A fixture for shock and constant acceleration testing of electronic products

CN122568056APending Publication Date: 2026-08-14XIAN DONGFENG INSTR FACTORY
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2026-06-01
Publication Date
2026-08-14

AI Technical Summary

Technical Problem

[0004]有鉴于此,本发明的目的在于提供一种用于电子产品的冲击及恒加速试验夹具,以解决现有技术中所提到的技术问题

Benefits of technology

本发明所提供的一种用于电子产品的冲击及恒加速试验夹具,通过支座上的第一装配孔位实现与冲击、恒加速两类试验台的通用连接,并依托第一试验部的第二装配孔位(与第一装配孔位轴线垂直)为安装盘提供多方向安装基准;安装盘与第二装配孔位转动连接、顶板与第二试验部活动连接,配合安装盘上的一级安装阵列和顶板上的二级安装阵列,再通过转接板间接连接待测试产品,同时借助支座U形结构及待测试空间的预留,共同形成试验台通用连接、多方位角度可调以及多规格产品适配的一体化试验夹具,使其适配不同规格、外形、安装尺寸的电子产品进行一次定位装夹测试,同时满足两类试验台及±X、±Y以及±Z六个方位的试验考核需求,使其在保证测试精度的同时满足低成本测试需求,并提升批量检测效率。

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Abstract

This invention discloses a fixture for impact and constant acceleration testing of electronic products, comprising a support, a mounting plate, and a top plate. The support is provided with a plurality of first mounting holes that are respectively connected to an impact test bench and a constant acceleration test bench. A first test section is provided on one side of the support, and a second mounting hole is provided on the first test section, the central axis of which is perpendicular to the central axis of the first mounting hole. A second test section is provided on the side of the support away from the first mounting holes, and a test space is provided between the second test section and the first mounting hole. The mounting plate is rotatably connected to the second mounting hole and is provided with a primary mounting array. The top plate is movably connected to the second test section and is provided with a secondary mounting array. The primary and secondary mounting arrays are used to install adapter plates to load impact and / or constant acceleration simulation test loads, adapting to the needs of products of different specifications, shapes, and installation dimensions for single positioning clamping and multi-directional testing and evaluation.
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Description

Technical Field

[0001] This invention relates to the field of electronic product manufacturing and quality inspection technology, specifically to a fixture for impact and constant acceleration testing of electronic products. Background Technology

[0002] In the field of electronic product manufacturing and quality inspection, impact testing and constant acceleration testing are core mechanical environment tests for assessing the structural strength, overload resistance, and reliability of electronic products. They are also indispensable testing links for factory inspection and quality rating of electronic products. To comprehensively verify the performance of electronic products under complex stress conditions, industry standards clearly require electronic products to complete mechanical testing in six directions: ±X-axis, ±Y-axis, and ±Z-axis. This simulates the impact loads and constant acceleration loads that the product experiences under different conditions such as transportation, use, and drops, identifying potential quality hazards such as structural cracking, component detachment, and functional failure, and ensuring the operational stability of electronic products in complex application environments.

[0003] Currently, in impact and constant-acceleration testing, test fixtures are the core load-bearing components connecting the test bench and the electronic product under test. They not only need to ensure a reliable and secure connection between the test bench and the product, but also guarantee precise product positioning, uniform stress distribution, accurate reproduction of the test load, and the accuracy of the test data. At present, most test fixtures used in the industry are custom-designed structures. For electronic products of different specifications, shapes, and installation dimensions, production and testing companies need to design and manufacture dedicated test fixtures. However, in the past, the development and processing cycle of customized fixtures was long and the processing cost was high. Testing multiple types of electronic products required multiple dedicated fixtures, leading to a significant increase in fixture procurement, storage, and maintenance costs, resulting in high production and testing costs and poor economic efficiency. At the same time, dedicated fixtures have extremely low versatility; a single fixture can only be used for a single type of electronic product. When testing a different product model, the entire fixture set needs to be disassembled and replaced, resulting in a cumbersome clamping process, poor operational convenience, and severely reducing the efficiency of batch testing of electronic products. Summary of the Invention

[0004] In view of this, the purpose of the present invention is to provide a fixture for impact and constant acceleration testing of electronic products, so as to solve the technical problems mentioned in the prior art.

[0005] A shock and constant acceleration test fixture for electronic products, comprising: The support is provided with a plurality of first assembly holes that are respectively connected to the impact test bench and the constant acceleration test bench; A first test section is provided on one side of the support, and a second assembly hole is provided on the first test section. The central axis of the second assembly hole is perpendicular to that of the first assembly hole. A second test section is provided on the side of the support away from the first assembly hole, and a test space is provided between the second test section and the first assembly hole. The mounting plate is rotatably connected to the second mounting hole, and the mounting plate is provided with a primary mounting array. A top plate is movably connected to the second test section, and a secondary mounting array is provided on the top plate; The primary mounting array and the secondary mounting array are used to mount adapter plates to apply impact and / or constant acceleration simulation test loads.

[0006] Optionally, the support is a U-shaped structure.

[0007] Optionally, the second test section is located on the open side of the support, and connecting plates connected to the support are respectively provided on opposite sides of the second test section, and a space for rotation is provided between the connecting plates and the top plate.

[0008] Optionally, the support includes: A base plate, wherein a plurality of positioning grooves are respectively provided at one end of the base plate and on opposite sides; The side plates are arranged one-to-one with the number of positioning slots. One end of each side plate is installed in the positioning slot and forms a U-shaped structure with the bottom plate.

[0009] Optionally, a connecting portion is provided at one end of the top plate and on opposite sides, and the connecting portion is rotatably connected to the side plate by a rotating shaft and / or fixedly connected by a number of sets of fasteners.

[0010] Optionally, the fastener includes: The bolt has one end of its thread penetrating the side plate and the connecting portion in sequence, and extends to provide a locking portion; the thickness of the bolt head is less than or equal to the thickness of the mounting plate. A fastening nut is threadedly connected to the locking part.

[0011] Optionally, the mounting plate is provided with a plurality of third mounting holes, and the support is provided with at least one set of fourth mounting holes that correspond one-to-one with the positions and sizes of the third mounting holes. The third mounting holes and the fourth mounting holes are connected by fasteners.

[0012] Optionally, the fastener includes: A screw, the head of which is embedded in the third mounting hole, and one end of the screw shaft passing through the third mounting hole and the fourth mounting hole in sequence, and extending to be provided with a fixing part; A fixing nut is threadedly connected to the fixing part.

[0013] Optionally, the primary mounting array and the secondary mounting array have the same structural size.

[0014] Optionally, both the primary mounting array and the secondary mounting array are composed of multiple sets of threaded holes, and the multiple sets of threaded holes are arranged in a uniform ring array along the corresponding mounting axis direction.

[0015] The beneficial effects that this invention can produce include: This invention provides a fixture for impact and constant acceleration testing of electronic products. It achieves universal connection with both impact and constant acceleration test benches through a first mounting hole on the support, and provides a multi-directional mounting reference for the mounting plate via a second mounting hole (perpendicular to the axis of the first mounting hole) in the first test section. The mounting plate is rotatably connected to the second mounting hole, and the top plate is movably connected to the second test section. It works in conjunction with a primary mounting array on the mounting plate and a secondary mounting array on the top plate, and indirectly connects to the product under test via an adapter plate. Simultaneously, with the help of the U-shaped structure of the support and the reserved space for testing, it forms an integrated test fixture that provides universal connection to test benches, multi-directional angle adjustment, and adaptability to multiple product specifications. This allows it to perform a single positioning and clamping test on electronic products of different specifications, shapes, and installation dimensions, simultaneously meeting the testing requirements of both types of test benches and six directions (±X, ±Y, and ±Z). This ensures testing accuracy while meeting low-cost testing requirements and improving batch testing efficiency. Attached Figure Description

[0016] Figure 1 This is a schematic diagram of the structure of a shock and constant acceleration test fixture for electronic products according to the present invention; Figure 2 In this invention Figure 1 Side view; Figure 3 In this invention Figure 1 A schematic diagram of the base plate; Figure 4 In this invention Figure 1 A structural schematic diagram of the top slab; In the diagram: 1. Support, 2. First assembly hole, 3. First test section, 4. Second assembly hole, 5. Second test section, 6. Test space, 7. Mounting plate, 8. Primary mounting array, 9. Top plate, 10. Secondary mounting array, 11. Connecting plate, 12. Rotation space, 13. Connecting part, 14. Base plate, 15. Positioning groove, 16. Side plate, 17. Rotation shaft, 18. Bolt, 19. Fastening nut, 20. Third assembly hole, 21. Fourth assembly hole, 22. Screw, 23. Fixing nut. Detailed Implementation

[0017] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0018] Please see Figures 1 to 4 As shown, this invention provides a fixture for impact and constant acceleration testing of electronic products, including a support 1, a mounting plate 7, and a top plate 9. The support 1 is provided with a plurality of first mounting holes 2 that are respectively connected to the impact test bench and the constant acceleration test bench, which can be adapted to meet the installation and testing requirements of different test benches. A first test section 3 is provided on one side of the support 1, and a second mounting hole 4 is provided on the first test section 3. The central axis of the second mounting hole 4 is perpendicular to that of the first mounting hole 2, which facilitates providing different installation references for the mounting plate 7. A second test section 5 is provided on the side of the support 1 away from the first mounting hole 2. A test space 6 is provided between the second test section 5 and the first mounting hole 2 to avoid interference during the flipping test. The mounting plate 7 is rotatably connected to the second mounting hole 4, and a primary mounting array 8 is provided on the mounting plate 7. The top plate 9 is movably connected to the second test section 5, and a secondary mounting array 10 is provided on the top plate 9. The primary mounting array 8 and the secondary mounting array 10 are respectively used to install adapter plates to load impact and / or constant acceleration simulation test loads. This test fixture can simultaneously complete load simulation tests of the first test section 3 and the second test section 5 through a unified positioning benchmark, eliminating the need to change the positioning benchmark when applying multi-directional loads. This simplifies the assembly process, reduces assembly errors and equipment wear, and improves batch testing efficiency. Meanwhile, the multi-position mounting points of the primary mounting array 8 and the secondary mounting array 10 can quickly adapt to clamping operations between products of different mounting sizes and various test benches, eliminating the need for customized fixtures to meet the impact and constant acceleration testing requirements of different products, significantly reducing production costs. Furthermore, the indirect connection between the product under test and the fixture via the adapter plate avoids the poor compatibility issues caused by a direct rigid connection between the fixture and the product, while achieving accurate transmission of impact and constant acceleration loads, solving the problems of inaccurate load transmission and easy product damage associated with existing dedicated fixtures. Moreover, the production cost of a customized adapter plate for each product is far lower than that of a customized complete fixture set, ensuring testing accuracy while meeting low-cost testing requirements.

[0019] Furthermore, such as Figure 1 and Figure 2As shown, the support 1 has a U-shaped structure, including a base plate 14 and side plates 16. The base plate 14 has several positioning grooves 15 on one end and opposite sides. The side plates 16 correspond one-to-one with the number of positioning grooves 15. One end of each side plate 16 is installed within a positioning groove 15, forming a U-shaped support frame with the base plate 14. This facilitates the overall stability of the fixture installation and uses a split structure to reduce processing difficulty. Any damaged component can be replaced independently without replacing the entire fixture, reducing maintenance costs. A test space 6 is formed along the opening direction, providing operable space for the top plate 9 during flipping and subsequent component operations. The second test section 5 is located on the opening side of the support 1. Connecting plates 11 connected to the support 1 are provided on opposite sides of the second test section 5 to enhance its structural strength. A rotation space 12 is provided between the connecting plates 11 and the top plate 9, providing room for rotation of the top plate 9 and allowing for flexible adjustment of the flipping angle, thus avoiding interference during component assembly.

[0020] Furthermore, such as Figure 4 As shown, a connecting part 13 is provided at one end of the top plate 9 and on opposite sides. The connecting part 13 is rotatably connected to the side plate 16 via a rotating shaft 17 and / or fixedly connected via several sets of fasteners. The rotating shaft 17 enables flexible rotation of the top plate 9, while the fasteners ensure its fixed positioning. This combination of two connection methods solves the problems of unstable fixation after angle adjustment of the top plate 9 in existing fixtures and its tendency to loosen during testing. Furthermore, the two connection methods can be flexibly switched according to testing requirements, improving operational convenience. Specifically, the fasteners include a bolt 18 and a fastening nut 19. One end of the bolt 18 passes through the side plate 16 and the connecting part 13, extending to provide a locking part. The head thickness of the bolt 18 is less than or equal to the thickness of the mounting plate 7, preventing interference during rotational testing after the product is installed, ensuring smooth multi-directional testing. The fastening nut 19 is threadedly connected to the locking part, enabling quick locking and disassembly, accommodating the rapid switching between the two connection methods of the fixture, and improving batch testing efficiency.

[0021] Furthermore, such as Figure 1 and Figure 2As shown, the mounting plate 7 is provided with several third mounting holes 20, and the support 1 is provided with at least one set of fourth mounting holes 21, which are positioned and sized one-to-one with the third mounting holes 20. The third mounting holes 20 and the fourth mounting holes 21 are connected by fasteners. Specifically, the fasteners include screws 22 and fixing nuts 23. The head of the screw 22 is embedded in the third mounting hole 20, and one end of the screw 22 passes through the third mounting hole 20 and the fourth mounting hole 21 in sequence, and extends to provide a fixing part; the fixing nut 23 is threadedly connected to the fixing part. In the above, through the cooperation of the third mounting holes 20 and the fourth mounting holes 21 and the connection of the fasteners, the mounting plate 7 can be stably positioned after rotation, solving the problems of the existing mounting plate 7 not being able to be accurately fixed after rotation and the angle deviation during the test. This ensures that the angle of the mounting plate 7 does not deviate during the test, guarantees the accurate load transmission direction, and improves the accuracy of the test data. Moreover, the cooperation of multiple sets of holes can realize multi-angle positioning of the mounting plate 7, adapting to the test requirements of different orientations, and further improving the versatility of the fixture.

[0022] Furthermore, such as Figure 1 As shown, the primary mounting array 8 and the secondary mounting array 10 are identical in size, enabling universal interchangeability of adapter plates. This eliminates the need for custom-made adapter plates, reducing customization costs and simplifying storage and management, thus improving operational convenience. Simultaneously, it ensures that products can be tested in different orientations after a single clamping, shortening testing and assembly time and improving batch testing efficiency. Specifically, both the primary mounting array 8 and the secondary mounting array 10 consist of multiple sets of threaded holes arranged in a uniform ring along the corresponding mounting axis, expanding the distribution range of mounting points and adapting to products of different mounting sizes and positions, thereby enhancing the versatility of the fixture.

[0023] In the above, such as Figure 2 As shown, the first assembly hole position 2 includes two sets of first through holes and four sets of second through holes. The two sets of first through holes are located on the symmetrical central axis of the base plate 14, and the four sets of second through holes are symmetrically distributed in pairs on opposite sides of the symmetrical central axis of the base plate 14.

[0024] In some embodiments, during impact testing, the four M10X25 screws provided on the impact testing platform are passed through the four φ11mm second through holes on the base plate 14, and tightening the M10X25 screws achieves a quick connection between the test fixture and the impact testing platform. After the product to be tested is secured to the adapter plate, the adapter plate is then fixed to the primary mounting array 8 of the mounting plate 7. Rotating the mounting plate 7 allows for rotation in four impact testing directions. After securing the adapter plate to the secondary mounting array 10 of the top plate 9, flipping the top plate 9 allows for switching the remaining two impact testing directions. When rotating the mounting plate 7 or flipping the top plate 9, the nuts that mate with it are loosened, and the bolts 18 / screws 22 are removed to achieve rotation. After the direction switch is completed, the bolts 18 / screws 22 are assembled into the corresponding holes, and the corresponding nuts are tightened to proceed with the test in the next direction.

[0025] In some embodiments of this invention, during constant acceleration testing, two M24X40 screws provided on the constant acceleration test bench are inserted through two φ26mm second through holes in the base plate 14. Tightening the M24X40 screws completes the quick connection between the test fixture and the constant acceleration test bench. After the product to be tested is secured to the adapter plate, the adapter plate is then fixed to the primary mounting array 8 of the mounting plate 7. Rotating the mounting plate 7 allows for rotation in four directions of the constant acceleration test; the other two directions can be achieved by driving the entire test fixture to rotate using the drive motor on the constant acceleration test bench.

Claims

1. A fixture for impact and constant acceleration testing of electronic products, characterized in that, include: Support (1), the support (1) is provided with a plurality of first assembly holes (2) respectively connected to the impact test bench and the constant acceleration test bench. A first test section (3) is provided on one side of the support (1), and a second assembly hole (4) is provided on the first test section (3). The second assembly hole (4) is perpendicular to the central axis of the first assembly hole (2). A second test section (5) is provided on the side of the support (1) away from the first assembly hole (2), and a test space (6) is provided between the second test section (5) and the first assembly hole (2). The mounting plate (7) is rotatably connected to the second mounting hole (4), and a primary mounting array (8) is provided on the mounting plate (7). The top plate (9) is movably connected to the second test section (5), and a secondary mounting array (10) is provided on the top plate (9); The primary mounting array (8) and the secondary mounting array (10) are used to mount the adapter plate to load the impact and / or constant acceleration simulation test load, respectively.

2. The impact and constant acceleration test fixture for electronic products according to claim 1, characterized in that, The support (1) is a U-shaped structure.

3. The impact and constant acceleration test fixture for electronic products according to claim 2, characterized in that, The second test section (5) is located on the opening side of the support (1). The two opposite sides of the second test section (5) are respectively provided with connecting plates (11) connected to the support (1). A space (12) to be rotated is provided between the connecting plate (11) and the top plate (9).

4. The impact and constant acceleration test fixture for electronic products according to claim 2, characterized in that, The support (1) includes: The base plate (14) has several positioning grooves (15) respectively opened at one end and on opposite sides. The side plates (16) are arranged in a one-to-one correspondence with the number of the positioning grooves (15). One end of the side plate (16) is installed in the positioning groove (15) and forms a U-shaped structure with the bottom plate (14).

5. A fixture for impact and constant acceleration testing of electronic products according to claim 4, characterized in that, One end of the top plate (9) and on opposite sides are respectively provided with a connecting part (13), and the connecting part (13) is rotatably connected to the side plate (16) by a rotating shaft (17) and / or fixedly connected by a number of fasteners.

6. A fixture for impact and constant acceleration testing of electronic products according to claim 5, characterized in that, The fasteners include: Bolt (18), one end of the bolt (18) passes through the side plate (16) and the connecting part (13) in sequence, and extends to provide a locking part; the head thickness of the bolt (18) is less than or equal to the thickness of the mounting plate (7); A fastening nut (19) is threadedly connected to the locking part.

7. A fixture for impact and constant acceleration testing of electronic products according to claim 1, characterized in that, The mounting plate (7) is provided with a plurality of third assembly holes (20), and the support (1) is provided with at least one set of fourth assembly holes (21) that correspond one-to-one with the positions and sizes of the third assembly holes (20). The third assembly holes (20) and the fourth assembly holes (21) are connected by fasteners.

8. A fixture for impact and constant acceleration testing of electronic products according to claim 7, characterized in that, The fastener includes: Screw (22), the head of the screw (22) is embedded in the third mounting hole (20), one end of the screw (22) passes through the third mounting hole (20) and the fourth mounting hole (21) in sequence, and is provided with a fixing part; A fixing nut (23) is threadedly connected to the fixing part.

9. A fixture for impact and constant acceleration testing of electronic products according to claim 1, characterized in that, The primary mounting array (8) and the secondary mounting array (10) have the same structural size.

10. A fixture for impact and constant acceleration testing of electronic products according to claim 1, characterized in that, Both the primary mounting array (8) and the secondary mounting array (10) are composed of multiple sets of threaded holes, and the multiple sets of threaded holes are arranged in a uniform ring array along the corresponding mounting axis direction.