Angular analysis apparatus and method for transparent thin-walled structures

Abstract

The application relates to an angle analysis device and method of a transparent thin-walled structure, wherein the device comprises: a measuring element for collecting image information of the transparent thin-walled structure; an adjusting element for adjusting the spatial posture of the transparent thin-walled structure until a preset calibration posture is reached; a fixing element for fixing the calibrated transparent thin-walled structure; and an analyzing element for calculating the actual included angle between the support column and the reference surface of the calibrated transparent thin-walled structure according to the image information. Thus, the problems in the prior art that the measurement process relies on offline image processing, real-time feedback cannot be realized, processing errors cannot be corrected in time, the special fixture has poor universality and high cost, error accumulation is easy to occur during multiple clamping, the boundary of the transparent thin-walled structure is difficult to identify, the precision and efficiency of the support column angle are low, and the quality of the product is affected are solved, and the structural assembly precision and manufacturing efficiency are improved.

Description

Technical Field

[0001] This application relates to the fields of ultra-precision manufacturing and optical inspection technology, and in particular to an angle analysis device and method for transparent thin-walled structural components. Background Technology

[0002] Currently, in the manufacturing process of high-end inertial devices such as quartz hemispherical resonators, the vertical angle accuracy of the internal support structure (support column) of the micro-shell directly affects the frequency splitting, quality factor and subsequent assembly consistency of the device. Therefore, accurate measurement of the support column angle has become a key link to ensure device performance.

[0003] In related technologies, an optical microscope combined with a special fixture is used for offline measurement. After fixing the sample posture, the image is acquired. The angle analysis of the image is performed by offline image processing and manual boundary interpretation. The measurement and calibration processes are independent of each other and require multiple clamping and positioning. During the inspection, colloidal materials are also needed to fix and clamp the workpiece.

[0004] However, in related technologies, the measurement process relies on offline image processing, which cannot achieve real-time feedback, resulting in the inability to correct processing errors in a timely manner. Furthermore, the high degree of customization of special fixtures leads to poor versatility and high cost. Due to the accumulation of errors from multiple clamping operations, stress shifts during the curing process of colloidal materials affect measurement accuracy. The difficulty in identifying the boundaries of transparent thin-walled structural components results in low accuracy and efficiency of support column angles, affecting product quality and urgently requiring improvement. Summary of the Invention

[0005] This application provides an angle analysis device and method for transparent thin-walled structural components to solve the problems in related technologies, such as the inability to achieve real-time feedback due to the reliance on offline image processing in the measurement process, resulting in the inability to correct processing errors in a timely manner, the poor versatility and high cost of dedicated fixtures, the easy accumulation of errors due to repeated clamping, the difficulty in identifying the boundaries of transparent thin-walled structural components, and the resulting low accuracy and efficiency of the support column angle, which affects the quality of the product.

[0006] The first aspect of this application provides an angle analysis device for a transparent thin-walled structure, comprising: a measuring component for acquiring image information of the transparent thin-walled structure; an adjusting component for adjusting the spatial posture of the transparent thin-walled structure until a preset calibration posture is reached; a fixing component for fixing the calibrated transparent thin-walled structure; and an analysis component for calculating the actual included angle between the support column and the reference plane of the calibrated transparent thin-walled structure based on the image information.

[0007] Through the above-mentioned technical means, the embodiments of this application can acquire images of transparent thin-walled structural components and adjust their spatial posture to calculate the angle between the support column of the thin-walled structural component and the reference plane, thereby realizing the integration of real-time observation, dynamic adjustment, image fitting calculation and in-situ fixation of the angle, completing high-precision online calibration of the internal support structure angle of the transparent thin-walled structural component, and improving the assembly accuracy and manufacturing efficiency of the structure.

[0008] Optionally, in one embodiment of this application, the measuring device includes: a light source and an image acquisition device; a one-dimensional moving stage in the X direction, wherein the image acquisition device is disposed on the one-dimensional moving stage in the X direction; and a two-dimensional moving stage in the YZ direction, wherein the transparent thin-walled structure is disposed on the sample stage of the two-dimensional moving stage in the YZ direction, such that the transparent thin-walled structure is within the imaging range of the image acquisition device, thereby obtaining the image information.

[0009] Through the above-mentioned technical means, the embodiments of this application can rely on a light source and an image acquisition device to obtain the angle information of the structural component under test, and use a one-dimensional moving stage in the X direction and a two-dimensional moving stage in the YZ direction to adjust the relative position of the acquisition device and the workpiece under test, thereby realizing spatial alignment and real-time imaging of transparent thin-walled structural components, and adapting to the imaging needs of transparent thin-walled structural components of different sizes and specifications, thus improving versatility.

[0010] Optionally, in one embodiment of this application, the center of the transparent thin-walled structure is aligned with the center of the three-point support column of the sample stage.

[0011] Through the above-mentioned technical means, the embodiments of this application can ensure that the shell can be stably inverted inside the glass tube by precisely aligning the center of the transparent thin-walled structural component with the center of the three-point support column, thus providing an accurate reference for subsequent establishment of a horizontal baseline and angle measurement.

[0012] Optionally, in one embodiment of this application, the adjusting component includes: a pitch adjustment platform and a tilt adjustment platform, used to adjust the pitch and tilt angles of the transparent thin-walled structure to determine the spatial attitude; and a plurality of support columns, used to adjust the position and attitude of the support columns of the transparent thin-walled structure relative to the horizontal baseline.

[0013] Through the above-mentioned technical means, the embodiments of this application can adjust the spatial attitude of the structural component from two angular dimensions: pitch angle and tilt angle, and adjust the position and attitude of the support column of the transparent thin-walled structural component relative to the horizontal baseline to complete the attitude adjustment, thereby avoiding the accumulation of measurement errors and ensuring the accuracy of measurement.

[0014] Optionally, in one embodiment of this application, the plurality of support columns are first to third support columns, which are arranged in a three-point distribution.

[0015] Through the above-mentioned technical means, the embodiments of this application can use three-point distributed support columns to provide stable support for transparent thin-walled structural components and adapt to the deformation characteristics of transparent thin-walled structural components, thus ensuring the reliability of subsequent calculations.

[0016] Optionally, in one embodiment of this application, the analysis component includes: a first extraction device for extracting end face edge information of the transparent thin-walled structural component based on the image information; a second extraction device for extracting support column edge information of the adjustment component; and a calculation device for calculating the actual included angle based on the end face edge information and the support column edge information.

[0017] Through the above-mentioned technical means, the embodiments of this application can extract the end face edge information of transparent thin-walled structural components and the support column edge information of adjustment components, and calculate the actual included angle by combining edge extraction and axis fitting algorithms, thereby solving the problem of difficult boundary identification of transparent thin-walled structures, avoiding errors caused by manual interpretation, and improving the calculation accuracy and detection reliability of angle analysis.

[0018] A second aspect of this application provides an angle analysis method for a transparent thin-walled structural component, comprising the following steps: acquiring image information of the transparent thin-walled structural component; adjusting the spatial orientation of the transparent thin-walled structural component until the preset calibration orientation is reached; and calculating the actual included angle between the support column and the reference plane of the calibrated transparent thin-walled structural component based on the image information.

[0019] Through the above-mentioned technical means, the embodiments of this application can acquire images of transparent thin-walled structural components and adjust their spatial posture to calculate the angle between the support column of the thin-walled structural component and the reference plane, thereby realizing the integration of real-time observation, dynamic adjustment, image fitting calculation and in-situ fixation of the angle, completing high-precision online calibration of the internal support structure angle of the transparent thin-walled structural component, and improving the assembly accuracy and manufacturing efficiency of the structure.

[0020] Optionally, in one embodiment of this application, adjusting the spatial attitude of the transparent thin-walled structure until the preset calibration attitude is achieved includes: adjusting the pitch and tilt angles of the transparent thin-walled structure to determine the spatial attitude; and adjusting the position and attitude of the support column of the transparent thin-walled structure relative to the horizontal baseline.

[0021] Through the above-mentioned technical means, the embodiments of this application can adjust the spatial attitude of the structural component from two angular dimensions: pitch angle and tilt angle, and adjust the position and attitude of the support column of the transparent thin-walled structural component relative to the horizontal baseline to complete the attitude adjustment, thereby avoiding the accumulation of measurement errors and ensuring the accuracy of measurement.

[0022] Optionally, in one embodiment of this application, calculating the actual included angle between the support column and the reference plane of the calibrated transparent thin-walled structural member based on the image information includes: extracting the end face edge information of the transparent thin-walled structural member based on the image information; extracting the support column edge information of the adjusting member; and calculating the actual included angle based on the end face edge information and the support column edge information.

[0023] Through the above-mentioned technical means, the embodiments of this application can extract the end face edge information of transparent thin-walled structural components and the support column edge information of adjustment components, and calculate the actual included angle by combining edge extraction and axis fitting algorithms, thereby solving the problem of difficult boundary identification of transparent thin-walled structures, avoiding errors caused by manual interpretation, and improving the calculation accuracy and detection reliability of angle analysis.

[0024] A third aspect of this application provides an electronic device, including: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the program to implement the angle analysis method for transparent thin-walled structures as described in the above embodiments.

[0025] A fourth aspect of this application provides a non-volatile computer-readable storage medium storing a computer program that, when executed by a processor, implements the above-described angle analysis method for transparent thin-walled structures.

[0026] A fifth aspect of this application provides a computer program product that stores a computer program that, when executed by a processor, implements the above-described angle analysis method for transparent thin-walled structures.

[0027] This application embodiment can acquire images of transparent thin-walled structural components and adjust their spatial orientation to calculate the angle between the support column and the reference plane. This achieves integrated real-time angle observation, dynamic adjustment, image fitting calculation, and in-situ fixation, enabling high-precision online calibration of the internal support structure angles of the transparent thin-walled structural components, thus improving assembly accuracy and manufacturing efficiency. This solves the problems in related technologies where offline image processing is required for measurement, preventing real-time feedback and hindering timely correction of processing errors. Furthermore, the poor versatility and high cost of dedicated fixtures lead to error accumulation from repeated clamping, making boundary identification of transparent thin-walled structural components difficult, resulting in low accuracy and efficiency of support column angles and impacting product quality.

[0028] Additional aspects and advantages of this application will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of this application. Attached Figure Description

[0029] The above and / or additional aspects and advantages of this application will become apparent and readily understood from the following description of the embodiments taken in conjunction with the accompanying drawings, wherein: Figure 1 This is a schematic diagram of an angle analysis device for a transparent thin-walled structural component provided according to an embodiment of this application; Figure 2 This is a schematic diagram of the angle analysis device for a transparent thin-walled structure provided according to an embodiment of this application; Figure 3 This is a schematic diagram of an adjustment table structure according to an embodiment of this application; Figure 4 This is a schematic diagram of axis measurement according to an embodiment of this application; Figure 5 This is a flowchart of an angle analysis method for a transparent thin-walled structural component according to an embodiment of this application; Figure 6 This is a schematic diagram of the structure of an electronic device provided according to an embodiment of this application.

[0030] Figure label: 10-Angle analysis device for transparent thin-walled structural components; 100-Measuring component, 200-Adjusting component, 300-Fixing component, 400-Analytical component; 201-CCD camera, 202-One-dimensional moving stage, 203-Two-dimensional moving stage, 204-Sample device, 205-Light source; 301-Sample support rod, 302-Adjusting pitch angle, 303-Adjusting tilt angle, 304-Support rod, 305-Glass support, 306-Parallel glass tube, 307-Horizontal support rod, 308-Pitch stage, 309-Sample stage base; 601-Memory, 602-Processor, 603-Communication interface. Detailed Implementation

[0031] The embodiments of this application are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and intended to explain this application, and should not be construed as limiting this application.

[0032] The following description, with reference to the accompanying drawings, describes an angle analysis device and method for transparent thin-walled structural components according to embodiments of this application. Addressing the issues raised in the background section regarding related technologies, where the measurement process relies on offline image processing, real-time feedback is impossible, leading to uncorrected processing errors. Furthermore, the poor versatility and high cost of specialized fixtures result in error accumulation from repeated clamping, making boundary identification of transparent thin-walled structural components difficult. This leads to low accuracy and efficiency in measuring the angle of the support column, impacting product quality. This application provides an angle analysis device for transparent thin-walled structural components. This device can acquire images of the transparent thin-walled structural component and adjust its spatial orientation to calculate the angle between the support column and the reference plane. This achieves integrated real-time angle observation, dynamic adjustment, image fitting calculation, and in-situ fixation, enabling high-precision online calibration of the internal support structure angle of the transparent thin-walled structural component, thereby improving structural assembly accuracy and manufacturing efficiency. This solves the problems in related technologies, such as the inability to correct processing errors in a timely manner due to the reliance on offline image processing for measurement, the inability to achieve real-time feedback, the poor versatility and high cost of dedicated fixtures, the tendency for repeated clamping to accumulate errors, the difficulty in identifying the boundaries of transparent thin-walled structural parts, and the resulting low accuracy and efficiency of support column angles, which affect product quality.

[0033] Specifically, Figure 1 This is a schematic diagram of the angle analysis device for a transparent thin-walled structural component according to an embodiment of this application.

[0034] like Figure 1 As shown, the angle analysis device 10 for the transparent thin-walled structure includes: a measuring component 100, an adjusting component 200, a fixing component 300, and an analyzing component 400.

[0035] Among them, the measuring component 100 is used to acquire image information of the transparent thin-walled structural component.

[0036] It is understood that the transparent thin-walled structure in the embodiments of this application can be understood as a high-precision inertial device such as a quartz hemispherical resonator microshell. The image information may include imaging data such as the outer contour, end face boundary, and angle information of the transparent thin-walled structure, providing raw basic data for subsequent attitude adjustment, edge recognition, and angle calculation.

[0037] In actual implementation, the embodiments of this application can take pictures of transparent thin-walled structural components under a determined spatial attitude, and acquire images of the horizontal reference plane and the boundary of the support column of the transparent thin-walled structural components in real time, generating raw image data that can be used for subsequent algorithm processing.

[0038] The embodiments of this application can achieve high-precision image acquisition of transparent thin-walled structural components through measuring devices, thereby providing a clear and reliable image basis for angle analysis and significantly improving the accuracy and repeatability of measurements.

[0039] Optionally, in one embodiment of this application, the measuring component 100 includes: a light source and an image acquisition device; a one-dimensional moving stage in the X direction, on which the image acquisition device is disposed; and a two-dimensional moving stage in the YZ direction, on which the transparent thin-walled structure is disposed on the sample stage of the two-dimensional moving stage in the YZ direction, so that the transparent thin-walled structure is within the imaging range of the image acquisition device, thereby obtaining image information.

[0040] It is understood that the image acquisition device in the embodiments of this application can be a high-speed CCD camera. In practical implementation, the embodiments of this application can be used to acquire angular information of the transparent thin-walled structural component to be tested. For example, the embodiments of this application can be used to set up the device. First, a high-speed CCD camera is mounted on the X-axis moving stage, and the sample stage is mounted on the YZ-axis two-dimensional moving stage. Then, the light source is turned on and the YZ direction is adjusted to ensure that the sample stage is within the imaging range of the CCD, so that the CCD camera, sample, and light source are on the same horizontal axis. Subsequently, by adjusting the X-axis and the focal length of the CCD camera, the focus of the CCD camera is accurately focused on the sample stage to ensure the accuracy of image acquisition.

[0041] The embodiments of this application can rely on a light source and an image acquisition device to obtain the angle information of the structural component under test, and use a one-dimensional moving stage in the X direction and a two-dimensional moving stage in the YZ direction to adjust the relative position of the acquisition device and the workpiece under test, thereby realizing spatial alignment and real-time imaging of transparent thin-walled structural components, and adapting to the imaging needs of transparent thin-walled structural components of different sizes and specifications, thus improving versatility.

[0042] Optionally, in one embodiment of this application, the center of the transparent thin-walled structure is aligned with the center of the three-point support column of the sample stage.

[0043] It is understood that, in the embodiments of this application, center alignment can be understood as the geometric center or symmetry center of the transparent thin-walled structural component coinciding with the positioning center of the three-point support column of the sample stage; the three-point support column is the load-bearing positioning structure of the sample stage, which can be used to provide stable support and center positioning reference for the transparent thin-walled structural component to be tested.

[0044] For example, in this embodiment, a transparent glass tube can be placed on the sample stage first, ensuring that the center of the glass tube is aligned with the center of the three-point support pillars of the sample stage. In this way, the glass tube becomes the housing structure supporting the microshell. By precisely aligning the center of the glass tube between the three support points, it is ensured that the shell can stand stably inverted inside the glass tube.

[0045] Subsequently, an image of the end face of the transparent glass tube is acquired using a CCD camera. The focus is adjusted so that the front and rear ends of the glass tube completely overlap in the CCD image, indicating that the end face of the glass tube is horizontal at this time. This establishes a horizontal baseline, providing an accurate reference for subsequent angle measurements.

[0046] Next, by adjusting the focal length, focus is placed on the edge of the microshell support column, and two horizontal baselines are obtained in the image. These two baselines intersect the edge of the microshell support column. By connecting the midpoint of the intersection of the two baselines and the edge of the support column, the position of the support column axis can be determined. At this point, the angle between the horizontal baseline and the support column axis can be measured.

[0047] The embodiments of this application can ensure that the shell can be stably inverted inside the glass tube by precisely aligning the center of the transparent thin-walled structural component with the center of the three-point support column, thus providing an accurate reference for subsequent establishment of a horizontal baseline and angle measurement.

[0048] Adjustment component 200 is used to adjust the spatial attitude of the transparent thin-walled structural component until the preset calibration attitude is reached.

[0049] It is understood that the preset calibration posture in the embodiments of this application can be understood as the axis of the support column of the transparent thin-walled structural component being perpendicular to the horizontal plane in space. The preset calibration posture can be set by those skilled in the art according to the actual situation, and no specific restrictions are imposed here.

[0050] In actual implementation, the embodiments of this application can load the transparent thin-walled structural component onto the adjusting component 200, and correct the deviation of the structural component in the pitch and tilt directions through the multi-degree-of-freedom adjustment function until the axis of the support column of the transparent thin-walled structural component is perpendicular to the horizontal plane in space, that is, the preset calibration posture has been achieved.

[0051] The embodiments of this application can support and adjust the spatial attitude of transparent thin-walled structural components, thereby eliminating the angle calculation system error caused by inconsistent clamping attitude, and improving measurement accuracy and universal adaptability.

[0052] Optionally, in one embodiment of this application, the adjusting member 200 includes: a pitch angle adjusting platform and a tilt angle adjusting platform, used to adjust the pitch angle and tilt angle of the transparent thin-walled structure to determine its spatial attitude; and a plurality of support columns, used to adjust the position and attitude of the support columns of the transparent thin-walled structure relative to the horizontal baseline.

[0053] It is understood that in the embodiments of this application, the pitch angle adjustment platform is used to control the forward and backward flipping angle of the transparent thin-walled structural component, and the tilt angle adjustment platform is used to control the left and right tilting angle of the transparent thin-walled structural component; the horizontal reference line is a horizontal reference line established based on the end face parallel to the transparent glass tube.

[0054] Specifically, an image of the end face of the transparent glass tube is acquired using a CCD camera. The focal length is adjusted so that the front and rear ends of the glass tube completely overlap in the CCD image, indicating that the end face of the glass tube is horizontal at this time. This establishes a horizontal baseline, providing an accurate reference for subsequent angle measurements.

[0055] In practical implementation, this embodiment of the application can perform dual-angle observation and measurement at 0 degrees and 90 degrees to ensure that the axis of the support column is perpendicular to the horizontal plane in space. First, the position of the sample stage where the CCD is observing the sample is marked as the 0-degree position. By adjusting the pitch and tilt angles of the sample stage, the included angle reaches 90°±0.02°. Then, the sample stage is rotated 90 degrees relative to the 0-degree position of the CCD, and the pitch and tilt angles of the sample stage are adjusted again to achieve the included angle of 90°±0.02°. Finally, the sample stage is adjusted back to the 0-degree position, ensuring that the included angle remains at 90°±0.02° at both the 0-degree and 90-degree positions. At this point, the axis of the support column is perpendicular to the horizontal reference plane in space.

[0056] During the adjustment process, specialized image processing software is used to automatically calculate the angle between the support column axis and the horizontal baseline. This calculation is based on precise extraction of image data, ensuring high accuracy of the measurement results.

[0057] The embodiments of this application can adjust the spatial attitude of the structural component from two angular dimensions: pitch angle and tilt angle, and adjust the position and attitude of the support column of the transparent thin-walled structural component relative to the horizontal baseline to complete the attitude adjustment, thereby avoiding the accumulation of measurement errors and ensuring the accuracy of the measurement.

[0058] Optionally, in one embodiment of this application, the multiple support columns are first to third support columns, which are arranged in a three-point distribution.

[0059] For example, in the embodiments of this application, the first to third support columns are arranged in a three-point distribution to achieve stable support and adapt to the deformation characteristics of the transparent thin-walled structural component.

[0060] The embodiments of this application can use three-point distributed support columns to provide stable support for transparent thin-walled structural components and adapt to the deformation characteristics of transparent thin-walled structural components, thus ensuring the reliability of subsequent calculations.

[0061] Fastener 300 is used to secure the calibrated transparent thin-walled structural component.

[0062] It is understood that the fixing member 300 in the embodiments of this application may include: a receiving clamp, an injection device, and a transparent curing adhesive. The receiving clamp may be a transparent glass tube with parallel end faces; the injection device may be a syringe; and the transparent curing adhesive may be resin or paraffin wax.

[0063] For example, in this embodiment of the application, resin or paraffin can be injected into the transparent glass tube using a syringe, and curing can be completed under continuous CCD observation. During the curing process, the included angle drift is monitored in real time and compensated for. The included angle change is monitored in real time during the curing process, and fine-tuning continues when the deviation exceeds a preset error threshold. After curing, the angle is measured again. The repeated measurement error can be no greater than ±0.02°, and the preset error threshold can be no greater than ±0.02°.

[0064] The embodiments of this application can inject resin or paraffin for curing after angle calibration to fix the structural component. The curing process can be monitored and corrected in real time, thereby ensuring the stability of the transparent thin-walled structural component during the measurement process, guaranteeing the accuracy and reliability of the measurement results, and avoiding the curing stress displacement problem caused by using colloidal materials for fixation.

[0065] Analysis component 400 is used to calculate the actual angle between the support column and the reference plane of the calibrated transparent thin-walled structural component based on image information.

[0066] In actual implementation, the embodiments of this application can receive image information collected by the measuring component 100, automatically identify the end face edge and support column edge of the transparent thin-walled structural component in the CCD image through image processing algorithms, extract the corresponding geometric feature parameters, and then perform geometric calculation based on the reference plane direction represented by the end face edge and the support column axis direction represented by the support column edge to obtain the actual included angle value between the support column and the reference plane.

[0067] For example, in this embodiment of the application, the image can be preprocessed (such as denoising and enhancement) to eliminate the ghosting interference caused by the light transmission of the transparent thin-walled structural component, and the edge extraction of the glass tube end face can be performed to accurately capture the contour boundary of the end face; the edge information of the support column can be extracted simultaneously to distinguish the support column from the background and other parts of the structural component; then, the reference axis of the glass tube end face and the axis of the support column can be fitted respectively through the axis fitting algorithm, and the actual included angle between the support column and the reference surface can be automatically calculated through geometric operations.

[0068] The embodiments of this application can realize the automated and accurate calculation of the support column angle, effectively avoiding the error of manual interpretation, significantly improving the measurement accuracy and consistency, and realizing the digital output of the measurement results, which facilitates subsequent data analysis and quality control.

[0069] Optionally, in one embodiment of this application, the analysis component 400 includes: a first extraction device for extracting end face edge information of the transparent thin-walled structural component based on image information; a second extraction device for extracting support column edge information of the adjustment component; and a calculation device for calculating the actual included angle based on the end face edge information and the support column edge information.

[0070] For example, in this embodiment of the application, the first extraction device can extract the edges of the image of the transparent thin-walled structural component, and the edge detection algorithm can be used to accurately segment the glass tube end face area in the CCD image, filter redundant background information, and extract the complete and clear end face edge; the second extraction device can simultaneously perform edge detection on the imaging area of ​​the support column and extract the contour edges of both sides of the support column; the computing device can fit the end face axis and the support column axis respectively based on the extracted end face edge and support column edge, and calculate the angle between the two lines using the vector angle formula to obtain the actual angle between the support column and the reference plane.

[0071] The embodiments of this application can extract the end face edge information of transparent thin-walled structural components and the support column edge information of adjustment components, and calculate the actual included angle by combining edge extraction and axis fitting algorithms, thereby solving the problem of difficult boundary identification of transparent thin-walled structures, avoiding errors caused by manual interpretation, and improving the calculation accuracy and detection reliability of angle analysis.

[0072] Specifically, it can be combined with Figures 2 to 4 As shown, the working principle of the angle analysis device for the transparent thin-walled structure in this application is explained in detail with a specific embodiment.

[0073] like Figure 2 As shown, taking a quartz hemispherical resonator microshell as an example, the embodiments of this application may include: a CCD camera 201, a one-dimensional moving stage 202, a two-dimensional moving stage 203, a sample device 204, and a light source 205.

[0074] First, in this embodiment, the CCD camera 201 can be mounted on a one-dimensional moving stage 202, and the sample device 204 can be mounted on a two-dimensional moving stage 203. Next, the light source 205 is turned on and its direction adjusted to ensure that the sample device 204 is within the imaging range of the CCD camera 201, so that the CCD camera 201, the sample device 204, and the light source 205 are on the same horizontal axis. Subsequently, by adjusting the focal length of the one-dimensional moving stage 202 and the CCD camera 201, the focus of the CCD camera 201 is accurately focused on the sample device 204, ensuring the accuracy of image acquisition.

[0075] like Figure 3 As shown, the embodiments of this application may include: a sample support rod 301, an adjustable pitch angle 302, an adjustable tilt angle 303, a support rod 304, a glass support 305, a parallel glass tube 306, a horizontal support rod 307, a pitch stage 308, and a sample stage base 309.

[0076] Specifically, the parallel glass tube 306 is first placed on the sample device 204, ensuring that the center of the parallel glass tube 306 is aligned with the center of the three-point support column of the sample support rod 301. In this way, the parallel glass tube 306 becomes the housing structure supporting the microshell. By precisely aligning the center of the parallel glass tube 306 between the three support points, it is ensured that the shell can be stably inverted inside the parallel glass tube 306.

[0077] Subsequently, the CCD camera 201 acquires an image of the end face of the parallel glass tube 306. The focal length is adjusted so that the front and rear ends of the parallel glass tube 306 completely overlap in the CCD image, indicating that the end face of the parallel glass tube 306 is horizontal at this time. This establishes a horizontal baseline and provides an accurate reference for subsequent angle measurements.

[0078] like Figure 4 As shown, by adjusting the focal length and focusing on the edge of the micro-shell support column, two horizontal baselines are obtained in the image. These two baselines intersect the edge of the micro-shell support column. By connecting the midpoint of the intersection of the two baselines and the edge of the support column, the position of the support column axis can be determined. At this point, the angle between the horizontal baseline and the support column axis can be measured.

[0079] Furthermore, to ensure that the axis of the support column is perpendicular to the horizontal plane in space, dual-angle observation measurements at 0 degrees and 90 degrees are performed. First, the position of the sample device 204, where the CCD camera 201 is observing the sample, is marked as the 0-degree position. By adjusting the pitch and tilt angles of the sample device 204, the included angle reaches 90° ± 0.02°. Then, the sample device 204 is rotated 90 degrees relative to the 0-degree position of the CCD camera 201, and the pitch and tilt angles of the sample device 204 are adjusted again to achieve an included angle of 90° ± 0.02°. Finally, the sample device 204 is adjusted back to the 0-degree position, ensuring that the included angle remains at 90° ± 0.02° at both the 0-degree and 90-degree positions. At this point, the axis of the support column is perpendicular to the horizontal reference plane in space.

[0080] During the adjustment process, specialized image processing software is used to automatically calculate the angle between the support column axis and the horizontal baseline. This calculation is based on precise extraction of image data, ensuring high accuracy of the measurement results.

[0081] Resin or paraffin is injected into the parallel glass tube 306 using a syringe, and curing is completed under continuous observation by the CCD camera 201. During curing, the angle change is monitored in real time, and fine-tuning is continued when the deviation exceeds a threshold of 0.02°. The angle is measured again after curing, and the error of repeated measurements is preferably no greater than ±0.02°.

[0082] The angle analysis device for transparent thin-walled structural components proposed in this application can acquire images of the transparent thin-walled structural components and adjust their spatial posture to calculate the angle between the support column and the reference plane. This achieves integrated real-time angle observation, dynamic adjustment, image fitting calculation, and in-situ fixation, enabling high-precision online calibration of the internal support structure angles of the transparent thin-walled structural components, thus improving structural assembly accuracy and manufacturing efficiency. This solves the problems in related technologies where the measurement process relies on offline image processing, making real-time feedback impossible and leading to uncorrected processing errors. Furthermore, the poor versatility and high cost of dedicated fixtures result in error accumulation from repeated clamping, making boundary identification of the transparent thin-walled structural components difficult, leading to low accuracy and efficiency of the support column angles and affecting product quality.

[0083] Next, referring to the accompanying drawings, a method for analyzing the angles of a transparent thin-walled structural component proposed according to an embodiment of this application is described.

[0084] Figure 5 This is a flowchart illustrating an angle analysis method for a transparent thin-walled structural component provided in an embodiment of this application.

[0085] like Figure 5 As shown, the angle analysis method for this transparent thin-walled structural component includes the following steps: In step S501, image information of the transparent thin-walled structural component is acquired.

[0086] In step S502, the spatial attitude of the transparent thin-walled structural component is adjusted until the preset calibration attitude is achieved.

[0087] In step S501, the actual angle between the support column and the reference plane of the calibrated transparent thin-walled structure is calculated based on the image information.

[0088] Optionally, in one embodiment of this application, adjusting the spatial attitude of the transparent thin-walled structure until a preset calibration attitude is achieved includes: adjusting the pitch and tilt angles of the transparent thin-walled structure to determine the spatial attitude; and adjusting the position and attitude of the support column of the transparent thin-walled structure relative to the horizontal baseline.

[0089] Optionally, in one embodiment of this application, calculating the actual included angle between the support column and the reference plane of the calibrated transparent thin-walled structure based on image information includes: extracting the end face edge information of the transparent thin-walled structure based on image information; extracting the support column edge information of the adjustment member; and calculating the actual included angle based on the end face edge information and the support column edge information.

[0090] It should be noted that the foregoing explanation of the angle analysis device embodiment for transparent thin-walled structural components also applies to the angle analysis method for transparent thin-walled structural components in this embodiment, and will not be repeated here.

[0091] The angle analysis method for transparent thin-walled structural components proposed in this application can acquire images of the transparent thin-walled structural components and adjust their spatial posture to calculate the angle between the support column and the reference plane. This achieves integrated real-time observation, dynamic adjustment, image fitting calculation, and in-situ fixation of the angle, enabling high-precision online calibration of the internal support structure angle of the transparent thin-walled structural components, thus improving structural assembly accuracy and manufacturing efficiency. This solves the problems in related technologies where the measurement process relies on offline image processing, making real-time feedback impossible and resulting in uncorrected processing errors. Furthermore, the poor versatility and high cost of dedicated fixtures lead to error accumulation from repeated clamping, making boundary identification of the transparent thin-walled structural components difficult, resulting in low accuracy and efficiency of the support column angle and affecting product quality.

[0092] Figure 6 A schematic diagram of the structure of an electronic device provided in an embodiment of this application. The electronic device may include: The memory 601, the processor 602, and the computer program stored on the memory 601 and capable of running on the processor 602.

[0093] When the processor 602 executes the program, it implements the angle analysis method for the transparent thin-walled structural component provided in the above embodiments.

[0094] Furthermore, electronic devices also include: Communication interface 603 is used for communication between memory 601 and processor 602.

[0095] The memory 601 is used to store computer programs that can run on the processor 602.

[0096] The memory 601 may include high-speed RAM memory, and may also include non-volatile memory, such as at least one disk storage device.

[0097] If the memory 601, processor 602, and communication interface 603 are implemented independently, then the communication interface 603, memory 601, and processor 602 can be interconnected via a bus to complete communication between them. The bus can be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, or an Extended Industry Standard Architecture (EISA) bus, etc. The bus can be divided into address bus, data bus, control bus, etc. For ease of representation, Figure 6The bus is represented by a single thick line, but this does not mean that there is only one bus or one type of bus.

[0098] Optionally, in a specific implementation, if the memory 601, processor 602, and communication interface 603 are integrated on a single chip, then the memory 601, processor 602, and communication interface 603 can communicate with each other through an internal interface.

[0099] The processor 602 may be a central processing unit (CPU), an application specific integrated circuit (ASIC), or one or more integrated circuits configured to implement the embodiments of this application.

[0100] This application also provides a non-volatile computer-readable storage medium storing a computer program that, when executed by a processor, implements the above-described angle analysis method for transparent thin-walled structures.

[0101] This application also provides a computer program product storing a computer program that, when executed by a processor, implements the above-described angle analysis method for transparent thin-walled structural components.

[0102] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of this application. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. Moreover, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of different embodiments or examples.

[0103] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, "N" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0104] Any process or method described in the flowchart or otherwise herein can be understood as representing a module, segment, or portion of code comprising one or N executable instructions for implementing custom logic functions or processes, and the scope of the preferred embodiments of this application includes additional implementations in which functions may be performed not in the order shown or discussed, including substantially simultaneously or in reverse order depending on the functions involved, as should be understood by those skilled in the art to which embodiments of this application pertain.

[0105] The logic and / or steps represented in the flowchart or otherwise described herein, for example, can be considered as a sequenced list of executable instructions for implementing logical functions, and can be embodied in any computer-readable medium for use by, or in conjunction with, an instruction execution system, apparatus, or device (such as a computer-based system, a processor-included system, or other system that can fetch and execute instructions from, an instruction execution system, apparatus, or device). For the purposes of this specification, "computer-readable medium" can be any means that can contain, store, communicate, propagate, or transmit programs for use by, or in conjunction with, an instruction execution system, apparatus, or device. More specific examples (a non-exhaustive list) of computer-readable media include: an electrical connection having one or more wires (electronic device), a portable computer disk drive (magnetic device), random access memory (RAM), read-only memory (ROM), erasable and editable read-only memory (EPROM or flash memory), fiber optic devices, and portable optical disc read-only memory (CDROM). Alternatively, the computer-readable medium may be paper or other suitable media on which the program can be printed, since the program can be obtained electronically by optically scanning the paper or other medium, followed by editing, interpreting, or otherwise processing as necessary, and then stored in a computer memory.

[0106] It should be understood that the various parts of this application can be implemented using hardware, software, firmware, or a combination thereof. In the above embodiments, the N steps or methods can be implemented using software or firmware stored in memory and executed by a suitable instruction execution system. If implemented in hardware, as in another embodiment, it can be implemented using any one or more of the following techniques known in the art: discrete logic circuits having logic gates for implementing logical functions on data signals, application-specific integrated circuits (ASICs) having suitable combinational logic gates, programmable gate arrays (PGAs), field-programmable gate arrays (FPGAs), etc.

[0107] Those skilled in the art will understand that all or part of the steps of the methods in the above embodiments can be implemented by a program instructing related hardware. The program can be stored in a computer-readable storage medium, and when executed, the program includes one or a combination of the steps of the method embodiments.

[0108] Furthermore, the functional units in the various embodiments of this application can be integrated into a processing module, or each unit can exist physically separately, or two or more units can be integrated into a module. The integrated module can be implemented in hardware or as a software functional module. If the integrated module is implemented as a software functional module and sold or used as an independent product, it can also be stored in a computer-readable storage medium.

[0109] The storage medium mentioned above can be a read-only memory, a disk, or an optical disk, etc. Although embodiments of this application have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting this application. Those skilled in the art can make changes, modifications, substitutions, and variations to the above embodiments within the scope of this application.

Claims

1. An angle analysis device for a transparent thin-walled structure, characterized by include: Measuring components are used to acquire image information of transparent thin-walled structural components. An adjustment component is used to adjust the spatial orientation of the transparent thin-walled structural component until a preset calibration orientation is achieved. Fasteners are used to secure the calibrated transparent thin-walled structural component. An analysis component is used to calculate the actual angle between the support column and the reference plane of the calibrated transparent thin-walled structural component based on the image information.

2. The apparatus of claim 1, wherein, The measuring element includes: Light source and image acquisition equipment; The image acquisition device is mounted on the X-direction one-dimensional moving stage; A two-dimensional moving stage in the YZ direction is used, and the transparent thin-walled structural component is disposed on the sample stage of the two-dimensional moving stage in the YZ direction, so that the transparent thin-walled structural component is within the imaging range of the image acquisition device, thereby obtaining the image information.

3. The apparatus of claim 2, wherein, The center of the transparent thin-walled structural component is aligned with the center of the three-point support column of the sample stage.

4. The apparatus of claim 1, wherein, The adjusting element includes: The pitch and tilt adjustment platforms are used to adjust the pitch and tilt angles of the transparent thin-walled structural member to determine its spatial attitude. Multiple support columns are used to adjust the position and orientation of the support columns of the transparent thin-walled structure relative to the horizontal reference line.

5. The apparatus of claim 4, wherein, The plurality of support columns are the first to the third support columns, which are arranged in a three-point distribution.

6. The apparatus of claim 5, wherein, The analytical component includes: The first extraction device is used to extract the end face edge information of the transparent thin-walled structural component based on the image information; The second extraction device is used to extract the edge information of the support column of the adjustment member; A computing device is used to calculate the actual included angle based on the end face edge information and the support column edge information.

7. A method for angular analysis of transparent thin-walled structural components, characterized in that, Using the apparatus according to any one of claims 1-6, the method comprises the following steps: Acquire image information of the transparent thin-walled structural component; Adjust the spatial orientation of the transparent thin-walled structural component until the preset calibration orientation is achieved; The actual angle between the support column and the reference plane of the calibrated transparent thin-walled structure is calculated based on the image information.

8. An electronic device, characterized in that, include: The memory, the processor, and the computer program stored in the memory and capable of running on the processor, the processor executing the program to implement the angle analysis method for transparent thin-walled structures as described in claim 7.

9. A non-volatile computer-readable storage medium having a computer program stored thereon, characterized in that, The program is executed by the processor to implement the angle analysis method for transparent thin-walled structures as described in claim 7.

10. A computer program product comprising a computer program, characterized in that, The computer program is executed to implement the angle analysis method for transparent thin-walled structural members as described in claim 7.

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