Probe deviation correction method and device, computer device and storage medium

Abstract

This invention relates to the field of flying probe testing technology, and discloses a method, apparatus, computer equipment, and storage medium for correcting probe deviation. The method includes: after flying probe testing, if the test result is unqualified, collecting the actual coordinates of the probe tip at the unqualified test point during the flying probe testing process; based on the actual coordinates of the probe tip, the theoretical coordinates of the test point, and a preset deviation threshold, determining the cause of the unqualification and the deviation type, wherein the deviation type includes systematic deviation and random deviation; if the cause of the unqualification is determined to be XY plane deviation, calculating the compensation amount of the test point based on the deviation type and the corresponding compensation strategy; and correcting the actual coordinates of the probe tip based on the compensation amount of the test point. This method, for XY plane deviation, analyzes the deviation type and adopts corresponding compensation strategies for different deviation types, thereby optimizing the XY plane deviation and improving the pass rate of flying probe testing.

Description

Technical Field

[0001] This invention relates to the field of flying probe testing technology, specifically to probe deviation correction methods, devices, computer equipment, and storage media. Background Technology

[0002] Flying probe testing is an electrical testing technique for printed circuit boards (PCBs). It involves controlling a small number of high-speed probes to move across the XY plane, sequentially contacting scattered test points on the PCB to measure circuit continuity, insulation, and component parameters. The high degree of automation and accuracy of flying probe testing relies on precise alignment between the probe tips and the test points. In practical applications, various factors can cause uncorrected deviations in the XY plane, leading to problems such as poor contact at test points and misjudgments in continuity / insulation tests. Therefore, reducing the deviation of the probe tips in the XY plane during flying probe testing is a pressing issue that needs to be addressed. Summary of the Invention

[0003] In view of this, the present invention provides a probe deviation correction method, apparatus, computer equipment and storage medium to solve the problem of probe tip deviation in flying probe testing.

[0004] In a first aspect, the present invention provides a probe deviation correction method, the method comprising: If the test result of the flying needle test is unqualified, collect the actual coordinates of the needle tip at the unqualified test point during the flying needle test; Based on the actual coordinates of the needle tip, the theoretical coordinates of the test point, and the preset deviation threshold, the reasons for non-compliance and the type of deviation are determined. The type of deviation includes systematic deviation and random deviation. If the reason for non-compliance is determined to be XY plane deviation, the compensation amount of the test point is calculated based on the deviation type and the compensation strategy corresponding to the deviation type. The actual coordinates of the needle tip are corrected based on the compensation amount of the test points.

[0005] In one optional implementation, determining the cause of non-compliance and the type of deviation based on the actual coordinates of the needle tip, the theoretical coordinates of the test point, and a preset deviation threshold includes: Based on the actual coordinates of the needle tip and the theoretical coordinates of the test point, the coordinate deviation of the unqualified test point is calculated; The coordinate deviation is compared with a preset deviation threshold. If the coordinate deviation in at least one direction is greater than the preset deviation threshold, the reason for the non-compliance is determined to be XY plane deviation. The deviation direction of the non-conforming test points is analyzed based on the coordinate deviation of the non-conforming test points, so as to determine the deviation type according to the deviation direction.

[0006] In one optional implementation, analyzing the deviation direction of the non-conforming test points based on their coordinate deviations, and determining the deviation type according to the deviation direction, includes: If the number of unqualified test points with consistent deviation in the same direction is greater than or equal to the first preset number threshold, then the deviation type is determined to be a systematic deviation. If the number of unqualified test points with consistent deviations in the same direction is less than a first preset threshold, then the deviation type is determined to be a random deviation.

[0007] In one optional implementation, if the deviation type is a systematic deviation, the calculation of the compensation amount for the test point based on the deviation type and the corresponding compensation strategy includes: Calculate the average value of the actual coordinates of the needle tip at the unqualified test points to obtain the basic compensation amount; The temperature parameters and probe status parameters during flying probe testing are obtained, and the environmental correction amount is calculated based on the preset compensation coefficient, temperature parameters, and probe status parameters. The compensation amount for the test point is obtained by superimposing the basic compensation amount with the environmental correction amount.

[0008] In one optional implementation, the preset compensation coefficient includes a temperature compensation coefficient and a probe state compensation coefficient, the temperature parameter includes a calibration temperature and a test temperature, and the environmental correction amount includes a temperature correction amount and a probe state correction amount, the temperature correction amount being determined according to the following formula: ΔX_temp=K_temp×(T_cal - T_test); ΔY_temp=K_temp×(T_cal - T_test); Where ΔX_temp represents the temperature correction amount in the X-axis direction, ΔY_temp represents the temperature correction amount in the Y-axis direction, K_temp represents the temperature compensation coefficient, T_cal represents the calibration temperature, and T_test represents the test temperature; The probe state correction amount is determined according to the following formula: ΔX_wear = K_wear × t_use; ΔY_wear = K_wear × t_use; Where ΔX_wear represents the probe state correction amount in the X-axis direction, ΔY_wear represents the probe state correction amount in the Y-axis direction, K_wear represents the probe state compensation coefficient, and t_use represents the probe state parameter.

[0009] In one optional implementation, if the deviation type is a random deviation, the calculation of the compensation amount for the test point based on the deviation type and the corresponding compensation strategy includes: The expected compensation amount for the unqualified test points is calculated based on a preset spatial compensation model. The expected compensation amount is subjected to amplitude limiting processing, and the result after amplitude limiting processing is used as the compensation amount of the test point.

[0010] In one optional implementation, correcting the actual coordinates of the needle tip based on the compensation amount of the test point includes: The compensation amount of the test point is superimposed with the theoretical coordinates of the test point to determine the compensation coordinates and generate the correction motion command; The flying probe testing device is driven to move based on the corrected motion command execution mechanism to obtain secondary movement coordinates; If the deviation between the secondary movement coordinates and the compensation coordinates is greater than a preset deviation, then the secondary compensation coordinates are determined based on the deviation between the secondary movement coordinates and the actual coordinates of the needle tip and the deviation coefficient. A second correction is performed based on the aforementioned second-order compensation coordinates.

[0011] The probe deviation correction method provided in this embodiment includes the following steps: After flying probe testing, if the test result is unqualified, the actual coordinates of the probe tip at the unqualified test point during the flying probe testing process are collected; based on the actual coordinates of the probe tip, the theoretical coordinates of the test point, and a preset deviation threshold, the cause of failure and the deviation type are determined, whereby the deviation type includes systematic deviation and random deviation; if the cause of failure is determined to be XY plane deviation, the compensation amount of the test point is calculated based on the deviation type and the corresponding compensation strategy; and the actual coordinates of the probe tip are corrected based on the compensation amount of the test point. This method, for XY plane deviation, analyzes the deviation type and adopts corresponding compensation strategies for different deviation types, thereby optimizing the XY plane deviation and improving the pass rate of flying probe testing.

[0012] Secondly, the present invention provides a probe deviation correction device, the device comprising: The actual coordinate determination module is used to collect the actual coordinates of the needle tip at the unqualified test point during the flying needle test if the test result is unqualified. The type determination module is used to determine the cause of non-compliance and the type of deviation based on the actual coordinates of the needle tip, the theoretical coordinates of the test point, and the preset deviation threshold. The deviation type includes systematic deviation and random deviation. The compensation amount calculation module is used to calculate the compensation amount of the test point based on the deviation type and the compensation strategy corresponding to the deviation type if the reason for non-compliance is determined to be XY plane deviation. The correction module is used to correct the actual coordinates of the needle tip based on the compensation amount of the test point.

[0013] Thirdly, the present invention provides a computer device, comprising: a memory and a processor, wherein the memory and the processor are communicatively connected to each other, the memory stores computer instructions, and the processor executes the computer instructions to perform the probe deviation correction method of the first aspect or any corresponding embodiment described above.

[0014] Fourthly, the present invention provides a computer-readable storage medium storing computer instructions for causing a computer to execute the probe deviation correction method of the first aspect or any corresponding embodiment thereof. Attached Figure Description

[0015] To more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0016] Figure 1 This is a schematic flowchart of a probe deviation correction method according to an embodiment of the present invention; Figure 2 This is a structural block diagram of a probe deviation correction device according to an embodiment of the present invention; Figure 3 This is a schematic diagram of the hardware structure of a computer device according to an embodiment of the present invention. Detailed Implementation

[0017] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0018] Flying probe testing is an electrical testing method for printed circuit boards (PCBs). It involves controlling a small number of high-speed, precision probes to move in the XY plane, sequentially contacting scattered test points on the PCB to measure circuit continuity, insulation, and component parameters. In flying probe testing, uncorrected deviations in the probe tips within the XY plane can lead to test failures. Types of failures due to XY deviation include poor contact failures, misjudgments, and collisions. Poor contact failures manifest as no signal feedback or excessive signal attenuation at the test point, caused by the probe tip not fully contacting the test point (contact area < 50%), commonly seen in tests of miniature pads (diameter ≤ 0.3 mm). Misjudgments manifest as open circuits in continuity tests or short circuits in insulation tests, caused by the probe tip touching adjacent pads (spacing ≤ 0.2 mm) due to XY deviation, leading to crosstalk. The failure due to probe collision occurs when the probe collides with the edge of the PCB board or components. Due to the XY deviation of the probe tip, the actual trajectory deviates from the theoretical path, exceeding the safe distance (<0.5mm). Based on this, the present invention provides a probe deviation correction method.

[0019] According to an embodiment of the present invention, a probe deviation correction method embodiment is provided. It should be noted that the steps shown in the flowchart in the accompanying drawings can be executed in a computer system such as a set of computer-executable instructions. Furthermore, although a logical order is shown in the flowchart, in some cases, the steps shown or described may be executed in a different order than that shown here.

[0020] This embodiment provides a probe deviation correction method. Figure 1 This is a flowchart of a probe deviation correction method according to an embodiment of the present invention, as follows: Figure 1 As shown, the process includes the following steps: Step S101: If the test result of the flying needle test is unqualified, collect the actual coordinates of the needle tip of the unqualified test point during the flying needle test.

[0021] When the flying probe testing system completes the first test and determines the result to be unqualified, the testing machine software retrieves and records the actual coordinates (X_act, Y_act) of the probe tip fed back by position sensors such as encoders during the test for all unqualified test points in the unqualified analysis interface.

[0022] Step S102: Based on the actual coordinates of the needle tip, the theoretical coordinates of the test point, and the preset deviation threshold, determine the cause of non-compliance and the type of deviation.

[0023] The deviation types include systematic deviations and random deviations. If the flying probe test result is unqualified, in addition to the actual coordinates of the probe tip, the theoretical coordinates (X_theo, Y_theo) of the test point will also be obtained from the test program. Based on the actual coordinates of the probe tip and the theoretical coordinates of the test point, the coordinate deviation of each unqualified test point can be calculated, including the X-axis deviation and the Y-axis deviation. The calculated X-axis deviation and Y-axis deviation are compared with the preset deviation threshold (e.g., ±0.0003 mm). If the deviation of most test points exceeds the preset deviation threshold, the reason for the unqualified test is determined to be XY plane deviation. Furthermore, the deviation direction and distribution pattern of the test points are analyzed. If the deviation direction of multiple points is consistent (e.g., all X-axis deviations are positive and all Y-axis deviations are negative), the deviation type is determined to be systematic deviation, usually caused by factors such as temperature drift and cumulative clearance in the transmission chain. If the deviation direction is chaotic and has no uniform pattern, the deviation type is determined to be random deviation, usually caused by factors such as instantaneous probe deformation and minor vibrations.

[0024] Step S103: If the reason for non-compliance is determined to be XY plane deviation, the compensation amount of the test point is calculated based on the deviation type and the corresponding compensation strategy.

[0025] If the cause of non-compliance is determined to be XY plane deviation, different compensation strategies are applied to calculate the compensation amount for the test points based on the deviation type. For systematic deviations, the compensation strategy calculates a global compensation amount applicable to all test points, including a basic compensation amount based on the average deviation and an environmental correction amount incorporating parameters such as temperature compensation coefficient and wear compensation coefficient. The two are then summed to form the total compensation amount. For random deviations, the compensation strategy constructs a spatial compensation model within a local area surrounding the non-compliant test point. This model is used to predict and calculate the local compensation amount for each test point within the area, thereby correcting irregular deviations.

[0026] Before calculating the compensation amount, deviation filtering can be performed first, that is, abnormal deviation values ​​are removed to avoid sudden deviations caused by factors such as collisions with the plate, and valid deviation data (deviation fluctuation ≤ 0.002mm) is retained.

[0027] Step S104: Correct the actual coordinates of the needle tip based on the compensation amount of the test point.

[0028] The theoretical coordinates of each test point are superimposed with the corresponding compensation amount in real time to generate corrected coordinates. The probe is then controlled to move according to these corrected coordinates, moving to the corrected coordinate location. During this secondary test, the test points are monitored in real time to ensure that the corrected residual deviation is less than the set value.

[0029] The probe deviation correction method provided in this embodiment includes the following steps: After flying probe testing, if the test result is unqualified, the actual coordinates of the probe tip at the unqualified test point during the flying probe testing process are collected; based on the actual coordinates of the probe tip, the theoretical coordinates of the test point, and a preset deviation threshold, the cause of failure and the deviation type are determined, whereby the deviation type includes systematic deviation and random deviation; if the cause of failure is determined to be XY plane deviation, the compensation amount of the test point is calculated based on the deviation type and the corresponding compensation strategy; and the actual coordinates of the probe tip are corrected based on the compensation amount of the test point. This method, for XY plane deviation, analyzes the deviation type and adopts corresponding compensation strategies for different deviation types, thereby optimizing the XY plane deviation and improving the pass rate of flying probe testing.

[0030] This embodiment provides a probe deviation correction method, which includes the following steps: Step S201: If the test result of the flying needle test is unqualified, collect the actual coordinates of the needle tip of the unqualified test point during the flying needle test.

[0031] Please see details Figure 1 Step S101 of the illustrated embodiment will not be described again here.

[0032] Step S202: Based on the actual coordinates of the needle tip, the theoretical coordinates of the test point, and the preset deviation threshold, determine the cause of non-compliance and the type of deviation. The deviation types include systematic deviations and random deviations.

[0033] Specifically, step S202 includes: Step S2021: Calculate the coordinate deviation of the unqualified test points based on the actual coordinates of the needle tip and the theoretical coordinates of the test points.

[0034] The actual coordinates of the needle tip are (X_theo, Y_theo), and the theoretical coordinates of the test point are (X_theo, Y_theo). The coordinate deviation of the unqualified test point includes the X-axis deviation ΔX and the Y-axis deviation ΔY. Specifically, ΔX = X_act - X_theo, ΔY = Y_act - Y_theo.

[0035] Step S2022: Compare the coordinate deviation with the preset deviation threshold. If the coordinate deviation in at least one direction is greater than the preset deviation threshold, the reason for non-compliance is determined to be XY plane deviation.

[0036] If the preset deviation threshold is ±0.003mm and the coordinate deviation is an absolute value, if the test point satisfies |ΔX|>0.003mm or |ΔY|>0.003mm, then the reason for non-compliance is the existence of XY plane deviation.

[0037] Step S2023: Analyze the deviation direction of the non-conforming test points based on the coordinate deviation of the non-conforming test points, so as to determine the deviation type according to the deviation direction.

[0038] By analyzing the signs of the X-axis deviation ΔX and the Y-axis deviation ΔY, the direction of the deviation can be determined. By analyzing the deviation direction at the test point in the same direction, the type of deviation can be determined.

[0039] In some optional implementations, step S2023 above includes: Step a1: If the number of unqualified test points with consistent deviations in the same direction is greater than or equal to the first preset quantity threshold, then the deviation type is determined to be a systematic deviation.

[0040] If multiple non-conforming test points have the same sign for their deviation values ​​in the X-axis and / or Y-axis directions (e.g., positive deviation in the X-axis and negative deviation in the Y-axis), and the number of non-conforming test points that meet this condition is greater than or equal to a first preset quantity threshold, then the deviation type is determined to be a systematic deviation.

[0041] Step a2: If the number of unqualified test points with consistent deviations in the same direction is less than the first preset threshold, then the deviation type is determined to be random deviation.

[0042] If there are non-conforming test points with consistent signs of deviation values ​​in the X-axis and / or Y-axis directions, and the number of non-conforming test points meeting this condition is less than the first preset threshold, meaning that most non-conforming test points have irregular deviation values ​​in the X-axis and / or Y-axis directions, possibly due to minor deformation or instantaneous vibration of individual probes, then the deviation type is determined to be random deviation.

[0043] Step S203: If the reason for non-compliance is determined to be XY plane deviation, the compensation amount of the test point is calculated based on the deviation type and the corresponding compensation strategy.

[0044] Specifically, if the deviation type is a systematic deviation, step S203 above includes: Step S2031: Calculate the average value of the actual coordinates of the needle tip of the unqualified test points to obtain the basic compensation amount.

[0045] Before calculation, select valid non-conforming test points to exclude those caused by defects in the printed circuit board itself (e.g., solder pad detachment). For systematic deviations, select multiple (e.g., three or more) consecutive non-conforming test points and calculate the average of the actual coordinates of the probe tips of these non-conforming test points, as follows: The actual coordinates of the needle tip are (X_theo, Y_theo), and the theoretical coordinates of the test point are (X_theo, Y_theo). The coordinate deviation of the unqualified test point includes the X-axis deviation ΔX and the Y-axis deviation ΔY, where ΔX = X_act - X_theo and ΔY = Y_act - Y_theo. ΔX_avg=ΣΔX / n, ΔY_avg=ΣΔY / n, where n represents the number of non-conforming test points involved in the calculation.

[0046] The basic compensation amount for the X-axis is ΔX_base = -ΔX_avg; The basic compensation amount for the Y-axis is ΔY_base = -ΔY_avg.

[0047] Step S2032: Obtain the temperature parameters and probe status parameters during the flying probe test, and calculate the environmental correction amount based on the preset compensation coefficient, temperature parameters, and probe status parameters.

[0048] Specifically, the preset compensation coefficients include temperature compensation coefficients and probe state compensation coefficients; the temperature parameters include calibration temperature and test temperature; and the environmental correction includes temperature correction and probe state correction. The temperature correction is determined according to the following formula: ΔX_temp=K_temp×(T_cal - T_test); ΔY_temp=K_temp×(T_cal - T_test); Where ΔX_temp represents the temperature correction amount in the X-axis direction, ΔY_temp represents the temperature correction amount in the Y-axis direction, K_temp represents the temperature compensation coefficient, T_cal represents the calibration temperature (e.g., 25℃), and T_test represents the test temperature; The probe state correction amount is determined according to the following formula: ΔX_wear = K_wear × t_use; ΔY_wear = K_wear × t_use; Where ΔX_wear represents the probe state correction amount in the X-axis direction, ΔY_wear represents the probe state correction amount in the Y-axis direction, K_wear represents the probe state compensation coefficient, and t_use represents the probe state parameter.

[0049] The environmental correction is obtained by superimposing the temperature correction and the probe state correction, i.e., the environmental correction in the X-axis direction = ΔX_temp + ΔX_wear, and the environmental correction in the Y-axis direction = ΔY_temp + ΔY_wear.

[0050] Step S2033: The basic compensation amount and the environmental correction amount are superimposed to obtain the compensation amount of the test point.

[0051] The compensation amount of the test point in the X-axis direction is ΔX_total=ΔX_base+ΔX_temp+ΔX_wear, and the compensation amount of the test point in the Y-axis direction is ΔY_total=ΔY_base+ΔY_temp+ΔY_wear.

[0052] Specifically, if the deviation type is random deviation, step S203 above includes: Step S2034: Calculate the expected compensation amount for the unqualified test points based on the preset spatial compensation model; Step S2035: Limit the expected compensation amount and use the result after limiting as the compensation amount of the test point.

[0053] If the deviation type is random deviation, first select a certain number (e.g., 5 or more) of dispersed non-conforming test points, and calculate the standard deviations σ_X = √[Σ(ΔX - ΔX_avg)² / (n-1)] and σ_Y = √[Σ(ΔY - ΔY_avg)² / (n-1)], where n represents the number of non-conforming test points selected, ΔX_avg represents the average of the x-coordinates of the n selected test points, and ΔY_avg represents the average of the y-coordinates of the n selected test points. If σ_X > 0.0015 mm or σ_Y > 0.0015 mm, then execute steps S2034 and S2035.

[0054] The preset spatial compensation model is a predefined algorithm model used to describe the relationship between the compensation amount and coordinate position in the XY plane. A 5mm × 5mm local mesh is divided with the non-conforming test point as the midpoint. All test points (including conforming points) within the mesh are included in the compensation range. Based on the deviation values ​​of each point within the mesh, the compensation amount for each non-conforming test point is calculated using a quadratic interpolation formula. ΔX_comp (x,y)=a1x²+a2y²+a3xy+a4x+a5y+a6 ΔY_comp (x,y)=b1x²+b2y²+b3xy+b4x+b5y+b6 Where ΔX_comp (x,y) represents the expected compensation amount in the X-axis direction, ΔY_comp (x,y) represents the expected compensation amount in the Y-axis direction, and a1-a6 and b1-b6 represent the interpolation coefficients, which are obtained by fitting known deviation points within the grid.

[0055] Check each calculated expected compensation amount. If the absolute value of ΔX_comp (x,y)|ΔX_comp (x,y)| ≤ 0.005mm, then the value is considered to be within the safe range. Similarly, if the absolute value of ΔY_comp (x,y)|ΔY_comp (x,y)| ≤ 0.005mm, then the value is considered to be within the safe range. Expected compensation amounts that do not meet the above conditions are eliminated, and the expected compensation amounts within the safe range are used as the compensation amounts of the test points.

[0056] Step S204: Correct the actual coordinates of the needle tip based on the compensation amount of the test point.

[0057] Specifically, step S204 includes the following steps: Step S2041: Superimpose the compensation amount of the test point with the theoretical coordinates of the test point to determine the compensation coordinates and generate the correction motion command.

[0058] The compensation coordinates are obtained by superimposing the compensation amount and the theoretical coordinates of the test points. The generated correction motion command includes the compensation coordinates. In addition, the compensation response speed can be set according to the density of the test points (for example, the compensation response speed v_comp=2mm / s, where 1mm / s is taken for dense points and 5mm / s is taken for sparse points).

[0059] Step S2042: Drive the flying probe testing device to move based on the correction motion command execution mechanism to obtain the secondary movement coordinates.

[0060] The path for non-conforming test points is generated based on the corrected motion commands, ensuring that these points are tested first, thereby quickly verifying the compensation effect. The XY axis motors of the flying probe testing equipment are controlled to move according to the compensation coordinates. Each time the probe moves to a test point, the actual coordinates of that test point are fed back in real time, i.e., the secondary movement coordinates.

[0061] Step S2043: If the deviation between the secondary movement coordinates and the actual coordinates of the needle tip is greater than the preset deviation, then the secondary compensation amount is determined based on the deviation between the secondary movement coordinates and the actual coordinates of the needle tip and the deviation coefficient.

[0062] Calculate the deviation between the secondary movement coordinate and the actual coordinate of the needle tip. If the deviation between the secondary movement coordinate and the actual coordinate of the needle tip is greater than the preset deviation amount (e.g., 0.002mm), then calculate the product of the deviation between the secondary movement coordinate and the actual coordinate of the needle tip and the deviation coefficient to obtain the secondary compensation amount.

[0063] Step S2044: Perform secondary correction based on the secondary compensation coordinates.

[0064] A secondary correction command is generated based on the secondary compensation coordinates, which controls the XY axis motors to move according to the secondary compensation coordinates to complete the secondary correction.

[0065] After testing all non-conforming test points, analyze the pass rate. If the pass rate reaches the preset pass rate (e.g., pass rate ≥ 99%), continue testing the remaining qualified test points. If the qualified points do not reach the preset pass rate (e.g., pass rate < 99%), repeat steps S202 to S204.

[0066] The probe deviation correction method provided in this embodiment, after correction during secondary testing, further includes statistically analyzing the corrected deviations of non-conforming test points in the secondary test and checking whether the corrected deviations meet preset requirements (e.g., the absolute value of the average deviation ≤ 0.0002 mm, and the absolute value of the maximum deviation ≤ 0.003 mm). Multiple (e.g., 10) qualified test points are randomly selected, and the deviations after secondary correction are checked to ensure no new deviations appear. A correction report is generated based on the test results, including deviation data, compensation calculation process, and correction results from the secondary test. The generated correction report is associated with and saved in the printed circuit board test program for reuse of compensation parameters in the event of similar non-conforming problems in the future.

[0067] In some optional implementations, this method includes specific correction strategies for specific test failure scenarios. For micro-pad contact problems (diameter ≤ 0.3 mm), a 0.001 mm step compensation is used to avoid excessive compensation causing the probe tip to extend beyond the pad area. During secondary testing, a camera is used for real-time monitoring, capturing images of the probe tip and pad contact. If the contact area is < 70%, the compensation amount is automatically fine-tuned (e.g., increased by 0.0005 mm). The contact pressure is reduced from the conventional 10 g to 8 g to reduce the impact of probe tip deformation on XY deviation and ensure compensation accuracy.

[0068] For false positives due to adjacent pads (spacing ≤ 0.2mm), add a safety margin of 0.001mm when calculating the compensation (e.g., base compensation ΔX_base = -0.003mm, actual compensation is -0.002mm) to prevent the probe tip from touching adjacent pads. During secondary test path planning, increase the detour distance for XY axis movement (from 0.5mm to 0.8mm) to ensure the probe tip trajectory stays away from adjacent pads. Enable software anti-crosstalk filtering to reduce signal interference caused by minute probe tip offsets and lower the false positive rate.

[0069] For edge-collision type defects, double the compensation amount (e.g., 0.002mm for normal compensation and 0.004mm for edge compensation) is applied within 5mm of the printed circuit board edge to correct the cumulative deviation in the boundary area. Before the secondary test, the needle tip trajectory is simulated by software. If a certain segment of the trajectory is less than 0.8mm from the edge of the printed circuit board, the compensation amount is automatically adjusted to ensure a safe distance. During edge area testing, the XY axis movement speed is reduced from the normal 30mm / s to 15mm / s to extend the emergency stop response time and avoid secondary collisions.

[0070] This embodiment also provides a probe deviation correction device, which is used to implement the above embodiments and implementation methods, and will not be repeated as already described. As used below, the term "module" can be a combination of software and / or hardware that implements a predetermined function. Although the device described in the following embodiments is preferably implemented in software, hardware implementation, or a combination of software and hardware, is also possible and contemplated.

[0071] This embodiment provides a probe deviation correction device, such as Figure 2 As shown, it includes: The actual coordinate determination module is used to collect the actual coordinates of the needle tip at the unqualified test point during the flying needle test if the test result is unqualified. The type determination module is used to determine the cause of non-compliance and the type of deviation based on the actual coordinates of the needle tip, the theoretical coordinates of the test point, and the preset deviation threshold. The deviation type includes systematic deviation and random deviation. The compensation amount calculation module is used to calculate the compensation amount of the test point based on the deviation type and the compensation strategy corresponding to the deviation type if the reason for non-compliance is determined to be XY plane deviation. The correction module is used to correct the actual coordinates of the needle tip based on the compensation amount of the test point.

[0072] In some alternative implementations, the type determination module includes: The coordinate deviation calculation unit is used to calculate the coordinate deviation of the unqualified test point based on the actual coordinates of the needle tip and the theoretical coordinates of the test point. The cause determination unit is used to compare the coordinate deviation with a preset deviation threshold. If the coordinate deviation in at least one direction is greater than the preset deviation threshold, the cause of the non-compliance is determined to be XY plane deviation. The type determination unit is used to analyze the deviation direction of the non-conforming test point based on the coordinate deviation of the non-conforming test point, so as to determine the deviation type according to the deviation direction.

[0073] In some optional implementations, the type determination unit includes: The first type determination subunit is used to determine that the deviation type is a systematic deviation if the number of unqualified test points with consistent deviation in the same direction is greater than or equal to a first preset number threshold. The second type determination subunit is used to determine that the deviation type is a random deviation if the number of unqualified test points with consistent deviations in the same direction is less than a first preset number threshold.

[0074] In some optional implementations, if the deviation type is a systematic deviation, the compensation calculation module includes: The mean value calculation unit is used to calculate the average value of the actual coordinates of the needle tip of the unqualified test points to obtain the basic compensation amount; The environmental correction calculation unit is used to obtain the temperature parameters and probe status parameters during flying probe testing, and calculate the environmental correction based on the preset compensation coefficient, temperature parameters and probe status parameters. The first compensation calculation unit is used to superimpose the basic compensation amount and the environmental correction amount to obtain the compensation amount of the test point.

[0075] In some optional implementations, the preset compensation coefficient includes a temperature compensation coefficient and a probe state compensation coefficient, the temperature parameter includes a calibration temperature and a test temperature, and the environmental correction amount includes a temperature correction amount and a probe state correction amount, the temperature correction amount being determined according to the following formula: ΔX_temp=K_temp×(T_cal - T_test); ΔY_temp=K_temp×(T_cal - T_test); Where ΔX_temp represents the temperature correction amount in the X-axis direction, ΔY_temp represents the temperature correction amount in the Y-axis direction, K_temp represents the temperature compensation coefficient, T_cal represents the calibration temperature, and T_test represents the test temperature; The probe state correction amount is determined according to the following formula: ΔX_wear = K_wear × t_use; ΔY_wear = K_wear × t_use; Where ΔX_wear represents the probe state correction amount in the X-axis direction, ΔY_wear represents the probe state correction amount in the Y-axis direction, K_wear represents the probe state compensation coefficient, and t_use represents the probe state parameter.

[0076] In some optional implementations, if the deviation type is a random deviation, the compensation calculation module includes: The expected compensation calculation unit is used to calculate the expected compensation amount of the unqualified test point based on a preset spatial compensation model. The second compensation calculation unit is used to limit the expected compensation amount and use the result after the limit processing as the compensation amount of the test point.

[0077] In some alternative implementations, the correction module includes: The compensation coordinate calculation unit is used to superimpose the compensation amount of the test point with the theoretical coordinates of the test point to determine the compensation coordinates and generate correction motion commands; The secondary movement coordinate calculation unit is used to drive the flying probe testing device to move based on the correction motion command execution mechanism to obtain the secondary movement coordinates; The secondary compensation coordinate calculation unit is used to determine the secondary compensation coordinate based on the deviation between the secondary movement coordinate and the actual coordinate of the needle tip and the deviation coefficient if the deviation between the secondary movement coordinate and the compensation coordinate is greater than a preset deviation amount. The secondary correction unit is used to perform secondary correction based on the secondary compensation coordinates.

[0078] Further functional descriptions of the above modules and units are the same as those in the corresponding embodiments described above, and will not be repeated here.

[0079] In this embodiment, the probe deviation correction device is presented in the form of a functional unit. Here, a unit refers to an ASIC (Application Specific Integrated Circuit) circuit, a processor and memory that execute one or more software or fixed programs, and / or other devices that can provide the above functions.

[0080] This invention also provides a computer device having the above-described features. Figure 2 The probe deviation correction device shown.

[0081] Please see Figure 3 , Figure 3 This is a schematic diagram of the structure of a computer device provided in an optional embodiment of the present invention, such as... Figure 3As shown, the computer device includes one or more processors 10, memory 20, and interfaces for connecting the components, including high-speed interfaces and low-speed interfaces. The components communicate with each other via different buses and can be mounted on a common motherboard or otherwise installed as needed. The processors can process instructions executed within the computer device, including instructions stored in or on memory to display graphical information of a GUI on external input / output devices (such as display devices coupled to the interfaces). In some alternative implementations, multiple processors and / or multiple buses can be used with multiple memories and multiple memory modules, if desired. Similarly, multiple computer devices can be connected, each providing some of the necessary operations (e.g., as a server array, a group of blade servers, or a multiprocessor system). Figure 3 Take a processor 10 as an example.

[0082] Processor 10 may be a central processing unit, a network processor, or a combination thereof. Processor 10 may further include a hardware chip. The hardware chip may be an application-specific integrated circuit (ASIC), a programmable logic device (PLD), or a combination thereof. The programmable logic device may be a complex programmable logic device (CAMP), a field-programmable gate array (FPGA), a general-purpose array logic (GDA), or any combination thereof.

[0083] The memory 20 stores instructions executable by at least one processor 10 to cause the at least one processor 10 to perform the method shown in the above embodiments.

[0084] The memory 20 may include a program storage area and a data storage area. The program storage area may store the operating system and applications required for at least one function; the data storage area may store data created based on the use of the computer device. Furthermore, the memory 20 may include high-speed random access memory and may also include non-transitory memory, such as at least one disk storage device, flash memory device, or other non-transitory solid-state storage device. In some alternative embodiments, the memory 20 may optionally include memory remotely located relative to the processor 10, and these remote memories may be connected to the computer device via a network. Examples of such networks include, but are not limited to, the Internet, intranets, local area networks, mobile communication networks, and combinations thereof.

[0085] The memory 20 may include volatile memory, such as random access memory; the memory may also include non-volatile memory, such as flash memory, hard disk or solid-state drive; the memory 20 may also include a combination of the above types of memory.

[0086] The computer device also includes a communication interface 30 for communicating with other devices or communication networks.

[0087] This invention also provides a computer-readable storage medium. The methods described above according to embodiments of the invention can be implemented in hardware or firmware, or implemented as computer code that can be recorded on a storage medium, or implemented as computer code downloaded via a network and originally stored on a remote storage medium or a non-transitory machine-readable storage medium and then stored on a local storage medium. Thus, the methods described herein can be processed by software stored on a storage medium using a general-purpose computer, a dedicated processor, or programmable or dedicated hardware. The storage medium can be a magnetic disk, optical disk, read-only memory, random access memory, flash memory, hard disk, or solid-state drive, etc.; further, the storage medium can also include combinations of the above types of memory. It is understood that computers, processors, microprocessor controllers, or programmable hardware include storage components capable of storing or receiving software or computer code, which, when accessed and executed by the computer, processor, or hardware, implements the methods shown in the above embodiments.

[0088] A portion of this invention can be applied as a computer program product, such as computer program instructions, which, when executed by a computer, can invoke or provide the methods and / or technical solutions according to the invention through the operation of the computer. Those skilled in the art will understand that the forms in which computer program instructions exist in a computer-readable medium include, but are not limited to, source files, executable files, installation package files, etc. Correspondingly, the ways in which computer program instructions are executed by a computer include, but are not limited to: the computer directly executing the instructions, or the computer compiling the instructions and then executing the corresponding compiled program, or the computer reading and executing the instructions, or the computer reading and installing the instructions and then executing the corresponding installed program. Here, the computer-readable medium can be any available computer-readable storage medium or communication medium accessible to a computer.

[0089] Although embodiments of the invention have been described in conjunction with the accompanying drawings, those skilled in the art can make various modifications and variations without departing from the spirit and scope of the invention, and all such modifications and variations fall within the scope defined by the invention.

Claims

1. A probe bias correction method characterized by, The method includes: If the test result of the flying needle test is unqualified, collect the actual coordinates of the needle tip at the unqualified test point during the flying needle test; Based on the actual coordinates of the needle tip, the theoretical coordinates of the test point, and the preset deviation threshold, the reasons for non-compliance and the type of deviation are determined. The type of deviation includes systematic deviation and random deviation. If the reason for non-compliance is determined to be XY plane deviation, the compensation amount of the test point is calculated based on the deviation type and the compensation strategy corresponding to the deviation type. The actual coordinates of the needle tip are corrected based on the compensation amount of the test points.

2. The probe deviation correction method according to claim 1, characterized by, The determination of the cause of non-compliance and the type of deviation based on the actual coordinates of the needle tip, the theoretical coordinates of the test point, and the preset deviation threshold includes: Based on the actual coordinates of the needle tip and the theoretical coordinates of the test point, the coordinate deviation of the unqualified test point is calculated; The coordinate deviation is compared with a preset deviation threshold. If the coordinate deviation in at least one direction is greater than the preset deviation threshold, the reason for the non-compliance is determined to be XY plane deviation. The deviation direction of the non-conforming test points is analyzed based on the coordinate deviation of the non-conforming test points, so as to determine the deviation type according to the deviation direction.

3. The probe deviation correction method according to claim 2, characterized in that, Based on the coordinate deviation analysis of the non-conforming test points, the deviation direction of the non-conforming test points is analyzed, and the deviation type is determined according to the deviation direction, including: If the number of unqualified test points with consistent deviation in the same direction is greater than or equal to the first preset number threshold, then the deviation type is determined to be a systematic deviation. If the number of unqualified test points with consistent deviations in the same direction is less than a first preset threshold, then the deviation type is determined to be a random deviation.

4. The probe deviation correction method according to claim 1, characterized by, If the deviation type is a systematic deviation, the calculation of the compensation amount for the test point based on the deviation type and the corresponding compensation strategy includes: Calculate the average value of the actual coordinates of the needle tip at the unqualified test points to obtain the basic compensation amount; The temperature parameters and probe status parameters during flying probe testing are obtained, and the environmental correction amount is calculated based on the preset compensation coefficient, temperature parameters, and probe status parameters. The compensation amount for the test point is obtained by superimposing the basic compensation amount with the environmental correction amount.

5. The probe deviation correction method according to claim 4, characterized by, The preset compensation coefficients include a temperature compensation coefficient and a probe state compensation coefficient. The temperature parameters include the calibration temperature and the test temperature. The environmental correction amount includes a temperature correction amount and a probe state correction amount. The temperature correction amount is determined according to the following formula: ΔX_temp=K_temp×(T_cal - T_test); ΔY_temp=K_temp×(T_cal - T_test); Where ΔX_temp represents the temperature correction amount in the X-axis direction, ΔY_temp represents the temperature correction amount in the Y-axis direction, K_temp represents the temperature compensation coefficient, T_cal represents the calibration temperature, and T_test represents the test temperature; The probe state correction amount is determined according to the following formula: ΔX_wear = K_wear × t_use; ΔY_wear = K_wear × t_use; Where ΔX_wear represents the probe state correction amount in the X-axis direction, ΔY_wear represents the probe state correction amount in the Y-axis direction, K_wear represents the probe state compensation coefficient, and t_use represents the probe state parameter.

6. The probe deviation correction method according to Claim 1, characterized by, If the deviation type is a random deviation, the calculation of the compensation amount for the test point based on the deviation type and the corresponding compensation strategy includes: The expected compensation amount for the unqualified test points is calculated based on a preset spatial compensation model. The expected compensation amount is subjected to amplitude limiting processing, and the result after amplitude limiting processing is used as the compensation amount of the test point.

7. The probe deviation correction method according to Claim 1, characterized by, The correction of the actual coordinates of the needle tip based on the compensation amount of the test point includes: The compensation amount of the test point is superimposed with the theoretical coordinates of the test point to determine the compensation coordinates and generate the correction motion command; The flying probe testing device is driven to move based on the corrected motion command execution mechanism to obtain secondary movement coordinates; If the deviation between the secondary movement coordinates and the compensation coordinates is greater than a preset deviation, then the secondary compensation coordinates are determined based on the deviation between the secondary movement coordinates and the actual coordinates of the needle tip and the deviation coefficient. A second correction is performed based on the aforementioned second-order compensation coordinates.

8. A probe deviation correction apparatus characterized by comprising: The device includes: The actual coordinate determination module is used to collect the actual coordinates of the needle tip at the unqualified test point during the flying needle test if the test result is unqualified. The type determination module is used to determine the cause of non-compliance and the type of deviation based on the actual coordinates of the needle tip, the theoretical coordinates of the test point, and the preset deviation threshold. The deviation type includes systematic deviation and random deviation. The compensation amount calculation module is used to calculate the compensation amount of the test point based on the deviation type and the compensation strategy corresponding to the deviation type if the reason for non-compliance is determined to be XY plane deviation. The correction module is used to correct the actual coordinates of the needle tip based on the compensation amount of the test point.

9. A computer device, comprising: include: A memory and a processor are communicatively connected, the memory storing computer instructions, and the processor executing the computer instructions to perform the probe deviation correction method according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer instructions for causing the computer to perform the probe deviation correction method according to any one of claims 1 to 7.

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