A detection system for analog signal amplifier boards of subway vehicle controllers

Abstract

This invention relates to the field of subway vehicle controller testing technology, and discloses a testing system for an analog signal amplifier board of a subway vehicle controller, including controller A, controller B, and the analog signal amplifier board under test. The 8 analog output interfaces of controller B are connected to the 8 analog input interfaces of the board under test, and the 8 amplified signal output interfaces are connected to the 8 amplified signal input interfaces. Controller B outputs test signals and acquires the amplified signals for analog-to-digital conversion, performing testing according to the test signals of the first, second, and third test stages. By setting up a testing system with controller A, controller B, and the analog signal amplifier board under test, and using the test signals of the first, second, and third test stages to test each channel, and based on a specific algorithm combined with cumulative error parameters and cumulative rate of change deviation parameters for judgment, the system achieves phased detection and judgment of the state of each channel of the analog signal amplifier board.

Description

Technical Field

[0001] This invention relates to the field of subway vehicle controller testing technology, specifically a subway vehicle controller analog signal amplifier board testing system. Background Technology

[0002] The metro vehicle controller is a crucial component of the metro vehicle electrical control system. It receives, processes, and outputs relevant electrical signals during vehicle operation to control and coordinate various functional units within the vehicle. The analog signal amplifier board, as one of the board-level functional units in the metro vehicle controller, primarily amplifies the input analog voltage signals and outputs the amplified signals to subsequent circuits or control components to meet the metro vehicle controller's requirements for processing and transmitting multiple analog signals. Therefore, the operating status of the analog signal amplifier board directly affects the metro vehicle controller's processing results for analog signals. Current testing of the metro vehicle controller's analog signal amplifier board typically involves testing personnel inputting test signals to the board and then collecting and analyzing the output signals to determine if each channel is functioning correctly.

[0003] However, in current technology, analog signal amplifier boards are usually tested based on the output results of a single stage. It is difficult to combine the differences between the actual output signals and theoretical output signals of each channel in different testing stages to make a comprehensive judgment on the status of each channel, which makes it inconvenient to test the working status of each channel of the analog signal amplifier board. Summary of the Invention

[0004] To address the shortcomings of existing technologies, this invention provides a detection system for analog signal amplifier boards of subway vehicle controllers. Based on a specific algorithm, it solves the problem that existing analog signal amplifier board detection systems struggle to comprehensively determine the status of each channel.

[0005] To achieve the above objectives, the present invention is implemented through the following technical solution: a detection system for analog signal amplifier boards of subway vehicle controllers, comprising controller A, controller B and the analog signal amplifier board to be tested; The controller A and the controller B are connected via an RS232 communication interface, and the controller A is equipped with host computer software. The controller B is provided with 8 analog output interfaces and 8 amplified signal input interfaces, and the measured analog signal amplification board is provided with 8 analog input interfaces and 8 amplified signal output interfaces. The eight analog output interfaces are connected to the eight analog input interfaces respectively, and the eight amplified signal output interfaces are connected to the eight amplified signal input interfaces respectively. The controller B is used to output test signals to the 8 analog input interfaces of the analog signal amplifier board under test according to a specific mathematical function through the 8 analog output interfaces. The analog signal amplifier board under test is used to amplify the input test signals and output amplified signals through the 8 amplified signal output interfaces. The controller B acquires the amplified signal through the 8-channel amplified signal input interface and performs analog-to-digital conversion on the acquired amplified signal; The controller B tests the analog signal amplifier board under test according to the test signals of the first test stage, the second test stage, and the third test stage. Based on the error parameters between the actual output signal and the theoretical output signal in each stage, and the deviation parameters between the rate of change of the actual output signal and the rate of change of the theoretical output signal, the controller B determines whether each channel of the analog signal amplifier board under test is qualified according to a specific algorithm, and verifies whether there is mutual interference between the amplified signal output channels. The controller A receives the sampling data sent by the controller B and displays the voltage curves of each channel.

[0006] Preferably, the analog signal amplifier board under test is an analog signal amplifier integrated circuit board in the subway controller; The analog signal amplifier board under test is based on a DSP chip and has 8 built-in DC voltage transformers. The 8 analog input interfaces correspond to 8 input signal channels, and the 8 amplified signal output interfaces correspond to 8 output signal channels. The analog signal amplifier board under test is used to amplify the input analog voltage signal.

[0007] Preferably, the controller B has 8 analog output interfaces, namely ADO1-ADO8; The output voltage range of ADO1-ADO8 is DC-5V to 5V; the 8-channel amplified signal input interface of the controller B is IN1-IN8, and the voltage range of the amplified signal received by IN1-IN8 is DC-25V to 25V. The 8 analog input interfaces of the analog signal amplifier board under test are ADI1-ADI8, and the 8 amplified signal output interfaces of the analog signal amplifier board under test are OUT1-OUT8.

[0008] Preferably, the controller B acquires the 8 amplified signals output by the analog signal amplifier board under test through IN1-IN8, and performs analog-to-digital conversion on the acquired 8 amplified signals every 200ns.

[0009] Preferably, the controller B outputs test signals to the eight analog input interfaces of the analog signal amplifier board under test through the eight analog output interfaces according to specific mathematical functions, based on the test signals of the first test stage, the second test stage, and the third test stage. It also calculates the cumulative error parameter between the actual output signal and the theoretical output signal, the rate of change parameter of the theoretical output signal, the rate of change parameter of the actual output signal, the deviation parameter between the rate of change of the actual output signal and the rate of change of the theoretical output signal, and the cumulative deviation parameter of the rate of change according to specific algorithms for each stage.

[0010] Preferably, the controller B determines the pass / fail status of each channel of the analog signal amplifier board under test based on the cumulative error parameters between the actual output signals and the theoretical output signals of each channel in the first test stage, the second test stage, and the third test stage, as well as the cumulative deviation parameters between the rate of change of the actual output signal and the rate of change of the theoretical output signal, according to a specific algorithm.

[0011] Preferably, the controller B compares the cumulative error parameter between the actual output signal and the theoretical output signal of each channel in the first test stage, the second test stage and the third test stage with the corresponding error threshold, and compares the cumulative parameter of the rate of change deviation between the actual output signal change rate and the theoretical output signal change rate with the corresponding deviation threshold. Based on a specific algorithm, the controller determines whether each channel is qualified according to the comparison results.

[0012] Preferably, the first testing phase corresponds to a first error threshold and a first deviation threshold, the second testing phase corresponds to a second error threshold and a second deviation threshold, and the third testing phase corresponds to a third error threshold and a third deviation threshold.

[0013] Preferably, the controller B performs simultaneous pairwise detection on each amplified signal output channel of the analog signal amplifier board under test to verify whether there is mutual interference between the amplified signal output channels.

[0014] Preferably, when the controller B performs simultaneous pairwise detection on each amplified signal output channel, it collects the output signal of the excited channel and the output signals of the other channels, and determines whether there is mutual interference between each amplified signal output channel based on the comparison result of the output signal of the unexcited channel and the preset interference threshold according to a specific algorithm.

[0015] This invention provides a detection system for analog signal amplifier boards in subway vehicle controllers. It offers the following advantages: 1. This invention establishes a detection system by setting up controller A, controller B, and the analog signal amplifier board under test. It uses test signals from the first test stage, the second test stage, and the third test stage to detect each channel. Based on a specific algorithm combined with cumulative error parameters and cumulative rate of change deviation parameters, it makes a judgment, thereby realizing the phased detection and judgment of the status of each channel of the analog signal amplifier board.

[0016] 2. This invention outputs test signals, collects and amplifies signals and performs analog-to-digital conversion through controller B, and then controller A receives the sampled data and displays the voltage curves of each channel, so that the signal input, data acquisition and result display in the detection process form a unified process, which makes it easy to obtain the output changes of each channel in the detection process.

[0017] 3. This invention performs output detection on each channel while simultaneously detecting each pair of amplified signal output channels. It also determines whether there is mutual interference between channels based on the comparison result between the output signal of the unexcited channel and the preset interference threshold, thereby enabling simultaneous channel output status detection and channel interference detection. Attached Figure Description

[0018] Figure 1 This is an architectural diagram of a subway vehicle controller analog signal amplifier board detection system according to the present invention. Detailed Implementation

[0019] The technical solution of the present invention will now be clearly and completely described with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0020] Please see the appendix Figure 1 This invention provides a detection system for analog signal amplifier boards of subway vehicle controllers, including controller A, controller B, and the analog signal amplifier board under test. Controller A and Controller B are connected via an RS232 communication interface. Controller A has host computer software installed. Controller B is equipped with 8 analog output interfaces and 8 amplified signal input interfaces, and the analog signal amplifier board under test is equipped with 8 analog input interfaces and 8 amplified signal output interfaces. The 8 analog output interfaces are connected to the 8 analog input interfaces respectively, and the 8 amplified signal output interfaces are connected to the 8 amplified signal input interfaces respectively. Controller B is used to output test signals to the 8 analog input interfaces of the analog signal amplifier board under test through the 8 analog output interfaces. The analog signal amplifier board under test is used to amplify the input test signals and output amplified signals through the 8 amplified signal output interfaces. Controller B acquires amplified signals through an 8-channel amplified signal input interface and performs analog-to-digital conversion on the acquired amplified signals; Controller B tests the analog signal amplifier board under test according to the test signals of the first test stage, the second test stage, and the third test stage. Based on specific algorithms, it determines whether each channel of the analog signal amplifier board under test is qualified according to the error parameters between the actual output signal and the theoretical output signal in each stage, as well as the deviation parameters between the actual output signal change rate and the theoretical output signal change rate. It also verifies whether there is mutual interference between the amplified signal output channels. Controller A receives the sampling data sent by Controller B and displays the voltage curves of each channel.

[0021] Specifically, the system includes controller A, controller B, and a measured analog signal amplifier board. Controller A and controller B are connected via an RS232 communication interface. Controller A has host computer software installed for data interaction with controller B. Controller B is equipped with 8 analog output interfaces and 8 amplified signal input interfaces. The measured analog signal amplifier board is equipped with 8 analog input interfaces and 8 amplified signal output interfaces. The 8 analog output interfaces of controller B are connected to the 8 analog input interfaces of the measured analog signal amplifier board, and the 8 amplified signal input interfaces of controller B are connected to the 8 amplified signal output interfaces of the measured analog signal amplifier board, thus forming the input path of the test signal and the acquisition path of the amplified signal in the detection system. In this embodiment, controller B outputs test signals to the 8 analog input interfaces of the analog signal amplifier board under test through its 8 analog output interfaces. After receiving the test signals, the analog signal amplifier board under test amplifies the input test signals and outputs the corresponding amplified signals through its 8 amplified signal output interfaces. Controller B collects the amplified signals through its 8 amplified signal input interfaces and performs analog-to-digital conversion on the collected amplified signals to obtain the sampling data of each output channel of the analog signal amplifier board under test during the detection process. Controller B sends the sampling data to controller A. After receiving the sampling data, controller A displays the voltage curves of each channel through the host computer software, thereby forming a visual display of the output status of the analog signal amplifier board under test. Simultaneously, controller B tests the analog signal amplifier board under test according to the test signals of the first test stage, the second test stage, and the third test stage. In the specific testing process, controller B outputs test signals of different stages in sequence and collects the output signals of the analog signal amplifier board under test in each testing stage. Based on the actual output signals collected in each testing stage, combined with the corresponding theoretical output signals, controller B calculates the error parameters between the actual output signals and the theoretical output signals in each stage, as well as the deviation parameters between the rate of change of the actual output signals and the rate of change of the theoretical output signals, according to a specific algorithm. Based on the parameters, controller B determines whether each channel of the analog signal amplifier board under test is qualified. In addition, during the detection and judgment of each channel, controller B also verifies whether there is mutual interference between each amplified signal output channel. After controller A, controller B and the analog signal amplification board under test work together according to the above structural relationship and workflow, they can complete the detection of the analog signal amplification board of the subway vehicle controller and output the detection results and curve display results of each channel.

[0022] The analog signal amplifier board under test is the analog signal amplifier integrated circuit board in the subway controller; The analog signal amplifier board under test is based on a DSP chip and has 8 built-in DC voltage transformers. It has 8 analog input interfaces corresponding to 8 input signal channels and 8 amplified signal output interfaces corresponding to 8 output signal channels. The analog signal amplifier board under test is used to amplify the input analog voltage signal.

[0023] Specifically, the object under test is the analog signal amplification integrated circuit board installed in the subway controller. This analog signal amplification integrated circuit board is connected to the detection circuit as the analog signal amplification board under test in the detection system of this invention. The analog signal amplification board under test receives the externally input analog voltage signal, amplifies the received analog voltage signal and outputs it to meet the requirements of the relevant analog signal processing links in the subway controller for voltage amplitude and output channel. Therefore, using this analog signal amplification board as the object of test can directly correspond to the actual board that needs to be tested in the subway controller. In terms of specific structure, the analog signal amplifier board under test uses a DSP chip as the core to form the on-board control and signal processing unit. During the operation of the board, the DSP chip is used to cooperate with the on-board circuit to process the input signal and manage the channel, so that the analog signal amplifier board under test has the basis to receive, process and output multiple analog voltage signals. At the same time, the analog signal amplifier board under test has eight built-in DC voltage transformers. The DC voltage transformers are used to cooperate with the on-board amplification circuit to perform corresponding voltage processing on the input signal, so that the input analog voltage signal completes the corresponding voltage transformation and amplification transmission process on the board. Through the cooperation of the DSP chip and the DC voltage transformers, the analog signal amplifier board under test forms a board-level structure suitable for processing multiple analog signals. Meanwhile, the analog signal amplifier board under test is equipped with 8 analog input interfaces and 8 amplified signal output interfaces. The 8 analog input interfaces correspond to 8 input signal channels, and the 8 amplified signal output interfaces correspond to 8 output signal channels. That is to say, the analog voltage signal input to the analog signal amplifier board under test can enter the corresponding input signal channel through the corresponding input interface, be amplified in the board, and then be output from the corresponding output signal channel through the corresponding output interface. With the above-mentioned 8 input signal channels and 8 output signal channels, the analog signal amplifier board under test can perform channelized processing on multiple input analog voltage signals, thereby matching the multi-channel test signal output and multi-channel amplified signal acquisition method in the detection system of the present invention. In this embodiment, after the analog signal amplifier board under test is connected to the detection system of the present invention, its 8 analog input interfaces are used to receive the test analog voltage signal output by the detection system. Each input signal channel in the board transmits and processes the corresponding input signal, and the input analog voltage signal is amplified by the amplifier circuit in the board. Then, the amplified signal is output from the 8-channel amplified signal output interface by the corresponding 8 output signal channels. Thus, the detection system can detect the multi-channel signal amplification function of the analog signal amplifier board under test based on the correspondence between each input channel and each output channel. By adopting the above-mentioned board structure, the analog signal amplifier board under test serves as the actual component under test in the subway controller of the present invention's detection system. It can realize multi-channel amplification and output of the input analog voltage signal, thereby providing a board-level implementation basis for its interface configuration, signal range, acquisition and conversion method, as well as parameter calculation and status determination at each detection stage.

[0024] The controller B has 8 analog output interfaces, namely ADO1-ADO8; The output voltage range of ADO1-ADO8 is DC-5V to 5V; the 8-channel amplified signal input interface of controller B is IN1-IN8, and the voltage range of the amplified signal received by IN1-IN8 is DC-25V to 25V; The 8 analog input interfaces of the analog signal amplifier board under test are ADI1-ADI8, and the 8 amplified signal output interfaces of the analog signal amplifier board under test are OUT1-OUT8.

[0025] Specifically, controller B, as the detection execution end, has its interface settings matched with those of the analog signal amplifier board under test. This is used to realize test signal output and amplified signal feedback. Specifically, controller B has 8 analog output interfaces, namely ADO1-ADO8. These 8 analog output interfaces are used to output test analog voltage signals to the analog signal amplifier board under test. To adapt to the test requirements of the input end of the analog signal amplifier board under test, the output voltage range of ADO1-ADO8 is set to DC-5V to 5V, so that controller B can output preset test signals within this voltage range and load them to the analog signal amplifier board under test through the corresponding interfaces. Corresponding to the analog output interface of controller B, the analog signal amplifier board under test is equipped with 8 analog input interfaces, namely ADI1-ADI8. In actual testing, the test signal output by controller B is input to ADI1-ADI8 of the analog signal amplifier board under test via ADO1-ADO8, so that the test signal can enter the internal part of the analog signal amplifier board under test according to the predetermined channel relationship. That is, ADO1 is connected to ADI1, ADO2 is connected to ADI2, and the other interfaces are connected in the same way. This constitutes the interface basis for controller B to input test signals to the analog signal amplifier board under test. By setting the 8 analog output interfaces of controller B to correspond with the 8 analog input interfaces of the analog signal amplifier board under test, each test signal can enter the corresponding input channel, so as to detect the amplification output of each channel in the future. Furthermore, controller B is equipped with 8 amplified signal input interfaces, namely IN1-IN8, for receiving amplified signals output from the analog signal amplifier board under test. The voltage range of the amplified signals received by IN1-IN8 is set to DC-25V to 25V to match the voltage signal range amplified at the output of the analog signal amplifier board under test. Correspondingly, the analog signal amplifier board under test is equipped with 8 amplified signal output interfaces, namely OUT1-OUT8. During the test, the analog signal amplifier board under test amplifies the input test analog voltage signal and outputs it through OUT1-OUT8. Controller B then receives the amplified output signal through IN1-IN8. Specifically, OUT1 is connected to IN1, OUT2 is connected to IN2, and the other output interfaces and input interfaces are connected in the same way, thus forming an interface path where the analog signal amplifier board under test outputs amplified signals and controller B receives amplified signals. In this embodiment, by configuring controller B with two sets of interfaces, ADO1-ADO8 and IN1-IN8, and configuring the analog signal amplifier board under test with two sets of interfaces, ADI1-ADI8 and OUT1-OUT8, controller B can both input test signals to the analog signal amplifier board under test and receive amplified signals output by the analog signal amplifier board under test, thus forming a complete signal input and signal acquisition interface structure. Among them, ADO1-ADO8 and ADI1-ADI8 together constitute the test signal input path, and OUT1-OUT8 and IN1-IN8 together constitute the amplified signal acquisition path. Based on the above interface configuration and voltage range settings, controller B can complete the test signal loading and output signal reception after being connected to the analog signal amplifier board under test, providing an interface implementation basis for subsequent sampling, analog-to-digital conversion, and detection calculation.

[0026] Controller B acquires the 8 amplified signals output by the analog signal amplifier board under test through IN1-IN8, and performs analog-to-digital conversion on the acquired 8 amplified signals every 200ns.

[0027] Specifically, controller B acquires the 8 amplified signals output by the analog signal amplifier board under test through its input interfaces IN1-IN8. After the analog signal amplifier board under test completes the amplification of the input test signal, it outputs the corresponding amplified signal to controller B's IN1-IN8 through the 8 amplified signal output interfaces. Controller B receives the 8 amplified signals and continuously acquires them according to a preset sampling rhythm. In order to convert the acquired analog signals into digital signals that can be used for subsequent detection and calculation, controller B performs an analog-to-digital conversion on the acquired 8 amplified signals every 200ns, thereby obtaining the timing sampling data of each output channel during the detection process. The timing sampling data is used for subsequent calculation and analysis of the difference between the actual output signal and the theoretical output signal and the output signal change process at each detection stage.

[0028] Controller B outputs test signals to the 8 analog input interfaces of the analog signal amplifier board under test through the 8 analog output interfaces according to the test signals of the first test stage, the second test stage, and the third test stage. It also calculates the cumulative error parameter between the actual output signal and the theoretical output signal, the theoretical output signal rate of change parameter, the actual output signal rate of change parameter, the deviation parameter between the actual output signal rate of change and the theoretical output signal rate of change, and the cumulative deviation parameter of the rate of change in each stage.

[0029] Specifically, in each detection stage, controller B outputs the corresponding test signal to the eight analog input interfaces of the analog signal amplifier board under test through the eight analog output interfaces, and collects the actual output signal output by the analog signal amplifier board under test in that stage. Subsequently, based on the relationship between the actual output signal and the theoretical output signal in each stage, controller B calculates the cumulative error parameter between the actual output signal and the theoretical output signal, the rate of change parameter of the theoretical output signal, the rate of change parameter of the actual output signal, the deviation parameter between the rate of change of the actual output signal and the rate of change of the theoretical output signal, and the cumulative deviation parameter of the rate of change according to a specific algorithm, thereby providing a parameter basis for subsequent status determination of each channel. In one embodiment, during the first testing phase, the analog output interfaces ADO1, ADO2...AD07 and ADO8 of controller B are all in U... 1ADOX The (t) function outputs externally (x: represents the ADO channel number);

[0030] Then controller B calculates the following parameters: ; ; ; ; ; The actual output voltage of the amplifier board in the first test phase differs from the theoretical output voltage. -t 1rj arrive The cumulative error function over the interval; U 1INx(t) The voltage function of the actual output of the amplifier board is acquired by controller B in the first test phase; The input signal voltage function of the amplifier board in the first test stage; The interval length constant is calculated by integrating the deviation between the actual output voltage and the theoretical output voltage of the amplifier board in the first test stage, and its value is 0.0215. The interval length constant is calculated by differentiating the input signal voltage of the amplifier board in the first test stage, and its value is 0.00153. The theoretical output voltage change rate function of the amplifier board in the first test stage; The first test phase uses the actual output voltage change rate function of the amplifier board acquired by controller B. This is the deviation function between the actual output voltage change rate of the amplifier board and the input signal voltage change rate during the first test phase. This is the cumulative function of the deviation between the actual output voltage change rate of the amplifier board and the input signal voltage change rate during the first test phase. like Maximum value If the x channel of the amplifier board is not qualified (x=1, 2, 3, 4, 5, 6, 7 and 8), then it is considered that the x channel is not qualified. like Maximum value If the x channel of the amplifier board is not qualified (x=1, 2, 3, 4, 5, 6, 7 and 8), then it is considered that the x channel is not qualified.

[0031] The value is a constant representing the interval length of the deviation between the actual output voltage change rate and the input signal voltage change rate of the amplifier board in the first test stage, and is set to 0.0182. In the second testing phase, the analog output interfaces ADO1, ADO2...ADO7 and ADO8 of controller B were all... Output to external channel (x: represents the ADO channel number); ; Then controller B calculates the following parameters: ; ; ; ; ; The actual output voltage of the amplifier board in the second test phase differs from the theoretical output voltage. -t 2rj / 2 to +t 2rj The cumulative error function in the interval / 2; The voltage function actually output by the amplifier board is acquired by controller B in the second test phase; The input signal voltage function of the amplifier board in the second test stage; The interval length constant is calculated by integrating the deviation between the actual output voltage and the theoretical output voltage of the amplifier board in the second test stage, and its value is 0.0198. The interval length constant is calculated for the differential of the input signal voltage of the amplifier board in the second test stage, and its value is 0.00136. The theoretical output voltage change rate function of the amplifier board in the second test stage; The second test phase uses the actual output voltage change rate function of the amplifier board acquired by controller B. The deviation function between the actual output voltage change rate of the amplifier board and the input signal voltage change rate during the second test phase; This is the cumulative function of the deviation between the actual output voltage change rate of the amplifier board and the input signal voltage change rate during the second test phase. The interval length constant is the deviation between the actual output voltage change rate of the amplifier board and the input signal voltage change rate in the second test stage, and its value is 0.0156. like Maximum value If the x channel of the amplifier board is not qualified (x=1,2,3,4,5,6,7 and8), then it is considered that the x channel is not qualified. like Maximum value If the x channel of the amplifier board is not qualified (x=1,2,3,4,5,6,7 and8), then it is considered that the x channel is not qualified. In the third testing phase, the analog output interfaces ADO1, ADO2..., ADO7 and ADO8 of controller B were all... Output to external channel (x: represents the ADO channel number); ; Then controller B calculates the following parameters: ; ; ; ; ; The actual output voltage of the amplifier board in the third test stage differs from the theoretical output voltage. arrive The cumulative error function over the interval; The voltage function of the actual output of the amplifier board is acquired by controller B in the third test phase; The input signal voltage function of the amplifier board in the third test stage; The interval length constant is calculated by integrating the deviation between the actual output voltage and the theoretical output voltage of the amplifier board in the third test stage, and its value is 0.0185. The interval length constant is calculated by differentiating the input signal voltage of the amplifier board in the third test stage, and its value is 0.00128. The theoretical output voltage change rate function of the amplifier board in the third test stage; The third test phase uses the actual output voltage change rate function of the amplifier board acquired by controller B. This is the deviation function between the actual output voltage change rate of the amplifier board and the input signal voltage change rate during the third test phase. The cumulative function of the deviation between the actual output voltage change rate and the input signal voltage change rate of the amplifier board in the third test stage; The interval length constant is the deviation between the actual output voltage change rate of the amplifier board and the input signal voltage change rate in the third test stage, with a value of 0.0169. like If the maximum value is ≥1.685, then the x channel of the amplifier board is considered unqualified (x=1, 2, 3, 4, 5, 6, 7 and 8). like If the maximum value is ≥0.568, the x channel of the amplifier board is considered unqualified (x=1, 2, 3, 4, 5, 6, 7 and 8).

[0032] Controller B determines the pass / fail status of each channel of the analog signal amplifier board under test based on the cumulative error parameters between the actual output signals and the theoretical output signals of each channel in the first, second, and third test phases, as well as the cumulative deviation parameters between the rate of change of the actual output signals and the rate of change of the theoretical output signals.

[0033] Specifically, in one embodiment of the present invention, after completing the test signal output, amplified signal acquisition, and corresponding parameter calculation in the first, second, and third test stages, controller B further determines the pass / fail status of each channel of the analog signal amplifier board under test based on a specific algorithm and the parameter calculation results in each detection stage. Specifically, controller B, on a channel-by-channel basis, reads and summarizes the cumulative error parameter between the actual output signal and the theoretical output signal obtained in the first, second, and third test stages, as well as the cumulative deviation parameter of the rate of change between the actual output signal and the theoretical output signal, and uses the above parameters as the basis for the detection and judgment of the x-th channel. Subsequently, controller B comprehensively analyzes the output process of the channel under the three detection stages based on the cumulative error parameters and cumulative rate of change deviation parameters corresponding to each stage to determine whether the channel meets the detection requirements. On this basis, controller B performs the same judgment process on the eight channels in sequence according to a specific algorithm, thereby obtaining the pass / fail judgment results of all channels of the analog signal amplifier board under test. In the above way, controller B does not judge the channel status based on only a certain stage or a single parameter, but combines the cumulative error parameters and cumulative rate of change deviation parameters of each channel under the three detection stages to make an overall judgment on the output status of each channel, thereby forming the pass / fail judgment results of each channel of the analog signal amplifier board under test.

[0034] Controller B compares the cumulative error parameters between the actual output signals and the theoretical output signals of each channel in the first, second, and third test phases with the corresponding error thresholds, and compares the cumulative deviation parameter between the rate of change of the actual output signal and the rate of change of the theoretical output signal with the corresponding deviation thresholds. Based on a specific algorithm, it determines whether each channel is qualified according to the comparison results.

[0035] Specifically, after calculating the cumulative error parameters and rate of change deviation cumulative parameters for each channel in the first, second, and third testing phases according to a specific algorithm, controller B further compares the corresponding parameters for each phase with preset thresholds to determine whether each channel is qualified. For example, for channel x, controller B reads the cumulative error parameters between the actual output signal and the theoretical output signal in the first, second, and third testing phases, and compares the cumulative error parameters for each phase with the preset error thresholds for the corresponding phases. Simultaneously, controller B reads the rate of change of the actual output signal and the rate of change of the theoretical output signal in the first, second, and third testing phases. The controller calculates the cumulative error parameter of the rate of change deviation and compares it with the preset deviation threshold for each stage. If the cumulative error parameter of a channel exceeds the corresponding error threshold in a certain stage, or if the cumulative error parameter of the rate of change deviation of the channel exceeds the corresponding deviation threshold, then the detection result of the channel in that stage is deemed unqualified based on a specific algorithm. If the cumulative error parameter of the channel does not exceed the corresponding error threshold in any of the three detection stages, and the cumulative error parameter of the rate of change deviation does not exceed the corresponding deviation threshold, then the channel is deemed qualified. In this way, the controller B judges each channel of the analog signal amplifier board under test based on the comparison results between the parameters of each stage and the corresponding thresholds.

[0036] The first testing phase corresponds to the first error threshold and the first deviation threshold, the second testing phase corresponds to the second error threshold and the second deviation threshold, and the third testing phase corresponds to the third error threshold and the third deviation threshold.

[0037] Specifically, to enable controller B to make corresponding determinations on the detection parameters of each channel in the first, second, and third testing stages, threshold parameters corresponding to each other are pre-set for the three testing stages. Specifically, the first testing stage corresponds to the first error threshold and the first deviation threshold, the second testing stage corresponds to the second error threshold and the second deviation threshold, and the third testing stage corresponds to the third error threshold and the third deviation threshold. After calculating the cumulative error parameters and cumulative rate of change deviation parameters for each stage, controller B compares the cumulative error parameters obtained in the first testing stage with the first error threshold, and compares the cumulative rate of change deviation parameters obtained in the first testing stage with the first deviation threshold. Similarly, it compares the cumulative error parameters obtained in the second testing stage with the second error threshold, and compares the cumulative rate of change deviation parameters obtained in the second testing stage with the second deviation threshold. Finally, it compares the cumulative error parameters obtained in the third testing stage with the third error threshold, and compares the cumulative rate of change deviation parameters obtained in the third testing stage with the third deviation threshold. This achieves phased corresponding determination of the parameters of each channel in the three testing stages.

[0038] Controller B performs simultaneous pairwise detection on each amplified signal output channel of the analog signal amplifier board under test to verify whether there is mutual interference between the amplified signal output channels.

[0039] Specifically, while performing output detection on each channel of the analog signal amplifier board under test, controller B also performs pairwise simultaneous detection on each amplified signal output channel to verify whether there is mutual interference between different amplified signal output channels. In practice, controller B uses any two amplified signal output channels as a group of detection objects. While applying a test signal to one channel and acquiring its output response, it simultaneously acquires the output state of the other channel and compares and analyzes the output results of the two channels in the same detection process to determine whether the input excitation or output change of one channel affects the output of the other channel. Afterward, controller B performs sequential combination detection on each amplified signal output channel in the above manner, thereby completing the pairwise simultaneous verification between each amplified signal output channel and determining whether there is mutual interference between the amplified signal output channels of the analog signal amplifier board under test.

[0040] When the controller B performs simultaneous pairwise detection on each amplified signal output channel, it collects the output signal of the excited channel and the output signals of the other channels, and determines whether there is mutual interference between each amplified signal output channel based on the comparison result of the output signal of the unexcited channel and the preset interference threshold.

[0041] Specifically, when controller B performs simultaneous pairwise detection on each amplified signal output channel, it first selects one channel as the excited channel and inputs a test signal to the excited channel through the corresponding analog output interface, causing the corresponding channel of the analog signal amplifier board under test to generate an output response. While the excited channel outputs a response, controller B simultaneously acquires the output signal of the excited channel and the output signals of the remaining unexcited channels through each amplified signal input interface, and compares the acquired output signals of the unexcited channels with a preset interference threshold. When the output signal of any unexcited channel exceeds the interference threshold, it is determined that there is mutual interference between the unexcited channel and the currently excited channel. Afterwards, controller B switches the excited channels sequentially in the same manner and repeats the above detection process to complete the interference detection between each amplified signal output channel, thereby obtaining the determination result of whether there is mutual interference between each amplified signal output channel of the analog signal amplifier board under test.

[0042] Although embodiments of the invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A detection system for analog signal amplifier boards of subway vehicle controllers, characterized in that, Includes controller A, controller B, and an amplifier board for the analog signal under test; The controller A and the controller B are connected via an RS232 communication interface, and the controller A is equipped with host computer software. The controller B is provided with 8 analog output interfaces and 8 amplified signal input interfaces, and the measured analog signal amplification board is provided with 8 analog input interfaces and 8 amplified signal output interfaces. The eight analog output interfaces are respectively connected to the eight analog input interfaces, and the eight amplified signal output interfaces are respectively connected to the eight amplified signal input interfaces. The controller B is used to output test signals to the 8 analog input interfaces of the analog signal amplifier board under test according to a specific mathematical function through the 8 analog output interfaces. The analog signal amplifier board under test is used to amplify the input test signals and output amplified signals through the 8 amplified signal output interfaces. The controller B acquires the amplified signal through the 8-channel amplified signal input interface and performs analog-to-digital conversion on the acquired amplified signal; The controller B tests the analog signal amplifier board under test according to the test signals of the first test stage, the second test stage, and the third test stage. It calculates the error parameters between the actual output signal and the theoretical output signal in each stage, as well as the deviation parameters between the rate of change of the actual output signal and the rate of change of the theoretical output signal, based on specific algorithms. It then determines whether each channel of the analog signal amplifier board under test is qualified and verifies whether there is mutual interference between the amplified signal output channels. The controller A receives the sampling data sent by the controller B and displays the voltage curves of each channel.

2. The detection system for analog signal amplifier board of a subway vehicle controller according to claim 1, characterized in that, The analog signal amplifier board being measured is the analog signal amplifier integrated circuit board in the subway controller. The analog signal amplifier board under test is based on a DSP chip and has 8 built-in DC voltage transformers. The 8 analog input interfaces correspond to 8 input signal channels, and the 8 amplified signal output interfaces correspond to 8 output signal channels. The analog signal amplifier board under test is used to amplify the input analog voltage signal.

3. The detection system for analog signal amplifier board of a subway vehicle controller according to claim 1, characterized in that, The controller B has 8 analog output interfaces, namely ADO1-ADO8. The output voltage range of ADO1-ADO8 is DC-5V to 5V; the 8-channel amplified signal input interface of the controller B is IN1-IN8, and the voltage range of the amplified signal received by IN1-IN8 is DC-25V to 25V; The 8 analog input interfaces of the analog signal amplifier board under test are ADI1-ADI8, and the 8 amplified signal output interfaces of the analog signal amplifier board under test are OUT1-OUT8.

4. The detection system for analog signal amplifier board of a subway vehicle controller according to claim 3, characterized in that, The controller B acquires the eight amplified signals output by the analog signal amplifier board under test through IN1-IN8, and performs analog-to-digital conversion on the eight amplified signals every 200ns.

5. The subway vehicle controller analog signal amplifier board detection system according to claim 4, characterized in that, The controller B outputs test signals to the 8 analog input interfaces of the analog signal amplifier board under test through the 8 analog output interfaces according to specific mathematical functions for the test signals of the first test stage, the second test stage, and the third test stage. It also calculates the cumulative error parameter between the actual output signal and the theoretical output signal, the rate of change parameter of the theoretical output signal, the rate of change parameter of the actual output signal, the deviation parameter between the rate of change of the actual output signal and the rate of change of the theoretical output signal, and the cumulative deviation parameter of the rate of change according to specific algorithms for each stage.

6. The detection system for analog signal amplifier board of a subway vehicle controller according to claim 5, characterized in that, The controller B determines the pass / fail status of each channel of the analog signal amplifier board under test based on the cumulative error parameters between the actual output signals and the theoretical output signals of each channel in the first test phase, the second test phase, and the third test phase, as well as the cumulative deviation parameters between the rate of change of the actual output signals and the rate of change of the theoretical output signals, according to a specific algorithm.

7. The detection system for analog signal amplifier board of a subway vehicle controller according to claim 6, characterized in that, The controller B compares the cumulative error parameters between the actual output signal and the theoretical output signal of each channel in the first test stage, the second test stage and the third test stage with the corresponding error thresholds, and compares the cumulative parameter of the rate of change deviation between the actual output signal change rate and the theoretical output signal change rate with the corresponding deviation thresholds according to a specific algorithm, and determines whether each channel is qualified based on the comparison results.

8. The detection system for analog signal amplifier board of a subway vehicle controller according to claim 7, characterized in that, The first test phase corresponds to a first error threshold and a first deviation threshold, the second test phase corresponds to a second error threshold and a second deviation threshold, and the third test phase corresponds to a third error threshold and a third deviation threshold.

9. The detection system for analog signal amplifier board of a subway vehicle controller according to claim 1, characterized in that, The controller B performs simultaneous pairwise detection on each amplified signal output channel of the analog signal amplifier board under test to verify whether there is mutual interference between the amplified signal output channels.

10. A detection system for analog signal amplifier boards of subway vehicle controllers according to claim 9, characterized in that, When the controller B performs simultaneous pairwise detection on each amplified signal output channel, it collects the output signal of the excited channel and the output signals of the other channels, and determines whether there is mutual interference between each amplified signal output channel based on the comparison result of the output signal of the unexcited channel and the preset interference threshold.

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