Method and system for electrical testing

Abstract

Embodiments provided by the present disclosure relate to methods and systems for electrical testing. A method for electrical testing comprises receiving (101) a set of coordinates (200) of an object (100), receiving (102) information indicative of a number of test contacts (211) of an apparatus (20) for electrical testing, determining (103) at least one subset (300) of the received set of coordinates (200) based on the number of test contacts (211), selecting (104) a first subset (300) from the at least one subset, moving (105) the object (100) to a position in which test contacts have access to a first set of points of the object (100) corresponding to the coordinates in the first subset, applying (106) an input signal to the first set of points, and generating (107) a response to the output signal related to the input signal.

Description

Technical Field

[0001] The embodiments of the present invention generally relate to methods and systems for electrical testing. Background Technology

[0002] With increasingly severe global energy and environmental challenges, new energy vehicles are an inevitable trend in the automotive industry. The battery tray is a crucial component of the powertrain system of new energy vehicles. It serves as a carrier for battery modules and other vehicle components. The electrical performance of the battery tray has a significant impact on the safety of the new energy vehicle, the battery module, and other components carried on it.

[0003] A coating is formed on the battery tray to ensure its electrical performance. For example, special materials can be sprayed onto designated surfaces of the battery tray to give it insulation and fire resistance. However, due to existing production conditions, oil, dust, welding spatter, and other impurities may be present on the surface of the battery tray. Furthermore, burrs and uneven coating thickness may exist at spot welds. Therefore, it is necessary to test the insulation performance of the battery tray. Summary of the Invention

[0004] Embodiments of the present invention provide a method for electrical testing and a system for electrical testing.

[0005] In a first aspect, a method for electrical testing is provided. The method includes: receiving a set of coordinates of an object; receiving information indicating the number of test contacts of a device for electrical testing; determining at least one subset of the received set of coordinates based on the number of test contacts; selecting a first subset from the at least one subset; moving the object to a position where the test contacts can approach a first set of points of the object corresponding to coordinates in the first subset; applying an input signal to the first set of points; and generating a response to an output signal associated with the input signal.

[0006] By applying input signals from corresponding test contacts to each point on the object under test and generating a corresponding response, the electrical properties of the entire surface of the object can be accurately determined. Furthermore, further processing, such as repairing defective points, can be performed based on the generated responses. This improves the efficiency of object inspection and repair. It also provides benefits for object manufacturing.

[0007] In one or more embodiments, applying an input signal to the first set of points may include: disabling the application of the input signal to points corresponding to the same coordinates in response to determining that a subset of the at least one subset includes coordinates that are the same as those included in the first subset.

[0008] In one or more embodiments, the method may further include determining a second subset based on the similarity between the first subset and another subset of the at least one subset.

[0009] In one or more embodiments, the coordinates are coordinates in a two-dimensional coordinate system. In one example, the coordinates can be represented as ([distance relative to the origin], [angle]). In another example, the coordinates can be represented as ([x-axis coordinate], [y-axis coordinate]). When the coordinates are in the form of ([x-axis coordinate], [y-axis coordinate]), similarity can be associated with at least one of the x-axis coordinates or the y-axis coordinates of the first subset.

[0010] In one or more embodiments, the method further includes determining a second subset based on a first subset and a predefined offset.

[0011] In one or more embodiments, the number of coordinates in each subset of the at least one subset corresponds to the number of test contacts.

[0012] In one or more embodiments, applying the input signal to the first set of points further includes: enabling a portion of the test contacts while simultaneously disabling the remaining portion of the test contacts.

[0013] In one or more embodiments, applying the input signal to the first set of points further includes selectively energizing the test contacts.

[0014] In one or more embodiments, the method further includes, in response to determining that each point in the first set of points has been generated, moving the object to a position where the test contact can approach a second set of points of the object corresponding to coordinates in the second subset.

[0015] In one or more embodiments, the method further includes displaying an image representing a set of coordinates of objects via a user interface. The displayed image may further include: indicating, in a first color, the first coordinates of points in the first subset corresponding to points for which the response has been generated, as the object approaches the first set of points. The displayed image may further include indicating, in a second color, the second coordinates of points in the first subset corresponding to points to which an input signal is to be applied. If a second subset has been determined, the displayed image may further include indicating the coordinates of the second subset in a third color.

[0016] In one or more embodiments, the method further includes determining whether the point is faulty based on the generated response. In response to determining that the point is faulty, another process is initiated to repair the faulty point and / or generate an alarm associated with the faulty point.

[0017] In a second aspect, an apparatus for electrical testing is provided. The apparatus for electrical testing may include a platform and a plurality of test devices. Each of the plurality of test devices may include a base, a plurality of test contacts extending from a first side of the base, and a column extending from a second side of the base opposite to the first side and configured to connect to the platform at a distal end of the column. Each test contact may include a first terminal for receiving an input signal and configured to contact an object under test, and a second terminal for outputting an output signal.

[0018] In one or more embodiments, the first terminal further includes conductive foam disposed at the distal end of the first terminal.

[0019] In one or more embodiments, the column includes an elastomer that allows the column to retract a certain distance under pressure and extend to recover when the pressure is removed.

[0020] In one or more embodiments, the device may further include a plurality of switches. Each test contact is connected to a corresponding switch among the plurality of switches. The plurality of switches are configured to selectively activate the test contact.

[0021] In a third aspect, a system for electrical testing is provided. This system may include the apparatus of the second aspect and a robot. The robot includes one or more processors and a memory storing instructions thereon, which, when executed by the processors, cause the robot to receive a set of coordinates of an object and receive information indicating the number of test contacts of the apparatus. When executed by the processors, these instructions also cause the robot to determine at least one subset of the received coordinate set based on the number of test contacts, select a first subset from the at least one subset, move the object to a position where the test contacts can approach a first set of points of the object corresponding to the coordinates in the first subset, enable the application of an input signal to the first set of points, and enable the generation of an output signal associated with the input signal.

[0022] It should be understood that the summary is not intended to identify key or essential features of the embodiments of this disclosure, nor is it intended to limit the scope of this disclosure. Other features of this disclosure will become readily apparent from the following description. Attached Figure Description

[0023] The above and other objects, features and advantages of this disclosure will become more apparent from the more detailed description of exemplary embodiments thereof taken in conjunction with the accompanying drawings, in which the same reference numerals generally denote the same parts.

[0024] Figure 1 This is a schematic diagram of a system for electrical testing provided in this disclosure;

[0025] Figure 2A system for electrical testing according to an embodiment of the present disclosure is shown;

[0026] Figure 3 A system for electrical testing according to another embodiment of the present disclosure is shown;

[0027] Figure 4 A flowchart of a process for electrical testing according to an embodiment of the present disclosure is shown;

[0028] Figure 5A An image showing a portion of the object to be tested and a portion of the object's coordinate set is displayed.

[0029] Figure 5B It shows Figure 5A A subset of the coordinate set of objects in the dataset;

[0030] Figure 6 A flowchart of another process for electrical testing according to an embodiment of the present disclosure is shown;

[0031] Figure 7A A circuit with multiple switches used in the system provided in this disclosure is shown;

[0032] Figure 7B Another circuit with a switching network used in the system provided in this disclosure is shown;

[0033] Figure 7C It shows Figure 5B The testing process for the subset shown;

[0034] Figure 8A An apparatus for electrical testing according to an embodiment of the present disclosure is shown; and

[0035] Figure 8B It shows Figure 8A A single test device of the apparatus shown.

[0036] In all the accompanying drawings, the same or similar reference numerals are used to denote the same or similar elements. Detailed Implementation

[0037] This disclosure will now be discussed with reference to several exemplary embodiments. It should be understood that these embodiments are discussed only to enable those skilled in the art to better understand and thus implement this disclosure, and are not intended to imply any limitation on the scope of the subject matter.

[0038] As used herein, the term "comprising" and its variations should be interpreted as open-ended terms meaning "including but not limited to". The term "based on" should be understood as "at least partially based on". The terms "one embodiment" and "embodiment" should be understood as "at least one embodiment". The term "another embodiment" should be understood as "at least one other embodiment". The terms "first", "second", etc., may refer to different or the same objects. Other explicit and implicit definitions may be included below. Unless the context clearly indicates otherwise, the definitions of terms are consistent throughout the specification.

[0039] Generally, there are two methods for insulation testing of battery trays. One method uses an insulation testing device and a manually operated testing tool. The manually operated testing tool is used to repeatedly scan the surface of the battery tray. The presence of defects or fault points in the insulation can be determined based on the readings on the insulation testing device. The disadvantage of this method is that, due to the large testing area of ​​the manually operated testing tool in each scan, only the approximate location of defects in the insulation can be determined. It is impossible to determine the exact location of the fault point, which will cause difficulties for subsequent repairs.

[0040] Another method involves using industrial robots or other mechanical devices to hold the battery tray. The insulation testing device is connected to the coated surface of the battery tray via conductive lines to detect the insulation performance of the coating. A drawback of this method is that only a few defects can be found at a time. After the detected defects are repaired, another test must be performed for further inspection, because the insulation testing device will show poor insulation performance as long as defects are present. This testing process is repeated until the battery tray coating passes the insulation test. This inspection method is inefficient and therefore cannot guarantee the production efficiency of qualified battery trays.

[0041] This invention aims to provide a method and system for electrical testing. The method and system according to this disclosure improve the efficiency of fault detection and facilitate further processing of detected faults, such as repair procedures.

[0042] Figure 1 This is a schematic diagram of a system for electrical testing provided in this disclosure. (Reference) Figure 1The system includes a robot 10 and a device 20 for electrical testing. The robot 10 can be configured to hold an object 100 to be tested, such as the aforementioned battery tray. The robot 10 may include one or more processors and a memory. The robot 10 is capable of wired or wireless communication with other devices, such as a computer that stores information associated with the object 100 to be tested and information associated with the device 20 for electrical testing. The additional device can send information about the object 100 to be tested and information about the device 20 for electrical testing to the robot 10. Alternatively, the robot 10 can interact with an operator via a user interface. The operator can input information about the object 100 to be tested and information about the device 20 for electrical testing into the robot 10. The received information can be stored in the memory of the robot 10.

[0043] Information about the object 100 to be tested may include at least a set of coordinates for the object 100. Each coordinate in this set may be mapped to a corresponding point on the object 100. Information about the apparatus 20 used for electrical testing may include at least information indicating the number of test contacts of the apparatus 20 used for electrical testing.

[0044] The apparatus 20 may include a plurality of test devices 21 and a platform 22. Each of the plurality of test devices may include a base 210, a plurality of test contacts 211, and a post. The plurality of test contacts 211 may be arranged to extend from a first side of the base 210. Each test contact 211 may include a first terminal for receiving an input signal and configured to contact the object under test, and a second terminal for outputting an output signal. The output signal is related to the input signal. The input signal and the output signal may be electrical signals, such as voltage signals or current signals. In one example, both the input signal and the output signal are voltage signals. When an input signal is applied, the area of ​​the object 100 contacted by the first terminal will cause abnormal signal attenuation, so if the area does not have sufficient insulation, there will be a large difference between the input signal and the output signal. Conversely, when an input signal is applied, the area of ​​the object 100 contacted by the first terminal will cause very small signal attenuation, so if the area has the desired insulation, the output signal can be approximately equal to the input signal.

[0045] The system may also include a power supply for generating an input signal and a tester for estimating electrical performance. The power supply may be coupled to a first terminal of test contact 211 to feed the input signal. The tester may be coupled to a second terminal of test contact 211. An output signal may be transmitted to the tester for estimating electrical performance, enabling the generation of a response to the output signal. The tester may include commercially available insulation detection devices. The tester may be configured to generate a response to an output signal associated with the input signal. Where the tester includes an insulation detection device, the response may indicate the presence of the desired electrical performance result. In another example, the tester may be configured to generate various responses to an electrical test. This may depend on the inherent functionality of the tester.

[0046] Figure 2 A system for electrical testing according to an embodiment of the present disclosure is shown. In this embodiment, the apparatus 20 is stationary relative to the earth. The object 100 to be tested is held above a plurality of test devices 21. The object 100 can be moved relative to the test devices 21 by using a robot 10. The movement of the object 100 relative to the test devices 21 can enable testing of different areas of the surface of the object 100.

[0047] Figure 3 A system for electrical testing according to another embodiment of the present disclosure is shown. In this embodiment, object 100 is held stationary relative to the earth by frame 30. Device 20 includes wheels disposed on the bottom of platform 22, such as... Figure 3 As shown. The device 20 can move horizontally relative to the stationary object 100. The frame 30 may be equipped with a lifting mechanism configured to move the object 100 up and down. Using this embodiment, different areas of the surface of the object 100 can be detected by using the device 20.

[0048] Figure 4 A flowchart of a process for electrical testing according to an embodiment of the present disclosure is shown.

[0049] In box 101, the coordinate set of the object is received. In box 102, information indicating the number of test contacts is received. In box 103, a subset of the coordinate set is determined based on the number of test contacts.

[0050] In one example, the coordinate set can be divided into multiple subsets based on the number of test contacts. Criteria for dividing the coordinate set into subsets may include that the number of coordinates in each subset is equal to or less than the number of test contacts. In one example, the total number of test contacts is 160, and some subsets may have 160 coordinates, while the remaining subsets may have fewer than 160 coordinates.

[0051] Furthermore, the criteria for dividing the coordinate set into multiple subsets may also include: the test contact point can simultaneously approach points corresponding to each coordinate in the subset. This allows testing of all points corresponding to coordinates in the subset at once.

[0052] In one example, a single subset is determined from multiple subsets and used in other processes, as shown in the following reference. Figure 6 The process described. Before the testing of the points corresponding to object 100 of the selected single subset has been completed, it is not necessary to determine and select other subsets in a specific order.

[0053] Figure 5A An image showing a portion of the object to be tested and a portion of the object's coordinate set is displayed. Figure 5B It shows Figure 5A A subset of the coordinate set of objects in the dataset.

[0054] refer to Figure 5A The object shown is a battery tray. Image 100' of the battery tray is displayed. Image 100' can be displayed to the operator through a user interface. Figure 5A As shown, a portion of the battery tray image 100' overlaps with the grid. The grid represents a portion of the coordinate set 200.

[0055] refer to Figure 5B The figure shows an example subset of coordinates 300. As shown, the coordinates are spaced apart from each other. In particular, there is a uniform interval between each pair of adjacent coordinates in the subset.

[0056] Once at least one subset has been determined, processing can be performed on each subset within that at least one subset. Figure 6 A flowchart of another process for electrical testing according to an embodiment of the present disclosure is shown.

[0057] In box 104, select a first subset from at least one subset. In one example... Figure 5B The coordinate subset 300 shown can be selected as the first subset. In another example, the first subset 300 is selected based on the location of the test contact point. The first subset can be determined such that points of objects corresponding to coordinates in the first subset have the total shortest distance to the test contact point. The total distance to the test contact point can be the cumulative sum of the distances from each point in the subset to the corresponding test contact point. In another example, the first subset 300 can be determined as the initial subset used to start the test, and points of objects corresponding to coordinates in the first subset include points on the edges and / or corners of the object.

[0058] In box 105, an object can be moved to a position accessible to the first set of points on the object corresponding to the coordinates in the first subset by a test contact. Each test contact can be moved to approach the surface of the object and abut against the corresponding point.

[0059] In box 106, an input signal can be applied to the first set of points. The input signal can be a voltage signal or a current signal. The input signal can be provided by a power supply coupled to the first terminal of the test contact.

[0060] Using the applied input signal, a corresponding point on the object can be excited. In block 107, a response to an output signal associated with the input signal can be generated. This response can be generated using a tester coupled to a second terminal of the test contact for estimating electrical performance. The response can be an electrical signal. The electrical signal can be compared to a reference to determine the electrical performance of a point in the first set of points. Additionally or alternatively, the response may include an indicator indicating whether the point is a fault point. The point can be marked as a fault point based on predetermined criteria. For example, the predetermined criterion is that the point has electrical performance worse than expected.

[0061] Furthermore, the method may also include determining whether the point is faulty based on the generated response. In response to determining that the point is faulty, the method may include initiating another process to repair the faulty point and / or generating an alarm associated with the faulty point.

[0062] In one example, the fault point may include a defective insulation point. This disclosure also provides two repair methods for defective insulation points. One method is to repair the defective point using insulating varnish or other suitable materials. The other method is to apply insulating tape to the defective point. These repair methods can be performed by robots or manually.

[0063] Alarms associated with a fault point can be used to notify operators of the existence of the fault. Alarms can include audible signals, visual signals, or a combination thereof.

[0064] In one example, applying an input signal to the first set of points further includes: disabling the application of the input signal to points corresponding to the same coordinates in response to determining that a subset of the at least one subset includes coordinates identical to those included in the first subset. This way, points on the object can be tested without being repeated, thus consuming less power from the power supply during testing.

[0065] Determining whether a subset includes coordinates identical to those included in the first object can be performed by comparing subsets within multiple subsets. Alternatively, when dividing the coordinate set into multiple subsets, subsets that include coordinates identical to those included in one or more other subsets can be marked. The marked subsets are then compared with the other subsets, and the identical coordinates are identified. This facilitates the process of finding identical coordinates that are simultaneously included in at least two subsets.

[0066] In one example, the method further includes determining a second subset based on the similarity between the first subset and other subsets of at least one subset. When the coordinates are in a two-dimensional coordinate system, the similarity is related to at least one of the x-axis coordinates or the y-axis coordinates of the first subset. For example, a subset including coordinates (100, 100) can be considered more similar to the first subset including coordinates (100, 50) than a subset including coordinates (200, 200). In this example, the similarity is estimated at least partially based on the x-axis coordinates. In another example, the second subset can be an “offset” of the first subset. That is, the second subset can be determined by offsetting the x-axis coordinate, y-axis coordinate, or both of each element in the first subset. The offset between the first and second subsets can be predetermined. The offset can include various offsets. In one example, the offset includes a first offset and a second offset. The first offset can be determined based on the maximum difference between the coordinates of the first subset. The second offset can be determined based on the distance in the coordinate system corresponding to the width of a single test contact point. In this way, all points on the object can be tested.

[0067] Figure 7A A circuit with multiple switches used in the system provided in this disclosure is shown. Figure 7B Another circuit with a switching network is shown for use in the system provided in this disclosure.

[0068] refer to Figure 7A Multiple switches are provided between the power supply and test contacts. Each of these switches can be connected to a corresponding test contact. When an input signal is applied to the first set of points, the multiple switches can operate to selectively connect the test contacts. The multiple switches can be replaced by a switch network, such as... Figure 7B As shown. All test contacts can be connected to the switch network. The switch network can be configured to selectively connect the test contacts in response to control signals.

[0069] By utilizing multiple switches or a network of switches, when an input signal is applied to the first set of points, a portion of the test contacts can be enabled while the remainder of the test contacts can be disabled. Figure 7C It shows Figure 5BThe testing procedure for the subset shown. Region II can be tested after Region I. When testing a point located in Region II, the test contact corresponding to Region II is enabled, and the other test contacts corresponding to Regions I, III, and IV are disabled.

[0070] Additional or alternative grounds can be used to determine the number of test contacts to be enabled based on the power supply's rated operating power and the level of the input signal. This offers advantage when there are many test contacts and the power supply configured to provide the input signal has a limited rated operating power.

[0071] The method further includes: in response to determining that a response has been generated for each point in the first set of points, moving the object to a position where a second set of points corresponding to the coordinates in the second subset of the object can be approached by a test contact. Electrical testing of the points of the object corresponding to the coordinates in the second subset can then be performed, similar to the method described above. Figure 6 The discussion process.

[0072] Similar to the transformation from processing for the first subset to processing for the second subset, a transformation can be performed from processing for the second subset to processing for yet another subset of multiple subsets. Another process for testing points corresponding to coordinates in the other subset can be referenced above. Figure 6 The process described is the same. This allows for electrical testing of every point on the object.

[0073] Furthermore, during electrical testing, an image representing a set of coordinates of the object can be displayed via a user interface. When displaying the image, the first coordinates corresponding to points in the first subset that have generated a response can be represented by a first color. The second coordinates corresponding to points in the first subset that have been applied by an input signal can be represented by a second color. The coordinates of the second subset can be represented by a third color. The first, second, and third colors can be different from each other. For example, the first color can be red, the second color can be blue, and the third color can be yellow. In this way, the progress of the test can be displayed on the user interface, allowing the operator to learn about the stages of the electrical test in real time.

[0074] To further facilitate electrical testing, the present invention provides an apparatus for electrical testing. Figure 8A An apparatus for electrical testing according to an embodiment of the present disclosure is shown. Figure 8B It shows Figure 8A A single test device of the apparatus shown.

[0075] refer to Figures 8A-8BThe device 20 may include a platform 22 and a plurality of test devices 21. Each of the plurality of test devices 21 may include a base 210, a plurality of test contacts 211, and a post 212. The test contacts 211 may be arranged to extend from a first side of the base 210. Each test contact 211 includes a first terminal 213 and a second terminal 214.

[0076] The post 212 may be arranged to extend from a second side of the base 210 opposite to the first side. The post 212 may be configured to connect to the platform at its distal end. Additionally, the test equipment may include a flat bottom 216. The flat bottom 216 may be securely connected to the platform using fasteners.

[0077] In one example, the first terminal 213 also includes a conductive foam 215 disposed at the distal end of the first terminal 213. When the first terminal 213 abuts against the surface of the object at the corresponding point, the conductive foam 215 can deform according to the contour of the contact surface, and thus there is sufficient contact between the first terminal 213 of the test contact and the surface of the object in order to avoid poor conductivity and increased resistance.

[0078] The post 212 may also include an elastomer. The elastomer can retract and extend based on the application and release of pressure thereon. In the case where each of the multiple test devices 21 includes a post 212 containing an elastomer, sufficient pressure can be applied to the multiple test devices 21 so that the post 212 of each test device 21 can retract to different degrees, allowing all test contacts to abut the surface of the object.

[0079] In one example, spring 217 is positioned between the flat bottom 216 and the base 210. Specifically, post 212 is surrounded by spring 217. When the applied pressure is removed, spring 217 can facilitate the extension of post 212, and thus post 212 can return to its original position more quickly.

[0080] It should be understood that the embodiments of the present invention are also applicable to computer programs, particularly computer programs on or in a carrier suitable for putting the present invention into practice.

[0081] The program can be in the form of source code, object code, intermediate source code, and object code, such as in a partially compiled form, or any other form suitable for use in the implementation of the method according to embodiments of the invention. It should also be understood that such a program can have many different architectural designs. For example, program code implementing the functionality of the method or system according to the invention can be subdivided into one or more subroutines. Many different ways of distributing functionality among these subroutines will be apparent to those skilled in the art. Subroutines can be stored together in an executable file to form a self-contained program. Such an executable file can include computer-executable instructions, such as processor instructions and / or interpreter instructions (e.g., Java interpreter instructions). Alternatively, one or more or all subroutines can be stored in at least one external library file and linked to the main program, for example, statically or dynamically at runtime. The main program contains at least one call to at least one subroutine. Subroutines can also include function calls to each other. Embodiments relating to computer program products include computer-executable instructions corresponding to each processing stage of at least one method set forth herein. These instructions can be subdivided into subroutines and / or stored in one or more files that can be statically or dynamically linked. Another embodiment relating to a computer program product includes computer-executable instructions for each device corresponding to at least one system and / or product set forth herein. These instructions may be subdivided into subroutines and / or stored in one or more files that may be statically or dynamically linked.

[0082] The carrier of a computer program can be any entity or device capable of carrying the program. For example, the carrier can include data storage, such as ROM, like a CD-ROM or semiconductor ROM, or magnetic recording media, such as a hard disk. Furthermore, the carrier can be a transmissible carrier, such as an electrical or optical signal, which can be transmitted via cable or optical fiber or by radio or other means. When a program is contained within such a signal, the carrier can be constituted by such a cable or other means or device. Alternatively, the carrier can be an integrated circuit in which the program is embedded, the integrated circuit being adapted to execute or be used to execute related methods.

[0083] Those skilled in the art, upon practicing the principles and techniques described herein, will understand and implement variations of the disclosed embodiments by studying the accompanying drawings, the disclosure, and the appended claims. In the claims, the word "comprising" does not exclude other elements or steps, and the indefinite articles "a" or "an" do not exclude a plurality. A single processor or other unit can implement the functions of several items as described in the claims. The fact that certain measures are recited in mutually different dependent claims does not imply that combinations of these measures cannot be advantageously used. Computer programs may be stored or distributed on suitable media, such as optical storage media or solid-state media provided with or as part of other hardware, but may also be distributed in other forms, such as via the Internet or other wired or wireless telecommunications systems. Any reference numerals in the claims should not be construed as limiting the scope.

Claims

1. A method for electrical testing, comprising: Receive (101) the coordinate set (200) for object (100). Receive (102) information indicating the number of test contacts (211) of the device (20) used for the electrical test, Based on the number of the test contacts (211), at least one subset (300) of the coordinate set (200) received by (103) is determined. Select (104) a first subset (300) from the at least one subset. Move the object (100) (105) to a position where the test contact can approach the first set of points of the object (100) corresponding to the coordinates in the first subset. The input signal is applied (106) to the first set of points, and Generate (107) a response to an output signal associated with the input signal.

2. The method of claim 1, wherein applying the input signal to the first set of points further comprises: In response to determining that a subset of the at least one subset includes the same coordinates as those included in the first subset, applying the input signal to the point corresponding to the same coordinates is disabled.

3. The method according to claim 1, further comprising: The second subset is determined based on the similarity between the first subset (300) and another subset in the at least one subset.

4. The method of claim 3, wherein the coordinates are coordinates in a two-dimensional coordinate system; and The similarity mentioned therein refers to at least one of the following: The x-coordinate of the first subset, or The y-coordinate of the first subset.

5. The method according to claim 1, further comprising: The second subset is determined based on the first subset (300) and the predefined offset.

6. The method according to claim 1, wherein the number of coordinates in each subset of the at least one subset (300) corresponds to the number of test contacts (211).

7. The method of claim 1, wherein applying the input signal to the first set of points further comprises: Enable a portion of the test contact while simultaneously disabling the remaining portion of the test contact.

8. The method according to claim 3, further comprising: In response to the determination that a response has been generated for each of the first set of points, the object (100) is moved to a position where the test contact can approach the second set of points of the object (100) corresponding to the coordinates in the second subset.

9. The method according to claim 3, further comprising: An image (100') representing the coordinate set of the object (100) is displayed via a user interface.

10. The method of claim 9, wherein displaying the image further comprises: As the approach to the first set of points is made, the first coordinates of the points in the first subset (300) corresponding to the points that have generated the response are indicated by the first color; The second color indicates the second coordinates of the points in the first subset (300) corresponding to the points to which the input signal is to be applied; and The coordinates of the second subset are indicated by a third color.

11. The method of claim 10, further comprising: Determine whether the point is faulty based on the generated response, and In response to the determination that the point is faulty, another process is initiated to repair the faulty point and / or generate an alarm associated with the faulty point.

12. An apparatus (20) for electrical testing, comprising: Platform (22), Multiple test devices (21), each of the multiple test devices comprising: Base (210); Multiple test contacts (211) extending from a first side of the base (210), and each test contact comprising: A first terminal (213) is used to receive an input signal and is configured to contact the object to be tested (100); and The second terminal (214) is used to output the output signal, and A column (212) extends from a second side of the base (210) opposite to the first side and is configured to connect to the platform (22) at the distal end of the column.

13. The apparatus of claim 12, wherein the first terminal (213) further comprises a conductive foam (215) disposed on the distal end of the first terminal (213).

14. The apparatus of claim 12, wherein the column (213) comprises an elastomer and / or the test device comprises a spring (217) surrounding the column (212).

15. The apparatus of claim 12, further comprising a plurality of switches, and Each test contact (211) is connected to a corresponding switch among the plurality of switches. The plurality of switches are configured to selectively connect the test contacts.

16. An electrical testing system, comprising: The device (20) according to any one of claims 12-15. A robot includes one or more processors and a memory, wherein the memory stores instructions that, when executed by the processor, cause the robot to: Receive (101) the coordinate set for object (100), Receive (102) information indicating the number of test contacts of the device, Based on the number of test contacts, at least one subset of the coordinate set received by (103) is determined. Select (104) a first subset from the at least one subset. Move the object (100) (105) to a position where the test contact can approach the first set of points of the object (100) corresponding to the coordinates in the first subset. Enable the application of the input signal to the first set of points (106); and Enable the generation of a response to an output signal associated with the input signal (107).

Images