The resistance testing unit (4) includes a housing (41) fixed to the bottom of the frame (1) and a main control module (42), a constant current source unit (43) and a voltage acquisition unit (44) located inside the housing (41).

8. A resistor testing apparatus according to claim 7, characterized in that, The constant current source unit (43) is electrically connected to the main control module (42) and receives the control signal sent by the main control module (42) to output a constant test current to the resistor under test (24). The constant current source unit (43) is also electrically connected to the upper lead wire (54) and the lower lead wire (56) to form a closed current path; The voltage acquisition unit (44) is connected in parallel between the two sets of resistance test terminals (5) to acquire the voltage signal across the resistor (24) under test. The voltage acquisition unit (44) is electrically connected to the main control module (42) and transmits the acquired voltage signal back to the main control module (42). The main control module (42) is used to issue test control commands, receive voltage signals returned by the voltage acquisition unit (44), calculate the actual resistance value of the resistor under test (24) according to Ohm's law, and compare it with the preset resistance value range to complete the good product determination of the resistor under test (24).

9. A resistor testing apparatus according to claim 8, characterized in that, The voltage acquisition unit (44) includes a differential amplifier circuit and an analog-to-digital converter (ADC) circuit, which are used to convert the acquired analog voltage signal into a digital signal and then transmit it back to the main control module (42).

10. A resistor testing apparatus according to claim 8, characterized in that, The constant current source unit (43) also includes an LED indicator (45), which is located on the surface of the rigid guide cylinder (55) and electrically connected to the main control module (42) via a wire, for displaying the actual good product judgment result of the resistor under test (24).

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