An automated configuration and testing system for residual current

Abstract

This invention proposes an automated residual current configuration and testing system. The method is implemented through a technical solution encompassing digital configuration, automated waveform generation, closed-loop calibration, multi-device parallel testing, and traceability data management. The digital configuration unifies and encodes key configuration parameters such as device model, rated residual operating current, delay level, and calibration batch number, generating standardized data frames. The automated waveform generation employs controllable simulated residual current waveform automatic generation and closed-loop calibration technology, correlating the RCD's operating time with factors such as residual current amplitude, frequency, rise rate, and harmonic content. The closed-loop calibration automatically adjusts simulator output parameters and generates correction schemes based on current and operating time errors. The multi-device parallel testing performs parallel configuration and testing on multiple devices. The traceability data management uploads data in real-time to the MES system or cloud database, enabling data traceability throughout the entire lifecycle.

Description

Technical Field

[0001] This invention relates to the field of automated residual current testing technology, specifically to an automated residual current configuration and testing system. Background Technology

[0002] With urban development, the demand for urban electricity is also increasing. Safety maintenance and monitoring of power equipment are crucial to ensuring its normal operation. Residual current monitoring is an extremely important aspect of safety testing. Existing residual current monitoring equipment requires configuration and functional verification before leaving the factory or during maintenance. Traditional methods mainly rely on manual operation, such as setting the rated residual operating current using DIP switches, manually adjusting the delay level, and manually recording the operating current and operating time. This method has several drawbacks: 1) Low configuration efficiency and prone to errors; traditional manual configuration methods require testers to operate DIP switches or jumpers on each device and manually input parameters. This not only consumes a lot of time but is also prone to inconsistencies or errors due to operational mistakes, increasing production and maintenance costs; 2) Insufficient testing accuracy and repeatability; existing testing methods mostly rely on fixed test chambers or simple adjustable current sources, which cannot flexibly simulate residual current waveforms of different amplitudes, frequencies, and slopes. Therefore, the operating values ​​and operating times of the equipment vary in different batches or under different operating conditions. The following issues exist: 1) There may be significant differences among operators, resulting in low reliability and repeatability of test data; 2) Insufficient batch testing capability on the production line; Traditional testing methods typically involve testing each device individually, with operators manually recording test data. This approach is not only inefficient but also prone to data omissions or errors, hindering full lifecycle traceability management of equipment and impeding automated data acquisition and management by the MES system; 3) Difficulty in achieving closed-loop calibration; Due to the lack of real-time acquisition and automatic comparison mechanisms, existing methods cannot perform closed-loop calibration of equipment action points. Even if test results deviate, manual adjustment or repeated testing is required, increasing time costs and error risks; Existing technologies have significant shortcomings in configuration automation, testing accuracy, batch processing on the production line, and closed-loop calibration. Therefore, based on actual needs, the applicant proposes an automated residual current configuration and testing system capable of digital configuration, automatic generation of standardized residual current waveforms, and parallel testing of multiple devices with automatic recording and traceability capabilities. Summary of the Invention

[0003] To address the aforementioned technical issues, this invention proposes an automated residual current configuration and testing system. This system employs a technical solution encompassing digital configuration, automated waveform generation, closed-loop calibration, multi-device parallel testing, and traceability data management. The digital configuration standardizes key configuration parameters such as device model, rated residual operating current, delay level, and calibration batch number, generating standardized data frames. The automated waveform generation utilizes controllable simulation of residual current waveforms through automatic generation and closed-loop calibration technology, linking the RCD's operating time to factors such as residual current amplitude, frequency, rise rate, and harmonic content. The closed-loop calibration automatically adjusts simulator output parameters and generates correction schemes based on current and operating time errors. The multi-device parallel testing performs parallel configuration and testing on multiple devices. The traceability data management uploads data in real-time to the MES system or cloud database, enabling data traceability throughout the entire lifecycle.

[0004] To achieve the above objectives, the technical solution adopted by the present invention is as follows:

[0005] An automated residual current configuration and testing system is characterized by the following: the automated residual current configuration and testing method includes a main control computer, a communication interface module, a data storage and upload module, a database / MES system, a DAC module, a current injection module, a test station, and a multi-channel acquisition module; the testing method is implemented through a technical solution of digital configuration, automated waveform generation, closed-loop calibration, multi-device parallel testing, and traceable data management; the digital configuration uniformly encodes key configuration parameters such as device model, rated residual operating current, delay level, and calibration batch number, and generates standardized data frames; the automated waveform generation uses a controllable simulation of residual current waveforms. The automatic generation and closed-loop calibration technology correlates the RCD's operating time with factors such as the amplitude, frequency, rise rate, and harmonic content of the residual current. The closed-loop calibration automatically adjusts the simulator output parameters and generates a correction scheme based on the current and operating time errors, forming a closed-loop calibration mechanism. The multi-device parallel testing performs parallel configuration and testing on multiple devices, with each device automatically associated with its configuration data frame, test waveform settings, and test result data for pass / fail determination via barcode or serial number. The traceability data management uploads data to the MES system or cloud database in real time, enabling traceability of configuration information, test information, and calibration history throughout the entire lifecycle.

[0006] Furthermore, the digital configuration of the automated residual current configuration and testing method adopts a digital parameter mapping mechanism, which maps the equipment model and rated residual operating current. Latency level A series of key configuration parameters, such as calibration batch number B, are uniformly encoded and a standardized data frame D is generated. This enables a process of digital input, automatic writing to the device, and configuration consistency verification. The expression formula for this mapping process is as follows:

[0007]

[0008]

[0009] Where: M represents the equipment model code;

[0010] ⊕ indicates a combination operation of data frame fields;

[0011] The device receives data frame D via a communication bus or wireless interface, writes it to its internal storage unit, and automatically triggers a read feedback frame upon completion of the write operation. And calculate the consistency check result. :

[0012]

[0013] like =false, the system automatically charges or marks the device as abnormal, avoiding common configuration errors in traditional manual dialing, jumpering or manual input methods, thus reducing the risk of misconfiguration from the source.

[0014] Furthermore, the automated waveform generation of the residual current automated configuration and testing method utilizes a digitally controlled DAC and a current injection module, and the generated waveform expression is as follows:

[0015]

[0016]

[0017] Where: A is the set residual operating current amplitude;

[0018] f sets the analog frequency;

[0019] K is the rising slope coefficient, used to simulate the current rise rate;

[0020] H(t) represents the higher harmonic components.

[0021] Furthermore, the automated waveform generation of the residual current automated configuration and testing method utilizes a segmented slope control and amplitude holding algorithm to generate the waveform using a digital control DAC and current injection module. This ensures accurate response of the device during both the rising and constant current phases. The formula is as follows:

[0022]

[0023] in: The current rise rate;

[0024] This is the rising phase of time;

[0025] A represents the target operating current amplitude;

[0026] To maintain the phase time.

[0027] Furthermore, the closed-loop calibration of the residual current automated configuration and testing method involves collecting the actual operating current of the equipment during operation. and action time Set the target action time as and based on and The system automatically adjusts the simulator output parameters A, k, and harmonic coefficients. A correction scheme is generated, thus forming a closed-loop calibration mechanism. The comparison error formula is as follows:

[0028]

[0029] .

[0030] Furthermore, the automated configuration and testing method for residual current employs a task scheduling algorithm and a real-time monitoring algorithm for parallel testing of multiple devices. The task scheduling algorithm is used to optimize the current injection sequence and test sequence to avoid current coupling between injectors or mutual interference between devices. The real-time monitoring algorithm continuously monitors the output waveform, the status of the test device, and the device response. When waveform deviation, abnormal operation, or feedback failure is detected, the system automatically triggers retesting or alarm prompts to ensure the stability and reliability of the testing process.

[0031] Furthermore, the residual current automated configuration and testing method uses a task scheduling algorithm for multi-device parallel testing, with the test time window calculation formula for each device as follows:

[0032]

[0033]

[0034] in: Let i be the start time of the test for the i-th device;

[0035] This represents the complete test cycle for the j-th device.

[0036] The benefits of this application are:

[0037] 1. The automated configuration and testing method for residual current can automatically execute the configuration writing process, avoiding deviations caused by manual input;

[0038] 2. The automated configuration and testing method for residual current verifies the operating conditions based on adjustable current waveforms, improving test consistency;

[0039] 3. The automated configuration and testing method for residual current corrects test deviations through a closed-loop calibration method driven by action data;

[0040] 4. The automated configuration and testing method for residual current supports parallel operation of multiple workstations, improving the overall processing capacity of the production line;

[0041] 5. The automated configuration and testing method for residual current automatically collects and stores configuration and testing data, enabling full-process traceability. Attached Figure Description

[0042] Figure 1 This is a schematic diagram of the automated configuration and testing process of the present invention;

[0043] Figure 2 This is a schematic diagram of the system architecture of the present invention. Detailed Implementation

[0044] The present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments:

[0045] like Figure 1-2 As shown, this is an automated residual current configuration and testing system. The system includes a main control computer, a communication interface module, a data storage and upload module, a database / MES system, a DAC module, a current injection module, a test station, and a multi-channel acquisition module. The main control computer runs automated configuration and testing software, responsible for parameter input, data frame generation, write management, waveform calculation, closed-loop calibration, task scheduling, data acquisition, judgment, and result storage. The operator inputs the model of the device under test and the rated residual operating current into the system interface. Latency level After obtaining information such as production batch number B, the system generates a digital configuration data frame. The configuration is automatically written to the device's internal storage module via a communication bus or wireless interface, achieving automated configuration and consistency verification. The test method shown is implemented through a technical solution of digital configuration, automated waveform generation, closed-loop calibration, multi-device parallel testing, and traceability data management. The digital configuration shows that key configuration parameters such as device model, rated residual operating current, delay level, and calibration batch number are uniformly encoded and standardized data frames are generated. The automated waveform generation shows that the automatic generation and closed-loop calibration technology of controllable simulated residual current waveform is used to correlate the RCD's operating time with factors such as the amplitude, frequency, rise rate, and harmonic content of the residual current. The closed-loop calibration shows that the simulator output parameters are automatically adjusted and a correction scheme is generated based on the current and operating time errors, forming a closed-loop calibration mechanism. The multi-device parallel testing shows that multiple devices are configured and tested in parallel, and each device is automatically associated with its configuration data frame, test waveform settings, and test result data through barcodes or serial numbers for pass / fail judgment. The traceability data management shows that the data is uploaded to the MES system or cloud database in real time, realizing the traceability of configuration information, test information, and calibration history throughout the entire life cycle.

[0046] The digital configuration of the automated residual current configuration and testing method shown adopts a digital parameter mapping mechanism, which maps the equipment model and rated residual operating current. Latency level A series of key configuration parameters, such as calibration batch number B, are uniformly encoded and a standardized data frame D is generated. This enables a process of digital input, automatic writing to the device, and configuration consistency verification. The expression formula for this mapping process is as follows:

[0047]

[0048]

[0049] Where: M represents the equipment model code;

[0050] ⊕ indicates a combination operation of data frame fields;

[0051] The device receives data frame D via a communication bus or wireless interface, writes it to its internal storage unit, and automatically triggers a read feedback frame upon completion of the write operation. And calculate the consistency check result. :

[0052]

[0053] like =false, the system automatically charges or marks the device as abnormal, avoiding common configuration errors in traditional manual dialing, jumpering or manual input methods, thus reducing the risk of misconfiguration from the source.

[0054] Each configuration command shown includes a CRC checksum when written, and the writing algorithm is as follows:

[0055]

[0056] in: Configure the nth data;

[0057] This is a cyclic redundancy check value;

[0058] The device returns a feedback frame after receiving the data. The main control computer determines whether the write operation was successful using the following formula:

[0059]

[0060] If the write operation fails, the system automatically resends the data frame or generates an exception flag to automate error handling. After the write operation is complete, the system stores device configuration and batch information, write time, configuration parameters, and other data in the database, enabling full-process traceability. (See [link to documentation]). Figure 2 The direction of data flow in the middle;

[0061] The automated waveform generation of the residual current automated configuration and testing method shown utilizes a digitally controlled DAC and a current injection module. The generated waveform expression is as follows:

[0062]

[0063]

[0064] Where: A is the set residual operating current amplitude;

[0065] f sets the analog frequency;

[0066] K is the rising slope coefficient, used to simulate the current rise rate;

[0067] H(t) represents the higher harmonic components.

[0068] The automated waveform generation method for residual current configuration and testing, as shown, utilizes a digital control DAC and a current injection module to generate waveforms with a piecewise slope control and amplitude hold algorithm. This ensures accurate response of the device during both the rise and constant current phases. The formula is as follows:

[0069]

[0070] in: The current rise rate;

[0071] This is the rising phase of time;

[0072] A represents the target operating current amplitude;

[0073] To maintain the phase time.

[0074] The closed-loop calibration of the automated residual current configuration and testing method shown involves collecting the actual operating current of the equipment during operation. and action time Set the target action time as and based on and The system automatically adjusts the simulator output parameters A, k, and harmonic coefficients. A correction scheme is generated, thus forming a closed-loop calibration mechanism. The comparison error formula is as follows:

[0075]

[0076]

[0077] When error Or when The system automatically adjusts parameters at that time. Maintain current amplitude A or harmonic coefficient The waveform is regenerated and tested a second time until the error meets the set threshold; closed-loop calibration can also introduce a temperature drift coefficient. and equipment aging coefficient :

[0078]

[0079] Parallel testing of multiple devices is another core aspect of this embodiment; the system supports simultaneous testing of N devices, each automatically associated with configuration data, test waveforms, and test results via barcode or serial number; to avoid mutual interference of injected currents, the system calculates the test time window for each device using a task scheduling algorithm:

[0080]

[0081]

[0082] in: Let i be the start time of the test for the i-th device;

[0083] The complete test cycle for the j-th device includes the rise phase, the hold phase, and the system stabilization waiting time, ensuring that the actions of each device do not interfere with each other;

[0084] During the test, the system continuously collects the operating current and operating time of each device and calculates the operating consistency index:

[0085]

[0086] when < When this occurs, the system determines that the device is malfunctioning and automatically triggers a retest.

[0087] The automated residual current configuration and testing method shown employs a multi-device parallel testing approach using task scheduling and real-time monitoring algorithms. The task scheduling algorithm optimizes the current injection sequence and test sequence, avoiding current coupling between injectors or mutual interference between devices. The real-time monitoring algorithm continuously monitors the output waveform, test device status, and device response. When waveform deviation, abnormal operation, or feedback failure is detected, the system automatically triggers retesting or alarm prompts to ensure a stable and reliable testing process. The system has complete data management and batch testing functions. After each device is tested, configuration parameters, waveform parameters, action data, error values, judgment results, batch numbers, and timestamps are all stored in the database and can be accessed in real time. Uploaded to the MES system or cloud platform, enabling full-process traceability and data analysis; the system can aggregate and analyze historical data, identify the impact of different equipment models, production batches, temperatures, or aging on operating characteristics, and optimize the configuration mapping function and waveform generation strategy; the entire system forms an end-to-end closed-loop control process of "digital input → automatic writing → waveform generation → real-time acquisition → closed-loop calibration → judgment → data storage and traceability", realizing automated configuration and high-precision testing of residual current devices; through this embodiment, the production line can significantly improve configuration accuracy, testing precision, and production efficiency, while reducing human intervention and ensuring that the performance of each piece of equipment is consistent and verifiable.

[0088] The automated configuration and testing method for residual current devices, as shown, integrates five core technologies: digital configuration mapping, automatic waveform generation, closed-loop calibration, multi-device parallel testing, and automatic traceability data management. It organically combines software control, hardware simulation, algorithm calibration, and production management to form a complete automated configuration and testing method for residual current devices. Compared with traditional manual dialing, manual testing, or single fixed test chamber methods, this invention not only improves configuration accuracy, shortens testing cycles, and increases equipment throughput, but also enhances testing precision, improves data reliability, and strengthens the automation level of the production line. Therefore, it provides an efficient and modern solution for the mass production and quality assurance of residual current protection devices.

[0089] The above description is merely a preferred embodiment of the present invention and is not intended to limit the present invention in any other way. Any modifications or equivalent changes made based on the technical essence of the present invention shall still fall within the scope of protection claimed by the present invention.

Claims

1. An automated residual current configuration and testing system, characterized in that: The automated residual current configuration and testing method includes a main control computer, a communication interface module, a data storage and upload module, a database / MES system, a DAC module, a current injection module, a test station, and a multi-channel acquisition module. The testing method is implemented through a technical solution of digital configuration, automated waveform generation, closed-loop calibration, multi-device parallel testing, and traceable data management. The digital configuration uniformly encodes key configuration parameters such as device model, rated residual operating current, delay level, and calibration batch number, generating standardized data frames. The automated waveform generation employs controllable simulated residual current waveform automatic generation and closed-loop calibration technology, correlating the RCD's operating time with factors such as the residual current's amplitude, frequency, rise rate, and harmonic content. The closed-loop calibration automatically adjusts the simulator output parameters and generates a correction scheme based on current and action time errors, forming a closed-loop calibration mechanism; the multi-device parallel testing performs parallel configuration and testing on multiple devices, with each device automatically associated with its configuration data frame, test waveform settings, and test result data through barcodes or serial numbers for pass / fail determination; the traceability data management uploads data to the MES system or cloud database in real time, enabling traceability of configuration information, test information, and calibration history throughout the entire lifecycle.

2. The residual current automated configuration and testing system according to claim 1, characterized in that: The digital configuration of the automated residual current configuration and testing method adopts a digital parameter mapping mechanism, which maps the equipment model and rated residual operating current. Latency level A series of key configuration parameters, such as calibration batch number B, are uniformly encoded and a standardized data frame D is generated. This enables a process of digital input, automatic writing to the device, and configuration consistency verification. The expression formula for this mapping process is as follows: ； ； Where: M represents the equipment model code; ⊕ indicates a combination operation of data frame fields; The device receives data frame D via a communication bus or wireless interface, writes it to its internal storage unit, and automatically triggers a read feedback frame upon completion of the write operation. And calculate the consistency check result. : ； like =false, the system automatically charges or marks the device as abnormal, avoiding common configuration errors in traditional manual dialing, jumpering or manual input methods, thus reducing the risk of misconfiguration from the source.

3. The automated residual current configuration and testing system according to claim 1, characterized in that: The automated waveform generation of the residual current automated configuration and testing method utilizes a digital control DAC and a current injection module. The generated waveform expression is as follows: ； ； Where: A is the set residual operating current amplitude; f sets the analog frequency; K is the rising slope coefficient, used to simulate the current rise rate; H(t) represents the higher harmonic components.

4. The automated residual current configuration and testing system according to claim 1, characterized in that: The automated waveform generation method for residual current configuration and testing utilizes a digital control DAC and a current injection module to generate waveforms with a segmented slope control and amplitude hold algorithm, enabling the device to respond accurately during both the rising and constant current phases. The formula is as follows: ； in: The current rise rate; This is the rising phase of time; A represents the target operating current amplitude; To maintain the phase time.

5. The automated residual current configuration and testing system according to claim 1, characterized in that: The closed-loop calibration of the aforementioned automated residual current configuration and testing method involves collecting the actual operating current of the device during operation. and action time Set the target action time as and based on and The system automatically adjusts the simulator output parameters A, k, and harmonic coefficients. A correction scheme is generated, thus forming a closed-loop calibration mechanism. The comparison error formula is as follows: ； 。 6. The automated residual current configuration and testing system according to claim 1, characterized in that: The automated configuration and testing method for residual current employs a task scheduling algorithm and a real-time monitoring algorithm for parallel testing of multiple devices. The task scheduling algorithm is used to optimize the current injection sequence and test sequence to avoid current coupling between injectors or mutual interference between devices. The real-time monitoring algorithm continuously monitors the output waveform, the status of the test device, and the device response. When waveform deviation, abnormal operation, or feedback failure is detected, the system automatically triggers retesting or alarm prompts to ensure the stability and reliability of the testing process.

7. The automated residual current configuration and testing system according to claim 1, characterized in that: The automated configuration and testing method for residual current is a task scheduling algorithm for multi-device parallel testing. The calculation formula for the test time window of each device is as follows: ； ； in: Let i be the start time of the test for the i-th device; This represents the complete test cycle for the j-th device.

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