Partial discharge electric field strength determination method, apparatus, and nonvolatile storage medium

Abstract

This invention discloses a method, apparatus, and non-volatile storage medium for determining the electric field intensity of partial discharge. The method includes: constructing an electromagnetically induced transparency system in a cesium atom gas cell based on a preset detection laser and a preset coupling laser; determining the center frequency of the transparent window of the electromagnetically induced transparency system under partial discharge conditions by scanning the frequency of the preset coupling laser; applying a preset intensity electric field to the cesium atom gas cell to determine the frequency offset of the transparent window of the electromagnetically induced transparency system under the preset intensity electric field; acquiring the transmitted light intensity signal at the partial discharge occurrence point when partial discharge occurs; and determining the center frequency offset based on the transmitted light intensity signal. This invention solves the technical problems of traditional partial discharge detection methods, such as low sensitivity, poor interference immunity, inability to capture nanosecond transient electric fields, and the need for on-site calibration, leading to missed detections of early weak signals, high false alarm rates, and poor environmental adaptability.

Description

Technical Field

[0001] This invention relates to the field of partial discharge detection, and more specifically, to a method, apparatus, and non-volatile storage medium for determining the electric field strength of partial discharge. Background Technology

[0002] There is currently no effective solution to the technical problems of traditional partial discharge detection methods, such as low sensitivity, weak anti-interference, inability to accurately capture nanosecond-level transient electric field changes, reliance on on-site calibration, resulting in missed detection of weak early signals, lack of quantitative capability, high false alarm rate, and poor environmental adaptability. Existing technologies, whether ultra-high frequency, ultrasonic, or traditional optical methods, struggle to overcome the physical limits of weak electric field sensing. Although there is research on electric field sensing based on Rydberg atoms, a stable three-level EIT preparation system suitable for partial discharge scenarios in power equipment has not yet been constructed.

[0003] There is currently no effective solution to the above problems. Summary of the Invention

[0004] This invention provides a method, apparatus, and non-volatile storage medium for determining the electric field intensity of partial discharge, at least to solve the technical problems of traditional partial discharge detection methods, such as low sensitivity, weak anti-electromagnetic interference capability, inability to accurately capture nanosecond-level transient electric field changes, reliance on on-site self-calibration, resulting in missed detection of early weak discharge signals, lack of quantitative measurement, low measurement accuracy, and difficulty in adapting to complex power environments.

[0005] According to one aspect of the present invention, a method for determining the intensity of a partial discharge electric field is provided, comprising: constructing an electromagnetically induced transparency system in a cesium atom gas chamber based on a preset detection laser and a preset coupling laser, wherein the cesium atoms in the cesium atom gas chamber are in the Rydberg state, and the cesium atom gas chamber is located within a preset distance around the partial discharge occurrence point; in the absence of partial discharge, scanning the frequency of the preset coupling laser to determine the center frequency of the transparent window of the electromagnetically induced transparency system under the absence of partial discharge; applying a preset intensity electric field to the cesium atom gas chamber to determine the frequency offset of the transparent window of the electromagnetically induced transparency system under the preset intensity electric field; in the case of partial discharge at the occurrence point, acquiring the transmitted light intensity signal of the partial discharge occurrence point; determining the center frequency offset of the transparent window corresponding to the electromagnetically induced transparency system based on the transmitted light intensity signal; and determining the intensity of the partial discharge electric field based on the center frequency offset of the transparent window under partial discharge, the center frequency of the transparent window under the absence of partial discharge, and the center frequency offset of the transparent window under the preset intensity electric field.

[0006] Optionally, in the absence of partial discharge, the center frequency of the transparent window of the electromagnetically induced transparency system is determined by scanning the frequency of a preset coupling laser, including: gradually adjusting the frequency of the preset coupling laser and recording the light intensity changes in the cesium atom gas cell in the absence of partial discharge; determining the electromagnetically induced transparency spectral curve based on the light intensity changes; determining the peak position of the transparent window of the electromagnetically induced transparency system based on the region with the highest transmittance in the electromagnetically induced transparency spectral curve; and determining the center frequency of the transparent window in the absence of partial discharge based on the frequency of the preset coupling laser corresponding to the peak position.

[0007] Optionally, applying a preset intensity electric field to the cesium atom gas chamber and determining the frequency offset of the transparent window of the electromagnetically induced transparency system under the preset intensity electric field includes: setting a parallel plate electrode structure outside the cesium atom gas chamber to apply the preset intensity electric field, wherein the direction of the preset intensity electric field is perpendicular to the propagation direction of the preset probe laser and the preset coupling laser; while keeping the frequency of the preset probe laser constant, gradually adjusting the frequency of the preset coupling laser to determine the transmission spectrum of the electromagnetically induced transparency system; and determining the frequency offset of the transparent window under the preset intensity electric field based on the transmission spectrum and the center frequency of the transparent window under the condition of no partial discharge.

[0008] Optionally, the process involves repeatedly adjusting the frequency of the preset coupling laser while keeping the preset detection laser frequency constant to determine the transmission spectrum of the electromagnetically induced transparent system, thereby determining multiple transmission spectra; based on the multiple transmission spectra and the center frequency of the transparent window under no partial discharge conditions, determining the candidate frequency offset corresponding to each of the multiple transmission spectra; and based on the candidate frequency offset corresponding to each of the multiple transmission spectra, determining the frequency offset of the transparent window under a preset intensity electric field.

[0009] Optionally, the partial discharge electric field strength is determined based on the center frequency offset of the transparent window under partial discharge conditions, the center frequency of the transparent window under no partial discharge conditions, and the center frequency offset of the transparent window under a preset intensity electric field. This includes: comparing the center frequency offset of the transparent window under partial discharge conditions with the center frequency of the transparent window under no partial discharge conditions to determine the frequency change; determining a proportional relationship based on the frequency change and the center frequency offset of the transparent window under a preset intensity electric field; and determining the partial discharge electric field strength based on the proportional relationship and the electric field strength corresponding to the preset intensity electric field.

[0010] Optionally, the wavelength of the detection laser is preset to 852 nanometers, and the wavelength of the coupling laser is preset to 509 nanometers.

[0011] According to another aspect of the present invention, a device for determining the intensity of a partial discharge electric field is also provided, comprising: a construction module, configured to construct an electromagnetically induced transparency system in a cesium atom gas cell based on a preset detection laser and a preset coupling laser, wherein the cesium atoms in the cesium atom gas cell are in the Rydberg state and the cesium atom gas cell is located within a preset distance around the partial discharge occurrence point; a first determination module, configured to scan the frequency of the preset coupling laser to determine the center frequency of the transparent window of the electromagnetically induced transparency system in the absence of partial discharge; a second determination module, configured to apply a preset intensity electric field to the cesium atom gas cell to determine the frequency offset of the transparent window of the electromagnetically induced transparency system under the preset intensity electric field; a collection module, configured to collect the transmitted light intensity signal of the partial discharge occurrence point when the partial discharge occurrence point is experiencing partial discharge; a third determination module, configured to determine the center frequency offset of the transparent window corresponding to the electromagnetically induced transparency system based on the transmitted light intensity signal; and a fourth determination module, configured to determine the intensity of the partial discharge electric field based on the center frequency offset of the transparent window under partial discharge, the center frequency of the transparent window in the absence of partial discharge, and the center frequency offset of the transparent window under the preset intensity electric field.

[0012] According to another aspect of the present invention, a non-volatile storage medium is also provided, the non-volatile storage medium including a stored program, wherein, when the program is running, the device where the non-volatile storage medium is located is controlled to execute any of the above-described methods for determining the partial discharge electric field intensity.

[0013] According to another aspect of the present invention, a computer device is also provided, the computer device including a processor, the processor being configured to run a program, wherein the program executes any of the above-described methods for determining the partial discharge electric field intensity.

[0014] According to another aspect of the present invention, a computer program product is also provided, including a computer program that, when executed by a processor, implements any of the above-described methods for determining the partial discharge electric field intensity.

[0015] In this embodiment of the invention, a method for determining the electric field intensity of partial discharge is employed. An electromagnetically induced transparency system is constructed within a cesium atom gas chamber based on a preset detection laser and a preset coupling laser. The cesium atoms in the cesium atom gas chamber are in the Rydberg state, and the cesium atom gas chamber is located within a preset distance surrounding the partial discharge occurrence point. In the absence of partial discharge, the frequency of the preset coupling laser is scanned to determine the center frequency of the transparent window of the electromagnetically induced transparency system under this condition. A preset intensity electric field is applied to the cesium atom gas chamber to determine the frequency offset of the transparent window of the electromagnetically induced transparency system under this preset intensity electric field. When partial discharge occurs at the occurrence point, the transmitted light intensity signal at the occurrence point is collected. Based on the transmitted light intensity signal, the electromagnetically induced transparency system is determined. The transparent window center frequency offset corresponding to the system is used to determine the intensity of the partial discharge electric field. Based on the transparent window center frequency offset under partial discharge conditions, the transparent window center frequency under no partial discharge conditions, and the transparent window center frequency offset under a preset intensity electric field, the high-sensitivity quantum sensing and precise quantitative measurement of the electric field based on the Rydberg state of the three-level cesium atom are achieved. This improves the accuracy of the electric field measurement of partial discharge and solves the technical problems of traditional partial discharge detection methods, such as low sensitivity, weak anti-electromagnetic interference ability, inability to accurately capture nanosecond-level transient electric field changes, reliance on on-site self-calibration, resulting in missed detection of early weak discharge signals, lack of quantitative measurement, low measurement accuracy, and difficulty in adapting to complex power environments. Attached Figure Description

[0016] The accompanying drawings, which are included to provide a further understanding of the invention and form part of this application, illustrate exemplary embodiments of the invention and, together with their description, serve to explain the invention and do not constitute an undue limitation thereof. In the drawings:

[0017] Figure 1 A hardware block diagram of a computer terminal for implementing a method for determining the electric field intensity of partial discharge is shown.

[0018] Figure 2 This is a flowchart illustrating the method for determining the partial discharge electric field intensity according to an embodiment of the present invention;

[0019] Figure 3 This is a schematic diagram of a preparation system based on Rydberg atoms (a three-level system) according to an optional embodiment of the present invention;

[0020] Figure 4 This is an EIT spectrum under the action of an electrostatic field provided by an optional embodiment of the present invention;

[0021] Figure 5 This is a three-level diagram of the EIT effect based on cesium atoms provided by an optional embodiment of the present invention;

[0022] Figure 6 This is a structural block diagram of a partial discharge electric field intensity determination device provided according to an embodiment of the present invention. Detailed Implementation

[0023] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of the present invention.

[0024] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this invention are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of the invention described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover a non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0025] According to an embodiment of the present invention, a method embodiment for determining the electric field intensity of partial discharge is provided. It should be noted that the steps shown in the flowchart in the accompanying drawings can be executed in a computer system such as a set of computer-executable instructions. Furthermore, although a logical order is shown in the flowchart, in some cases, the steps shown or described may be executed in a different order than that shown here.

[0026] The methods and embodiments provided in this application can be executed on mobile terminals, computer terminals, or similar computing devices. Figure 1 A hardware block diagram of a computer terminal for implementing a method for determining the electric field intensity of partial discharge is shown. Figure 1 As shown, the computer terminal 10 may include one or more processors (shown as 102a, 102b, ..., 102n in the figure) (the processor may include, but is not limited to, a microprocessor MCU or a programmable logic device FPGA, etc.) and a memory 104 for storing data. In addition, it may also include: a display, an input / output interface (I / O interface), a universal serial bus (USB) port (which may be included as one of the ports of a BUS bus), a network interface, a power supply, and / or a camera. Those skilled in the art will understand that... Figure 1 The structure shown is for illustrative purposes only and does not limit the structure of the aforementioned electronic device. For example, computer terminal 10 may also include... Figure 1 The more or fewer components shown, or having the same Figure 1 The different configurations shown.

[0027] It should be noted that the aforementioned one or more processors and / or other data processing circuits are generally referred to herein as "data processing circuits". These data processing circuits may be embodied, in whole or in part, in software, hardware, firmware, or any other combination thereof. Furthermore, the data processing circuits may be a single, independent processing module, or may be integrated, in whole or in part, into any other element within the computer terminal 10. As involved in the embodiments of this application, the data processing circuits serve as a processor control mechanism (e.g., selection of a variable resistor termination path connected to an interface).

[0028] The memory 104 can be used to store software programs and modules of application software, such as the program instructions / data storage device corresponding to the partial discharge electric field intensity determination method in this embodiment of the invention. The processor executes various functional applications and data processing by running the software programs and modules stored in the memory 104, thereby realizing the partial discharge electric field intensity determination method of the above-mentioned application. The memory 104 may include high-speed random access memory, and may also include non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some instances, the memory 104 may further include memory remotely located relative to the processor, and these remote memories can be connected to the computer terminal 10 via a network. Examples of the above-mentioned networks include, but are not limited to, the Internet, corporate intranets, local area networks, mobile communication networks, and combinations thereof.

[0029] The display can be, for example, a touchscreen liquid crystal display (LCD) that allows the user to interact with the user interface of the computer terminal 10.

[0030] Figure 2 This is a flowchart illustrating the method for determining the partial discharge electric field intensity according to an embodiment of the present invention, as shown below. Figure 2 As shown, the method includes the following steps:

[0031] Step S202: Based on the preset detection laser and the preset coupling laser, an electromagnetically induced transparent system is constructed in the cesium atom gas chamber, wherein the cesium atoms in the cesium atom gas chamber are in the Rydberg state, and the cesium atom gas chamber is located within a preset distance around the partial discharge occurrence point.

[0032] In this step, the wavelength of the probe laser is preset to 852 nm to excite cesium atoms from the ground state to an intermediate state; the wavelength of the coupling laser is preset to 509 nm to further excite the cesium atoms from the intermediate state to the Rydberg state with principal quantum number n=72. This energy level has an extremely large electric dipole moment and a very strong Stark response—its energy level shift is proportional to the fourth power of the applied electric field, making it one of the most field-sensitive atomic systems known. Both laser beams are linearly polarized, with strictly consistent polarization directions to ensure perfect matching with the magnetic quantum number selection rule of cesium atoms, maximizing excitation efficiency while suppressing non-resonant background signals.

[0033] Two laser beams are precisely overlapped in a reverse-propagation manner within a cesium atom chamber, forming a spatially symmetrical and time-synchronized two-photon interference field. This geometry not only enhances the coupling strength between the light field and atoms but also effectively counteracts the disturbances to the electromagnetically induced transparent window (EIT window) caused by laser frequency drift and intensity fluctuations, giving the transparent window extremely high signal-to-noise ratio and long-term stability. The chamber is filled with low-density cesium vapor, and with the help of a constant temperature control unit, temperature fluctuations are controlled within ±0.1℃, significantly reducing Doppler broadening and collision broadening, ensuring that the EIT resonance peak has a natural linewidth at the sub-megahertz level, laying the physical foundation for the accurate detection of subsequent subtle frequency shifts.

[0034] The cesium atom gas chamber can be installed at a predetermined distance of 2 centimeters around the point of partial discharge. This location is not arbitrarily chosen, but rather optimized based on a combination of electromagnetic field spatial decay model and quantum response threshold simulation: at this distance, the nanosecond-level transient electric field generated by partial discharge can still penetrate the gas chamber shell with sufficient intensity, acting on Rydberg atoms and inducing energy level shifts detectable by EIT spectroscopy; simultaneously, this distance effectively avoids the direct damage risks to the optical window from strong electric arcs, ionized gases, and electromagnetic radiation, achieving "non-contact, non-destructive, and highly safe" in-situ sensing. The gas chamber is wrapped with a high-permeability magnetic shielding layer, leaving only the laser incident and probe light output channels, enabling the system to operate stably even in environments with strong electromagnetic interference—external interference signals can only affect electronic equipment but cannot penetrate the quantum state of atoms, truly achieving the unique advantage of "atomic immunity to electromagnetic noise."

[0035] After this construction is completed, the cesium atom ensemble is stably maintained in the 72D5 / 2 Rydberg state, with its valence electron orbital radius approaching the micrometer scale, located at the "quantum edge" of the atomic nucleus. At this point, the presence of the EIT transparent window indicates that the system is in a coherent equilibrium state, and any disturbance of the external electric field will disrupt this equilibrium, causing measurable changes in the window's center frequency, depth, or linear shape. Therefore, the EIT system is no longer a passive optical element, but an active, real-time responsive quantum sensing unit that requires no power supply.

[0036] The system constructed in this step does not rely on capacitive coupling, does not introduce metal probes, is not grounded, and does not shield high voltage. It can solve the technical problems of inaccurate measurement results caused by system disturbances, signal distortion, and installation complexity due to the introduction of sensors in traditional methods. It is the fundamental premise for achieving the three core advantages of high sensitivity, strong anti-interference, and no need for on-site calibration.

[0037] Step S204: In the absence of partial discharge, scan the frequency of the preset coupling laser to determine the center frequency of the transparent window of the electromagnetically induced transparent system under the condition of no partial discharge.

[0038] In this step, under the baseline condition that no partial discharge occurs and the environment is in a state without an external electric field, the frequency of the probe laser is kept stably locked to cesium atom 6. up to 6 The transition line is simultaneously adjusted using a preset 509nm coupling laser frequency via continuous frequency sweeping. During this process, Rydberg state atoms within the cesium atom chamber form a quantum coherent superposition under two-photon drive, and the system exhibits a typical electromagnetically induced transparency effect. This is manifested by a significant increase in the intensity of the probe light transmission at a specific coupling frequency, forming a clear, narrow-band "transparent window." The center of this transparent window corresponds to the precise resonance condition between the ground state and the Rydberg state without disturbance. Figure 3 This is a schematic diagram of a preparation system based on Rydberg atoms (a three-level system) according to an optional embodiment of the present invention, as shown below. Figure 3 As shown, the window was obtained by real-time acquisition of the light intensity changes of the probe light using a photodetector. Its stable morphology and high signal-to-noise ratio indicate successful Rydberg state preparation and that the system is in a highly coherent state. The center frequency of this transparent window was recorded as the reference frequency of the system in the absence of partial discharge. This reference value will serve as the reference zero point for subsequent detection of discharge electric field disturbances, providing a reliable starting scale for judging the frequency shift caused by the electric field and ensuring the repeatability and quantitative basis of subsequent measurements.

[0039] Step S206: Apply a preset intensity electric field to the cesium atom gas cell and determine the frequency offset of the transparent window of the electromagnetically induced transparent system under the preset intensity electric field.

[0040] In this step, to establish the quantitative response relationship of the electromagnetically induced transparency system to an electric field, a stable standard electric field of known strength is applied to the cesium atom gas cell, based on the center frequency of the transparent window obtained without an external electric field. This electric field is generated by a precisely controlled parallel plate electrode system, and its field strength is confirmed by a calibration device to ensure repeatability and accuracy. After applying this standard electric field, the coupling laser frequency is continuously scanned to reacquire the transmission spectrum of the electromagnetically induced transparency system. Figure 4 This is an EIT spectrum under the influence of an electrostatic field, provided by an optional embodiment of the present invention, such as... Figure 4As shown in the figure, this visually illustrates that under the action of steady-state electric fields of different intensities, the center frequency of the EIT transparent window undergoes a linear shift, while the peak shape remains symmetrical, sharp, and distortion-free. This indicates that the Rydberg state energy levels undergo uniform shift dominated by the Stark effect, while the ground state and intermediate state energy levels remain largely undisturbed. Therefore, the two-photon resonance condition manifests only as a frequency shift, rather than spectral broadening or splitting. By accurately comparing the center frequencies of the transparent window before and after the application of the electric field, the frequency shift corresponding to the standard electric field is calculated. This shift directly reflects the response sensitivity of the Rydberg atom to the electric field, providing a reliable calibration parameter for subsequently inferring the unknown electric field intensity based on the frequency shift of the transparent window in real partial discharge scenarios. This achieves a reversible mapping from optical frequency shift signals to electric field intensity, which is a core step in realizing accurate quantitative measurement of weak electric fields.

[0041] Step S208: When partial discharge occurs at the partial discharge point, the transmitted light intensity signal at the partial discharge point is collected.

[0042] In this step, the system enters the real-time monitoring phase. When a partial discharge occurs inside the power equipment, the resulting nanosecond-level transient electric field spreads outwards at the speed of light, acting on a cesium atom gas chamber pre-deployed 2 centimeters around the discharge point. At this time, the cesium atoms in the Rydberg state with a high principal quantum number n=72 within the gas chamber, due to the extremely dispersed valence electron orbitals and extremely weak binding to the atomic nucleus, exhibit a sensitivity to the applied electric field that is more than ten thousand times greater than that of conventional atomic systems. The instantaneous disturbance of the partial discharge electric field will directly change the Stark shift of the Rydberg level, disrupting the quantum coherence balance of the original electromagnetically induced transparency (EIT) system, resulting in a weak but measurable instantaneous change in the transmitted light intensity of the probe laser.

[0043] The acquisition module operates continuously with ultra-high temporal resolution, using a high-sensitivity photodetector to continuously sample the transmission intensity of the 852nm probe light at a sampling frequency on the order of GHz, with a temporal resolution better than 1 ns. This ensures the complete capture of the rising edge, peak value, and decay of the partial discharge pulse. The photodetector employs a low-noise avalanche structure, possessing picowatt-level light intensity detection capability. It can identify weak signals with transmittance changes as low as parts per million caused by Rydberg level shifts, even under background light intensity fluctuations of less than 0.1%.

[0044] In this process, the probe beam interacts with the atomic gas chamber only through an optical path, and all electrical signal conversions are completed at the optical receiving end, far from the high-voltage area. This fundamentally eliminates the signal distortion, grounding loop interference, or safety risks that may be caused by the introduction of metal conductors in traditional UHF or capacitively coupled sensors. Simultaneously, the acquisition system integrates adaptive gain control and digital notch filtering modules to suppress non-target noise in real time, such as power frequency interference from substations, switching operation radiation, and laser source intensity drift, retaining only the transmitted light intensity variation component dominated by the atomic quantum state response.

[0045] The transmitted light intensity signal is not merely used to determine the presence or absence of partial discharge, but rather to truly reflect the dynamic response of the EIT system under electric field disturbances. When partial discharge occurs, its transient electric field acts on Rydberg atoms, causing a shift in the center frequency or a change in the spectral profile of the EIT transparent window, which in turn leads to a measurable instantaneous change in the intensity of the probe light transmission. The time-domain waveforms of these intensity changes, including rise edge characteristics, peak amplitude, duration, and repetition period, directly correspond to the physical characteristics of the discharge event, such as pulse intensity, occurrence frequency, and evolutionary morphology. Through high-temporal resolution acquisition and waveform analysis, the system can distinguish different types of discharge behavior, such as floating potential discharge, flashover of insulating surfaces, or internal air gap breakdown. This signal originates from the direct response of atomic quantum states to the electric field, and its variation is determined by the Stark effect of the Rydberg state, possessing physical traceability. Therefore, the transmitted light intensity sequence obtained in this step is a direct observational basis for realizing early identification and feature recognition of weak discharges, representing a substantial advancement in the transformation of partial discharge detection from traditional electrical induction to in-situ electric field sensing based on quantum effects.

[0046] Step S210: Based on the transmitted light intensity signal, determine the center frequency offset of the transparent window corresponding to the electromagnetically induced transparency system.

[0047] In this step, based on the acquired time-domain signal of transmitted light intensity during partial discharge, frequency-domain analysis is performed on the response of the electromagnetically induced transparency system (EIT) to determine the offset of its transparent window center frequency relative to the reference state. This analysis process uses high-speed data acquisition and Fourier transform algorithms to convert transient light intensity fluctuations into corresponding spectral characteristics, thereby identifying the center frequency position of the EIT transparent window under partial discharge electric field disturbance. The core of this step lies in intelligently identifying the difference between the "reference window" and the "disturbance window." The system automatically calls the EIT system reference state as a reference and uses an adaptive peak positioning algorithm to accurately locate the new peak position of the EIT transparent window at the current moment near the known center frequency when there is no discharge. This algorithm is noise robust and can automatically distinguish between physical offsets caused by electric field disturbances and pseudo-signals caused by laser drift, temperature fluctuations, or electronic noise, retaining only frequency changes that conform to the physical laws of the Rydberg atom Stark effect. The calculation accuracy of the offset can reach tens of kilohertz, sufficient to identify quantum responses induced by electric fields on the order of microvolts per meter.

[0048] Furthermore, this step not only outputs a single offset value but also simultaneously generates the temporal evolution trajectory of the frequency offset, completely recording the entire process of the discharge pulse from triggering, development, to decay. This dynamic tracking capability enables the system not only to determine "whether a discharge has occurred" but also to identify the type and evolution trend of the discharge: steep and rapid offsets correspond to strong pulse discharges, slow drifts may indicate surface charge accumulation, and repetitive oscillations suggest periodic local breakdown. These characteristics are all encoded in the time-domain waveform of the frequency offset, providing rich information for subsequent discharge diagnosis.

[0049] The frequency offset output in this step is not a "relative change in signal strength," but a "quantum electric field response" with a clear physical meaning. The entire processing is completed within milliseconds, requiring no manual intervention, and can be embedded into a real-time monitoring system for cyclic operation. Its high stability, high anti-interference capability, and high resolution enable this system to accurately pinpoint the atomic quantum response triggered by each partial discharge event, even in substations with strong electromagnetic environments, multi-device interference, and complex background noise.

[0050] Step S212: Determine the intensity of the partial discharge electric field based on the center frequency offset of the transparent window under partial discharge conditions, the center frequency of the transparent window under no partial discharge conditions, and the center frequency offset of the transparent window under a preset intensity electric field.

[0051] In this step, based on the frequency offset of the transparent window center measured when partial discharge occurs, the reference frequency when there is no partial discharge, and the frequency offset response coefficient previously obtained under a standard electric field of known strength, the actual electric field strength corresponding to the current partial discharge is calculated through a linear proportional relationship. This calculation process does not rely on real-time calibration, but reuses the previously established and experimentally verified frequency offset-electric field strength mapping relationship. That is, the frequency offset caused by a unit electric field is used as a fixed conversion factor and applied to the frequency offset value caused by the current discharge disturbance. Since this conversion factor originates from the inherent physical response characteristics of the Rydberg atomic energy level under the Stark effect, it has high stability, good repeatability, and is not significantly affected by conventional interference factors such as ambient temperature and air pressure, thus maintaining consistency under different operating conditions. The system directly outputs the corresponding electric field strength value by dividing the frequency offset caused by the discharge by this preset conversion factor, achieving accurate quantification of the strength of the partial discharge. This method requires no additional sensors or on-site recalibration and can operate stably in complex electromagnetic environments, effectively supporting early warning and trend analysis of the insulation status of power equipment.

[0052] Through the above steps, it is possible to achieve highly sensitive, interference-resistant, and precise quantitative measurement of the weak transient electric field generated by partial discharge inside power equipment, without the need for on-site self-calibration.

[0053] As an optional embodiment, this can be achieved through the following steps: In the absence of partial discharge, scanning the frequency of a preset coupling laser to determine the center frequency of the transparent window of the electromagnetically induced transparency system under partial discharge conditions includes: gradually adjusting the frequency of the preset coupling laser and recording the light intensity changes in the cesium atom gas cell under partial discharge conditions; determining the electromagnetically induced transparency spectral curve based on the light intensity changes; determining the peak position of the transparent window of the electromagnetically induced transparency system based on the region with the highest transmittance in the electromagnetically induced transparency spectral curve; and determining the center frequency of the transparent window under partial discharge conditions based on the frequency of the preset coupling laser corresponding to the peak position.

[0054] Optionally, the probe laser is first stably locked at the transition frequency from the ground state to the intermediate state of cesium atoms. Then, the frequency of the coupling laser is slowly scanned within a preset range, while simultaneously recording the intensity change of the probe light after transmission through the cesium atom gas cell. With continuous adjustment of the coupling light frequency, the system exhibits typical electromagnetically induced transparency spectral characteristics: within a specific frequency range, the probe light transmittance significantly increases, forming a narrow and sharp transparent window. The appearance of this window stems from the satisfaction of the two-photon resonance condition between the ground state and the Rydberg state, with its transmission peak corresponding to the state with the strongest quantum interference destructive effect. By analyzing the recorded light intensity change curve, the region with the highest transmittance is identified, and the corresponding coupling laser frequency value is determined, which is the center frequency of the transparent window without an external electric field. This frequency serves as the reference point for all subsequent electric field response measurements, ensuring the system's high-precision identification capability against weak electric field disturbances.

[0055] As an optional embodiment, this can be achieved through the following steps: applying a preset intensity electric field to the cesium atom gas chamber and determining the frequency offset of the transparent window of the electromagnetically induced transparency system under the preset intensity electric field, including: setting a parallel plate electrode structure outside the cesium atom gas chamber to apply the preset intensity electric field, wherein the direction of the preset intensity electric field is perpendicular to the propagation direction of the preset probe laser and the preset coupling laser; while keeping the frequency of the preset probe laser constant, gradually adjusting the frequency of the preset coupling laser to determine the transmission spectrum of the electromagnetically induced transparency system; and determining the frequency offset of the transparent window under the preset intensity electric field based on the transmission spectrum and the center frequency of the transparent window under the condition of no partial discharge.

[0056] Optionally, a pair of precision-machined parallel plate electrodes are disposed outside the cesium atom gas chamber. Their structural arrangement ensures that the direction of the applied electric field is perpendicular to the propagation directions of the probe laser and the coupling laser, thus avoiding optical path disturbance and ensuring that the electric field acts uniformly on the Rydberg atoms in the gas chamber. This maintains the probe laser frequency consistently locked at the cesium atom 6. up to 6 Under the premise of the transition, the frequency of the coupled laser is slowly scanned, and the intensity change of the probe light passing through the atomic gas cell is simultaneously collected to obtain the electromagnetically induced transparent transmission spectrum under the action of the applied electric field. Compared with the reference spectrum without an electric field, the transparent window in this transmission spectrum is shifted as a whole, and its peak shape remains sharp and symmetrical without broadening or splitting. This indicates that the Rydberg energy levels undergo a uniform shift under the Stark effect, while the ground state and intermediate states are not significantly affected. By comparing the center position of the transparent window under this electric field with the reference center frequency determined without an electric field, the frequency shift can be accurately calculated. This shift directly reflects the quantum response characteristics of Rydberg atoms to electric fields of specific intensities, providing a key calibration basis for subsequently inferring the unknown electric field intensity based on the frequency shift in partial discharge scenarios, and realizing a reliable mapping from optical signals to electric field quantities.

[0057] As an optional embodiment, this can be achieved through the following steps: performing multiple steps to determine the transmission spectrum of the electromagnetically induced transparent system by gradually adjusting the frequency of the preset coupling laser while keeping the preset detection laser frequency constant, thereby determining multiple transmission spectra; determining the candidate frequency offset corresponding to each of the multiple transmission spectra based on the multiple transmission spectra and the center frequency of the transparent window under the condition of no partial discharge; and determining the frequency offset of the transparent window under the preset intensity electric field based on the candidate frequency offset corresponding to each of the multiple transmission spectra.

[0058] Optionally, while keeping the probe laser frequency constant, the coupled laser frequency is scanned multiple times independently, and the corresponding electromagnetically induced transparent transmission spectra are recorded to obtain a set of spectral data with slight differences. For each set of spectra, the corresponding frequency offset is calculated using its reference center frequency when there is no partial discharge, forming a set of candidate offset values. Subsequently, these candidate values ​​are fused using statistical methods, and the stable center value is taken as the final frequency offset, effectively suppressing random noise and system drift that may exist in a single measurement. This method does not rely on a single scan result, significantly enhancing the robustness and engineering applicability of the calibration data, and providing a more stable calibration basis for the subsequent high-precision inversion of the partial discharge electric field.

[0059] As an optional embodiment, the following steps can be used to determine the partial discharge electric field strength: based on the center frequency offset of the transparent window under partial discharge conditions, the center frequency of the transparent window under no partial discharge conditions, and the center frequency offset of the transparent window under a preset intensity electric field, the partial discharge electric field strength is determined, including: comparing the center frequency offset of the transparent window under partial discharge conditions with the center frequency of the transparent window under no partial discharge conditions to determine the frequency change; determining the proportional relationship based on the frequency change and the center frequency offset of the transparent window under the preset intensity electric field; and determining the partial discharge electric field strength based on the proportional relationship and the electric field strength corresponding to the preset intensity electric field.

[0060] Optionally, the center frequency of the transparent window measured when partial discharge occurs is compared with the reference frequency when there is no partial discharge, and the frequency change between the two is extracted. This change directly reflects the degree of disturbance of the Rydberg atomic energy level by the transient electric field of partial discharge. Subsequently, this frequency change is compared with the frequency offset pre-calibrated using a standard electric field of known intensity to establish a proportional relationship between the two. This proportional relationship stems from the linear physical characteristic of the Rydberg atom's response to an electric field, i.e., the frequency offset is proportional to the applied electric field strength, and this ratio remains stable under system operating conditions. Based on this proportional relationship, and combined with the known intensity value of the standard electric field, the actual electric field strength generated by the partial discharge can be directly calculated. This method does not require recalibration at the detection site; it only relies on a pre-completed calibration data to achieve real-time, quantitative evaluation of weak, transient discharge signals, significantly improving the system's on-site applicability and measurement consistency.

[0061] As an optional embodiment, this can be achieved through the following steps: preset the wavelength of the detection laser to 852 nanometers and preset the wavelength of the coupling laser to 509 nanometers.

[0062] Optionally, the wavelength of the probe laser is precisely set to 852 nm, which corresponds precisely to the allowed electric dipole transition spectral line between the ground state and intermediate excited state of cesium atoms. This wavelength has a narrow linewidth and high transition probability, making it an ideal choice for achieving efficient optical pumping and stable detection. The wavelength of the coupling laser is set to 509 nm, which corresponds to the two-photon transition path between the intermediate state and the high principal quantum number Rydberg state. This energy level combination exhibits extremely strong Stark effect response capability, and its excitation efficiency reaches an optimal balance under experimental conditions. The wavelength selection of the two lasers is not arbitrary but based on precise calculations and laboratory verification results of the cesium atom energy level structure. This ensures that the probe and coupling beams form perfect two-photon resonance conditions in the atomic gas cell, thereby maximizing the depth and sharpness of the transparent window of the electromagnetically induced transparency (EIT) effect. Furthermore, both 852nm and 509nm are wavelengths where commercially available tunable semiconductor lasers can easily achieve stable output. Combined with active frequency locking and temperature control technologies, frequency drift suppression can be achieved during long-term operation, ensuring high stability of the system even under complex temperature variations and electromagnetic environments in power field settings. This wavelength combination can also effectively avoid absorption peaks from atmospheric components such as water vapor and carbon dioxide, reducing signal attenuation during optical propagation and improving the system's feasibility in non-enclosed or semi-open monitoring scenarios. In practical deployments, this wavelength system, in conjunction with linearly polarized light and reverse transmission optical path design, significantly improves the uniformity and controllability of light-atom interactions. Figure 5 This is a three-level diagram of the EIT effect based on cesium atoms provided by an optional embodiment of the present invention, such as... Figure 5As shown in the figure, the transition paths corresponding to the 852nm probe light and the 509nm coupling light in the three-level cesium atom system are fully presented, and the interaction mechanism of the two in the quantum energy level structure is clearly pointed out, providing irreplaceable physical support and engineering basis for the selection of laser parameters in this embodiment.

[0063] It should be noted that, for the sake of simplicity, the foregoing method embodiments are all described as a series of actions. However, those skilled in the art should understand that the present invention is not limited to the described order of actions, because according to the present invention, some steps can be performed in other orders or simultaneously. Furthermore, those skilled in the art should also understand that the embodiments described in the specification are preferred embodiments, and the actions and modules involved are not necessarily essential to the present invention.

[0064] Through the above description of the embodiments, those skilled in the art can clearly understand that the method for determining the partial discharge electric field intensity according to the above embodiments can be implemented by means of software plus necessary general-purpose hardware platform. Of course, it can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) and includes several instructions to cause a terminal device (which may be a mobile phone, computer, server, or network device, etc.) to execute the methods described in the various embodiments of the present invention.

[0065] According to embodiments of the present invention, a partial discharge electric field intensity determination apparatus for implementing the above-described method for determining partial discharge electric field intensity is also provided. Figure 6 This is a structural block diagram of a partial discharge electric field intensity determination device provided according to an embodiment of the present invention, such as... Figure 6 As shown, the partial discharge electric field intensity determination device includes: a construction module 602, a first determination module 604, a second determination module 606, an acquisition module 608, a third determination module 610, and a fourth determination module 612. The partial discharge electric field intensity determination device will be described below.

[0066] Module 602 is used to construct an electromagnetically induced transparency (EIT) system within a cesium atom gas chamber based on a preset probe laser and a preset coupling laser. The cesium atoms in the gas chamber are in a Rydberg state, and the gas chamber is located within a preset distance from the partial discharge initiation point. Specifically, through the synergistic effect of the preset probe laser and the preset coupling laser, the cesium atoms in the gas chamber are efficiently excited to a Rydberg state with a high principal quantum number, forming a clear and stable electromagnetically induced transparency (EIT) quantum coherence window without external electric field disturbance. This module does not rely on external calibration or manual intervention; instead, it achieves continuous and reproducible preparation of the Rydberg atom state through precise laser frequency locking and optimized optical path design. The cesium atom gas chamber is positioned within a preset distance from the partial discharge initiation point. This distance, verified by both simulation and experiment, is 2 cm. This ensures that the nanosecond-level transient electric field generated by the partial discharge fully acts on the atom gas chamber while effectively avoiding direct damage to optical devices from strong electric arcs and electromagnetic radiation, achieving non-contact, highly safe in-situ sensing. The chamber is filled with low-pressure cesium vapor, and a constant-temperature control unit ensures stable atomic density, preventing spectral line broadening caused by thermal motion and maintaining high resolution of the EIT signal. The probe laser and coupling laser overlap in the chamber via reverse propagation, with consistent polarization directions, ensuring full coupling between the light field and the atomic ensemble and maximizing the excitation efficiency of Rydberg states. This module integrates laser frequency stabilization control, beam collimation correction, and background light suppression functions, automatically compensating for optical path offsets caused by ambient temperature fluctuations and mechanical micro-vibrations, ensuring the EIT transparent window maintains structural integrity and stable signal-to-noise ratio during long-term operation. Before and after partial discharge, the module continuously outputs a high-quality EIT spectral response, providing a high-fidelity original signal for subsequent electric field change detection. This construction process is entirely based on the principle of quantum coherence, with no moving mechanical parts, no high-voltage probe connection, and no need for grounding or shielding, truly realizing a novel detection form of "light as sensor." This is the physical basis for the invention's core advantages of high-sensitivity detection of weak electric fields, reliable identification under strong electromagnetic interference, and no need for on-site self-calibration.

[0067] The stable operation of this module enables the system to directly sense the quantum perturbation of the Rydberg level by the discharge electric field, rather than indirectly measuring current or electromagnetic radiation. This fundamentally distinguishes it from traditional ultra-high frequency or ultrasonic methods and opens up a new quantum sensing mode for monitoring the insulation status of power equipment.

[0068] The first determining module 604 is used to scan the frequency of a preset coupled laser to determine the center frequency of the transparent window of the electromagnetically induced transparency system under the condition of no partial discharge. Specifically, this module does not rely on an external calibration source or manual intervention, but achieves self-calibrating initial state locking through the system's own quantum response characteristics.

[0069] With the probe laser frequency stably locked to the cesium atom 6S¹ / ² to 6P³ / ² transition, the first determining module 604 drives the coupled laser to perform a narrow-range, high-resolution frequency step scan around 509 nm, simultaneously acquiring the intensity changes of the probe light passing through the cesium atom gas cell to generate a complete EIT transmission spectrum. Since there is no external electric field disturbance at this time, the Rydberg state energy level is in a naturally undisturbed state, and the EIT transparent window exhibits a sharp, symmetrical peak shape with an extremely high signal-to-noise ratio. The module integrates an adaptive peak detection algorithm, which automatically identifies and locks the center frequency of this window with sub-megahertz precision through local maximum fitting and background noise suppression, using it as the quantum reference point for the system's "zero electric field" state.

[0070] This frequency value not only characterizes the quantum resonance equilibrium point of the system under ideal conditions, but also carries comprehensive information on multiple system parameters such as laser frequency stability, atomic gas cell temperature uniformity, and optical path alignment accuracy. Once this reference frequency is recorded, all subsequent frequency shifts caused by electric field disturbances will use this as the absolute reference, ensuring the physical consistency and traceability of the measurement results. Module 604 automatically performs an initialization scan when the system starts, and then performs a rapid check before the start of each detection cycle to detect whether the system has drifted. If the reference frequency shift is detected to exceed the preset tolerance, the module will trigger an automatic relock mechanism to recalibrate the laser frequency, ensuring that the "zero point" never drifts during long-term system operation.

[0071] This process is entirely based on the inherent properties of quantum energy levels within atoms, without relying on any external electric field generators or standard sensors, truly realizing the absolute measurement concept of "using atoms as the ruler." The module's high stability and self-recovery capability are the core guarantees that this system can be deployed for a long time in harsh environments such as high-voltage substations without on-site self-calibration, marking a key leap in partial discharge detection from "empirical response" to "quantum benchmark sensing."

[0072] The second determining module 606 is used to apply a preset intensity electric field to the cesium atom gas cell and determine the frequency offset of the transparent window of the electromagnetically induced transparent system under the preset intensity electric field. Specifically, this module does not rely on traditional electric field probes or high-voltage sensors, but uses a high-purity parallel plate electrode structure to construct a uniform, controllable, and reproducible electrostatic field environment outside the gas cell. Its field strength accuracy can be calibrated to within 0.1%, ensuring the physical reliability of the calibration process.

[0073] When an electric field is applied, the module automatically controls a high-precision DC voltage source to apply a stable DC voltage to both sides of the cesium atom gas cell without interfering with the laser propagation path, forming a uniform electrostatic field perpendicular to the laser propagation direction. This electric field acts on the cesium atoms in the Rydberg state. Due to their extremely large valence electron orbital radius and extremely high polarizability, the energy level undergoes a significant Stark shift, resulting in a measurable shift in the center frequency of the EIT transparent window. The module simultaneously acquires the transmission spectrum of the probe light under this condition and accurately identifies the new center position of the transparent window by comparing it point-by-point with the reference spectrum without an electric field, thus calculating the frequency shift. This shift is not a single instantaneous value but is obtained through multiple cycles of application-release-reapplication. The system automatically eliminates spurious signals caused by temperature drift, laser noise, or mechanical vibration, retaining only the highly repeatable stable shift response. The frequency shift obtained in this way is essentially the quantum response "fingerprint" of the Rydberg atom to the electric field. It directly reflects the sensitivity characteristics of the system under a specific energy level structure and is the physical foundation for all subsequent partial discharge electric field inversions.

[0074] The calibration process of this module is completed once before system deployment, eliminating the need for repetitive operations in each test. Once calibrated, the offset is permanently established as the system's internal "quantum sensitivity coefficient," becoming the sole bridge connecting the observed frequency change with the actual electric field strength. The introduction of this module frees the system from the drawbacks of traditional testing methods, such as reliance on on-site calibration, susceptibility to environmental disturbances, and the need for frequent calibration. Its calibration results do not decay over time and are unaffected by electromagnetic interference, stemming from the universal physical constants of atomic energy levels, providing crucial support for the long-term stable operation of this invention in complex electrical environments.

[0075] The acquisition module 608 is used to acquire the transmitted light intensity signal at the partial discharge point when partial discharge occurs. Specifically, this module does not rely on traditional capacitor or inductor probes, but directly uses atoms as natural electric field sensors. Through subtle changes in photon flow, it indirectly captures the quantum state perturbation induced by the transient electric field of partial discharge. When partial discharge occurs inside electrical equipment, the nanosecond-level pulsed electric field it generates extends at the speed of light to the region where the cesium atom gas cell is located, acting on the cesium atoms in the Rydberg state, disrupting their original quantum coherent superposition state, causing a transient change in the transmission characteristics of the electromagnetically induced transparency (EIT) window—manifested as a slight drop in probe light intensity, spectral distortion, or center frequency shift. This module uses a high-speed photodetector as its core to continuously receive the 852nm probe light signal transmitted through the gas cell and convert it into a high-resolution electrical signal stream. The detector has a picowatt-level light intensity response capability, gigahertz-level bandwidth, and nanosecond-level response time. It can completely capture submicrosecond-level light intensity fluctuations caused by the Stark effect during partial discharge, ensuring that no early weak discharge characteristics are lost.

[0076] To ensure accurate signal reproduction, this module integrates a low-noise preamplifier circuit, digital filtering, and an automatic gain control unit. Even in environments with strong electromagnetic interference, it effectively suppresses interference sources such as power frequency noise, radio frequency radiation, and laser intensity drift, retaining only the EIT signal variation components directly related to the atomic quantum response. Simultaneously, the module's sampling frequency is synchronized with the system's scan rate, ensuring that the EIT spectral changes corresponding to each partial discharge pulse are completely recorded, forming a precise time-series mapping between "electric field—atomic response—optical signal."

[0077] This module has no electrical connection to high-voltage equipment and achieves non-contact sensing entirely through an optical path, fundamentally avoiding signal distortion or safety hazards that may be caused by sensors in traditional partial discharge detection. The transmitted light intensity signal it collects not only serves as an "indicator" of the discharge occurrence but also as a quantum-encoded carrier of key characteristics such as discharge intensity, rise time steepness, and duration. The module's high sensitivity and high temporal resolution enable the system to identify anomalies within the first microsecond after a discharge occurs, far earlier than the response window of ultra-high frequency or ultrasonic methods, providing a decisive time advantage for early warning of insulation defects.

[0078] The third determining module 610 is used to determine the center frequency shift of the transparent window corresponding to the electromagnetically induced transparency system based on the transmitted light intensity signal. Specifically, this module does not rely on manual interpretation or external reference sources, but automatically identifies the subtle structural evolution of the EIT spectrum under the action of a transient electric field through a built-in quantum signal intelligent decoding algorithm, and accurately extracts the deviation of its frequency response. During the partial discharge process, the electric field intensity sensed by the cesium atom gas cell changes rapidly in a pulse, causing a transient Stark shift in the Rydberg state energy level, which in turn causes the originally stable EIT transparent window to undergo a center frequency shift, spectral line broadening, or asymmetric distortion.

[0079] This module receives a high temporal resolution transmitted light intensity sequence from the acquisition module. First, it performs background noise suppression and baseline correction to eliminate interference from laser intensity drift, ambient light fluctuations, and electronic noise. Then, the module employs an adaptive sliding window fitting algorithm to fit each frame of spectral data to a Gaussian-Lorentz mixture model, automatically identifying the peak position of the EIT transparent window in the current state. This is then compared point-by-point with the discharge-free reference frequency recorded by the first determination module 304 to calculate the instantaneous frequency shift. This module possesses dynamic tracking capabilities: it can continuously output the temporal evolution trajectory of the frequency shift during the rising edge, peak, and decay phases of the discharge pulse, completely reconstructing the temporal characteristics of the partial discharge electric field. Its resolution reaches tens of kilohertz, sufficient to capture quantum-level response changes caused by microvolts per meter-level electric fields. More importantly, the module incorporates an adaptive threshold judgment mechanism, confirming a valid shift only when the EIT spectral shape change conforms to the physical laws of the Rydberg atom Stark response. This effectively filters out false signals caused by non-discharge factors such as mechanical vibration, temperature abrupt changes, or external electromagnetic pulses, significantly improving the reliability and anti-interference capability of the detection. The output of this module is not a single numerical value, but a multi-dimensional feature vector containing the magnitude of the offset, the rate of change, the duration, and the spectral distortion pattern, providing rich evidence for subsequent discharge type identification and severity assessment. Since this offset directly originates from the physical response of atomic quantum energy levels, it has a definite and calibrable linear relationship with the electric field strength. Therefore, the output of this module essentially "translates" the electromagnetic disturbance of partial discharge into quantum language, realizing a cross-domain mapping from classical electrical quantities to atomic quantum states.

[0080] The operation of this module is fully embedded in the system closed loop, requiring no manual intervention. It can complete the frequency shift analysis of a single discharge event within milliseconds, enabling the system to have real-time monitoring capabilities and providing a unique and reliable input for subsequent electric field strength estimation.

[0081] The fourth determining module 612 is used to determine the partial discharge electric field strength based on the center frequency offset of the transparent window under partial discharge conditions, the center frequency of the transparent window under no partial discharge conditions, and the center frequency offset of the transparent window under a preset intensity electric field. Specifically, this module constructs a closed-loop reasoning path from atomic energy level perturbation to electric field strength through the inherent linear response relationship of quantum physics. The module first calls the center frequency of the EIT transparent window in the no-discharge state recorded by the first determining module, which is the "zero-point reference" of the system in the natural quantum state; at the same time, it calls the frequency offset obtained by the second determining module when a standard electric field is applied, which is the "fingerprint" of the system's quantum response to a known electric field. These two sets of data together constitute the quantum sensitivity model inside the system, which no longer depends on any external electric field sensor or empirical formula, but is directly rooted in the Stark effect of the Rydberg state of cesium atoms: that is, the energy level shift is proportional to the applied electric field, and this proportional relationship is determined by the quantum structure of the atom itself, and has universality and stability.

[0082] When partial discharge occurs, the real-time frequency offset output by the third determination module is input to the fourth determination module. By comparing this real-time offset with the offset under a known standard electric field, the absolute intensity of the current partial discharge electric field is automatically derived with a linear proportional relationship. The entire process requires no fitting, no interpolation, and no manual threshold setting; it is entirely based on the quantum response proportional relationship established during the calibration phase, ensuring the physical consistency and traceability of the measurement results. This module has self-verification capabilities: if the real-time offset exceeds the calibration range, the module will automatically trigger an anomaly alarm, indicating possible system anomalies such as nonlinear response, anomalous atomic density, or laser lock-off; if the offset is extremely small but still higher than the system noise baseline, it is determined to be an early weak discharge, and the system will activate a high-sensitivity tracking mode to continuously record its evolution trend. In addition, the module can perform statistical analysis on the offsets of multiple discharge events to identify discharge frequency, repeatability, and energy accumulation characteristics, providing data support for judging insulation degradation trends.

[0083] The operation of this module marks a leap in partial discharge detection from "relative signal comparison" to "absolute physical quantity inversion." It completely eliminates the measurement uncertainties caused by differences in sensor sensitivity, changes in ambient temperature, and installation position deviations in traditional methods, enabling this system to achieve accurate quantitative assessment of early insulation defects with a sensitivity at the μV / m / √Hz level in complex electromagnetic environments.

[0084] It should be noted that the aforementioned construction module 602, first determining module 604, second determining module 606, acquisition module 608, third determining module 610, and fourth determining module 612 correspond to steps S202 to S212 in the embodiments. Multiple modules and their corresponding steps implement the same instances and application scenarios, but are not limited to the content disclosed in the above embodiments. It should also be noted that the aforementioned modules, as part of the device, can run on the computer terminal 10 provided in the embodiments.

[0085] Embodiments of the present invention may provide a computer device. Optionally, in this embodiment, the computer device may be located in at least one of a plurality of network devices in a computer network. The computer device includes a memory and a processor.

[0086] The memory can be used to store software programs and modules, such as the program instructions / modules corresponding to the partial discharge electric field intensity determination method and apparatus in this embodiment of the invention. The processor executes various functional applications and data processing by running the software programs and modules stored in the memory, thereby realizing the aforementioned partial discharge electric field intensity determination method. The memory may include high-speed random access memory, and may also include non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some instances, the memory may further include memory remotely located relative to the processor, and these remote memories can be connected to a computer terminal via a network. Examples of such networks include, but are not limited to, the Internet, corporate intranets, local area networks, mobile communication networks, and combinations thereof.

[0087] The processor can access information and application programs stored in the memory via a transmission device to execute the following steps: Constructing an electromagnetically induced transparency system in a cesium atom gas chamber based on a preset detection laser and a preset coupling laser, wherein the cesium atoms in the cesium atom gas chamber are in the Rydberg state, and the cesium atom gas chamber is located within a preset distance around the partial discharge occurrence point; Scanning the frequency of the preset coupling laser to determine the center frequency of the transparent window of the electromagnetically induced transparency system in the absence of partial discharge, without partial discharge; Applying a preset intensity electric field to the cesium atom gas chamber to determine the frequency offset of the transparent window of the electromagnetically induced transparency system under the preset intensity electric field; Acquiring the transmitted light intensity signal at the partial discharge occurrence point when partial discharge occurs; Determining the center frequency offset of the transparent window corresponding to the electromagnetically induced transparency system based on the transmitted light intensity signal; Determining the intensity of the partial discharge electric field based on the center frequency offset of the transparent window under partial discharge, the center frequency of the transparent window in the absence of partial discharge, and the center frequency offset of the transparent window under the preset intensity electric field.

[0088] Optionally, the processor may also execute program code for the following steps: Under conditions of no partial discharge, scanning the frequency of a preset coupling laser to determine the center frequency of the transparent window of the electromagnetically induced transparency system under conditions of no partial discharge, including: under conditions of no partial discharge, gradually adjusting the frequency of the preset coupling laser and recording the light intensity changes in the cesium atom gas cell; determining the electromagnetically induced transparency spectral curve based on the light intensity changes; determining the peak position of the transparent window of the electromagnetically induced transparency system based on the region with the highest transmittance in the electromagnetically induced transparency spectral curve; and determining the center frequency of the transparent window under conditions of no partial discharge based on the frequency of the preset coupling laser corresponding to the peak position.

[0089] Optionally, the processor may also execute program code for the following steps: applying a preset intensity electric field to the cesium atom gas chamber and determining the frequency offset of the transparent window of the electromagnetically induced transparency system under the preset intensity electric field, including: setting a parallel plate electrode structure outside the cesium atom gas chamber to apply the preset intensity electric field, wherein the direction of the preset intensity electric field is perpendicular to the propagation direction of the preset probe laser and the preset coupling laser; while keeping the frequency of the preset probe laser constant, gradually adjusting the frequency of the preset coupling laser to determine the transmission spectrum of the electromagnetically induced transparency system; and determining the frequency offset of the transparent window under the preset intensity electric field based on the transmission spectrum and the center frequency of the transparent window under the condition of no partial discharge.

[0090] Optionally, the processor may also execute program code for the following steps: performing multiple steps to determine the transmission spectrum of the electromagnetically induced transparent system by gradually adjusting the frequency of the preset coupling laser while keeping the preset detection laser frequency constant; determining multiple transmission spectra; determining the candidate frequency offset corresponding to each of the multiple transmission spectra based on the multiple transmission spectra and the center frequency of the transparent window under the condition of no partial discharge; and determining the frequency offset of the transparent window under the preset intensity electric field based on the candidate frequency offset corresponding to each of the multiple transmission spectra.

[0091] Optionally, the processor may also execute program code for the following steps: determining the partial discharge electric field strength based on the center frequency offset of the transparent window under partial discharge conditions, the center frequency of the transparent window under no partial discharge conditions, and the center frequency offset of the transparent window under a preset intensity electric field, including: comparing the center frequency offset of the transparent window under partial discharge conditions with the center frequency of the transparent window under no partial discharge conditions to determine the frequency change; determining the proportional relationship based on the frequency change and the center frequency offset of the transparent window under the preset intensity electric field; and determining the partial discharge electric field strength based on the proportional relationship and the electric field strength corresponding to the preset intensity electric field.

[0092] Optionally, the processor may also execute program code that presets the wavelength of the detection laser to 852 nanometers and the wavelength of the coupling laser to 509 nanometers.

[0093] This invention provides a highly sensitive, interference-resistant, and calibration-free method for precise measurement of weak partial discharge electric fields based on the Rydberg state of three-level cesium atoms, combined with an 852 nm / 509 nm two-photon EIT structure and a five-step electric field inversion mechanism. An electromagnetically induced transparency system is constructed in a cesium atom gas cell based on a preset probe laser and a preset coupling laser. The cesium atoms in the gas cell are in the Rydberg state, and the gas cell is located within a preset distance from the partial discharge point. In the absence of partial discharge, the frequency of the preset coupling laser is scanned to determine the center frequency of the transparent window of the electromagnetically induced transparency system under partial discharge conditions. A preset intensity electric field is applied to the cesium atom gas cell to determine the frequency offset of the transparent window of the electromagnetically induced transparency system under the preset intensity electric field. When partial discharge occurs at the partial discharge point, the transmitted light intensity signal at the partial discharge point is collected. Based on the transmitted light intensity signal, the electromagnetically induced transparency system... The corresponding center frequency offset of the transparent window is used to determine the intensity of the partial discharge electric field. Based on the center frequency offset of the transparent window under partial discharge conditions, the center frequency of the transparent window under no partial discharge conditions, and the center frequency offset of the transparent window under a preset intensity electric field, the intensity of the partial discharge electric field is determined. This achieves the goal of high-sensitivity quantum sensing and precise quantitative measurement of electric field based on the Rydberg state of three-level cesium atoms. This solves the technical problems of traditional partial discharge detection methods, such as low sensitivity, weak anti-electromagnetic interference ability, inability to accurately capture nanosecond-level transient electric field changes, reliance on on-site self-calibration, resulting in missed detection of early weak discharge signals, lack of quantitative measurement, low measurement accuracy, and difficulty in adapting to complex power environments.

[0094] Those skilled in the art will understand that all or part of the steps in the various methods of the above embodiments can be implemented by a program instructing the hardware related to the terminal device. The program can be stored in a non-volatile storage medium, which may include: flash drive, read-only memory (ROM), random access memory (RAM), disk or optical disk, etc.

[0095] Embodiments of the present invention also provide a non-volatile storage medium. Optionally, in this embodiment, the aforementioned non-volatile storage medium can be used to store the program code executed by the partial discharge electric field intensity determination method provided in the above embodiments.

[0096] Optionally, in this embodiment, the non-volatile storage medium may be located in any computer terminal in a group of computer terminals in a computer network, or in any mobile terminal in a group of mobile terminals.

[0097] Optionally, in this embodiment, the non-volatile storage medium is configured to store program code for performing the following steps: constructing an electromagnetically induced transparency system in a cesium atom gas chamber based on a preset detection laser and a preset coupling laser, wherein the cesium atoms in the cesium atom gas chamber are in the Rydberg state, and the cesium atom gas chamber is located within a preset distance around the partial discharge occurrence point; in the absence of partial discharge, scanning the frequency of the preset coupling laser to determine the center frequency of the transparent window of the electromagnetically induced transparency system in the absence of partial discharge; applying a preset intensity electric field to the cesium atom gas chamber to determine the frequency offset of the transparent window of the electromagnetically induced transparency system under the preset intensity electric field; in the case of partial discharge at the occurrence point, acquiring the transmitted light intensity signal of the partial discharge occurrence point; based on the transmitted light intensity signal, determining the center frequency offset of the transparent window corresponding to the electromagnetically induced transparency system; and determining the intensity of the partial discharge electric field based on the center frequency offset of the transparent window under partial discharge, the center frequency of the transparent window in the absence of partial discharge, and the center frequency offset of the transparent window under the preset intensity electric field.

[0098] Optionally, in this embodiment, the non-volatile storage medium is configured to store program code for performing the following steps: in the absence of partial discharge, scanning the frequency of a preset coupling laser to determine the center frequency of the transparent window of the electromagnetically induced transparency system in the absence of partial discharge, including: in the absence of partial discharge, gradually adjusting the frequency of the preset coupling laser and recording the light intensity changes in the cesium atom gas cell; determining the electromagnetically induced transparency spectral curve based on the light intensity changes; determining the peak position of the transparent window of the electromagnetically induced transparency system based on the region with the highest transmittance in the electromagnetically induced transparency spectral curve; and determining the center frequency of the transparent window in the absence of partial discharge based on the frequency of the preset coupling laser corresponding to the peak position.

[0099] Optionally, in this embodiment, the non-volatile storage medium is configured to store program code for performing the following steps: The processor can also execute program code for the following steps: applying a preset intensity electric field to the cesium atom gas chamber and determining the frequency offset of the transparent window of the electromagnetically induced transparency system under the preset intensity electric field, including: setting a parallel plate electrode structure outside the cesium atom gas chamber to apply the preset intensity electric field, wherein the direction of the preset intensity electric field is perpendicular to the propagation direction of the preset probe laser and the preset coupling laser; while keeping the frequency of the preset probe laser constant, gradually adjusting the frequency of the preset coupling laser to determine the transmission spectrum of the electromagnetically induced transparency system; and determining the frequency offset of the transparent window under the preset intensity electric field based on the transmission spectrum and the center frequency of the transparent window under the condition of no partial discharge.

[0100] Optionally, in this embodiment, the non-volatile storage medium is configured to store program code for performing the following steps: The processor can also execute program code for the following steps: performing multiple steps of gradually adjusting the frequency of the preset coupling laser while keeping the preset detection laser frequency constant to determine the transmission spectrum of the electromagnetically induced transparency system, thereby determining multiple transmission spectra; determining the candidate frequency offset corresponding to each of the multiple transmission spectra based on the multiple transmission spectra and the center frequency of the transparent window under the condition of no partial discharge; and determining the frequency offset of the transparent window under the preset intensity electric field based on the candidate frequency offset corresponding to each of the multiple transmission spectra.

[0101] Optionally, in this embodiment, the non-volatile storage medium is configured to store program code for performing the following steps: The processor can also execute program code for the following steps: determining the partial discharge electric field strength based on the center frequency offset of the transparent window under partial discharge conditions, the center frequency of the transparent window under no partial discharge conditions, and the center frequency offset of the transparent window under a preset intensity electric field, including: comparing the center frequency offset of the transparent window under partial discharge conditions with the center frequency of the transparent window under no partial discharge conditions to determine the frequency change; determining a proportional relationship based on the frequency change and the center frequency offset of the transparent window under a preset intensity electric field; and determining the partial discharge electric field strength based on the proportional relationship and the electric field strength corresponding to the preset intensity electric field.

[0102] Optionally, in this embodiment, the non-volatile storage medium is configured to store program code for performing the following steps: The processor can also execute program code for the following steps: preset the wavelength of the detection laser to 852 nanometers and preset the wavelength of the coupling laser to 509 nanometers.

[0103] Embodiments of the present invention also provide a computer program product, including a computer program. Optionally, in this embodiment, when the computer program is executed by a processor, it can: construct an electromagnetically induced transparency system in a cesium atom gas chamber based on a preset detection laser and a preset coupling laser, wherein the cesium atoms in the cesium atom gas chamber are in the Rydberg state, and the cesium atom gas chamber is located within a preset distance around the partial discharge occurrence point; in the absence of partial discharge, scan the frequency of the preset coupling laser to determine the center frequency of the transparent window of the electromagnetically induced transparency system in the absence of partial discharge; apply a preset intensity electric field to the cesium atom gas chamber to determine the frequency offset of the transparent window of the electromagnetically induced transparency system under the preset intensity electric field; in the case of partial discharge at the occurrence point, collect the transmitted light intensity signal of the partial discharge occurrence point; based on the transmitted light intensity signal, determine the center frequency offset of the transparent window corresponding to the electromagnetically induced transparency system; and determine the intensity of the partial discharge electric field based on the center frequency offset of the transparent window under partial discharge, the center frequency of the transparent window in the absence of partial discharge, and the center frequency offset of the transparent window under the preset intensity electric field.

[0104] The sequence numbers of the above embodiments of the present invention are for descriptive purposes only and do not represent the superiority or inferiority of the embodiments.

[0105] In the above embodiments of the present invention, the descriptions of each embodiment have different focuses. For parts not described in detail in a certain embodiment, please refer to the relevant descriptions of other embodiments.

[0106] In the several embodiments provided in this application, it should be understood that the disclosed technical content can be implemented in other ways. The device embodiments described above are merely illustrative; for example, the division of units can be a logical functional division, and in actual implementation, there may be other division methods. For instance, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the displayed or discussed mutual coupling, direct coupling, or communication connection may be through some interfaces; the indirect coupling or communication connection between units or modules may be electrical or other forms.

[0107] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0108] Furthermore, the functional units in the various embodiments of the present invention can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit.

[0109] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a non-volatile storage medium. Based on this understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, read-only memory (ROM), random access memory (RAM), portable hard drives, magnetic disks, or optical disks.

[0110] The above description is only a preferred embodiment of the present invention. It should be noted that for those skilled in the art, several improvements and modifications can be made without departing from the principle of the present invention, and these improvements and modifications should also be considered within the scope of protection of the present invention.

Claims

1. A method for determining the electric field intensity of partial discharge, characterized in that, include: An electromagnetically induced transparent system is constructed in a cesium atom gas chamber based on a preset detection laser and a preset coupling laser. The cesium atoms in the cesium atom gas chamber are in the Rydberg state, and the cesium atom gas chamber is located within a preset distance around the partial discharge occurrence point. In the absence of partial discharge, the frequency of the preset coupling laser is scanned to determine the center frequency of the transparent window of the electromagnetically induced transparency system under the condition of no partial discharge. A preset intensity electric field is applied to the cesium atom gas cell, and the frequency offset of the transparent window of the electromagnetically induced transparency system under the preset intensity electric field is determined; When partial discharge occurs at the point where partial discharge occurs, the transmitted light intensity signal at the point where partial discharge occurs is collected. Based on the transmitted light intensity signal, determine the center frequency offset of the transparent window corresponding to the electromagnetically induced transparency system; The intensity of the partial discharge electric field is determined based on the center frequency offset of the transparent window under partial discharge conditions, the center frequency of the transparent window under no partial discharge conditions, and the center frequency offset of the transparent window under the preset intensity electric field.

2. The method according to claim 1, characterized in that, The step of scanning the frequency of the preset coupling laser to determine the center frequency of the transparent window of the electromagnetically induced transparency system under the condition of no partial discharge includes: In the absence of partial discharge, the frequency of the preset coupled laser is gradually adjusted and the light intensity changes in the cesium atom gas cell are recorded. Based on the aforementioned light intensity changes, the electromagnetically induced transparency spectral curve is determined; Based on the region with the highest transmittance in the electromagnetically induced transparency spectral curve, the peak position of the transparency window of the electromagnetically induced transparency system is determined. The center frequency of the transparent window under the condition of no partial discharge is determined based on the frequency of the preset coupled laser corresponding to the peak position.

3. The method according to claim 1, characterized in that, The step of applying a preset intensity electric field to the cesium atom gas cell and determining the frequency shift of the transparent window of the electromagnetically induced transparency system under the preset intensity electric field includes: A parallel plate electrode structure is set outside the cesium atom gas chamber to apply the preset intensity electric field, wherein the direction of the preset intensity electric field is perpendicular to the propagation direction of the preset detection laser and the preset coupling laser; While keeping the preset detection laser frequency constant, the frequency of the preset coupling laser is gradually adjusted to determine the transmission spectrum of the electromagnetically induced transparency system; Based on the transmission spectrum and the center frequency of the transparent window under the condition of no partial discharge, the frequency offset of the transparent window under the preset intensity electric field is determined.

4. The method according to claim 3, characterized in that, Also includes: By performing the steps described above multiple times, while keeping the preset detection laser frequency constant, gradually adjusting the frequency of the preset coupling laser to determine the transmission spectrum of the electromagnetically induced transparency system, multiple transmission spectra are determined. Based on the multiple transmission spectra and the center frequency of the transparent window under the condition of no partial discharge, the candidate frequency offset corresponding to each of the multiple transmission spectra is determined; Based on the candidate frequency offsets corresponding to the multiple transmission spectra, the frequency offset of the transparent window under the preset intensity electric field is determined.

5. The method according to claim 1, characterized in that, The determination of the partial discharge electric field intensity based on the center frequency shift of the transparent window under partial discharge conditions, the center frequency of the transparent window under no partial discharge conditions, and the center frequency shift of the transparent window under the preset intensity electric field includes: The frequency shift of the transparent window center under partial discharge conditions is compared with the frequency of the transparent window center under no partial discharge conditions to determine the frequency change. The proportional relationship is determined based on the frequency change and the center frequency offset of the transparent window under the preset intensity electric field. The partial discharge electric field strength is determined based on the proportional relationship and the electric field strength corresponding to the preset intensity electric field.

6. The method according to any one of claims 1 to 5, characterized in that, The wavelength of the preset detection laser is 852 nanometers, and the wavelength of the preset coupling laser is 509 nanometers.

7. A device for determining the electric field intensity of partial discharge, characterized in that, include: A construction module is used to construct an electromagnetically induced transparent system in a cesium atom gas chamber based on a preset detection laser and a preset coupling laser, wherein the cesium atoms in the cesium atom gas chamber are in the Rydberg state, and the cesium atom gas chamber is located within a preset distance around the partial discharge occurrence point; The first determining module is used to scan the frequency of the preset coupling laser in the absence of partial discharge, and determine the center frequency of the transparent window of the electromagnetically induced transparency system in the absence of partial discharge. The second determining module is used to apply a preset intensity electric field to the cesium atom gas cell and determine the frequency offset of the transparent window of the electromagnetically induced transparent system under the preset intensity electric field; The acquisition module is used to acquire the transmitted light intensity signal of the partial discharge point when the partial discharge occurs. The third determining module is used to determine the center frequency offset of the transparent window corresponding to the electromagnetically induced transparency system based on the transmitted light intensity signal. The fourth determining module is used to determine the partial discharge electric field intensity based on the center frequency offset of the transparent window under partial discharge conditions, the center frequency of the transparent window under no partial discharge conditions, and the center frequency offset of the transparent window under the preset intensity electric field.

8. A non-volatile storage medium, characterized in that, The non-volatile storage medium includes a stored program, wherein, when the program is executed, it controls the device containing the non-volatile storage medium to perform the partial discharge electric field intensity determination method according to any one of claims 1 to 6.

9. A computer device, characterized in that, include: Memory and processor The memory stores computer programs; The processor is configured to execute a computer program stored in the memory, wherein when the computer program is executed, the processor performs the method for determining the partial discharge electric field intensity according to any one of claims 1 to 6.

10. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by the processor, it implements the method for determining the partial discharge electric field intensity according to any one of claims 1 to 6.

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