A testability index assignment method

Abstract

This application provides a method for allocating testability indicators, belonging to the technical field of testability indicator allocation. The method includes: determining the equipment categories included in the equipment; determining the testability indicator allocation content for each equipment category, wherein the testability indicator allocation content includes fault detection rate and fault isolation rate; decomposing the equipment system level by level to the field replaceable unit level according to the equipment's physical architecture hierarchy; determining the allocation objects of testability indicators based on the equipment categories and the number of field replaceable units included in the equipment; allocating indicators according to the determined allocation objects; and recording and summarizing the allocation results in a testability indicator allocation table. This invention's testability indicator allocation method is based on the system's physical architecture, enabling the allocation of testability indicators to better align with the actual design of the equipment system, and resulting in more explicit and clear allocation results.

Description

Technical Field

[0001] This application belongs to the field of test index allocation technology, and specifically relates to a test index allocation method. Background Technology

[0002] Modern aviation equipment is becoming increasingly complex and functionally diverse, posing challenges to its testing and maintenance. Testability design is a key technology for improving equipment testing and diagnostics. Testability index allocation is a crucial component of testability design; it distributes given system-level testability indexes hierarchically downwards, determining the testability indexes for subsystems, components, or assemblies, thus providing a basis for subsystem- or component-level testability design. Therefore, testability index allocation is of great significance to testability design.

[0003] Traditional testability index allocation methods have shortcomings such as difficulty in obtaining accurate judgment results, lack of objectivity and reliability, and lack of systematization. Furthermore, with the rapid development of aviation equipment, system-level faults and test elements are becoming more complex, making fault isolation more difficult and further leading to inaccurate allocation results, which greatly hinders the smooth progress of testability design work. Summary of the Invention

[0004] The purpose of this application is to provide a method for assigning test metrics to solve or mitigate at least one of the problems in the prior art.

[0005] The technical solution of this application is: a method for allocating test indicators, including:

[0006] The equipment categories included in the equipment are determined, and the testability index allocation content for each equipment category is determined according to the equipment category. The testability index allocation content includes fault detection rate and fault isolation rate.

[0007] Based on the physical architecture hierarchy of the equipment, the equipment system is decomposed down to the level of replaceable units in the field.

[0008] The allocation of test performance indicators is determined based on the types of equipment included in the equipment and the number of field-replaceable units.

[0009] The indicators are allocated based on the identified test indicator allocation targets;

[0010] Record and summarize the allocation results in the testability index allocation table.

[0011] In at least one embodiment of this application, the equipment category includes electromechanical and electronic types.

[0012] In at least one embodiment of this application, when the equipment system is decomposed down to the field replaceable unit level according to the physical architecture hierarchy of the equipment, the equipment system is the top layer, the subsystems and equipment are the middle layer, and the field replaceable unit is the bottom layer.

[0013] In at least one embodiment of this application, the fault detection rate index is allocated to electronic devices and electromechanical devices with controllers;

[0014] The fault isolation rate index is allocated to electronic devices and electromechanical devices with controllers that have a number of field replaceable units N greater than or equal to 2 and whose functions are interconnected between the field replaceable units. The index allocation content is the fault isolation rate when isolated to 1, 2...N-1 field replaceable units.

[0015] In at least one embodiment of this application, the method for allocating testability indicators for electronic subsystems is as follows:

[0016] The fault detection rate index of electronic subsystems adopts the equal value allocation method, that is, the fault detection rate index of the equipment is equal to the fault detection rate index required by the equipment; the fault isolation rate index of electronic subsystems adopts the equal value allocation method, that is, the fault isolation rate index of the equipment is equal to the fault isolation rate index required by the equipment.

[0017] In at least one embodiment of this application, the method for allocating testability indicators for electromechanical subsystems is as follows:

[0018] For electromechanical equipment with controllers in the electromechanical subsystem, the fault detection rate index adopts the equal value allocation method, that is, the fault detection rate index of the equipment is equal to the fault detection rate index required by the equipment. The fault isolation rate index adopts the equal value allocation method, that is, the fault isolation rate index of the equipment is equal to the fault isolation rate index required by the equipment.

[0019] For electronic equipment in the electromechanical subsystem, the fault detection rate index shall be in accordance with the fault detection rate index requirements of the electronic subsystem, and the fault isolation rate index shall be in accordance with the fault isolation rate index requirements of the electronic subsystem.

[0020] The testability index allocation method of this invention is based on the system physical architecture, which enables the allocation of testability indexes to better conform to the actual design of the equipment system, and the allocation results to be more clear and explicit. Attached Figure Description

[0021] To more clearly illustrate the technical solutions provided in this application, the accompanying drawings will be briefly described below. Obviously, the drawings described below are merely some embodiments of this application.

[0022] Figure 1 This is a schematic diagram of the test index allocation method of the present invention.

[0023] Figure 2 This is a schematic diagram of the physical architecture hierarchy of aviation equipment according to an embodiment of the present invention. Detailed Implementation

[0024] To make the objectives, technical solutions, and advantages of this application clearer, the technical solutions in the embodiments of this application will be described in more detail below with reference to the accompanying drawings.

[0025] To address the issues of inaccurate and unobjective allocation of testability indicators in existing technologies, as mentioned in the background section, this application proposes a testability indicator allocation method. This method allocates testability indicators from the overall equipment to physical entities such as field replaceable units (LRUs) in a top-down manner. Based on the physical architecture of the equipment, the allocation objects are more clearly defined, making the allocation of testability indicators more consistent with the actual equipment design. This method is of great significance for positive design of equipment testability and improving the level of equipment testability.

[0026] like Figure 1 As shown, the testability index allocation method provided in this application includes the following steps:

[0027] Step S1: Determine the equipment categories included in the equipment, and determine the testability index allocation content for each equipment category according to the equipment category. The testability index allocation content generally includes fault detection rate and fault isolation rate.

[0028] For example, in this embodiment of the invention, the equipment includes an electromechanical subsystem and an electronic subsystem. The fault detection rate requirement for the electromechanical subsystem is 80%, and the fault isolation rate requirement is 70% (isolated to 1 LRU), 80% (isolated to 2 LRUs), and 90% (isolated to 3 LRUs). The fault detection rate requirement for the electronic subsystem is 85%, and the fault isolation rate requirement is 75% (isolated to 1 LRU), 85% (isolated to 2 LRUs), and 95% (isolated to 3 LRUs).

[0029] Step S2: Decompose the equipment system down to the field replaceable unit (LRU) level according to the physical architecture hierarchy of the equipment.

[0030] like Figure 2The diagram illustrates the physical architecture of the equipment in this embodiment of the invention, with the equipment at the top layer, subsystems at the first intermediate layer, devices at the second intermediate layer, and field replaceable units (LRUs) at the bottom layer. In this embodiment, a certain aviation equipment includes an electromechanical subsystem, an electronic subsystem, and other subsystems. The electromechanical subsystem includes device 1 and device 2. Device 1 is further decomposed into three LRUs—LRU1, LRU2, and LRU3. Device 2 is further decomposed into four LRUs—LRU4, LRU6, and LRU7. Similarly, the electronic subsystem includes device 3, which is further decomposed into two LRUs—LRU8 and LRU9. This completes the decomposition of the aviation equipment.

[0031] Step S3: Determine the allocation of test performance indicators based on the equipment category (electronic / electromechanical) and the number of field replaceable units (LRUs) included in the equipment.

[0032] Among them, the fault detection rate index is allocated to electronic equipment and electromechanical equipment with controllers, while the fault isolation rate index is allocated to electronic equipment and electromechanical equipment with controllers that have a number N of 2 or more field replaceable unit LRUs and whose functions are interconnected. The index allocation content is the fault isolation rate isolated to 1, 2...N-1 field replaceable unit LRUs.

[0033] For example, in this embodiment of the application, the aviation equipment includes an electromechanical subsystem and an electronic subsystem. Therefore, it is necessary to allocate equipment 1 (electronic equipment) and equipment 2 (electromechanical equipment with controllers) under the electromechanical subsystem, and equipment 3 under the electronic subsystem, as the allocation objects. The number of field replaceable units (LRUs) of equipment 1 under the electromechanical subsystem is 3. Therefore, the index allocation content is the fault isolation rate of 1 or 2 field replaceable units (LRUs). The number of field replaceable units (LRUs) of equipment 2 under the electromechanical subsystem is 4. Therefore, the index allocation content is the fault isolation rate of 1, 2, or 3 field replaceable units (LRUs). The number of field replaceable units (LRUs) of equipment 3 under the electronic subsystem is 2. Therefore, the index allocation content is the fault isolation rate of 1 field replaceable unit (LRU).

[0034] Step S4: Assign metrics based on the determined test metrics allocation targets, where:

[0035] The method for allocating testability indicators for electronic subsystems is as follows:

[0036] The fault detection rate index of electronic subsystems adopts the equal value allocation method, that is, the fault detection rate index of the equipment is equal to the fault detection rate index required by the equipment; the fault isolation rate index of electronic subsystems adopts the equal value allocation method, that is, the fault isolation rate index of the equipment is equal to the fault isolation rate index required by the equipment.

[0037] The method for allocating testability indicators for electromechanical subsystems is as follows:

[0038] For electromechanical equipment with controllers in the electromechanical subsystem, the fault detection rate index adopts the equal value allocation method, that is, the fault detection rate index of the equipment is equal to the fault detection rate index required by the equipment. The fault isolation rate index adopts the equal value allocation method, that is, the fault isolation rate index of the equipment is equal to the fault isolation rate index required by the equipment.

[0039] For electronic equipment in the electromechanical subsystem, the fault detection rate index shall be in accordance with the fault detection rate index requirements of the electronic subsystem, and the fault isolation rate index shall be in accordance with the fault isolation rate index requirements of the electronic subsystem.

[0040] Step S5: Record and summarize the allocation results in the test index allocation table.

[0041] Table 1 shows the testability index allocation table in this embodiment of the application. The testability index allocation results can be filled into the table below.

[0042] Table 1. Distribution of Testability Indicators

[0043]

[0044] The testability index allocation method of this invention is based on the system physical architecture, which enables the allocation of testability indexes to better conform to the actual design of the equipment system, and the allocation results to be more clear and explicit.

[0045] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A method for allocating test indicators, characterized in that, include: The equipment categories included in the equipment are determined, and the testability index allocation content for each equipment category is determined according to the equipment category. The testability index allocation content includes fault detection rate and fault isolation rate. Based on the physical architecture hierarchy of the equipment, the equipment system is decomposed down to the level of replaceable units in the field. The allocation of test performance indicators is determined based on the types of equipment included in the equipment and the number of field-replaceable units. The indicators are allocated based on the identified test indicator allocation targets; Record and summarize the allocation results in the testability index allocation table.

2. The testability index allocation method as described in claim 1, characterized in that, The equipment categories include electromechanical and electronic equipment.

3. The testability index allocation method as described in claim 2, characterized in that, When decomposing the equipment system down to the field replaceable unit level according to the physical architecture hierarchy of the equipment, the equipment system is the top layer, the subsystems and equipment are the middle layer, and the field replaceable unit is the bottom layer.

4. The testability index allocation method as described in claim 3, characterized in that, The fault detection rate index is allocated to electronic equipment and electromechanical equipment with controllers; The fault isolation rate index is allocated to electronic devices and electromechanical devices with controllers that have a number of field replaceable units N greater than or equal to 2 and whose functions are interconnected between the field replaceable units. The index allocation content is the fault isolation rate when isolated to 1, 2...N-1 field replaceable units.

5. The testability index allocation method as described in claim 4, characterized in that, The method for allocating testability indicators for electronic subsystems is as follows: The fault detection rate index of electronic subsystems adopts the equal value allocation method, that is, the fault detection rate index of the equipment is equal to the fault detection rate index required by the equipment; the fault isolation rate index of electronic subsystems adopts the equal value allocation method, that is, the fault isolation rate index of the equipment is equal to the fault isolation rate index required by the equipment.

6. The testability index allocation method as described in claim 5, characterized in that, The method for allocating testability indicators for electromechanical subsystems is as follows: For electromechanical equipment with controllers in the electromechanical subsystem, the fault detection rate index adopts the equal value allocation method, that is, the fault detection rate index of the equipment is equal to the fault detection rate index required by the equipment. The fault isolation rate index adopts the equal value allocation method, that is, the fault isolation rate index of the equipment is equal to the fault isolation rate index required by the equipment. For electronic equipment in the electromechanical subsystem, the fault detection rate index shall be in accordance with the fault detection rate index requirements of the electronic subsystem, and the fault isolation rate index shall be in accordance with the fault isolation rate index requirements of the electronic subsystem.

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