A method for evaluating the high-temperature creep service safety of thin-walled single-crystal alloys

Abstract

This application discloses a method for evaluating the high-temperature creep service safety of thin-walled single-crystal alloys, relating to the field of alloy high-temperature creep service safety assessment. The method includes: obtaining the topological inversion evolution curve of a thick-walled single-crystal alloy standard sample under set creep test parameters; obtaining the service time of the thin-walled single-crystal alloy component to be evaluated under current service conditions, obtaining the thin-wall creep time; calculating the degree of topological inversion of the thin-walled single-crystal alloy component to be evaluated during the thin-wall creep time, obtaining the degree of thin-wall topological inversion; determining the creep time required for the thick-walled single-crystal alloy standard sample to reach the degree of thin-wall topological inversion based on the topological inversion evolution curve, obtaining the thick-wall creep time; and calculating the remaining life of the thin-walled single-crystal alloy component to be evaluated based on the thin-wall creep time, the thick-wall creep time, and the creep fracture life of the thick-walled single-crystal alloy standard sample. This application enables accurate assessment of the high-temperature creep service safety of thin-walled single-crystal alloys.

Description

Technical Field

[0001] This application relates to the field of high-temperature creep service safety assessment of alloys, and in particular to a method for assessing the high-temperature creep service safety of thin-walled single-crystal alloys. Background Technology

[0002] Nickel-based single-crystal superalloys, due to their excellent high-temperature strength, creep resistance, and oxidation resistance, have been widely used in key hot-end components such as turbine blades of aero-engines and gas turbines. With the continuous improvement of engine thermal efficiency and thrust-to-weight ratio, the service temperature of turbine blades continues to rise, placing higher demands on the microstructural stability and service reliability of nickel-based single-crystal superalloys under high-temperature conditions.

[0003] To further improve cooling efficiency, modern turbine blades typically employ complex internal air-cooling channels, hollow internal cavities, and sophisticated cooling structure designs. While these structures effectively reduce the blade's metal temperature, they also lead to the gradual thinning of blade walls in certain areas, with significant reductions in wall thickness in some regions. As a high-temperature rotating component, turbine blades not only endure prolonged exposure to high-temperature environments during actual service but also bear substantial centrifugal loads and complex thermal stresses. Consequently, the material is prone to high-temperature creep damage and creep rupture failure during service. This is particularly true for thin-walled regions; as the wall thickness decreases, their high-temperature creep performance and creep rupture life often decline significantly, making these thin-walled areas vulnerable to failure in single-crystal turbine blades and directly impacting the overall service safety of the component.

[0004] Therefore, studying the microstructure evolution, two-phase morphology changes, topological inversion characteristics, and their relationship with high-temperature mechanical behavior of thin-walled single-crystal superalloys under high-temperature creep conditions is of great significance for revealing the service failure mechanism of thin-walled single-crystal blades, improving the accuracy of their service safety assessment, and realizing the prediction of remaining service life.

[0005] Currently, the assessment of high-temperature creep life or service safety of single-crystal superalloy components in engineering mainly relies on two types of conventional techniques. The first is the traditional life extrapolation method based on standard specimen experimental data. This method directly uses the experimental results of thick-walled specimens to extrapolate the life of thin-walled components, often leading to significant deviations between the assessment results and actual service conditions, making it difficult to accurately reflect the true high-temperature creep service safety status of thin-walled components. The second is the assessment method based on microstructure characterization. This method follows the conventional rule that "the degree of topological inversion is basically uniform" in thick-walled specimens to assess thin-walled components, which easily underestimates the actual creep damage degree in the near-surface region, leading to misjudgments of remaining life and service safety, and potentially causing engineering safety hazards. Therefore, how to achieve accurate assessment of the high-temperature creep service safety of thin-walled single-crystal alloys has become an urgent problem to be solved. Summary of the Invention

[0006] The purpose of this application is to provide a method for evaluating the high-temperature creep service safety of thin-walled single-crystal alloys, which can achieve accurate evaluation of the high-temperature creep service safety of thin-walled single-crystal alloys.

[0007] To achieve the above objectives, this application provides the following solution: This application provides a method for evaluating the high-temperature creep service safety of thin-walled single-crystal alloys, including: The topological inversion evolution curve of a thick-walled single-crystal alloy standard sample under set creep test parameters is obtained. The thick-walled single-crystal alloy standard sample has the same composition and crystal orientation as the thin-walled single-crystal alloy component to be evaluated. The thickness of the thick-walled single-crystal alloy standard sample is greater than the thickness of the thin-walled single-crystal alloy component to be evaluated. The topological inversion evolution curve characterizes the relationship between the degree of topological inversion and creep time. The service time of the thin-walled single-crystal alloy component to be evaluated under the current service conditions is obtained, and the service time is determined as the thin-wall creep time; the creep test parameters are set to be the same as the creep test parameters under the current service conditions. The degree of topological inversion of the thin-walled single-crystal alloy component to be evaluated is calculated at the thin-walled creep time to obtain the degree of topological inversion of the thin-walled component; The creep time required for the thick-walled single-crystal alloy standard sample to reach the degree of thin-walled topological inversion is determined based on the topological inversion evolution curve, thus obtaining the thick-walled creep time. The remaining life of the thin-walled single-crystal alloy component to be evaluated is calculated based on the thin-walled creep time, the thick-walled creep time, and the creep fracture life of the thick-walled single-crystal alloy standard sample under the set creep test parameters; the remaining life is used to characterize the creep service safety of the thin-walled single-crystal alloy component to be evaluated.

[0008] In one embodiment, obtaining the topological inversion evolution curve of a thick-walled single-crystal alloy standard sample under set creep test parameters specifically includes: Multiple identical thick-walled single-crystal alloy standard specimens were subjected to parallel tests under set creep test parameters, and parallel specimen groups were selected from different creep time points during the creep fracture process from the start of the test. The parallel specimen groups included multiple identical thick-walled single-crystal alloy standard specimens at the creep time points. For any parallel sample group, slice each sample in the parallel sample group along the thickness direction. Based on the microscopic images of each slice in different fields of view, calculate the degree of topological inversion of each sample in the parallel sample group, and take the average degree of topological inversion of all samples in the parallel sample group as the degree of topological inversion at the corresponding creep time point. Based on the degree of topological reversal at all creep time points, a topological reversal evolution curve is plotted with creep time as the x-axis and the degree of topological reversal as the y-axis.

[0009] In one embodiment, obtaining the service time of the thin-walled single-crystal alloy component to be evaluated under current service conditions specifically includes: Obtain the service time of the thin-walled single-crystal alloy component to be evaluated under current service conditions, as recorded using a creep testing machine.

[0010] In one embodiment, the degree of topological inversion of the thin-walled single-crystal alloy component to be evaluated during the thin-wall creep time is calculated to obtain the degree of thin-wall topological inversion, specifically including: The thin-walled single-crystal alloy component to be evaluated was cut according to the set requirements to obtain a thin-walled sample. Microscopic images of the near-surface region of the thin-walled sample at different fields of view during the thin-walled creep time were obtained; the near-surface region is the area range at a set distance from the surface of the thin-walled sample. Based on the microscopic images of the thin-walled sample under different fields of view during the thin-walled creep time, the degree of topological inversion of the near-surface region of the thin-walled sample under each field of view is calculated. The average value of the degree of topological inversion of the near-surface region of the thin-walled sample under all fields of view is determined as the degree of topological inversion of the thin-walled sample.

[0011] In one embodiment, the creep time required for the thick-walled single-crystal alloy standard sample to reach the degree of thin-walled topological inversion is determined based on the topological inversion evolution curve, thereby obtaining the thick-walled creep time, specifically including: The topology reversal evolution curve is queried, and the creep time corresponding to the degree of topology reversal of the thin-walled structure on the topology reversal evolution curve is determined as the creep time of the thick-walled structure.

[0012] In one embodiment, the formula for calculating the remaining life of the thin-walled single-crystal alloy component to be evaluated is: ; in, The remaining life of the thin-walled single-crystal alloy component to be evaluated; The creep fracture life of a standard specimen of a thick-walled single-crystal alloy under set creep test parameters; For thin-walled creep time; This represents the thick-walled creep time.

[0013] In one embodiment, before conducting parallel tests on multiple identical thick-walled single-crystal alloy standard specimens under set creep test parameters, the method further includes: Each thick-walled single-crystal alloy standard sample was polished.

[0014] In one embodiment, before acquiring microscopic images of the near-surface region of the thin-walled sample at different fields of view during the thin-wall creep time, the method further includes: The thin-walled sample was polished.

[0015] In one embodiment, the creep test parameters include: test temperature, stress, and duration.

[0016] In one embodiment, the thickness of the thick-walled single-crystal alloy standard sample is 5 mm; the thickness of the thin-walled single-crystal alloy component to be evaluated is 0.3 mm to 1 mm.

[0017] According to the specific embodiments provided in this application, this application has the following technical effects: This application provides a method for evaluating the high-temperature creep service safety of thin-walled single-crystal alloys. By distinguishing the differences in topological inversion between thick-walled and thin-walled single-crystal alloys during the creep process, a correlation is established between the degree of topological inversion of the thin-walled single-crystal alloy component to be evaluated and the evolution law of topological inversion of the standard sample of thick-walled single-crystal alloy, thereby achieving accurate evaluation of the high-temperature creep service safety of thin-walled single-crystal alloy components and accurate prediction of their remaining life. Attached Figure Description

[0018] To more clearly illustrate the technical solutions in the embodiments of this application or related technologies, the drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0019] Figure 1 A flowchart illustrating a method for evaluating the high-temperature creep service safety of thin-walled single-crystal alloys, provided as an embodiment of this application; Figure 2 This is a schematic diagram of the topological inversion evolution curve of a thick-walled sample provided in an embodiment of this application. Figure 3 This is a schematic diagram of the structure of a computer device provided in an embodiment of this application. Detailed Implementation

[0020] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0021] Nickel-based single-crystal superalloys are widely used in aero-engine and gas turbine blades. With the continuous development of advanced cooling technologies, such as double-walled and layered cooling structures, thin-walled structures are increasingly used in turbine blades, becoming an important trend in high-performance blade design. Accurately assessing the creep life of thin-walled single-crystal superalloys under high-temperature conditions is crucial for optimizing manufacturing processes, guiding alloy composition design, and improving microstructure, thereby contributing to further enhancing their creep resistance and service safety.

[0022] Currently, there are two main methods for assessing the high-temperature creep life or service safety of single-crystal superalloy components in engineering: one is the traditional life extrapolation method based on standard sample experimental data, and the other is the assessment method based on microstructure characterization.

[0023] Traditional life extrapolation methods based on standard specimen experimental data typically involve conducting high-temperature endurance or creep tests on standard single-crystal superalloy specimens of conventional size and relatively large thickness to obtain life data of the material under different temperature and stress conditions. This data is then combined with the service conditions of actual components to perform life extrapolation and safety assessment. This method is commonly used in engineering applications and features a relatively mature testing process and a relatively direct evaluation method.

[0024] Evaluation methods based on microstructure characterization generally analyze the microscopic characteristics of single-crystal superalloys during high-temperature creep, such as the evolution of the γ / γ′ two-phase morphology, the degree of rafting, the degree of topological inversion, and changes in damaged microstructure. This establishes a correlation between microstructure evolution parameters and creep damage state, degree of service life depletion, or remaining service life, thereby enabling the assessment of the material's service condition. Compared to extrapolation methods that solely rely on macroscopic experimental lifetime data, these methods can reflect the internal damage evolution process of the material to a certain extent.

[0025] However, the two methods mentioned above still have significant shortcomings in assessing the high-temperature creep service safety of thin-walled components.

[0026] First, traditional life extrapolation methods based on experimental data from thick-walled standard specimens typically assume that standard specimens and actual thin-walled components are similar in terms of heating conditions, stress distribution, and damage evolution. However, in reality, thick-walled specimens and thin-walled components differ significantly in heat transfer characteristics, thickness-direction temperature gradients, stress state distribution, and the effects of surface heat dissipation and oxidation. For thin-walled components, due to their smaller wall thickness, surface effects are more pronounced, and the local microstructure evolution and damage accumulation processes differ significantly from those of thick-walled specimens. Therefore, directly using experimental results from thick-walled specimens to extrapolate the life of thin-walled components often leads to significant deviations between the assessment results and actual service conditions, making it difficult to accurately reflect the true high-temperature creep service safety status of thin-walled components.

[0027] Secondly, most evaluation methods based on microstructure characterization are still based on research on thick-walled single-crystal alloy specimens. For thick-walled specimens, since the temperature and stress fields are relatively uniform along the thickness direction, and the surface effect accounts for a low proportion of the overall thickness, the degree of microstructure evolution is generally considered to be basically consistent across the entire thickness range, especially with small differences in the degree of topological inversion. The microstructure evolution laws and damage criteria established on this basis have certain applicability to thick-walled specimens.

[0028] However, the actual situation of thin-walled single-crystal alloy components differs significantly from that of thick-walled specimens. Due to the thinner wall thickness, factors such as surface heat dissipation, surface oxidation, and surface stress response cannot be ignored. Under the same high-temperature creep time, the microstructure evolution rate of the near-surface region and the internal region of thin-walled components often differs significantly. In particular, the topological inversion rate in the near-surface region is usually faster than that in the central region, resulting in significant non-uniform microstructure evolution characteristics along the thickness direction of thin-walled components. If the conventional rule that "the degree of topological inversion is basically uniform" is still applied to evaluate thin-walled components, it is easy to underestimate the true creep damage degree in the near-surface region, leading to misjudgment of remaining service life and operational safety, and potentially causing engineering safety hazards.

[0029] Furthermore, the relevant assessment methods usually focus on damage analysis of thick-walled specimens or under ideal homogeneous conditions, which makes it difficult to effectively characterize the high-temperature creep damage characteristics caused by size effect, surface effect and non-uniform microstructure evolution in thin-walled structures. Therefore, their applicability in complex hot-end components such as thin-walled single-crystal alloy blades is limited, and they cannot meet the needs of accurate assessment of high-temperature creep service safety in actual engineering.

[0030] In summary, existing methods for assessing the high-temperature creep life or service safety of single-crystal superalloys cannot fully consider the differences in microstructure evolution and near-surface damage acceleration characteristics in thin-walled components along the thickness direction, making it difficult to accurately characterize the damage state and safety margin of thin-walled single-crystal alloys under actual high-temperature service conditions. Therefore, this application provides a method for assessing the high-temperature creep service safety of thin-walled single-crystal alloys. This method can combine the characteristics of thin-walled structures and the differences in topological inversion evolution between near-surface and internal regions to more accurately reflect the creep damage state, service safety, and remaining life of thin-walled single-crystal alloy components during high-temperature service, thereby providing a reliable basis for the safe operation evaluation of critical hot-end components such as thin-walled single-crystal alloy blades.

[0031] To make the above-mentioned objectives, features and advantages of this application more apparent and understandable, the application will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0032] In one exemplary embodiment, such as Figure 1As shown, a method for evaluating the high-temperature creep service safety of thin-walled single-crystal alloys is provided, comprising: Step 101: Obtain the topological inversion evolution curve of the standard thick-walled single-crystal alloy sample under the set creep test parameters.

[0033] The thick-walled single-crystal alloy standard sample and the thin-walled single-crystal alloy component to be evaluated have the same composition and crystal orientation; the thickness of the thick-walled single-crystal alloy standard sample is greater than the thickness of the thin-walled single-crystal alloy component to be evaluated; the topological inversion evolution curve characterizes the relationship between the degree of topological inversion and creep time; the degree of topological inversion is the percentage of the area of ​​the topological inversion region to the total observed area.

[0034] Step 102: Obtain the service time of the thin-walled single-crystal alloy component to be evaluated under the current service conditions, and determine the service time as the thin-walled creep time; the creep test parameters are the same as the creep test parameters under the current service conditions.

[0035] Step 103: Calculate the degree of topological inversion of the thin-walled single-crystal alloy component to be evaluated during the thin-walled creep time to obtain the degree of topological inversion of the thin-walled component.

[0036] Step 104: Determine the creep time required for the thick-walled single-crystal alloy standard sample to reach the degree of thin-walled topological inversion based on the topological inversion evolution curve, and obtain the thick-walled creep time.

[0037] Step 105: Calculate the remaining life of the thin-walled single-crystal alloy component to be evaluated based on the thin-walled creep time, the thick-walled creep time, and the creep fracture life of the thick-walled single-crystal alloy standard sample under the set creep test parameters.

[0038] The remaining lifetime is used to characterize the creep service safety of the thin-walled single-crystal alloy component to be evaluated.

[0039] In another exemplary embodiment of this application, step 101 specifically includes: (1) Multiple identical thick-walled single-crystal alloy standard specimens are subjected to parallel tests under set creep test parameters, and parallel specimen groups are selected from different creep time points from the start of the test until the creep fracture process; the parallel specimen group includes multiple identical thick-walled single-crystal alloy standard specimens at the creep time point.

[0040] (2) For any parallel sample group, slice each sample in the parallel sample group along the thickness direction. Based on the microscopic images of each slice in different fields of view, calculate the degree of topological inversion of each sample in the parallel sample group, and take the average of the degree of topological inversion of all samples in the parallel sample group as the degree of topological inversion at the corresponding creep time point.

[0041] (3) Based on the degree of topological reversal at all creep time points, plot the topological reversal evolution curve with creep time as the horizontal axis and the degree of topological reversal as the vertical axis.

[0042] In another exemplary embodiment of this application, step 102 specifically includes: obtaining the service time of the thin-walled single-crystal alloy component to be evaluated under current service conditions, as recorded by a creep testing machine.

[0043] In another exemplary embodiment of this application, step 103 specifically includes: (1) The thin-walled single-crystal alloy component to be evaluated is cut according to the set requirements to obtain a thin-walled sample. The set requirements include areas with small stress concentration and no obvious damage (such as cracks or deformation).

[0044] (2) Obtain microscopic images of the near-surface region of the thin-walled sample at different fields of view during the thin-walled creep time; the near-surface region is the range of the area at a set distance from the surface of the thin-walled sample. The set value can be 0.1 mm to 0.3 mm.

[0045] (3) Based on the microscopic images of the thin-walled sample under different fields of view during the thin-walled creep time, calculate the degree of topological inversion of the near-surface region of the thin-walled sample under each field of view.

[0046] (4) The average value of the degree of topological inversion of the near-surface region of the thin-walled sample under all fields of view is determined as the degree of topological inversion of the thin-walled sample.

[0047] In another exemplary embodiment of this application, step 104 specifically includes: querying the topology reversal evolution curve and determining the creep time corresponding to the degree of thin-walled topology reversal on the topology reversal evolution curve as the thick-walled creep time.

[0048] In another exemplary embodiment of this application, in step 105, the formula for calculating the remaining life of the thin-walled single-crystal alloy component to be evaluated is as follows.

[0049] .

[0050] .

[0051] in, The remaining life of the thin-walled single-crystal alloy component to be evaluated; The creep fracture life of the standard specimen of thick-walled single crystal alloy under the set creep test parameters is determined by the test process in step 101. The thin-wall creep time (the creep time for a thin-walled sample to reach the degree of topological inversion of the thin-walled sample). Thick-walled creep time (the creep time for a thick-walled sample to reach the degree of topological inversion of a thin-walled sample).

[0052] In another exemplary embodiment of this application, before conducting parallel tests on multiple identical thick-walled single-crystal alloy standard samples under set creep test parameters in step 101, the method further includes polishing each thick-walled single-crystal alloy standard sample.

[0053] In another exemplary embodiment of this application, step 103, before obtaining microscopic images of the near-surface region of the thin-walled sample at different fields of view under the thin-walled creep time, further includes: polishing the thin-walled sample.

[0054] In another exemplary embodiment of this application, the creep test parameters include: test temperature, stress, and duration.

[0055] In another exemplary embodiment of this application, the thickness of the thick-walled single-crystal alloy standard sample is 5 mm; the thickness of the thin-walled single-crystal alloy component to be evaluated is 0.3 mm to 1 mm.

[0056] This embodiment represents a significant improvement over existing methods in assessing the high-temperature creep life of thin-walled single-crystal alloys. By distinguishing the differences in topological inversion between thick-walled and thin-walled single-crystal alloys during high-temperature creep, it establishes a correlation between the degree of near-surface topological inversion of thin-walled components and the evolution law of topological inversion of thick-walled samples. This enables accurate assessment of the high-temperature creep service safety of thin-walled single-crystal alloy components and accurate prediction of their remaining life, overcoming the limitations of traditional methods in assessing high-temperature life.

[0057] In practical applications, a specific implementation process of the method for evaluating the high-temperature creep service safety of thin-walled single-crystal alloys described in the above embodiments is as follows.

[0058] 1. Prepare standard samples of thick-walled single-crystal alloys and obtain their topological inversion evolution curves.

[0059] a) Select a single crystal alloy material with the same composition and crystal orientation as the thin-walled single crystal alloy sample to be evaluated (thickness 0.3mm~1mm, length and width not limited), prepare the sample according to strict size requirements (thickness 5mm, length 20mm, width 8mm), and polish the surface (roughness Ra≤0.2μm).

[0060] (b) Set high-temperature creep test parameters (test temperature, stress, and duration, etc.) consistent with those used in the thin-walled component's service life, and collect at least three parallel specimens at different creep time points (0h, 20h, 50h, etc. until fracture). Parallel specimens are multiple sets of specimens processed from the same material under identical conditions for parallel testing. In this embodiment, at least three thick-walled single-crystal alloy specimens are collected at typical creep time points: 0h, 20h, 50h, etc., until fracture. Three specimens are the minimum sample size to ensure data reliability and scientific rigor.

[0061] c) Slice the sample along the thickness direction and observe the microstructure using a scanning electron microscope (SEM). Select multiple fields of view and calculate the degree of topological inversion using image analysis software (such as ImageJ software). Take the average value of 5 fields of view as the degree of topological inversion of the thick-walled sample at that creep time (i.e., the percentage of the area of ​​the topological inversion region to the total observed area).

[0062] d) Plot the topological inversion evolution curve with creep time on the x-axis and the degree of topological inversion on the y-axis, as shown below. Figure 2 As shown in the figure, the creep time T required for a thick-walled specimen to achieve an arbitrary degree of topological inversion X can be clearly obtained from the curve. X (i.e., T) X (This represents the x-coordinate value corresponding to the degree of topological inversion on the curve, X).

[0063] 2. Obtain the degree of near-surface topological inversion of the thin-walled single-crystal alloy component to be evaluated.

[0064] a) Scan the component under a micro-electron microscope, select areas on the component with low stress concentration and no obvious damage (such as cracks or deformation), and cut a sample with a size of 5mm×5mm×d (d is the thickness of the component) using the wire cutting method to ensure that the sample contains the complete thickness of the component (from the surface to the center).

[0065] b) The service time T0 of the thin-walled component is recorded by a creep testing machine (T0 = 0h for new components; T0 is usually 50~200h for in-service components), which is the thin-wall creep time.

[0066] c) Polish the thin-walled sample along its thickness until a clear microstructure is exposed; observe the near-surface region of the sample (the range of 0.1 mm to 0.3 mm from the sample surface, which is most significantly affected by surface effects and has the fastest topological inversion rate) using SEM or transmission electron microscopy (TEM). Select at least 5 different fields of view, calculate the degree of topological inversion for each field of view using image analysis software, and take the average value as the performance of the thin-walled component under evaluation in service. The degree of near-surface topological inversion at that time, i.e., the degree of thin-walled topological inversion b.

[0067] 3. Evaluate the high-temperature creep service safety and remaining life of thin-walled components.

[0068] a) Determine the creep time required for the thick-walled specimen to reach the degree of topological inversion b of the thin-walled specimen, i.e., the thick-walled creep time. .

[0069] Query the topological inversion evolution curve of the thick-walled specimen established in step 1, and find the abscissa value corresponding to the degree of topological inversion b of the thin-walled component on the curve. This value represents the creep time required for the thick-walled specimen to reach the same degree of topological inversion b as the near-surface of the thin-walled component under temperature T and stress σ. .

[0070] b) Estimate the remaining life L of the thin-walled component.

[0071] Since the degree of topological inversion *b* near the surface of a thin-walled component represents its current maximum creep damage (the near-surface is the region most prone to failure), and the topological inversion evolution curve of a thick-walled sample can reflect the "standard damage-time" relationship of this type of single-crystal alloy under the same operating conditions, the remaining life *L* of the thin-walled component can be obtained through the formula... Calculate the creep fracture life of a thick-walled specimen under fixed temperature and stress. Determined by step 1.

[0072] This embodiment establishes a quantitative equivalent relationship between the rapid microstructure evolution near the surface of thin-walled samples and the uniform microstructure evolution of thick-walled samples. By measuring the degree of topological inversion of thin-walled components, the creep damage time is evaluated. This embodiment effectively solves the problem that traditional methods seriously underestimate the degree of damage due to ignoring the thin-wall effect. By using data from thick-walled samples to quantify the damage state of the near-surface of thin-walled components, the accuracy of remaining life prediction is significantly improved, providing a more scientific basis and engineering practical value for the safe operation of thin-walled single-crystal blades.

[0073] Based on the above method for evaluating the high-temperature creep service safety of thin-walled single-crystal alloys, combined with the measured data, the results are shown in Table 1.

[0074] Table 1. Test Results

[0075] The results show that the thin-wall remaining life L predicted by the evaluation method is close to the actual measured thin-wall remaining life, with a small error range of about 4.2~8.9%.

[0076] The method in this embodiment can also be used to periodically detect the degree of topological inversion in the near-surface region during component service, and estimate the remaining life by combining the creep microstructure evolution curve of thick-walled samples, thereby achieving the classification of the component's safety status and providing a basis for rationally arranging maintenance and replacement, ensuring the safe and stable operation of the engine. This method provides an effective testing means for evaluating the degradation behavior and failure mechanism of material properties during long-term high-temperature service. With the continuous improvement of the thrust-to-weight ratio requirements of aero-engines, higher requirements are placed on the performance of nickel-based single-crystal superalloys. The relevant results of this embodiment can provide theoretical basis and data support for the design and manufacturing of next-generation aero-engine turbine blades, promoting the research and development and application of advanced power equipment.

[0077] Based on the same inventive concept, this application also provides an apparatus for evaluating the high-temperature creep service safety of thin-walled single-crystal alloys, which implements the method for evaluating the high-temperature creep service safety of thin-walled single-crystal alloys described above. The solution provided by this apparatus is similar to the solution described in the above method. Therefore, the specific limitations of one or more apparatus embodiments for evaluating the high-temperature creep service safety of thin-walled single-crystal alloys provided below can be found in the limitations of the method for evaluating the high-temperature creep service safety of thin-walled single-crystal alloys described above, and will not be repeated here.

[0078] In one exemplary embodiment, an apparatus for evaluating the high-temperature creep service safety of thin-walled single-crystal alloys is provided, comprising: The thick-walled topological inversion evolution curve acquisition module is used to acquire the topological inversion evolution curve of a thick-walled single-crystal alloy standard sample under set creep test parameters. The thick-walled single-crystal alloy standard sample has the same composition and crystal orientation as the thin-walled single-crystal alloy component to be evaluated. The thickness of the thick-walled single-crystal alloy standard sample is greater than the thickness of the thin-walled single-crystal alloy component to be evaluated. The topological inversion evolution curve characterizes the relationship between the degree of topological inversion and creep time.

[0079] The thin-wall creep time determination module is used to obtain the service time of the thin-walled single-crystal alloy component to be evaluated under the current service conditions, and to determine the service time as the thin-wall creep time; the creep test parameters are the same as the creep test parameters under the current service conditions.

[0080] The thin-walled topological inversion degree calculation module is used to calculate the degree of topological inversion of the thin-walled single-crystal alloy component to be evaluated during the thin-walled creep time, and obtain the degree of thin-walled topological inversion.

[0081] The thick-walled creep time determination module is used to determine the creep time required for the thick-walled single-crystal alloy standard sample to reach the degree of thin-walled topological inversion based on the topological inversion evolution curve, thereby obtaining the thick-walled creep time.

[0082] The remaining life calculation module is used to calculate the remaining life of the thin-walled single-crystal alloy component to be evaluated based on the thin-walled creep time, the thick-walled creep time, and the creep fracture life of the thick-walled single-crystal alloy standard sample under set creep test parameters; the remaining life is used to characterize the creep service safety of the thin-walled single-crystal alloy component to be evaluated.

[0083] In one exemplary embodiment, a computer device is provided, which may be a server or a terminal, and its internal structure diagram may be as follows. Figure 3 As shown, the computer device includes a processor, memory, input / output (I / O) interfaces, and a communication interface. The processor, memory, and I / O interfaces are connected via a system bus, and the communication interface is also connected to the system bus via the I / O interfaces. The processor provides computational and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores the operating system, computer programs, and a database. The internal memory provides the environment for the operation of the operating system and computer programs in the non-volatile storage media. The database stores the remaining lifespan of the thin-walled single-crystal alloy components to be evaluated. The I / O interfaces are used for information exchange between the processor and external devices. The communication interface is used for communication with external terminals via a network connection. When executed by the processor, the computer program implements a method for evaluating the high-temperature creep service safety of thin-walled single-crystal alloys.

[0084] Those skilled in the art will understand that Figure 3 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer equipment to which the present application is applied. Specific computer equipment may include, for example, [the following is a list of possible additional structures]. Figure 3 The embodiments show more or fewer components, combinations of certain components, or different component arrangements. In one exemplary embodiment, a computer device is provided, including a memory and a processor, the memory storing a computer program, which the processor executes to implement the steps in the above-described method embodiments.

[0085] In one exemplary embodiment, a computer-readable storage medium is provided storing a computer program that, when executed by a processor, implements the steps in the above-described method embodiments.

[0086] In one exemplary embodiment, a computer program product is provided, including a computer program that, when executed by a processor, implements the steps in the above-described method embodiments.

[0087] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM).

[0088] The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, etc., and are not limited to these.

[0089] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0090] This document uses specific examples to illustrate the principles and implementation methods of this application. The descriptions of the above embodiments are only for the purpose of helping to understand the methods and core ideas of this application. Furthermore, those skilled in the art will recognize that, based on the ideas of this application, there will be changes in the specific implementation methods and application scope. Therefore, the content of this specification should not be construed as a limitation of this application.

Claims

1. A method for evaluating the high-temperature creep service safety of thin-walled single-crystal alloys, characterized in that, include: The topological inversion evolution curve of a thick-walled single-crystal alloy standard sample under set creep test parameters is obtained. The thick-walled single-crystal alloy standard sample has the same composition and crystal orientation as the thin-walled single-crystal alloy component to be evaluated. The thickness of the thick-walled single-crystal alloy standard sample is greater than the thickness of the thin-walled single-crystal alloy component to be evaluated. The topological inversion evolution curve characterizes the relationship between the degree of topological inversion and creep time. The service time of the thin-walled single-crystal alloy component to be evaluated under the current service conditions is obtained, and the service time is determined as the thin-wall creep time; the creep test parameters are set to be the same as the creep test parameters under the current service conditions. The degree of topological inversion of the thin-walled single-crystal alloy component to be evaluated is calculated at the thin-walled creep time to obtain the degree of topological inversion of the thin-walled component; The creep time required for the thick-walled single-crystal alloy standard sample to reach the degree of thin-walled topological inversion is determined based on the topological inversion evolution curve, thus obtaining the thick-walled creep time. The remaining life of the thin-walled single-crystal alloy component to be evaluated is calculated based on the thin-walled creep time, the thick-walled creep time, and the creep fracture life of the thick-walled single-crystal alloy standard sample under the set creep test parameters; the remaining life is used to characterize the creep service safety of the thin-walled single-crystal alloy component to be evaluated.

2. The method for evaluating the high-temperature creep service safety of thin-walled single-crystal alloys according to claim 1, characterized in that, Obtain the topological inversion evolution curves of thick-walled single-crystal alloy standard specimens under set creep test parameters, specifically including: Multiple identical thick-walled single-crystal alloy standard specimens were subjected to parallel tests under set creep test parameters, and parallel specimen groups were selected from different creep time points during the creep fracture process from the start of the test. The parallel specimen groups included multiple identical thick-walled single-crystal alloy standard specimens at the creep time points. For any parallel sample group, slice each sample in the parallel sample group along the thickness direction. Based on the microscopic images of each slice in different fields of view, calculate the degree of topological inversion of each sample in the parallel sample group, and take the average degree of topological inversion of all samples in the parallel sample group as the degree of topological inversion at the corresponding creep time point. Based on the degree of topological reversal at all creep time points, a topological reversal evolution curve is plotted with creep time as the x-axis and the degree of topological reversal as the y-axis.

3. The method for evaluating the high-temperature creep service safety of thin-walled single-crystal alloys according to claim 1, characterized in that, Obtain the service time of the thin-walled single-crystal alloy component to be evaluated under current service conditions, specifically including: Obtain the service time of the thin-walled single-crystal alloy component to be evaluated under current service conditions, as recorded using a creep testing machine.

4. The method for evaluating the high-temperature creep service safety of thin-walled single-crystal alloys according to claim 1, characterized in that, The degree of topological inversion of the thin-walled single-crystal alloy component to be evaluated is calculated at the specified thin-wall creep time to obtain the degree of thin-wall topological inversion, specifically including: The thin-walled single-crystal alloy component to be evaluated was cut according to the set requirements to obtain a thin-walled sample. Microscopic images of the near-surface region of the thin-walled sample at different fields of view during the thin-walled creep time were obtained; the near-surface region is the area range at a set distance from the surface of the thin-walled sample. Based on the microscopic images of the thin-walled sample under different fields of view during the thin-walled creep time, the degree of topological inversion of the near-surface region of the thin-walled sample under each field of view is calculated. The average value of the degree of topological inversion of the near-surface region of the thin-walled sample under all fields of view is determined as the degree of topological inversion of the thin-walled sample.

5. The method for evaluating the high-temperature creep service safety of thin-walled single-crystal alloys according to claim 1, characterized in that, The creep time required for the thick-walled single-crystal alloy standard sample to reach the degree of thin-walled topological inversion is determined based on the topological inversion evolution curve, thus obtaining the thick-walled creep time, specifically including: The topology reversal evolution curve is queried, and the creep time corresponding to the degree of topology reversal of the thin-walled structure on the topology reversal evolution curve is determined as the creep time of the thick-walled structure.

6. The method for evaluating the high-temperature creep service safety of thin-walled single-crystal alloys according to claim 1, characterized in that, The formula for calculating the remaining life of the thin-walled single-crystal alloy component to be evaluated is as follows: ； in, The remaining life of the thin-walled single-crystal alloy component to be evaluated; The creep fracture life of a standard specimen of a thick-walled single-crystal alloy under set creep test parameters; For thin-walled creep time; This refers to the thick-walled creep time.

7. The method for evaluating the high-temperature creep service safety of thin-walled single-crystal alloys according to claim 2, characterized in that, Before conducting parallel tests on multiple identical thick-walled single-crystal alloy standard specimens under set creep test parameters, the following steps are also included: Each thick-walled single-crystal alloy standard sample was polished.

8. The method for evaluating the high-temperature creep service safety of thin-walled single-crystal alloys according to claim 4, characterized in that, Before acquiring microscopic images of the near-surface region of the thin-walled sample at different fields of view during the thin-walled creep time, the method further includes: The thin-walled sample was polished.

9. The method for evaluating the high-temperature creep service safety of thin-walled single-crystal alloys according to claim 1, characterized in that, The creep test parameters include: test temperature, stress, and duration.

10. The method for evaluating the high-temperature creep service safety of thin-walled single-crystal alloys according to claim 1, characterized in that, The thickness of the standard thick-walled single-crystal alloy sample is 5 mm; the thickness of the thin-walled single-crystal alloy component to be evaluated is 0.3 mm to 1 mm.

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